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THz-Raman® Spectroscopy Benchtop Systems

Features• Fast collection of THz-Raman® spectra from

5cm-1 to >3000cm-1 (150GHz to 90THz) • Simultaneous Stokes and anti-Stokes signals

improve SNR while providing inherent calibration reference

• Available as add-on to an existing Raman systems or spectrometers, or as a complete custom-configured system

• Convenient vial holder option for fast sample measurements

• Fiber coupling enables easy interface to a wide range of spectrometers

• Available at 488nm, 514nm, 633nm, 532nm, 785nm, 830nm, and 976nm excitation wavelengths

Applications• Polymorph identification and analysis• Trace detection and source attribution of

explosives/hazmat/drugs• Crystal and phase monitoring• Structural studies of nano- and

bio- materials, photovoltaics, and semiconductors

• Forensics, archeology, mineralogy

THz-Raman® – The “Second Fingerprint” of RamanOndax’s patented1 THz-Raman® Spectroscopy Systems extend the range of traditional Raman spectroscopy into the terahertz/low-frequency regime, exploring the same range of energy transitions as terahertz spectroscopy – without limiting the ability to measure the fingerprint region. The THz-Raman spectral region covers both Stokes and anti-Stokes signals from ±5 cm-1 to 200 cm-1, (or 150 GHz to 6 THz), which contain important structural information about the molecule or crystal lattice. This region reveals a new “Structural Fingerprint” to complement the traditional “Chemical Fingerprint” of Raman, enabling simultaneous analysis of both molecular structure and chemical composition in one instrument for advanced materials characterization.

 See What You’ve Been Missing – More Data, Better Sensitivity and ReliabilityTHz-Raman spectra show clear differentiation of structural attributes of the material, ideal for identification and analysis of polymorphs, raw material sources, defects & contamination, crystal formation and orientation, phase monitoring and synthesis methods. Applications include pharmaceuticals, explosives, narcotics, nano- and bio-materials, semiconductors, photovoltaics, and petrochemicals.

By adding both low-frequency and anti-Stokes signals to the traditional fingerprint, THz-Raman systems boost overall Raman intensity and improve SNR. The anti-Stokes signals can also be used to calculate in-situ temperatures and to confirm the position/validity of Stokes peaks, providing an inherent calibration reference (via Stokes/anti-Stokes symmetry) that improves overall confidence and reliability.

One Sample, One System, One AnswerCombining both composition and structural analysis eliminates the need for multiple samples and instruments, lowering capital, training and maintenance costs. These compact plug-and-play platforms can be integrated with virtually any lab-grade microscope or Raman system. With excitation wavelengths ranging from 488nm to 976nm, and a wide range of options and compatible spectrometers to choose from, an Ondax THz-Raman® system can be optimized to match any application.

XLF-CLM (with vial holder)

1 Patents #8,184,285 and 7,986,407

Full Raman spectrum of the pharmaceutical Carbamazepine showing both the THz-Raman “Structural Fingerprint” and traditional “Chemical Fingerprint” regions. Note higher intensity

and symmetry of THz-Raman signals.

XLF-C(with fiber input

for external laser)

THz Raman: Covering low frequencies, anti-Stokes, plus the traditional fi ngerprint region!THz-Raman® extends the reach of Raman systems into the low-frequency, (low wavenumber) spectral regime where important structural details can be discerned, including polymorphs, isomers, cocrystals, and lattice/phonon modes. The high optical density, ultra-narrowband, high-throughput design virtually eliminates the Rayleigh signal while enabling rapid collection of both Stokes and anti-Stokes signals from ± 5cm-1 to >3,000 cm-1.

