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SpectroscopIC aNALYSIS Part 7 – X-ray Analysis Methods. Chulalongkorn University, Bangkok, Thailand January 2012 Dr Ron Beckett Water Studies Centre & School of Chemistry Monash University, Melbourne, Australia Email: [email protected]. Water Studies Centre. 1. - PowerPoint PPT Presentation
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SpectroscopIC aNALYSISPart 7 – X-ray Analysis Methods
Chulalongkorn University, Bangkok, Thailand January 2012
Dr Ron Beckett
Water Studies Centre & School of ChemistryMonash University, Melbourne, Australia
Email: [email protected]
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X-ray Analysis Methods
• Properties of X-radiation
• X-ray diffraction
• X-ray emission spectroscopy
• Production of X-radiation in an X-ray tube
• X-ray fluorscence
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Properties of X-radiation
• Frequency 3x1016 – 3x1018 Hz
• Wavelength 10 nm – 100 pm
• High energy radiation, damaging to biological cells
• High penetration of materials due to low absorbance is useful in medicine (body X-rays) and material science (fracture detection)
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X-ray Diffraction by Crystals
X-rays are reflected from planes of atoms in the crystal lattice of compounds
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X-ray Diffraction by CrystalsX-rays reflected from two planes of atoms in the crystal lattice constructively interfere only when the path length difference is an integral number of wavelengths
For waves 1 and 2 path lengths BC + CD = , ...., n 7
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X-ray Diffraction by Crystals
This condition results in the following law for X-ray diffraction by crystals
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X-ray Powder Diffraction PatternsDirection of incident beam
Random orientation of crystals in the powder
Diffracted beams
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X-ray Powder Diffraction Patternsare used to identify crystalline materials and to determine the
amount of each phase in a mixture
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Single Crystal X-ray Crystallography
Analysis of the geometry and intensity of spots enables the crystal and molecular structure of compounds to be determined
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X-ray Studies Lead to the Discovery of the Double Helix Structure of DNA
Rosalyn Franklin Single crystal X-ray pattern of DNA16
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X-ray Emission Spectroscopy
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X-ray emission spectrum of a Ni compound the exact position and intensity of the peaks can give information about the oxidation state and bonding
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Production of X-radiation in an X-ray Tube1. High voltage extracts electrons from the anode
and accelerates them towards the metal cathode2. These high energy collisions eject electrons from
inner atomic orbitals of the metal
_+ e-
Metal Target
High Voltage ~100,000 V
X-radiationFrequency depends on target metal
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Production of X-radiation in an X-ray Tube
e-
e-
e-
..
...
......
..
...
.High energy electron accelerated by voltage
High energy electron after collision with metal atom in the target
Inner shell electron ejected from the metal atom in the target
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X-ray Fluorescence Atomic
Fluorescence1. Excitation by X-rays
ejects electrons from inner orbitals of atoms
2. Electrons from higher orbitals jump back to fill vacancies
3. Emission of fluorescence X-rays occurs
4. Results in Stokes shift to longer wavelength (lower energy since EFluorescence < EExcitation).
EExcitation = h e-
e-EFluorescence = h
KE = 1/2mv2
e-
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X-ray Fluorescence Instrument
_+ e-
EExcitation = h
Detector
EFluorescence = h
Sample
X-ray TubeMonochrometer
X-ray Excitation Source
X-ray Emission
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X-ray Fluorescence Analysis
• The fluorescence frequencies can be used to identify the elements in the sample
• The intensity of the fluorescent X-ray beam is used to determine the concentration of specific elements using callibration standards