UC1625-SP Radiation Report - Texas Instruments€¦ · · 2011-11-08Drift Report 30,40,50krad ELDRS Report UC1625-SP Supply_VCC_20V Test Site SBDL SBDL Tester ETS364 ETS364 Test

UC1625-SP 5962-9168902VYA

Brushless DC Motor Controller

Radiation (ELDRS)Test Report

Contact: [email protected]

Purpose of Testing: Perform ELDRS to 30kRad, 40kRad and 50kRad per Method 1019.

Device name: 5962-9168902VYA (Parent UC1625, BRUSHLESS DC MOTOR CONTROLLER)Technology: SFAB JI PWR2

Package Pinout CDIP, JT/28

Block Diagram:

Bias Diagram:

Customer: Device Type:

Dose Rate: 0.01 rad/sec (Si) Total Dose (krad):

Quantity Irradiated: RAD Job Number:

Diffusion lot#

A/T lot#

Date Code:

Serial Number Total Dose (krad)

3 304 308 3012 3013 3015 3016 3017 3021 3025 3029 0


3 42.6 9/14/20114 42.6 9/14/20118 42.6 9/14/201112 42.6 9/14/201113 42.6 9/14/201115 42.6 9/14/201116 42 6 9/14/2011

8/4/2011 un-biased8/4/2011

8/4/2011 un-biased

un-biased8/4/2011 un-biased8/4/2011 un-biased

8/4/2011 biased8/4/2011 biased

biased8/4/2011 biased

CommentsDate Shipped

biased

8/4/2011 control

Exposure Record

TI UC162530 krad, 40krad, 50krad

10 11-321

Date Tested

8/2/20118/2/2011

8/2/2011

8/2/20118/2/20118/2/2011

106039010075951117A

8/2/2011

8/2/20118/2/20118/2/20118/2/2011

8/4/2011

8/4/2011

Date Shipped Date Tested Comments

9/12/2011 biased9/12/2011 biased

9/12/2011 biased9/12/2011 biased

9/12/2011 bi d

9/12/2011 biased9/12/2011 un-biased

16 42.6 9/14/201117 42.6 9/14/201121 42.6 9/14/201125 42.6 9/14/201129 0 9/14/2011


3 50 9/30/20114 50 9/30/20118 50 9/30/201112 50 9/30/201113 50 9/30/201115 50 9/30/201116 50 9/30/201117 50 9/30/201121 50 9/30/201125 50 9/30/201129 0 9/30/2011

9/12/2011 un-biased9/12/2011 un-biased

9/12/2011 control


Date Shipped Date Tested Comments

9/28/2011 biased9/28/2011 biased

9/28/2011 biased9/28/2011 biased


9/28/2011 biased9/28/2011 un-biased

9/28/2011 control


Drift Report 30,40,50krad

Delta Threshold 10.00% Note: unit numbers have prefix '3' for 30krad and '4' for 40krad and '5' for 50krad samples50krad "un-biased" samples failed TACH and Hall Input functionality

ELDRS ReportUC1625-SP

Supply_VCC_12VTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit mA mAMax Limit 25 25Min Limit 5 5

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 13.239 14.060 -0.821 -6.20% 4.10%30 34 13.936 13.724 0.212 1.52% 1.06%30 38 13.911 13.557 0.354 2.54% 1.77%30 312 13.385 13.971 -0.586 -4.38% 2.93%30 313 13.565 13.449 0.116 0.85% 0.58%30 315 13.667 13.901 -0.234 -1.71% 1.17%30 316 13.767 13.933 -0.166 -1.20% 0.83%30 317 14.397 13.849 0.548 3.81% 2.74%30 321 13.286 13.725 -0.439 -3.30% 2.19%30 325 12.673 13.753 -1.080 -8.53% 5.40%40 43 13.239 13.822 -0.583 -4.40% 2.91% Supply_VCC_12V40 44 13.936 13.479 0.457 3.28% 2.28% Test Site SBDL40 48 13.911 13.307 0.604 4.34% 3.02% Tester ETS36440 412 13.385 13.724 -0.339 -2.54% 1.70% Test Number EF357940 413 13.565 13.220 0.345 2.54% 1.72% Max Limit 25 mA40 415 13.667 13.724 -0.057 -0.42% 0.29% Min Limit 5 mA40 416 13.767 13.742 0.025 0.18% 0.13% Krad(Si) 0 30 40 5040 417 14.397 13.659 0.738 5.13% 3.69% LL 5.000 5.000 5.000 5.00040 421 13.286 13.531 -0.245 -1.84% 1.22% Min 14.207 13.449 12.075 11.93740 425 12.673 12.075 0.598 4.72% 2.99% Average 14.207 13.792 13.428 12.60850 53 13.239 13.459 -0.220 -1.66% 1.10% Max 14.207 14.060 13.822 13.45950 54 13.936 13.132 0.804 5.77% 4.02% UL 25.000 25.000 25.000 25.00050 58 13.911 12.984 0.927 6.66% 4.63%

R² = 0.3727

-2.000

-1.500

-1.000

-0.500

0.000

0.500

1.000

1.500

2.000

2.500

3.000

0 25 50 75

De

lta (

mA

)

Krad(Si)

Supply_VCC_12V

50 512 13.385 13.418 -0.033 -0.25% 0.17%50 513 13.565 12.938 0.627 4.62% 3.13%50 515 13.667 12.103 1.564 11.44% 7.82%50 516 13.767 12.102 1.665 12.10% 8.33%50 517 14.397 12.037 2.360 16.39% 11.80%50 521 13.286 11.937 1.349 10.16% 6.75%50 525 12.673 11.970 0.703 5.54% 3.51%0 29 13.570 14.207 -0.637 -4.69% 3.19%

Max 14.397 14.207 2.360 16.39% 11.80%Average 13.582 13.306 0.276 1.95% 3.13%

Min 12.673 11.937 -1.080 -8.53% 0.13%Std Dev 0.448 0.695 0.778 5.68% 2.63%

R² = 0.3727

-2.000

-1.500

-1.000

-0.500

0.000

0.500

1.000

1.500

2.000

2.500

3.000

0 25 50 75

De

lta (

mA

)

Krad(Si)

Supply_VCC_12V

0.000

5.000

10.000

15.000

20.000

25.000

30.000

0 30 40 50

mA

Krad(Si)

Supply_VCC_12V

Pass Range

Fail Range

Min

Average

Max

Page 1



Supply_VCC_20VTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit mA mAMax Limit 25 25Min Limit 5 5

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 14.226 15.141 -0.915 -6.44% 4.58%30 34 14.963 14.783 0.180 1.21% 0.90%30 38 14.902 14.616 0.286 1.92% 1.43%30 312 14.345 15.021 -0.676 -4.71% 3.38%30 313 14.545 14.498 0.047 0.32% 0.23%30 315 14.694 14.963 -0.269 -1.83% 1.34%30 316 14.766 14.980 -0.214 -1.45% 1.07%30 317 15.409 14.874 0.535 3.47% 2.67%30 321 14.240 14.768 -0.528 -3.71% 2.64%30 325 13.663 14.764 -1.101 -8.06% 5.50%40 43 14.226 14.767 -0.541 -3.81% 2.71% Supply_VCC_20V40 44 14.963 14.421 0.542 3.62% 2.71% Test Site SBDL40 48 14.902 14.224 0.678 4.55% 3.39% Tester ETS36440 412 14.345 14.644 -0.299 -2.09% 1.50% Test Number EF357940 413 14.545 14.218 0.327 2.25% 1.63% Max Limit 25 mA40 415 14.694 14.651 0.043 0.29% 0.22% Min Limit 5 mA40 416 14.766 14.686 0.080 0.54% 0.40% Krad(Si) 0 30 40 5040 417 15.409 14.591 0.818 5.31% 4.09% LL 5.000 5.000 5.000 5.00040 421 14.240 14.454 -0.214 -1.50% 1.07% Min 15.106 14.498 12.954 12.73240 425 13.663 12.954 0.709 5.19% 3.55% Average 15.106 14.841 14.361 13.45650 53 14.226 14.361 -0.135 -0.95% 0.68% Max 15.106 15.141 14.767 14.36150 54 14.963 14.023 0.940 6.28% 4.70% UL 25.000 25.000 25.000 25.00050 58 14.902 13.776 1.126 7.56% 5.63%

R² = 0.4083

-2.000

-1.500

-1.000

-0.500

0.000

0.500

1.000

1.500

2.000

2.500

3.000

0 25 50 75

De

lta (

mA

)

Krad(Si)

Supply_VCC_20V

50 512 14.345 14.293 0.052 0.36% 0.26%50 513 14.545 13.785 0.760 5.22% 3.80%50 515 14.694 12.851 1.843 12.54% 9.22%50 516 14.766 12.986 1.780 12.06% 8.90%50 517 15.409 12.934 2.475 16.06% 12.37%50 521 14.240 12.815 1.425 10.01% 7.12%50 525 13.663 12.732 0.931 6.82% 4.66%0 29 14.515 15.106 -0.591 -4.07% 2.95%

Max 15.409 15.141 2.475 16.06% 12.37%Average 14.573 14.248 0.326 2.16% 3.40%

Min 13.663 12.732 -1.101 -8.06% 0.22%Std Dev 0.461 0.761 0.840 5.73% 2.91%

0.000

5.000

10.000

15.000

20.000

25.000

30.000

0 30 40 50

mA

Krad(Si)

Supply_VCC_20V

Pass Range

Fail Range

Min

Average

Max

Page 2



VCC_Turn_On_ThresholdTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 9.535 9.535Min Limit 8.815 8.815

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 9.265 9.070 0.195 2.10% 27.08%30 34 9.230 9.070 0.160 1.73% 22.22%30 38 9.225 9.030 0.195 2.11% 27.08%30 312 9.210 9.055 0.155 1.68% 21.53%30 313 9.210 9.040 0.170 1.85% 23.61%30 315 9.215 9.160 0.055 0.60% 7.64%30 316 9.225 9.170 0.055 0.60% 7.64%30 317 9.200 9.170 0.030 0.33% 4.17%30 321 9.220 9.160 0.060 0.65% 8.33%30 325 9.285 9.200 0.085 0.92% 11.81%40 43 9.265 9.030 0.235 2.54% 32.64% VCC_Turn_On_Threshold40 44 9.230 9.030 0.200 2.17% 27.78% Test Site SBDL40 48 9.225 8.990 0.235 2.55% 32.64% Tester ETS36440 412 9.210 9.015 0.195 2.12% 27.08% Test Number EF357940 413 9.210 8.995 0.215 2.33% 29.86% Max Limit 9.535 V40 415 9.215 9.140 0.075 0.81% 10.42% Min Limit 8.815 V40 416 9.225 9.150 0.075 0.81% 10.42% Krad(Si) 0 30 40 5040 417 9.200 9.150 0.050 0.54% 6.94% LL 8.815 8.815 8.815 8.81540 421 9.220 9.140 0.080 0.87% 11.11% Min 9.190 9.030 8.990 8.98540 425 9.285 9.180 0.105 1.13% 14.58% Average 9.190 9.113 9.082 9.07550 53 9.265 9.025 0.240 2.59% 33.33% Max 9.190 9.200 9.180 9.17050 54 9.230 9.025 0.205 2.22% 28.47% UL 9.535 9.535 9.535 9.53550 58 9.225 8.985 0.240 2.60% 33.33%

R² = 0.1242

0.000

0.050

0.100

0.150

0.200

0.250

0.300

0 25 50 75

De

lta (

V)

Krad(Si)

VCC_Turn_On_Threshold

50 512 9.210 9.005 0.205 2.23% 28.47%50 513 9.210 8.990 0.220 2.39% 30.56%50 515 9.215 9.130 0.085 0.92% 11.81%50 516 9.225 9.140 0.085 0.92% 11.81%50 517 9.200 9.145 0.055 0.60% 7.64%50 521 9.220 9.130 0.090 0.98% 12.50%50 525 9.285 9.170 0.115 1.24% 15.97%0 29 9.210 9.190 0.020 0.22% 2.78%

Max 9.285 9.200 0.240 2.60% 33.33%Average 9.228 9.093 0.135 1.46% 18.75%

Min 9.200 8.985 0.020 0.22% 2.78%Std Dev 0.025 0.072 0.073 0.79% 10.15%

8.200

8.400

8.600

8.800

9.000

9.200

9.400

9.600

9.800

0 30 40 50

V

Krad(Si)

VCC_Turn_On_Threshold

Pass Range

Fail Range

Min

Average

Max

Page 3



VCC_Turn_Off_ThresholdTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 8.525 8.525Min Limit 7.86 7.86

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 8.270 8.125 0.145 1.75% 21.80%30 34 8.245 8.130 0.115 1.39% 17.29%30 38 8.240 8.100 0.140 1.70% 21.05%30 312 8.225 8.120 0.105 1.28% 15.79%30 313 8.225 8.100 0.125 1.52% 18.80%30 315 8.230 8.210 0.020 0.24% 3.01%30 316 8.240 8.220 0.020 0.24% 3.01%30 317 8.225 8.220 0.005 0.06% 0.75%30 321 8.235 8.210 0.025 0.30% 3.76%30 325 8.290 8.245 0.045 0.54% 6.77%40 43 8.270 8.095 0.175 2.12% 26.32% VCC_Turn_Off_Threshold40 44 8.245 8.105 0.140 1.70% 21.05% Test Site SBDL40 48 8.240 8.070 0.170 2.06% 25.56% Tester ETS36440 412 8.225 8.090 0.135 1.64% 20.30% Test Number EF357940 413 8.225 8.070 0.155 1.88% 23.31% Max Limit 8.525 V40 415 8.230 8.200 0.030 0.36% 4.51% Min Limit 7.86 V40 416 8.240 8.205 0.035 0.42% 5.26% Krad(Si) 0 30 40 5040 417 8.225 8.215 0.010 0.12% 1.50% LL 7.860 7.860 7.860 7.86040 421 8.235 8.200 0.035 0.43% 5.26% Min 8.215 8.100 8.070 8.06540 425 8.290 8.235 0.055 0.66% 8.27% Average 8.215 8.168 8.149 8.14550 53 8.270 8.095 0.175 2.12% 26.32% Max 8.215 8.245 8.235 8.23550 54 8.245 8.100 0.145 1.76% 21.80% UL 8.525 8.525 8.525 8.52550 58 8.240 8.065 0.175 2.12% 26.32%

R² = 0.0644

0.000

0.020

0.040

0.060

0.080

0.100

0.120

0.140

0.160

0.180

0.200

0 25 50 75

De

lta (

V)

Krad(Si)

VCC_Turn_Off_Threshold

50 512 8.225 8.085 0.140 1.70% 21.05%50 513 8.225 8.065 0.160 1.95% 24.06%50 515 8.230 8.200 0.030 0.36% 4.51%50 516 8.240 8.200 0.040 0.49% 6.02%50 517 8.225 8.210 0.015 0.18% 2.26%50 521 8.235 8.195 0.040 0.49% 6.02%50 525 8.290 8.235 0.055 0.66% 8.27%0 29 8.230 8.215 0.015 0.18% 2.26%

Max 8.290 8.245 0.175 2.12% 26.32%Average 8.242 8.156 0.086 1.05% 12.98%

Min 8.225 8.065 0.005 0.06% 0.75%Std Dev 0.021 0.063 0.062 0.75% 9.35%

7.400

7.600

7.800

8.000

8.200

8.400

8.600

8.800

0 30 40 50

V

Krad(Si)

VCC_Turn_Off_Threshold

Pass Range

Fail Range

Min

Average

Max

Page 4



Output Voltage @ Iref=0mATest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 5.085 5.085Min Limit 4.85 4.85

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 5.043 4.982 0.061 1.21% 26.02%30 34 4.967 4.908 0.059 1.18% 25.03%30 38 4.994 4.917 0.077 1.54% 32.80%30 312 4.978 4.979 -0.001 -0.03% 0.63%30 313 4.987 4.926 0.061 1.23% 26.15%30 315 4.986 4.943 0.043 0.85% 18.11%30 316 4.987 4.941 0.046 0.91% 19.38%30 317 4.988 4.942 0.046 0.92% 19.57%30 321 4.995 4.947 0.048 0.95% 20.30%30 325 4.985 4.937 0.048 0.96% 20.31%40 43 5.043 4.960 0.083 1.65% 35.38% Output Voltage @ Iref=0mA40 44 4.967 4.885 0.082 1.65% 34.82% Test Site SBDL40 48 4.994 4.894 0.100 2.00% 42.59% Tester ETS36440 412 4.978 4.956 0.022 0.43% 9.16% Test Number EF357940 413 4.987 4.902 0.085 1.71% 36.36% Max Limit 5.085 V40 415 4.986 4.926 0.060 1.19% 25.34% Min Limit 4.85 V40 416 4.987 4.925 0.062 1.23% 26.19% Krad(Si) 0 30 40 5040 417 4.988 4.926 0.062 1.24% 26.38% LL 4.850 4.850 4.850 4.85040 421 4.995 4.930 0.065 1.30% 27.53% Min 4.973 4.908 4.885 4.87540 425 4.985 4.921 0.064 1.28% 27.11% Average 4.973 4.942 4.923 4.91550 53 5.043 4.952 0.091 1.81% 38.79% Max 4.973 4.982 4.960 4.95250 54 4.967 4.875 0.092 1.85% 39.07% UL 5.085 5.085 5.085 5.08550 58 4.994 4.884 0.110 2.20% 46.84%

R² = 0.3743

-0.020

0.000

0.020

0.040

0.060

0.080

0.100

0.120

0 25 50 75

De

lta (

V)

Krad(Si)

Output Voltage @ Iref=0mA

50 512 4.978 4.946 0.032 0.63% 13.41%50 513 4.987 4.891 0.096 1.93% 41.04%50 515 4.986 4.920 0.066 1.31% 27.89%50 516 4.987 4.919 0.068 1.35% 28.74%50 517 4.988 4.920 0.068 1.36% 28.93%50 521 4.995 4.924 0.071 1.42% 30.08%50 525 4.985 4.914 0.071 1.42% 30.09%0 29 4.976 4.973 0.003 0.06% 1.30%

Max 5.043 4.982 0.110 2.20% 46.84%Average 4.990 4.928 0.062 1.25% 26.62%

Min 4.967 4.875 -0.001 -0.03% 0.63%Std Dev 0.019 0.027 0.026 0.52% 10.87%

4.700

4.750

4.800

4.850

4.900

4.950

5.000

5.050

5.100

5.150

0 30 40 50

V

Krad(Si)

Output Voltage @ Iref=0mA

Pass Range

Fail Range

Min

Average

Max

Page 5



Soft Start VoltageTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 4.9 4.9Min Limit 3.1 3.1

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 4.475 4.448 0.027 0.60% 1.48%30 34 4.417 4.384 0.033 0.75% 1.83%30 38 4.440 4.392 0.048 1.07% 2.64%30 312 4.423 4.447 -0.024 -0.54% 1.34%30 313 4.435 4.400 0.035 0.78% 1.93%30 315 4.431 4.413 0.018 0.40% 0.99%30 316 4.433 4.413 0.020 0.45% 1.12%30 317 4.438 4.411 0.027 0.60% 1.48%30 321 4.436 4.418 0.018 0.41% 1.02%30 325 4.422 4.410 0.012 0.27% 0.66%40 43 4.475 4.436 0.039 0.87% 2.15% Soft Start Voltage40 44 4.417 4.371 0.046 1.04% 2.56% Test Site SBDL40 48 4.440 4.380 0.060 1.34% 3.31% Tester ETS36440 412 4.423 4.433 -0.010 -0.23% 0.56% Test Number EF357940 413 4.435 4.386 0.049 1.10% 2.70% Max Limit 4.9 V40 415 4.431 4.408 0.023 0.52% 1.27% Min Limit 3.1 V40 416 4.433 4.407 0.026 0.59% 1.45% Krad(Si) 0 30 40 5040 417 4.438 4.406 0.032 0.71% 1.76% LL 3.100 3.100 3.100 3.10040 421 4.436 4.412 0.024 0.55% 1.35% Min 4.432 4.384 4.371 4.35940 425 4.422 4.405 0.017 0.38% 0.94% Average 4.432 4.414 4.404 4.39750 53 4.475 4.427 0.048 1.07% 2.65% Max 4.432 4.448 4.436 4.42750 54 4.417 4.359 0.058 1.31% 3.22% UL 4.900 4.900 4.900 4.90050 58 4.440 4.369 0.071 1.59% 3.92%

R² = 0.2117

-0.040

-0.020

0.000

0.020

0.040

0.060

0.080

0 25 50 75

De

lta (

V)

Krad(Si)

Soft Start Voltage

50 512 4.423 4.424 -0.001 -0.02% 0.06%50 513 4.435 4.376 0.059 1.32% 3.26%50 515 4.431 4.402 0.029 0.65% 1.60%50 516 4.433 4.402 0.031 0.70% 1.73%50 517 4.438 4.402 0.036 0.80% 1.98%50 521 4.436 4.408 0.028 0.64% 1.57%50 525 4.422 4.400 0.022 0.50% 1.22%0 29 4.423 4.432 -0.009 -0.21% 0.52%

Max 4.475 4.448 0.071 1.59% 3.92%Average 4.434 4.406 0.029 0.65% 1.75%

Min 4.417 4.359 -0.024 -0.54% 0.06%Std Dev 0.015 0.022 0.021 0.48% 0.92%

0.000

1.000

2.000

3.000

4.000

5.000

6.000

0 30 40 50

V

Krad(Si)

Soft Start Voltage

Pass Range

Fail Range

Min

Average

Max

Page 6



Load regulationTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit mV mVMax Limit 30 30Min Limit -5 -5

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 8.184 7.355 0.829 10.14% 2.37%30 34 7.482 7.161 0.321 4.30% 0.92%30 38 7.168 7.006 0.162 2.26% 0.46%30 312 7.829 7.011 0.818 10.45% 2.34%30 313 7.530 7.125 0.405 5.38% 1.16%30 315 7.874 7.316 0.558 7.08% 1.59%30 316 7.563 7.454 0.109 1.44% 0.31%30 317 7.159 7.365 -0.206 -2.87% 0.59%30 321 7.840 7.316 0.524 6.68% 1.50%30 325 8.418 7.276 1.142 13.57% 3.26%40 43 8.184 7.248 0.936 11.44% 2.68% Load regulation40 44 7.482 7.313 0.169 2.27% 0.48% Test Site SBDL40 48 7.168 7.316 -0.148 -2.06% 0.42% Tester ETS36440 412 7.829 7.410 0.419 5.35% 1.20% Test Number EF357940 413 7.530 7.619 -0.089 -1.18% 0.25% Max Limit 30 mV40 415 7.874 7.806 0.068 0.86% 0.19% Min Limit -5 mV40 416 7.563 7.304 0.259 3.42% 0.74% Krad(Si) 0 30 40 5040 417 7.159 7.321 -0.162 -2.26% 0.46% LL -5.000 -5.000 -5.000 -5.00040 421 7.840 7.069 0.771 9.83% 2.20% Min 6.927 7.006 7.069 7.37940 425 8.418 7.663 0.755 8.97% 2.16% Average 6.927 7.239 7.407 7.55550 53 8.184 7.450 0.734 8.97% 2.10% Max 6.927 7.454 7.806 7.71550 54 7.482 7.715 -0.233 -3.11% 0.66% UL 30.000 30.000 30.000 30.00050 58 7.168 7.710 -0.542 -7.56% 1.55%

R² = 0.1203

-0.800-0.600-0.400-0.2000.0000.2000.4000.6000.8001.0001.2001.400

0 25 50 75

De

lta (

mV

)

Krad(Si)

Load regulation

50 512 7.829 7.379 0.450 5.75% 1.29%50 513 7.530 7.397 0.133 1.76% 0.38%50 515 7.874 7.512 0.362 4.59% 1.03%50 516 7.563 7.689 -0.126 -1.67% 0.36%50 517 7.159 7.573 -0.414 -5.78% 1.18%50 521 7.840 7.420 0.420 5.35% 1.20%50 525 8.418 7.701 0.717 8.52% 2.05%0 29 7.664 6.927 0.737 9.62% 2.11%

Max 8.418 7.806 1.142 13.57% 3.26%Average 7.703 7.385 0.319 3.92% 1.26%

Min 7.159 6.927 -0.542 -7.56% 0.19%Std Dev 0.386 0.227 0.427 5.41% 0.83%

-10.000

-5.000

0.000

5.000

10.000

15.000

20.000

25.000

30.000

35.000

0 30 40 50

mV

Krad(Si)

Load regulation

Pass Range

Fail Range

Min

Average

Max

Page 7



Line RegulationTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit mV mVMax Limit 8 8Min Limit -8 -8

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 -0.514 -0.112 -0.402 78.19% 2.51%30 34 -0.308 -0.192 -0.116 37.61% 0.72%30 38 -0.295 -0.260 -0.035 11.91% 0.22%30 312 -0.441 -0.044 -0.397 90.03% 2.48%30 313 -0.358 -0.176 -0.182 50.88% 1.14%30 315 -0.358 -0.064 -0.294 82.14% 1.84%30 316 -0.210 0.078 -0.288 137.18% 1.80%30 317 -0.075 0.018 -0.093 123.92% 0.58%30 321 -0.613 0.117 -0.730 119.09% 4.56%30 325 -0.530 -0.156 -0.374 70.54% 2.33%40 43 -0.514 -0.121 -0.393 76.44% 2.45% Line Regulation40 44 -0.308 -0.240 -0.068 22.01% 0.42% Test Site SBDL40 48 -0.295 -0.194 -0.101 34.27% 0.63% Tester ETS36440 412 -0.441 -0.161 -0.280 63.51% 1.75% Test Number EF357940 413 -0.358 -0.301 -0.057 16.00% 0.36% Max Limit 8 mV40 415 -0.358 0.013 -0.371 103.63% 2.32% Min Limit -8 mV40 416 -0.210 -0.041 -0.169 80.46% 1.05% Krad(Si) 0 30 40 5040 417 -0.075 -0.025 -0.050 66.78% 0.31% LL -8.000 -8.000 -8.000 -8.00040 421 -0.613 0.000 -0.613 100.00% 3.83% Min -0.598 -0.260 -0.301 -0.15940 425 -0.530 -0.088 -0.442 83.38% 2.76% Average -0.598 -0.079 -0.116 -0.00650 53 -0.514 0.013 -0.527 102.53% 3.29% Max -0.598 0.117 0.013 0.18350 54 -0.308 -0.159 -0.149 48.33% 0.93% UL 8.000 8.000 8.000 8.00050 58 -0.295 -0.066 -0.229 77.64% 1.43%

R² = 0.1142

-0.800

-0.700

-0.600

-0.500

-0.400

-0.300

-0.200

-0.100

0.000

0.100

0 25 50 75

De

lta (

mV

)

Krad(Si)

Line Regulation

50 512 -0.441 0.092 -0.533 120.85% 3.33%50 513 -0.358 0.012 -0.370 103.35% 2.31%50 515 -0.358 -0.045 -0.313 87.44% 1.96%50 516 -0.210 0.183 -0.393 187.23% 2.45%50 517 -0.075 0.074 -0.149 198.32% 0.93%50 521 -0.613 -0.102 -0.511 83.36% 3.19%50 525 -0.530 -0.062 -0.468 88.29% 2.92%0 29 -0.545 -0.598 0.053 -9.81% 0.33%

Max -0.075 0.183 0.053 198.32% 4.56%Average -0.376 -0.084 -0.292 81.79% 1.84%

Min -0.613 -0.598 -0.730 -9.81% 0.22%Std Dev 0.156 0.149 0.192 45.65% 1.16%

-10.000

-8.000

-6.000

-4.000

-2.000

0.000

2.000

4.000

6.000

8.000

10.000

0 30 40 50

mV

Krad(Si)

Line Regulation

Pass Range

Fail Range

Min

Average

Max

Page 8



Short Circuit CurrentTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit mA mAMax Limit 120 120Min Limit 25 25

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 34.788 35.882 -1.094 -3.15% 1.15%30 34 37.191 35.635 1.556 4.18% 1.64%30 38 36.868 34.984 1.884 5.11% 1.98%30 312 35.560 35.706 -0.146 -0.41% 0.15%30 313 35.911 34.619 1.292 3.60% 1.36%30 315 36.329 35.834 0.495 1.36% 0.52%30 316 36.535 35.865 0.670 1.83% 0.70%30 317 38.146 35.626 2.520 6.61% 2.65%30 321 35.199 35.207 -0.008 -0.02% 0.01%30 325 33.704 35.360 -1.656 -4.91% 1.74%40 43 34.788 35.009 -0.221 -0.64% 0.23% Short Circuit Current40 44 37.191 34.731 2.460 6.62% 2.59% Test Site SBDL40 48 36.868 34.080 2.788 7.56% 2.94% Tester ETS36440 412 35.560 34.801 0.759 2.14% 0.80% Test Number EF357940 413 35.911 33.814 2.097 5.84% 2.21% Max Limit 120 mA40 415 36.329 32.253 4.076 11.22% 4.29% Min Limit 25 mA40 416 36.535 32.283 4.252 11.64% 4.48% Krad(Si) 0 30 40 5040 417 38.146 32.071 6.075 15.93% 6.39% LL 25.000 25.000 25.000 25.00040 421 35.199 31.669 3.530 10.03% 3.72% Min 37.414 34.619 31.669 31.20640 425 33.704 31.832 1.872 5.55% 1.97% Average 37.414 35.472 33.254 32.54450 53 34.788 33.985 0.803 2.31% 0.84% Max 37.414 35.882 35.009 33.98550 54 37.191 33.722 3.469 9.33% 3.65% UL 120.000 120.000 120.000 120.00050 58 36.868 33.126 3.742 10.15% 3.94%

R² = 0.4125

-4.000

-2.000

0.000

2.000

4.000

6.000

8.000

0 25 50 75

De

lta (

mA

)

Krad(Si)

Short Circuit Current

50 512 35.560 33.882 1.678 4.72% 1.77%50 513 35.911 32.935 2.976 8.29% 3.13%50 515 36.329 31.843 4.486 12.35% 4.72%50 516 36.535 31.755 4.780 13.08% 5.03%50 517 38.146 31.591 6.555 17.18% 6.90%50 521 35.199 31.206 3.993 11.34% 4.20%50 525 33.704 31.396 2.308 6.85% 2.43%0 29 35.986 37.414 -1.428 -3.97% 1.50%

Max 38.146 37.414 6.555 17.18% 6.90%Average 36.022 33.875 2.147 5.86% 2.57%

Min 33.704 31.206 -1.656 -4.91% 0.01%Std Dev 1.215 1.719 2.080 5.65% 1.80%

0.000

20.000

40.000

60.000

80.000

100.000

120.000

140.000

0 30 40 50

mA

Krad(Si)

Short Circuit Current

Pass Range

Fail Range

Min

Average

Max

Page 9



EA Input Offset @ VCM=0VTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit mV mVMax Limit 6 6Min Limit -6 -6

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 -1.991 -1.996 0.005 -0.24% 0.04%30 34 -1.989 -1.995 0.006 -0.28% 0.05%30 38 -1.991 -1.993 0.002 -0.09% 0.01%30 312 -1.989 -1.995 0.006 -0.29% 0.05%30 313 -1.993 -1.994 0.001 -0.06% 0.01%30 315 -1.991 -1.994 0.003 -0.17% 0.03%30 316 -1.990 -1.994 0.004 -0.21% 0.03%30 317 -1.989 -1.996 0.007 -0.35% 0.06%30 321 -1.994 -1.994 0.000 -0.01% 0.00%30 325 -1.992 -1.994 0.002 -0.09% 0.02%40 43 -1.991 -1.967 -0.024 1.22% 0.20% EA Input Offset @ VCM=0V40 44 -1.989 -1.971 -0.018 0.92% 0.15% Test Site SBDL40 48 -1.991 -1.969 -0.022 1.12% 0.19% Tester ETS36440 412 -1.989 -1.969 -0.020 1.02% 0.17% Test Number EF357940 413 -1.993 -1.967 -0.026 1.30% 0.22% Max Limit 6 mV40 415 -1.991 -1.969 -0.022 1.09% 0.18% Min Limit -6 mV40 416 -1.990 -1.968 -0.022 1.10% 0.18% Krad(Si) 0 30 40 5040 417 -1.989 -1.969 -0.020 1.01% 0.17% LL -6.000 -6.000 -6.000 -6.00040 421 -1.994 -1.976 -0.018 0.89% 0.15% Min -1.958 -1.996 -1.976 -1.96140 425 -1.992 -1.969 -0.023 1.16% 0.19% Average -1.958 -1.995 -1.969 -1.95750 53 -1.991 -1.956 -0.035 1.77% 0.29% Max -1.958 -1.993 -1.967 -1.95550 54 -1.989 -1.956 -0.033 1.68% 0.28% UL 6.000 6.000 6.000 6.00050 58 -1.991 -1.955 -0.036 1.82% 0.30%

R² = 0.3902

-0.040

-0.030

-0.020

-0.010

0.000

0.010

0.020

0.030

0 25 50 75

De

lta (

mV

)

Krad(Si)

EA Input Offset @ VCM=0V

50 512 -1.989 -1.956 -0.033 1.67% 0.28%50 513 -1.993 -1.961 -0.032 1.60% 0.27%50 515 -1.991 -1.958 -0.033 1.64% 0.27%50 516 -1.990 -1.958 -0.032 1.60% 0.27%50 517 -1.989 -1.956 -0.033 1.66% 0.28%50 521 -1.994 -1.960 -0.034 1.69% 0.28%50 525 -1.992 -1.957 -0.035 1.76% 0.29%0 29 -1.988 -1.958 -0.030 1.52% 0.25%

Max -1.988 -1.955 0.007 1.82% 0.30%Average -1.991 -1.973 -0.018 0.88% 0.17%

Min -1.994 -1.996 -0.036 -0.35% 0.00%Std Dev 0.002 0.016 0.016 0.79% 0.11%

-8.000

-6.000

-4.000

-2.000

0.000

2.000

4.000

6.000

8.000

0 30 40 50

mV

Krad(Si)


Pass Range

Fail Range

Min

Average

Max

Page 10



EA Input Offset @ VCM=3VTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit mV mVMax Limit 6 6Min Limit -6 -6

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 -5.426 -5.476 0.050 -0.92% 0.41%30 34 -5.424 -5.473 0.049 -0.90% 0.41%30 38 -5.431 -5.487 0.056 -1.03% 0.47%30 312 -5.425 -5.485 0.060 -1.11% 0.50%30 313 -5.423 -5.470 0.047 -0.86% 0.39%30 315 -5.436 -5.413 -0.023 0.43% 0.20%30 316 -5.441 -5.407 -0.034 0.63% 0.29%30 317 -5.417 -5.382 -0.035 0.65% 0.29%30 321 -5.421 -5.367 -0.054 0.99% 0.45%30 325 -5.425 -5.406 -0.019 0.35% 0.16%40 43 -5.426 -5.472 0.046 -0.84% 0.38% EA Input Offset @ VCM=3V40 44 -5.424 -5.473 0.049 -0.90% 0.41% Test Site SBDL40 48 -5.431 -5.470 0.039 -0.72% 0.33% Tester ETS36440 412 -5.425 -5.479 0.054 -1.00% 0.45% Test Number EF357940 413 -5.423 -5.468 0.045 -0.82% 0.37% Max Limit 6 mV40 415 -5.436 -5.420 -0.016 0.30% 0.14% Min Limit -6 mV40 416 -5.441 -5.462 0.021 -0.38% 0.17% Krad(Si) 0 30 40 5040 417 -5.417 -5.417 0.000 0.01% 0.00% LL -6.000 -6.000 -6.000 -6.00040 421 -5.421 -5.417 -0.004 0.07% 0.03% Min -5.418 -5.487 -5.479 -5.46940 425 -5.425 -5.412 -0.013 0.24% 0.11% Average -5.418 -5.437 -5.449 -5.43250 53 -5.426 -5.459 0.033 -0.60% 0.27% Max -5.418 -5.367 -5.412 -5.39250 54 -5.424 -5.460 0.036 -0.66% 0.30% UL 6.000 6.000 6.000 6.00050 58 -5.431 -5.455 0.024 -0.44% 0.20%

