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The top documents tagged [i d v d characteristics]
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6.1 Transistor Operation 6.2 The Junction FET 6.3 The Metal-Semiconductor FET 6.4 The Metal-Insulator-Semiconductor FET 6.5 The MOS Field-Effect Transistor
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IWCE 10 Purdue University October 24-27 2004 Intrinsic Parameter Fluctuations in Conventional MOSFETs at the scaling Limit: A Statistical Study *F. Adamu-Lema,
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