SWITCHING REGULATOR WITH DYNAMICALLY ADJUSTABLE SUPPLY VOLTAGE FOR LOW POWER VLS

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    SWITCHING REGULATOR WITH DYNAMICALLY ADJUSTABLESUPPLY VOLTAGE FOR LOW POWER VLSI

    Sandeep Dhar and Dragan Maksimović

    Colorado Power Electronics Center

    Department of Electrical and Computer Engineering

    University of Colorado, Boulder, CO 80309-0425,

      dhar,maksimov   @colorado.edu

     Abstract – The paper describes a switching regulator system

    for adaptive voltage scaling (AVS) where the supply volt-

    age to a digital VLSI chip is dynamically adjusted to the

    minimum value required for the desired system speed. The

    control loop includes a variable-frequency Watkins-Johnson

    switching DC-DC converter and a model of the critical path

    delay of the application. Simple bang-bang control of the

    critical path delay allows fast transient response to step

    changes in speed, and stable operation over a very wide

    range of system clock frequencies. A chip including the AVS

    controller and a small digital application has been fabricated

    in a standard CMOS process. Experimental results demon-

    strate operation over the application clock frequency rangefrom 10 kHz to 20 MHz, and a 12   s transient response for a

    step change in speed from standby to maximum throughput

    operation.

    1. Introduction

    The strong demand for low-power computing has been driven

    by a growing class of portable, battery-operated applications

    that demand ever increasing functionalities with low-power con-

    sumption. The power consumption is also a limiting factor in

    integrating more transistors in VLSI chips for portable appli-

    cations. The resulting heat dissipation also limits the feasible

    packaging and performance of the VLSI chip and system. Be-

    cause of the quadratic dependence of power consumption on thesupply voltage [11], reducing the supply voltage level is an ef-

    fective way to reduce power consumption. However lower sup-

    ply voltage, for a given technology leads to increased gate delay

    and as a result the application has to be operated at a reduced

    clock rate.

    More recently, adaptive (or dynamic) voltage scaling (AVS)

    has been proposed as an effective power management technique

    where the system supply voltage and the clock frequency of a

    digital VLSI application are dynamically adjusted to meet the

    application throughput requirements [1]-[8]. By reducing the

    supply voltage and application clock frequency, adaptive voltage

    scaling offers, in principle, superior power savings compared to

    simple on/off power management. Successful applications have

    included digital signal processing systems [1]-[5], I/O interface

    [6], and general-purpose microprocessor [7, 8].

    At the system level, AVS requires a voltage/frequency sched-

    uler that can intelligently vary the speed depending on the ap-

    plication requirements [7, 8]. At the hardware implementation

    level, the key AVS component is a controller that can automat-

    ically generate the minimum voltage required for the desired

    speed. Desirable features of an AVS controller include [8]-[10]:

    high efficiency of the power converter used to generate the vari-

    able supply voltage; ability to make voltage adjustments over

    Figure 1: Supply voltage and critical path delay waveforms illustratingsteady state operation of the “bang-bang” delay controller.

    a very wide range of clock frequencies to accommodate pro-

    cessing speeds from stand-by to maximum throughput; stable

    and fast transient response to minimize latency and losses when

    switching between different speed levels.

    Voltage regulation systems for adaptive voltage scaling include

    frequency locked loop (FLL) based scheme [8], phase locked

    loop (PLL) based scheme [2, 9], and a delay-line based speed

    detector [3, 5]. In these approaches, the control loop design

    requires a careful compromise between the loop stability and

    dynamic response times [2, 8, 9] or multiple test clock cy-

    cles needed [3, 5]. In addition, the capture range of PLL or

    FLL based schemes may limit the achievable range of operat-ing system clock frequencies. Also, since the system clock in

    a PLL/FLL scheme is generated by a VCO operating from the

    supply voltage [2, 8, 9], the system clock suffers from variable

    clock jitter due to supply voltage noise.

