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Presented by Christian Poivey at the 2006 Single Event Effects Symposium (SEESYM), April 10, 2006 to April 12, 2006 in Long Beach, CA.
Single Event Transients in Low Voltage Dropout (LVDO) Voltage
Regulators
C. Poivey1, H. Kim1, C. Seidleck1, K. LaBel2J. Karsh2, S. Pursley2,I. Kleyner2, R. Katz2,
S. Pursley2
1 MEI Technologies2 NASA - GSFC
2Presented by Christian Poivey at the 2006 Single Event Effects Symposium (SEESYM), April 10, 2006 to April 12, 2006 in Long Beach, CA.
Outline
• Background• Summary of recent test results• Mitigation• Conclusion
3Presented by Christian Poivey at the 2006 Single Event Effects Symposium (SEESYM), April 10, 2006 to April 12, 2006 in Long Beach, CA.
Background
• Voltage regulators are sensitive to heavy ion induced Single Event Transients (SET)– SET amplitude is generally small (<1-2V) because of
large output capacitors used in typical applications
Vin
VoltageRegulator
Vout
GND
4Presented by Christian Poivey at the 2006 Single Event Effects Symposium (SEESYM), April 10, 2006 to April 12, 2006 in Long Beach, CA.
Background
• SET in voltage regulators are a concern for low voltage applications (< 5V)– Overvoltages may cause destructive conditions– Undervoltages may cause functional interrupts and electrical
latch-up conditions• SET in 1.5V voltage regulators are critical for FPGA
RTAXpower supply applications– DC core absolute max rating = 1.6V– 1.5V core supply voltage recommended operating conditions:
1.425V min, 1.575V max• Summary of results on test candidates for 1.5V voltage
regulators– RHLP4913, STM– MSK5900, MS Kennedy– Discrete design, Space Power Electronics
http://radhome.gsfc.nasa.gov
5Presented by Christian Poivey at the 2006 Single Event Effects Symposium (SEESYM), April 10, 2006 to April 12, 2006 in Long Beach, CA.
RHLP4913
1.00E-06
1.00E-05
1.00E-04
1.00E-03
1.00E-02
0.0 10.0 20.0 30.0 40.0 50.0 60.0 70.0 80.0
LET (MeVcm2/mg)
Cro
ss s
ectio
n (c
m2 /d
ev)
SN101, Vin=3.3V, Cout=10uF, Iload=1600mA
SN101, Vin=3.3V, Cout=10uF, Iload=560mA
SN101, Vin=3.3V, Cout=10uF, Iload=300mA
SN101, Vin=3.3V, Cout=10uF, Iload=110mA
SET sensitivity increases with load
6Presented by Christian Poivey at the 2006 Single Event Effects Symposium (SEESYM), April 10, 2006 to April 12, 2006 in Long Beach, CA.
RHLP4913, Typical SETs, Cout=10µµµµF
Run 21, RHFL4913, Cout=10uF, Iout=300 mA, LET=75MeVcm2/mg
0.8
1
1.2
1.4
1.6
1.8
2
0.00E+00 1.00E-06 2.00E-06 3.00E-06 4.00E-06 5.00E-06
Time (s)
Out
put V
olta
ge (V
)
Run65, RHFL4913, Cout=10uF, Iout=300mA, LET=8.6MeVcm2/mg
0.8
1
1.2
1.4
1.6
1.8
2
0.00E+00 1.00E-06 2.00E-06 3.00E-06 4.00E-06 5.00E-06
Time (s)
Out
put V
olta
ge (V
)
Run69, RHFL4913, Cout=10uF, Iout=1.6A, LET=8.6MeVcm2/mg
0.8
1
1.2
1.4
1.6
1.8
2
0.00E+00 1.00E-06 2.00E-06 3.00E-06 4.00E-06 5.00E-06
Time (s)
Out
put V
olta
ge (V
)
Run 25, RHLP4913, Cout = 10 uF, Iout=1.6A, LET = 75 MeVcm2/mg
0.6
0.8
1
1.2
1.4
1.6
1.8
2
0.00E+00 1.00E-06 2.00E-06 3.00E-06 4.00E-06 5.00E-06
Time (s)
Out
put V
olta
ge (V
)
Iout
LET
7Presented by Christian Poivey at the 2006 Single Event Effects Symposium (SEESYM), April 10, 2006 to April 12, 2006 in Long Beach, CA.
1.00E-08
1.00E-07
1.00E-06
1.00E-05
1.00E-04
1.00E-03
1.00E-02
0.0 10.0 20.0 30.0 40.0 50.0 60.0 70.0 80.0
LET (MeVcm2/mg)
SET
cros
s se
ctio
n (c
m2 /d
ev)
Vin=3.6V, Iload=100mAVin=3.3V, Iload= 100mAVin=3.3V, Iload=300mAVin=3.6V, Iload=300mAVin=3.6V, Iload=560mARHLP4913, 300mA load
MSK5900
0 event
SET sensitivitydecreases with load
8Presented by Christian Poivey at the 2006 Single Event Effects Symposium (SEESYM), April 10, 2006 to April 12, 2006 in Long Beach, CA.
