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More on our XRF and XRD solutions: http://bit.ly/1pZ3zBo A useful way to compare similar samples or to follow a trend through a series of samples is to use the Stack Screen, which allows you to view all of your diffraction patterns together. To better represent a series of data, you can set the patterns in a Waterfall Plot. Sign up for our Newsletter: http://bit.ly/1sQqOyj
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Comparing Data with a Waterfall Plot
A Waterfall Plot can be used to: • View all your diffraction patterns together • Compare similar samples • Follow trends through a series of data
1. Open multiple diffraction patterns • Left click on the first and last file while holding the shift key and then
press the open button
2. Stack the plots • Once all the files have loaded, click the Stack button
3. Create a Waterfall Plot • Use the box in the lower center of the screen to adjust the depth and
angle of the waterfall plot by clicking in the blue field • Clicking to the left or right of center will angle the patterns so you
can inspect each pattern for similar peaks
4. Additional graphic options • The box in the lower right hand corner provides additional tools to
rescale or shadow the area under the patterns for a different visual affect
5. Save the file • Once you have the desired plot, click File, Save Graphic
For more information: http://www.olympus-ims.com/en/innovx-xrf-xrd/
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