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The top documents tagged [ieee vlsi test symposium]
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Externally Tested Scan Circuit with Built-In Activity Monitor and Adaptive Test Clock Priyadharshini Shanmugasundaram
[email protected]
Vishwani D. Agrawal
221 views
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JAAF+T: A Framework to Implement Self- Adaptive Agents that Apply Self-Test Andrew Diniz da Costa
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225 views
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Externally Tested Scan Circuit with Built-In Activity Monitor and Adaptive Test Clock
68 views