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COURSE OUTLINE

Department & Faculty: Departm ent of Physics,Faculty of Science

Page : 1 of 3

Code and Subject: SSP 33 23 Advanced ElectronicsTotal Lecture Hours: 42 hours

Semester: I Academic Session: 2 0 1 0/ 1 1

Prepared by:

Name: MUHAMMAD ZAKI YAACOB

Signature:Date: 12 JUNE 20 09

Certified by:

Name: PROF DR NORI AH BI DI N

Signature:Date:

Lecturer : Muhammad Zaki Yaacob

Room No. : C20-205

Tel. No : 07-5534188e mail : zaki@dfiz2.fs.utm.my

Synopsis :The course begins with discussion of operational amplifier

(OPAMP) and its applications such as summing and differential

amplifiers, differentiator/integrator, and active filters. Sensors andamplification of signals are introduced. Basic concepts and

principles of digital circuits; number codes and number system,Boolean algebra, logic gates, Karnaugh maps, IC specification and

interfacing, encoding and decoding, flip-flops, counters, shiftregisters and digital arithmetic circuits are also discussed. Finally

analogue to digital and digital to analogue conversion are covered.

In general, the course will be conducted by lectures and hands-on

to provide students with sound basic concepts and practicalexperience in advanced analogue and digital electronics.

Learning Outcomes

By the end of the course, students should be able to:

No. Course Learning Outcomes

Programme

Learning

Outcome(s)

Addressed

Assessment

Methods

LO1

Describe the characteristics, operations and

solve problem related to the OPAMPcircuits for simple applications.

PO1(C2, P2, A2),PO2(C3, P3, A2),

Assign 1 (Ind.),Test 1, F. Exam

LO2

Determine sensors for detecting physicalproperties such as temperature, light

intensity, and pressure and design the

appropriate signal amplifiers in group.

PO2(C4, P3, A2),

PO6(TS1,2,3)

Assign 2

(Group), Test 1,F. Exam

LO3Define the characteristics and specificationsof the TTL and CMOS digital ICs(integrated circuits).

PO1(C1, P2, A2)Test 2

F. Exam

LO4

Explain the principle of digital systems anddigital devices such as logic gates, encoders,

decoders, flip-flops, counters and shiftregister.

PO1(C2, P2, A2),Test 2,

F. Exam

LO5Explain and solve problems involving digitalarithmetic circuits

PO1(C2, P2, A2)PO2(C3, P3, A2)

Assign 3 (Ind)Test 2, F. Exam

LO6

Use ADC to convert analogue to digital

signal and to work in group to design

electronic sensor.

PO2(C3, P5, A3),PO6(TS1,2,2,4)

Group Project,Final. Exam

8/2/2019 SSP 3323 L1

2/3

COURSE OUTLINE

Department & Faculty: Departm ent of Physics,Faculty of Science

Page : 2 of 3

Code and Subject: SSP 33 23 Advanced ElectronicsTotal Lecture Hours: 42 hours

Semester: I Academic Session: 2 0 1 0/ 1 1

Prepared by:

Name: MUHAMMAD ZAKI YAACOB

Signature:Date: 12 JUNE 20 09

Certified by:

Name: PROF DR NORI AH BI DI N

Signature:Date:

Student Learning Time

Teaching and Learning Activities Student Learning Time

1. Face to face Learning

a. Lecturer- Centered Learning

i. Lecture (3 hrs lecture ) x 14 42

2. Self-Directed Learning

a. Revision (preparation for lecture and assignment) 38

b. Assignment (3 x) 13

c. Group project 14

d. Preparations for assessment 8

3. Formal Assessment

a. Tests (2x) 2

b. Final Examination 3Total SLT 120

Teaching Methods

a) Lecture and Discussion

b) Individual and group assignmentc) Group project

d) Independent Study

e) Problem Solving

Weekly Schedule

Week Topic

Week 1INTRODUCTION: Course introduction, basic requirement.

Review on transistor, capacitors role and frequency response.

Week 2OPERATIONAL AMPLIFIER (OPAM): ideal characteristics,

inverting amplifier, non-inverting amplifier, voltage follower.

Week 3OPAMP applications: Summing amplifier, integrator, differentiator,

instrumentation amplifier.

Week 4 Filters: Active filter, low pass filter, high pass filter, band pass filter.

Week 5Sensors: temperature, light intensity, humidity, acceleration andpressure.

Week 6 Sensor applications: construct the appropriate signal amplifiers.

Week 7

DIGITAL SYSTEM & NUMBERS: Principle of digital electronics,

analogue and digital system, numbers system decimal, binary,hexadecimal, octal. BINARY LOGIC GATES: AND, OR, INVERTER,

NAND, NOR, XOR, XNOR.

Week 8 Semester Break

Week 9 Boolean expressions, minterm and maxterm circuits, truth tables,

8/2/2019 SSP 3323 L1

3/3

COURSE OUTLINE

Department & Faculty: Departm ent of Physics,Faculty of Science

Page : 3 of 3

Code and Subject: SSP 33 23 Advanced ElectronicsTotal Lecture Hours: 42 hours

Semester: I Academic Session: 2 0 1 0/ 1 1

Prepared by:

Name: MUHAMMAD ZAKI YAACOB

Signature:Date: 12 JUNE 20 09

Certified by:

Name: PROF DR NORI AH BI DI N

Signature:Date:

Karnaugh maps, data selectors.

Week 10 INTEGRATED CIRCUITS (IC): TTL and CMOS, IC specification andsimple interfacing. CODES: BCD code, excess-3 code, gray code, ASCII

code, encoders, seven-segment displays, decoders.

Week 11FLIP-FLOPS: RS, JK and D flip-flops, latches, Schmitt trigger, ripple

counters, synchronous counters, Up and down counters.

Week 12Frequency dividers, TTL and CMOS IC counters. Serial and Parallel load

shift registers, universal shift register, TTL and CMOS shift register ICs.

Week 13

DIGITAL ARITHMETIC CIRCUITS: Binary addition, half and fulladders, three-bit adders, binary subtraction, using adders for subtraction,

four-bit adder/subtractors, IC adders, Parallel adder/subtractor systems.

Week 14

Binary multiplication, binary multipliers. 2s complement notation,

addition and subtraction. 2s complement adder/subtractors.

MEMORIES: RAM and ROM.

Week 15 Digital to Analogue converter, Analogue to Digital converter

Week 16 Study week

Week 17 -18 Final Examination

References

Course Note

Main Text

Other References 1. Tokheim L. T,Digital Electronics, McGraw Hill, Sixth edition 2006.(Text for digital part)

2.

Malvino A. P, Electronics Principles, McGraw Hill, Fifth edition1993.

3. Bogart T. F, Beasley J. S, Rico G, Electronics Devices and Circuts,Pearson Prentice Hall, Sixth edition 2004.

4. Neamen D. A, Microelectronics Circuit Analysis and Design,

McGraw Hill, Third edition 2007.

Assessment

No Type of Assessment Number % each % total Date

1 Assignment (Individual) 2 5 10 W2, W10

2 Assignment (Group) 1 5 5 W9

3 Test 2 10, 15 25 W6, W134 Group project 1 10 10 W12-14

5 Final Exam 1 50 50 W17-W18

Total 100