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TI Space ProductsInnovating your space solution with leading-edge RHA and QMLV products
2017www.ti.com/space
MIL-PRF-38535 QMLClass V Qualified
Radiation HardnessAssured per MIL-STD-883Method 1019
Single Event EffectsCharacterized
2 | TI Space Products Guide 2017 Texas Instruments
Space Products GuideOverview/Table of Contents
TI Space ProductsTexas Instruments offers the most comprehensive selection of leading-edge radiation hardness assured (RHA) and QMLV products for space flight. With a proven legacy of 55+ years in the space market and supporting countless space programs both domestically and internationally, TI is a trusted partner. We focus on radiation performance and best-in-class SWaP (Size, Weight, and Power) to enable leading-edge designs. The breadth of TI’s space portfolio provides a full signal-chain solution. The portfolio includes the smallest RHA point-of-load power solutions, fast discrete SerDes, and some of the world’s highest performance data converters.
TI’s Space products include MIL-PRF-38535 QML Class V and RHA components. These devices are typically supported with Total Ionizing Dose (TID) and Single Event Effects (SEE) test reports to address poten-tial product degradation in a space environment. The test results for these devices are available at www.ti.com/radiation
Satellite Applications• Satellite bus/platform • General payload• Communications payload• Imaging payload• Data processing and storage
(solid-state recorder)• Telemetry sensors• Inertial navigation (IMU/INS)• Manned vehicles• Launch vehicles• Power generation and distribution• Health monitoring
Analog Output
Digital Output
Table of contents
Introduction 2
Radiation Testing and Design Resources 3
Featured ProductsRadiation Hardened Power Management 4Radiation Hardened Interface 6Radiation Hardened Data Converters 8Radiation Hardened Amplifiers 10Radiation Hardened Clock and Timing 12
TI Worldwide Technical Support 12
DSP SerDes
PWM Controller
Power FET
Clocking Space Logic
Point-of- Load
Power
Memory
Low-Speed ADC
MUX
FPGA
High- Speed ADC
High- Speed DAC
High-SpeedOp Amp
High-SpeedOp Amp
High-Speed
Op Amp
TI Space Products Portfolio
TI offers RHA and radiation-tolerant, hermetically packaged components high-lighted in each of the red blocks below.
For a complete list of TI’s Space Products, see www.ti.com/spaceTo view this guide online, visit www.ti.com/spaceguide
Texas Instruments TI Space Products Guide 2017 | 3
Radiation Testing and Design Resources
Radiation Testing
Radiation in Space High-energy protons, electrons and heavy ions are present in the natural space environment that can adversely affect the operation of semiconduc-tors used in space applications. In space, these particles generally have so much energy that they easily ionize atoms, freeing negatively-charged electrons and leaving the positively-charged atoms. In electronic devices, this ionization process creates excess charge, which can produce both tran-sient and lasting effects.
Total Ionizing DoseThe most common radiation require-ment in the aerospace design commu-nity is Total Ionizing Dose (TID), also known as total dose. Total-dose effects are caused when electrons and protons create excess charge in the dielectric layers used for insulation in electronic devices. Total-dose effects are cumu-lative and require chronic exposure to numerous radiation events before device degradation becomes obvious. Electronics in a satellite or spacecraft thus accumulate TID damage over time as they operate under continuous levels of radiation. While electrons are mobile in insulators, the holes (positively-charged atoms) must move by breaking bonds and can become trapped in defects. The result of this accumulated positive charge in a device’s insulators leads to degradation
and/or device failure. The oxide charge buildup affects the current-voltage characteristics of transistors used in semiconductor circuits. Proper opera-tion of a transistor relies on the ability to switch it from a low-conductance (off) state to a high-conductance (on) state as the gate voltage passes through a threshold. Extended expo-sure to TID radiation can shift the threshold voltages, making transistors easier or harder to switch. Radiation may also increase the leakage current, causing the on and off states of the transistors to become less distinguish-able. Either effect can ultimately cause circuit failure. For our space products, these effects have been characterized and summarized in our TID Radiation Reports at www.ti.com/radiation
Single-Event EffectsThe second and perhaps the most critical radiation effect to consider is Single-Event Effects (SEEs). SEEs actually include multiple different failure modes; the one commonality is that all of the failure modes are created by the passage of a single ionizing particle (single-event). SEE failures in digital and analog devices are usually “soft,” meaning that the data or node voltage is affected but the device is not perma-nently damaged. These failures include the Single-Event Transient (SET), the Single-Event Upset (SEU), the Single-Event Functional Interrupt (SEFI), and possibly the Single-Event Latch-up (SEL), which may be destructive.