R² = 0.005

-0.060

-0.040

-0.020

0.000

0.020

0.040

0.060

0.080

0 25 50 75

De

lta (

mV

)

Krad(Si)


50 512 -5.425 -5.457 0.032 -0.59% 0.27%50 513 -5.423 -5.469 0.046 -0.84% 0.38%50 515 -5.436 -5.413 -0.023 0.43% 0.20%50 516 -5.441 -5.414 -0.027 0.50% 0.23%50 517 -5.417 -5.398 -0.019 0.36% 0.16%50 521 -5.421 -5.392 -0.029 0.53% 0.24%50 525 -5.425 -5.403 -0.022 0.41% 0.18%0 29 -5.397 -5.418 0.021 -0.39% 0.18%

Max -5.397 -5.367 0.060 0.99% 0.50%Average -5.426 -5.439 0.012 -0.23% 0.28%

Min -5.441 -5.487 -0.054 -1.11% 0.00%Std Dev 0.009 0.035 0.035 0.64% 0.13%

-8.000

-6.000

-4.000

-2.000

0.000

2.000

4.000

6.000

8.000

0 30 40 50

mV

Krad(Si)


Pass Range

Fail Range

Min

Average

Max

Page 11



EA (+) Input Bias CurrrentTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit nA nAMax Limit 3000 3000Min Limit -3000 -3000

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 -472.181 -466.272 -5.909 1.25% 0.10%30 34 -471.963 -466.308 -5.655 1.20% 0.09%30 38 -472.314 -465.061 -7.253 1.54% 0.12%30 312 -471.911 -465.551 -6.360 1.35% 0.11%30 313 -472.341 -466.592 -5.749 1.22% 0.10%30 315 -472.222 -467.422 -4.800 1.02% 0.08%30 316 -472.202 -467.019 -5.183 1.10% 0.09%30 317 -471.782 -467.234 -4.548 0.96% 0.08%30 321 -472.332 -467.048 -5.284 1.12% 0.09%30 325 -472.408 -467.377 -5.031 1.06% 0.08%40 43 -472.181 -468.251 -3.930 0.83% 0.07% EA (+) Input Bias Currrent40 44 -471.963 -467.453 -4.510 0.96% 0.08% Test Site SBDL40 48 -472.314 -467.855 -4.459 0.94% 0.07% Tester ETS36440 412 -471.911 -467.336 -4.575 0.97% 0.08% Test Number EF357940 413 -472.341 -467.245 -5.096 1.08% 0.08% Max Limit 3000 nA40 415 -472.222 -468.195 -4.027 0.85% 0.07% Min Limit -3000 nA40 416 -472.202 -468.152 -4.050 0.86% 0.07% Krad(Si) 0 30 40 5040 417 -471.782 -468.280 -3.502 0.74% 0.06% LL -3000.000 -3000.000 -3000.000 -3000.00040 421 -472.332 -467.701 -4.631 0.98% 0.08% Min -474.066 -467.422 -468.280 -467.79640 425 -472.408 -467.452 -4.956 1.05% 0.08% Average -474.066 -466.588 -467.792 -467.31950 53 -472.181 -467.796 -4.385 0.93% 0.07% Max -474.066 -465.061 -467.245 -466.92050 54 -471.963 -467.303 -4.660 0.99% 0.08% UL 3000.000 3000.000 3000.000 3000.00050 58 -472.314 -467.203 -5.111 1.08% 0.09%

R² = 0.1648

-8.000-7.000-6.000-5.000-4.000-3.000-2.000-1.0000.0001.0002.0003.000

0 25 50 75

De

lta (

nA

)

Krad(Si)

EA (+) Input Bias Currrent

50 512 -471.911 -467.415 -4.496 0.95% 0.07%50 513 -472.341 -467.055 -5.286 1.12% 0.09%50 515 -472.222 -467.463 -4.759 1.01% 0.08%50 516 -472.202 -467.793 -4.409 0.93% 0.07%50 517 -471.782 -467.163 -4.619 0.98% 0.08%50 521 -472.332 -467.074 -5.258 1.11% 0.09%50 525 -472.408 -466.920 -5.488 1.16% 0.09%0 29 -472.230 -474.066 1.836 -0.39% 0.03%

Max -471.782 -465.061 1.836 1.54% 0.12%Average -472.168 -467.453 -4.714 1.00% 0.08%

Min -472.408 -474.066 -7.253 -0.39% 0.03%Std Dev 0.200 1.421 1.427 0.30% 0.02%

-4000.000

-3000.000

-2000.000

-1000.000

0.000

1000.000

2000.000

3000.000

4000.000

0 30 40 50

nA

Krad(Si)

EA (+) Input Bias Currrent

Pass Range

Fail Range

Min

Average

Max

Page 12



EA (-) Input Bias CurrrentTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit nA nAMax Limit 3000 3000Min Limit -3000 -3000

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 -472.967 -474.093 1.126 -0.24% 0.02%30 34 -472.807 -474.089 1.282 -0.27% 0.02%30 38 -472.623 -474.024 1.401 -0.30% 0.02%30 312 -472.565 -474.071 1.506 -0.32% 0.03%30 313 -472.874 -474.102 1.228 -0.26% 0.02%30 315 -472.658 -474.147 1.489 -0.32% 0.02%30 316 -473.549 -474.092 0.543 -0.11% 0.01%30 317 -472.451 -474.166 1.715 -0.36% 0.03%30 321 -472.461 -474.169 1.708 -0.36% 0.03%30 325 -473.649 -474.159 0.510 -0.11% 0.01%40 43 -472.967 -474.058 1.091 -0.23% 0.02% EA (-) Input Bias Currrent40 44 -472.807 -474.058 1.251 -0.26% 0.02% Test Site SBDL40 48 -472.623 -474.058 1.435 -0.30% 0.02% Tester ETS36440 412 -472.565 -474.058 1.493 -0.32% 0.02% Test Number EF357940 413 -472.874 -474.058 1.184 -0.25% 0.02% Max Limit 3000 nA40 415 -472.658 -474.058 1.400 -0.30% 0.02% Min Limit -3000 nA40 416 -473.549 -474.058 0.509 -0.11% 0.01% Krad(Si) 0 30 40 5040 417 -472.451 -474.058 1.607 -0.34% 0.03% LL -3000.000 -3000.000 -3000.000 -3000.00040 421 -472.461 -474.058 1.597 -0.34% 0.03% Min -474.066 -474.169 -474.065 -474.07740 425 -473.649 -474.065 0.416 -0.09% 0.01% Average -474.066 -474.111 -474.059 -474.06950 53 -472.967 -474.066 1.099 -0.23% 0.02% Max -474.066 -474.024 -474.058 -474.06650 54 -472.807 -474.066 1.259 -0.27% 0.02% UL 3000.000 3000.000 3000.000 3000.00050 58 -472.623 -474.066 1.443 -0.31% 0.02%

R² = 0.0312

0.000

0.200

0.400

0.600

0.800

1.000

1.200

1.400

1.600

1.800

2.000

0 25 50 75

De

lta (

nA

)

Krad(Si)

EA (-) Input Bias Currrent

50 512 -472.565 -474.066 1.501 -0.32% 0.03%50 513 -472.874 -474.066 1.192 -0.25% 0.02%50 515 -472.658 -474.066 1.408 -0.30% 0.02%50 516 -473.549 -474.066 0.517 -0.11% 0.01%50 517 -472.451 -474.076 1.625 -0.34% 0.03%50 521 -472.461 -474.077 1.616 -0.34% 0.03%50 525 -473.649 -474.073 0.424 -0.09% 0.01%0 29 -472.340 -474.066 1.726 -0.37% 0.03%

Max -472.340 -474.024 1.726 -0.09% 0.03%Average -472.844 -474.079 1.235 -0.26% 0.02%

Min -473.649 -474.169 0.416 -0.37% 0.01%Std Dev 0.413 0.035 0.414 0.09% 0.01%

-4000.000

-3000.000

-2000.000

-1000.000

0.000

1000.000

2000.000

3000.000

4000.000

0 30 40 50

nA

Krad(Si)

EA (-) Input Bias Currrent

Pass Range

Fail Range

Min

Average

Max

Page 13



EA Open Loop Gain (.25V - 3V)Test Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit dB dBMax Limit 200 200Min Limit 73 73

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 89.732 105.446 -15.714 -17.51% 12.37%30 34 87.926 100.494 -12.568 -14.29% 9.90%30 38 91.285 85.328 5.957 6.53% 4.69%30 312 91.783 91.303 0.480 0.52% 0.38%30 313 98.556 91.161 7.395 7.50% 5.82%30 315 97.324 92.639 4.685 4.81% 3.69%30 316 106.938 85.877 21.061 19.69% 16.58%30 317 109.883 84.149 25.734 23.42% 20.26%30 321 113.636 105.265 8.371 7.37% 6.59%30 325 84.685 100.189 -15.504 -18.31% 12.21%40 43 89.732 120.000 -30.268 -33.73% 23.83% EA Open Loop Gain (.25V - 3V)40 44 87.926 120.000 -32.074 -36.48% 25.25% Test Site SBDL40 48 91.285 120.000 -28.715 -31.46% 22.61% Tester ETS36440 412 91.783 120.000 -28.217 -30.74% 22.22% Test Number EF357940 413 98.556 120.000 -21.444 -21.76% 16.89% Max Limit 200 dB40 415 97.324 120.000 -22.676 -23.30% 17.86% Min Limit 73 dB40 416 106.938 120.000 -13.062 -12.21% 10.28% Krad(Si) 0 30 40 5040 417 109.883 109.883 0.000 0.00% 0.00% LL 73.000 73.000 73.000 73.00040 421 113.636 120.000 -6.364 -5.60% 5.01% Min 120.000 84.149 109.883 102.99340 425 84.685 120.000 -35.315 -41.70% 27.81% Average 120.000 94.185 118.988 118.29950 53 89.732 120.000 -30.268 -33.73% 23.83% Max 120.000 105.446 120.000 120.00050 54 87.926 120.000 -32.074 -36.48% 25.25% UL 200.000 200.000 200.000 200.00050 58 91.285 120.000 -28.715 -31.46% 22.61%

R² = 0.1715

-40.000

-30.000

-20.000

-10.000

0.000

10.000

20.000

30.000

0 25 50 75

De

lta (

dB

)

Krad(Si)

EA Open Loop Gain (.25V - 3V)

50 512 91.783 120.000 -28.217 -30.74% 22.22%50 513 98.556 120.000 -21.444 -21.76% 16.89%50 515 97.324 120.000 -22.676 -23.30% 17.86%50 516 106.938 120.000 -13.062 -12.21% 10.28%50 517 109.883 102.993 6.890 6.27% 5.42%50 521 113.636 120.000 -6.364 -5.60% 5.01%50 525 84.685 120.000 -35.315 -41.70% 27.81%0 29 103.711 120.000 -16.289 -15.71% 12.83%

Max 113.636 120.000 25.734 23.42% 27.81%Average 97.386 110.798 -13.412 -14.96% 14.65%

Min 84.685 84.149 -35.315 -41.70% 0.00%Std Dev 9.509 12.941 16.996 18.25% 8.51%

0.000

50.000

100.000

150.000

200.000

250.000

0 30 40 50

dB

Krad(Si)

EA Open Loop Gain (.25V - 3V)

Pass Range

Fail Range

Min

Average

Max

Page 14



EA VOLTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 0.2 0.2Min Limit 0 0

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 0.009 0.009 0.000 2.05% 0.09%30 34 0.010 0.009 0.001 6.04% 0.29%30 38 0.010 0.011 -0.001 -13.91% 0.67%30 312 0.010 0.009 0.001 10.30% 0.52%30 313 0.010 0.010 0.000 -4.69% 0.22%30 315 0.009 0.008 0.001 13.30% 0.61%30 316 0.010 0.009 0.001 13.45% 0.70%30 317 0.009 0.009 0.000 -0.37% 0.02%30 321 0.010 0.010 0.000 -5.26% 0.25%30 325 0.010 0.009 0.001 8.16% 0.40%40 43 0.009 0.008 0.001 12.93% 0.59% EA VOL40 44 0.010 0.007 0.003 26.92% 1.29% Test Site SBDL40 48 0.010 0.007 0.003 27.51% 1.33% Tester ETS36440 412 0.010 0.007 0.003 30.24% 1.52% Test Number EF357940 413 0.010 0.007 0.003 26.72% 1.28% Max Limit 0.2 V40 415 0.009 0.007 0.002 24.14% 1.11% Min Limit 0 V40 416 0.010 0.007 0.003 32.68% 1.70% Krad(Si) 0 30 40 5040 417 0.009 0.007 0.002 21.93% 0.98% LL 0.000 0.000 0.000 0.00040 421 0.010 0.007 0.003 26.32% 1.25% Min 0.007 0.008 0.007 0.00740 425 0.010 0.007 0.003 28.57% 1.40% Average 0.007 0.009 0.007 0.00750 53 0.009 0.007 0.002 23.81% 1.09% Max 0.007 0.011 0.008 0.00750 54 0.010 0.007 0.003 26.92% 1.29% UL 0.200 0.200 0.200 0.20050 58 0.010 0.007 0.003 27.51% 1.33%

R² = 0.3316

-0.002

-0.001

0.000

0.001

0.002

0.003

0.004

0 25 50 75

De

lta (

V)

Krad(Si)

EA VOL

50 512 0.010 0.007 0.003 30.24% 1.52%50 513 0.010 0.007 0.003 26.72% 1.28%50 515 0.009 0.007 0.002 24.14% 1.11%50 516 0.010 0.007 0.003 32.68% 1.70%50 517 0.009 0.007 0.002 21.93% 0.98%50 521 0.010 0.007 0.003 26.32% 1.25%50 525 0.010 0.007 0.003 28.57% 1.40%0 29 0.009 0.007 0.002 19.96% 0.87%

Max 0.010 0.011 0.003 32.68% 1.70%Average 0.010 0.008 0.002 18.57% 0.97%

Min 0.009 0.007 -0.001 -13.91% 0.02%Std Dev 0.000 0.001 0.001 12.59% 0.49%

0.000

0.050

0.100

0.150

0.200

0.250

0 30 40 50

V

Krad(Si)

EA VOL

Pass Range

Fail Range

Min

Average

Max

Page 15



EA VOHTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 6 6Min Limit 3.6 3.6

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 4.177 4.016 0.161 3.86% 6.71%30 34 4.024 3.965 0.059 1.47% 2.47%30 38 4.051 3.983 0.068 1.67% 2.82%30 312 4.089 4.014 0.075 1.83% 3.12%30 313 4.072 4.000 0.072 1.76% 2.99%30 315 4.068 3.988 0.080 1.97% 3.35%30 316 4.063 3.986 0.077 1.89% 3.20%30 317 4.007 3.989 0.018 0.46% 0.76%30 321 4.119 3.997 0.122 2.96% 5.08%30 325 4.230 3.987 0.243 5.74% 10.12%40 43 4.177 4.004 0.173 4.14% 7.21% EA VOH40 44 4.024 3.956 0.068 1.69% 2.84% Test Site SBDL40 48 4.051 3.979 0.072 1.77% 2.99% Tester ETS36440 412 4.089 4.001 0.088 2.15% 3.66% Test Number EF357940 413 4.072 3.995 0.077 1.88% 3.20% Max Limit 6 V40 415 4.068 3.976 0.092 2.27% 3.85% Min Limit 3.6 V40 416 4.063 3.976 0.087 2.13% 3.61% Krad(Si) 0 30 40 5040 417 4.007 3.979 0.028 0.71% 1.18% LL 3.600 3.600 3.600 3.60040 421 4.119 3.988 0.131 3.18% 5.46% Min 3.997 3.965 3.956 3.97840 425 4.230 3.977 0.253 5.98% 10.54% Average 3.997 3.993 3.983 4.00050 53 4.177 4.027 0.150 3.59% 6.25% Max 3.997 4.016 4.004 4.03150 54 4.024 3.989 0.035 0.87% 1.47% UL 6.000 6.000 6.000 6.00050 58 4.051 4.017 0.034 0.83% 1.40%

R² = 0.0005

0.000

0.050

0.100

0.150

0.200

0.250

0.300

0 25 50 75

De

lta (

V)

Krad(Si)

EA VOH

50 512 4.089 4.017 0.072 1.76% 2.99%50 513 4.072 4.031 0.041 1.00% 1.70%50 515 4.068 3.978 0.090 2.22% 3.76%50 516 4.063 3.981 0.082 2.01% 3.40%50 517 4.007 3.983 0.024 0.61% 1.01%50 521 4.119 3.993 0.126 3.06% 5.25%50 525 4.230 3.980 0.250 5.91% 10.41%0 29 4.065 3.997 0.068 1.67% 2.83%

Max 4.230 4.031 0.253 5.98% 10.54%Average 4.089 3.992 0.097 2.36% 4.05%

Min 4.007 3.956 0.018 0.46% 0.76%Std Dev 0.065 0.018 0.063 1.48% 2.63%

0.000

1.000

2.000

3.000

4.000

5.000

6.000

7.000

0 30 40 50

V

Krad(Si)

EA VOH

Pass Range

Fail Range

Min

Average

Max

Page 16



PWM Input Bias Current @ 2.5VTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit uA uAMax Limit 10 10Min Limit 0 0

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 0.020 0.008 0.012 60.50% 0.12%30 34 0.027 0.005 0.022 81.32% 0.22%30 38 0.003 0.008 -0.005 -152.22% 0.05%30 312 0.024 0.001 0.023 95.86% 0.23%30 313 0.028 0.007 0.021 75.06% 0.21%30 315 0.027 0.009 0.018 66.37% 0.18%30 316 0.032 0.014 0.018 56.21% 0.18%30 317 0.020 0.005 0.015 75.31% 0.15%30 321 0.019 0.001 0.018 94.72% 0.18%30 325 0.015 0.004 0.011 73.42% 0.11%40 43 0.020 0.028 -0.008 -38.24% 0.08% PWM Input Bias Current @ 2.5V40 44 0.027 0.047 -0.020 -75.62% 0.20% Test Site SBDL40 48 0.003 0.021 -0.018 -562.07% 0.18% Tester ETS36440 412 0.024 0.029 -0.005 -20.03% 0.05% Test Number EF357940 413 0.028 0.030 -0.002 -6.90% 0.02% Max Limit 10 uA40 415 0.027 0.032 -0.005 -19.57% 0.05% Min Limit 0 uA40 416 0.032 0.021 0.011 34.31% 0.11% Krad(Si) 0 30 40 5040 417 0.020 0.049 -0.029 -141.91% 0.29% LL 0.000 0.000 0.000 0.00040 421 0.019 0.030 -0.011 -58.28% 0.11% Min 0.041 0.001 0.021 0.03440 425 0.015 0.021 -0.006 -39.54% 0.06% Average 0.041 0.006 0.031 0.04350 53 0.020 0.040 -0.020 -97.48% 0.20% Max 0.041 0.014 0.049 0.05350 54 0.027 0.034 -0.007 -27.04% 0.07% UL 10.000 10.000 10.000 10.00050 58 0.003 0.036 -0.033 -1034.97% 0.33%

R² = 0.3206

-0.040

-0.030

-0.020

-0.010

0.000

0.010

0.020

0.030

0.040

0 25 50 75

De

lta (

uA

)

Krad(Si)

PWM Input Bias Current @ 2.5V

50 512 0.024 0.047 -0.023 -94.54% 0.23%50 513 0.028 0.046 -0.018 -63.91% 0.18%50 515 0.027 0.050 -0.023 -86.83% 0.23%50 516 0.032 0.053 -0.021 -65.79% 0.21%50 517 0.020 0.041 -0.021 -102.42% 0.21%50 521 0.019 0.050 -0.031 -163.80% 0.31%50 525 0.015 0.037 -0.022 -145.86% 0.22%0 29 0.024 0.041 -0.017 -69.70% 0.17%

Max 0.032 0.053 0.023 95.86% 0.33%Average 0.022 0.027 -0.006 -75.92% 0.17%

Min 0.003 0.001 -0.033 -1034.97% 0.02%Std Dev 0.008 0.017 0.018 217.34% 0.08%

0.000

2.000

4.000

6.000

8.000

10.000

12.000

0 30 40 50

uA

Krad(Si)

PWM Input Bias Current @ 2.5V

Pass Range

Fail Range

Min

Average

Max

Page 17



Soft Start Current @ 0VTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit uA uAMax Limit -6.5 -6.5Min Limit -13 -13

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 -8.932 -11.527 2.595 -29.05% 39.92%30 34 -9.440 -11.401 1.961 -20.77% 30.16%30 38 -9.452 -11.309 1.857 -19.65% 28.57%30 312 -9.053 -11.577 2.524 -27.88% 38.83%30 313 -9.236 -11.243 2.007 -21.73% 30.87%30 315 -9.253 -11.214 1.961 -21.20% 30.17%30 316 -9.280 -11.256 1.976 -21.30% 30.40%30 317 -9.820 -11.272 1.452 -14.79% 22.34%30 321 -8.995 -11.130 2.135 -23.74% 32.85%30 325 -8.568 -11.247 2.679 -31.26% 41.21%40 43 -8.932 -11.983 3.051 -34.15% 46.93% Soft Start Current @ 0V40 44 -9.440 -11.824 2.384 -25.25% 36.67% Test Site SBDL40 48 -9.452 -11.714 2.262 -23.93% 34.80% Tester ETS36440 412 -9.053 -12.005 2.952 -32.61% 45.41% Test Number EF357940 413 -9.236 -11.651 2.415 -26.15% 37.15% Max Limit -6.5 uA40 415 -9.253 -11.769 2.516 -27.19% 38.71% Min Limit -13 uA40 416 -9.280 -11.784 2.504 -26.99% 38.53% Krad(Si) 0 30 40 5040 417 -9.820 -11.782 1.962 -19.98% 30.19% LL -13.000 -13.000 -13.000 -13.00040 421 -8.995 -11.648 2.653 -29.50% 40.82% Min -9.652 -11.577 -12.005 -11.98240 425 -8.568 -11.751 3.183 -37.14% 48.96% Average -9.652 -11.318 -11.791 -11.82950 53 -8.932 -11.918 2.986 -33.43% 45.93% Max -9.652 -11.130 -11.648 -11.65750 54 -9.440 -11.749 2.309 -24.46% 35.52% UL -6.500 -6.500 -6.500 -6.50050 58 -9.452 -11.657 2.205 -23.33% 33.92%

R² = 0.4943

0.000

0.500

1.000

1.500

2.000

2.500

3.000

3.500

0 25 50 75

De

lta (

uA

)

Krad(Si)

Soft Start Current @ 0V

50 512 -9.053 -11.982 2.929 -32.35% 45.06%50 513 -9.236 -11.664 2.428 -26.29% 37.35%50 515 -9.253 -11.876 2.623 -28.35% 40.36%50 516 -9.280 -11.888 2.608 -28.11% 40.13%50 517 -9.820 -11.898 2.078 -21.16% 31.97%50 521 -8.995 -11.770 2.775 -30.85% 42.69%50 525 -8.568 -11.884 3.316 -38.70% 51.01%0 29 -9.209 -9.652 0.443 -4.81% 6.82%

Max -8.568 -9.652 3.316 -4.81% 51.01%Average -9.203 -11.581 2.378 -26.00% 36.59%

Min -9.820 -12.005 0.443 -38.70% 6.82%Std Dev 0.324 0.443 0.560 6.74% 8.62%

-14.000

-12.000

-10.000

-8.000

-6.000

-4.000

-2.000

0.000

0 30 40 50

uA

Krad(Si)

Soft Start Current @ 0V

Pass Range

Fail Range

Min

Average

Max

Page 18



Soft Start Current @ 2.5VTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit mA mAMax Limit 2 2Min Limit 0.2 0.2

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 0.494 0.536 -0.042 -8.40% 2.31%30 34 0.551 0.529 0.022 3.95% 1.21%30 38 0.545 0.523 0.022 3.99% 1.21%30 312 0.519 0.529 -0.010 -1.93% 0.56%30 313 0.530 0.514 0.016 3.07% 0.90%30 315 0.533 0.539 -0.006 -1.06% 0.31%30 316 0.536 0.536 0.000 0.06% 0.02%30 317 0.584 0.536 0.048 8.27% 2.69%30 321 0.509 0.526 -0.017 -3.27% 0.93%30 325 0.472 0.527 -0.055 -11.75% 3.08%40 43 0.494 0.520 -0.026 -5.16% 1.42% Soft Start Current @ 2.5V40 44 0.551 0.513 0.038 6.85% 2.10% Test Site SBDL40 48 0.545 0.505 0.040 7.29% 2.21% Tester ETS36440 412 0.519 0.512 0.007 1.35% 0.39% Test Number EF357940 413 0.530 0.500 0.030 5.71% 1.68% Max Limit 2 mA40 415 0.533 0.527 0.006 1.19% 0.35% Min Limit 0.2 mA40 416 0.536 0.524 0.012 2.30% 0.68% Krad(Si) 0 30 40 5040 417 0.584 0.523 0.061 10.50% 3.41% LL 0.200 0.200 0.200 0.20040 421 0.509 0.513 -0.004 -0.72% 0.20% Min 0.577 0.514 0.500 0.48140 425 0.472 0.514 -0.042 -8.99% 2.36% Average 0.577 0.530 0.515 0.50050 53 0.494 0.497 -0.003 -0.51% 0.14% Max 0.577 0.539 0.527 0.51850 54 0.551 0.491 0.060 10.85% 3.32% UL 2.000 2.000 2.000 2.00050 58 0.545 0.485 0.060 10.97% 3.32%

R² = 0.2164

-0.080

-0.060

-0.040

-0.020

0.000

0.020

0.040

0.060

0.080

0 25 50 75

De

lta (

mA

)

Krad(Si)

Soft Start Current @ 2.5V

50 512 0.519 0.493 0.026 5.01% 1.44%50 513 0.530 0.481 0.049 9.29% 2.74%50 515 0.533 0.518 0.015 2.88% 0.85%50 516 0.536 0.513 0.023 4.35% 1.29%50 517 0.584 0.513 0.071 12.21% 3.96%50 521 0.509 0.504 0.005 1.05% 0.30%50 525 0.472 0.505 -0.033 -7.08% 1.86%0 29 0.532 0.577 -0.045 -8.44% 2.50%

Max 0.584 0.577 0.071 12.21% 3.96%Average 0.528 0.517 0.011 1.74% 1.60%

Min 0.472 0.481 -0.055 -11.75% 0.02%Std Dev 0.030 0.019 0.034 6.45% 1.14%

0.000

0.500

1.000

1.500

2.000

2.500

0 30 40 50

mA

Krad(Si)

Soft Start Current @ 2.5V

Pass Range

Fail Range

Min

Average

Max

Page 19



Soft Start Restart ThresholdTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 0.25 0.25Min Limit 0.13 0.13

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 0.167 0.192 -0.025 -15.20% 21.11%30 34 0.171 0.193 -0.022 -12.65% 18.06%30 38 0.172 0.197 -0.025 -14.53% 20.83%30 312 0.174 0.194 -0.020 -11.49% 16.67%30 313 0.173 0.197 -0.024 -13.65% 19.72%30 315 0.173 0.181 -0.008 -4.42% 6.39%30 316 0.171 0.179 -0.008 -4.47% 6.39%30 317 0.175 0.179 -0.004 -2.48% 3.61%30 321 0.173 0.181 -0.008 -4.83% 6.94%30 325 0.164 0.175 -0.011 -6.71% 9.17%40 43 0.167 0.198 -0.031 -18.80% 26.11% Soft Start Restart Threshold40 44 0.171 0.197 -0.026 -14.98% 21.39% Test Site SBDL40 48 0.172 0.203 -0.031 -18.02% 25.83% Tester ETS36440 412 0.174 0.199 -0.025 -14.37% 20.83% Test Number EF357940 413 0.173 0.203 -0.030 -17.12% 24.72% Max Limit 0.25 V40 415 0.173 0.183 -0.010 -5.58% 8.06% Min Limit 0.13 V40 416 0.171 0.182 -0.011 -6.23% 8.89% Krad(Si) 0 30 40 5040 417 0.175 0.182 -0.007 -4.20% 6.11% LL 0.130 0.130 0.130 0.13040 421 0.173 0.183 -0.010 -5.98% 8.61% Min 0.176 0.175 0.178 0.17940 425 0.164 0.178 -0.014 -8.54% 11.67% Average 0.176 0.187 0.191 0.19250 53 0.167 0.199 -0.032 -19.40% 26.94% Max 0.176 0.197 0.203 0.20450 54 0.171 0.198 -0.027 -15.56% 22.22% UL 0.250 0.250 0.250 0.25050 58 0.172 0.204 -0.032 -18.60% 26.67%

R² = 0.129

-0.035

-0.030

-0.025

-0.020

-0.015

-0.010

-0.005

0.000

0 25 50 75

De

lta (

V)

Krad(Si)

Soft Start Restart Threshold

50 512 0.174 0.201 -0.027 -15.52% 22.50%50 513 0.173 0.203 -0.030 -17.12% 24.72%50 515 0.173 0.184 -0.011 -6.15% 8.89%50 516 0.171 0.183 -0.012 -6.81% 9.72%50 517 0.175 0.183 -0.008 -4.77% 6.94%50 521 0.173 0.185 -0.012 -7.14% 10.28%50 525 0.164 0.179 -0.015 -9.15% 12.50%0 29 0.173 0.176 -0.003 -1.54% 2.22%

Max 0.175 0.204 -0.003 -1.54% 26.94%Average 0.171 0.189 -0.018 -10.52% 14.99%

Min 0.164 0.175 -0.032 -19.40% 2.22%Std Dev 0.003 0.010 0.010 5.62% 7.99%

0.000

0.050

0.100

0.150

0.200

0.250

0.300

0 30 40 50

V

Krad(Si)

Soft Start Restart Threshold

Pass Range

Fail Range

Min

Average

Max

Page 20



ISENSE1 Input Bias @ 0VTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit uA uAMax Limit -50 -50Min Limit -500 -500

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 -282.298 -293.981 11.682 -4.14% 2.60%30 34 -291.257 -284.437 -6.820 2.34% 1.52%30 38 -291.283 -282.062 -9.221 3.17% 2.05%30 312 -282.043 -290.901 8.858 -3.14% 1.97%30 313 -282.762 -277.744 -5.018 1.77% 1.12%30 315 -286.302 -287.263 0.961 -0.34% 0.21%30 316 -289.631 -289.562 -0.069 0.02% 0.02%30 317 -299.375 -285.876 -13.499 4.51% 3.00%30 321 -279.519 -283.436 3.917 -1.40% 0.87%30 325 -268.965 -284.752 15.787 -5.87% 3.51%40 43 -282.298 -289.070 6.772 -2.40% 1.50% ISENSE1 Input Bias @ 0V40 44 -291.257 -279.391 -11.866 4.07% 2.64% Test Site SBDL40 48 -291.283 -276.919 -14.364 4.93% 3.19% Tester ETS36440 412 -282.043 -285.820 3.777 -1.34% 0.84% Test Number EF357940 413 -282.762 -273.018 -9.744 3.45% 2.17% Max Limit -50 uA40 415 -286.302 -283.247 -3.055 1.07% 0.68% Min Limit -500 uA40 416 -289.631 -285.279 -4.352 1.50% 0.97% Krad(Si) 0 30 40 5040 417 -299.375 -281.651 -17.724 5.92% 3.94% LL -500.000 -500.000 -500.000 -500.00040 421 -279.519 -279.039 -0.480 0.17% 0.11% Min -295.356 -293.981 -289.070 -282.37140 425 -268.965 -280.448 11.483 -4.27% 2.55% Average -295.356 -286.001 -281.388 -276.98250 53 -282.298 -282.371 0.073 -0.03% 0.02% Max -295.356 -277.744 -273.018 -267.37550 54 -291.257 -273.151 -18.106 6.22% 4.02% UL -50.000 -50.000 -50.000 -50.00050 58 -291.283 -270.571 -20.712 7.11% 4.60%

R² = 0.197

-25.000

-20.000

-15.000

-10.000

-5.000

0.000

5.000

10.000

15.000

20.000

0 25 50 75

De

lta (

uA

)

Krad(Si)

ISENSE1 Input Bias @ 0V

50 512 -282.043 -280.237 -1.806 0.64% 0.40%50 513 -282.762 -267.375 -15.387 5.44% 3.42%50 515 -286.302 -280.827 -5.475 1.91% 1.22%50 516 -289.631 -282.233 -7.398 2.55% 1.64%50 517 -299.375 -278.892 -20.483 6.84% 4.55%50 521 -279.519 -276.269 -3.250 1.16% 0.72%50 525 -268.965 -277.891 8.926 -3.32% 1.98%0 29 -284.185 -295.356 11.171 -3.93% 2.48%

Max -268.965 -267.375 15.787 7.11% 4.60%Average -285.306 -281.905 -3.401 1.12% 1.95%

Min -299.375 -295.356 -20.712 -5.87% 0.02%Std Dev 7.848 6.384 10.253 3.58% 1.36%

-600.000

-500.000

-400.000

-300.000

-200.000

-100.000

0.000

0 30 40 50

uA

Krad(Si)


Pass Range

Fail Range

Min

Average

Max

Page 21



ISENSE2 Input Bias @ 0VTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit uA uAMax Limit -50 -50Min Limit -500 -500

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 -281.411 -289.963 8.552 -3.04% 1.90%30 34 -289.842 -279.871 -9.971 3.44% 2.22%30 38 -289.764 -277.305 -12.459 4.30% 2.77%30 312 -280.418 -286.501 6.083 -2.17% 1.35%30 313 -281.470 -273.292 -8.178 2.91% 1.82%30 315 -285.677 -284.095 -1.582 0.55% 0.35%30 316 -288.327 -285.732 -2.595 0.90% 0.58%30 317 -297.467 -281.697 -15.770 5.30% 3.50%30 321 -278.087 -279.376 1.289 -0.46% 0.29%30 325 -267.587 -280.549 12.962 -4.84% 2.88%40 43 -281.411 -284.148 2.737 -0.97% 0.61% ISENSE2 Input Bias @ 0V40 44 -289.842 -273.891 -15.951 5.50% 3.54% Test Site SBDL40 48 -289.764 -271.225 -18.539 6.40% 4.12% Tester ETS36440 412 -280.418 -280.473 0.055 -0.02% 0.01% Test Number EF357940 413 -281.470 -267.599 -13.871 4.93% 3.08% Max Limit -50 uA40 415 -285.677 -279.287 -6.390 2.24% 1.42% Min Limit -500 uA40 416 -288.327 -280.668 -7.659 2.66% 1.70% Krad(Si) 0 30 40 5040 417 -297.467 -276.711 -20.756 6.98% 4.61% LL -500.000 -500.000 -500.000 -500.00040 421 -278.087 -274.194 -3.893 1.40% 0.87% Min -294.298 -289.963 -284.148 -277.34140 425 -267.587 -275.471 7.884 -2.95% 1.75% Average -294.298 -281.838 -276.367 -271.90050 53 -281.411 -277.186 -4.225 1.50% 0.94% Max -294.298 -273.292 -267.599 -262.82950 54 -289.842 -267.354 -22.488 7.76% 5.00% UL -50.000 -50.000 -50.000 -50.00050 58 -289.764 -265.774 -23.990 8.28% 5.33%

