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Model Process Define 차별 경쟁 우위 Series HO2 GIass 가공 i— watch, 2. 5D) · 0.5unㄱ -10um, White. Pink · EVEN한 품질 유지 · 산포 적은 구성 (D50.90) · 'Jser 편이성의 (25Kg. PE Bucket) ㅕㅓ O1, FP '形 , W 3 ge Application Optical GIass, Le Optical GIass, Mob¡ Ie GIass 2. 0ㅕ --0. 4 Touch Panel

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  • Model

    Process

    Define

    Series

    HO2

    GIass iwatch, 2. 5D)

    0.5un-10um, White. Pink

    EVEN (D50.90)'Jser

    (25Kg. PE Bucket)

    O1,FP '

    ,

    W 3 ge

    Application

    Optical GIass, Lens

    Optical GIass,

    Mob Ie GIass

    2. 0--0. 4 Touch Panel

  • Define

    Series

    GA01 -1 2

    BIue F Ier GIass

    0.5, 0.8, 1.0, 1.2 seriesEVEN (D50.90)'Jser

    (25Kg. PE Bucket)

    GA 05

    GA-08

    GA- 1 0

    GA-1 2

    1.1

    1.5

    3. 2

    3. 8

  • Model

    Process

    Define

    Series

    G G-80

    C.G CelI Cutting, Hole

    1. Lock Ga1'net Cutting

    Cuttng 2. Low Dusting : 6 , 3 , 3 Filter3. Non toxic : no s icosis hazard, leachaUe heav y

    metals or radioactive contan inants.

    {typi :u )' uatlve 9 eainedu s /e /4 I'50n h !''; ',13 OOg 120 25 20 Og 65 O 13 0g $0 s 54 425 9 }$ 1S , 7 5 } 3009 S 2 o99 90 2129'80 130980 1 9911 12550 g6

    : :

    :, ;

    ':

    : :

  • Pocess

    Define

    Series

    GH-44P(B)

    Cover GIass

    1. Na Fnee, Na : 0 PPM

    2. Bead 3. Quality(G4) CS 750 Mpa

    DOL 72 uml,

    , 'ij : ':', '

    i ':

    ' : * .

    GH -44P GH -44B

  • Pocess

    Define

    Series

    G LJ04

    3D GIass ( Edge, iwatch, 2.5D)

    Scratch Crack , 1. , 1 WOek

    -) Even 2. WOt 3. Low Hardness , 6-84. CeO2

    CeO2

    Bod'y HEPU PI Silicon

    Handness 6-8 1 0-1 5 3-8

    Pad

  • G F-1 000

    Filtering Pocess

    Def ne

    Series

    Ftering Capacity

    3

    50L/min 10urn

    2

    25L/min 8um

    Scratch Crack , 1. Non Fter

    2. 8(10)unn Ra''ticle Rerfect filte''ing

    3. Maintenance .

    Descri pton 2 3

    Operating Pr'

    (P S I)30-40 40-45

    FIow late

    iter/min)1 9-38 57-95

    Filter ng Limit

    (urn)7-10 10-1 2

    Din ension

    (L* D)260*50 360*75

    | n/Outlet Size 1 2. 5/1 8. 25/37. 5

    Cyclone F lter, F lter

  • Define

    Series

    C.G CelI Cutting, Hole

    1. Filtering Chip, , .etc

    2. Tonk . 3. ouble 4. Scratch, Crack

    : Rotary :

  • Model

    Pocess

    Define

    Series

    GINZ-05(1 27)

    Woterjpt GIass Cut ( ie, R, Pienc ng)

    1. Spot 2. Longer Life time

    3. 0.5-1.27 full series

    OD DL mP'ch mHD,nch mmL ,nchm' 'nch rnm 'nch mm 'nch

    9

  • GSTP-820

    Pocess Wter jet Cutting & Stripping

    Define

    Stripped

    Pictu e

    1. 1.5-2.5mm, Jig 2. Gell 3. Amine 1.5% under

    4. .Bubble

    GSTP-820

    .

    1 0

  • Define

    Series

    GC-1 00A

    PoIish ng Cerium

    .

    1. 40 nde'' GIass Peeling 2. CeO2 3. Micro CIass 4. SUS, PVC, P /A, Nylon , 5. No need UItrasonic

    6. ,

    GC-1 00C

    GC-1 00A

    4. 5

    5. 3

    1 1

  • G PSR4

    PoIishing Cerium

    GIass Polishing Cerium . Coating

    1.

    2. .

    : SS, PVC, Paint

    Coating

    Effects

    GPSR -4

  • Define

    GHC-1 0

    KNo3 Na

    Na .

    1. Gl=S 2. Na , 168hi' I (1 ' 'eek)3. Particle Zeno4. : A1'm n 2% under

    :- :-:

    1 3

  • Process

    Define

    C R-1 00

    LCD.TSP ACF Bond ng rework

    At N.G COG/FOG/PCB Bonding, Thermal cured

    resin should be clean without remain ng.

    Rernain sludge! lt will be make 2nd trouble

    1. COG/FOG/PCB all available

    2. AII ACF ava lable

    Dexerial( Sony). TACI . H&S3.

    2r'nin under

    4. No hazad cornponents

    MEK.NMP etc.

    CF Rernover

  • GC-50/90

    Process LCM+TSP(CG), CG+Senor Rework

    Harden G'ass

    Define

    Series

    OCR. OCA availableUrethane, Silicon Son'y. Henkel. Kyoritsu / MT V. A. LH No hazand components

    GC-50 U ethane GC-90 Silicon

    ,: :, ,

    '