Transcript
Page 1: Brunel bio tem presentation june 2013

Brunel TEM Presentation

Some applications of TEM for Biological Applications

Neil Wilkinson Gatan UK

June 2013

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Introduction Basic TEM Imaging Specimen Prep. What is EELS, GIF, EFTEM, spectroscopy etc Electron Specimen Interaction GIF – The way it works EFTEM & Spectroscopy Infected Blood Cell data

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Specimen Prep Sectioning Particulates Dried samples Cryo Sectioning

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Image examples

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ORIUS 1000 CCD camera

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ES1000 Skeletal Muscle

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ORIUS SC1000B: HREM image of GaSb/InAs superlattice

Image courtesy of C.H. Lei and J.G. Wen at the Center for Microanalysis of

Materials (CMM) at the University of Illinois, Urbana-Champaign, USA

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Electron Diffraction

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Low Dose Cryo – special cameras

Low Dose cryo image (part of 4k image) GRO EL protein.

Special Low Dose Scintillator – High “conversion factor”

Low Dose software on microscope essential.

Typically 10 – 20 e/Å dose to avoid damage.

Ideal camera – high resolution & VERY large area.

1000’s of “particles” per image.

10k x 10k best available.

Price !!!!!!!!!!!!!!!!!

Filtered Image for best resolution and contrast – GIF Zero Loss Imaging.

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First CCD only reconstruction 14Å Subramanian et al Journ Struct Biol 143 (2003)135-144

CCD reconstruction now better than 5 Å

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Current best

resolution

Reconstruction

3.3Å

Special New

Camera

Cryo Prep

Exceeds X-Ray

Resolution

“Direct Detection”

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TEM AUTOMATION – using CCD.

• Focus

• Astigmatism correction

• Alignment

• Digital Montage

• Unattended Image capture – Automated - 10’s of thousands of images from Multiple samples.

• Tomography

• EELS, SFTEM, etc.

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TEM Tune - Example

Focus Stigmation Alignment

*

*

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TEM Automation - DigitalMontage

Unstained

liver sample

3 x 3 automated

MONTAGE

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TEM Automation - DigitalMontage

Montage of 9

Images

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EELS/EFTEM/STEM/STEM EELS SI

Electron Energy Loss Spectrometry – EELS

Gatan Image Filter – GIF

Energy Filtered TEM – EFTEM

Scanning Transmission Electron Microscopy – STEM

STEM EELS Spectrum Imaging – STEM EELS SI

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beam-specimen interactions and signals

Elastic scattering (Diffraction)

X rays (EDS)

Auger electrons

Backscattered electrons

Elastic & Inelastic scattering (EELS)

Secondary electrons

Thin TEM Specimen

+

e-

e-

e-

e-

e-

e-

e- e- e-

elastically scattered e-

in-elastically scattered e-

un-scattered

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The EELS Spectrum – Main feature – Zero Loss

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The EELS Spectrum – Main features – Zero Loss & Core Loss

Elastic Inelastic

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The EELS Spectrum – Main features and uses

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In-Column & Post Column Filters

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GIF – Imaging Mode

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Vertically dispersed spectrum formed near back focal plane of prism

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GIF – Imaging Mode

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Unfiltered TEM

Image mode

Unfiltered image projected onto CCD detector

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GIF – Imaging Mode

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Core-loss EFTEM

Image mode

Energy-selecting slit inserted

Core-loss image projected onto CCD detector

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GIF – Spectroscopy Mode

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Low-loss EELS

Spectrum mode EELS spectrum projected onto CCD

Final EELS readout

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GIF – Spectroscopy Mode

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Core-loss EELS

Spectrum mode

Spectrum offset via prism current or high tension

EELS spectrum projected onto CCD

Final EELS readout

O K edge

Mn L edge

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• EELS provides another dimension for generating image contrast

• EELS isolates elastic scattering for enhanced imaging

170 eV, contrast inverted Unfiltered bright-field TEM Loss image at 170 ± 15 eV

Contrast enhancement - inelastic only

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Most Probably Loss Imaging

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• Minimum of two background windows are necessary

• Map intensity is directly proportional to projected concentration

• Map-intensity can be related to

absolute concentration if thickness and elemental cross-sections are known

Elemental mapping – 3 Window or Jump Ratio

Determine and subtract edge background using two pre-edge images to obtain the

true edge signal

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EFTEM: 3-window mapping

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3

2 32

Pre edge 1 (485eV) Pre edge 2 (515eV) Post edge (542eV)

Elemental map Jump ratio image

Semiconductor

O-N-O layers

Oxygen Maps

EFTEM Elemental mapping vs. jump ratio imaging

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Benefits of resolving energy loss in ETEM - Imaging

• EELS can be used to identify and map elements and phases

3

3

Each 3 window EFTEM

map takes approx 20 – 30

seconds to collect.

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STEM spectrum image acquisition

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4

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Acquired by stepping a focused electron probe from one pixel to the next

EDX

STEM

EELS DF

Specimen

Spectrum image data cube is filled one spectrum column at a time

STEM allows collecting any combination of EELS, x-ray, and CL spectra simultaneously

DF or SE signal permits spatial drift correction during acquisition

x

y

E

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What is Spectrum Imaging?

• Collects detailed spatial and spectroscopy information • Allows processing decisions after acquisition

• Spectrum imaging can create quantitative images / profiles

• Can confidently locate artifacts & understand image contrast

x, y spatial dimensions

E energy-loss dimension

y

x

E

image at E1

image at E2

image at Ei

.

.

.

.

.

.

.

.

.

spectrum at xi , yi

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6

STEM/EELS Spectrum Image – “Data Cube”

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STEM/EELS Spectrum Imaging – extraction of maps

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Elemental maps extracted from STEM/EELS “Data Cube”

Si Al

Ti N

W SiO2

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Summary

• Very Well equipped TEM/STEM with many high end accessories

• Conventional TEM Imaging

• TEM Tomography

• STEM HAADF Imaging

• EFTEM – Energy Filtered Imaging

• EELS – Electron Energy Loss Spectroscopy

• STEM/ EELS – EELS Mapping

Any Questions ?