R² = 0.247

-30.000

-25.000

-20.000

-15.000

-10.000

-5.000

0.000

5.000

10.000

15.000

0 25 50 75

De

lta (

uA

)

Krad(Si)


50 512 -280.418 -274.540 -5.878 2.10% 1.31%50 513 -281.470 -262.829 -18.641 6.62% 4.14%50 515 -285.677 -276.565 -9.112 3.19% 2.02%50 516 -288.327 -277.341 -10.986 3.81% 2.44%50 517 -297.467 -273.629 -23.838 8.01% 5.30%50 521 -278.087 -271.171 -6.916 2.49% 1.54%50 525 -267.587 -272.610 5.023 -1.88% 1.12%0 29 -283.224 -294.298 11.074 -3.91% 2.46%

Max -267.587 -262.829 12.962 8.28% 5.33%Average -283.980 -277.269 -6.711 2.29% 2.29%

Min -297.467 -294.298 -23.990 -4.84% 0.01%Std Dev 7.751 6.973 10.516 3.67% 1.53%

-600.000

-500.000

-400.000

-300.000

-200.000

-100.000

0.000

0 30 40 50

uA

Krad(Si)


Pass Range

Fail Range

Min

Average

Max

Page 22



ISENSE Input Offset CurrentTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit uA uAMax Limit 8 8Min Limit -8 -8

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 0.888 4.018 -3.130 -352.70% 19.57%30 34 1.414 4.566 -3.152 -222.85% 19.70%30 38 1.518 4.758 -3.240 -213.34% 20.25%30 312 1.625 4.400 -2.775 -170.78% 17.34%30 313 1.292 4.453 -3.161 -244.55% 19.75%30 315 0.625 3.168 -2.543 -406.91% 15.89%30 316 1.303 3.830 -2.527 -193.91% 15.79%30 317 1.908 4.179 -2.271 -119.07% 14.20%30 321 1.432 4.060 -2.628 -183.48% 16.42%30 325 1.378 4.203 -2.825 -205.05% 17.66%40 43 0.888 4.922 -4.034 -454.55% 25.22% ISENSE Input Offset Current40 44 1.414 5.499 -4.085 -288.81% 25.53% Test Site SBDL40 48 1.518 5.694 -4.176 -274.98% 26.10% Tester ETS36440 412 1.625 5.347 -3.722 -229.06% 23.26% Test Number EF357940 413 1.292 5.419 -4.127 -319.29% 25.79% Max Limit 8 uA40 415 0.625 3.960 -3.335 -533.64% 20.84% Min Limit -8 uA40 416 1.303 4.611 -3.308 -253.84% 20.67% Krad(Si) 0 30 40 5040 417 1.908 4.940 -3.032 -158.96% 18.95% LL -8.000 -8.000 -8.000 -8.00040 421 1.432 4.845 -3.413 -238.29% 21.33% Min 1.058 3.168 3.960 4.26340 425 1.378 4.976 -3.598 -261.15% 22.49% Average 1.058 4.164 5.021 5.08250 53 0.888 5.186 -4.298 -484.29% 26.87% Max 1.058 4.758 5.694 5.79750 54 1.414 5.797 -4.383 -309.88% 27.39% UL 8.000 8.000 8.000 8.00050 58 1.518 4.797 -3.279 -215.91% 20.49%

R² = 0.6866

-5.000

-4.500

-4.000

-3.500

-3.000

-2.500

-2.000

-1.500

-1.000

-0.500

0.000

0 25 50 75

De

lta (

uA

)

Krad(Si)

ISENSE Input Offset Current

50 512 1.625 5.698 -4.073 -250.66% 25.46%50 513 1.292 4.546 -3.254 -251.74% 20.33%50 515 0.625 4.263 -3.638 -582.12% 22.74%50 516 1.303 4.892 -3.589 -275.40% 22.43%50 517 1.908 5.263 -3.355 -175.90% 20.97%50 521 1.432 5.098 -3.666 -255.96% 22.91%50 525 1.378 5.281 -3.903 -283.29% 24.39%0 29 0.961 1.058 -0.097 -10.11% 0.61%

Max 1.908 5.797 -0.097 -10.11% 27.39%Average 1.326 4.636 -3.310 -271.63% 20.69%

Min 0.625 1.058 -4.383 -582.12% 0.61%Std Dev 0.349 0.906 0.815 119.55% 5.09%

-10.000

-8.000

-6.000

-4.000

-2.000

0.000

2.000

4.000

6.000

8.000

10.000

0 30 40 50

uA

Krad(Si)

ISENSE Input Offset Current

Pass Range

Fail Range

Min

Average

Max

Page 23



C/L Gain (IS1=0.3V, IS2 = 0.5V - 0.7V)Test Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 2.05 2.05Min Limit 1.9 1.9

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 1.973 1.948 0.025 1.29% 16.96%30 34 1.969 1.947 0.022 1.12% 14.65%30 38 1.969 1.946 0.023 1.17% 15.32%30 312 1.971 1.949 0.022 1.14% 14.97%30 313 1.981 1.956 0.025 1.28% 16.94%30 315 1.972 1.953 0.019 0.95% 12.53%30 316 1.966 1.946 0.020 1.03% 13.56%30 317 1.965 1.949 0.016 0.82% 10.79%30 321 1.973 1.947 0.026 1.30% 17.05%30 325 1.972 1.948 0.024 1.24% 16.26%40 43 1.973 1.941 0.032 1.64% 21.62% C/L Gain (IS1=0.3V, IS2 = 0.5V - 0.7V)40 44 1.969 1.939 0.030 1.52% 19.98% Test Site SBDL40 48 1.969 1.938 0.031 1.57% 20.65% Tester ETS36440 412 1.971 1.943 0.028 1.44% 18.97% Test Number EF357940 413 1.981 1.949 0.032 1.64% 21.61% Max Limit 2.05 V40 415 1.972 1.947 0.025 1.26% 16.53% Min Limit 1.9 V40 416 1.966 1.941 0.025 1.29% 16.89% Krad(Si) 0 30 40 5040 417 1.965 1.944 0.021 1.08% 14.13% LL 1.900 1.900 1.900 1.90040 421 1.973 1.941 0.032 1.60% 21.05% Min 1.970 1.946 1.938 1.93740 425 1.972 1.942 0.030 1.54% 20.26% Average 1.970 1.949 1.943 1.94250 53 1.973 1.939 0.034 1.74% 22.96% Max 1.970 1.956 1.949 1.95450 54 1.969 1.937 0.032 1.62% 21.31% UL 2.050 2.050 2.050 2.05050 58 1.969 1.943 0.026 1.32% 17.32%

R² = 0.6429

0.000

0.005

0.010

0.015

0.020

0.025

0.030

0.035

0.040

0 25 50 75

De

lta (

V)

Krad(Si)

C/L Gain (IS1=0.3V, IS2 = 0.5V - 0.7V)

50 512 1.971 1.940 0.031 1.60% 20.97%50 513 1.981 1.954 0.027 1.38% 18.27%50 515 1.972 1.945 0.027 1.36% 17.86%50 516 1.966 1.938 0.028 1.44% 18.89%50 517 1.965 1.941 0.024 1.23% 16.13%50 521 1.973 1.938 0.035 1.75% 23.05%50 525 1.972 1.940 0.032 1.64% 21.59%0 29 1.973 1.970 0.003 0.16% 2.16%

Max 1.981 1.970 0.035 1.75% 23.05%Average 1.971 1.945 0.026 1.33% 17.46%

Min 1.965 1.937 0.003 0.16% 2.16%Std Dev 0.004 0.007 0.006 0.32% 4.22%

1.800

1.850

1.900

1.950

2.000

2.050

2.100

0 30 40 50

V

Krad(Si)

C/L Gain (IS1=0.3V, IS2 = 0.5V - 0.7V)

Pass Range

Fail Range

Min

Average

Max

Page 24



C/L Amp Level ShiftTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 2.6 2.6Min Limit 2.45 2.45

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 2.562 2.524 0.038 1.48% 25.31%30 34 2.528 2.494 0.034 1.35% 22.73%30 38 2.539 2.493 0.046 1.83% 30.96%30 312 2.529 2.529 0.000 0.02% 0.27%30 313 2.535 2.500 0.035 1.38% 23.32%30 315 2.538 2.512 0.026 1.03% 17.50%30 316 2.535 2.507 0.028 1.11% 18.78%30 317 2.538 2.511 0.027 1.06% 17.91%30 321 2.540 2.512 0.028 1.11% 18.84%30 325 2.533 2.505 0.028 1.10% 18.65%40 43 2.562 2.512 0.050 1.95% 33.31% C/L Amp Level Shift40 44 2.528 2.481 0.047 1.86% 31.39% Test Site SBDL40 48 2.539 2.480 0.059 2.34% 39.62% Tester ETS36440 412 2.529 2.516 0.013 0.53% 8.94% Test Number EF357940 413 2.535 2.487 0.048 1.89% 31.99% Max Limit 2.6 V40 415 2.538 2.503 0.035 1.39% 23.50% Min Limit 2.45 V40 416 2.535 2.497 0.038 1.51% 25.45% Krad(Si) 0 30 40 5040 417 2.538 2.501 0.037 1.45% 24.57% LL 2.450 2.450 2.450 2.45040 421 2.540 2.503 0.037 1.47% 24.84% Min 2.524 2.493 2.480 2.47240 425 2.533 2.496 0.037 1.46% 24.65% Average 2.524 2.509 2.498 2.49350 53 2.562 2.507 0.055 2.15% 36.65% Max 2.524 2.529 2.516 2.51150 54 2.528 2.476 0.052 2.06% 34.73% UL 2.600 2.600 2.600 2.60050 58 2.539 2.472 0.067 2.66% 44.96%

R² = 0.379

0.000

0.010

0.020

0.030

0.040

0.050

0.060

0.070

0.080

0 25 50 75

De

lta (

V)

Krad(Si)

C/L Amp Level Shift

50 512 2.529 2.511 0.018 0.73% 12.27%50 513 2.535 2.479 0.056 2.21% 37.32%50 515 2.538 2.499 0.039 1.55% 26.17%50 516 2.535 2.494 0.041 1.62% 27.45%50 517 2.538 2.498 0.040 1.57% 26.57%50 521 2.540 2.499 0.041 1.62% 27.50%50 525 2.533 2.492 0.041 1.62% 27.32%0 29 2.525 2.524 0.001 0.03% 0.49%

Max 2.562 2.529 0.067 2.66% 44.96%Average 2.537 2.500 0.037 1.46% 24.64%

Min 2.525 2.472 0.000 0.02% 0.27%Std Dev 0.009 0.014 0.015 0.60% 10.12%

2.350

2.400

2.450

2.500

2.550

2.600

2.650

0 30 40 50

V

Krad(Si)

C/L Amp Level Shift

Pass Range

Fail Range

Min

Average

Max

Page 25



C/L CMRR ( IS1=-1.1 to 2V, IS2 = IS1+0.1VTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 198 198Min Limit 50 50

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 52.423 52.522 -0.099 -0.19% 0.07%30 34 52.734 52.420 0.314 0.59% 0.21%30 38 52.782 52.550 0.232 0.44% 0.16%30 312 52.721 52.347 0.374 0.71% 0.25%30 313 52.877 52.613 0.264 0.50% 0.18%30 315 52.493 52.487 0.006 0.01% 0.00%30 316 52.650 52.521 0.129 0.25% 0.09%30 317 52.928 52.595 0.333 0.63% 0.23%30 321 52.774 52.683 0.091 0.17% 0.06%30 325 52.418 52.586 -0.168 -0.32% 0.11%40 43 52.423 51.932 0.491 0.94% 0.33% C/L CMRR ( IS1=-1.1 to 2V, IS2 = IS1+0.1V40 44 52.734 51.945 0.789 1.50% 0.53% Test Site SBDL40 48 52.782 52.021 0.761 1.44% 0.51% Tester ETS36440 412 52.721 51.842 0.879 1.67% 0.59% Test Number EF357940 413 52.877 52.130 0.747 1.41% 0.50% Max Limit 198 V40 415 52.493 52.055 0.438 0.83% 0.30% Min Limit 50 V40 416 52.650 51.960 0.690 1.31% 0.47% Krad(Si) 0 30 40 5040 417 52.928 52.062 0.866 1.64% 0.59% LL 50.000 50.000 50.000 50.00040 421 52.774 52.086 0.688 1.30% 0.46% Min 52.672 52.347 51.842 51.67840 425 52.418 52.090 0.328 0.63% 0.22% Average 52.672 52.532 52.012 51.90250 53 52.423 51.678 0.745 1.42% 0.50% Max 52.672 52.683 52.130 52.11950 54 52.734 51.803 0.931 1.76% 0.63% UL 198.000 198.000 198.000 198.00050 58 52.782 51.830 0.952 1.80% 0.64%

R² = 0.4938

-0.400

-0.200

0.000

0.200

0.400

0.600

0.800

1.000

1.200

0 25 50 75

De

lta (

V)

Krad(Si)

C/L CMRR ( IS1=-1.1 to 2V, IS2 = IS1+0.1V

50 512 52.721 51.919 0.802 1.52% 0.54%50 513 52.877 51.937 0.940 1.78% 0.64%50 515 52.493 51.835 0.658 1.25% 0.44%50 516 52.650 51.888 0.762 1.45% 0.51%50 517 52.928 51.960 0.968 1.83% 0.65%50 521 52.774 52.049 0.725 1.37% 0.49%50 525 52.418 52.119 0.299 0.57% 0.20%0 29 52.841 52.672 0.169 0.32% 0.11%

Max 52.928 52.683 0.968 1.83% 0.65%Average 52.685 52.166 0.519 0.99% 0.36%

Min 52.418 51.678 -0.168 -0.32% 0.00%Std Dev 0.174 0.307 0.336 0.64% 0.21%

0.000

50.000

100.000

150.000

200.000

250.000

0 30 40 50

V

Krad(Si)

C/L CMRR ( IS1=-1.1 to 2V, IS2 = IS1+0.1V

Pass Range

Fail Range

Min

Average

Max

Page 26



Over Current ThresholdTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 0.34 0.34Min Limit 0.29 0.29

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 0.309 0.316 -0.007 -2.27% 14.00%30 34 0.303 0.310 -0.007 -2.31% 14.00%30 38 0.306 0.313 -0.007 -2.29% 14.00%30 312 0.305 0.314 -0.009 -2.95% 18.00%30 313 0.306 0.314 -0.008 -2.61% 16.00%30 315 0.303 0.307 -0.004 -1.32% 8.00%30 316 0.305 0.310 -0.005 -1.64% 10.00%30 317 0.307 0.311 -0.004 -1.30% 8.00%30 321 0.308 0.313 -0.005 -1.62% 10.00%30 325 0.308 0.313 -0.005 -1.62% 10.00%40 43 0.309 0.318 -0.009 -2.91% 18.00% Over Current Threshold40 44 0.303 0.312 -0.009 -2.97% 18.00% Test Site SBDL40 48 0.306 0.316 -0.010 -3.27% 20.00% Tester ETS36440 412 0.305 0.317 -0.012 -3.93% 24.00% Test Number EF357940 413 0.306 0.316 -0.010 -3.27% 20.00% Max Limit 0.34 V40 415 0.303 0.309 -0.006 -1.98% 12.00% Min Limit 0.29 V40 416 0.305 0.311 -0.006 -1.97% 12.00% Krad(Si) 0 30 40 5040 417 0.307 0.313 -0.006 -1.95% 12.00% LL 0.290 0.290 0.290 0.29040 421 0.308 0.315 -0.007 -2.27% 14.00% Min 0.306 0.307 0.309 0.30940 425 0.308 0.314 -0.006 -1.95% 12.00% Average 0.306 0.312 0.314 0.31450 53 0.309 0.319 -0.010 -3.24% 20.00% Max 0.306 0.316 0.318 0.31950 54 0.303 0.314 -0.011 -3.63% 22.00% UL 0.340 0.340 0.340 0.34050 58 0.306 0.314 -0.008 -2.61% 16.00%

R² = 0.3789

-0.014

-0.012

-0.010

-0.008

-0.006

-0.004

-0.002

0.000

0 25 50 75

De

lta (

V)

Krad(Si)

Over Current Threshold

50 512 0.305 0.318 -0.013 -4.26% 26.00%50 513 0.306 0.314 -0.008 -2.61% 16.00%50 515 0.303 0.309 -0.006 -1.98% 12.00%50 516 0.305 0.312 -0.007 -2.30% 14.00%50 517 0.307 0.313 -0.006 -1.95% 12.00%50 521 0.308 0.316 -0.008 -2.60% 16.00%50 525 0.308 0.315 -0.007 -2.27% 14.00%0 29 0.306 0.306 0.000 0.00% 0.00%

Max 0.309 0.319 0.000 0.00% 26.00%Average 0.306 0.313 -0.007 -2.38% 14.58%

Min 0.303 0.306 -0.013 -4.26% 0.00%Std Dev 0.002 0.003 0.003 0.85% 5.19%

0.260

0.270

0.280

0.290

0.300

0.310

0.320

0.330

0.340

0.350

0 30 40 50

V

Krad(Si)

Over Current Threshold

Pass Range

Fail Range

Min

Average

Max

Page 27



Peak Current ThresholdTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 0.23 0.23Min Limit 0.17 0.17

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 0.213 0.213 0.000 0.00% 0.00%30 34 0.202 0.201 0.001 0.50% 1.67%30 38 0.207 0.207 0.000 0.00% 0.00%30 312 0.207 0.206 0.001 0.48% 1.67%30 313 0.202 0.201 0.001 0.50% 1.67%30 315 0.205 0.203 0.002 0.98% 3.33%30 316 0.207 0.205 0.002 0.97% 3.33%30 317 0.206 0.204 0.002 0.97% 3.33%30 321 0.207 0.206 0.001 0.48% 1.67%30 325 0.207 0.205 0.002 0.97% 3.33%40 43 0.213 0.213 0.000 0.00% 0.00% Peak Current Threshold40 44 0.202 0.201 0.001 0.50% 1.67% Test Site SBDL40 48 0.207 0.207 0.000 0.00% 0.00% Tester ETS36440 412 0.207 0.206 0.001 0.48% 1.67% Test Number EF357940 413 0.202 0.201 0.001 0.50% 1.67% Max Limit 0.23 V40 415 0.205 0.202 0.003 1.46% 5.00% Min Limit 0.17 V40 416 0.207 0.205 0.002 0.97% 3.33% Krad(Si) 0 30 40 5040 417 0.206 0.204 0.002 0.97% 3.33% LL 0.170 0.170 0.170 0.17040 421 0.207 0.205 0.002 0.97% 3.33% Min 0.209 0.201 0.201 0.20140 425 0.207 0.204 0.003 1.45% 5.00% Average 0.209 0.205 0.205 0.20550 53 0.213 0.213 0.000 0.00% 0.00% Max 0.209 0.213 0.213 0.21350 54 0.202 0.201 0.001 0.50% 1.67% UL 0.230 0.230 0.230 0.23050 58 0.207 0.208 -0.001 -0.48% 1.67%

R² = 0.0311

-0.002

-0.001

-0.001

0.000

0.001

0.001

0.002

0.002

0.003

0.003

0.004

0 25 50 75

De

lta (

V)

Krad(Si)

Peak Current Threshold

50 512 0.207 0.206 0.001 0.48% 1.67%50 513 0.202 0.202 0.000 0.00% 0.00%50 515 0.205 0.202 0.003 1.46% 5.00%50 516 0.207 0.205 0.002 0.97% 3.33%50 517 0.206 0.204 0.002 0.97% 3.33%50 521 0.207 0.205 0.002 0.97% 3.33%50 525 0.207 0.204 0.003 1.45% 5.00%0 29 0.209 0.209 0.000 0.00% 0.00%

Max 0.213 0.213 0.003 1.46% 5.00%Average 0.206 0.205 0.001 0.63% 2.26%

Min 0.202 0.201 -0.001 -0.48% 0.00%Std Dev 0.003 0.003 0.001 0.52% 1.64%

0.000

0.050

0.100

0.150

0.200

0.250

0.300

0 30 40 50

V

Krad(Si)

Peak Current Threshold

Pass Range

Fail Range

Min

Average

Max

Page 28



PUA Leakage CurrentTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit uA uAMax Limit 5 5Min Limit -5 -5

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 0.005 0.006 -0.001 -20.66% 0.01%30 34 0.004 0.007 -0.002 -61.07% 0.02%30 38 0.006 0.006 -0.001 -12.55% 0.01%30 312 0.006 0.006 0.000 -6.61% 0.00%30 313 0.005 0.007 -0.002 -48.53% 0.02%30 315 0.006 0.006 -0.001 -9.50% 0.01%30 316 0.006 0.006 0.000 -7.49% 0.00%30 317 0.005 0.006 -0.001 -20.49% 0.01%30 321 0.005 0.006 -0.001 -23.10% 0.01%30 325 0.005 0.006 -0.001 -15.23% 0.01%40 43 0.005 0.007 -0.001 -25.74% 0.01% PUA Leakage Current40 44 0.004 0.007 -0.003 -67.98% 0.03% Test Site SBDL40 48 0.006 0.007 -0.001 -21.03% 0.01% Tester ETS36440 412 0.006 0.007 -0.001 -13.01% 0.01% Test Number EF357940 413 0.005 0.007 -0.002 -49.64% 0.02% Max Limit 5 uA40 415 0.006 0.006 0.000 2.53% 0.00% Min Limit -5 uA40 416 0.006 0.006 0.000 -5.56% 0.00% Krad(Si) 0 30 40 5040 417 0.005 0.006 -0.001 -14.40% 0.01% LL -5.000 -5.000 -5.000 -5.00040 421 0.005 0.006 -0.001 -16.77% 0.01% Min 0.004 0.006 0.006 0.00440 425 0.005 0.006 -0.001 -21.60% 0.01% Average 0.004 0.006 0.006 0.00550 53 0.005 0.006 -0.001 -18.59% 0.01% Max 0.004 0.007 0.007 0.00750 54 0.004 0.005 -0.001 -34.63% 0.01% UL 5.000 5.000 5.000 5.00050 58 0.006 0.007 -0.001 -15.20% 0.01%

R² = 0.0092

-0.003

-0.002

-0.001

0.000

0.001

0.002

0.003

0 25 50 75

De

lta (

uA

)

Krad(Si)

PUA Leakage Current

50 512 0.006 0.006 0.000 1.68% 0.00%50 513 0.005 0.007 -0.003 -56.91% 0.03%50 515 0.006 0.005 0.001 17.49% 0.01%50 516 0.006 0.004 0.002 33.21% 0.02%50 517 0.005 0.004 0.001 20.49% 0.01%50 521 0.005 0.004 0.001 15.48% 0.01%50 525 0.005 0.004 0.001 26.36% 0.01%0 29 0.005 0.004 0.001 22.80% 0.01%

Max 0.006 0.007 0.002 33.21% 0.03%Average 0.005 0.006 -0.001 -14.40% 0.01%

Min 0.004 0.004 -0.003 -67.98% 0.00%Std Dev 0.001 0.001 0.001 25.35% 0.01%

-8.000

-6.000

-4.000

-2.000

0.000

2.000

4.000

6.000

8.000

0 30 40 50

uA

Krad(Si)

PUA Leakage Current

Pass Range

Fail Range

Min

Average

Max

Page 29



PUB Leakage CurrentTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit uA uAMax Limit 5 5Min Limit -5 -5

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 0.004 0.002 0.002 46.99% 0.02%30 34 0.003 0.001 0.002 55.38% 0.02%30 38 0.004 0.002 0.002 53.47% 0.02%30 312 0.003 0.001 0.002 57.96% 0.02%30 313 0.003 0.001 0.002 56.86% 0.02%30 315 0.004 0.001 0.003 66.37% 0.03%30 316 0.003 0.001 0.002 70.66% 0.02%30 317 0.003 0.002 0.001 25.97% 0.01%30 321 0.003 0.002 0.001 39.17% 0.01%30 325 0.004 0.002 0.002 52.58% 0.02%40 43 0.004 0.001 0.003 80.12% 0.03% PUB Leakage Current40 44 0.003 0.000 0.003 95.00% 0.03% Test Site SBDL40 48 0.004 0.000 0.004 102.00% 0.04% Tester ETS36440 412 0.003 0.000 0.003 89.72% 0.03% Test Number EF357940 413 0.003 0.001 0.003 79.36% 0.03% Max Limit 5 uA40 415 0.004 0.000 0.005 111.61% 0.05% Min Limit -5 uA40 416 0.003 0.000 0.004 108.22% 0.04% Krad(Si) 0 30 40 5040 417 0.003 0.000 0.003 116.18% 0.03% LL -5.000 -5.000 -5.000 -5.00040 421 0.003 0.000 0.003 105.94% 0.03% Min 0.002 0.001 0.000 0.00140 425 0.004 0.000 0.004 110.88% 0.04% Average 0.002 0.002 0.000 0.00250 53 0.004 0.003 0.001 17.57% 0.01% Max 0.002 0.002 0.001 0.00350 54 0.003 0.002 0.001 23.74% 0.01% UL 5.000 5.000 5.000 5.00050 58 0.004 0.003 0.001 27.77% 0.01%

R² = 0.0001

0.000

0.001

0.001

0.002

0.002

0.003

0.003

0.004

0.004

0.005

0.005

0 25 50 75

De

lta (

uA

)

Krad(Si)

PUB Leakage Current

50 512 0.003 0.002 0.001 38.65% 0.01%50 513 0.003 0.003 0.001 15.57% 0.01%50 515 0.004 0.001 0.003 69.51% 0.03%50 516 0.003 0.001 0.002 68.31% 0.02%50 517 0.003 0.001 0.002 59.03% 0.02%50 521 0.003 0.001 0.002 54.20% 0.02%50 525 0.004 0.001 0.002 68.48% 0.02%0 29 0.003 0.002 0.002 49.88% 0.02%

Max 0.004 0.003 0.005 116.18% 0.05%Average 0.003 0.001 0.002 65.07% 0.02%

Min 0.003 0.000 0.001 15.57% 0.01%Std Dev 0.000 0.001 0.001 29.27% 0.01%

-8.000

-6.000

-4.000

-2.000

0.000

2.000

4.000

6.000

8.000

0 30 40 50

uA

Krad(Si)

PUB Leakage Current

Pass Range

Fail Range

Min

Average

Max

Page 30



PUC Leakage CurrentTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit uA uAMax Limit 5 5Min Limit -5 -5

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 0.004 0.003 0.001 17.66% 0.01%30 34 0.005 0.006 -0.001 -17.18% 0.01%30 38 -0.002 0.003 -0.005 315.37% 0.05%30 312 0.004 0.004 0.000 8.37% 0.00%30 313 0.001 0.003 -0.002 -234.81% 0.02%30 315 0.003 0.003 0.000 -2.22% 0.00%30 316 0.002 0.003 -0.001 -53.15% 0.01%30 317 0.001 0.003 -0.002 -184.13% 0.02%30 321 0.002 0.003 -0.002 -110.40% 0.02%30 325 0.003 0.003 0.000 -7.46% 0.00%40 43 0.004 0.003 0.001 23.07% 0.01% PUC Leakage Current40 44 0.005 0.003 0.003 48.13% 0.03% Test Site SBDL40 48 -0.002 0.003 -0.004 268.72% 0.04% Tester ETS36440 412 0.004 0.002 0.002 43.34% 0.02% Test Number EF357940 413 0.001 0.003 -0.002 -205.60% 0.02% Max Limit 5 uA40 415 0.003 0.002 0.001 39.39% 0.01% Min Limit -5 uA40 416 0.002 0.002 0.000 -4.84% 0.00% Krad(Si) 0 30 40 5040 417 0.001 0.002 -0.001 -79.30% 0.01% LL -5.000 -5.000 -5.000 -5.00040 421 0.002 0.002 0.000 -12.85% 0.00% Min 0.003 0.003 0.002 0.00440 425 0.003 0.002 0.001 41.21% 0.01% Average 0.003 0.003 0.002 0.00450 53 0.004 0.005 -0.002 -52.15% 0.02% Max 0.003 0.006 0.003 0.00550 54 0.005 0.005 0.000 1.84% 0.00% UL 5.000 5.000 5.000 5.00050 58 -0.002 0.005 -0.007 415.70% 0.07%

R² = 0.0301

-0.007

-0.006

-0.005

-0.004

-0.003

-0.002

-0.001

0.000

0.001

0.002

0.003

0 25 50 75

De

lta (

uA

)

Krad(Si)

PUC Leakage Current

50 512 0.004 0.005 -0.001 -20.47% 0.01%50 513 0.001 0.005 -0.004 -428.80% 0.04%50 515 0.003 0.004 -0.001 -19.26% 0.01%50 516 0.002 0.004 -0.002 -80.69% 0.02%50 517 0.001 0.004 -0.002 -222.75% 0.02%50 521 0.002 0.004 -0.002 -129.53% 0.02%50 525 0.003 0.004 -0.001 -41.72% 0.01%0 29 0.003 0.003 0.000 -18.51% 0.00%

Max 0.005 0.006 0.003 415.70% 0.07%Average 0.002 0.003 -0.001 -22.68% 0.02%

Min -0.002 0.002 -0.007 -428.80% 0.00%Std Dev 0.002 0.001 0.002 158.37% 0.02%

-8.000

-6.000

-4.000

-2.000

0.000

2.000

4.000

6.000

8.000

0 30 40 50

uA

Krad(Si)

PUC Leakage Current

Pass Range

Fail Range

Min

Average

Max

Page 31



PDA Low 1mA SinkTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 0.3 0.3Min Limit 0 0

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 0.015 0.015 0.000 3.23% 0.17%30 34 0.014 0.015 -0.001 -5.27% 0.25%30 38 0.015 0.015 0.000 -3.17% 0.15%30 312 0.015 0.015 0.000 -2.98% 0.15%30 313 0.014 0.015 -0.001 -4.98% 0.24%30 315 0.015 0.016 -0.001 -6.43% 0.32%30 316 0.015 0.016 -0.001 -7.69% 0.38%30 317 0.014 0.016 -0.002 -12.57% 0.58%30 321 0.015 0.016 -0.001 -5.71% 0.28%30 325 0.016 0.016 0.000 0.07% 0.00%40 43 0.015 0.015 0.000 0.38% 0.02% PDA Low 1mA Sink40 44 0.014 0.016 -0.001 -8.24% 0.40% Test Site SBDL40 48 0.015 0.015 -0.001 -5.43% 0.26% Tester ETS36440 412 0.015 0.016 -0.001 -5.62% 0.28% Test Number EF357940 413 0.014 0.015 -0.001 -7.63% 0.36% Max Limit 0.3 V40 415 0.015 0.016 -0.002 -10.81% 0.54% Min Limit 0 V40 416 0.015 0.017 -0.002 -12.60% 0.62% Krad(Si) 0 30 40 5040 417 0.014 0.016 -0.002 -17.59% 0.82% LL 0.000 0.000 0.000 0.00040 421 0.015 0.016 -0.002 -10.38% 0.51% Min 0.014 0.015 0.015 0.01640 425 0.016 0.016 -0.001 -4.71% 0.25% Average 0.014 0.015 0.016 0.01650 53 0.015 0.016 0.000 -2.59% 0.13% Max 0.014 0.016 0.017 0.01750 54 0.014 0.016 -0.002 -11.49% 0.55% UL 0.300 0.300 0.300 0.30050 58 0.015 0.016 -0.001 -9.13% 0.44%

R² = 0.3963

-0.004

-0.003

-0.003

-0.002

-0.002

-0.001

-0.001

0.000

0.001

0.001

0 25 50 75

De

lta (

V)

Krad(Si)

PDA Low 1mA Sink

50 512 0.015 0.016 -0.001 -8.86% 0.44%50 513 0.014 0.016 -0.002 -10.50% 0.50%50 515 0.015 0.017 -0.002 -13.37% 0.66%50 516 0.015 0.017 -0.002 -15.39% 0.75%50 517 0.014 0.017 -0.003 -20.96% 0.97%50 521 0.015 0.017 -0.002 -13.63% 0.67%50 525 0.016 0.017 -0.001 -7.71% 0.40%0 29 0.014 0.014 0.001 3.94% 0.19%

Max 0.016 0.017 0.001 3.94% 0.97%Average 0.015 0.016 -0.001 -7.67% 0.40%

Min 0.014 0.014 -0.003 -20.96% 0.00%Std Dev 0.000 0.001 0.001 5.71% 0.23%

0.000

0.050

0.100

0.150

0.200

0.250

0.300

0.350

0 30 40 50

V

Krad(Si)

PDA Low 1mA Sink

Pass Range

Fail Range

Min

Average

Max

Page 32



PDB Low 1mA SinkTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 0.3 0.3Min Limit 0 0

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 0.016 0.015 0.000 3.15% 0.17%30 34 0.015 0.016 -0.001 -4.95% 0.25%30 38 0.015 0.015 0.000 -2.76% 0.14%30 312 0.015 0.016 0.000 -2.38% 0.12%30 313 0.015 0.015 -0.001 -4.32% 0.21%30 315 0.015 0.016 -0.001 -6.51% 0.33%30 316 0.015 0.016 -0.001 -6.85% 0.34%30 317 0.014 0.016 -0.002 -13.38% 0.63%30 321 0.015 0.016 -0.001 -5.13% 0.26%30 325 0.016 0.016 0.000 -0.18% 0.01%40 43 0.016 0.016 0.000 2.14% 0.11% PDB Low 1mA Sink40 44 0.015 0.016 -0.001 -6.02% 0.30% Test Site SBDL40 48 0.015 0.016 -0.001 -3.76% 0.19% Tester ETS36440 412 0.015 0.016 -0.001 -3.57% 0.18% Test Number EF357940 413 0.015 0.015 -0.001 -5.00% 0.25% Max Limit 0.3 V40 415 0.015 0.017 -0.001 -9.81% 0.50% Min Limit 0 V40 416 0.015 0.017 -0.002 -10.10% 0.51% Krad(Si) 0 30 40 5040 417 0.014 0.017 -0.002 -16.97% 0.80% LL 0.000 0.000 0.000 0.00040 421 0.015 0.017 -0.001 -8.95% 0.45% Min 0.014 0.015 0.015 0.01640 425 0.016 0.017 -0.001 -3.49% 0.19% Average 0.014 0.016 0.016 0.01650 53 0.016 0.016 0.000 -0.51% 0.03% Max 0.014 0.016 0.017 0.01750 54 0.015 0.016 -0.001 -9.18% 0.46% UL 0.300 0.300 0.300 0.30050 58 0.015 0.016 -0.001 -6.63% 0.33%

R² = 0.2957

-0.003

-0.003

-0.002

-0.002

-0.001

-0.001

0.000

0.001

0.001

0.002

0 25 50 75

De

lta (

V)