    The contribution of this paper is to introduce the theory and

    concept of a simple digital control scheme for AVS based on

    the “bang-bang” control method. The controlled variable is the

    critical path delay of the application. This variable is forced

    to be between the limits that correspond to the supply voltage

    value being close to the minimum required for the desired sys-

    tem clock frequency. The bang-bang delay control method ef-

    fectively removes the stability concerns, and allows fast tran-

    sient response and operation over a very wide range of clock frequencies. Furthermore, since the system clock and supply

    voltage are generated independently, system clock jitter can be

    effectively reduced.

    This paper is organized as follows. The proposed AVS con-

    troller is described in Section 2. Design of the power converter

    embedded in the control loop is given in Section 3. Simula-

    tion results of the proposed scheme and experimental results ob-

    tained from a fabricated chip that combines the AVS controller

    and a simple test application are presented in Section 4 followed

    by conclusions in Section 5.

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    Figure 5: Implementation of the control logic to generate   . Alldevices are assumed to be operating at supply voltage

    tions, i.e., at the maximum supply voltage, and at the maximum

    clock frequency

      . The delay-cell is then designed

    using the model parameters for that process corner. Next, the

    delay-line length   is selected such that the test clock at

    the maximum system clock frequency is just able to propagate

    through this length when the supply voltage to the delay-line

    has the maximum value. The length   can be altered by

    choice of the device sizes in the delay-cell design. This choice

    also affects the output voltage ripple

      as explained in Sec.

    3.2.Since the test takes one half of the test clock period (i.e. when

    is at logic 1), the critical path model effectively captures

    half of the application worst-case critical path delay. With the

    delay-line fabricated on the same chip as the application, the

    delay-line characteristics scale with the application for voltage,

    process or temperature variations.

    It should be noted that for proper testing of the

      value, the

    clock    must have a 50% duty cycle. Instead of placing

    this responsibility on the external clock, in our scheme the test

    clock and the system clock are obtained by dividing an external

    clock (at

      ) by 2.

    2.3 Control LogicFig. 5 shows the implementation of the control logic that takes

    as inputs the level-shifted delay-line taps DATA2, DATA1, and

    DATAH and outputs the control signals for the power converter

    switches. As explained in Sec. 2.1, a logic 1 on the input DATAi

    implies that the test clock could not propagate to DATAi within

    the test clock period. For the outputs, a logic 1 value turns on a

    power converter switch. These signals are explained below with

     

     

    Figure 6:  State diagram showing state of the converter power switchescontrolled by (a) CONT IN and (b) CONT DIS. The arcs are labeled

    with valid input combinations

     

    Figure 7: modified Watkins Johnson (WJ) converter used in the

    AVS scheme

    reference to the modified Watkins-Johnson converter shown in

    Fig. 7;

    CONT IN : controls the input side switch   . When turned on,

    the switch connects   to the converter network.

    CONT OUT : controls the output side switch   . When turned

    on, the switch allows the charging or discharging of the output

    capacitor through the converter.

    CONT DIS : controls the output discharge switch   . When

    turned on in conjunction with   it allows the capacitor to dis-

    charge through the inductor.

    Fig. 6 shows the state diagram for the control outputs CONT IN

    and CONT DIS. Control output CONT OUT is the logic sum

    of these control signals. For example in steady state the inputs

    (DATA2, DATA1, DATAH) are at logic values (0,1,1) which

    implies that   is sufficient for the test clock to propagate

    through the critical path model consisting of 

      cells, but not

    enough to propagate through the additional delay ripple of 

    cells. Depending on the previous state of the converter switch

    and the supply voltage limit (   or   ) reached the

    power converter switches are turned on or off.3. Variable-Frequency Switching Converter

    While any step-down switch-mode power converter should suf-

    fice, a desirable property of the power converter is that in steady

    state operation the output voltage should start increasing when

    the control signal CONT OUT is logic 1, and start decreasing

    when CONT OUT is logic 0. This allows for a simple, stable

    bang-bang control of the delay and therefore of the output volt-

    age ripple.

