18
www.cst.com | CST workshop series 2010 | February 10 | 1 Virtual ESD Testing

Virtual ESD Testing - Computer Simulation Technology · Virtual ESD Testing. ... precautions to prevent any ESD damage, ... CST Innovations Workshop Series PPT Template Author: AndreasBarchanski

  • Upload
    phamthu

  • View
    217

  • Download
    2

Embed Size (px)

Citation preview

www.cst.com | CST workshop series 2010 | February 10 | 1

Virtual ESD Testing

www.cst.com | CST workshop series 2010 | February 10 | 2

Introduction to ESD

Definition

Testing Standards and Scenarios

Reliability of Measurments

Properties and Interpretation of ESD Simulations

Example ESD Simulations

Modelling the Gun for ESD Simualtions

Virtual Testing on a Laptop

ESD Strike to an USB Jack

Agenda

www.cst.com | CST workshop series 2010 | February 10 | 3

Electrostatic discharge (ESD) is the sudden and

momentary electric current that flows between two

objects at different electrical potentials caused by

direct contact or induced by an electrostatic field.

ESD Definition

www.cst.com | CST workshop series 2010 | February 10 | 4

ESD Damage

Catastrophic Failure

Burn Out

Breakdown of insulator

Latent Defect

Decrease of lifetime

Software Failure

www.cst.com | CST workshop series 2010 | February 10 | 5

Testing Standards The IEC61000-4-2 standard defines standard test conditions that electronic

equipment should withstand. It assumes that the user will take no

precautions to prevent any ESD damage, and it defines a variety of levels

that the equipment should withstand.

The typical curve for an electrostatic discharge defined by IEC61000-4-2 has

a rise time of about 1 ns and a peak current level of around 30A.

www.cst.com | CST workshop series 2010 | February 10 | 6

Failure levels are defined by means of the max. current

Level Nominal

Voltage

[kV]

Peak Voltage

Current of Discharge

10%

[A]

Rise Time tr

With discharge switch

Current( 30%)

At 30ns At 60ns

[A] [A]

1 2 7.5 0.7 to 1 4 2

2 4 15 0.7 to 1 9 4

3 6 22.5 0.7 to 1 12 6

4 8 30 0.7 to 1 16 8

Testing Standards

www.cst.com | CST workshop series 2010 | February 10 | 8

Even for guns obeying the IEC standard, failure levels for the

same device may vary from gun to gun !

Reliability of Measurments

„Correlation Between EUT Failure Levels and ESD Generator Parameters“, Jayong Koo et. al.

IEEE Trans Elect. Comp. Vol. 50 No.4, Nov 2008

www.cst.com | CST workshop series 2010 | February 10 | 9

Reliability of Measurments

Even for the same gun, the orientation of the gun has a strong impact

„Correlation Between EUT Failure Levels and ESD Generator Parameters“, Jayong Koo et.

al. IEEE Trans Elect. Comp. Vol. 50 No.4, Nov 2008

Not only the discharge current, but also

the field distribution is relevant!

www.cst.com | CST workshop series 2010 | February 10 | 10

ESD Simulations

CST MWS Transient Solver is the best choice:

ESD event exhibits transient characteristics

3D Simulation is necessary -> field coupling

Complete system: PCB + housing

True Transient Co-Simulation: 1 excitation port

including all lumped elements

GPU acceleration

www.cst.com | CST workshop series 2010 | February 10 | 11

Interpretation of Simulation Results

Look for large field values / large currents

Compare different positions

(w & w/o failure)

Check critical lines: CLK

www.cst.com | CST workshop series 2010 | February 10 | 12

ESD Simulation of a PCB

www.cst.com | CST workshop series 2010 | February 10 | 13

Surface Current on a PCB

www.cst.com | CST workshop series 2010 | February 10 | 14

Surface Current on a Mobile Phone

www.cst.com | CST workshop series 2010 | February 10 | 15

Surface Current on a Mobile Phone

High currents

at the antenna

www.cst.com | CST workshop series 2010 | February 10 | 16

Gun Models

„Numerical Prediction and Measurment of ESD Radiated Fields by Free-Space Field Sensors“ S.Caniggia, F. Maradei,

IEEE Trans Elec Comp. Vol 49 No.3, Aug 2007

www.cst.com | CST workshop series 2010 | February 10 | 17

Gun Models

„Full Wave Model for simulating a Noiseken

ESD Generator“, Dazhao Liu; Nandy, A.;

Pommerenke, D.; Soon Jae Kwon; Ki Hyuk

Kim; IEEE Symposium on Electromagnetic

Compatibility,17-21 Aug. 2009

www.cst.com | CST workshop series 2010 | February 10 | 18

Gun Valiation

www.cst.com | CST workshop series 2010 | February 10 | 19

Gun Validation

„Full Wave Model for simulating a Noiseken ESD Generator“, Dazhao Liu;

Nandy, A.; Pommerenke, D.; Soon Jae Kwon; Ki Hyuk Kim; IEEE Symposium

on Electromagnetic Compatibility,17-21 Aug. 2009

Discharge current

at gun tip

Induced voltage in

semi-circular loop