Krad(Si)

PDB Low 1mA Sink

50 512 0.015 0.016 -0.001 -6.40% 0.32%50 513 0.015 0.016 -0.001 -7.24% 0.36%50 515 0.015 0.017 -0.002 -11.19% 0.57%50 516 0.015 0.017 -0.002 -12.09% 0.61%50 517 0.014 0.017 -0.003 -19.15% 0.91%50 521 0.015 0.017 -0.002 -11.46% 0.58%50 525 0.016 0.017 -0.001 -5.24% 0.28%0 29 0.015 0.014 0.001 6.07% 0.30%

Max 0.016 0.017 0.001 6.07% 0.91%Average 0.015 0.016 -0.001 -6.19% 0.34%

Min 0.014 0.014 -0.003 -19.15% 0.01%Std Dev 0.000 0.001 0.001 5.48% 0.21%

0.000

0.050

0.100

0.150

0.200

0.250

0.300

0.350

0 30 40 50

V

Krad(Si)

PDB Low 1mA Sink

Pass Range

Fail Range

Min

Average

Max

Page 33



PDC Low 1mA SinkTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 0.3 0.3Min Limit 0 0

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 0.016 0.016 0.001 3.30% 0.18%30 34 0.015 0.016 -0.001 -4.55% 0.23%30 38 0.015 0.016 0.000 -2.59% 0.13%30 312 0.015 0.016 0.000 -1.87% 0.10%30 313 0.015 0.016 -0.001 -4.17% 0.21%30 315 0.015 0.016 -0.001 -6.28% 0.32%30 316 0.015 0.016 -0.001 -6.62% 0.34%30 317 0.014 0.016 -0.002 -12.47% 0.60%30 321 0.015 0.016 -0.001 -5.42% 0.28%30 325 0.016 0.016 0.000 0.64% 0.03%40 43 0.016 0.016 0.000 1.99% 0.11% PDC Low 1mA Sink40 44 0.015 0.016 -0.001 -6.40% 0.32% Test Site SBDL40 48 0.015 0.016 -0.001 -4.22% 0.21% Tester ETS36440 412 0.015 0.016 -0.001 -3.43% 0.18% Test Number EF357940 413 0.015 0.016 -0.001 -5.43% 0.27% Max Limit 0.3 V40 415 0.015 0.017 -0.001 -9.47% 0.48% Min Limit 0 V40 416 0.015 0.017 -0.002 -10.75% 0.55% Krad(Si) 0 30 40 5040 417 0.014 0.017 -0.002 -16.55% 0.80% LL 0.000 0.000 0.000 0.00040 421 0.015 0.017 -0.001 -8.72% 0.45% Min 0.014 0.016 0.016 0.01640 425 0.016 0.017 0.000 -2.96% 0.16% Average 0.014 0.016 0.016 0.01750 53 0.016 0.016 0.000 -1.06% 0.06% Max 0.014 0.016 0.017 0.01750 54 0.015 0.017 -0.001 -9.58% 0.48% UL 0.300 0.300 0.300 0.30050 58 0.015 0.016 -0.001 -6.91% 0.35%

R² = 0.3208

-0.004

-0.003

-0.003

-0.002

-0.002

-0.001

-0.001

0.000

0.001

0.001

0.002

0 25 50 75

De

lta (

V)

Krad(Si)

PDC Low 1mA Sink

50 512 0.015 0.016 -0.001 -6.34% 0.33%50 513 0.015 0.016 -0.001 -8.17% 0.41%50 515 0.015 0.017 -0.002 -11.56% 0.59%50 516 0.015 0.017 -0.002 -12.00% 0.61%50 517 0.014 0.017 -0.003 -19.66% 0.95%50 521 0.015 0.017 -0.002 -11.19% 0.58%50 525 0.016 0.017 -0.001 -5.04% 0.28%0 29 0.015 0.014 0.001 5.70% 0.29%

Max 0.016 0.017 0.001 5.70% 0.95%Average 0.015 0.016 -0.001 -6.19% 0.35%

Min 0.014 0.014 -0.003 -19.66% 0.03%Std Dev 0.001 0.001 0.001 5.49% 0.22%

0.000

0.050

0.100

0.150

0.200

0.250

0.300

0.350

0 30 40 50

V

Krad(Si)

PDC Low 1mA Sink

Pass Range

Fail Range

Min

Average

Max

Page 34



PDA Low 50mA SinkTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 0.77 0.77Min Limit 0 0

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 0.552 0.522 0.030 5.50% 3.95%30 34 0.519 0.533 -0.014 -2.63% 1.78%30 38 0.521 0.530 -0.009 -1.72% 1.16%30 312 0.531 0.529 0.002 0.38% 0.26%30 313 0.517 0.526 -0.009 -1.67% 1.12%30 315 0.533 0.542 -0.010 -1.81% 1.25%30 316 0.525 0.538 -0.013 -2.43% 1.66%30 317 0.502 0.539 -0.038 -7.47% 4.87%30 321 0.537 0.539 -0.003 -0.48% 0.33%30 325 0.567 0.537 0.030 5.22% 3.84%40 43 0.552 0.534 0.018 3.30% 2.36% PDA Low 50mA Sink40 44 0.519 0.547 -0.027 -5.29% 3.57% Test Site SBDL40 48 0.521 0.544 -0.023 -4.42% 2.99% Tester ETS36440 412 0.531 0.543 -0.012 -2.17% 1.49% Test Number EF357940 413 0.517 0.539 -0.021 -4.15% 2.78% Max Limit 0.77 V40 415 0.533 0.556 -0.024 -4.47% 3.09% Min Limit 0 V40 416 0.525 0.551 -0.026 -5.01% 3.41% Krad(Si) 0 30 40 5040 417 0.502 0.553 -0.051 -10.23% 6.67% LL 0.000 0.000 0.000 0.00040 421 0.537 0.553 -0.016 -3.02% 2.11% Min 0.498 0.522 0.534 0.55040 425 0.567 0.551 0.015 2.72% 2.00% Average 0.498 0.533 0.547 0.55950 53 0.552 0.550 0.002 0.29% 0.21% Max 0.498 0.542 0.556 0.56550 54 0.519 0.564 -0.044 -8.56% 5.77% UL 0.770 0.770 0.770 0.77050 58 0.521 0.559 -0.039 -7.41% 5.01%

R² = 0.3006

-0.070-0.060-0.050-0.040-0.030-0.020-0.0100.0000.0100.0200.0300.040

0 25 50 75

De

lta (

V)

Krad(Si)

PDA Low 50mA Sink

50 512 0.531 0.557 -0.026 -4.87% 3.36%50 513 0.517 0.552 -0.035 -6.79% 4.56%50 515 0.533 0.565 -0.032 -5.99% 4.14%50 516 0.525 0.561 -0.036 -6.77% 4.62%50 517 0.502 0.562 -0.060 -12.02% 7.84%50 521 0.537 0.562 -0.025 -4.68% 3.26%50 525 0.567 0.559 0.008 1.42% 1.05%0 29 0.523 0.498 0.025 4.79% 3.25%

Max 0.567 0.565 0.030 5.50% 7.84%Average 0.530 0.545 -0.015 -2.92% 3.02%

Min 0.502 0.498 -0.060 -12.02% 0.21%Std Dev 0.018 0.015 0.023 4.43% 1.87%

0.000

0.100

0.200

0.300

0.400

0.500

0.600

0.700

0.800

0.900

0 30 40 50

V

Krad(Si)

PDA Low 50mA Sink

Pass Range

Fail Range

Min

Average

Max

Page 35



PDB Low 50mA SinkTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 0.77 0.77Min Limit 0 0

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 0.570 0.539 0.031 5.37% 3.97%30 34 0.537 0.552 -0.015 -2.86% 2.00%30 38 0.537 0.547 -0.010 -1.88% 1.31%30 312 0.548 0.546 0.002 0.31% 0.22%30 313 0.534 0.544 -0.010 -1.84% 1.28%30 315 0.549 0.560 -0.011 -1.96% 1.40%30 316 0.542 0.556 -0.015 -2.68% 1.89%30 317 0.518 0.558 -0.040 -7.72% 5.19%30 321 0.554 0.559 -0.004 -0.80% 0.58%30 325 0.584 0.554 0.030 5.11% 3.87%40 43 0.570 0.552 0.018 3.08% 2.28% PDB Low 50mA Sink40 44 0.537 0.567 -0.030 -5.68% 3.96% Test Site SBDL40 48 0.537 0.562 -0.025 -4.69% 3.26% Tester ETS36440 412 0.548 0.560 -0.013 -2.31% 1.65% Test Number EF357940 413 0.534 0.558 -0.023 -4.37% 3.03% Max Limit 0.77 V40 415 0.549 0.575 -0.026 -4.72% 3.36% Min Limit 0 V40 416 0.542 0.571 -0.029 -5.37% 3.78% Krad(Si) 0 30 40 5040 417 0.518 0.573 -0.055 -10.61% 7.13% LL 0.000 0.000 0.000 0.00040 421 0.554 0.574 -0.019 -3.50% 2.52% Min 0.514 0.539 0.552 0.56940 425 0.584 0.569 0.015 2.56% 1.94% Average 0.514 0.551 0.566 0.57850 53 0.570 0.569 0.001 0.12% 0.09% Max 0.514 0.560 0.575 0.58550 54 0.537 0.585 -0.048 -8.97% 6.26% UL 0.770 0.770 0.770 0.77050 58 0.537 0.577 -0.041 -7.63% 5.32%

R² = 0.3066

-0.080

-0.060

-0.040

-0.020

0.000

0.020

0.040

0 25 50 75

De

lta (

V)

Krad(Si)

PDB Low 50mA Sink

50 512 0.548 0.575 -0.028 -5.04% 3.59%50 513 0.534 0.572 -0.038 -7.06% 4.90%50 515 0.549 0.583 -0.034 -6.24% 4.45%50 516 0.542 0.580 -0.038 -7.08% 4.98%50 517 0.518 0.582 -0.064 -12.42% 8.35%50 521 0.554 0.583 -0.029 -5.16% 3.71%50 525 0.584 0.577 0.007 1.27% 0.97%0 29 0.540 0.514 0.026 4.85% 3.40%

Max 0.584 0.585 0.031 5.37% 8.35%Average 0.547 0.564 -0.017 -3.16% 3.25%

Min 0.518 0.514 -0.064 -12.42% 0.09%Std Dev 0.018 0.016 0.024 4.51% 1.99%

0.000

0.100

0.200

0.300

0.400

0.500

0.600

0.700

0.800

0.900

0 30 40 50

V

Krad(Si)

PDB Low 50mA Sink

Pass Range

Fail Range

Min

Average

Max

Page 36



PDC Low 50mA SinkTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 0.77 0.77Min Limit 0 0

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 0.582 0.554 0.028 4.73% 3.58%30 34 0.548 0.568 -0.020 -3.61% 2.57%30 38 0.550 0.564 -0.015 -2.69% 1.92%30 312 0.561 0.562 -0.001 -0.21% 0.15%30 313 0.547 0.563 -0.015 -2.81% 1.99%30 315 0.561 0.577 -0.016 -2.83% 2.06%30 316 0.554 0.574 -0.020 -3.69% 2.65%30 317 0.531 0.579 -0.048 -9.00% 6.21%30 321 0.567 0.578 -0.011 -1.91% 1.41%30 325 0.598 0.575 0.022 3.74% 2.90%40 43 0.582 0.569 0.012 2.11% 1.60% PDC Low 50mA Sink40 44 0.548 0.585 -0.038 -6.87% 4.89% Test Site SBDL40 48 0.550 0.583 -0.033 -5.99% 4.28% Tester ETS36440 412 0.561 0.579 -0.018 -3.22% 2.34% Test Number EF357940 413 0.547 0.579 -0.032 -5.88% 4.18% Max Limit 0.77 V40 415 0.561 0.595 -0.034 -6.04% 4.40% Min Limit 0 V40 416 0.554 0.591 -0.038 -6.82% 4.90% Krad(Si) 0 30 40 5040 417 0.531 0.597 -0.066 -12.42% 8.57% LL 0.000 0.000 0.000 0.00040 421 0.567 0.596 -0.029 -5.12% 3.77% Min 0.527 0.554 0.569 0.58840 425 0.598 0.594 0.004 0.65% 0.50% Average 0.527 0.569 0.587 0.60150 53 0.582 0.588 -0.006 -1.00% 0.75% Max 0.527 0.579 0.597 0.60850 54 0.548 0.605 -0.057 -10.38% 7.38% UL 0.770 0.770 0.770 0.77050 58 0.550 0.600 -0.050 -9.13% 6.52%

R² = 0.3637

-0.100

-0.080

-0.060

-0.040

-0.020

0.000

0.020

0.040

0 25 50 75

De

lta (

V)

Krad(Si)

PDC Low 50mA Sink

50 512 0.561 0.595 -0.034 -6.09% 4.43%50 513 0.547 0.595 -0.048 -8.72% 6.20%50 515 0.561 0.604 -0.043 -7.68% 5.60%50 516 0.554 0.602 -0.048 -8.69% 6.25%50 517 0.531 0.608 -0.077 -14.44% 9.96%50 521 0.567 0.607 -0.039 -6.96% 5.13%50 525 0.598 0.603 -0.005 -0.90% 0.70%0 29 0.554 0.527 0.027 4.80% 3.45%

Max 0.598 0.608 0.028 4.80% 9.96%Average 0.560 0.584 -0.024 -4.42% 3.91%

Min 0.531 0.527 -0.077 -14.44% 0.15%Std Dev 0.018 0.018 0.026 4.77% 2.42%

0.000

0.100

0.200

0.300

0.400

0.500

0.600

0.700

0.800

0.900

0 30 40 50

V

Krad(Si)

PDC Low 50mA Sink

Pass Range

Fail Range

Min

Average

Max

Page 37



PDA Rise timeTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit ns nsMax Limit 400 400Min Limit 10 10

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 49.899 48.047 1.852 3.71% 0.47%30 34 48.343 49.430 -1.087 -2.25% 0.28%30 38 48.537 49.311 -0.774 -1.59% 0.20%30 312 49.510 48.871 0.639 1.29% 0.16%30 313 48.676 49.064 -0.388 -0.80% 0.10%30 315 49.065 48.594 0.471 0.96% 0.12%30 316 48.778 48.270 0.508 1.04% 0.13%30 317 47.064 48.502 -1.439 -3.06% 0.37%30 321 49.667 48.390 1.277 2.57% 0.33%30 325 51.199 48.430 2.770 5.41% 0.71%40 43 49.899 49.202 0.697 1.40% 0.18% PDA Rise time40 44 48.343 50.205 -1.863 -3.85% 0.48% Test Site SBDL40 48 48.537 50.418 -1.881 -3.87% 0.48% Tester ETS36440 412 49.510 49.490 0.019 0.04% 0.00% Test Number EF357940 413 48.676 50.480 -1.804 -3.71% 0.46% Max Limit 400 ns40 415 49.065 49.961 -0.897 -1.83% 0.23% Min Limit 10 ns40 416 48.778 49.408 -0.630 -1.29% 0.16% Krad(Si) 0 30 40 5040 417 47.064 49.950 -2.887 -6.13% 0.74% LL 10.000 10.000 10.000 10.00040 421 49.667 50.284 -0.617 -1.24% 0.16% Min 48.454 48.047 49.202 51.60040 425 51.199 50.018 1.181 2.31% 0.30% Average 48.454 48.691 49.942 55.36350 53 49.899 51.600 -1.701 -3.41% 0.44% Max 48.454 49.430 50.480 65.44850 54 48.343 52.792 -4.449 -9.20% 1.14% UL 400.000 400.000 400.000 400.00050 58 48.537 53.037 -4.500 -9.27% 1.15%

R² = 0.3856

-20.000

-15.000

-10.000

-5.000

0.000

5.000

10.000

0 25 50 75

De

lta (

ns)

Krad(Si)

PDA Rise time

50 512 49.510 52.022 -2.513 -5.08% 0.64%50 513 48.676 52.989 -4.313 -8.86% 1.11%50 515 49.065 53.180 -4.116 -8.39% 1.06%50 516 48.778 57.943 -9.165 -18.79% 2.35%50 517 47.064 54.550 -7.487 -15.91% 1.92%50 521 49.667 60.071 -10.404 -20.95% 2.67%50 525 51.199 65.448 -14.249 -27.83% 3.65%0 29 48.753 48.454 0.299 0.61% 0.08%

Max 51.199 65.448 2.770 5.41% 3.65%Average 49.063 51.239 -2.176 -4.45% 0.72%

Min 47.064 48.047 -14.249 -27.83% 0.00%Std Dev 1.043 3.839 3.782 7.59% 0.85%

0.000

50.000

100.000

150.000

200.000

250.000

300.000

350.000

400.000

450.000

0 30 40 50

ns

Krad(Si)

PDA Rise time

Pass Range

Fail Range

Min

Average

Max

Page 38



PDA Hi 1mA SourceTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 12 12Min Limit 9.95 9.95

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 10.580 10.414 0.166 1.57% 8.09%30 34 10.470 10.423 0.047 0.45% 2.28%30 38 10.477 10.421 0.056 0.53% 2.72%30 312 10.518 10.418 0.100 0.95% 4.89%30 313 10.483 10.420 0.062 0.60% 3.04%30 315 10.506 10.421 0.085 0.81% 4.14%30 316 10.497 10.417 0.080 0.76% 3.89%30 317 10.412 10.417 -0.005 -0.05% 0.24%30 321 10.527 10.415 0.112 1.06% 5.46%30 325 10.612 10.418 0.194 1.83% 9.47%40 43 10.580 10.418 0.162 1.54% 7.92% PDA Hi 1mA Source40 44 10.470 10.427 0.043 0.41% 2.09% Test Site SBDL40 48 10.477 10.426 0.051 0.49% 2.48% Tester ETS36440 412 10.518 10.422 0.096 0.91% 4.68% Test Number EF357940 413 10.483 10.422 0.060 0.58% 2.94% Max Limit 12 V40 415 10.506 10.420 0.086 0.82% 4.19% Min Limit 9.95 V40 416 10.497 10.418 0.079 0.75% 3.83% Krad(Si) 0 30 40 5040 417 10.412 10.418 -0.006 -0.06% 0.28% LL 9.950 9.950 9.950 9.95040 421 10.527 10.416 0.111 1.05% 5.40% Min 10.413 10.414 10.416 10.42340 425 10.612 10.419 0.194 1.82% 9.44% Average 10.413 10.418 10.421 10.43950 53 10.580 10.451 0.129 1.22% 6.32% Max 10.413 10.423 10.427 10.45850 54 10.470 10.458 0.012 0.11% 0.57% UL 12.000 12.000 12.000 12.00050 58 10.477 10.455 0.022 0.21% 1.08%

R² = 0.0106

-0.050

0.000

0.050

0.100

0.150

0.200

0.250

0 25 50 75

De

lta (

V)

Krad(Si)

PDA Hi 1mA Source

50 512 10.518 10.448 0.070 0.67% 3.43%50 513 10.483 10.446 0.036 0.35% 1.78%50 515 10.506 10.426 0.080 0.76% 3.89%50 516 10.497 10.428 0.069 0.66% 3.36%50 517 10.412 10.426 -0.014 -0.14% 0.69%50 521 10.527 10.423 0.103 0.98% 5.04%50 525 10.612 10.425 0.187 1.76% 9.13%0 29 10.492 10.413 0.079 0.75% 3.86%

Max 10.612 10.458 0.194 1.83% 9.47%Average 10.508 10.425 0.082 0.78% 4.08%

Min 10.412 10.413 -0.014 -0.14% 0.24%Std Dev 0.054 0.012 0.056 0.53% 2.63%

0.000

2.000

4.000

6.000

8.000

10.000

12.000

14.000

0 30 40 50

V

Krad(Si)

PDA Hi 1mA Source

Pass Range

Fail Range

Min

Average

Max

Page 39



PUC Low 1mA SinkTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 0.25 0.25Min Limit 0 0

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 0.026 0.028 -0.002 -9.35% 0.96%30 34 0.024 0.028 -0.004 -16.27% 1.58%30 38 0.024 0.028 -0.004 -15.70% 1.53%30 312 0.025 0.028 -0.004 -14.42% 1.43%30 313 0.024 0.028 -0.004 -15.68% 1.53%30 315 0.025 0.028 -0.003 -13.89% 1.37%30 316 0.025 0.028 -0.004 -14.37% 1.41%30 317 0.024 0.028 -0.004 -18.39% 1.74%30 321 0.025 0.028 -0.003 -12.72% 1.27%30 325 0.026 0.028 -0.002 -7.95% 0.83%40 43 0.026 0.029 -0.004 -13.76% 1.41% PUC Low 1mA Sink40 44 0.024 0.030 -0.005 -21.33% 2.08% Test Site SBDL40 48 0.024 0.029 -0.005 -19.79% 1.93% Tester ETS36440 412 0.025 0.030 -0.005 -19.01% 1.89% Test Number EF357940 413 0.024 0.029 -0.005 -20.31% 1.98% Max Limit 0.25 V40 415 0.025 0.029 -0.004 -17.78% 1.76% Min Limit 0 V40 416 0.025 0.029 -0.005 -18.36% 1.80% Krad(Si) 0 30 40 5040 417 0.024 0.029 -0.005 -22.83% 2.16% LL 0.000 0.000 0.000 0.00040 421 0.025 0.029 -0.004 -17.13% 1.71% Min 0.023 0.028 0.029 0.03040 425 0.026 0.029 -0.003 -12.20% 1.27% Average 0.023 0.028 0.029 0.03050 53 0.026 0.030 -0.005 -17.90% 1.83% Max 0.023 0.028 0.030 0.03050 54 0.024 0.030 -0.006 -24.69% 2.40% UL 0.250 0.250 0.250 0.25050 58 0.024 0.030 -0.006 -23.11% 2.26%

R² = 0.7327

-0.007

-0.006

-0.005

-0.004

-0.003

-0.002

-0.001

0.000

0.001

0.002

0 25 50 75

De

lta (

V)

Krad(Si)

PUC Low 1mA Sink

50 512 0.025 0.030 -0.005 -21.79% 2.17%50 513 0.024 0.030 -0.006 -23.10% 2.25%50 515 0.025 0.030 -0.005 -20.13% 1.99%50 516 0.025 0.030 -0.005 -21.05% 2.07%50 517 0.024 0.030 -0.006 -25.44% 2.41%50 521 0.025 0.030 -0.005 -19.62% 1.96%50 525 0.026 0.030 -0.004 -13.89% 1.45%0 29 0.025 0.023 0.001 5.61% 0.55%

Max 0.026 0.030 0.001 5.61% 2.41%Average 0.025 0.029 -0.004 -16.98% 1.71%

Min 0.024 0.023 -0.006 -25.44% 0.55%Std Dev 0.001 0.001 0.001 6.00% 0.45%

0.000

0.050

0.100

0.150

0.200

0.250

0.300

0 30 40 50

V

Krad(Si)

PUC Low 1mA Sink

Pass Range

Fail Range

Min

Average

Max

Page 40



PDA Hi 50mA SourceTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 12 12Min Limit 9.85 9.85

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 10.401 10.255 0.147 1.41% 6.82%30 34 10.306 10.263 0.043 0.42% 2.01%30 38 10.312 10.261 0.051 0.49% 2.37%30 312 10.348 10.258 0.090 0.87% 4.19%30 313 10.316 10.259 0.057 0.55% 2.65%30 315 10.337 10.260 0.077 0.74% 3.57%30 316 10.329 10.257 0.072 0.70% 3.35%30 317 10.255 10.257 -0.002 -0.02% 0.11%30 321 10.355 10.254 0.101 0.97% 4.68%30 325 10.429 10.258 0.171 1.64% 7.95%40 43 10.401 10.258 0.144 1.38% 6.68% PDA Hi 50mA Source40 44 10.306 10.266 0.040 0.39% 1.85% Test Site SBDL40 48 10.312 10.265 0.047 0.46% 2.19% Tester ETS36440 412 10.348 10.261 0.087 0.84% 4.05% Test Number EF357940 413 10.316 10.261 0.055 0.54% 2.58% Max Limit 12 V40 415 10.337 10.259 0.078 0.75% 3.62% Min Limit 9.85 V40 416 10.329 10.258 0.071 0.69% 3.32% Krad(Si) 0 30 40 5040 417 10.255 10.257 -0.003 -0.03% 0.13% LL 9.850 9.850 9.850 9.85040 421 10.355 10.255 0.100 0.96% 4.64% Min 10.257 10.254 10.255 10.26240 425 10.429 10.258 0.171 1.64% 7.95% Average 10.257 10.258 10.260 10.27550 53 10.401 10.286 0.115 1.11% 5.36% Max 10.257 10.263 10.266 10.29350 54 10.306 10.293 0.013 0.13% 0.62% UL 12.000 12.000 12.000 12.00050 58 10.312 10.290 0.022 0.22% 1.04%

R² = 0.0086

-0.0200.0000.0200.0400.0600.0800.1000.1200.1400.1600.1800.200

0 25 50 75

De

lta (

V)

Krad(Si)

PDA Hi 50mA Source

50 512 10.348 10.284 0.065 0.63% 3.02%50 513 10.316 10.282 0.034 0.33% 1.60%50 515 10.337 10.264 0.073 0.70% 3.39%50 516 10.329 10.267 0.063 0.61% 2.92%50 517 10.255 10.264 -0.009 -0.09% 0.44%50 521 10.355 10.262 0.093 0.90% 4.33%50 525 10.429 10.263 0.166 1.59% 7.72%0 29 10.325 10.257 0.069 0.67% 3.20%

Max 10.429 10.293 0.171 1.64% 7.95%Average 10.339 10.264 0.074 0.72% 3.49%

Min 10.255 10.254 -0.009 -0.09% 0.11%Std Dev 0.047 0.011 0.049 0.47% 2.21%

0.000

2.000

4.000

6.000

8.000

10.000

12.000

14.000

0 30 40 50

V

Krad(Si)

PDA Hi 50mA Source

Pass Range

Fail Range

Min

Average

Max

Page 41



PUC Low 50mA SinkTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 1.25 1.25Min Limit 0 0

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 0.821 0.759 0.062 7.60% 4.99%30 34 0.775 0.769 0.006 0.73% 0.45%30 38 0.777 0.765 0.012 1.55% 0.96%30 312 0.793 0.768 0.025 3.15% 2.00%30 313 0.778 0.766 0.012 1.60% 1.00%30 315 0.789 0.766 0.023 2.91% 1.84%30 316 0.780 0.762 0.019 2.43% 1.52%30 317 0.751 0.765 -0.015 -1.94% 1.17%30 321 0.802 0.767 0.035 4.35% 2.79%30 325 0.845 0.765 0.079 9.38% 6.34%40 43 0.821 0.762 0.059 7.15% 4.69% PUC Low 50mA Sink40 44 0.775 0.773 0.002 0.22% 0.14% Test Site SBDL40 48 0.777 0.769 0.008 1.03% 0.64% Tester ETS36440 412 0.793 0.772 0.021 2.64% 1.67% Test Number EF357940 413 0.778 0.769 0.010 1.25% 0.78% Max Limit 1.25 V40 415 0.789 0.768 0.021 2.62% 1.65% Min Limit 0 V40 416 0.780 0.764 0.016 2.11% 1.32% Krad(Si) 0 30 40 5040 417 0.751 0.769 -0.018 -2.35% 1.41% LL 0.000 0.000 0.000 0.00040 421 0.802 0.769 0.032 4.02% 2.58% Min 0.749 0.759 0.762 0.76940 425 0.845 0.768 0.077 9.06% 6.12% Average 0.749 0.765 0.768 0.77750 53 0.821 0.777 0.044 5.33% 3.50% Max 0.749 0.769 0.773 0.78750 54 0.775 0.787 -0.013 -1.63% 1.01% UL 1.250 1.250 1.250 1.25050 58 0.777 0.782 -0.005 -0.65% 0.41%

R² = 0.0373

-0.040

-0.020

0.000

0.020

0.040

0.060

0.080

0.100

0 25 50 75

De

lta (

V)

Krad(Si)

PUC Low 50mA Sink

50 512 0.793 0.785 0.009 1.09% 0.69%50 513 0.778 0.780 -0.002 -0.21% 0.13%50 515 0.789 0.771 0.017 2.20% 1.39%50 516 0.780 0.769 0.011 1.46% 0.91%50 517 0.751 0.773 -0.022 -2.92% 1.75%50 521 0.802 0.774 0.028 3.45% 2.21%50 525 0.845 0.772 0.073 8.59% 5.81%0 29 0.783 0.749 0.034 4.32% 2.71%

Max 0.845 0.787 0.079 9.38% 6.34%Average 0.791 0.770 0.021 2.60% 2.08%

Min 0.751 0.749 -0.022 -2.92% 0.13%Std Dev 0.025 0.008 0.027 3.25% 1.77%

0.000

0.200

0.400

0.600

0.800

1.000

1.200

1.400

0 30 40 50

V

Krad(Si)

PUC Low 50mA Sink

Pass Range

Fail Range

Min

Average

Max

Page 42



PDA Fall TimeTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit ns nsMax Limit 400 400Min Limit 10 10

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 66.374 61.222 5.152 7.76% 1.32%30 34 64.870 61.872 2.997 4.62% 0.77%30 38 65.119 62.192 2.927 4.50% 0.75%30 312 66.109 61.283 4.826 7.30% 1.24%30 313 65.118 61.739 3.379 5.19% 0.87%30 315 65.584 61.056 4.528 6.90% 1.16%30 316 65.454 60.965 4.488 6.86% 1.15%30 317 64.192 60.477 3.715 5.79% 0.95%30 321 65.393 61.042 4.351 6.65% 1.12%30 325 66.518 60.980 5.538 8.33% 1.42%40 43 66.374 276.408 -210.034 -316.44% 53.85% PDA Fall Time40 44 64.870 277.798 -212.928 -328.24% 54.60% Test Site SBDL40 48 65.119 276.972 -211.852 -325.33% 54.32% Tester ETS36440 412 66.109 277.111 -211.002 -319.17% 54.10% Test Number EF357940 413 65.118 276.039 -210.920 -323.90% 54.08% Max Limit 400 ns40 415 65.584 276.264 -210.679 -321.24% 54.02% Min Limit 10 ns40 416 65.454 277.736 -212.283 -324.33% 54.43% Krad(Si) 0 30 40 5040 417 64.192 278.897 -214.705 -334.47% 55.05% LL 10.000 10.000 10.000 10.00040 421 65.393 277.162 -211.769 -323.84% 54.30% Min 279.819 60.477 276.039 278.08640 425 66.518 278.060 -211.542 -318.02% 54.24% Average 279.819 61.283 277.245 279.39050 53 66.374 278.959 -212.584 -320.28% 54.51% Max 279.819 62.192 278.897 280.73950 54 64.870 280.570 -215.701 -332.51% 55.31% UL 400.000 400.000 400.000 400.00050 58 65.119 280.739 -215.619 -331.11% 55.29%

R² = 0.3159

-250.000

-200.000

-150.000

-100.000

-50.000

0.000

50.000

100.000

0 25 50 75

De

lta (

ns)

Krad(Si)

PDA Fall Time

50 512 66.109 279.080 -212.971 -322.15% 54.61%50 513 65.118 279.043 -213.925 -328.52% 54.85%50 515 65.584 279.643 -214.059 -326.39% 54.89%50 516 65.454 278.086 -212.632 -324.86% 54.52%50 517 64.192 278.785 -214.593 -334.30% 55.02%50 521 65.393 279.219 -213.826 -326.99% 54.83%50 525 66.518 279.775 -213.256 -320.60% 54.68%0 29 64.731 279.819 -215.088 -332.28% 55.15%

Max 66.518 280.739 5.538 8.33% 55.31%Average 65.449 208.355 -142.905 -218.42% 37.34%

Min 64.192 60.477 -215.701 -334.47% 0.75%Std Dev 0.690 103.173 103.194 157.76% 25.44%

0.000

50.000

100.000

150.000

200.000

250.000

300.000

350.000

400.000

450.000

0 30 40 50

ns

Krad(Si)

PDA Fall Time

Pass Range

Fail Range

Min

Average

Max

Page 43



PDB Rise timeTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit ns nsMax Limit 400 400Min Limit 10 10

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 48.711 46.860 1.851 3.80% 0.47%30 34 46.825 47.954 -1.129 -2.41% 0.29%30 38 46.680 47.965 -1.285 -2.75% 0.33%30 312 48.212 47.229 0.983 2.04% 0.25%30 313 47.150 48.073 -0.923 -1.96% 0.24%30 315 47.554 46.866 0.688 1.45% 0.18%30 316 47.232 47.111 0.121 0.26% 0.03%30 317 45.495 46.938 -1.443 -3.17% 0.37%30 321 48.254 47.451 0.803 1.66% 0.21%30 325 50.008 47.485 2.523 5.04% 0.65%40 43 48.711 48.144 0.567 1.16% 0.15% PDB Rise time40 44 46.825 49.398 -2.573 -5.50% 0.66% Test Site SBDL40 48 46.680 49.544 -2.864 -6.14% 0.73% Tester ETS36440 412 48.212 48.586 -0.374 -0.78% 0.10% Test Number EF357940 413 47.150 49.649 -2.498 -5.30% 0.64% Max Limit 400 ns40 415 47.554 48.579 -1.025 -2.16% 0.26% Min Limit 10 ns40 416 47.232 48.550 -1.319 -2.79% 0.34% Krad(Si) 0 30 40 5040 417 45.495 48.974 -3.480 -7.65% 0.89% LL 10.000 10.000 10.000 10.00040 421 48.254 49.384 -1.129 -2.34% 0.29% Min 47.250 46.860 48.144 50.56940 425 50.008 49.267 0.741 1.48% 0.19% Average 47.250 47.393 49.008 52.65450 53 48.711 50.569 -1.858 -3.81% 0.48% Max 47.250 48.073 49.649 55.47150 54 46.825 51.663 -4.838 -10.33% 1.24% UL 400.000 400.000 400.000 400.00050 58 46.680 51.943 -5.263 -11.27% 1.35%

R² = 0.4875

-10.000

-8.000

-6.000

-4.000

-2.000

0.000

2.000

4.000

6.000

0 25 50 75

De

lta (

ns)

Krad(Si)

PDB Rise time

50 512 48.212 50.786 -2.574 -5.34% 0.66%50 513 47.150 52.238 -5.088 -10.79% 1.30%50 515 47.554 52.385 -4.831 -10.16% 1.24%50 516 47.232 53.784 -6.552 -13.87% 1.68%50 517 45.495 53.427 -7.932 -17.43% 2.03%50 521 48.254 55.471 -7.217 -14.96% 1.85%50 525 50.008 54.275 -4.267 -8.53% 1.09%0 29 47.479 47.250 0.229 0.48% 0.06%

Max 50.008 55.471 2.523 5.04% 2.03%Average 47.608 49.606 -1.999 -4.26% 0.65%

Min 45.495 46.860 -7.932 -17.43% 0.03%Std Dev 1.186 2.432 2.700 5.72% 0.56%

0.000

50.000

100.000

150.000

200.000

250.000

300.000

350.000

400.000

450.000

0 30 40 50

ns

Krad(Si)

PDB Rise time

Pass Range

Fail Range

Min

Average

Max

Page 44



PDB Hi 1mA SourceTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 12 12Min Limit 9.95 9.95