    The switching converter we selected for the AVS controller

    (Fig. 7) is a modification of the Watkins-Johnson (WJ) converter

    [12]. The WJ converter has the desirable property that the out-

    put voltage will always decrease when the converter switchesare turned off as compared to a standard step-down (buck) con-

    verter.

    The WJ converter is operated in the discontinuous conduction

    mode (DCM) in steady state. In this mode of operation the con-

    verter switches

      and

      turn on for short durations of time.

    The inductor current is discontinuous and is zero at the end of 

    the converter switching period.

    3.1 Dynamic response to step changes in clock frequency.

    3.1.1 Step change from low

      to high

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    Figure 8: LC networks used to model the transient response of 

    the converter to step changes in frequency, (a) for a step change

    from low to high

      and (b) a step change from high to low

    To minimize latency and/or additional losses, it is desirable to

    have fast transient response to step changes in clock frequency.

    The converter and the controller transient response to a step

    change from low to high   is determined by a simple open-

    loop model shown in Fig. 8(a). We assume that the converter

    operates in DCM so that initially the inductor current is zero.

    During this voltage transient the supply voltage   is too low

    for the application and the the system clock    is disabled.

    During this time, the application consumes almost no current

    (

      0) . As a result,

      =

      during the transient. The

    capacitor voltage

      is at some initial value   .

    At

      , the switches   and   are closed and voltage

    is applied across the terminals of the network. We are inter-

    ested in the time taken for the capacitor voltage to reach a value

    . This can be found by solving the differential

    equations for the network, resulting in

    (1)

    3.1.2 Step change from high   to low

    Similarly the converter transient response to a step change from

    high to low

      is determined by the simple open-loop

    model shown in Fig. 8(b). The inductor current is initially zero.The capacitor is at some initial voltage

      and is discharging

    with load current

      .

    At

      , the switches

      and

      close and the capacitor ad-

    ditionally discharges through the inductor. Once again we are

    interested in the time take for the capacitor voltage to reach a

    value   . For simplicity we can ignore the load

    current giving us the solution,

    (2)

    The actual transient time is less than (2) since it includes the ca-

    pacitor discharge through the load. Equations (1) and (2) show

    that the transient responses are of the order of 

      .

    3.2 Converter Switching Frequency

    In steady-state (DCM) operation, the converter switches turn

    on for a short time interval

      charging the capacitor   to

    , followed by a longer period

      over which   dis-

    charges to

      . Under this assumption the capacitor charg-

    ing time period can be ignored and the switching period of the

    converter

      equals

      .

    (3)

    Consequently the converter switching frequency   can be

    given as,

    (4)

    where

      is the power consumption of the application. However

    depends on the delay-line parameters (   and   ) and

    . This dependence can be found as follows:

    At its valley voltage value

      the delay through the criti-

    cal path model is given as,

    (5)

    where

      is the delay through a delay-cell and is a function of 

    , i.e.

      .

    At its peak voltage value

      the delay through the delay-

    line is

    (6)

    Since these delays represent the test portion of    , they are

    equal. Equating the two sides and simplifying by keeping only

    the linear terms in the Taylor expansion gives us

    (7)

    Furthermore, the relation between

      and   was obtained

    by a curve-fit to be approximated as,

    (8)

    Taking the derivative and substituting in (7) we have,

    (9)

    As

      increases so does

      . The delay-line parameters

    and

      can thus be set to limit the output voltage ripple at

    the maximum supply voltage. The output voltage ripple is not

    determined by the converter parameters, which is an advantage

    of the scheme since it allows for straightforward design of the

    WJ converter.

    To a first order the power consumption

      of the application is,

    (10)

    where

      is a constant. Substituting for

      and

      in (4)

    yields

    (11)

    Since the test period is also one-half of the system clock period,

    can be related to   using (8),

    (12)

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    Figure 9: Block diagram of fabricated chip with external WJ converterproviding AVS of a 6x6 multiplier with registered outputs.

