34
1 SpectroscopIC aNALYSIS Part 7 – X-ray Analysis Methods Chulalongkorn University, Bangkok, Thailand January 2012 Dr Ron Beckett Water Studies Centre & School of Chemistry Monash University, Melbourne, Australia Email: [email protected] Water Studies Centre 1

SpectroscopIC aNALYSIS Part 7 – X-ray Analysis Methods

Embed Size (px)

DESCRIPTION

SpectroscopIC aNALYSIS Part 7 – X-ray Analysis Methods. Chulalongkorn University, Bangkok, Thailand January 2012 Dr Ron Beckett Water Studies Centre & School of Chemistry Monash University, Melbourne, Australia Email: [email protected]. Water Studies Centre. 1. - PowerPoint PPT Presentation

Citation preview

1

SpectroscopIC aNALYSISPart 7 – X-ray Analysis Methods

Chulalongkorn University, Bangkok, Thailand January 2012

Dr Ron Beckett

Water Studies Centre & School of ChemistryMonash University, Melbourne, Australia

Email: [email protected]

1

2

X-ray Analysis Methods

• Properties of X-radiation

• X-ray diffraction

• X-ray emission spectroscopy

• Production of X-radiation in an X-ray tube

• X-ray fluorscence

2

3

Properties of X-radiation

• Frequency 3x1016 – 3x1018 Hz

• Wavelength 10 nm – 100 pm

• High energy radiation, damaging to biological cells

• High penetration of materials due to low absorbance is useful in medicine (body X-rays) and material science (fracture detection)

3

44

5

X-ray Imaging in Medicine and Dentistry

5

6

X-ray Diffraction by Crystals

X-rays are reflected from planes of atoms in the crystal lattice of compounds

6

7

X-ray Diffraction by CrystalsX-rays reflected from two planes of atoms in the crystal lattice constructively interfere only when the path length difference is an integral number of wavelengths

For waves 1 and 2 path lengths BC + CD = , ...., n 7

8

X-ray Diffraction by Crystals

This condition results in the following law for X-ray diffraction by crystals

8

9

X-ray Powder Diffraction PatternsDirection of incident beam

Random orientation of crystals in the powder

Diffracted beams

9

10

X-ray Powder Diffraction Camera

10

11

X-ray Powder Diffraction

Camera

11

12

X-ray Powder Diffractometer

12

13

X-ray Powder Diffractometer

13

14

X-ray Powder Diffraction Patternsare used to identify crystalline materials and to determine the

amount of each phase in a mixture

14

15

Single Crystal X-ray Crystallography

Analysis of the geometry and intensity of spots enables the crystal and molecular structure of compounds to be determined

15

16

X-ray Studies Lead to the Discovery of the Double Helix Structure of DNA

Rosalyn Franklin Single crystal X-ray pattern of DNA16

17

Single Crystal X-ray Diffraction Monochrometers

17

18

Single Crystal X-ray Diffraction Monochrometers

18

19

X-ray Emission Spectrometer

19

Excitation Source electrons protons X-rays -rays

Monochrometer

20

X-ray Emission

Excitation Source electrons protons X-rays -rays

X-ray Emission

21

X-ray Emission

21

22

X-ray Emission Energy Jumps

22

Excitation Emission Emission

23

X-ray Emission Energy Jumps

23

3d

3p3s

2p

2s

1s

24

X-ray Emission Spectroscopy

24

X-ray emission spectrum of a Ni compound the exact position and intensity of the peaks can give information about the oxidation state and bonding

25

Production of X-radiation in an X-ray Tube1. High voltage extracts electrons from the anode

and accelerates them towards the metal cathode2. These high energy collisions eject electrons from

inner atomic orbitals of the metal

_+ e-

Metal Target

High Voltage ~100,000 V

X-radiationFrequency depends on target metal

26

Production of X-radiation in an X-ray Tube

26

27

X-ray Tube

27

28

Production of X-radiation in an X-ray Tube

e-

e-

e-

..

...

......

..

...

.High energy electron accelerated by voltage

High energy electron after collision with metal atom in the target

Inner shell electron ejected from the metal atom in the target

28

29

Production of X-radiation in an X-ray Tube

.

...

......

EX-ray = hEelectron

29

30

X-ray Fluorescence Atomic

Fluorescence1. Excitation by X-rays

ejects electrons from inner orbitals of atoms

2. Electrons from higher orbitals jump back to fill vacancies

3. Emission of fluorescence X-rays occurs

4. Results in Stokes shift to longer wavelength (lower energy since EFluorescence < EExcitation).

EExcitation = h e-

e-EFluorescence = h

KE = 1/2mv2

e-

30

31

X-ray Fluorescence Instrument

_+ e-

EExcitation = h

Detector

EFluorescence = h

Sample

X-ray TubeMonochrometer

X-ray Excitation Source

X-ray Emission

32

X-ray Fluorescence Spectrometer

32

33

X-ray Fluorescence Analysis

• The fluorescence frequencies can be used to identify the elements in the sample

• The intensity of the fluorescent X-ray beam is used to determine the concentration of specific elements using callibration standards

34

Thank You for your Attention !