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 10.582 10.416 0.166 1.57% 8.10%30 34 10.472 10.425 0.048 0.45% 2.32%30 38 10.480 10.423 0.057 0.54% 2.76%30 312 10.521 10.420 0.101 0.96% 4.93%30 313 10.485 10.422 0.063 0.60% 3.07%30 315 10.508 10.422 0.086 0.82% 4.18%30 316 10.499 10.419 0.080 0.76% 3.90%30 317 10.414 10.419 -0.005 -0.05% 0.23%30 321 10.529 10.417 0.112 1.07% 5.48%30 325 10.614 10.420 0.194 1.83% 9.47%40 43 10.582 10.420 0.162 1.53% 7.92% PDB Hi 1mA Source40 44 10.472 10.430 0.043 0.41% 2.10% Test Site SBDL40 48 10.480 10.429 0.051 0.49% 2.50% Tester ETS36440 412 10.521 10.424 0.097 0.92% 4.72% Test Number EF357940 413 10.485 10.425 0.060 0.58% 2.95% Max Limit 12 V40 415 10.508 10.421 0.087 0.82% 4.22% Min Limit 9.95 V40 416 10.499 10.420 0.079 0.76% 3.87% Krad(Si) 0 30 40 5040 417 10.414 10.420 -0.006 -0.06% 0.28% LL 9.950 9.950 9.950 9.95040 421 10.529 10.418 0.111 1.05% 5.41% Min 10.416 10.416 10.418 10.42540 425 10.614 10.421 0.194 1.82% 9.45% Average 10.416 10.420 10.423 10.44050 53 10.582 10.452 0.130 1.23% 6.35% Max 10.416 10.425 10.430 10.46050 54 10.472 10.460 0.013 0.12% 0.62% UL 12.000 12.000 12.000 12.00050 58 10.480 10.457 0.023 0.22% 1.14%

R² = 0.0103

-0.050

0.000

0.050

0.100

0.150

0.200

0.250

0 25 50 75

De

lta (

V)

Krad(Si)

PDB Hi 1mA Source

50 512 10.521 10.449 0.071 0.68% 3.49%50 513 10.485 10.448 0.037 0.36% 1.82%50 515 10.508 10.427 0.081 0.77% 3.95%50 516 10.499 10.430 0.069 0.66% 3.39%50 517 10.414 10.427 -0.013 -0.13% 0.65%50 521 10.529 10.425 0.104 0.98% 5.05%50 525 10.614 10.426 0.188 1.77% 9.16%0 29 10.495 10.416 0.080 0.76% 3.88%

Max 10.614 10.460 0.194 1.83% 9.47%Average 10.510 10.427 0.083 0.78% 4.11%

Min 10.414 10.416 -0.013 -0.13% 0.23%Std Dev 0.054 0.012 0.056 0.53% 2.63%

0.000

2.000

4.000

6.000

8.000

10.000

12.000

14.000

0 30 40 50

V

Krad(Si)

PDB Hi 1mA Source

Pass Range

Fail Range

Min

Average

Max

Page 45



PUA Low 1mA SinkTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 0.25 0.25Min Limit 0 0

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 0.026 0.029 -0.003 -10.52% 1.10%30 34 0.025 0.029 -0.004 -17.38% 1.73%30 38 0.025 0.029 -0.004 -16.69% 1.67%30 312 0.025 0.029 -0.004 -16.10% 1.63%30 313 0.025 0.029 -0.004 -16.63% 1.66%30 315 0.025 0.029 -0.004 -14.10% 1.43%30 316 0.025 0.029 -0.004 -15.13% 1.52%30 317 0.024 0.029 -0.005 -19.43% 1.88%30 321 0.026 0.029 -0.003 -12.76% 1.30%30 325 0.027 0.029 -0.002 -9.17% 0.97%40 43 0.026 0.030 -0.004 -15.00% 1.57% PUA Low 1mA Sink40 44 0.025 0.030 -0.005 -21.64% 2.15% Test Site SBDL40 48 0.025 0.030 -0.005 -20.65% 2.06% Tester ETS36440 412 0.025 0.030 -0.005 -20.45% 2.07% Test Number EF357940 413 0.025 0.030 -0.005 -20.63% 2.06% Max Limit 0.25 V40 415 0.025 0.030 -0.005 -18.41% 1.86% Min Limit 0 V40 416 0.025 0.030 -0.005 -19.60% 1.96% Krad(Si) 0 30 40 5040 417 0.024 0.030 -0.006 -24.03% 2.32% LL 0.000 0.000 0.000 0.00040 421 0.026 0.030 -0.004 -17.30% 1.77% Min 0.024 0.029 0.030 0.03140 425 0.027 0.030 -0.003 -13.01% 1.38% Average 0.024 0.029 0.030 0.03150 53 0.026 0.031 -0.005 -18.86% 1.97% Max 0.024 0.029 0.030 0.03150 54 0.025 0.031 -0.006 -25.55% 2.54% UL 0.250 0.250 0.250 0.25050 58 0.025 0.031 -0.006 -24.33% 2.43%

R² = 0.7397

-0.007

-0.006

-0.005

-0.004

-0.003

-0.002

-0.001

0.000

0.001

0.002

0 25 50 75

De

lta (

V)

Krad(Si)

PUA Low 1mA Sink

50 512 0.025 0.031 -0.006 -23.85% 2.41%50 513 0.025 0.031 -0.006 -24.36% 2.43%50 515 0.025 0.031 -0.005 -20.78% 2.10%50 516 0.025 0.031 -0.006 -22.15% 2.22%50 517 0.024 0.031 -0.006 -26.65% 2.57%50 521 0.026 0.031 -0.005 -19.73% 2.01%50 525 0.027 0.031 -0.004 -15.27% 1.62%0 29 0.025 0.024 0.001 4.81% 0.48%

Max 0.027 0.031 0.001 4.81% 2.57%Average 0.025 0.030 -0.005 -17.91% 1.84%

Min 0.024 0.024 -0.006 -26.65% 0.48%Std Dev 0.001 0.001 0.001 6.07% 0.48%

0.000

0.050

0.100

0.150

0.200

0.250

0.300

0 30 40 50

V

Krad(Si)

PUA Low 1mA Sink

Pass Range

Fail Range

Min

Average

Max

Page 46



PDB Hi 50mA SourceTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 12 12Min Limit 9.85 9.85

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 10.405 10.258 0.147 1.41% 6.84%30 34 10.309 10.266 0.044 0.42% 2.03%30 38 10.315 10.264 0.051 0.49% 2.37%30 312 10.352 10.261 0.091 0.88% 4.23%30 313 10.320 10.262 0.058 0.56% 2.68%30 315 10.340 10.263 0.077 0.75% 3.60%30 316 10.333 10.260 0.072 0.70% 3.37%30 317 10.257 10.259 -0.002 -0.02% 0.09%30 321 10.358 10.257 0.101 0.97% 4.69%30 325 10.432 10.260 0.172 1.65% 8.00%40 43 10.405 10.261 0.144 1.39% 6.70% PDB Hi 50mA Source40 44 10.309 10.269 0.040 0.39% 1.87% Test Site SBDL40 48 10.315 10.268 0.047 0.46% 2.20% Tester ETS36440 412 10.352 10.264 0.088 0.85% 4.08% Test Number EF357940 413 10.320 10.264 0.056 0.54% 2.60% Max Limit 12 V40 415 10.340 10.261 0.079 0.76% 3.66% Min Limit 9.85 V40 416 10.333 10.261 0.072 0.70% 3.35% Krad(Si) 0 30 40 5040 417 10.257 10.260 -0.002 -0.02% 0.11% LL 9.850 9.850 9.850 9.85040 421 10.358 10.258 0.100 0.97% 4.65% Min 10.259 10.257 10.258 10.26440 425 10.432 10.261 0.172 1.64% 7.98% Average 10.259 10.261 10.263 10.27850 53 10.405 10.289 0.116 1.12% 5.40% Max 10.259 10.266 10.269 10.29550 54 10.309 10.295 0.014 0.13% 0.64% UL 12.000 12.000 12.000 12.00050 58 10.315 10.293 0.023 0.22% 1.06%

R² = 0.0082

-0.0200.0000.0200.0400.0600.0800.1000.1200.1400.1600.1800.200

0 25 50 75

De

lta (

V)

Krad(Si)

PDB Hi 50mA Source

50 512 10.352 10.286 0.066 0.63% 3.05%50 513 10.320 10.284 0.035 0.34% 1.65%50 515 10.340 10.266 0.074 0.71% 3.44%50 516 10.333 10.269 0.064 0.62% 2.98%50 517 10.257 10.266 -0.009 -0.08% 0.40%50 521 10.358 10.264 0.094 0.91% 4.36%50 525 10.432 10.265 0.167 1.60% 7.76%0 29 10.329 10.259 0.069 0.67% 3.23%

Max 10.432 10.295 0.172 1.65% 8.00%Average 10.342 10.267 0.075 0.72% 3.52%

Min 10.257 10.257 -0.009 -0.08% 0.09%Std Dev 0.047 0.011 0.049 0.47% 2.22%

0.000

2.000

4.000

6.000

8.000

10.000

12.000

14.000

0 30 40 50

V

Krad(Si)

PDB Hi 50mA Source

Pass Range

Fail Range

Min

Average

Max

Page 47



PUA Low 50mA SinkTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 1.25 1.25Min Limit 0 0

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 0.836 0.773 0.063 7.51% 5.03%30 34 0.790 0.784 0.006 0.75% 0.48%30 38 0.793 0.780 0.013 1.63% 1.03%30 312 0.808 0.784 0.024 3.01% 1.94%30 313 0.794 0.781 0.013 1.68% 1.07%30 315 0.804 0.780 0.023 2.92% 1.88%30 316 0.796 0.776 0.020 2.51% 1.60%30 317 0.765 0.781 -0.015 -2.00% 1.22%30 321 0.817 0.782 0.035 4.33% 2.83%30 325 0.860 0.780 0.080 9.27% 6.38%40 43 0.836 0.777 0.059 7.01% 4.69% PUA Low 50mA Sink40 44 0.790 0.788 0.002 0.23% 0.14% Test Site SBDL40 48 0.793 0.784 0.009 1.09% 0.69% Tester ETS36440 412 0.808 0.788 0.020 2.50% 1.62% Test Number EF357940 413 0.794 0.784 0.010 1.31% 0.83% Max Limit 1.25 V40 415 0.804 0.783 0.021 2.62% 1.68% Min Limit 0 V40 416 0.796 0.779 0.017 2.08% 1.32% Krad(Si) 0 30 40 5040 417 0.765 0.784 -0.018 -2.40% 1.47% LL 0.000 0.000 0.000 0.00040 421 0.817 0.785 0.032 3.93% 2.57% Min 0.764 0.773 0.777 0.78440 425 0.860 0.784 0.076 8.89% 6.12% Average 0.764 0.780 0.784 0.79250 53 0.836 0.792 0.044 5.24% 3.51% Max 0.764 0.784 0.788 0.80350 54 0.790 0.803 -0.013 -1.62% 1.02% UL 1.250 1.250 1.250 1.25050 58 0.793 0.797 -0.004 -0.53% 0.34%

R² = 0.0395

-0.040

-0.020

0.000

0.020

0.040

0.060

0.080

0.100

0 25 50 75

De

lta (

V)

Krad(Si)

PUA Low 50mA Sink

50 512 0.808 0.800 0.008 0.98% 0.64%50 513 0.794 0.795 -0.001 -0.09% 0.06%50 515 0.804 0.786 0.017 2.16% 1.39%50 516 0.796 0.784 0.011 1.43% 0.91%50 517 0.765 0.788 -0.023 -2.99% 1.83%50 521 0.817 0.789 0.028 3.38% 2.21%50 525 0.860 0.787 0.073 8.46% 5.82%0 29 0.798 0.764 0.035 4.33% 2.77%

Max 0.860 0.803 0.080 9.27% 6.38%Average 0.806 0.785 0.021 2.57% 2.10%

Min 0.765 0.764 -0.023 -2.99% 0.06%Std Dev 0.025 0.008 0.027 3.21% 1.77%

0.000

0.200

0.400

0.600

0.800

1.000

1.200

1.400

0 30 40 50

V

Krad(Si)

PUA Low 50mA Sink

Pass Range

Fail Range

Min

Average

Max

Page 48



PDC Rise timeTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit ns nsMax Limit 400 400Min Limit 10 10

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 57.042 53.192 3.850 6.75% 0.99%30 34 50.321 53.530 -3.209 -6.38% 0.82%30 38 51.162 53.573 -2.411 -4.71% 0.62%30 312 53.687 53.083 0.604 1.13% 0.15%30 313 51.918 53.504 -1.585 -3.05% 0.41%30 315 52.724 52.641 0.082 0.16% 0.02%30 316 51.987 52.490 -0.503 -0.97% 0.13%30 317 47.286 52.703 -5.416 -11.45% 1.39%30 321 53.927 51.901 2.026 3.76% 0.52%30 325 59.707 51.494 8.213 13.76% 2.11%40 43 57.042 49.666 7.376 12.93% 1.89% PDC Rise time40 44 50.321 49.750 0.571 1.13% 0.15% Test Site SBDL40 48 51.162 50.677 0.485 0.95% 0.12% Tester ETS36440 412 53.687 49.378 4.309 8.03% 1.10% Test Number EF357940 413 51.918 51.816 0.102 0.20% 0.03% Max Limit 400 ns40 415 52.724 50.068 2.655 5.04% 0.68% Min Limit 10 ns40 416 51.987 50.737 1.251 2.41% 0.32% Krad(Si) 0 30 40 5040 417 47.286 52.439 -5.153 -10.90% 1.32% LL 10.000 10.000 10.000 10.00040 421 53.927 60.848 -6.922 -12.84% 1.77% Min 48.994 51.494 49.378 51.44140 425 59.707 58.797 0.910 1.52% 0.23% Average 48.994 52.811 52.418 64.32850 53 57.042 51.441 5.601 9.82% 1.44% Max 48.994 53.573 60.848 81.35450 54 50.321 55.025 -4.704 -9.35% 1.21% UL 400.000 400.000 400.000 400.00050 58 51.162 57.759 -6.597 -12.89% 1.69%

R² = 0.2602

-30.000

-25.000

-20.000

-15.000

-10.000

-5.000

0.000

5.000

10.000

15.000

0 25 50 75

De

lta (

ns)

Krad(Si)

PDC Rise time

50 512 53.687 53.333 0.354 0.66% 0.09%50 513 51.918 61.666 -9.748 -18.77% 2.50%50 515 52.724 67.536 -14.813 -28.09% 3.80%50 516 51.987 68.811 -16.824 -32.36% 4.31%50 517 47.286 69.251 -21.965 -46.45% 5.63%50 521 53.927 81.354 -27.428 -50.86% 7.03%50 525 59.707 77.104 -17.397 -29.14% 4.46%0 29 52.478 48.994 3.484 6.64% 0.89%

Max 59.707 81.354 8.213 13.76% 7.03%Average 52.960 56.276 -3.316 -6.56% 1.54%

Min 47.286 48.994 -27.428 -50.86% 0.02%Std Dev 3.289 8.274 8.555 16.17% 1.76%

0.000

50.000

100.000

150.000

200.000

250.000

300.000

350.000

400.000

450.000

0 30 40 50

ns

Krad(Si)

PDC Rise time

Pass Range

Fail Range

Min

Average

Max

Page 49



PDC Hi 1mA SourceTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 12 12Min Limit 9.95 9.95

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 10.583 10.417 0.166 1.57% 8.10%30 34 10.473 10.426 0.048 0.45% 2.32%30 38 10.481 10.424 0.057 0.54% 2.79%30 312 10.522 10.421 0.101 0.96% 4.95%30 313 10.486 10.423 0.064 0.61% 3.10%30 315 10.509 10.423 0.086 0.82% 4.22%30 316 10.500 10.420 0.080 0.76% 3.90%30 317 10.414 10.419 -0.005 -0.05% 0.23%30 321 10.529 10.417 0.112 1.07% 5.49%30 325 10.615 10.421 0.194 1.83% 9.48%40 43 10.583 10.421 0.162 1.54% 7.93% PDC Hi 1mA Source40 44 10.473 10.430 0.043 0.41% 2.11% Test Site SBDL40 48 10.481 10.429 0.052 0.50% 2.54% Tester ETS36440 412 10.522 10.425 0.097 0.92% 4.74% Test Number EF357940 413 10.486 10.425 0.061 0.58% 2.98% Max Limit 12 V40 415 10.509 10.422 0.087 0.83% 4.26% Min Limit 9.95 V40 416 10.500 10.420 0.079 0.76% 3.88% Krad(Si) 0 30 40 5040 417 10.414 10.420 -0.006 -0.06% 0.29% LL 9.950 9.950 9.950 9.95040 421 10.529 10.418 0.111 1.06% 5.43% Min 10.416 10.417 10.418 10.42640 425 10.615 10.421 0.194 1.82% 9.45% Average 10.416 10.421 10.423 10.44150 53 10.583 10.453 0.130 1.23% 6.35% Max 10.416 10.426 10.430 10.46050 54 10.473 10.460 0.013 0.12% 0.63% UL 12.000 12.000 12.000 12.00050 58 10.481 10.457 0.024 0.23% 1.17%

R² = 0.0102

-0.050

0.000

0.050

0.100

0.150

0.200

0.250

0 25 50 75

De

lta (

V)

Krad(Si)

PDC Hi 1mA Source

50 512 10.522 10.450 0.072 0.68% 3.51%50 513 10.486 10.448 0.038 0.36% 1.86%50 515 10.509 10.428 0.082 0.78% 3.99%50 516 10.500 10.430 0.070 0.66% 3.40%50 517 10.414 10.427 -0.013 -0.13% 0.64%50 521 10.529 10.426 0.104 0.98% 5.05%50 525 10.615 10.427 0.188 1.77% 9.17%0 29 10.496 10.416 0.080 0.76% 3.90%

Max 10.615 10.460 0.194 1.83% 9.48%Average 10.511 10.428 0.083 0.79% 4.12%

Min 10.414 10.416 -0.013 -0.13% 0.23%Std Dev 0.054 0.012 0.056 0.53% 2.62%

0.000

2.000

4.000

6.000

8.000

10.000

12.000

14.000

0 30 40 50

V

Krad(Si)

PDC Hi 1mA Source

Pass Range

Fail Range

Min

Average

Max

Page 50



PUB Low 1 mA SinkTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 0.25 0.25Min Limit 0 0

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 0.026 0.029 -0.003 -11.00% 1.14%30 34 0.025 0.029 -0.004 -17.66% 1.74%30 38 0.025 0.029 -0.004 -16.72% 1.66%30 312 0.025 0.029 -0.004 -15.98% 1.60%30 313 0.025 0.029 -0.004 -16.45% 1.63%30 315 0.025 0.029 -0.004 -14.23% 1.43%30 316 0.025 0.029 -0.004 -15.34% 1.53%30 317 0.024 0.029 -0.005 -19.80% 1.90%30 321 0.025 0.029 -0.003 -12.90% 1.31%30 325 0.026 0.029 -0.002 -9.40% 0.99%40 43 0.026 0.030 -0.004 -17.02% 1.76% PUB Low 1 mA Sink40 44 0.025 0.031 -0.006 -23.83% 2.35% Test Site SBDL40 48 0.025 0.030 -0.006 -22.37% 2.22% Tester ETS36440 412 0.025 0.031 -0.006 -22.08% 2.21% Test Number EF357940 413 0.025 0.030 -0.006 -22.83% 2.26% Max Limit 0.25 V40 415 0.025 0.030 -0.005 -20.05% 2.01% Min Limit 0 V40 416 0.025 0.030 -0.005 -20.88% 2.08% Krad(Si) 0 30 40 5040 417 0.024 0.030 -0.006 -25.81% 2.47% LL 0.000 0.000 0.000 0.00040 421 0.025 0.030 -0.005 -18.94% 1.92% Min 0.024 0.029 0.030 0.03140 425 0.026 0.030 -0.004 -14.90% 1.57% Average 0.024 0.029 0.030 0.03150 53 0.026 0.031 -0.005 -20.26% 2.10% Max 0.024 0.029 0.031 0.03150 54 0.025 0.031 -0.007 -26.88% 2.65% UL 0.250 0.250 0.250 0.25050 58 0.025 0.031 -0.006 -25.85% 2.56%

R² = 0.7669

-0.008

-0.007

-0.006

-0.005

-0.004

-0.003

-0.002

-0.001

0.000

0.001

0.002

0 25 50 75

De

lta (

V)

Krad(Si)

PUB Low 1 mA Sink

50 512 0.025 0.031 -0.006 -24.96% 2.50%50 513 0.025 0.031 -0.006 -25.38% 2.51%50 515 0.025 0.031 -0.006 -21.92% 2.20%50 516 0.025 0.031 -0.006 -23.00% 2.29%50 517 0.024 0.031 -0.007 -27.86% 2.67%50 521 0.025 0.031 -0.005 -20.83% 2.11%50 525 0.026 0.031 -0.004 -16.50% 1.74%0 29 0.025 0.024 0.001 3.70% 0.37%

Max 0.026 0.031 0.001 3.70% 2.67%Average 0.025 0.030 -0.005 -18.96% 1.92%

Min 0.024 0.024 -0.007 -27.86% 0.37%Std Dev 0.001 0.001 0.002 6.32% 0.53%

0.000

0.050

0.100

0.150

0.200

0.250

0.300

0 30 40 50

V

Krad(Si)

PUB Low 1 mA Sink

Pass Range

Fail Range

Min

Average

Max

Page 51



PDC Hi 50mA SourceTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 12 12Min Limit 9.85 9.85

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 10.406 10.259 0.147 1.42% 6.85%30 34 10.311 10.267 0.044 0.43% 2.07%30 38 10.317 10.265 0.052 0.50% 2.41%30 312 10.353 10.262 0.091 0.88% 4.23%30 313 10.322 10.263 0.058 0.56% 2.71%30 315 10.342 10.264 0.078 0.75% 3.61%30 316 10.334 10.261 0.073 0.71% 3.39%30 317 10.258 10.260 -0.002 -0.02% 0.10%30 321 10.359 10.258 0.101 0.97% 4.68%30 325 10.433 10.262 0.171 1.64% 7.97%40 43 10.406 10.262 0.144 1.39% 6.72% PDC Hi 50mA Source40 44 10.311 10.270 0.041 0.40% 1.90% Test Site SBDL40 48 10.317 10.269 0.048 0.46% 2.23% Tester ETS36440 412 10.353 10.266 0.088 0.85% 4.08% Test Number EF357940 413 10.322 10.265 0.057 0.55% 2.64% Max Limit 12 V40 415 10.342 10.263 0.079 0.76% 3.67% Min Limit 9.85 V40 416 10.334 10.262 0.072 0.70% 3.37% Krad(Si) 0 30 40 5040 417 10.258 10.261 -0.003 -0.03% 0.13% LL 9.850 9.850 9.850 9.85040 421 10.359 10.259 0.100 0.96% 4.64% Min 10.260 10.258 10.259 10.26540 425 10.433 10.262 0.172 1.65% 7.98% Average 10.260 10.262 10.264 10.27950 53 10.406 10.290 0.117 1.12% 5.42% Max 10.260 10.267 10.270 10.29750 54 10.311 10.297 0.015 0.14% 0.68% UL 12.000 12.000 12.000 12.00050 58 10.317 10.294 0.024 0.23% 1.09%

R² = 0.0082

-0.0200.0000.0200.0400.0600.0800.1000.1200.1400.1600.1800.200

0 25 50 75

De

lta (

V)

Krad(Si)

PDC Hi 50mA Source

50 512 10.353 10.288 0.066 0.63% 3.05%50 513 10.322 10.285 0.036 0.35% 1.68%50 515 10.342 10.267 0.074 0.72% 3.46%50 516 10.334 10.269 0.065 0.62% 3.00%50 517 10.258 10.267 -0.009 -0.09% 0.42%50 521 10.359 10.265 0.094 0.91% 4.36%50 525 10.433 10.266 0.167 1.60% 7.77%0 29 10.330 10.260 0.070 0.68% 3.24%

Max 10.433 10.297 0.172 1.65% 7.98%Average 10.343 10.268 0.075 0.72% 3.53%

Min 10.258 10.258 -0.009 -0.09% 0.10%Std Dev 0.047 0.011 0.049 0.47% 2.21%

0.000

2.000

4.000

6.000

8.000

10.000

12.000

14.000

0 30 40 50

V

Krad(Si)

PDC Hi 50mA Source

Pass Range

Fail Range

Min

Average

Max

Page 52



PUB Low 50 mA SinkTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 1.25 1.25Min Limit 0 0

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 0.833 0.769 0.063 7.58% 5.05%30 34 0.785 0.779 0.006 0.78% 0.49%30 38 0.788 0.776 0.012 1.49% 0.94%30 312 0.805 0.778 0.027 3.31% 2.13%30 313 0.790 0.777 0.013 1.67% 1.05%30 315 0.801 0.776 0.024 3.02% 1.94%30 316 0.791 0.771 0.020 2.54% 1.61%30 317 0.761 0.776 -0.015 -1.92% 1.17%30 321 0.812 0.777 0.036 4.40% 2.86%30 325 0.856 0.776 0.080 9.34% 6.40%40 43 0.833 0.774 0.059 7.07% 4.71% PUB Low 50 mA Sink40 44 0.785 0.784 0.001 0.18% 0.11% Test Site SBDL40 48 0.788 0.781 0.007 0.88% 0.56% Tester ETS36440 412 0.805 0.783 0.022 2.70% 1.74% Test Number EF357940 413 0.790 0.780 0.010 1.22% 0.77% Max Limit 1.25 V40 415 0.801 0.780 0.021 2.63% 1.69% Min Limit 0 V40 416 0.791 0.775 0.017 2.11% 1.33% Krad(Si) 0 30 40 5040 417 0.761 0.779 -0.018 -2.41% 1.47% LL 0.000 0.000 0.000 0.00040 421 0.812 0.780 0.032 3.94% 2.56% Min 0.760 0.769 0.774 0.78040 425 0.856 0.779 0.076 8.92% 6.11% Average 0.760 0.776 0.780 0.78850 53 0.833 0.789 0.044 5.27% 3.51% Max 0.760 0.779 0.784 0.79850 54 0.785 0.798 -0.013 -1.63% 1.02% UL 1.250 1.250 1.250 1.25050 58 0.788 0.794 -0.006 -0.74% 0.47%

R² = 0.04

-0.040

-0.020

0.000

0.020

0.040

0.060

0.080

0.100

0 25 50 75

De

lta (

V)

Krad(Si)

PUB Low 50 mA Sink

50 512 0.805 0.795 0.010 1.23% 0.79%50 513 0.790 0.791 -0.001 -0.17% 0.11%50 515 0.801 0.783 0.018 2.20% 1.41%50 516 0.791 0.780 0.012 1.46% 0.92%50 517 0.761 0.784 -0.023 -2.99% 1.82%50 521 0.812 0.785 0.028 3.41% 2.21%50 525 0.856 0.783 0.073 8.53% 5.84%0 29 0.794 0.760 0.034 4.33% 2.75%

Max 0.856 0.798 0.080 9.34% 6.40%Average 0.802 0.780 0.022 2.59% 2.11%

Min 0.761 0.760 -0.023 -2.99% 0.11%Std Dev 0.025 0.008 0.027 3.24% 1.77%

0.000

0.200

0.400

0.600

0.800

1.000

1.200

1.400

0 30 40 50

V

Krad(Si)

PUB Low 50 mA Sink

Pass Range

Fail Range

Min

Average

Max

Page 53



PDC Fall TimeTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit ns nsMax Limit 400 400Min Limit 10 10

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 66.779 65.327 1.452 2.17% 0.37%30 34 65.570 65.542 0.028 0.04% 0.01%30 38 65.848 65.916 -0.068 -0.10% 0.02%30 312 66.774 65.333 1.441 2.16% 0.37%30 313 66.401 65.766 0.635 0.96% 0.16%30 315 66.435 65.336 1.099 1.65% 0.28%30 316 66.104 65.068 1.036 1.57% 0.27%30 317 64.935 65.456 -0.521 -0.80% 0.13%30 321 65.732 64.881 0.851 1.29% 0.22%30 325 66.872 65.281 1.592 2.38% 0.41%40 43 66.779 287.758 -220.978 -330.91% 56.66% PDC Fall Time40 44 65.570 260.624 -195.054 -297.47% 50.01% Test Site SBDL40 48 65.848 259.158 -193.310 -293.57% 49.57% Tester ETS36440 412 66.774 261.454 -194.681 -291.55% 49.92% Test Number EF357940 413 66.401 254.562 -188.161 -283.37% 48.25% Max Limit 400 ns40 415 66.435 282.851 -216.417 -325.76% 55.49% Min Limit 10 ns40 416 66.104 284.951 -218.847 -331.07% 56.11% Krad(Si) 0 30 40 5040 417 64.935 283.981 -219.046 -337.33% 56.17% LL 10.000 10.000 10.000 10.00040 421 65.732 287.537 -221.806 -337.44% 56.87% Min 282.935 64.881 254.562 258.88740 425 66.872 286.831 -219.958 -328.92% 56.40% Average 282.935 65.390 274.971 275.40250 53 66.779 258.887 -192.108 -287.67% 49.26% Max 282.935 65.916 287.758 290.16050 54 65.570 263.114 -197.544 -301.27% 50.65% UL 400.000 400.000 400.000 400.00050 58 65.848 261.236 -195.388 -296.73% 50.10%

R² = 0.3004

-250.000

-200.000

-150.000

-100.000

-50.000

0.000

50.000

100.000

0 25 50 75

De

lta (

ns)

Krad(Si)

PDC Fall Time

PDC F ll Ti50 512 66.774 259.379 -192.605 -288.45% 49.39%50 513 66.401 265.020 -198.618 -299.12% 50.93%50 515 66.435 289.385 -222.950 -335.59% 57.17%50 516 66.104 289.926 -223.822 -338.59% 57.39%50 517 64.935 290.160 -225.225 -346.84% 57.75%50 521 65.732 288.580 -222.848 -339.03% 57.14%50 525 66.872 288.331 -221.459 -331.17% 56.78%0 29 65.667 282.935 -217.268 -330.86% 55.71%

Max 66.872 290.160 1.592 2.38% 57.75%Average 66.130 207.760 -141.631 -214.24% 36.45%

Min 64.935 64.881 -225.225 -346.84% 0.01%Std Dev 0.600 100.496 100.517 152.11% 25.58%

0.000

50.000

100.000

150.000

200.000

250.000

300.000

350.000

400.000

450.000

0 30 40 50

ns

Krad(Si)

PDC Fall Time

Pass Range

Fail Range

Min

Average

Max

Page 54



PDB Fall TimeTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit ns nsMax Limit 400 400Min Limit 10 10

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 68.493 59.075 9.418 13.75% 2.41%30 34 67.248 58.761 8.487 12.62% 2.18%30 38 67.374 59.031 8.343 12.38% 2.14%30 312 68.198 59.054 9.144 13.41% 2.34%30 313 67.380 58.844 8.536 12.67% 2.19%30 315 67.888 58.963 8.925 13.15% 2.29%30 316 67.738 59.788 7.950 11.74% 2.04%30 317 66.718 59.528 7.190 10.78% 1.84%30 321 67.469 58.874 8.595 12.74% 2.20%30 325 68.129 59.444 8.685 12.75% 2.23%40 43 68.493 275.675 -207.182 -302.49% 53.12% PDB Fall Time40 44 67.248 277.361 -210.113 -312.45% 53.88% Test Site SBDL40 48 67.374 276.235 -208.861 -310.00% 53.55% Tester ETS36440 412 68.198 277.153 -208.955 -306.40% 53.58% Test Number EF357940 413 67.380 277.510 -210.130 -311.86% 53.88% Max Limit 400 ns40 415 67.888 277.650 -209.763 -308.98% 53.79% Min Limit 10 ns40 416 67.738 277.718 -209.980 -309.99% 53.84% Krad(Si) 0 30 40 5040 417 66.718 276.721 -210.003 -314.76% 53.85% LL 10.000 10.000 10.000 10.00040 421 67.469 277.678 -210.209 -311.57% 53.90% Min 283.862 58.761 275.675 280.09640 425 68.129 277.659 -209.530 -307.55% 53.73% Average 283.862 59.136 277.136 281.75850 53 68.493 281.811 -213.318 -311.45% 54.70% Max 283.862 59.788 277.718 283.67850 54 67.248 280.889 -213.641 -317.69% 54.78% UL 400.000 400.000 400.000 400.00050 58 67.374 280.096 -212.722 -315.73% 54.54%

R² = 0.3159

-250.000

-200.000

-150.000

-100.000

-50.000

0.000

50.000

100.000

0 25 50 75

De

lta (

ns)

Krad(Si)

PDB Fall Time

PDB F ll Ti50 512 68.198 280.688 -212.490 -311.58% 54.48%50 513 67.380 280.789 -213.409 -316.73% 54.72%50 515 67.888 282.075 -214.187 -315.50% 54.92%50 516 67.738 281.652 -213.914 -315.80% 54.85%50 517 66.718 283.401 -216.683 -324.77% 55.56%50 521 67.469 282.498 -215.030 -318.71% 55.14%50 525 68.129 283.678 -215.549 -316.38% 55.27%0 29 67.053 283.862 -216.810 -323.34% 55.59%

Max 68.493 283.862 9.418 13.75% 55.59%Average 67.644 208.521 -140.878 -208.31% 37.53%

Min 66.718 58.761 -216.810 -324.77% 1.84%Std Dev 0.513 104.812 104.829 155.03% 24.80%

0.000

50.000

100.000

150.000

200.000

250.000

300.000

350.000

400.000

450.000

0 30 40 50

ns

Krad(Si)

PDB Fall Time

Pass Range

Fail Range

Min

Average

Max

Page 55



Tach ON TimeTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit uS uSMax Limit 260 260Min Limit 200 200

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 230.000 230.000 0.000 0.00% 0.00%30 34 230.000 230.000 0.000 0.00% 0.00%30 38 230.000 230.000 0.000 0.00% 0.00%30 312 230.000 230.000 0.000 0.00% 0.00%30 313 230.000 230.000 0.000 0.00% 0.00%30 315 230.000 230.000 0.000 0.00% 0.00%30 316 230.000 230.000 0.000 0.00% 0.00%30 317 230.000 230.000 0.000 0.00% 0.00%30 321 230.000 230.000 0.000 0.00% 0.00%30 325 230.000 230.000 0.000 0.00% 0.00%40 43 230.000 230.000 0.000 0.00% 0.00% Tach ON Time40 44 230.000 230.000 0.000 0.00% 0.00% Test Site SBDL40 48 230.000 230.000 0.000 0.00% 0.00% Tester ETS36440 412 230.000 230.000 0.000 0.00% 0.00% Test Number EF357940 413 230.000 230.000 0.000 0.00% 0.00% Max Limit 260 uS40 415 230.000 230.000 0.000 0.00% 0.00% Min Limit 200 uS40 416 230.000 230.000 0.000 0.00% 0.00% Krad(Si) 0 30 40 5040 417 230.000 230.000 0.000 0.00% 0.00% LL 200.000 200.000 200.000 200.00040 421 230.000 230.000 0.000 0.00% 0.00% Min 230.000 230.000 230.000 220.00040 425 230.000 230.000 0.000 0.00% 0.00% Average 230.000 230.000 230.000 137.00050 53 230.000 230.000 0.000 0.00% 0.00% Max 230.000 230.000 230.000 230.00050 54 230.000 230.000 0.000 0.00% 0.00% UL 260.000 260.000 260.000 260.00050 58 230.000 230.000 0.000 0.00% 0.00%