Power devices are dominated by hard failure modes such as the Single-Event Burn-Out (SEB) and Single-Event Gate Rupture (SEGR), but can also suffer from soft mechanism like SET in the output or a SEFI in the PGOOD signal. The functional failures caused by SEE are evaluated in space devices using the heavy ion beam provided by a cyclotron facility. These effects on our space products are captured in our Single-Event Effects radiation reports at www.ti.com/radiation
Space and High-Reliability Design ToolsTI’s High-Reliability portfolio offers a comprehensive suite of design tools to serve your simulation needs. You canfind support for transient and AC-Spice simulations, solution size estimation and thermal modeling via TI’s WEBENCH® simulation tools, and dgital I/O support via IBIS models. Our Spice models are thoroughly correlated to our Cadence design database, laboratory test benches, and mathematical represen-tations. A variety of sources are also used for IBIS model creation. These range from simulation tools in the IC design flow to third-party empirical testing. Ceramic package parasitics are extracted and included in the IBIS models.
More information at www.ti.com/webench
4 | TI Space Products Guide 2017 Texas Instruments
Radiation Hardened Power ManagementFeatured Products
3-A, Sink/Source DDR Termination Regulator with Built-In VTTREF Buffer TPS7H3301-SP
Key Features• Control input voltage: 2.5 and 3.3 V• VLDO input down to 0.9 V • Enable input and power good output • 10-mA buffered VTTREF • Source/sink VTT voltage output with droop compensation• Thermally enhanced 16-pin CFP (HKR) package
Radiation Performance• Total Dose (TID) tolerance = 100 krad RHA• SEL, SEB and SEGR immune to LET = 65 MeV-cm2/mg• SEU immune to LET = 65 MeV-cm2/mg
Applications• Space payload processing and data storage• DDR, DDR2, DDR3, LPDDR3, and DDR4 VTT memory
termination and VREF buffer
Benefits• RHA qualified and orderable as SMD: 5962R1422801VXC meets
DDR, DDR2, DDR3, LPDDR3 and DDR4 JEDEC specifications
• Smaller size than competing discrete solutions enabling very small form factor designs
• Outstanding SEE performance, VTT-VTTREF < ±5 mV (JESD8-9B standard is VTT-VTTREF < ±40 mV)
• Very low RθJC = 0.6°C/W• EAR99
3- to 6.3-VIN, 6-A, Monolithic Point-of-Load DC/DC Converter TPS50601-SP
Key Features• PVIN = 1.6 V to 6.3 V• 6-A maximum output current• Min output voltage to 0.8 V• Integrated 55-mΩ high-side and 50-mΩ low-side power FETs• Adjustable frequency from 100 kHz to 1.0 MHz • Parallel operation 180° out of Φ with Sync pin• Patented dynamic bias functionality included• Integrated tracking function• RθJC = 0.6°C/W• Packaged in thermally enhanced 20-pin ceramic flatpack (HKH)
and known good die (KGD)
Radiation Performance• TID = 100 krad RHA• SEL, SEGR, SEB immune to LET = 85 MeV-cm2/mg• SET/SEFI onset 40 MeV-cm2/mg
Applications• Satellite point-of-load (POL) power supplies
Benefits• RHA qualified and orderable as SMD: 5962R1022101VSC
(RHA) 5962R1022101V9A (KGD) and EAR99• 95% peak efficiency • Minimizes solution size through small package and excellent
