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Testing OIF Optical and Electrical Implementation Agreements Gary Goncher Tektronix, Inc.

Testing OIF Optical and Electrical Implementation Agreements Gary Goncher Tektronix, Inc

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Page 1: Testing OIF Optical and Electrical Implementation Agreements Gary Goncher Tektronix, Inc

Testing OIF Optical and Electrical Implementation Agreements

Gary GoncherTektronix, Inc.

Page 2: Testing OIF Optical and Electrical Implementation Agreements Gary Goncher Tektronix, Inc

Agenda

OIF Interfaces Mask Testing, Optical and Electrical Jitter Testing Jitter Component Separation Physical Layer Protocol Testing Summary

Page 3: Testing OIF Optical and Electrical Implementation Agreements Gary Goncher Tektronix, Inc

OIF Interfaces

OIF Electrical Interfaces

PHYDevice

DataTransmitLink Layer

Device

ReceiveLink Layer

Device

Status

Data

Status

System PacketInterface (SPI-5)

TransmitInterface(SPI-5)

ReceiveInterface(SPI-5)

FECDevice

SERDESDevice

andOptics

SERDES FramerInterface (SFI-5)

SERDES FramerInterface (SFI-5)

Data Data

DataData

Clock

Clock

Clock

Clock

Page 4: Testing OIF Optical and Electrical Implementation Agreements Gary Goncher Tektronix, Inc

Mask testing

Mask testing measures many parameters simultaneously:• Amplitude (signal to noise)• Rise and fall times• Edge jitter

Page 5: Testing OIF Optical and Electrical Implementation Agreements Gary Goncher Tektronix, Inc

Mask testing

Example: SFI-5 transmit mask

Normalized bit time [UI]

0 XTnm1 XTnm2 1-XTnm2 1-XTnm1 1

Differential signal amplitude

[V]

0

-YT2

-YT1

YT1

YT2

ReferencePoint

Data /Clock

XT1 (UI) XT2 (UI) YT1 (V) YT2 (V) DJ [ppUI]

Total JitterJTot[pp UI]

A Data 0.175 0.45 0.50 0.25 0.17 0.35A Clock 0.15 0.45 0.50 0.25 0.12 0.30C Data 0.225 0.50 0.50 0.25 0.20 0.45C Clock 0.20 0.50 0.50 0.25 0.15 0.40

Page 6: Testing OIF Optical and Electrical Implementation Agreements Gary Goncher Tektronix, Inc

Mask testing

Page 7: Testing OIF Optical and Electrical Implementation Agreements Gary Goncher Tektronix, Inc

Jitter Testing

Jitter is mis-positioning of data or clock edges that can result in data bit errors

Jitter results from different causes, and is typically broken into random and non-random (deterministic) components for purposes of bit error estimation

Jitter parameters are specified for all OIF physical interfaces and must be tested

Page 8: Testing OIF Optical and Electrical Implementation Agreements Gary Goncher Tektronix, Inc

Jitter Testing

Jitter of a random nature has Gaussian distribution

1-sigma or RMS 7-sigma

Page 9: Testing OIF Optical and Electrical Implementation Agreements Gary Goncher Tektronix, Inc

Jitter Testing

Deterministic jitter has non-Gaussian distribution

Random components

Deterministic components

Peak-to-Peak

1-sigma or RMS

Page 10: Testing OIF Optical and Electrical Implementation Agreements Gary Goncher Tektronix, Inc

Jitter Testing

Measuring Jitter:• Equivalent Time Sampling Methods• Time Interval Analyzer Method• $300,000 BERT Method• Real Time Oscilloscope Method

Separating Jitter: Rj/Dj and BER• ET scope averaging (frame scan)• $170,000 TIA and analysis software• RT scope with analysis software

Page 11: Testing OIF Optical and Electrical Implementation Agreements Gary Goncher Tektronix, Inc

