TRENDS IN ATE INSTRUMENTS - Salland · Overview •Founded in 2012 by Former Members of the Intersil ATE Products Division •Small, Specialized Company Focused Exclusively at Providing

Company Confidential

TRENDS IN ATE INSTRUMENTS

VP – WW Sales and Marketing

Q3 - 2018

Chris Hartshorn

Visit Us Online at WWW.Elevatesemi.com

2 Company Confidentialwww.elevatesemi.com

Elevate Semiconductor Inc.

Overview

• Founded in 2012 by Former Members of the Intersil ATE

Products Division

• Small, Specialized Company Focused Exclusively at Providing

Support and Innovative IC Products for the ATE Industry

• 14 Full-Time Employees based in San Diego, CA

• Leveraged Outsource Business Model

• 15 IC Products In Production

• 47 Satisfied Customers Across 17 Countries


Where we play


Overview

Standard Digital Instruments

• Burn-in Instruments

DUT Power Supply Instruments

High Voltage Instruments

Development Ecosystem


Digital Instruments

Main Goals of new Instruments

• Lower the Cost of test, COT, for the end user

– This usually means improved tester thru-put

• Increased parallelism

• Faster analog settling time

• Reduced configuration time

• Standard based configurations (i.e. PXI)

• Increased digital speed needed for testing new classes of DUTs

– 200MHz still adequate for many applications

– 500MHz is table stakes for newer designs

– 800MHz and beyond is required for many of the standard memory testers

• Higher voltage applications are driving the need for expanded voltage range capability

– Automotive, IOT, Power Supplies, and displays are driving the requirements


Digital Instruments

Increased parallelism

• Testing more DUTs at the same time can reduce COT.

– Design Challenges

• Component Availability

– Traditional vendors are failing to offer a wide range off the shelf multi-channel PEICs

– ASICs can be expensive and time consuming to develop

• Cooling

– High density PEICs MUST offer low power per channel

– IC process technology is a major driver of power per channel

– IC products MUST offer a low thermal impedance path for easy cooling

• Architecture

– IC products MUST be highly integrated SOCs and include multiple channels of appropriate

functions like DACs, ADCs, Pin Drivers, Active Loads, Test Comparators, PPMUs, etc.


Digital Instruments

Low Cost Instruments below 400MHz

• Venus Family of PEICs

– Dual Channel, Pin/SW compatible products

• Field proven technology

• Improved TTM

• Leveraging of Design resources


Lowest Quiescent Power-The CMOS Advantage

Venus Family: ISL55161, ISL55163, Hallasan



Digital Instruments

Low Cost Digital Instruments Beyond 400MHz

• Mt. Mystery Family of PEICs

– Latest Generation of 8-channel Integrated devices

– Leverage field learning from Venus Family

– Increase digital speed to 500MHz

– Reduce per channel Power

– 6 family members

• Optimize Instrument

– Price

– Architecture

– Power


Burn In Instruments

Test During Burn-In (TDBI)

• Popular for Memory Test

– Why not use “Free” Test Time

• PEIC Availability has slowed the deployment of TDBI

– Traditional PEIC products focused at BIT

• Offer Extremely low pin cost

• Lack timing accuracy needed for parametric test (TPD Variation)

• Digital speeds too slow for many applications

– Traditional PEIC products focused at parametric test

• Per channel cost is too high

• Digital performance is overkill

• Integrated architecture does not fit well


Burn In Instruments

TDBI Digital Solution

• Kilimanjaro PEIC

• Low per-channel cost is inline with traditional burn-in only products

• TPD is trimmed at final test to offer 10x timing accuracy improvement

• Architecture is suitable for TDBI and BI systems


DPS Instruments

Main goals of new Instruments

• Support basic V/I requirements for target DUTs

• Support parallel testing of DUTs (High Density)

• Reduce COT (Similar to PEICs)

Many different approaches

• Re-use other instrument functions (i.e. PPMU or driver level)

• “Smart” Power Rails using switches/monitoring

• Use dedicated DPS products

– Traditional architecture (like a big PPMU)

• AD5560

– Special DPS architecture (optimized to act like a battery)

• Jupiter, Europa (ISL55180), Vesuvius


DPS Instruments: Special Architecture

Special ArchitectureTraditional Architecture


Unparalleled Parallelism

Infinite Gangability for Infinite Current

• Each Vesuvius IC Can Be Used at Up to +/- 4A in Total

Voltage Mode Ganging

for Excellent Current

Sharing and Transient

Response !