    Substituting in (11) gives us,

    (13)

    This relation implies that the converter switching frequency in-

    creases with   (and   ). This is desirable, because it

    implies that the converter switching frequency scales with the

    system clock frequency. As a result, switching losses in the

    converter also scale with application load power, and the con-

    verter can maintain relatively high efficiency over a wide range

    of operating conditions.

    3.3 Selection of Converter Components

      and 

    As described by (1), (2) and (13),   is inversely proportional

    to   and the transient responses are of the order of 

      . Hence

    can be selected to set the switching frequency. It is desirable

    to have a small   so that the transient response is faster and

    the losses in transient are smaller. However a higher switching

    frequency also results in higher switching losses [12] which re-

    duces the steady-state power efficiency of the converter. Using

    (10),   can be inferred from power consumption of the ap-plication for the measured

      and   .   and   have

    already been selected to limit the output voltage ripple. Hence

    can be selected to set the maximum switching frequency at

    the maximum supply voltage. Once   has been selected,

      is

    selected to adjust the transient response time. How short the

    transient response can be is constrained only by the ability of 

    power switches to conduct increased peak inductor current and

    the conduction losses in the converter switches.

    4. Simulation and Experimental Results

    The entire scheme except for external

      and   was designed in

    a standard CMOS process and extensive Spice simulations were

    performed.

    A chip implementing the AVS controller was designed in a 1.5

    standard CMOS process available through MOSIS (Fig. 10).

    The area taken by the AVS controller including pads is 0.88

    . The chip also contains a 6x6 array multiplier which was

    used as a test application for the controller. The outputs of the

    multiplier are registered and are updated at the rising edge of 

    the system clock. A model extracted from layout of the mul-

    tiplier was simulated at the typical process corner to determine

    that under worst-case input data, and at an operating frequency

    of 20MHz, the multiplier requires a supply voltage of 2.8   . The

    Figure 10:  Die photo of chip implementing AVS controller for the testapplication

           

       

    Figure 11:  Plot of    

      as a function of 

      for a test where   

    was adaptively scaled to its minimum value for operation at the given

    system clock frequency.

      is varied from 20KHz to 40MHz.

    parameters used in the typical process corner model were then

    used to design the critical path model of the delay-line, with

    appropriate sizing of the devices in the delay-cell such that for

    delay line length

      a test clock pulse at

    20MHz and   = 2.8 V is just able to propagate to the level-shifted tap DATA2. With these parameters the maximum

    is about 150   at 2.8   (cf. equation 7).

    A test circuit for AVS of the multiplier was designed with a WJ

    converter closing the loop externally as shown in the block di-

    agram representation (Fig. 9). The delay-line for the fabricated

      

     

     

     

    Figure 12:  Comparison of measured power consumption for differentschemes. From top to bottom, (a)

      

      = 3 V, constant, (b) AVS with

    power consumption on-chip only and (c) including the power consump-

    tion in the WJ-converter.

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    Figure 13:   Measured power efficiency of WJ-converter as a functionof 

      when used in the closed loop AVS scheme.

    chip does not include the delay-cells to detect high

      and

    during a step change from high to low   the capacitor is

    simply allowed to discharge to the lower supply voltage value.

    From power consumption measurements of the multiplier,

    was estimated to be about 4 pF. It was desired to have a converter

    switching frequency about 50 kHz at the maximum supply volt-

    age.   = 47 nF was selected by substituting for values in (13).

    Also, it was desired to have a worst case transient response

    15

      s for a step change from the lowest system clock frequency(10 kHz,

      = 0.8 V) to the highest system clock frequency

    (20 MHz,

      = 2.8 V). Using (1),

      was selected to be 750

    H.