load transient response with smaller output capacitances • Excellent for driving 12-A current through current share• Ease of implementing power sequencing schemes • Best in class thermal performance• WEBENCH® and PSpice models available
More information at www.ti.com/product/TPS50601-SP
TPS50601-SP
PVIN
VIN
VIN
EN
EN
SS/TR
RT/CLK
COMP
PGND
GND
PWRGDPWRGD
BOOTVOUT
PHASE
VSENSE
TPS7H3301-SPVTTREF
VTTREF = VDDQSNS
VDDQSNS
VLDOIN
VLDOIN
VLDOIN
PGND
PGND
PGND
PGND
EN
VDD/VIN
PGOOD
AGND
VTTSNS
VTT/Vo
VTT/Vo
VTT/Vo
VTT/Vo = VDDQ/2
Enable
Power Good
3.3 V or 2.5 V Supply
AGND
AGND
VDDQ
DDR – 2.5 VDDR2 – 1.8 VDDR3 – 1.5 VDDR3L – 1.35 VDDR4 – 1.2 V
More information at www.ti.com/product/TPS7H3301-SP
Texas Instruments TI Space Products Guide 2017 | 5
High-Speed Signal ChainHigh-Speed Analog-to-Digital Converters (ADCs)Radiation Hardened Power ManagementFeatured Products
1.5- to 7-VIN, 3-A Low-Drop-Out Regulator TPS7H1101A-SP
Key Features• VIN = 1.5 V to 7 V• Ultra-low dropout, PMOS pass device
62 mV (typ) @ 1 A, 335 mV (Max) at 3 A• Very-high accuracy = ±2%
Internal VREF = ±1.8%• Ultra-low noise: 20.33 μVRMS• PSRR: >45 dB at 1 kHz • Programmable softstart and OCP (with current reading) • Enable across all input voltages and Power Good output (for
sequencing)• Temperature range: –55°C to 125°C• Packaged in thermally enhanced 16-pin ceramic flatpack
Radiation Performance• TID = 100 krad, HDR and LDR• SEL immune to LET = 85 MeV-cm2/mg• SET onset 52 MeV-cm2/mg
Applications• Power management – LDO• RF components VCOs, receiver, ADC’s amplifiers• High PSRR, and low noise for clean analog-supply
requirement applications
Benefits• RHA Qualified: 5962R1320202VXC• ELDRS Free and EAR99 • SET at higher MeV is guaranteed to be low (no high
transients)• High power savings with lowest VIN on the Market for LDO
Wide VIN (2.3 to 20 V), 1.5-A Low-Drop-Out RegulatorTPS7A4501-SP
Key Features• VIN = 2.3 V to 20 V• Adjustable output from 1.21 to 20 V• Optimized for fast transient response.• Low Noise: 35 μVRMS (10 Hz to 100 kHz)• High ripple rejection: 68 dB at 1 kHz• No protection diodes needed• Less than 1-μA quiescent current in shutdown• Reverse battery and reverse current protection • Thermally enhanced 10-pin CFP (HKU) package
Radiation Performance• Total Dose (TID) 100 krad, HDR and LDR • SEL immune to LET = 85 MeV-cm2/mg • SET immune to LET = 75 MeV-cm2/mg
Applications• Power management — LDO• Satellite point-of-load (POL) power supplies• Satellite bus and payload
Benefits• RHA qualified and orderable as SMD: 5962R122402VHA• EAR99• Outstanding low-noise performance • Widest input voltage range for a RHA LDO
More information at www.ti.com/product/TPS7A4501-SP
More information at www.ti.com/product/TPS7H1101A-SP
CS
CIN
CSS
VIN
EN
PCL
SoftStart
FeedBack
COUT
3.3 VVOUT
GND
Comp
PowerGood
TPS7H1101A-SP
RCS
RPCL
5 V
Rb
Rt
500
450
499
350
300
250
200
150
100
50
00 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6
TA = 125°C
TA = 25°C
Output Current (A)
Dropout Voltage vs. Output Current
Dro
po
ut V
olt
age
(mV
)
6 | TI Space Products Guide 2017 Texas Instruments
Radiation Hardened InterfaceFeatured Products
