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Structural Image Analysis in Investigation of Concrete Warsaw, October 21-23, 2002
Classification of defectson the surface of black ceramics
Leszek Chmielewski, Mariusz Nieniewski,Marek Skłodowski, Waldemar Cudny
Division of Vision and Measurement Systems (PSWiP)
Institute of Fundamental Technological Reserach, PAS(IPPT PAN)
Adam JóźwikInstitute of Biocybernetics and Biomedical Engineering, PAS
(IBIB PAN)
2/25SIAIC 2002, Warsaw L. Chmielewski (PSWiP) et al., Classification of defects on the surface of black ceramics
Schedule
Objects and their defects Detection of defects Classification of defects Training of the classifier Postprocessing Performance of the processes Results
AcknowledgementsThis research was partly supported by the European Commission: COPERNICUS grant CRASH no. COP - 94 00717 (1995-96) INCO-COPERNICUS grant SQUASH no. ERBIC 15CT 96 0742 (1997-98)
3/25SIAIC 2002, Warsaw L. Chmielewski (PSWiP) et al., Classification of defects on the surface of black ceramics
This is not concrete – this is ferrite
Black ceramics: ferrite cores magnets
The material is: milled molded pressed sintered ground transported ...
A large number of various defects can emerge during these processesA pair of ferrite cores
4/25SIAIC 2002, Warsaw L. Chmielewski (PSWiP) et al., Classification of defects on the surface of black ceramics
Objects and their defects – called nicely: irregularities
Surfaces:3 important types of defects: crack chip pull-out
Sometimes difficult to classify even for humans
Tiring quality inspection
5/25SIAIC 2002, Warsaw L. Chmielewski (PSWiP) et al., Classification of defects on the surface of black ceramics
Special illumination: controlled light
Tangential, multidirectional light amplifies the visibility of defects
Brightness uniform and independent on distance
LED illuminator Fluorescent illuminator
6/25SIAIC 2002, Warsaw L. Chmielewski (PSWiP) et al., Classification of defects on the surface of black ceramics
Locating the object in the field of view
Simple morphological operations help to find the region occupied by the object for further processing
Aim: to eliminate bright spots and blobs
In this application a narrow stripe at the edge was excluded from analysis
original thresholded complemented
original complemented
7/25SIAIC 2002, Warsaw L. Chmielewski (PSWiP) et al., Classification of defects on the surface of black ceramics
Detection of irregularities (not defects!)
Region of interest is further limited to the irregular part of the surface with the morphological methods
tomorrow’s presentation by prof. Mariusz Nieniewski
original thresholded elongated irregular summed
8/25SIAIC 2002, Warsaw L. Chmielewski (PSWiP) et al., Classification of defects on the surface of black ceramics
Classification of irregularities – features (1/2)
Each pixel detected in the detection phase is classified with the pattern recognition methods. Pixel = pattern.
Features are calculated for each pixel: functions on pixel neighbourhoods = masks.
Direction invariance of features is obtained by rotation of the mask according to local directionality of texture.
Pixel & its mask
original mask rotated mask
tan( )2 2
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2 2
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Ix
Iy
dxdy
dxdy
[YBF95]
9/25SIAIC 2002, Warsaw L. Chmielewski (PSWiP) et al., Classification of defects on the surface of black ceramics
Classification of irregularities – features (2/2) brightnesses in the original & rotated mask statistical moments of order up to R in masks gradient modulus 9 classical textural features according to [Law80, Pra91] textural features based on coocurrence relations [WuCh92] relative values of brightness function along the red line
From 30 to 150 features were used for feature selection.
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For example: Features as in [Law80, Pra91]: convolve the mask with A1 – A9 and take standard deviation of the output values 9 features.