The examples below show spectra in the ~5-200cm-1, or 150GHz-6THz regimes, using two diff erent excitation wavelengths. For strong Raman scatterers such as Sulfur (left), the ratio of Rayleigh peak to signal peak is exceptionally low. The L-Cystine spectrum (right) shows how narrow the fi lters are by producing clearly diff erentiated signals down to

THz-Raman® System Specifications:Parameter Units Specification

Wavelength1 nm 532 785/830 976

Power at sample port (min) mW 50 to 2502 100 300

Physical Dimensions (W x L x H) in 9” x 14” x 3” 9” x 14” x 3” 9” x 14” x 3”1 Model XLF-C also available in 488nm, 514nm, and 633nm2 Specify power level at time of order

Spectrometer3:Fixed Grating Spectrometer Tunable Grating Spectrometer

Spectral Range (typical) -200cm-1 to +2200cm-1 0-1100 nm (w/Si Detector)

Spectral Resolution 2.5cm-1 to 4cm-1 1.25cm-1 or greater

Computer Interface USB USB

3 Spectrometer specifications depend on manufacturer and options ordered

System Description and Configurations:All THz-Raman® Series platforms are ultra-compact and simple to connect via fiber to almost any spectrometer or Raman system. Our patented SureBlock™ ultra-narrow-band Volume Holographic Grating (VHG) filters precisely block only the Rayleigh excitation with >OD8 attenuation, enabling simultaneous capture of both Stokes and anti-Stokes signals. A high-power, wavelength-stabilized, ASE-free single-frequency laser source is precisely matched to the filters to assure maximum throughput and exceptional attenuation of the excitation source.

The TR-MICRO mounts directly to a broad range of popular microscope platforms and micro-Raman systems, and can be easily switched in and out of the optical path. The system includes an Ondax SureLock™ 785nm, 830nm, or 976nm laser source, notch filters, and optional circular polarization (linear polarization is standard). A sample imaging camera is also available upon request.

The XLF-CLM is configured for Benchtop use and offers an optional vial/cuvette sample holder for fast, easy measurements. The system also comes with a standard cage mounting plate (centered on the collimated output beam) to allow for customized collection optics or easy integration into a customized system. The XLF-CLM includes a SureLock™ 785nm, 830nm, or 976nm laser source, notch filters, and optional circular polarization. The XLF-C has a fiber input port to accept a fiber coupled DPSS or gas laser as an alternative excitation source to our diode lasers.

Model XLF-CLM with Integrated Laser Module and Sample Vial/Cuvette Holder Model XLF-C with fiber coupled input

for gas or DPSS laser

Model TR-MICRO Mounted on Leica DM 2700 M

Compatible with either fixed-grating or tunable grating

spectrometers

850 E. Duarte Rd. Monrovia, CA 91016626-357-9600 (Tel)626-513-7494 (Sales Fax)

For more information about Ondax products and the name of a local representative or distributor, visit www.ondax.com,email sales@ondax.com, or call (626) 357-9600. Specification Subject to change without notice. Each purchased laser is provided with test data. Please refer to this data before using the laser. © 2014 Ondax, Inc. 6/14 - Rev. 1

Phase MonitoringThz-Raman can be used for in-situ phase monitoring. Shown at right are the phase changes of Sulfur observed when heated from room temp.(α) to 95.2°C (β) and then to the melting point of 115.21°C (λ). Note the clearly recognizable changes in both peak location and magnitude in the THz-Raman region, with no obvious shifts in peaks in the Raman fi ngerprint region.

Crystal MonitoringMonitoring the presence or formation of cocrystals is also improved using THz-Raman spectra. The fi gure at left shows the clearly recognizable peak shifts that occur when cocrystals are formed in a mixture of Caff eine and 2-Benzoic acid.

Gas SensingRotational modes of many gases can be clearly seen in the THz-Raman region. Signal intensities can be up to 10x those in the fi ngerprint region, opening up the possibility of using Raman for extremely sensitive gas sensing applications. The Stokes/anti-Stokes ratios can also be used for remote sensing of temperature.

Ordering Information

Additional ApplicationsAs with traditional Raman, THz-Raman spectra are inelastically scattered from the sample, are excited by a visible or NIR laser, and enable direct measurement of materials without special sample preparation or environmental control. THz-Raman spectra show clear diff erentiation of structural attributes of the material. A few example applications are shown below:

λ: Wavelength 1

A: Output Fiber2

B: Sample Port31 Wavelength= 532nm, 785nm, 830nm or 976nm. For 532nm, specify power at time of order2 100µm, 50µm, or 25µm to match spectrometer f # (NA)3 FS = Free Space, OB = Cage with Objective, CUV = Cuvette/Vial Holder

Sample Holder (Vial/Cuvette)Circular Polarization

XLF – CLM – λλλ – A – B Options:XLF – C – λλλ – A – B