Single 1.6- to 2.5-Gbps TransceiverTLK2711-SP
Key Features• 1.6- to 2.5-Gbps data rate• 16:1 serializer/deserializer• LVTTL parallel side interface• VML driver with internal termination on Rx • Output transmit pre-emphasis• Loss-of-signal detection circuitry• Built-in testability features
PRBS generation and verificationInternal loop back
• Temperature range: –55°C to +125°C• Available in 68-pin 14- x 14-mm ceramic QFP (HFG) package
Radiation Performance• TID = 25 krad• SEL immune LET = 65 MeV-cm2/mg
Applications• Satellite and communications payload• Satellite radar systems• Satellite guidance systems
Benefits• Orderable as SMD: 5962-0522101VXC • Ultra-low power consumption of 390 mW • EAR99• Backplane or cable applications
LVDS Quad, CMOS Differential Line DriverDS90C031QML-SP
Key Features• 5-V supply• Supply current only 25 mA in operation• >155.5-Mbps (77.7-MHz) switching rates • High-impedance LVDS outputs with power-off • Fail-safe logic for floating inputs• ±350-mV differential signaling • 400-ps maximum differential skew (5 V, 25°C) • 3.5-ns maximum propagation delay • Conforms to ANSI/TIA/EIA-644 LVDS standard • Available in 16-pin ceramic flatpack and SOIC
Radiation Performance• TID = 100 krad• SEL and SEFI immune > 100 MeV-cm2/mg
Applications• Satellite communication
Benefits• Orderable as SMD: 5962R9583301VxA • High-impedance LVDS outputs and fail-safe logic for cold
sparing• Ultra-low power consumption• Radiation (RHA) and space (QMLV) qualified
Other Drivers/Receivers in LVDS Family (Tx, Rx, 3.3 V, 5 V)• SN55LVDS31-SP 3.3-V quad LVDS driver• SN55LVDS32-SP 3.3-V quad LVDS receiver• SN55LVDS33-SP 3.3-V quad LVDS receiver with –4 to 5 V CM• DS90C032QML-SP 5-V quad LVDS receiver
More information at www.ti.com/product/DS90C031QML-SP
More information at www.ti.com/product/TLK2711-SP
DS90C031WxRQMLV DS90C032WxLQMLV
DIN1
DIN2
DIN3
DIN4
ROUT1
ROUT2
ROUT3
ROUT4
ENEN*
ENEN*
DOUT1+
DOUT1–
DOUT2+
DOUT2–
DOUT3+
DOUT3–
DOUT4+
DOUT4–
ROUT1+
ROUT1–
ROUT2+
ROUT2–
ROUT3+
ROUT3–
ROUT4+
ROUT4–
D1
D2
D3
D4
R1
R2
R3
R4
Backplaneor
50-ΩMedia
TLK2711-SPTLK2711-SP
FPGASpace Fiber
orGenericProtocol
FPGASpace Fiber
orGenericProtocol
CDCM7005-SP CDCM7005-SP
Texas Instruments TI Space Products Guide 2017 | 7
Radiation Hardened InterfaceFeatured Products
1:10 LVPECL Burrer/Clock Distribution with Selectable InputCDCLVP111-SP
Key Features• 1:10 differential LVPECL clock outputs with frequency range
from DC to 3.5 GHz• Supply voltage range: 2.375 V to 3.8 V• Low output skew: 15 ps (Typ)• Input MUX• Flexible input capability: LVDS, CML, SSTL, LVCMOS/TTL input
compatible • VBB reference voltage output for single-ended clocking• Operating temperature –55 to 125°C• Low additive jitter
Radiation Performance• TID = 50 krad (Si) RHA• SEL Immune LET = 69.2 MeV-cm2/mg • SEU Characterized up to 69.2 MeV-cm2/mg
Applications• Orbital observation systems (e.g. satellite, shuttles, space
stations, launchers)• Clock distribution
Benefits• Wide range supports various applications and use one