10/25SIAIC 2002, Warsaw L. Chmielewski (PSWiP) et al., Classification of defects on the surface of black ceramics
Classification: the K Nearest Neighbour (k-NN) method
11/25SIAIC 2002, Warsaw L. Chmielewski (PSWiP) et al., Classification of defects on the surface of black ceramics
K-NN: Enhancements and speed-ups
With full selection of features and K Leave-one-out method
Fuzzy version Fuzzy decisions made crisp in the end
Parallel Distinct classifiers for each pair of classes
Hierarchical Advanced version only where classes overlap
Reference set largely reduced with the modified, bidirectional Hart algorithm
Optimized, low error rate, quick algorithm
12/25SIAIC 2002, Warsaw L. Chmielewski (PSWiP) et al., Classification of defects on the surface of black ceramics
The parallel version of the K Nearest Neighbour method
13/25SIAIC 2002, Warsaw L. Chmielewski (PSWiP) et al., Classification of defects on the surface of black ceramics
K-NN: class overlap as the training criterion (not error)
14/25SIAIC 2002, Warsaw L. Chmielewski (PSWiP) et al., Classification of defects on the surface of black ceramics
Training: the training patterns
Note: artificial, boundary classes introduced better accuracy
2479 training patterns can be obtained quite quickly...
15/25SIAIC 2002, Warsaw L. Chmielewski (PSWiP) et al., Classification of defects on the surface of black ceramics
Training: first results
The system has successfully classified thousands of unknown pixels.
Quite satisfactory results can be obtained with just 4 training images.
2479 training patterns
raw classifi-cation results
enhanced by local votong
16/25SIAIC 2002, Warsaw L. Chmielewski (PSWiP) et al., Classification of defects on the surface of black ceramics
Training: first results – zoom – results of the enhancement
This was only a convincing example. The error rate estimated with the leave-one-out method was 3.3%.
More training patterns were used in the final system.
pixels used in training classified pixels: all / raw / enhanced
17/25SIAIC 2002, Warsaw L. Chmielewski (PSWiP) et al., Classification of defects on the surface of black ceramics
Final training results – error estimates
5903 training patterns a posteriori error probabilities: pixel classified as class "i"
(row) comes in fact from the class "j" (column); in % overall error: 2.56% max error: 9% between classes 8 and 9
cared for by the postprocessing (to some extent)
18/25SIAIC 2002, Warsaw L. Chmielewski (PSWiP) et al., Classification of defects on the surface of black ceramics
Classification results – various types of elements (1/4)
blue – chip, yellow – good object
19/25SIAIC 2002, Warsaw L. Chmielewski (PSWiP) et al., Classification of defects on the surface of black ceramics
Classification results – various types of elements (2/4)
brown – irregular,
red – crack,
green – pull-out,
blue – chip,
grey – good object.
20/25SIAIC 2002, Warsaw L. Chmielewski (PSWiP) et al., Classification of defects on the surface of black ceramics
Classification results – various types of elements (3/4)
blue – chip,
navy – chip near
good,
red – crack.
21/25SIAIC 2002, Warsaw L. Chmielewski (PSWiP) et al., Classification of defects on the surface of black ceramics
Classification results – various types of elements (4/4)
blue – chip,
green – pull-out,
red – crack !?
22/25SIAIC 2002, Warsaw L. Chmielewski (PSWiP) et al., Classification of defects on the surface of black ceramics
Higher level – discern cracks from grinding grooves
Classify cracks – red betweenall irregular regions – green.
Limits of the method reached.details in other images
23/25SIAIC 2002, Warsaw L. Chmielewski (PSWiP) et al., Classification of defects on the surface of black ceramics
Classification results – rotation (in)variance
24/25SIAIC 2002, Warsaw L. Chmielewski (PSWiP) et al., Classification of defects on the surface of black ceramics
Technical data & Performance
Resolution
A 512*512 pixel camera. Spatial resolutions: 0.05mm/pixel
(up to 20*larger magnifications can be attained with normal lenses)
Accuracy of results
Classification errors: overall up to 4%, inter-class typically 4%, max 10%;
Stability of results
• Detection phase: repeatability not worse than 2-5% in area.
• Classification phase: repeatability not worse than 10-20% in area, depending of how fast classifier version is used.
