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Yibin Xu National Institute for Materials Science, Japan Thermal Conductivity of Amorphous Si and Ge Thin Films

Yibin Xu National Institute for Materials Science, Japan Thermal Conductivity of Amorphous Si and Ge Thin Films

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Page 1: Yibin Xu National Institute for Materials Science, Japan Thermal Conductivity of Amorphous Si and Ge Thin Films

Yibin Xu

National Institute for Materials Science, Japan

Thermal Conductivity of Amorphous Si and Ge Thin Films

Page 2: Yibin Xu National Institute for Materials Science, Japan Thermal Conductivity of Amorphous Si and Ge Thin Films

The transport forms of phonons has a great impact on the design of nanostructured thermoelectric materials with reduced thermal conductivity, as well as heat dissipation in electronic and photonic devices.

Thermoelectric devices Thermal management

Thermal management issue for thin film

Page 3: Yibin Xu National Institute for Materials Science, Japan Thermal Conductivity of Amorphous Si and Ge Thin Films

L

z, Cross-Plane

x, In-Plane

Diffuse Phonon Boundary Scattering

Phonon-Phonon ScatteringBallistic Phonon

Phonon transportation in thin film

scatteringboundary :

processes; Umklapp:

;scatteringimpurity :

time;relaxationphonon :

: ' 1111

B

U

imp

rulesnMatthiesse BUimp

),,,,()(

)()()(

:tyconductivi thermal2

,

TvrLfTk

dTvTCTk

imp

v

r

Phonon-Defect Scattering

Page 4: Yibin Xu National Institute for Materials Science, Japan Thermal Conductivity of Amorphous Si and Ge Thin Films

bulk

thin film

Temperature, T

The

rmal

con

duct

ivity

, l

Thickness, d

Features of thermal conductivity of thin film

The

rmal

con

duct

ivity

, l

Film thickness dependence can be observed when

How is amorphous thin film?• easily synthesized• extreme low thermal conductivity• little knowledge of phonon distribution, transportation, etc.

Page 5: Yibin Xu National Institute for Materials Science, Japan Thermal Conductivity of Amorphous Si and Ge Thin Films

[1] Einstein model[1]: heat conduction in amorphous solids is described by a random walk of thermal energy between neighboring atoms vibrating with random phases.

[2] Minimum thermal conductivity model[2]: the minimum thermal conductivity is reached when the distance between collisions of elastic waves equals the wavelength of Debye waves.

Fig. 1 Calculated minimum conductivity at 300 K versus the measured values for amorphous solids[3].

[1] A. Einstein, Ann. Phys. (Leipzig) 35, 679 (1911).

[2] G. A. Slack, in Solid State Physics: Advances in Research and Applications, edited by H. Ehrenreich et al. (Academic, New York, 1979), Vol. 34, p. 1.

[3] D. G. Cahill, S. K. Watson, and R.O. Pohl, Phys. Rev. B 46, 6131 (1992).

Classic models describing heat conduction in amorphous solids

Phonon mean free paths in amorphous solids are several nm.

Page 6: Yibin Xu National Institute for Materials Science, Japan Thermal Conductivity of Amorphous Si and Ge Thin Films

Existence of phonons with long mean free path predicted by MD simulation

Effective mean free paths of the vibrational modes of an a-Si in equilibrium MD simulations.

Y. P. He, D. Donadio, and G. Galli, Appl. Phys. Lett. 98, 144101 (2011).

Page 7: Yibin Xu National Institute for Materials Science, Japan Thermal Conductivity of Amorphous Si and Ge Thin Films

Purpose of research

Investigate the dependence of thermal conductivity of amorphous Si and Ge films on thickness and deposition conditions, and explore the nature of phonon propagating in amorphous solids.

Page 8: Yibin Xu National Institute for Materials Science, Japan Thermal Conductivity of Amorphous Si and Ge Thin Films

Magnetron sputtering

Deposition temperature

25 ℃ 300 ℃ 500 ℃ 600 ℃

Ge(Si) substrate (single crystal, 0.5 mm)

Si(Ge) thin film (15,100,250 nm)

Au sensing film (150 nm)

Deposition conditions

Synthesis of Si(Ge) thin films

Page 9: Yibin Xu National Institute for Materials Science, Japan Thermal Conductivity of Amorphous Si and Ge Thin Films

TEM image of Si and Ge thin film

Ge 300C Ge 25C

Si 600C

Page 10: Yibin Xu National Institute for Materials Science, Japan Thermal Conductivity of Amorphous Si and Ge Thin Films

2

,

1cosh

111)1(

1sinh)1(1

111)1(

1sinh11

1)0(

1

01

1122

1112

22

1111

011122

11

1211

12

22

11

22

1111

0122

1111

0

11

1111

j

jj

dki

dkidki

Ckwhere

dki

Rkikk

ekk

Rki

dkiRkikk

ekRiekk

kk

Rki

dkikk

Rki

Ci

qT

1

0

22

11

1

1

22

11

220

1

0

22

11

1

1

22

11

22

4

0

101

2

11

2

4cos

cos

2

11

2

)0(

1)(

d

C

Cd

C

CR

Cqd

T

d

C

Cd

C

CR

C

e

qd

T

ddkwhen

A

i

Ref

T

0

R. Kato, Y. Xu, et. al. ,   Jpn. J. Appl. Phys, 50, 106602 (2011)

Cross-plane thermal conductivity measurement (FDTR method)

Page 11: Yibin Xu National Institute for Materials Science, Japan Thermal Conductivity of Amorphous Si and Ge Thin Films

Thermal resistance of amorphous Si(Ge) films as a function of thickness and deposition temperature

Si

Ge

Page 12: Yibin Xu National Institute for Materials Science, Japan Thermal Conductivity of Amorphous Si and Ge Thin Films

Thermal conductivity of amorphous Si(Ge) film as a function of thickness and deposition temperature

Si

Ge

Page 13: Yibin Xu National Institute for Materials Science, Japan Thermal Conductivity of Amorphous Si and Ge Thin Films

FFT patterns of different area sizes in Ge films

10×10 nm

3×3 nm

2×2 nm

300 ºC25 ºC

Page 14: Yibin Xu National Institute for Materials Science, Japan Thermal Conductivity of Amorphous Si and Ge Thin Films

Conclusion

• Thermal conductivity of amorphous Si and Ge films shows thickness dependence. This result proves that long MFP (>100 nm) phonons exist in amorphous Si and Ge.

• Thermal conductivity of amorphous Si and Ge films shows dependent on deposition temperature. The nano-scaled structural order is supposed to be the responsible for it.