MSK5900, Typical SETsCout = 44 µµµµF
MSK5900, Run 275, LET=53.1 MeVcm2/mg, Vin=3.6V, Iload=100 mA
1.3
1.35
1.4
1.45
1.5
1.55
1.6
1.65
1.7
1.75
0.00E+00 2.00E-06 4.00E-06 6.00E-06 8.00E-06 1.00E-05 1.20E-05 1.40E-05 1.60E-05 1.80E-05 2.00E-05
Time (s)
Out
put V
olta
ge (V
)
9Presented by Christian Poivey at the 2006 Single Event Effects Symposium (SEESYM), April 10, 2006 to April 12, 2006 in Long Beach, CA.
Mitigation, CoutDiscrete Design
Discrete Voltage Regulator
1.00E-07
1.00E-06
1.00E-05
1.00E-04
1.00E-03
0.0 10.0 20.0 30.0 40.0 50.0 60.0 70.0 80.0
Effective LET (MeVcm2/mg)
Xsec
tion
(cm
2 /dev
)
Vin=3.1V, Cout=800uF, Iout=10mAVin=3.3V, Cout=800uF, Iout=10mAVin=3.4V, Cout=800uF, Iout=10mAVin=3.6V, Cout=800uF, Iout=10mAVin=3.6V, Cout=800uF, Iout=50 mAVin=3.3V, Cout=800uF, Iout=100mAVin=3.6V, Cout=800uF, Iout=100mAVin=3.6V, Iout=100mA, December 05Vin=3.3V, Iout=100mA, December 05
240uF output capacitor
800uF output capacitor
10Presented by Christian Poivey at the 2006 Single Event Effects Symposium (SEESYM), April 10, 2006 to April 12, 2006 in Long Beach, CA.
Mitigation, Cout, Discrete DesignSET waveform
Run 51, Vin=3.6V, Iout=10mA, LET=75MeVcm2/mg
1.4
1.45
1.5
1.55
1.6
1.65
1.7
0.0E+00 2.0E-06 4.0E-06 6.0E-06 8.0E-06 1.0E-05 1.2E-05 1.4E-05 1.6E-05 1.8E-05 2.0E-0
Time (s)
Out
put V
olta
ge (V
)
Discrete Volage Regulator, run260, Vin=3.6V, Iout=100 mA, LET=75 MeVcm2/mg
1.4
1.45
1.5
1.55
1.6
1.65
1.7
0.0E+00 1.0E-05 2.0E-05 3.0E-05 4.0E-05 5.0E-05 6.0E-05 7.0E-05 8.0E-05 9.0E-05 1.0E-04
Time (s)
Out
put V
olta
ge (V
)
Cout=240µµµµF Cout=800µµµµF
11Presented by Christian Poivey at the 2006 Single Event Effects Symposium (SEESYM), April 10, 2006 to April 12, 2006 in Long Beach, CA.
Mitigation, CoutRHLP4913
1.00E-06
1.00E-05
1.00E-04
1.00E-03
1.00E-02
0.0 10.0 20.0 30.0 40.0 50.0 60.0 70.0 80.0
LET (MeVcm2/mg)
Cro
ss s
ectio
n (c
m2 /d
ev)
SN101, Vin=3.3V, Cout=10uF, Iload=1600mA
SN101, Vin=3.3V, Cout=660uF, Iload=1600mA
12Presented by Christian Poivey at the 2006 Single Event Effects Symposium (SEESYM), April 10, 2006 to April 12, 2006 in Long Beach, CA.
Mitigation, Cout, RHLP4913, SET waveform
Run 6, RHLP4913, Cout=660 uF, Iout=300mA, LET=75 MeVcm2/mg
0.8
1
1.2
1.4
1.6
1.8
2
0.00E+00 1.00E-06 2.00E-06 3.00E-06 4.00E-06 5.00E-06
Time (s)
Out
put V
olta
ge (V
)
Run 9, RHFL4913, Cout=660uF, Iout=1.6A, LET=75 MeVcm2/mg
0.6
0.8
1
1.2
1.4
1.6
1.8
2
0.00E+00 1.00E-06 2.00E-06 3.00E-06 4.00E-06 5.00E-06
Time (s)
Out
put V
olta
ge (V
)
Run 21, RHFL4913, Cout=10uF, Iout=300 mA, LET=75MeVcm2/mg
0.8
1
1.2
1.4
1.6
1.8
2
0.00E+00 1.00E-06 2.00E-06 3.00E-06 4.00E-06 5.00E-06
Time (s)
Out
put V
olta
ge (V
)
Run 25, RHLP4913, Cout = 10 uF, Iout=1.6A, LET = 75 MeVcm2/mg
0.6
0.8
1
1.2
1.4
1.6
1.8
2
0.00E+00 1.00E-06 2.00E-06 3.00E-06 4.00E-06 5.00E-06
Time (s)
Out
put V
olta
ge (V
)
Cout=10µµµµF Cout=660µµµµF
13Presented by Christian Poivey at the 2006 Single Event Effects Symposium (SEESYM), April 10, 2006 to April 12, 2006 in Long Beach, CA.