single device across multiple designs• Wide supply voltage saves additional cost on LDO• Low skew ensures high-quality clock distribution• Selectable input allows flexibility• QMLV/RHA qualified to full mil temp (–55 to 125°C)
RS-485 Differential Bus TransceiverDS16F95QML-SP
Key Features• Designed for multipoint transmission • Wide positive and negative input/output bus voltage ranges • Thermal shutdown protection • Driver positive and negative current-limiting • High-impedance receiver input • Receiver input hysteresis of 50 mV typical • Operates from single 5.0 V supply • Available in 10-pin ceramic flatpack
Radiation Performance• TID = 300 krad
Applications• Satellite communication• Defense electronics• Radar and guidance systems
Benefits• Orderable as SMD RHA: 5962F8961501VXA • Meets EIA-485 and EIA-422A specifications• Meets SCSI-1 (5 MHz) specifications • RHA and QMLV qualified
Other Drivers/Receivers in RS485 Family (Tx, Rx, 3.3 V, 5 V)• DS96F174MQML-SP Quad high-speed differential driver• DS96F175MQML-SP Quad high -peed differential receiver
More information at www.ti.com/product/DS16F95QML-SP
More information at www.ti.com/product/CDCLVP111-SP
GND
IN/OUTBUS PORT
RO
RE
DE
DID
1
2
3
4
8
7
6
5
R
VCC
CLK_SEL
VBB
13
12
11
10
5
CLK0
CLK0
CLK1
CLK1
3
6–
–
–
–
– – 4
7
2
+
+
0
1 Q8
Q8
Q9
Q9
31
30
29
28
Q0
Q0
Q1
Q1
8 | TI Space Products Guide 2017 Texas Instruments
Radiation Hardened Data ConvertersFeatured Products
Fully-Buffered, 12-Bit, 1-GSPS ADC with 2.1-GHz Input BandwidthADS5400-SP
Key Features• 12-bit resolution with 1-GSPS sample rate• High dynamic performance from DC to 4th Nyquist• 59.1-dB SNR, 75-dBc SFDR at 250 MHz• 58-dB SNR, 70-dBc SFDR at 1000 MHz• On-chip interleaving trim adjustments
For gain: range 1.5 to 2.0 VPP, resolution 120 µVFor offset: range ±30 mV, resolution 120 µVFor clock phase: range ±35 ps, resolution 115 fs
• User selectable straight or de-muxed DDR LVDS • 2.2-W power dissipation• Available in a 100-pin ceramic flatpack (HFS)
Radiation Performance• TID = 50 krad
Applications• Space radar and guidance systems• Space communications payload
Benefits• Orderable as SMD: 5962-0924001VXC• One of the highest SNR, SFDR and SINAD available for
greater than 200-MHz bandwidth systems• Flexibility of reduced I/O speed or pin count
More information at www.ti.com/product/ADS5400-SP
High-Resolution Delta-Sigma ADCADS1282-SP
More information at www.ti.com/product/ADS1282-SP
Key Features• Very high resolution:
130-dB SNR (250 SPS, G = 1)125-dB SNR (250 SPS, G = 16)
• Ultra linear• THD = –122 dB, INL = 0.5 ppm• Two-channel input MUX• Low power consumption: 25 mW (high-res); 10 µW (standby) • Flexible digital filter (sync, FIR or IIR)• Packaged in thermally enhanced CFP package
Radiation Performance• TID = 50 krad RHA• SEL immune to LET = 40 MeV-cm2/mg • SEU characterized up to 40 MeV-cm2/mg
Applications• Orbital observation systems (e.g. satellite, shuttles, space
stations, launchers)• Satellite sensing • Space scientific instrumentation
Benefits• RHA qualified and orderable as SMD: 5962L1423101VXC • Allows user to acquire wide dynamic-range signals in
satellite-telemetry sensors• Minimal distortion to convert signals for frequency-domain