Processing time [s] (PC, 1000 MHz)
only software morphological processor
image acquisition 0.05-0.20
detection 2.00 0.0001-0.001
classification 1.00 typically; 10 for v. large defects - 20% of object
decision 0.1
25/25SIAIC 2002, Warsaw L. Chmielewski (PSWiP) et al., Classification of defects on the surface of black ceramics
Conclusion
Irregularities of flat surface in black ceramics – ferrite cores, magnets – can be detected and classififed
Special lighting system has been designed Detection of irregularities:
Irregularities in general – dynamic thresholding Compact irregularities – morphological method Elongated irregularities – morphological method General decision on quality of the tested object
Classification of irregularities: Training by showing examples
Segmentation and measurements Detailed, quantitative final decision
Project www site: http://www.tpo.org.pl/squash
26/25SIAIC 2002, Warsaw L. Chmielewski (PSWiP) et al., Classification of defects on the surface of black ceramics
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to construction of a fast minimum distance classifier. In Proc. 2nd Polish Conference on Computer Pattern Recognition Systems KOSYR 2001, pages 381-386, Miłków, Poland, May 28-31, 2001.
M. Nieniewski, L. Chmielewski, A. Jóźwik and M. Skłodowski. Morphological detection and feature-based classification of cracked regions in ferrites. MG&V, 8(4):699-712, 1999.
A. Jóźwik, L. Chmielewski, M. Skłodowski and W. Cudny. Class overlap rate as a design criterion for parallel Nearest Neighbour classifier. In Proc. 1st Polish Conference on Computer Pattern Recognition Systems KOSYR'99 Trzebieszowice, Poland, May 24-27, 1999.
A. Jóźwik, L. Chmielewski, M. Skłodowski and W. Cudny. A parallel net of (1-NN, k-NN) classifiers for optical inspection of surface defects in ferrites. MG&V, 7(1-2):99-112, 1998.
G. Vernazza, M. Lugg, T. Postupolski, A. Jóźwik, L. Chmielewski, D. Chetverikov and M. Peri. SQUASH: Standard Compliant Quality Control System for High-Level Ceramic Material Manufacturing. In Proc. INCO-COPERNICUS-INTAS Workshop on Advanced Ceramics and Alloys, pages 35-40, Brussels, Belgium, Mar 12-13, 1998. European Commission, Directoriate Generale XII.
L. Chmielewski, M. Skłodowski, W. Cudny, M. Nieniewski and A. Jóźwik. Optical system for detection and classification of surface defects in ferrites. In Proc. 3rd Symp. Image Processing Techniques (TPO'97), pages 1-13, Serock, Poland, Oct 29-31, 1997. Oficyna Wydawnicza Politechniki Warszawskiej.
M. Mari, C. Dambra, D. Chetverikov, J. Verestoy, A. Jóźwik, M. Nieniewski, M. Skłodowski, L. Chmielewski, W. Cudny and M. Lugg. The CRASH Project: Defect Detection and Classification in Ferrite Cores. In A. Del Bimbo, editor, Proc. 9th Int. Conf. Image Analysis and Processing, number 1310 in Lecture Notes in Computer Science, pages 781-787 (vol. II), Florence, Italy, Sept 17-19, 1997. Springer Verlag, Berlin.
A. Jóźwik, L. Chmielewski, W. Cudny and M. Skłodowski. A 1-NN preclassifier for fuzzy k-NN rule. In Proc. 13th Int. Conf. Pattern Recognition, pages D-234 - D-238, Wien, Austria, Aug 25-29, 1996. IAPR, Technical Univ. Vienna.
[Law80] K. I. Laws, Textured image segmentation, Univ. of Southern California, Image Processing Institute, USCIPI Report 940, Jan 1980
[Pra91] W. K. Pratt, Digital Image Processing, John Wiley, New York 1991. [WuCh92] C-M. Wu, Y-C. Chen, Statistical feature matrix for texture analysis, CVGIP: Graphical Models and
Image Processing, 54, 5, 1992, 407-419. [YBF95] G. Z. Yang, P. Burger, D. N. Firmin, S. R. Underwood, Structure Adaptive Anisotropic Filtering for
Magnetic Resonance Image Enhancement, Proc. 6th Int. Conf. CAIP, Prague, Czech Republic, Sept. 6-8, 1995, 384-391. Lecture Notes on Computer Science. Springer Verlag, 1995.