R² = 0.169

-150.000

-100.000

-50.000

0.000

50.000

100.000

150.000

200.000

250.000

0 25 50 75

De

lta (

uS

)

Krad(Si)

Tach ON Time

Tach ON Time50 512 230.000 230.000 0.000 0.00% 0.00%50 513 230.000 230.000 0.000 0.00% 0.00%50 515 230.000 220.000 10.000 4.35% 16.67%50 516 230.000 0.000 230.000 100.00% 383.33%50 517 230.000 0.000 230.000 100.00% 383.33%50 521 230.000 0.000 230.000 100.00% 383.33%50 525 230.000 0.000 230.000 100.00% 383.33%0 29 230.000 230.000 0.000 0.00% 0.00%

Max 230.000 230.000 230.000 100.00% 383.33%Average 230.000 200.000 30.000 13.04% 50.00%

Min 230.000 0.000 0.000 0.00% 0.00%Std Dev 0.000 78.273 78.273 34.03% 130.46%

0.000

50.000

100.000

150.000

200.000

250.000

300.000

0 30 40 50

uS

Krad(Si)

Tach ON Time

Pass Range

Fail Range

Min

Average

Max

Page 56



RC_Brake Input Bias Current @ 0VTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit mA mAMax Limit 0 0Min Limit -2.5 -2.5

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 -1.552 -1.664 0.111 -7.17% 4.45%30 34 -1.644 -1.635 -0.008 0.51% 0.34%30 38 -1.639 -1.601 -0.037 2.28% 1.50%30 312 -1.567 -1.661 0.094 -6.00% 3.76%30 313 -1.581 -1.584 0.002 -0.14% 0.09%30 315 -1.612 -1.654 0.042 -2.62% 1.69%30 316 -1.615 -1.650 0.035 -2.15% 1.39%30 317 -1.697 -1.644 -0.054 3.15% 2.14%30 321 -1.553 -1.620 0.066 -4.28% 2.66%30 325 -1.488 -1.628 0.141 -9.45% 5.62%40 43 -1.552 -1.640 0.087 -5.63% 3.49% RC_Brake Input Bias Current @ 0V40 44 -1.644 -1.610 -0.034 2.05% 1.35% Test Site SBDL40 48 -1.639 -1.574 -0.064 3.91% 2.56% Tester ETS36440 412 -1.567 -1.635 0.068 -4.37% 2.74% Test Number EF357940 413 -1.581 -1.560 -0.022 1.37% 0.87% Max Limit 0 mA40 415 -1.612 -0.980 -0.632 39.21% 25.28% Min Limit -2.5 mA40 416 -1.615 -0.680 -0.935 57.89% 37.40% Krad(Si) 0 30 40 5040 417 -1.697 -0.704 -0.993 58.53% 39.74% LL -2.500 -2.500 -2.500 -2.50040 421 -1.553 -0.706 -0.847 54.53% 33.89% Min -1.672 -1.664 -1.640 -1.60140 425 -1.488 -0.753 -0.735 49.41% 29.40% Average -1.672 -1.634 -1.184 -0.80550 53 -1.552 -1.599 0.047 -3.03% 1.88% Max -1.672 -1.584 -0.680 -0.04350 54 -1.644 -1.570 -0.073 4.46% 2.93% UL 0.000 0.000 0.000 0.00050 58 -1.639 -1.538 -0.101 6.14% 4.03%

R² = 0.2531

-2.000

-1.500

-1.000

-0.500

0.000

0.500

1.000

0 25 50 75

De

lta (

mA

)

Krad(Si)

RC_Brake Input Bias Current @ 0V

RC Brake Input Bias Current @ 0V50 512 -1.567 -1.601 0.034 -2.18% 1.37%50 513 -1.581 -1.528 -0.054 3.40% 2.15%50 515 -1.612 -0.044 -1.568 97.29% 62.74%50 516 -1.615 -0.044 -1.571 97.28% 62.85%50 517 -1.697 -0.043 -1.654 97.44% 66.16%50 521 -1.553 -0.043 -1.511 97.24% 60.42%50 525 -1.488 -0.043 -1.444 97.08% 57.77%0 29 -1.590 -1.672 0.082 -5.15% 3.28%

Max -1.488 -0.043 0.141 97.44% 66.16%Average -1.595 -1.223 -0.372 23.26% 16.97%

Min -1.697 -1.672 -1.654 -9.45% 0.09%Std Dev 0.056 0.614 0.615 38.59% 23.18%

-3.000

-2.500

-2.000

-1.500

-1.000

-0.500

0.000

0 30 40 50

mA

Krad(Si)

RC_Brake Input Bias Current @ 0V

Pass Range

Fail Range

Min

Average

Max

Page 57



Brake Low ThresholdTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 1.15 1.15Min Limit 0.9 0.9

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 0.990 0.960 0.030 3.03% 12.00%30 34 0.975 0.945 0.030 3.08% 12.00%30 38 0.980 0.945 0.035 3.57% 14.00%30 312 0.975 0.960 0.015 1.54% 6.00%30 313 0.980 0.950 0.030 3.06% 12.00%30 315 0.980 0.950 0.030 3.06% 12.00%30 316 0.980 0.945 0.035 3.57% 14.00%30 317 0.980 0.950 0.030 3.06% 12.00%30 321 0.980 0.950 0.030 3.06% 12.00%30 325 0.975 0.945 0.030 3.08% 12.00%40 43 0.990 0.950 0.040 4.04% 16.00% Brake Low Threshold40 44 0.975 0.935 0.040 4.10% 16.00% Test Site SBDL40 48 0.980 0.935 0.045 4.59% 18.00% Tester ETS36440 412 0.975 0.950 0.025 2.56% 10.00% Test Number EF357940 413 0.980 0.940 0.040 4.08% 16.00% Max Limit 1.15 V40 415 0.980 0.940 0.040 4.08% 16.00% Min Limit 0.9 V40 416 0.980 0.935 0.045 4.59% 18.00% Krad(Si) 0 30 40 5040 417 0.980 0.940 0.040 4.08% 16.00% LL 0.900 0.900 0.900 0.90040 421 0.980 0.935 0.045 4.59% 18.00% Min 0.975 0.945 0.935 0.93040 425 0.975 0.935 0.040 4.10% 16.00% Average 0.975 0.950 0.940 0.93650 53 0.990 0.945 0.045 4.55% 18.00% Max 0.975 0.960 0.950 0.94550 54 0.975 0.930 0.045 4.62% 18.00% UL 1.150 1.150 1.150 1.15050 58 0.980 0.930 0.050 5.10% 20.00%

R² = 0.7062

0.000

0.010

0.020

0.030

0.040

0.050

0.060

0 25 50 75

De

lta (

V)

Krad(Si)

Brake Low Threshold

Brake Low Threshold50 512 0.975 0.945 0.030 3.08% 12.00%50 513 0.980 0.935 0.045 4.59% 18.00%50 515 0.980 0.935 0.045 4.59% 18.00%50 516 0.980 0.935 0.045 4.59% 18.00%50 517 0.980 0.935 0.045 4.59% 18.00%50 521 0.980 0.935 0.045 4.59% 18.00%50 525 0.975 0.935 0.040 4.10% 16.00%0 29 0.975 0.975 0.000 0.00% 0.00%

Max 0.990 0.975 0.050 5.10% 20.00%Average 0.979 0.943 0.036 3.72% 14.58%

Min 0.975 0.930 0.000 0.00% 0.00%Std Dev 0.004 0.010 0.010 1.06% 4.17%

0.000

0.200

0.400

0.600

0.800

1.000

1.200

1.400

0 30 40 50

V

Krad(Si)

Brake Low Threshold

Pass Range

Fail Range

Min

Average

Max

Page 58



Brake High ThresholdTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 1.15 1.15Min Limit 0.9 0.9

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 1.095 1.050 0.045 4.11% 18.00%30 34 1.080 1.035 0.045 4.17% 18.00%30 38 1.085 1.035 0.050 4.61% 20.00%30 312 1.080 1.050 0.030 2.78% 12.00%30 313 1.085 1.035 0.050 4.61% 20.00%30 315 1.085 1.035 0.050 4.61% 20.00%30 316 1.085 1.030 0.055 5.07% 22.00%30 317 1.090 1.035 0.055 5.05% 22.00%30 321 1.085 1.035 0.050 4.61% 20.00%30 325 1.085 1.035 0.050 4.61% 20.00%40 43 1.095 1.035 0.060 5.48% 24.00% Brake High Threshold40 44 1.080 1.015 0.065 6.02% 26.00% Test Site SBDL40 48 1.085 1.015 0.070 6.45% 28.00% Tester ETS36440 412 1.080 1.030 0.050 4.63% 20.00% Test Number EF357940 413 1.085 1.020 0.065 5.99% 26.00% Max Limit 1.15 V40 415 1.085 1.015 0.070 6.45% 28.00% Min Limit 0.9 V40 416 1.085 1.010 0.075 6.91% 30.00% Krad(Si) 0 30 40 5040 417 1.090 1.015 0.075 6.88% 30.00% LL 0.900 0.900 0.900 0.90040 421 1.085 1.015 0.070 6.45% 28.00% Min 1.085 1.030 1.010 1.00040 425 1.085 1.010 0.075 6.91% 30.00% Average 1.085 1.038 1.018 1.01050 53 1.095 1.025 0.070 6.39% 28.00% Max 1.085 1.050 1.035 1.02550 54 1.080 1.010 0.070 6.48% 28.00% UL 1.150 1.150 1.150 1.15050 58 1.085 1.010 0.075 6.91% 30.00%

R² = 0.7995

-0.010

0.000

0.010

0.020

0.030

0.040

0.050

0.060

0.070

0.080

0.090

0 25 50 75

De

lta (

V)

Krad(Si)

Brake High Threshold

Brake High Threshold50 512 1.080 1.025 0.055 5.09% 22.00%50 513 1.085 1.010 0.075 6.91% 30.00%50 515 1.085 1.005 0.080 7.37% 32.00%50 516 1.085 1.005 0.080 7.37% 32.00%50 517 1.090 1.005 0.085 7.80% 34.00%50 521 1.085 1.005 0.080 7.37% 32.00%50 525 1.085 1.000 0.085 7.83% 34.00%0 29 1.080 1.085 -0.005 -0.46% 2.00%

Max 1.095 1.085 0.085 7.83% 34.00%Average 1.085 1.024 0.061 5.66% 24.71%

Min 1.080 1.000 -0.005 -0.46% 2.00%Std Dev 0.004 0.018 0.019 1.71% 6.96%

0.000

0.200

0.400

0.600

0.800

1.000

1.200

1.400

0 30 40 50

V

Krad(Si)

Brake High Threshold

Pass Range

Fail Range

Min

Average

Max

Page 59



Brake HysteresisTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 0.35 0.35Min Limit 0.04 0.04

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 0.105 0.090 0.015 14.29% 4.84%30 34 0.105 0.090 0.015 14.29% 4.84%30 38 0.105 0.090 0.015 14.29% 4.84%30 312 0.105 0.090 0.015 14.29% 4.84%30 313 0.105 0.085 0.020 19.05% 6.45%30 315 0.105 0.085 0.020 19.05% 6.45%30 316 0.105 0.085 0.020 19.05% 6.45%30 317 0.110 0.085 0.025 22.73% 8.06%30 321 0.105 0.085 0.020 19.05% 6.45%30 325 0.110 0.090 0.020 18.18% 6.45%40 43 0.105 0.085 0.020 19.05% 6.45% Brake Hysteresis40 44 0.105 0.080 0.025 23.81% 8.06% Test Site SBDL40 48 0.105 0.080 0.025 23.81% 8.06% Tester ETS36440 412 0.105 0.080 0.025 23.81% 8.06% Test Number EF357940 413 0.105 0.080 0.025 23.81% 8.06% Max Limit 0.35 V40 415 0.105 0.075 0.030 28.57% 9.68% Min Limit 0.04 V40 416 0.105 0.075 0.030 28.57% 9.68% Krad(Si) 0 30 40 5040 417 0.110 0.075 0.035 31.82% 11.29% LL 0.040 0.040 0.040 0.04040 421 0.105 0.080 0.025 23.81% 8.06% Min 0.110 0.085 0.075 0.06540 425 0.110 0.075 0.035 31.82% 11.29% Average 0.110 0.088 0.079 0.07450 53 0.105 0.080 0.025 23.81% 8.06% Max 0.110 0.090 0.085 0.08050 54 0.105 0.080 0.025 23.81% 8.06% UL 0.350 0.350 0.350 0.35050 58 0.105 0.080 0.025 23.81% 8.06%

R² = 0.6915

-0.010

0.000

0.010

0.020

0.030

0.040

0.050

0 25 50 75

De

lta (

V)

Krad(Si)

Brake Hysteresis

Brake Hysteresis50 512 0.105 0.080 0.025 23.81% 8.06%50 513 0.105 0.075 0.030 28.57% 9.68%50 515 0.105 0.070 0.035 33.33% 11.29%50 516 0.105 0.070 0.035 33.33% 11.29%50 517 0.110 0.070 0.040 36.36% 12.90%50 521 0.105 0.070 0.035 33.33% 11.29%50 525 0.110 0.065 0.045 40.91% 14.52%0 29 0.105 0.110 -0.005 -4.76% 1.61%

Max 0.110 0.110 0.045 40.91% 14.52%Average 0.106 0.081 0.025 23.53% 8.17%

Min 0.105 0.065 -0.005 -4.76% 1.61%Std Dev 0.002 0.009 0.009 8.64% 2.73%

0.000

0.050

0.100

0.150

0.200

0.250

0.300

0.350

0.400

0 30 40 50

V

Krad(Si)

Brake Hysteresis

Pass Range

Fail Range

Min

Average

Max

Page 60



Speed In ThresholdTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 270 270Min Limit 240 240

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 264.000 259.000 5.000 1.89% 16.67%30 34 259.000 254.000 5.000 1.93% 16.67%30 38 261.000 255.000 6.000 2.30% 20.00%30 312 260.000 257.000 3.000 1.15% 10.00%30 313 260.000 255.000 5.000 1.92% 16.67%30 315 259.000 257.000 2.000 0.77% 6.67%30 316 262.000 260.000 2.000 0.76% 6.67%30 317 261.000 258.000 3.000 1.15% 10.00%30 321 261.000 259.000 2.000 0.77% 6.67%30 325 261.000 258.000 3.000 1.15% 10.00%40 43 264.000 258.000 6.000 2.27% 20.00% Speed In Threshold40 44 259.000 252.000 7.000 2.70% 23.33% Test Site SBDL40 48 261.000 254.000 7.000 2.68% 23.33% Tester ETS36440 412 260.000 256.000 4.000 1.54% 13.33% Test Number EF357940 413 260.000 254.000 6.000 2.31% 20.00% Max Limit 270 V40 415 259.000 257.000 2.000 0.77% 6.67% Min Limit 240 V40 416 262.000 259.000 3.000 1.15% 10.00% Krad(Si) 0 30 40 5040 417 261.000 258.000 3.000 1.15% 10.00% LL 240.000 240.000 240.000 240.00040 421 261.000 258.000 3.000 1.15% 10.00% Min 261.000 254.000 252.000 251.00040 425 261.000 258.000 3.000 1.15% 10.00% Average 261.000 257.200 256.400 255.80050 53 264.000 257.000 7.000 2.65% 23.33% Max 261.000 260.000 259.000 259.00050 54 259.000 251.000 8.000 3.09% 26.67% UL 270.000 270.000 270.000 270.00050 58 261.000 253.000 8.000 3.07% 26.67%

R² = 0.2484

-2.000-1.0000.0001.0002.0003.0004.0005.0006.0007.0008.0009.000

0 25 50 75

De

lta (

V)

Krad(Si)

Speed In Threshold

Speed In Threshold50 512 260.000 255.000 5.000 1.92% 16.67%50 513 260.000 253.000 7.000 2.69% 23.33%50 515 259.000 256.000 3.000 1.16% 10.00%50 516 262.000 259.000 3.000 1.15% 10.00%50 517 261.000 258.000 3.000 1.15% 10.00%50 521 261.000 258.000 3.000 1.15% 10.00%50 525 261.000 258.000 3.000 1.15% 10.00%0 29 260.000 261.000 -1.000 -0.38% 3.33%

Max 264.000 261.000 8.000 3.09% 26.67%Average 260.774 256.613 4.161 1.60% 14.09%

Min 259.000 251.000 -1.000 -0.38% 3.33%Std Dev 1.407 2.445 2.131 0.82% 6.65%

220.000

230.000

240.000

250.000

260.000

270.000

280.000

0 30 40 50

V

Krad(Si)

Speed In Threshold

Pass Range

Fail Range

Min

Average

Max

Page 61



Speed In Bias Current @ 0VTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit uA uAMax Limit 10 10Min Limit -10 -10

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 -0.120 -0.746 0.626 -521.93% 3.13%30 34 -0.123 -0.770 0.647 -526.18% 3.24%30 38 -0.124 -0.774 0.650 -522.74% 3.25%30 312 -0.125 -0.777 0.651 -519.71% 3.26%30 313 -0.125 -0.772 0.647 -518.21% 3.24%30 315 -0.124 -1.135 1.011 -815.84% 5.05%30 316 -0.123 -1.183 1.060 -860.74% 5.30%30 317 -0.130 -1.168 1.038 -801.56% 5.19%30 321 -0.116 -1.188 1.072 -924.79% 5.36%30 325 -0.118 -1.240 1.122 -950.55% 5.61%40 43 -0.120 -0.886 0.766 -638.19% 3.83% Speed In Bias Current @ 0V40 44 -0.123 -0.901 0.778 -632.86% 3.89% Test Site SBDL40 48 -0.124 -0.898 0.774 -622.59% 3.87% Tester ETS36440 412 -0.125 -0.910 0.784 -625.67% 3.92% Test Number EF357940 413 -0.125 -0.888 0.763 -610.65% 3.81% Max Limit 10 uA40 415 -0.124 -1.498 1.374 -1108.75% 6.87% Min Limit -10 uA40 416 -0.123 -1.527 1.404 -1140.39% 7.02% Krad(Si) 0 30 40 5040 417 -0.130 -1.498 1.369 -1057.07% 6.84% LL -10.000 -10.000 -10.000 -10.00040 421 -0.116 -1.518 1.402 -1209.25% 7.01% Min -0.075 -1.240 -1.572 -1.68940 425 -0.118 -1.572 1.454 -1232.10% 7.27% Average -0.075 -0.975 -1.210 -1.27850 53 -0.120 -0.922 0.802 -668.28% 4.01% Max -0.075 -0.746 -0.886 -0.91550 54 -0.123 -0.928 0.805 -654.65% 4.03% UL 10.000 10.000 10.000 10.00050 58 -0.124 -0.915 0.791 -636.27% 3.95%

R² = 0.3379

-0.200

0.000

0.200

0.400

0.600

0.800

1.000

1.200

1.400

1.600

1.800

0 25 50 75

De

lta (

uA

)

Krad(Si)

Speed In Bias Current @ 0V

Speed In Bias Current @ 0V50 512 -0.125 -0.936 0.811 -646.73% 4.05%50 513 -0.125 -0.916 0.791 -633.15% 3.96%50 515 -0.124 -1.601 1.477 -1192.20% 7.39%50 516 -0.123 -1.624 1.501 -1219.02% 7.50%50 517 -0.130 -1.614 1.485 -1146.40% 7.42%50 521 -0.116 -1.634 1.518 -1309.57% 7.59%50 525 -0.118 -1.689 1.570 -1330.64% 7.85%0 29 -0.123 -0.075 -0.048 38.79% 0.24%

Max -0.116 -0.075 1.570 38.79% 7.85%Average -0.123 -1.119 0.997 -814.13% 5.00%

Min -0.130 -1.689 -0.048 -1330.64% 0.24%Std Dev 0.004 0.379 0.380 317.14% 1.86%

-15.000

-10.000

-5.000

0.000

5.000

10.000

15.000

0 30 40 50

uA

Krad(Si)


Pass Range

Fail Range

Min

Average

Max

Page 62



Speed In Bias Current @ 5VTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit uA uAMax Limit 10 10Min Limit -10 -10

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 -0.026 -0.023 -0.003 12.33% 0.02%30 34 -0.026 -0.023 -0.003 12.33% 0.02%30 38 -0.027 -0.023 -0.004 15.65% 0.02%30 312 -0.026 -0.025 -0.001 5.56% 0.01%30 313 -0.025 -0.022 -0.003 12.38% 0.02%30 315 -0.025 -0.021 -0.004 15.40% 0.02%30 316 -0.028 -0.020 -0.008 28.39% 0.04%30 317 -0.028 -0.023 -0.004 14.67% 0.02%30 321 -0.028 -0.022 -0.005 19.02% 0.03%30 325 -0.025 -0.020 -0.005 21.39% 0.03%40 43 -0.026 -0.003 -0.024 90.09% 0.12% Speed In Bias Current @ 5V40 44 -0.026 -0.004 -0.022 82.85% 0.11% Test Site SBDL40 48 -0.027 -0.004 -0.023 83.42% 0.11% Tester ETS36440 412 -0.026 0.001 -0.027 101.90% 0.13% Test Number EF357940 413 -0.025 0.000 -0.026 100.79% 0.13% Max Limit 10 uA40 415 -0.025 -0.002 -0.023 91.62% 0.11% Min Limit -10 uA40 416 -0.028 -0.004 -0.024 86.39% 0.12% Krad(Si) 0 30 40 5040 417 -0.028 -0.006 -0.022 79.67% 0.11% LL -10.000 -10.000 -10.000 -10.00040 421 -0.028 -0.002 -0.026 93.10% 0.13% Min 0.000 -0.025 -0.006 -0.00640 425 -0.025 -0.001 -0.024 95.21% 0.12% Average 0.000 -0.022 -0.003 -0.00250 53 -0.026 -0.003 -0.024 90.09% 0.12% Max 0.000 -0.020 0.001 0.00150 54 -0.026 -0.001 -0.025 96.95% 0.13% UL 10.000 10.000 10.000 10.00050 58 -0.027 -0.001 -0.027 97.79% 0.13%

R² = 0.3301

-0.030

-0.025

-0.020

-0.015

-0.010

-0.005

0.000

0.005

0 25 50 75

De

lta (

uA

)

Krad(Si)


Speed In Bias Current @ 5V50 512 -0.026 -0.005 -0.022 82.17% 0.11%50 513 -0.025 0.001 -0.026 103.54% 0.13%50 515 -0.025 -0.005 -0.020 78.05% 0.10%50 516 -0.028 -0.001 -0.027 95.35% 0.13%50 517 -0.028 -0.002 -0.026 94.19% 0.13%50 521 -0.028 -0.004 -0.024 86.93% 0.12%50 525 -0.025 0.000 -0.025 100.80% 0.13%0 29 -0.023 0.000 -0.023 100.87% 0.12%

Max -0.023 0.001 -0.001 103.54% 0.13%Average -0.026 -0.009 -0.018 67.38% 0.09%

Min -0.028 -0.025 -0.027 5.56% 0.01%Std Dev 0.001 0.010 0.010 36.96% 0.05%

-15.000

-10.000

-5.000

0.000

5.000

10.000

15.000

0 30 40 50

uA

Krad(Si)


Pass Range

Fail Range

Min

Average

Max

Page 63



OV_Coast High ThresholdTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 1.825 1.825Min Limit 1.69 1.69

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 1.792 1.752 0.040 2.23% 29.63%30 34 1.764 1.724 0.040 2.27% 29.63%30 38 1.774 1.732 0.042 2.37% 31.11%30 312 1.770 1.750 0.020 1.13% 14.81%30 313 1.772 1.734 0.038 2.14% 28.15%30 315 1.772 1.738 0.034 1.92% 25.19%30 316 1.770 1.738 0.032 1.81% 23.70%30 317 1.768 1.734 0.034 1.92% 25.19%30 321 1.778 1.742 0.036 2.02% 26.67%30 325 1.774 1.738 0.036 2.03% 26.67%40 43 1.792 1.740 0.052 2.90% 38.52% OV_Coast High Threshold40 44 1.764 1.712 0.052 2.95% 38.52% Test Site SBDL40 48 1.774 1.720 0.054 3.04% 40.00% Tester ETS36440 412 1.770 1.736 0.034 1.92% 25.19% Test Number EF357940 413 1.772 1.722 0.050 2.82% 37.04% Max Limit 1.825 V40 415 1.772 1.728 0.044 2.48% 32.59% Min Limit 1.69 V40 416 1.770 1.726 0.044 2.49% 32.59% Krad(Si) 0 30 40 5040 417 1.768 1.724 0.044 2.49% 32.59% LL 1.690 1.690 1.690 1.69040 421 1.778 1.730 0.048 2.70% 35.56% Min 1.772 1.724 1.712 1.70640 425 1.774 1.726 0.048 2.71% 35.56% Average 1.772 1.738 1.726 1.72150 53 1.792 1.736 0.056 3.13% 41.48% Max 1.772 1.752 1.740 1.73650 54 1.764 1.706 0.058 3.29% 42.96% UL 1.825 1.825 1.825 1.82550 58 1.774 1.714 0.060 3.38% 44.44%

R² = 0.7407

0.000

0.010

0.020

0.030

0.040

0.050

0.060

0.070

0 25 50 75

De

lta (

V)

Krad(Si)

OV_Coast High Threshold

OV Coast High Threshold50 512 1.770 1.732 0.038 2.15% 28.15%50 513 1.772 1.716 0.056 3.16% 41.48%50 515 1.772 1.722 0.050 2.82% 37.04%50 516 1.770 1.722 0.048 2.71% 35.56%50 517 1.768 1.718 0.050 2.83% 37.04%50 521 1.778 1.726 0.052 2.92% 38.52%50 525 1.774 1.722 0.052 2.93% 38.52%0 29 1.772 1.772 0.000 0.00% 0.00%

Max 1.792 1.772 0.060 3.38% 44.44%Average 1.773 1.730 0.043 2.44% 32.07%

Min 1.764 1.706 0.000 0.00% 0.00%Std Dev 0.007 0.013 0.012 0.68% 9.00%

1.600

1.650

1.700

1.750

1.800

1.850

0 30 40 50

V

Krad(Si)

OV_Coast High Threshold

Pass Range

Fail Range

Min

Average

Max

Page 64



OV_Coast Low ThresholdTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 1.725 1.725Min Limit 1.585 1.585

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 1.676 1.640 0.036 2.15% 25.71%30 34 1.650 1.614 0.036 2.18% 25.71%30 38 1.660 1.622 0.038 2.29% 27.14%30 312 1.656 1.638 0.018 1.09% 12.86%30 313 1.658 1.624 0.034 2.05% 24.29%30 315 1.658 1.628 0.030 1.81% 21.43%30 316 1.658 1.626 0.032 1.93% 22.86%30 317 1.654 1.624 0.030 1.81% 21.43%30 321 1.664 1.630 0.034 2.04% 24.29%30 325 1.660 1.626 0.034 2.05% 24.29%40 43 1.676 1.628 0.048 2.86% 34.29% OV_Coast Low Threshold40 44 1.650 1.602 0.048 2.91% 34.29% Test Site SBDL40 48 1.660 1.610 0.050 3.01% 35.71% Tester ETS36440 412 1.656 1.626 0.030 1.81% 21.43% Test Number EF357940 413 1.658 1.612 0.046 2.77% 32.86% Max Limit 1.725 V40 415 1.658 1.616 0.042 2.53% 30.00% Min Limit 1.585 V40 416 1.658 1.618 0.040 2.41% 28.57% Krad(Si) 0 30 40 5040 417 1.654 1.614 0.040 2.42% 28.57% LL 1.585 1.585 1.585 1.58540 421 1.664 1.620 0.044 2.64% 31.43% Min 1.656 1.614 1.602 1.59640 425 1.660 1.616 0.044 2.65% 31.43% Average 1.656 1.627 1.616 1.61250 53 1.676 1.624 0.052 3.10% 37.14% Max 1.656 1.640 1.628 1.62450 54 1.650 1.596 0.054 3.27% 38.57% UL 1.725 1.725 1.725 1.72550 58 1.660 1.604 0.056 3.37% 40.00%

R² = 0.7111

0.000

0.010

0.020

0.030

0.040

0.050

0.060

0 25 50 75

De

lta (

V)

Krad(Si)

OV_Coast Low Threshold

OV_Coast Low Threshold50 512 1.656 1.622 0.034 2.05% 24.29%50 513 1.658 1.606 0.052 3.14% 37.14%50 515 1.658 1.614 0.044 2.65% 31.43%50 516 1.658 1.614 0.044 2.65% 31.43%50 517 1.654 1.610 0.044 2.66% 31.43%50 521 1.664 1.616 0.048 2.88% 34.29%50 525 1.660 1.612 0.048 2.89% 34.29%0 29 1.658 1.656 0.002 0.12% 1.43%

Max 1.676 1.656 0.056 3.37% 40.00%Average 1.659 1.620 0.040 2.39% 28.39%

Min 1.650 1.596 0.002 0.12% 1.43%Std Dev 0.007 0.012 0.011 0.67% 7.92%

1.500

1.550

1.600

1.650

1.700

1.750

0 30 40 50

V

Krad(Si)

OV_Coast Low Threshold

Pass Range

Fail Range

Min

Average

Max

Page 65



OV_Coast HystersisTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit mV mVMax Limit 125 125Min Limit 85 85

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 116.000 112.000 4.000 3.45% 10.00%30 34 114.000 110.000 4.000 3.51% 10.00%30 38 114.000 110.000 4.000 3.51% 10.00%30 312 114.000 112.000 2.000 1.75% 5.00%30 313 114.000 110.000 4.000 3.51% 10.00%30 315 114.000 110.000 4.000 3.51% 10.00%30 316 112.000 112.000 0.000 0.00% 0.00%30 317 114.000 110.000 4.000 3.51% 10.00%30 321 114.000 112.000 2.000 1.75% 5.00%30 325 114.000 112.000 2.000 1.75% 5.00%40 43 116.000 112.000 4.000 3.45% 10.00% OV_Coast Hystersis40 44 114.000 110.000 4.000 3.51% 10.00% Test Site SBDL40 48 114.000 110.000 4.000 3.51% 10.00% Tester ETS36440 412 114.000 110.000 4.000 3.51% 10.00% Test Number EF357940 413 114.000 110.000 4.000 3.51% 10.00% Max Limit 125 mV40 415 114.000 112.000 2.000 1.75% 5.00% Min Limit 85 mV40 416 112.000 108.000 4.000 3.57% 10.00% Krad(Si) 0 30 40 5040 417 114.000 110.000 4.000 3.51% 10.00% LL 85.000 85.000 85.000 85.00040 421 114.000 110.000 4.000 3.51% 10.00% Min 116.000 110.000 108.000 108.00040 425 114.000 110.000 4.000 3.51% 10.00% Average 116.000 111.000 110.200 109.60050 53 116.000 112.000 4.000 3.45% 10.00% Max 116.000 112.000 112.000 112.00050 54 114.000 110.000 4.000 3.51% 10.00% UL 125.000 125.000 125.000 125.00050 58 114.000 110.000 4.000 3.51% 10.00%

R² = 0.5298

-3.000

-2.000

-1.000

0.000

1.000

2.000

3.000

4.000

5.000

6.000

7.000

0 25 50 75

De

lta (

mV

)

Krad(Si)

OV_Coast Hystersis

OV_Coast Hystersis50 512 114.000 110.000 4.000 3.51% 10.00%50 513 114.000 110.000 4.000 3.51% 10.00%50 515 114.000 108.000 6.000 5.26% 15.00%50 516 112.000 108.000 4.000 3.57% 10.00%50 517 114.000 108.000 6.000 5.26% 15.00%50 521 114.000 110.000 4.000 3.51% 10.00%50 525 114.000 110.000 4.000 3.51% 10.00%0 29 114.000 116.000 -2.000 -1.75% 5.00%

Max 116.000 116.000 6.000 5.26% 15.00%Average 114.000 110.452 3.548 3.11% 9.19%

Min 112.000 108.000 -2.000 -1.75% 0.00%Std Dev 0.894 1.609 1.524 1.34% 2.91%

0.000

20.000

40.000

60.000

80.000

100.000

120.000

140.000

0 30 40 50

mV

Krad(Si)

OV_Coast Hystersis

Pass Range

Fail Range

Min

Average

Max

Page 66



OV_Coast Bias Current @ 0VTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit uA uAMax Limit 5 5Min Limit -5 -5

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 -1.003 -1.261 0.258 -25.69% 2.58%30 34 -1.048 -1.204 0.156 -14.89% 1.56%30 38 -1.048 -1.231 0.182 -17.39% 1.82%30 312 -1.029 -1.230 0.201 -19.50% 2.01%30 313 -1.063 -1.245 0.183 -17.19% 1.83%30 315 -1.024 -1.382 0.357 -34.89% 3.57%30 316 -1.038 -1.400 0.363 -34.96% 3.63%30 317 -1.104 -1.415 0.311 -28.13% 3.11%30 321 -1.037 -1.446 0.409 -39.51% 4.09%30 325 -0.966 -1.410 0.444 -45.99% 4.44%40 43 -1.003 -1.249 0.246 -24.51% 2.46% OV_Coast Bias Current @ 0V40 44 -1.048 -1.192 0.144 -13.73% 1.44% Test Site SBDL40 48 -1.048 -1.226 0.178 -16.98% 1.78% Tester ETS36440 412 -1.029 -1.217 0.188 -18.29% 1.88% Test Number EF357940 413 -1.063 -1.234 0.171 -16.09% 1.71% Max Limit 5 uA40 415 -1.024 -1.404 0.379 -37.04% 3.79% Min Limit -5 uA40 416 -1.038 -1.426 0.388 -37.41% 3.88% Krad(Si) 0 30 40 5040 417 -1.104 -1.427 0.323 -29.26% 3.23% LL -5.000 -5.000 -5.000 -5.00040 421 -1.037 -1.471 0.434 -41.88% 4.34% Min -1.080 -1.446 -1.471 -1.48240 425 -0.966 -1.426 0.460 -47.62% 4.60% Average -1.080 -1.322 -1.327 -1.32750 53 -1.003 -1.226 0.223 -22.27% 2.23% Max -1.080 -1.204 -1.192 -1.17850 54 -1.048 -1.178 0.130 -12.40% 1.30% UL 5.000 5.000 5.000 5.00050 58 -1.048 -1.207 0.159 -15.12% 1.59%

R² = 0.0713

0.000

0.050

0.100

0.150

0.200

0.250

0.300

0.350

0.400

0.450

0.500

0 25 50 75

De

lta (

uA

)

Krad(Si)

OV_Coast Bias Current @ 0V

OV_Coast Bias Current @ 0V50 512 -1.029 -1.210 0.180 -17.53% 1.80%50 513 -1.063 -1.227 0.165 -15.51% 1.65%50 515 -1.024 -1.420 0.395 -38.60% 3.95%50 516 -1.038 -1.432 0.394 -37.98% 3.94%50 517 -1.104 -1.448 0.344 -31.13% 3.44%50 521 -1.037 -1.482 0.446 -43.01% 4.46%50 525 -0.966 -1.442 0.476 -49.30% 4.76%0 29 -1.055 -1.080 0.025 -2.40% 0.25%