analysis and post processing• Selectable digital filter assures a flexible design that will
meet the requirements of the most demanding applications
4th order
Mod. Programmable
Digital Filter& Calibration
SPIPGA
MUX
In1
In2
AVDD VREF
AVSS DGND
DVDD
Over-Range
Mod. Out
CLK
SYNC
PWDN
RESET
ADS1282-SP
Serial Interface I/O
1 to 64
3
ADS1282: MUX + PGA + Modulator + Digital Filter
ADS5400 SNR and SFDR at 1 GSPS across analog input bandwidth
SN
R (d
BFS
) and
SFD
R (d
Bc)
80
75
70
65
60
55
50
SFDRSNR
20001500
fIN (MHz)
100050010
Texas Instruments TI Space Products Guide 2017 | 9
12-Bit, Dual 1.6-GSPS or Single 3.2-GSPS, RF-Sampling Analog-to-Digital Converter (ADC)ADC12D1620QML-SP
Key Features• Dual channel 1.6 GSPS• Single channel interleaved 3.2 GSPS• Low-power sampling mode below 800 MSPS• Total ionizing dose (TID) to 300 krad (Si)• Single-event functional interrupt (SEFI) tested• Single-event latch-up (SEL) > 120 MeV-cm2/mg• Cold sparing capable• Wide temperature range: –55°C to +125°C• Power consumption: 3.8 W or 2.7 W (1600- or 800-MHz clock)• 3-dB input bandwidth: 3 GHz• Low-sampling power-saving mode (LSPSM) reduces power
consumption and improves performance for fCLK ≤ 800 MHz• 1:1 non-demuxed or 1:2 or 1:4 parallel demuxed LVDS outputs• Single 1.9-V power supply
Applications• Satellite communication system• Wideband communications • Data acquisition systems• RADAR/LIDAR• Software defined radio
Benefits• The ADC12D1620QML device uses a package redesign
to achieve better ENOB, SNR, and X-talk compared to the ADC12D1600QML.
• The ADC12D1620QML is a low-power, high-performance CMOS analog-to-digital converter (ADC) that digitizes signals at a 12-bit resolution at sampling rates up to 3.2 GSPS in an interleaved mode. It can also be used as a dual-channel ADC for sampling rates up to 1.6 GSPS
• For sampling rates below 800 MHz, there is a low-sampling power saving mode (LSPSM) that reduces power consumption to less than 1.4 W per channel (typical)
Prototyping and mechanical evaluation is supported with six orderable products:
More information at www.ti.com/product/ADC12D1620QML-SP
8-Channel, 12-Bit, 50-kSPS to 1-MSPS ADCADC128S102QML-SP
More information at www.ti.com/product/ADC128S102QML-SP
Radiation Hardened Data ConvertersFeatured Products
Key Features• Eight input channels• Split supplies• VA: 2.7 V to 5.25 V• VD: 2.7 V to VA
• Only 2.3 mW of power at 3 V• Power down 0.06 µW• DNL: –0.5 to +0.9 LSB typical• INL: ±0.9 LSB typical• SPI digital output• ADC addressing through CS decoder• SPI/QSPI/MICROWIRE/DSP compatible• Available in 16-pin ceramic SOIC, CFP and die
Radiation Performance• TID = 100 krad• SEL and SEFI immune > 120 MeV-cm2/mg
Applications• Sensors• Thermistors• Motor control
Benefits• Orderable as SMD: 5962R0722701VZA, 5962R0722701VFA
and die 5962R0722701V9A • Eight sensors can be monitored with one ADC• All ADC serialized data shares the same input bus to
onboard FPGA/ASIC• Ultra-low power consumption• RHA qualified for space applications• TID and SEU characterization data available for faster
design in
VA
AGNDAGND
VD
SCLKCSDINDOUTDGND
IN0
IN7
.