Digital Reconfiguration: Optimized Test Time


Ganging- 8 Channels, No Load vs. ConCap

Digitally

Programmable

Performance !


Vesuvius: 3rd Generation of Special Architecture

Key Improvements:

• 2x Maximum Current Capability of ISL55180

• Low Tempco Current Measurement

• True FI Mode

• On-Chip Voltage Clamps

• Per-Pin V/I Monitor

Key Similarities:

• Patented Glitch Free Architecture

• On Chip Programmable Compensation

• Limitless Current Ganging

• Low Power Dissipation

• Small PCB Footprint


High Voltage Instruments

High Voltage ATE

• Very Active Marketspace

– Many discrete and ASIC designs

– Value proposition is similar to standard digital pins but integration level is a few generations behind

Trends

• Lots of design activity

• Fragmented voltage requirements

– We group at under 24V, 40V, 72V, and over 120V

– Many specialized requirements, compatibilities, and compliance


Existing Generation Solutions

Saturn (ISL55188) 24V Integrated PE

Triton (ISL55185) 28V Integrated V/I


A Flexible Approach to High Voltage

Controller IC + Output IC

• Ultimate system flexibility for future expansion

• Enables process optimization for simplified design roadmap

The Concept

• Controller IC is standard (possibly common for V/I and PE applications)

– Leverage previous design and software development

– Reduced Time to Market with Focused Instruments


Whitney – Extremely HVVI

Quad Channel Analog Pin Solution

• 70V Output Range across -70V to +70V Common Mode

• 4 Per-pin V/I’s (Glitch Free Architecture)

• FV/MI/FI/MV

• Design Targeting 2V@1A

• Current will be de-rated proportionally with increasing voltage

• 8 On Chip Current Force/Measure Ranges

– +/-2.5uA, +/-25uA, +/-25mA, +/-50mA, +/-150mA, +/-250mA, +/-500mA, +/-1A

• Per Channel Window Comparator

– Go-no-go Testing

• Integrated DAC Levels

• Per Channel Monitor Pin

– Integrated ADC Pre-Conditioning

• High Density, Standard Packaging

Test Chip in Lab!

Customer Samples in Q2 2019 !


Everest – Extremely HVPE

Quad Channel Solution

• Pin Drivers

– 70V Swing over -70V to +70V Range

– 10 Ohm Zout

– 200mA Iout

– 50MHz Max Toggle Rate

– Programmable Driver Slew Rate

• Window Comparators

– 70V Swing over -70V to +70V Range

– 200MHz BW

• Timing Deskew

– 10ns to 20ns Span

– 312.5ps to 625ps Resolution

• High Density, Standard Packaging


Options beyond: The sky is the limit!

Focused Output Stage Products

• Developed in optimal process technology for the application

– Enables improved performance and robust designs

– Minimizes product development schedule

– Simplifies new instrument release process

• Possible Next Products

– Optimized DPS for Specific Applications

• Extremely efficient low voltage design for microcontroller testing

• 1,000V V/I for IGBT Testing

• 250V V/I or PE for Power Electronics Testing

• Etc…


Development Ecosystem

In-House Instrument Development

• Historic Approach, Works well

• Labor Intensive/Large Overhead

– Must maintain a staff of highly specialized workers for development.

Outsourced Instrument Development

• Choosing the right partners is key!

– Experience

– Flexibility

– Proven track record of success

We Recommend Salland…




Documents

TRENDS IN ATE INSTRUMENTS - Salland · Overview •Founded in 2012 by Former Members of the Intersil ATE Products Division •Small, Specialized Company Focused Exclusively at Providing