Max -0.966 -1.080 0.476 -2.40% 4.76%Average -1.037 -1.318 0.281 -27.30% 2.81%

Min -1.104 -1.482 0.025 -49.30% 0.25%Std Dev 0.035 0.115 0.123 12.39% 1.23%

-8.000

-6.000

-4.000

-2.000

0.000

2.000

4.000

6.000

8.000

0 30 40 50

uA

Krad(Si)


Pass Range

Fail Range

Min

Average

Max

Page 67



OV_Coast Bias Current @ 5VTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit uA uAMax Limit 5 5Min Limit -5 -5

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 0.020 0.017 0.003 15.03% 0.03%30 34 0.019 0.016 0.003 15.45% 0.03%30 38 0.017 0.013 0.004 24.07% 0.04%30 312 0.014 0.012 0.002 15.82% 0.02%30 313 0.018 0.015 0.003 15.16% 0.03%30 315 0.022 0.012 0.010 45.27% 0.10%30 316 0.021 0.018 0.002 11.44% 0.02%30 317 0.021 0.014 0.007 31.51% 0.07%30 321 0.020 0.012 0.009 42.12% 0.09%30 325 0.015 0.013 0.001 9.68% 0.01%40 43 0.020 0.039 -0.019 -92.31% 0.19% OV_Coast Bias Current @ 5V40 44 0.019 0.033 -0.015 -78.74% 0.15% Test Site SBDL40 48 0.017 0.037 -0.020 -119.50% 0.20% Tester ETS36440 412 0.014 0.037 -0.023 -160.20% 0.23% Test Number EF357940 413 0.018 0.044 -0.026 -145.11% 0.26% Max Limit 5 uA40 415 0.022 0.036 -0.014 -64.64% 0.14% Min Limit -5 uA40 416 0.021 0.040 -0.019 -90.11% 0.19% Krad(Si) 0 30 40 5040 417 0.021 0.034 -0.013 -60.14% 0.13% LL -5.000 -5.000 -5.000 -5.00040 421 0.020 0.034 -0.014 -68.26% 0.14% Min 0.038 0.012 0.033 0.03640 425 0.015 0.040 -0.026 -177.16% 0.26% Average 0.038 0.014 0.037 0.03850 53 0.020 0.038 -0.017 -86.34% 0.17% Max 0.038 0.018 0.044 0.04050 54 0.019 0.038 -0.020 -104.43% 0.20% UL 5.000 5.000 5.000 5.00050 58 0.017 0.038 -0.021 -124.24% 0.21%

R² = 0.3404

-0.030

-0.025

-0.020

-0.015

-0.010

-0.005

0.000

0.005

0.010

0.015

0 25 50 75

De

lta (

uA

)

Krad(Si)


OV_Coast Bias Current @ 5V50 512 0.014 0.039 -0.024 -169.25% 0.24%50 513 0.018 0.040 -0.022 -123.48% 0.22%50 515 0.022 0.040 -0.018 -83.20% 0.18%50 516 0.021 0.036 -0.015 -72.78% 0.15%50 517 0.021 0.037 -0.016 -74.78% 0.16%50 521 0.020 0.040 -0.019 -93.77% 0.19%50 525 0.015 0.038 -0.024 -162.68% 0.24%0 29 0.022 0.038 -0.016 -71.16% 0.16%

Max 0.022 0.044 0.010 45.27% 0.26%Average 0.019 0.030 -0.011 -64.41% 0.14%

Min 0.014 0.012 -0.026 -177.16% 0.01%Std Dev 0.003 0.011 0.012 68.67% 0.08%

-8.000

-6.000

-4.000

-2.000

0.000

2.000

4.000

6.000

8.000

0 30 40 50

uA

Krad(Si)


Pass Range

Fail Range

Min

Average

Max

Page 68



Hall Input 1 Low ThresholdTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 1.175 1.175Min Limit 0.9 0.9

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 0.990 0.970 0.020 2.02% 7.27%30 34 0.970 0.960 0.010 1.03% 3.64%30 38 0.970 0.960 0.010 1.03% 3.64%30 312 0.970 0.970 0.000 0.00% 0.00%30 313 0.970 0.960 0.010 1.03% 3.64%30 315 0.970 0.960 0.010 1.03% 3.64%30 316 0.970 0.960 0.010 1.03% 3.64%30 317 0.970 0.960 0.010 1.03% 3.64%30 321 0.980 0.970 0.010 1.02% 3.64%30 325 0.980 0.960 0.020 2.04% 7.27%40 43 0.990 0.960 0.030 3.03% 10.91% Hall Input 1 Low Threshold40 44 0.970 0.950 0.020 2.06% 7.27% Test Site SBDL40 48 0.970 0.950 0.020 2.06% 7.27% Tester ETS36440 412 0.970 0.960 0.010 1.03% 3.64% Test Number EF357940 413 0.970 0.950 0.020 2.06% 7.27% Max Limit 1.175 V40 415 0.970 0.960 0.010 1.03% 3.64% Min Limit 0.9 V40 416 0.970 0.960 0.010 1.03% 3.64% Krad(Si) 0 30 40 5040 417 0.970 0.960 0.010 1.03% 3.64% LL 0.900 0.900 0.900 0.90040 421 0.980 0.960 0.020 2.04% 7.27% Min 0.970 0.960 0.950 0.95040 425 0.980 0.960 0.020 2.04% 7.27% Average 0.970 0.963 0.957 1.22750 53 0.990 0.960 0.030 3.03% 10.91% Max 0.970 0.970 0.960 1.50050 54 0.970 0.950 0.020 2.06% 7.27% UL 1.175 1.175 1.175 1.17550 58 0.970 0.950 0.020 2.06% 7.27%

R² = 0.1972

-0.600

-0.500

-0.400

-0.300

-0.200

-0.100

0.000

0.100

0.200

0.300

0 25 50 75

De

lta (

V)

Krad(Si)

Hall Input 1 Low Threshold

Hall Input 1 Low Threshold50 512 0.970 0.960 0.010 1.03% 3.64%50 513 0.970 0.950 0.020 2.06% 7.27%50 515 0.970 1.500 -0.530 -54.64% 192.73%50 516 0.970 1.500 -0.530 -54.64% 192.73%50 517 0.970 1.500 -0.530 -54.64% 192.73%50 521 0.980 1.500 -0.520 -53.06% 189.09%50 525 0.980 1.500 -0.520 -53.06% 189.09%0 29 0.970 0.970 0.000 0.00% 0.00%

Max 0.990 1.500 0.030 3.03% 192.73%Average 0.974 1.046 -0.073 -7.45% 35.31%

Min 0.970 0.950 -0.530 -54.64% 0.00%Std Dev 0.007 0.202 0.202 20.77% 69.58%

0.000

0.200

0.400

0.600

0.800

1.000

1.200

1.400

1.600

0 30 40 50

V

Krad(Si)


Pass Range

Fail Range

Min

Average

Max

Page 69



Hall Input 1 High ThresholdTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 1.98 1.98Min Limit 1.75 1.75

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 1.936 1.924 0.012 0.62% 5.22%30 34 1.912 1.896 0.016 0.84% 6.96%30 38 1.916 1.900 0.016 0.84% 6.96%30 312 1.912 1.924 -0.012 -0.63% 5.22%30 313 1.916 1.904 0.012 0.63% 5.22%30 315 1.912 1.904 0.008 0.42% 3.48%30 316 1.916 1.908 0.008 0.42% 3.48%30 317 1.916 1.904 0.012 0.63% 5.22%30 321 1.920 1.912 0.008 0.42% 3.48%30 325 1.912 1.904 0.008 0.42% 3.48%40 43 1.936 1.916 0.020 1.03% 8.70% Hall Input 1 High Threshold40 44 1.912 1.892 0.020 1.05% 8.70% Test Site SBDL40 48 1.916 1.892 0.024 1.25% 10.43% Tester ETS36440 412 1.912 1.916 -0.004 -0.21% 1.74% Test Number EF357940 413 1.916 1.896 0.020 1.04% 8.70% Max Limit 1.98 V40 415 1.912 1.904 0.008 0.42% 3.48% Min Limit 1.75 V40 416 1.916 1.904 0.012 0.63% 5.22% Krad(Si) 0 30 40 5040 417 1.916 1.900 0.016 0.84% 6.96% LL 1.750 1.750 1.750 1.75040 421 1.920 1.908 0.012 0.62% 5.22% Min 1.912 1.896 1.892 1.50040 425 1.912 1.900 0.012 0.63% 5.22% Average 1.912 1.908 1.903 1.74050 53 1.936 1.916 0.020 1.03% 8.70% Max 1.912 1.924 1.916 1.91650 54 1.912 1.888 0.024 1.26% 10.43% UL 1.980 1.980 1.980 1.98050 58 1.916 1.888 0.028 1.46% 12.17%

R² = 0.1866

-0.200

-0.100

0.000

0.100

0.200

0.300

0.400

0.500

0 25 50 75

De

lta (

V)

Krad(Si)

Hall Input 1 High Threshold

Hall Input 1 High Threshold50 512 1.912 1.912 0.000 0.00% 0.00%50 513 1.916 1.892 0.024 1.25% 10.43%50 515 1.912 1.900 0.012 0.63% 5.22%50 516 1.916 1.500 0.416 21.71% 180.87%50 517 1.916 1.500 0.416 21.71% 180.87%50 521 1.920 1.500 0.420 21.87% 182.61%50 525 1.912 1.500 0.412 21.55% 179.13%0 29 1.912 1.912 0.000 0.00% 0.00%

Max 1.936 1.924 0.420 21.87% 182.61%Average 1.917 1.852 0.065 3.37% 28.50%

Min 1.912 1.500 -0.012 -0.63% 0.00%Std Dev 0.007 0.138 0.138 7.19% 59.69%

0.000

0.500

1.000

1.500

2.000

2.500

0 30 40 50

V

Krad(Si)


Pass Range

Fail Range

Min

Average

Max

Page 70




Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 1.936 1.920 0.016 0.83% 6.96%30 34 1.908 1.892 0.016 0.84% 6.96%30 38 1.916 1.896 0.020 1.04% 8.70%30 312 1.908 1.920 -0.012 -0.63% 5.22%30 313 1.912 1.896 0.016 0.84% 6.96%30 315 1.912 1.904 0.008 0.42% 3.48%30 316 1.912 1.904 0.008 0.42% 3.48%30 317 1.912 1.904 0.008 0.42% 3.48%30 321 1.916 1.908 0.008 0.42% 3.48%30 325 1.912 1.904 0.008 0.42% 3.48%40 43 1.936 1.916 0.020 1.03% 8.70% Hall Input 2 High Threshold40 44 1.908 1.888 0.020 1.05% 8.70% Test Site SBDL40 48 1.916 1.888 0.028 1.46% 12.17% Tester ETS36440 412 1.908 1.912 -0.004 -0.21% 1.74% Test Number EF357940 413 1.912 1.888 0.024 1.26% 10.43% Max Limit 1.98 V40 415 1.912 1.900 0.012 0.63% 5.22% Min Limit 1.75 V40 416 1.912 1.900 0.012 0.63% 5.22% Krad(Si) 0 30 40 5040 417 1.912 1.900 0.012 0.63% 5.22% LL 1.750 1.750 1.750 1.75040 421 1.916 1.904 0.012 0.63% 5.22% Min 1.908 1.892 1.888 1.50040 425 1.912 1.900 0.012 0.63% 5.22% Average 1.908 1.905 1.900 1.73850 53 1.936 1.912 0.024 1.24% 10.43% Max 1.908 1.920 1.916 1.91250 54 1.908 1.884 0.024 1.26% 10.43% UL 1.980 1.980 1.980 1.98050 58 1.916 1.884 0.032 1.67% 13.91%

R² = 0.187

-0.200

-0.100

0.000

0.100

0.200

0.300

0.400

0.500

0 25 50 75

De

lta (

V)

Krad(Si)


Hall Input 2 High Threshold50 512 1.908 1.912 -0.004 -0.21% 1.74%50 513 1.912 1.888 0.024 1.26% 10.43%50 515 1.912 1.900 0.012 0.63% 5.22%50 516 1.912 1.500 0.412 21.55% 179.13%50 517 1.912 1.500 0.412 21.55% 179.13%50 521 1.916 1.500 0.416 21.71% 180.87%50 525 1.912 1.500 0.412 21.55% 179.13%0 29 1.908 1.908 0.000 0.00% 0.00%

Max 1.936 1.920 0.416 21.71% 180.87%Average 1.914 1.849 0.065 3.38% 28.72%

Min 1.908 1.500 -0.012 -0.63% 0.00%Std Dev 0.008 0.137 0.137 7.14% 59.11%

0.000

0.500

1.000

1.500

2.000

2.500

0 30 40 50

V

Krad(Si)


Pass Range

Fail Range

Min

Average

Max

Page 71





R² = 0.2019

-0.600

-0.500

-0.400

-0.300

-0.200

-0.100

0.000

0.100

0.200

0.300

0 25 50 75

De

lta (

V)

Krad(Si)



Max 0.980 1.500 0.030 3.09% 192.73%Average 0.970 1.044 -0.074 -7.58% 35.43%

Min 0.960 0.940 -0.530 -54.64% 0.00%Std Dev 0.004 0.204 0.204 20.99% 70.15%

0.000

0.200

0.400

0.600

0.800

1.000

1.200

1.400

1.600

0 30 40 50

V

Krad(Si)


Pass Range

Fail Range

Min

Average

Max

Page 72





R² = 0.196

-0.600

-0.500

-0.400

-0.300

-0.200

-0.100

0.000

0.100

0.200

0.300

0 25 50 75

De

lta (

V)

Krad(Si)



Max 0.980 1.500 0.030 3.09% 192.73%Average 0.971 1.043 -0.072 -7.45% 35.89%

Min 0.970 0.940 -0.530 -54.64% 0.00%Std Dev 0.003 0.204 0.204 21.05% 69.96%

0.000

0.200

0.400

0.600

0.800

1.000

1.200

1.400

1.600

0 30 40 50

V

Krad(Si)


Pass Range

Fail Range

Min

Average

Max

Page 73




Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 1.936 1.920 0.016 0.83% 6.96%30 34 1.904 1.888 0.016 0.84% 6.96%30 38 1.912 1.892 0.020 1.05% 8.70%30 312 1.908 1.916 -0.008 -0.42% 3.48%30 313 1.912 1.896 0.016 0.84% 6.96%30 315 1.912 1.900 0.012 0.63% 5.22%30 316 1.912 1.904 0.008 0.42% 3.48%30 317 1.908 1.900 0.008 0.42% 3.48%30 321 1.912 1.900 0.012 0.63% 5.22%30 325 1.908 1.896 0.012 0.63% 5.22%40 43 1.936 1.912 0.024 1.24% 10.43% Hall Input 3 High Threshold40 44 1.904 1.880 0.024 1.26% 10.43% Test Site SBDL40 48 1.912 1.884 0.028 1.46% 12.17% Tester ETS36440 412 1.908 1.908 0.000 0.00% 0.00% Test Number EF357940 413 1.912 1.888 0.024 1.26% 10.43% Max Limit 1.98 V40 415 1.912 1.896 0.016 0.84% 6.96% Min Limit 1.75 V40 416 1.912 1.900 0.012 0.63% 5.22% Krad(Si) 0 30 40 5040 417 1.908 1.896 0.012 0.63% 5.22% LL 1.750 1.750 1.750 1.75040 421 1.912 1.900 0.012 0.63% 5.22% Min 1.904 1.888 1.880 1.50040 425 1.908 1.896 0.012 0.63% 5.22% Average 1.904 1.901 1.896 1.73550 53 1.936 1.908 0.028 1.45% 12.17% Max 1.904 1.920 1.912 1.90850 54 1.904 1.876 0.028 1.47% 12.17% UL 1.980 1.980 1.980 1.98050 58 1.912 1.884 0.028 1.46% 12.17%

R² = 0.1912

-0.200

-0.100

0.000

0.100

0.200

0.300

0.400

0.500

0 25 50 75

De

lta (

V)

Krad(Si)


Hall Input 3 High Threshold50 512 1.908 1.904 0.004 0.21% 1.74%50 513 1.912 1.884 0.028 1.46% 12.17%50 515 1.912 1.896 0.016 0.84% 6.96%50 516 1.912 1.500 0.412 21.55% 179.13%50 517 1.908 1.500 0.408 21.38% 177.39%50 521 1.912 1.500 0.412 21.55% 179.13%50 525 1.908 1.500 0.408 21.38% 177.39%0 29 1.904 1.904 0.000 0.00% 0.00%

Max 1.936 1.920 0.412 21.55% 179.13%Average 1.912 1.846 0.066 3.46% 28.95%

Min 1.904 1.500 -0.008 -0.42% 0.00%Std Dev 0.008 0.136 0.135 7.06% 58.52%

0.000

0.500

1.000

1.500

2.000

2.500

0 30 40 50

V

Krad(Si)


Pass Range

Fail Range

Min

Average

Max

Page 74



Hall Input 1 Bias CurrentTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit uA uAMax Limit -140 -140Min Limit -325 -325

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 -218.442 -234.200 15.758 -7.21% 8.52%30 34 -226.599 -227.231 0.632 -0.28% 0.34%30 38 -227.016 -224.916 -2.100 0.92% 1.14%30 312 -218.120 -233.006 14.886 -6.82% 8.05%30 313 -220.046 -222.598 2.552 -1.16% 1.38%30 315 -223.115 -231.878 8.763 -3.93% 4.74%30 316 -225.141 -233.191 8.050 -3.58% 4.35%30 317 -234.143 -230.942 -3.201 1.37% 1.73%30 321 -217.296 -228.815 11.519 -5.30% 6.23%30 325 -207.892 -229.164 21.272 -10.23% 11.50%40 43 -218.442 -231.677 13.235 -6.06% 7.15% Hall Input 1 Bias Current40 44 -226.599 -224.467 -2.132 0.94% 1.15% Test Site SBDL40 48 -227.016 -222.061 -4.955 2.18% 2.68% Tester ETS36440 412 -218.120 -230.210 12.090 -5.54% 6.54% Test Number EF357940 413 -220.046 -220.044 -0.002 0.00% 0.00% Max Limit -140 uA40 415 -223.115 -231.060 7.945 -3.56% 4.29% Min Limit -325 uA40 416 -225.141 -232.138 6.997 -3.11% 3.78% Krad(Si) 0 30 40 5040 417 -234.143 -229.867 -4.276 1.83% 2.31% LL -325.000 -325.000 -325.000 -325.00040 421 -217.296 -227.680 10.384 -4.78% 5.61% Min -229.838 -234.200 -232.138 -230.38440 425 -207.892 -228.065 20.173 -9.70% 10.90% Average -229.838 -229.594 -227.727 -224.82450 53 -218.442 -226.737 8.295 -3.80% 4.48% Max -229.838 -222.598 -220.044 -216.30050 54 -226.599 -219.754 -6.845 3.02% 3.70% UL -140.000 -140.000 -140.000 -140.00050 58 -227.016 -217.721 -9.295 4.09% 5.02%

R² = 0.0522

-15.000

-10.000

-5.000

0.000

5.000

10.000

15.000

20.000

25.000

0 25 50 75

De

lta (

uA

)

Krad(Si)

Hall Input 1 Bias Current

Hall Input 1 Bias Current50 512 -218.120 -226.058 7.938 -3.64% 4.29%50 513 -220.046 -216.300 -3.746 1.70% 2.02%50 515 -223.115 -229.784 6.669 -2.99% 3.60%50 516 -225.141 -230.384 5.243 -2.33% 2.83%50 517 -234.143 -228.392 -5.751 2.46% 3.11%50 521 -217.296 -226.262 8.966 -4.13% 4.85%50 525 -207.892 -226.844 18.952 -9.12% 10.24%0 29 -220.403 -229.838 9.435 -4.28% 5.10%

Max -207.892 -216.300 21.272 4.09% 11.50%Average -221.737 -227.461 5.724 -2.68% 4.57%

Min -234.143 -234.200 -9.295 -10.23% 0.00%Std Dev 6.765 4.614 8.388 3.88% 2.98%

-400.000

-350.000

-300.000

-250.000

-200.000

-150.000

-100.000

-50.000

0.000

0 30 40 50

uA

Krad(Si)


Pass Range

Fail Range

Min

Average

Max

Page 75




Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 -219.312 -237.933 18.621 -8.49% 10.07%30 34 -229.332 -230.385 1.053 -0.46% 0.57%30 38 -229.852 -227.783 -2.069 0.90% 1.12%30 312 -221.004 -236.111 15.107 -6.84% 8.17%30 313 -221.524 -226.221 4.697 -2.12% 2.54%30 315 -225.948 -235.721 9.773 -4.33% 5.28%30 316 -227.380 -238.193 10.813 -4.76% 5.85%30 317 -235.968 -234.549 -1.419 0.60% 0.77%30 321 -219.963 -233.639 13.676 -6.22% 7.39%30 325 -209.683 -232.728 23.045 -10.99% 12.46%40 43 -219.312 -235.128 15.816 -7.21% 8.55% Hall Input 2 Bias Current40 44 -229.332 -227.701 -1.631 0.71% 0.88% Test Site SBDL40 48 -229.852 -226.268 -3.584 1.56% 1.94% Tester ETS36440 412 -221.004 -232.392 11.388 -5.15% 6.16% Test Number EF357940 413 -221.524 -223.401 1.877 -0.85% 1.01% Max Limit -140 uA40 415 -225.948 -235.259 9.311 -4.12% 5.03% Min Limit -325 uA40 416 -227.380 -236.040 8.660 -3.81% 4.68% Krad(Si) 0 30 40 5040 417 -235.968 -232.131 -3.837 1.63% 2.07% LL -325.000 -325.000 -325.000 -325.00040 421 -219.963 -232.783 12.820 -5.83% 6.93% Min -232.913 -238.193 -236.040 -233.69540 425 -209.683 -232.783 23.100 -11.02% 12.49% Average -232.913 -233.326 -231.389 -227.98850 53 -219.312 -230.568 11.256 -5.13% 6.08% Max -232.913 -226.221 -223.401 -219.88350 54 -229.332 -221.707 -7.625 3.32% 4.12% UL -140.000 -140.000 -140.000 -140.00050 58 -229.852 -220.274 -9.578 4.17% 5.18%

R² = 0.0453

-15.000

-10.000

-5.000

0.000

5.000

10.000

15.000

20.000

25.000

0 25 50 75

De

lta (

uA

)

Krad(Si)



Max -209.683 -219.883 23.100 4.17% 12.49%Average -223.992 -230.966 6.973 -3.22% 5.00%

Min -235.968 -238.193 -9.578 -11.02% 0.57%Std Dev 6.925 4.880 8.886 4.09% 3.46%

-400.000

-350.000

-300.000

-250.000

-200.000

-150.000

-100.000

-50.000

0.000

0 30 40 50

uA

Krad(Si)


Pass Range

Fail Range

Min

Average

Max

Page 76




Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 -182.183 -192.521 10.338 -5.67% 5.59%30 34 -187.643 -185.372 -2.271 1.21% 1.23%30 38 -189.463 -183.682 -5.781 3.05% 3.12%30 312 -181.533 -192.781 11.248 -6.20% 6.08%30 313 -185.043 -182.252 -2.791 1.51% 1.51%30 315 -185.823 -190.961 5.138 -2.77% 2.78%30 316 -188.423 -192.911 4.488 -2.38% 2.43%30 317 -194.662 -192.001 -2.661 1.37% 1.44%30 321 -181.403 -188.622 7.219 -3.98% 3.90%30 325 -174.123 -189.662 15.539 -8.92% 8.40%40 43 -182.183 -190.200 8.017 -4.40% 4.33% Hall Input 3 Bias Current40 44 -187.643 -184.339 -3.304 1.76% 1.79% Test Site SBDL40 48 -189.463 -181.082 -8.381 4.42% 4.53% Tester ETS36440 412 -181.533 -190.721 9.188 -5.06% 4.97% Test Number EF357940 413 -185.043 -182.124 -2.919 1.58% 1.58% Max Limit -140 uA40 415 -185.823 -190.070 4.247 -2.29% 2.30% Min Limit -325 uA40 416 -188.423 -190.330 1.907 -1.01% 1.03% Krad(Si) 0 30 40 5040 417 -194.662 -188.767 -5.895 3.03% 3.19% LL -325.000 -325.000 -325.000 -325.00040 421 -181.403 -186.944 5.541 -3.05% 3.00% Min -192.284 -192.911 -190.721 -189.28840 425 -174.123 -185.902 11.779 -6.76% 6.37% Average -192.284 -189.077 -187.048 -184.69050 53 -182.183 -186.423 4.240 -2.33% 2.29% Max -192.284 -182.252 -181.082 -176.65450 54 -187.643 -181.343 -6.300 3.36% 3.41% UL -140.000 -140.000 -140.000 -140.00050 58 -189.463 -177.305 -12.158 6.42% 6.57%

R² = 0.0956

-15.000

-10.000

-5.000

0.000

5.000

10.000

15.000

20.000

0 25 50 75

De

lta (

uA

)

Krad(Si)



Max -174.123 -176.654 15.539 6.42% 8.40%Average -184.963 -187.111 2.148 -1.25% 3.51%

Min -194.662 -192.911 -12.158 -8.92% 0.33%Std Dev 5.341 4.375 7.191 3.94% 1.95%

-400.000

-350.000

-300.000

-250.000

-200.000

-150.000

-100.000

-50.000

0.000

0 30 40 50

uA

Krad(Si)


Pass Range

Fail Range

Min

Average

Max

Page 77



Quad Sel Input Current @ 0VTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit uA uAMax Limit 1 1Min Limit -15 -15

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 -0.725 -3.313 2.588 -356.91% 16.17%30 34 -0.836 -3.325 2.489 -297.72% 15.56%30 38 -0.816 -3.391 2.575 -315.34% 16.09%30 312 -0.921 -3.360 2.439 -264.89% 15.24%30 313 -0.840 -3.291 2.451 -291.82% 15.32%30 315 -0.843 -4.844 4.001 -474.94% 25.01%30 316 -0.850 -5.129 4.279 -503.16% 26.74%30 317 -0.875 -4.997 4.122 -470.99% 25.76%30 321 -0.845 -5.057 4.212 -498.36% 26.32%30 325 -0.768 -5.195 4.427 -576.30% 27.67%40 43 -0.725 -3.883 3.158 -435.52% 19.74% Quad Sel Input Current @ 0V40 44 -0.836 -3.964 3.128 -374.16% 19.55% Test Site SBDL40 48 -0.816 -3.927 3.111 -380.99% 19.44% Tester ETS36440 412 -0.921 -3.973 3.052 -331.46% 19.08% Test Number EF357940 413 -0.840 -3.793 2.953 -351.59% 18.46% Max Limit 1 uA40 415 -0.843 -6.468 5.625 -667.69% 35.16% Min Limit -15 uA40 416 -0.850 -6.528 5.678 -667.68% 35.49% Krad(Si) 0 30 40 5040 417 -0.875 -6.494 5.619 -642.04% 35.12% LL -15.000 -15.000 -15.000 -15.00040 421 -0.845 -6.541 5.696 -673.96% 35.60% Min -0.856 -5.195 -6.738 -7.26140 425 -0.768 -6.738 5.970 -777.17% 37.31% Average -0.856 -4.190 -5.231 -5.54850 53 -0.725 -4.034 3.309 -456.34% 20.68% Max -0.856 -3.291 -3.793 -3.90050 54 -0.836 -3.900 3.064 -366.50% 19.15% UL 1.000 1.000 1.000 1.00050 58 -0.816 -4.237 3.421 -418.96% 21.38%

R² = 0.3346

0.000

1.000

2.000

3.000

4.000

5.000

6.000

7.000

0 25 50 75

De

lta (

uA

)

Krad(Si)

Quad Sel Input Current @ 0V

Quad Sel Input Current @ 0V50 512 -0.921 -4.188 3.267 -354.81% 20.42%50 513 -0.840 -3.970 3.130 -372.66% 19.56%50 515 -0.843 -6.832 5.989 -710.89% 37.43%50 516 -0.850 -6.993 6.143 -722.36% 38.39%50 517 -0.875 -7.038 6.163 -704.20% 38.52%50 521 -0.845 -7.027 6.182 -731.46% 38.64%50 525 -0.768 -7.261 6.493 -845.25% 40.58%0 29 -0.816 -0.856 0.040 -4.85% 0.25%

Max -0.725 -0.856 6.493 -4.85% 40.58%Average -0.831 -4.856 4.025 -485.19% 25.16%

Min -0.921 -7.261 0.040 -845.25% 0.25%Std Dev 0.051 1.568 1.564 189.72% 9.78%

-18.000-16.000-14.000-12.000-10.000-8.000-6.000-4.000-2.0000.0002.0004.000

0 30 40 50

uA

Krad(Si)


Pass Range

Fail Range

Min

Average

Max

Page 78



Quad Sel Input Current @ 5VTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit uA uAMax Limit 75 75Min Limit 1 1

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 42.192 46.413 -4.221 -10.00% 5.70%30 34 46.179 46.046 0.133 0.29% 0.18%30 38 45.629 45.314 0.315 0.69% 0.43%30 312 43.583 46.094 -2.511 -5.76% 3.39%30 313 44.593 45.027 -0.434 -0.97% 0.59%30 315 44.614 46.495 -1.881 -4.22% 2.54%30 316 45.062 46.756 -1.694 -3.76% 2.29%30 317 47.979 46.373 1.606 3.35% 2.17%30 321 43.548 45.912 -2.364 -5.43% 3.19%30 325 40.719 46.230 -5.511 -13.53% 7.45%40 43 42.192 45.715 -3.523 -8.35% 4.76% Quad Sel Input Current @ 5V40 44 46.179 45.274 0.905 1.96% 1.22% Test Site SBDL40 48 45.629 44.498 1.131 2.48% 1.53% Tester ETS36440 412 43.583 45.295 -1.712 -3.93% 2.31% Test Number EF357940 413 44.593 44.313 0.280 0.63% 0.38% Max Limit 75 uA40 415 44.614 46.062 -1.448 -3.25% 1.96% Min Limit 1 uA40 416 45.062 46.250 -1.188 -2.64% 1.61% Krad(Si) 0 30 40 5040 417 47.979 45.877 2.102 4.38% 2.84% LL 1.000 1.000 1.000 1.00040 421 43.548 45.534 -1.986 -4.56% 2.68% Min 47.557 45.027 44.313 43.19040 425 40.719 45.658 -4.939 -12.13% 6.67% Average 47.557 46.066 45.448 44.57150 53 42.192 44.207 -2.015 -4.77% 2.72% Max 47.557 46.756 46.250 45.68650 54 46.179 43.900 2.279 4.93% 3.08% UL 75.000 75.000 75.000 75.00050 58 45.629 43.206 2.423 5.31% 3.27%

R² = 0.101

-6.000

-5.000

-4.000

-3.000

-2.000

-1.000

0.000

1.000

2.000

3.000

0 25 50 75

De

lta (

uA

)

Krad(Si)


Quad Sel Input Current @ 5V50 512 43.583 44.129 -0.546 -1.25% 0.74%50 513 44.593 43.190 1.403 3.15% 1.90%50 515 44.614 45.686 -1.072 -2.40% 1.45%50 516 45.062 45.669 -0.607 -1.35% 0.82%50 517 47.979 45.405 2.574 5.37% 3.48%50 521 43.548 45.077 -1.529 -3.51% 2.07%50 525 40.719 45.242 -4.523 -11.11% 6.11%0 29 44.506 47.557 -3.051 -6.86% 4.12%

Max 47.979 47.557 2.574 5.37% 7.45%Average 44.413 45.432 -1.019 -2.49% 2.70%

Min 40.719 43.190 -5.511 -13.53% 0.18%Std Dev 1.945 1.008 2.225 5.18% 1.87%

0.000

10.000

20.000

30.000

40.000

50.000

60.000

70.000

80.000

90.000

0 30 40 50

uA

Krad(Si)

Quad Se put Cu e t @ 5

Pass Range

Fail Range

Min

Average

Max

Page 79



Quad Sel Low ThresholdTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 2.75 2.75Min Limit 1.2 1.2

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 1.515 1.515 0.000 0.00% 0.00%30 34 1.494 1.494 0.000 0.00% 0.00%30 38 1.500 1.494 0.005 0.35% 0.34%30 312 1.494 1.515 -0.021 -1.39% 1.34%30 313 1.500 1.500 0.000 0.00% 0.00%30 315 1.500 1.489 0.010 0.69% 0.67%30 316 1.500 1.489 0.010 0.69% 0.67%30 317 1.500 1.489 0.010 0.69% 0.67%30 321 1.500 1.489 0.010 0.69% 0.67%30 325 1.500 1.489 0.010 0.69% 0.67%40 43 1.515 1.515 0.000 0.00% 0.00% Quad Sel Low Threshold40 44 1.494 1.494 0.000 0.00% 0.00% Test Site SBDL40 48 1.500 1.500 0.000 0.00% 0.00% Tester ETS36440 412 1.494 1.515 -0.021 -1.39% 1.34% Test Number EF357940 413 1.500 1.500 0.000 0.00% 0.00% Max Limit 2.75 V40 415 1.500 1.489 0.010 0.69% 0.67% Min Limit 1.2 V40 416 1.500 1.489 0.010 0.69% 0.67% Krad(Si) 0 30 40 5040 417 1.500 1.489 0.010 0.69% 0.67% LL 1.200 1.200 1.200 1.20040 421 1.500 1.489 0.010 0.69% 0.67% Min 1.494 1.489 1.489 1.48940 425 1.500 1.489 0.010 0.69% 0.67% Average 1.494 1.496 1.497 1.49850 53 1.515 1.515 0.000 0.00% 0.00% Max 1.494 1.515 1.515 1.51550 54 1.494 1.494 0.000 0.00% 0.00% UL 2.750 2.750 2.750 2.75050 58 1.500 1.500 0.000 0.00% 0.00%

R² = 3E-05

-0.025

-0.020

-0.015

-0.010

-0.005

0.000

0.005

0.010

0.015

0 25 50 75

De

lta (

V)

Krad(Si)

Quad Sel Low Threshold

Quad Sel Low Threshold50 512 1.494 1.515 -0.021 -1.39% 1.34%50 513 1.500 1.505 -0.005 -0.35% 0.34%50 515 1.500 1.489 0.010 0.69% 0.67%50 516 1.500 1.489 0.010 0.69% 0.67%50 517 1.500 1.489 0.010 0.69% 0.67%50 521 1.500 1.489 0.010 0.69% 0.67%50 525 1.500 1.489 0.010 0.69% 0.67%0 29 1.494 1.494 0.000 0.00% 0.00%

Max 1.515 1.515 0.010 0.69% 1.34%Average 1.500 1.497 0.003 0.20% 0.48%

Min 1.494 1.489 -0.021 -1.39% 0.00%Std Dev 0.006 0.010 0.009 0.63% 0.42%

0.000

0.500

1.000

1.500

2.000

2.500

3.000

3.500

0 30 40 50

V

Krad(Si)

Pass Range

Fail Range

Min

Average

Max

Page 80



Quad Sel High ThresholdTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 2.75 2.75Min Limit 1.2 1.2