.
.
ADC128S102
12-BitSuccessive-
ApproximationADC
MUX
ControlLogic
T/H
Part Number Grade Package
ADC12D1620CCMLS Flight 300 krad CCGA (376)
ADC12D1620CCMPR Pre-flight engineering prototype CCGA (376)
ADC10D1000DAISY Daisy chain, mechanical sample, no die CCGA (376)
ADC12D1620LGMLS Flight 300 krad CLGA (256)
ADC12D1620LGMPR Pre-flight engineering prototype CLGA (256)
ADC10D1000LDAZ Daisy chain, mechanical sample, no die CLGA (256)
10 | TI Space Products Guide 2017 Texas Instruments
Radiation Hardened Data ConvertersFeatured Products
12-Bit Micro Power DAC with Rail-to-Rail OutputDAC121S101QML-SP
Key Features• Supply range: +2.7 V to +5.5 V• Only 0.64 mW of power• Power down < 1 µW• Rail-to-rail voltage output• Power-on reset to zero volts output• SYNC interrupt facility• Guaranteed monotonic• DNL: +0.25/-0.15 LSB• 3-wire 20-MHz SPI digital interface• SPI/QSPI/MICROWIRE/DSP compatible• Settling time 12 μs• Available in a 10-pin ceramic SOIC
Radiation Performance• TID = 100 krad• SEL and SEFI Immune > 120 MeV-cm2/mg
Applications• Sensors• Thermistors• Motor control
Benefits• Orderable as SMD: 5962R0722601VZA • Wide operating range• Ultra-low power consumption• RHA and QMLV qualified
More information at www.ti.com/product/DAC121S101QML-SP
ELDRS-Free, Quad Differential Operational Amplifiers, 1.0 MHz, ±16 VLM124AQML-SP
More information at www.ti.com/product/LM124AQML-SP
Radiation Hardened AmplifiersFeatured Products
Key Features• Wide power-supply range:
Single supply 3 V to 32 V, or Dual supplies ±1.5 V to ±16 V
• Internally frequency compensated for unity gain• Input voltage range independent of power supply voltage• Differential input voltage range equal to the power supply voltage• Input common-mode voltage range includes ground• Large output voltage swing 0 V to V+ – 1.5 V• Large DC voltage gain 100 dB• Very-low supply current drain (700 µA) — essentially
independent of supply voltage
Radiation Performance• TID = 100 krad RHA• ELDRS-free
Applications• Satellites• Radar and guidance systems• Defense electronics
Benefits• Orderable as SMD RHA: 5962R9950402VXA• Eliminates need for dual supplies• Four internally compensated op amps in a single package• Allows directly sensing near GND and VOUT also goes to GND• Compatible with all forms of logic• Power drain suitable for battery operation
12
12
5 k 100 k
GND
DAC121S101
VOUT
VA
DAC Register 12-Bit DAC
REF(+) REF(–)
Buffer
SCLK DINSYNC
InputControl Logic
Power-DownControl Logic
Power-OnReset
R110 k
R21 M
1/4LM124AQML-SP
+
–
+VIN
+VOUT
+5 V
VIN (mV)0
VO
UT (V
)
Gain = 1 + R2
R1= 101 (As shown)
Texas Instruments TI Space Products Guide 2017 | 11
Dual, High-Precision, Rail-to-Rail Output, Operational Amplifier LMP2012QML-SP
Key Features• Low guaranteed VIO over temperature: 60 µV• Low noise: 35 nV/√—H–z • No popcorn noise• High CMRR: 90 dB• High PSRR: 90 dB• High AVOL: 85 dB• Wide gain-bandwidth product: 3 MHz • High slew rate: 4 V/µs• Rail-to-rail output: 30mV• No external capacitors required• Available in 10-pin ceramic SOIC