Jitter Testing

Equivalent time histogram method

Page 12: Testing OIF Optical and Electrical Implementation Agreements Gary Goncher Tektronix, Inc

Jitter Testing Time Interval Analyzer Method

• T1-T2 then rearm then T1-T3 then rearm… leaving lots of dead time between measurements

• No continuous time record means frequency components of jitter can’t be captured

• Measurements made over seconds will include wander

T1 T2 T3 T4

start stop

rearm

start stop

Page 13: Testing OIF Optical and Electrical Implementation Agreements Gary Goncher Tektronix, Inc

Jitter Testing

BERT Method - standard technique to measure BER

• Long measurement time (3.25Gbps*1E12*1000=307692s=85hrs)

BERT AcquireDUTBERT Sig Gen

Trillions of bits:

Pseudo-random codes, 1E23 bits

common

Page 14: Testing OIF Optical and Electrical Implementation Agreements Gary Goncher Tektronix, Inc

Jitter Testing Oscilloscope Rj/Dj

Separation and BER Estimation:

• Based on real time acquisition data

• Includes Golden PLL TIE measurements

• Spectral Analysis used to decompose jitter

• Wide noise margin – works even with substantial system noise

• Works with short or long data repeats – no pattern details required (you provide bit rate and pattern length)

• Trigger at any random point in your data

• Works with CSA7000, TDS5000, TDS6000, TDS7000 instruments

• Results for Rj, Dj, Pj, DDj,

Page 15: Testing OIF Optical and Electrical Implementation Agreements Gary Goncher Tektronix, Inc

Jitter Component Separation Start with

• TIE• PLL TIE

Perform FFT• Determine

frequency and pattern rate

• Sum pattern related bins

• Sum unrelated periodic bins

• Measure RMS of remaining bins

• Estimate BER

Page 16: Testing OIF Optical and Electrical Implementation Agreements Gary Goncher Tektronix, Inc

PLL Protocol Test

Several OIF physical layer interfaces require state machine implementations and pass status messages

Examination of interface state and decode of status messages is necessary for debugging

Examples will be shown for the OIF SPI-4.2 10 Gb/s packet interface

Page 17: Testing OIF Optical and Electrical Implementation Agreements Gary Goncher Tektronix, Inc

SPI-4.2 Protocol Test

SPI-4.2 Test Requirements• Support SPI-4.2 rates up to 350 MHz clock

and 700 Mb/s data rate• SPI-4.2 FIFO Status Decode with DIP 2 parity

check• DIP4 Parity Checking for SPI-4.2 data• Trigger on Control (SOP, EOP, ABORT) &

Packet Data• Display of Packetized SPI frames• ASCII payload decoding • Per Port Post-processed filtering of data• Real time filtering of IDLE conditions

Page 18: Testing OIF Optical and Electrical Implementation Agreements Gary Goncher Tektronix, Inc

SPI-4.2 Protocol Test

SPI-4.2 Example – Trigger on MACTrigger on Packet (MAC)

Des: 00 00 00 00 00 01Src: 00 00 00 00 00 02

Page 19: Testing OIF Optical and Electrical Implementation Agreements Gary Goncher Tektronix, Inc

SPI-4.2 Protocol TestPost-Processing Software Packet and control word decoding Packetized display of SPI-4.2 & SPI-3 frames ASCII payload decoding Post-processed filtering of data per port (user selectable)

FIFO Status Decode

Packet Display

ASCII payload decoding

Page 20: Testing OIF Optical and Electrical Implementation Agreements Gary Goncher Tektronix, Inc

SPI-4.2 Protocol Test Integration of physical &protocol

information:

SPI4.2 SOP Trigger

Integrated digital/analog probing

Page 21: Testing OIF Optical and Electrical Implementation Agreements Gary Goncher Tektronix, Inc

Summary

Implementation of physical interfaces requires extensive testing to assure interoperability

Both physical layer electrical/optical properties and protocols must be verified