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 1.588 1.557 0.031 1.96% 2.01%30 34 1.562 1.536 0.026 1.66% 1.68%30 38 1.572 1.536 0.036 2.31% 2.35%30 312 1.567 1.557 0.010 0.66% 0.67%30 313 1.572 1.541 0.031 1.98% 2.01%30 315 1.572 1.526 0.047 2.98% 3.02%30 316 1.567 1.526 0.042 2.65% 2.68%30 317 1.572 1.526 0.047 2.98% 3.02%30 321 1.572 1.526 0.047 2.98% 3.02%30 325 1.572 1.526 0.047 2.98% 3.02%40 43 1.588 1.552 0.036 2.29% 2.35% Quad Sel High Threshold40 44 1.562 1.531 0.031 2.00% 2.01% Test Site SBDL40 48 1.572 1.531 0.042 2.65% 2.68% Tester ETS36440 412 1.567 1.552 0.016 1.00% 1.01% Test Number EF357940 413 1.572 1.536 0.036 2.31% 2.35% Max Limit 2.75 V40 415 1.572 1.515 0.057 3.64% 3.69% Min Limit 1.2 V40 416 1.567 1.515 0.052 3.32% 3.35% Krad(Si) 0 30 40 5040 417 1.572 1.515 0.057 3.64% 3.69% LL 1.200 1.200 1.200 1.20040 421 1.572 1.520 0.052 3.31% 3.35% Min 1.567 1.526 1.515 1.51540 425 1.572 1.520 0.052 3.31% 3.35% Average 1.567 1.535 1.529 1.52750 53 1.588 1.552 0.036 2.29% 2.35% Max 1.567 1.557 1.552 1.55250 54 1.562 1.526 0.036 2.33% 2.35% UL 2.750 2.750 2.750 2.75050 58 1.572 1.531 0.042 2.65% 2.68%

R² = 0.2737

-0.010

0.000

0.010

0.020

0.030

0.040

0.050

0.060

0.070

0 25 50 75

De

lta (

V)

Krad(Si)

Quad Sel High Threshold

Quad Sel High Threshold50 512 1.567 1.552 0.016 1.00% 1.01%50 513 1.572 1.536 0.036 2.31% 2.35%50 515 1.572 1.515 0.057 3.64% 3.69%50 516 1.567 1.515 0.052 3.32% 3.35%50 517 1.572 1.515 0.057 3.64% 3.69%50 521 1.572 1.515 0.057 3.64% 3.69%50 525 1.572 1.515 0.057 3.64% 3.69%0 29 1.562 1.567 -0.005 -0.33% 0.34%

Max 1.588 1.567 0.057 3.64% 3.69%Average 1.572 1.532 0.040 2.54% 2.60%

Min 1.562 1.515 -0.005 -0.33% 0.34%Std Dev 0.007 0.015 0.015 0.98% 0.94%

0.000

0.500

1.000

1.500

2.000

2.500

3.000

3.500

0 30 40 50

V

Krad(Si)

g

Pass Range

Fail Range

Min

Average

Max

Page 81



Quad Sel HystersisTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit mV mVMax Limit 100 100Min Limit 15 15

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 72.800 41.600 31.200 42.86% 36.71%30 34 67.600 41.600 26.000 38.46% 30.59%30 38 72.800 41.600 31.200 42.86% 36.71%30 312 72.800 41.600 31.200 42.86% 36.71%30 313 72.800 41.600 31.200 42.86% 36.71%30 315 72.800 36.400 36.400 50.00% 42.82%30 316 67.600 36.400 31.200 46.15% 36.71%30 317 72.800 36.400 36.400 50.00% 42.82%30 321 72.800 36.400 36.400 50.00% 42.82%30 325 72.800 36.400 36.400 50.00% 42.82%40 43 72.800 36.400 36.400 50.00% 42.82% Quad Sel Hystersis40 44 67.600 36.400 31.200 46.15% 36.71% Test Site SBDL40 48 72.800 31.200 41.600 57.14% 48.94% Tester ETS36440 412 72.800 36.400 36.400 50.00% 42.82% Test Number EF357940 413 72.800 36.400 36.400 50.00% 42.82% Max Limit 100 mV40 415 72.800 26.000 46.800 64.29% 55.06% Min Limit 15 mV40 416 67.600 26.000 41.600 61.54% 48.94% Krad(Si) 0 30 40 5040 417 72.800 26.000 46.800 64.29% 55.06% LL 15.000 15.000 15.000 15.00040 421 72.800 31.200 41.600 57.14% 48.94% Min 72.800 36.400 26.000 26.00040 425 72.800 31.200 41.600 57.14% 48.94% Average 72.800 39.000 31.720 29.64050 53 72.800 36.400 36.400 50.00% 42.82% Max 72.800 41.600 36.400 36.40050 54 67.600 31.200 36.400 53.85% 42.82% UL 100.000 100.000 100.000 100.00050 58 72.800 31.200 41.600 57.14% 48.94%

R² = 0.6833

-10.000

0.000

10.000

20.000

30.000

40.000

50.000

0 25 50 75

De

lta (

mV

)

Krad(Si)

Quad Sel Hystersis

Quad Sel Hystersis50 512 72.800 36.400 36.400 50.00% 42.82%50 513 72.800 31.200 41.600 57.14% 48.94%50 515 72.800 26.000 46.800 64.29% 55.06%50 516 67.600 26.000 41.600 61.54% 48.94%50 517 72.800 26.000 46.800 64.29% 55.06%50 521 72.800 26.000 46.800 64.29% 55.06%50 525 72.800 26.000 46.800 64.29% 55.06%0 29 67.600 72.800 -5.200 -7.69% 6.12%

Max 72.800 72.800 46.800 64.29% 55.06%Average 71.626 34.723 36.903 51.38% 43.81%

Min 67.600 26.000 -5.200 -7.69% 6.12%Std Dev 2.210 8.945 9.715 13.41% 9.75%

0.000

20.000

40.000

60.000

80.000

100.000

120.000

0 30 40 50

mV

Krad(Si)

Pass Range

Fail Range

Min

Average

Max

Page 82



Dir Input Current @ 0VTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit uA uAMax Limit 10 10Min Limit -10 -10

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 -0.817 -3.311 2.494 -305.08% 12.47%30 34 -0.781 -3.273 2.492 -319.14% 12.46%30 38 -0.787 -3.326 2.539 -322.40% 12.69%30 312 -0.759 -3.386 2.627 -346.26% 13.14%30 313 -0.783 -3.281 2.498 -318.76% 12.49%30 315 -0.773 -4.806 4.033 -521.67% 20.16%30 316 -0.799 -5.080 4.281 -535.69% 21.40%30 317 -0.790 -4.911 4.121 -521.64% 20.60%30 321 -0.772 -5.013 4.241 -549.54% 21.21%30 325 -0.748 -5.133 4.385 -585.93% 21.92%40 43 -0.817 -3.703 2.886 -353.04% 14.43% Dir Input Current @ 0V40 44 -0.781 -3.797 3.016 -386.24% 15.08% Test Site SBDL40 48 -0.787 -3.775 2.988 -379.42% 14.94% Tester ETS36440 412 -0.759 -3.878 3.119 -411.10% 15.60% Test Number EF357940 413 -0.783 -3.791 3.008 -383.86% 15.04% Max Limit 10 uA40 415 -0.773 -6.432 5.659 -732.00% 28.29% Min Limit -10 uA40 416 -0.799 -6.388 5.589 -699.37% 27.94% Krad(Si) 0 30 40 5040 417 -0.790 -6.449 5.659 -716.32% 28.29% LL -10.000 -10.000 -10.000 -10.00040 421 -0.772 -6.543 5.771 -747.79% 28.86% Min -0.885 -5.133 -6.674 -7.19240 425 -0.748 -6.674 5.926 -791.86% 29.63% Average -0.885 -4.152 -5.143 -5.45450 53 -0.817 -4.010 3.193 -390.60% 15.96% Max -0.885 -3.273 -3.703 -3.83850 54 -0.781 -3.838 3.057 -391.49% 15.29% UL 10.000 10.000 10.000 10.00050 58 -0.787 -3.874 3.087 -392.00% 15.43%

R² = 0.3097

0.000

1.000

2.000

3.000

4.000

5.000

6.000

7.000

0 25 50 75

De

lta (

uA

)

Krad(Si)

Dir Input Current @ 0V

Dir Input Current @ 0V50 512 -0.759 -3.994 3.235 -426.39% 16.18%50 513 -0.783 -3.890 3.107 -396.49% 15.53%50 515 -0.773 -6.897 6.124 -792.15% 30.62%50 516 -0.799 -6.829 6.030 -754.56% 30.15%50 517 -0.790 -6.977 6.187 -783.15% 30.93%50 521 -0.772 -7.036 6.264 -811.67% 31.32%50 525 -0.748 -7.192 6.444 -861.08% 32.22%0 29 -0.772 -0.885 0.113 -14.67% 0.57%

Max -0.748 -0.885 6.444 -14.67% 32.22%Average -0.781 -4.786 4.005 -514.24% 20.03%

Min -0.817 -7.192 0.113 -861.08% 0.57%Std Dev 0.019 1.571 1.574 205.49% 7.87%

-15.000

-10.000

-5.000

0.000

5.000

10.000

15.000

0 30 40 50

uA

Krad(Si)

Pass Range

Fail Range

Min

Average

Max

Page 83



Dir Input Current @ 5VTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit uA uAMax Limit 10 10Min Limit -10 -10

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 -0.041 -0.048 0.007 -17.77% 0.04%30 34 -0.042 -0.038 -0.004 9.65% 0.02%30 38 -0.043 -0.032 -0.011 26.20% 0.06%30 312 -0.037 -0.040 0.003 -8.55% 0.02%30 313 -0.038 -0.035 -0.003 8.26% 0.02%30 315 -0.036 -0.042 0.006 -18.16% 0.03%30 316 -0.030 -0.043 0.013 -41.75% 0.06%30 317 -0.041 -0.051 0.010 -25.13% 0.05%30 321 -0.033 -0.061 0.028 -85.18% 0.14%30 325 -0.037 -0.038 0.001 -3.13% 0.01%40 43 -0.041 -0.001 -0.040 97.55% 0.20% Dir Input Current @ 5V40 44 -0.042 -0.022 -0.020 47.69% 0.10% Test Site SBDL40 48 -0.043 -0.022 -0.021 49.26% 0.11% Tester ETS36440 412 -0.037 -0.026 -0.011 29.44% 0.05% Test Number EF357940 413 -0.038 -0.027 -0.011 29.23% 0.06% Max Limit 10 uA40 415 -0.036 -0.026 -0.010 26.85% 0.05% Min Limit -10 uA40 416 -0.030 0.020 -0.050 165.93% 0.25% Krad(Si) 0 30 40 5040 417 -0.041 -0.017 -0.024 58.29% 0.12% LL -10.000 -10.000 -10.000 -10.00040 421 -0.033 -0.033 0.000 -0.18% 0.00% Min -0.022 -0.061 -0.039 -0.05140 425 -0.037 -0.039 0.002 -5.84% 0.01% Average -0.022 -0.043 -0.019 -0.01850 53 -0.041 -0.018 -0.023 55.83% 0.11% Max -0.022 -0.032 0.020 0.02550 54 -0.042 -0.051 0.009 -21.26% 0.04% UL 10.000 10.000 10.000 10.00050 58 -0.043 -0.005 -0.038 88.47% 0.19%

R² = 0.2019

-0.060

-0.050

-0.040

-0.030

-0.020

-0.010

0.000

0.010

0.020

0.030

0.040

0 25 50 75

De

lta (

uA

)

Krad(Si)

Dir Input Current @ 5V

Dir Input Current @ 5V50 512 -0.037 -0.025 -0.012 32.15% 0.06%50 513 -0.038 -0.034 -0.004 10.88% 0.02%50 515 -0.036 -0.025 -0.011 29.67% 0.05%50 516 -0.030 0.025 -0.055 182.41% 0.28%50 517 -0.041 -0.023 -0.018 43.57% 0.09%50 521 -0.033 -0.010 -0.023 69.64% 0.11%50 525 -0.037 -0.016 -0.021 56.58% 0.10%0 29 -0.026 -0.022 -0.004 16.75% 0.02%

Max -0.026 0.025 0.028 182.41% 0.28%Average -0.037 -0.027 -0.011 29.27% 0.08%

Min -0.043 -0.061 -0.055 -85.18% 0.00%Std Dev 0.004 0.019 0.019 54.53% 0.07%

-15.000

-10.000

-5.000

0.000

5.000

10.000

15.000

0 30 40 50

uA

Krad(Si)

Pass Range

Fail Range

Min

Average

Max

Page 84



Dir Low ThresholdTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 2.75 2.75Min Limit 0.9 0.9

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 1.016 1.040 -0.024 -2.36% 1.30%30 34 1.008 1.024 -0.016 -1.59% 0.86%30 38 1.016 1.032 -0.016 -1.57% 0.86%30 312 1.008 1.040 -0.032 -3.17% 1.73%30 313 1.016 1.040 -0.024 -2.36% 1.30%30 315 1.008 1.032 -0.024 -2.38% 1.30%30 316 1.008 1.032 -0.024 -2.38% 1.30%30 317 1.016 1.032 -0.016 -1.57% 0.86%30 321 1.016 1.032 -0.016 -1.57% 0.86%30 325 1.008 1.032 -0.024 -2.38% 1.30%40 43 1.016 1.048 -0.032 -3.15% 1.73% Dir Low Threshold40 44 1.008 1.032 -0.024 -2.38% 1.30% Test Site SBDL40 48 1.016 1.040 -0.024 -2.36% 1.30% Tester ETS36440 412 1.008 1.048 -0.040 -3.97% 2.16% Test Number EF357940 413 1.016 1.040 -0.024 -2.36% 1.30% Max Limit 2.75 V40 415 1.008 1.032 -0.024 -2.38% 1.30% Min Limit 0.9 V40 416 1.008 1.040 -0.032 -3.17% 1.73% Krad(Si) 0 30 40 5040 417 1.016 1.040 -0.024 -2.36% 1.30% LL 0.900 0.900 0.900 0.90040 421 1.016 1.040 -0.024 -2.36% 1.30% Min 1.016 1.024 1.032 1.03240 425 1.008 1.040 -0.032 -3.17% 1.73% Average 1.016 1.034 1.040 1.04250 53 1.016 1.048 -0.032 -3.15% 1.73% Max 1.016 1.040 1.048 1.04850 54 1.008 1.032 -0.024 -2.38% 1.30% UL 2.750 2.750 2.750 2.75050 58 1.016 1.040 -0.024 -2.36% 1.30%

R² = 0.4725

-0.045

-0.040

-0.035

-0.030

-0.025

-0.020

-0.015

-0.010

-0.005

0.000

0 25 50 75

De

lta (

V)

Krad(Si)

Dir Low Threshold

Dir Low Threshold

50 512 1.008 1.048 -0.040 -3.97% 2.16%50 513 1.016 1.048 -0.032 -3.15% 1.73%50 515 1.008 1.040 -0.032 -3.17% 1.73%50 516 1.008 1.040 -0.032 -3.17% 1.73%50 517 1.016 1.040 -0.024 -2.36% 1.30%50 521 1.016 1.048 -0.032 -3.15% 1.73%50 525 1.008 1.040 -0.032 -3.17% 1.73%0 29 1.008 1.016 -0.008 -0.79% 0.43%

Max 1.016 1.048 -0.008 -0.79% 2.16%Average 1.012 1.038 -0.026 -2.58% 1.41%

Min 1.008 1.016 -0.040 -3.97% 0.43%Std Dev 0.004 0.007 0.007 0.71% 0.39%

0.000

0.500

1.000

1.500

2.000

2.500

3.000

3.500

0 30 40 50

V

Krad(Si)

Pass Range

Fail Range

Min

Average

Max

Page 85



Dir High ThresholdTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 2.75 2.75Min Limit 0.9 0.9

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 1.712 1.728 -0.016 -0.93% 0.86%30 34 1.696 1.704 -0.008 -0.47% 0.43%30 38 1.704 1.712 -0.008 -0.47% 0.43%30 312 1.704 1.728 -0.024 -1.41% 1.30%30 313 1.704 1.712 -0.008 -0.47% 0.43%30 315 1.704 1.712 -0.008 -0.47% 0.43%30 316 1.704 1.712 -0.008 -0.47% 0.43%30 317 1.712 1.712 0.000 0.00% 0.00%30 321 1.704 1.712 -0.008 -0.47% 0.43%30 325 1.696 1.712 -0.016 -0.94% 0.86%40 43 1.712 1.728 -0.016 -0.93% 0.86% Dir High Threshold40 44 1.696 1.704 -0.008 -0.47% 0.43% Test Site SBDL40 48 1.704 1.712 -0.008 -0.47% 0.43% Tester ETS36440 412 1.704 1.728 -0.024 -1.41% 1.30% Test Number EF357940 413 1.704 1.712 -0.008 -0.47% 0.43% Max Limit 2.75 V40 415 1.704 1.712 -0.008 -0.47% 0.43% Min Limit 0.9 V40 416 1.704 1.712 -0.008 -0.47% 0.43% Krad(Si) 0 30 40 5040 417 1.712 1.712 0.000 0.00% 0.00% LL 0.900 0.900 0.900 0.90040 421 1.704 1.720 -0.016 -0.94% 0.86% Min 1.712 1.704 1.704 1.69640 425 1.696 1.720 -0.024 -1.42% 1.30% Average 1.712 1.714 1.716 1.71450 53 1.712 1.720 -0.008 -0.47% 0.43% Max 1.712 1.728 1.728 1.72850 54 1.696 1.696 0.000 0.00% 0.00% UL 2.750 2.750 2.750 2.75050 58 1.704 1.712 -0.008 -0.47% 0.43%

R² = 0.0001

-0.030

-0.025

-0.020

-0.015

-0.010

-0.005

0.000

0 25 50 75

De

lta (

V)

Krad(Si)

Dir High Threshold

Dir High Threshold

50 512 1.704 1.728 -0.024 -1.41% 1.30%50 513 1.704 1.712 -0.008 -0.47% 0.43%50 515 1.704 1.712 -0.008 -0.47% 0.43%50 516 1.704 1.712 -0.008 -0.47% 0.43%50 517 1.712 1.712 0.000 0.00% 0.00%50 521 1.704 1.720 -0.016 -0.94% 0.86%50 525 1.696 1.712 -0.016 -0.94% 0.86%0 29 1.704 1.712 -0.008 -0.47% 0.43%

Max 1.712 1.728 0.000 0.00% 1.30%Average 1.704 1.715 -0.011 -0.62% 0.57%

Min 1.696 1.696 -0.024 -1.42% 0.00%Std Dev 0.005 0.008 0.007 0.41% 0.38%

0.000

0.500

1.000

1.500

2.000

2.500

3.000

3.500

0 30 40 50

V

Krad(Si)

Pass Range

Fail Range

Min

Average

Max

Page 86



Dir HystersisTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit V VMax Limit 0.8 0.8Min Limit 0.55 0.55

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 0.696 0.688 0.008 1.15% 3.20%30 34 0.688 0.680 0.008 1.16% 3.20%30 38 0.688 0.680 0.008 1.16% 3.20%30 312 0.696 0.688 0.008 1.15% 3.20%30 313 0.688 0.672 0.016 2.33% 6.40%30 315 0.696 0.680 0.016 2.30% 6.40%30 316 0.696 0.680 0.016 2.30% 6.40%30 317 0.696 0.680 0.016 2.30% 6.40%30 321 0.688 0.680 0.008 1.16% 3.20%30 325 0.688 0.680 0.008 1.16% 3.20%40 43 0.696 0.680 0.016 2.30% 6.40% Dir Hystersis40 44 0.688 0.672 0.016 2.33% 6.40% Test Site SBDL40 48 0.688 0.672 0.016 2.33% 6.40% Tester ETS36440 412 0.696 0.680 0.016 2.30% 6.40% Test Number EF357940 413 0.688 0.672 0.016 2.33% 6.40% Max Limit 0.8 V40 415 0.696 0.680 0.016 2.30% 6.40% Min Limit 0.55 V40 416 0.696 0.672 0.024 3.45% 9.60% Krad(Si) 0 30 40 5040 417 0.696 0.672 0.024 3.45% 9.60% LL 0.550 0.550 0.550 0.55040 421 0.688 0.680 0.008 1.16% 3.20% Min 0.696 0.672 0.672 0.66440 425 0.688 0.680 0.008 1.16% 3.20% Average 0.696 0.681 0.676 0.67150 53 0.696 0.672 0.024 3.45% 9.60% Max 0.696 0.688 0.680 0.68050 54 0.688 0.664 0.024 3.49% 9.60% UL 0.800 0.800 0.800 0.80050 58 0.688 0.672 0.016 2.33% 6.40%

R² = 0.5528

-0.005

0.000

0.005

0.010

0.015

0.020

0.025

0.030

0 25 50 75

De

lta (

V)

Krad(Si)

Dir Hystersis

Dir Hystersis

50 512 0.696 0.680 0.016 2.30% 6.40%50 513 0.688 0.664 0.024 3.49% 9.60%50 515 0.696 0.672 0.024 3.45% 9.60%50 516 0.696 0.672 0.024 3.45% 9.60%50 517 0.696 0.672 0.024 3.45% 9.60%50 521 0.688 0.672 0.016 2.33% 6.40%50 525 0.688 0.672 0.016 2.33% 6.40%0 29 0.696 0.696 0.000 0.00% 0.00%

Max 0.696 0.696 0.024 3.49% 9.60%Average 0.692 0.677 0.015 2.24% 6.19%

Min 0.688 0.664 0.000 0.00% 0.00%Std Dev 0.004 0.007 0.007 0.94% 2.60%

0.000

0.100

0.200

0.300

0.400

0.500

0.600

0.700

0.800

0.900

0 30 40 50

V

Krad(Si)

Pass Range

Fail Range

Min

Average

Max

Page 87



Oscillator Leakage Current @ 1.8VTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit uA uAMax Limit 4 4Min Limit -0.4 -0.4

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 0.761 1.561 -0.800 -105.01% 18.17%30 34 0.887 1.520 -0.633 -71.38% 14.39%30 38 0.885 1.529 -0.644 -72.79% 14.64%30 312 0.810 1.554 -0.744 -91.78% 16.90%30 313 0.852 1.516 -0.664 -78.00% 15.10%30 315 0.847 1.420 -0.573 -67.58% 13.01%30 316 0.855 1.442 -0.587 -68.63% 13.34%30 317 0.991 1.432 -0.441 -44.49% 10.02%30 321 0.799 1.428 -0.629 -78.81% 14.30%30 325 0.700 1.416 -0.716 -102.29% 16.27%40 43 0.761 1.708 -0.947 -124.32% 21.51% Oscillator Leakage Current @ 1.8V40 44 0.887 1.666 -0.779 -87.84% 17.71% Test Site SBDL40 48 0.885 1.668 -0.783 -88.49% 17.80% Tester ETS36440 412 0.810 1.705 -0.895 -110.41% 20.33% Test Number EF357940 413 0.852 1.666 -0.814 -95.61% 18.51% Max Limit 4 uA40 415 0.847 1.546 -0.699 -82.45% 15.88% Min Limit -0.4 uA40 416 0.855 1.561 -0.706 -82.54% 16.04% Krad(Si) 0 30 40 5040 417 0.991 1.556 -0.565 -57.00% 12.84% LL -0.400 -0.400 -0.400 -0.40040 421 0.799 1.545 -0.746 -93.46% 16.96% Min 0.970 1.416 1.537 1.57340 425 0.700 1.537 -0.837 -119.57% 19.02% Average 0.970 1.482 1.616 1.62950 53 0.761 1.694 -0.933 -122.48% 21.19% Max 0.970 1.561 1.708 1.71150 54 0.887 1.657 -0.770 -86.82% 17.50% UL 4.000 4.000 4.000 4.00050 58 0.885 1.668 -0.783 -88.49% 17.80%

R² = 0.533

-1.000

-0.900

-0.800

-0.700

-0.600

-0.500

-0.400

-0.300

-0.200

-0.100

0.000

0 25 50 75

De

lta (

uA

)

Krad(Si)

Oscillator Leakage Current @ 1.8V

Oscillator Leakage Current @ 1.8V

50 512 0.810 1.711 -0.901 -111.15% 20.47%50 513 0.852 1.668 -0.816 -95.84% 18.55%50 515 0.847 1.579 -0.732 -86.34% 16.63%50 516 0.855 1.582 -0.727 -85.00% 16.52%50 517 0.991 1.579 -0.588 -59.32% 13.36%50 521 0.799 1.573 -0.774 -96.97% 17.60%50 525 0.700 1.576 -0.876 -125.14% 19.91%0 29 0.845 0.970 -0.125 -14.78% 2.84%

Max 0.991 1.711 -0.125 -14.78% 21.51%Average 0.839 1.556 -0.717 -86.93% 16.29%

Min 0.700 0.970 -0.947 -125.14% 2.84%Std Dev 0.075 0.141 0.161 23.96% 3.66%

-1.000

0.000

1.000

2.000

3.000

4.000

5.000

0 30 40 50

uA

Krad(Si)

Pass Range

Fail Range

Min

Average

Max

Page 88



Oscillator Frequency PDA @ RT=20K CT=2nFTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit KHz KHzMax Limit 69.5 69.5Min Limit 39.5 39.5

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 46.514 66.248 -19.734 -42.43% 65.78%30 34 47.280 61.861 -14.581 -30.84% 48.60%30 38 47.187 61.414 -14.227 -30.15% 47.42%30 312 46.902 63.758 -16.856 -35.94% 56.19%30 313 47.125 62.533 -15.408 -32.70% 51.36%30 315 46.761 62.000 -15.239 -32.59% 50.80%30 316 47.439 64.467 -17.028 -35.89% 56.76%30 317 47.252 61.680 -14.428 -30.53% 48.09%30 321 46.211 61.605 -15.394 -33.31% 51.31%30 325 45.891 61.686 -15.795 -34.42% 52.65%40 43 46.514 64.881 -18.367 -39.49% 61.22% Oscillator Frequency PDA @ RT=20K CT=2nF40 44 47.280 60.445 -13.165 -27.84% 43.88% Test Site SBDL40 48 47.187 59.991 -12.804 -27.14% 42.68% Tester ETS36440 412 46.902 62.336 -15.434 -32.91% 51.45% Test Number EF357940 413 47.125 61.243 -14.118 -29.96% 47.06% Max Limit 69.5 KHz40 415 46.761 60.975 -14.214 -30.40% 47.38% Min Limit 39.5 KHz40 416 47.439 63.351 -15.912 -33.54% 53.04% Krad(Si) 0 30 40 5040 417 47.252 60.567 -13.315 -28.18% 44.38% LL 39.500 39.500 39.500 39.50040 421 46.211 60.523 -14.312 -30.97% 47.71% Min 46.104 61.414 59.991 57.99940 425 45.891 60.654 -14.763 -32.17% 49.21% Average 46.104 62.725 61.497 59.94150 53 46.514 62.583 -16.069 -34.55% 53.56% Max 46.104 66.248 64.881 62.58350 54 47.280 58.350 -11.069 -23.41% 36.90% UL 69.500 69.500 69.500 69.50050 58 47.187 57.999 -10.812 -22.91% 36.04%

R² = 0.084

-25.000

-20.000

-15.000

-10.000

-5.000

0.000

5.000

0 25 50 75

De

lta (

KH

z)

Krad(Si)

Oscillator Frequency PDA @ RT=20K CT=2nF

Oscillator Frequency PDA @ RT=20K CT=2nF

50 512 46.902 60.355 -13.453 -28.68% 44.84%50 513 47.125 59.416 -12.291 -26.08% 40.97%50 515 46.761 59.973 -13.212 -28.25% 44.04%50 516 47.439 62.169 -14.730 -31.05% 49.10%50 517 47.252 59.506 -12.254 -25.93% 40.85%50 521 46.211 59.418 -13.207 -28.58% 44.02%50 525 45.891 59.645 -13.754 -29.97% 45.85%0 29 46.989 46.104 0.885 1.88% 2.95%

Max 47.439 66.248 0.885 1.88% 65.78%Average 46.861 60.895 -14.034 -29.97% 46.97%

Min 45.891 46.104 -19.734 -42.43% 2.95%Std Dev 0.484 3.312 3.368 7.24% 10.37%

0.000

10.000

20.000

30.000

40.000

50.000

60.000

70.000

80.000

0 30 40 50

KH

z

Krad(Si)

Pass Range

Fail Range

Min

Average

Max

Page 89



Oscillator Frequency PDB @ RT=20K CT=2nFTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit KHz KHzMax Limit 69.5 69.5Min Limit 39.5 39.5

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 46.526 66.235 -19.709 -42.36% 65.70%30 34 47.286 61.891 -14.605 -30.89% 48.68%30 38 47.161 61.397 -14.236 -30.19% 47.45%30 312 46.911 63.751 -16.840 -35.90% 56.13%30 313 47.123 62.555 -15.432 -32.75% 51.44%30 315 46.758 61.971 -15.213 -32.53% 50.71%30 316 47.444 64.462 -17.018 -35.87% 56.73%30 317 47.260 61.676 -14.416 -30.50% 48.05%30 321 46.197 61.647 -15.450 -33.44% 51.50%30 325 45.912 61.724 -15.812 -34.44% 52.71%40 43 46.526 64.880 -18.354 -39.45% 61.18% Oscillator Frequency PDB @ RT=20K CT=2nF40 44 47.286 60.467 -13.181 -27.88% 43.94% Test Site SBDL40 48 47.161 60.015 -12.854 -27.25% 42.85% Tester ETS36440 412 46.911 62.338 -15.427 -32.88% 51.42% Test Number EF357940 413 47.123 61.249 -14.126 -29.98% 47.09% Max Limit 69.5 KHz40 415 46.758 60.989 -14.231 -30.43% 47.44% Min Limit 39.5 KHz40 416 47.444 63.351 -15.907 -33.53% 53.02% Krad(Si) 0 30 40 5040 417 47.260 60.597 -13.337 -28.22% 44.46% LL 39.500 39.500 39.500 39.50040 421 46.197 60.532 -14.335 -31.03% 47.78% Min 46.101 61.397 60.015 58.04040 425 45.912 60.667 -14.755 -32.14% 49.18% Average 46.101 62.731 61.509 59.95050 53 46.526 62.580 -16.054 -34.51% 53.51% Max 46.101 66.235 64.880 62.58050 54 47.286 58.316 -11.030 -23.33% 36.77% UL 69.500 69.500 69.500 69.50050 58 47.161 58.040 -10.879 -23.07% 36.26%

R² = 0.0846

-25.000

-20.000

-15.000

-10.000

-5.000

0.000

5.000

0 25 50 75

De

lta (

KH

z)

Krad(Si)

Oscillator Frequency PDB @ RT=20K CT=2nF

Oscillator Frequency PDB @ RT=20K CT=2nF

50 512 46.911 60.382 -13.471 -28.72% 44.90%50 513 47.123 59.407 -12.284 -26.07% 40.95%50 515 46.758 59.985 -13.227 -28.29% 44.09%50 516 47.444 62.175 -14.731 -31.05% 49.10%50 517 47.260 59.523 -12.263 -25.95% 40.88%50 521 46.197 59.457 -13.260 -28.70% 44.20%50 525 45.912 59.638 -13.726 -29.90% 45.75%0 29 46.994 46.101 0.893 1.90% 2.98%

Max 47.444 66.235 0.893 1.90% 65.70%Average 46.862 60.903 -14.041 -29.98% 46.99%

Min 45.912 46.101 -19.709 -42.36% 2.98%Std Dev 0.481 3.310 3.365 7.23% 10.35%

0.000

10.000

20.000

30.000

40.000

50.000

60.000

70.000

80.000

0 30 40 50

KH

z

Krad(Si)

Pass Range

Fail Range

Min

Average

Max

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Oscillator Frequency PDC @ RT=20K CT=2nFTest Site SBDL SBDLTester ETS364 ETS364Test Number EF3579 EF3579Unit KHz KHzMax Limit 69.5 69.5Min Limit 39.5 39.5

Krad(Si) Serial # Pre ELDRS Post ELDRS Delta Delta % % of Limit Range30 33 46.536 66.281 -19.745 -42.43% 65.82%30 34 47.279 61.888 -14.609 -30.90% 48.70%30 38 47.185 61.389 -14.204 -30.10% 47.35%30 312 46.897 63.762 -16.865 -35.96% 56.22%30 313 47.128 62.561 -15.433 -32.75% 51.44%30 315 46.758 61.994 -15.236 -32.59% 50.79%30 316 47.443 64.461 -17.018 -35.87% 56.73%30 317 47.263 61.660 -14.397 -30.46% 47.99%30 321 46.201 61.648 -15.447 -33.44% 51.49%30 325 45.903 61.700 -15.797 -34.41% 52.66%40 43 46.536 64.895 -18.359 -39.45% 61.20% Oscillator Frequency PDC @ RT=20K CT=2nF40 44 47.279 60.470 -13.191 -27.90% 43.97% Test Site SBDL40 48 47.185 60.012 -12.827 -27.18% 42.76% Tester ETS36440 412 46.897 62.337 -15.440 -32.92% 51.47% Test Number EF357940 413 47.128 61.248 -14.120 -29.96% 47.07% Max Limit 69.5 KHz40 415 46.758 60.994 -14.236 -30.45% 47.45% Min Limit 39.5 KHz40 416 47.443 63.349 -15.906 -33.53% 53.02% Krad(Si) 0 30 40 5040 417 47.263 60.592 -13.329 -28.20% 44.43% LL 39.500 39.500 39.500 39.50040 421 46.201 60.552 -14.351 -31.06% 47.84% Min 46.092 61.389 60.012 58.05040 425 45.903 60.683 -14.780 -32.20% 49.27% Average 46.092 62.734 61.513 59.95450 53 46.536 62.580 -16.044 -34.48% 53.48% Max 46.092 66.281 64.895 62.58050 54 47.279 58.369 -11.090 -23.46% 36.97% UL 69.500 69.500 69.500 69.50050 58 47.185 58.050 -10.865 -23.03% 36.22%

R² = 0.0847

-25.000

-20.000

-15.000

-10.000

-5.000

0.000

5.000

0 25 50 75

De

lta (

KH

z)

Krad(Si)

Oscillator Frequency PDC @ RT=20K CT=2nF

Oscillator Frequency PDC @ RT=20K CT=2nF

50 512 46.897 60.385 -13.488 -28.76% 44.96%50 513 47.128 59.448 -12.320 -26.14% 41.07%50 515 46.758 59.996 -13.238 -28.31% 44.13%50 516 47.443 62.179 -14.736 -31.06% 49.12%50 517 47.263 59.498 -12.235 -25.89% 40.78%50 521 46.201 59.509 -13.308 -28.81% 44.36%50 525 45.903 59.526 -13.623 -29.68% 45.41%0 29 46.991 46.092 0.899 1.91% 3.00%

Max 47.443 66.281 0.899 1.91% 65.82%Average 46.864 60.907 -14.043 -29.98% 47.00%

Min 45.903 46.092 -19.745 -42.43% 3.00%Std Dev 0.483 3.314 3.367 7.24% 10.36%

0.000

10.000

20.000

30.000

40.000

50.000

60.000

70.000

80.000

0 30 40 50

KH

z

Krad(Si)

Pass Range

Fail Range

Min

Average

Max

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Documents

UC1625-SP Radiation Report - Texas Instruments€¦ · · 2011-11-08Drift Report 30,40,50krad ELDRS Report UC1625-SP Supply_VCC_20V Test Site SBDL SBDL Tester ETS364 ETS364 Test