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The top documents tagged [impact of process variations]
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DRAFT - NOT FOR PUBLICATION 14 July 2004 – ITRS Summer Conference Modeling and Simulation ITWG Jürgen Lorenz - Fraunhofer-IISB ITWG/TWG Members H. Jaouen,
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2 December 2003 – ITRS Public Conference Hsin Chu, Taiwan Modeling and Simulation ITWG Jürgen Lorenz - Fraunhofer-IISB ITWG/TWG Members H. Jaouen, STM
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DRAFT – Work In Progress - NOT FOR PUBLICATION 13 July 2005 Modeling and Simulation ITWG Jürgen Lorenz – Fraunhofer IISB – chairperson M&S ITWG ITWG Members
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ITRS Winter Conference 2006 The Ambassador Hotel Hsin Chu Taiwan 1 Modeling and Simulation ITWG Jürgen Lorenz – Fraunhofer IISB – chairperson M&S ITWG
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Estimation and Compensation of Process Induced Variations in Nanoscale Tunnel Field Effect Transistors (TFETs) for Improved Reliability
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EE141 © Digital Integrated Circuits 2nd Inverter 1 Digital Integrated Circuits A Design Perspective The Inverter Jan M. Rabaey Anantha Chandrakasan Borivoje
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Benton H. Calhoun Jan M. Rabaey Low Power Design Essentials ©2008 Chapter 9 Optimizing Power @ Standby Memory
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MODERN 2010 Review ENIAC-120003 MODERN Ref. Technical Annex MODERN_PartB Rev2 v3.3 Review period: m13 : m22 (2010-03-01 : 2010-12-31) WP1: Giuliana GangemiWP2:
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Project Review Meeting Catania, Nov.09-10, 2010 15/09/2015 1 MODERN ENIAC WP2 Meeting WP2 Tasks review summary Catania, 2010 Nov. 09-10
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MODERN Final Review ENIAC-120003 MODERN Ref. Technical Annex MODERN_PartB Rev2 v3.7
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Outline
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MODERN ENIAC WP2 Meeting
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