    A plot of 

      as a function of 

      is shown in Fig. 11. It

    is observed that the control loop provides the   over a very

    wide range of 

      , which is an advantage of the proposed

    controller. It is possible to realize very low power stand-by op-

    eration at very low clock frequency, and the supply voltage close

    to the threshold voltage of the devices. Fig. 12 shows the mea-

    sured power consumption as a function of 

      , of the AVS

    application compared to fixed   operation. For illustration,

    both the power consumption excluding the converter and includ-

    ing the converter losses are shown. The power levels in Fig. 12are low due to the small complexity of the multiplier application.

    The power efficiency,   of the WJ converter over this range of 

    frequencies is given in Fig. 13. Due to low output power levels

    of the converter, the converter losses become significant only at

    very low frequencies, resulting in low   .

    A second test was designed to demonstrate the fast transient

    response of the control loop from the lowest operating supply

    voltage to the maximum supply voltage. Two external clock 

    frequencies

      = 20 kHz and

      = 40MHz were applied

    to a switch that alternated between the two frequencies. Details

    of this transient response around the vicinity of the step change

    in frequency are seen in Fig. 14. The transient from

      = 0.8

    V to   = 2.8 V takes about 12   , which compares favorablyto the results reported in earlier publications [3, 5, 7, 8, 10].

    5. Conclusions

    Adaptive voltage scaling (AVS) of a supply voltage is emerging

    as an effective power management technique for digital VLSI

    applications. The paper describes a delay-line based regulation

    scheme which is simple to implement and allows fast transient

    response to step changes in speed, and stable operation over a

    very wide range of system clock frequencies. The delay is mea-

    sured at the system clock rate, which minimizes the system la-

    Figure 14:  Plot of supply voltage

      , control signal CONT IN, and

    inductor current   for the transient time period for a step change in

    from 20 kHz to 40 MHz.

    tency. The Watkins-Johnson converter is shown to be well suited

    for closed loop delay-line regulation. The design criteria for the

    selection of the converter components is straightforward and is

    described. A chip including the AVS controller and a small test

    application has been fabricated in a standard CMOS process.

    Experimental results demonstrate operation over the clock fre-quency range from 10KHz to 20MHz, and a 12   s transient re-

    sponse for a step change in system clock frequency from 10 kHz

    to 20 Mhz.

    References

    [1] L. Nielsen, C. Niessen, J. Sparso, K. Van Berkel,“Low-power op-eration using self-timed circuits and adaptive scaling of the sup-ply voltage,”  IEEE Trans. on VLSI Systems, vol.2, pp. 391-397,Dec. 1994.

    [2] A. Chandrakasan, V. Gutnik, T. Xanthopoulos, “Data driven sig-nal processing: An approach for energy efficient computing”,Proc. ISLPED’96 , pp. 347-250, Aug. 1996.

    [3] T. Kuroda et. al., “Variable Supply-Voltage Scheme for Low-Power High-Speed CMOS Digital Design”,   IEEE Journal of Solid-State Circuits, vol. 33, pp. 454-462, Mar. 1998.

    [4] S. Dhar, D. Maksimović, “Low Power Digital Filtering UsingMultiple Voltage Distribution and Adaptive Voltage Scaling”,Pro.c ISLPED’00, pp. 207-209, Jul. 2000.

    [5] T. Kuroda et. al., “Variable Supply-Voltage Scheme with95% Efficiency DC-DC converter for MPEG-4 codec,”   Proc.

     ISLPED’99, pp. 54-59

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    [8] T. D. Burd, T. A. Pering, A. J. Stratakos, R. W. Brodersen, “A

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    [9] V. Gutnik, A. Chandrakasan, “An Efficient Controller for Vari-able Supply-Voltage Low Power Processing”,  1996 Symposiumon VLSI Circuits, pp. 158-159.

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    [12] R. Erickson, D. Maksimovic,   Fundamentals of Power Electron-ics, 2nd Edition, Kluwer Academic Publishers, 2000.

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