Radiation Performance• TID = 50 krad and available as ELDRS free
Applications• Satellites• Gyroscopes• Star trackers• Reaction wheels
Benefits• Orderable as SMD: 5962L0620602VZA• Very stable – temp coefficient• RHA and QMLV qualified
More information at www.ti.com/product/LMP2012QML-SP
Quad, High-Precision Op AmpOPA4277-SP
Radiation Hardened AmplifiersFeatured Products
Key Features• Low offset voltage: 20 µV • Low offset drift: ±0.15 µV/°C• Voltage noise: 8 nV/√—H–z @ 1 kHz• GBW: 1 MHz• Low quiescent current: 790 µA/Ch• Wide supply range: ±2 V to ±18 V • Low bias current: 17.5 nA (max)• Available in KGD package
Radiation Performance• TID = 50 krad RHA• SEL immune to LET = 85 MeV-cm2/mg • SEU characterized up to 85 MeV-cm2/mg
Applications• Orbital observation systems (e.g. satellite, shuttles, space
stations, launchers)• Satellite sensing • Space scientific instrumentation
Benefits• High accuracy and stability for use in bridge-amplifier or
transducer-amplifier applications • Unity gain stable while providing excellent dynamic behavior
over a wide range of load conditions • Various packaging options provide design flexibility• Excellent replacement for RH1013 or RH1014
0 1.0 2.0 3.0 4.0 5.0Common-Mode Voltage (V)
500
400
300
200
100
0
–100
–200
–300
–400
–500
Bia
s C
urre
nt (p
A)
VS = 5 V
Common-Mode Voltage (V)
20
15
10
5
0
–5
–10
–15
–20
Off
set
Volt
age
(µV
)
–40ºC 25ºC
85ºC
125ºC
–0.3 0.0 0.3 0.6 0.9 1.2 1.5
VS = 2.7 V
R1
R2
No bias-currentcancellation resistor
OPA4277-SP+
–
More information at www.ti.com/product/OPA4277-SP
© 2017 Texas Instruments Incorporated SLYT532E
3.3-V, 2.2-GHz, Low Phase Noise, Clock Synchronizer and Jitter CleanerCDCM7005-SP
More information at www.ti.com/product/CDCM7005-SP
Radiation Hardened Clock and TimingFeatured Product
Key Features• VCXO_IN clock synchronized to primary or seconadary reference
clock inputs redundancy support with manual/auto selection• Accepts LVCMOS input frequencies up to 200 MHz • VCXO_IN frequencies up to 2.2 GHz (LVPECL) • LVPECL and/or LVCMOS output combinations • Output frequency is selectable by x1, /2, /3, /4, /6, /8, /16 on
each output Individually • SPI controllable device setting • 3.3-V power supply• Temperature range: –55°C to +125°C• Available in 52-pin ceramic QFP (HFG) package
Radiation Performance• TID = 50 krad• SEL immune to LET = 80 MeV-cm2/mg
Applications• Satellites• Radar and guidance systems• Defense electronics
Benefits• Orderable as SMD: 5962-07233001VXC • Wide input/output frequency range supports high/low end
of frequency standards• Flexible single and differential outputs• Selectable input/output standards
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B011617
System Reference Clock
TLK2711-SP
VCXO
FPGA
ADS54xx-SP
DAC5675A-SP
CDCM7005-SP
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