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The top documents tagged [defective layer]
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TEST & MEASUREMENT DIVISION PC_F_ CA 6545/47 - 1 Personal et confidential Megohmmeters 5kV C.A 6545 / C.A 6547 SALES PRODUCT INFORMATION Electrical testing
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Ion Beam Induced Exfoliation of Silicon Structures J.W. Mayer, T.L. Alford, Arizona State Univ.; S.S. Lau, UC-San Diego DMR-0308127 Fig.1 A sketch of the
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Development of Particle Detectors on the Base of Minsk Synthetic Monocrystalline Diamond
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