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The top documents tagged [siliconoxide interface]
Technology
Effect of mesh grid structure in reducing hot carrier effect of nmos device simulation
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IRPS Slides_KAJ4
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Comprehensive Radiation Damage Modeling of Silicon Detectors
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Trento, Feb.28, 2005 Workshop on p-type detectors 1 Comprehensive Radiation Damage Modeling of Silicon Detectors Petasecca M. 1,3, Moscatelli F. 1,2,3,
221 views