Mitigation, RC filter
Vin Vout
Inh
IscNCGnd
Adj
Ocm NC
GND
Vin
NC10 µF 470 nF Cout
Vout
RemoteLoad
0.1 ohm
220µF
Vin Vout
Inh
IscNCGnd
Adj
Ocm NC
GND
Vin
NC10 µF 470 nF Cout
Vout
RemoteLoad
0.1 ohm
220µF
14Presented by Christian Poivey at the 2006 Single Event Effects Symposium (SEESYM), April 10, 2006 to April 12, 2006 in Long Beach, CA.
Mitigation, RC filter, RHLP4913
1.00E-06
1.00E-05
1.00E-04
1.00E-03
1.00E-02
0.0 10.0 20.0 30.0 40.0 50.0 60.0 70.0 80.0
LET (MeVcm2/mg)
Cro
ss s
ectio
n (c
m2 /d
ev)
SN101, Vin=3.3V, Cout=10uF, Iload=300mA
SN101, Vin=3.3V, Cout=660uF,Iload=300mA
SN101, Vin=3.3V, Cout=10uF, Iload=300mA, filter
15Presented by Christian Poivey at the 2006 Single Event Effects Symposium (SEESYM), April 10, 2006 to April 12, 2006 in Long Beach, CA.
Mitigation, RC filter, RHLP4913SET waveform
Run52, RHFL4913, Cout=10uF, Iout=300mA + Filter (0.1ohm, 200uF), LET = 53 MeVcm2/mg
0.8
1
1.2
1.4
1.6
1.8
2
0.00E+00 1.00E-06 2.00E-06 3.00E-06 4.00E-06 5.00E-06
Time (s)
Out
put V
olta
ge (V
)
Run 21, RHFL4913, Cout=10uF, Iout=300 mA, LET=75MeVcm2/mg
0.8
1
1.2
1.4
1.6
1.8
2
0.00E+00 1.00E-06 2.00E-06 3.00E-06 4.00E-06 5.00E-06
Time (s)
Out
put V
olta
ge (V
)
No filter With filter
16Presented by Christian Poivey at the 2006 Single Event Effects Symposium (SEESYM), April 10, 2006 to April 12, 2006 in Long Beach, CA.
Mitigation, RC filter, MSK5900MSK5900, Run 281, LET=75 MeVcm2/mg, Vin=3.6V, Iload=100 mA
1.4
1.45
1.5
1.55
1.6
1.65
1.7
1.75
0.00E+00 2.00E-06 4.00E-06 6.00E-06 8.00E-06 1.00E-05 1.20E-05 1.40E-05 1.60E-05 1.80E-05 2.00E-05
Time (s)
Out
put V
olta
ge (V
)
frame1 channel 1frame1 channel 3frame 4 channel 1frame4 channel 3frame 45 channel 1frame 45 channel 3
Before filter
After filter
17Presented by Christian Poivey at the 2006 Single Event Effects Symposium (SEESYM), April 10, 2006 to April 12, 2006 in Long Beach, CA.
Mitigation, LC filter, MSK5900
18Presented by Christian Poivey at the 2006 Single Event Effects Symposium (SEESYM), April 10, 2006 to April 12, 2006 in Long Beach, CA.
Mitigation, LC filter, MSK5900SET waveform
Run140, MSK5900, Vin=3.2V, Iout=500mA, LET=28.8MeVcm2/mg
1.35
1.4
1.45
1.5
1.55
1.6
1.65
1.7
0.0E+00 2.0E-06 4.0E-06 6.0E-06 8.0E-06 1.0E-05 1.2E-05 1.4E-05 1.6E-05 1.8E-05 2.0E-05
Time (s)
Out
put V
olta
ge (V
)
frame16frame16 channel3frame110frame110ch3
After filter
Beforefilter
19Presented by Christian Poivey at the 2006 Single Event Effects Symposium (SEESYM), April 10, 2006 to April 12, 2006 in Long Beach, CA.
Conclusion
• SET sensitivity changes significantly from type to type
• Worst case bias is different from type to type
• Filtering is not effective for short duration transients
