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Introduction to EMI/EMC Challenges and Their Solution Dr. Hany Fahmy HSD Application Expert Agilent Technologies Davy Pissort, K.U. Leuven Charles Jackson, Nvidia Charlie Shu, Nvidia Chen Wang, Nvidia Amolak Badesha, Avago Copyright © 2012 Agilent Technologies

Introduction to emi hf feb_16_10am

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Page 1: Introduction to emi hf feb_16_10am

Introduction to

EMI/EMC Challenges

and Their Solution Dr. Hany Fahmy

HSD Application Expert

Agilent Technologies

Davy Pissort, K.U. Leuven

Charles Jackson, Nvidia

Charlie Shu, Nvidia

Chen Wang, Nvidia

Amolak Badesha, Avago

Copyright © 2012 Agilent Technologies

Page 2: Introduction to emi hf feb_16_10am

Current Solution

Put on a bandaid to stop the Bleeding

(radiation..)

•Not optimal

•Does not always work

•Costly

R4N Suppressor

band-aidCopper

band-aid

Copyright © 2012 Agilent Technologies

Page 3: Introduction to emi hf feb_16_10am

Complexity of EMI problem

I/Os can inject Common-mode Noise Or

Power-pins inject Noise into PDN

Badly routed traces generate EMI

High-speed connectors and cables amplify the EMI problems

Connectors

High-speed

PCB

High-speed

IC

M I N I M I Z E I C , P K G ,

A N D P C B E M I T O

R E D U C E O V E R A L L

S Y S T E M E M I

* From EM-Scan Measurement of GPU Board

Copyright © 2012 Agilent Technologies

Page 4: Introduction to emi hf feb_16_10am

Mechanism of Noise Propagation

Noise Source

Equipment or

device

exposed to

noise

(1) Conductive Noise

(2) Radiation Noise

Noise Source

Equipment or

device

exposed to

noise

(3)

Conductive

Noise

Noise Source

Equipment or

device

exposed to

noise

Conductive

Noise

Copyright © 2012 Agilent Technologies

Page 5: Introduction to emi hf feb_16_10am

Different types of Emission

Copyright © 2012 Agilent Technologies

I/O-Buffers Injecting

Signal

Trace-EmissionGND Return-currents & Slots

Power-Pins Injecting

Noise

Common-Mode noise travelling

through Connectors

Page 6: Introduction to emi hf feb_16_10am

Introducing the concept of “Virtual-EMI Lab”

O P T I M I Z E F O R E M I

D E V E L O P E M I

G U I D E L I N E S

V A L I D A T I O N W I T H

M E A S U R E M E N T S

**Measurements to Isolate the problem

and Correlate with Simulation*Full-wave EM Simulation,

What-if Analysis, Root-cause debugging

Copyright © 2012 Agilent Technologies

Page 7: Introduction to emi hf feb_16_10am

Radiated-emission on packages due to

return-path-discontinuity

Copyright © 2012 Agilent Technologies

Page 8: Introduction to emi hf feb_16_10am

DDR3 Package Modeling using MOM DC to 20GHz

Data- (DQ-) nets major referencing to GND

Copyright © 2012 Agilent Technologies

Page 9: Introduction to emi hf feb_16_10am

Routing of DQ signals from Die-Bumps-Top to

Layer-3 running as Symmetric-SL sandwiched

between GND on Layers 2 & 4

DQ signals @ Die-BumpsDQ signals on Layer-3 as Symmetric-SL

Copyright © 2012 Agilent Technologies

Page 10: Introduction to emi hf feb_16_10am

Moving from Layer-3 to Layer-6 through Signal-

PTH to pickup the Balls

DQ signals on Layer-3

DQ signals on Layer-6 routed

between GND on layers 5

Copyright © 2012 Agilent Technologies

Page 11: Introduction to emi hf feb_16_10am

Impact of GND-PTH stitching: Proximity & #

Original-Package:

With 15-GND-PTH

Cost-Reduced-Package:

with 3-GND-PTH

Copyright © 2012 Agilent Technologies

Page 12: Introduction to emi hf feb_16_10am

Comparison of Return-current on GND-L4

Copyright © 2012 Agilent Technologies

Original-Package:

With 15-GND-PTH

Cost-Reduced-Package:

With 3-GND-PTH

Larger NEXT by 10dB

Page 13: Introduction to emi hf feb_16_10am

Comparison of eye-diagram @ 1.33GBps

Copyright © 2012 Agilent Technologies

Original-Package:

With 15-GND-PTH

Cost-Reduced-Package:

With 3-GND-PTH

+95ps worst Setup-Margin +55ps worst Setup-Margin

40ps loss of

marginDQ DQ

DQS DQS

Page 14: Introduction to emi hf feb_16_10am

Do Dispersion of GND-Current leads to More-

Radiated Emission? (Movie)

Copyright © 2012 Agilent Technologies

Page 15: Introduction to emi hf feb_16_10am

PKG-Antenna-Parameters Comparison of

15-GND-PTH compared to 3-GND-PTH

Copyright © 2012 Agilent Technologies

Maximum Intensity: 5u-watts/Steradian 40-

uwatts/Steradian (8X)

Angle of U-max: 160-degrees vs. 140-degrees

Antenna-Gain

-19dB -11dB (+8dB)

Radiated-Power

40-uWatts 220-uWatts

(6x)

Page 16: Introduction to emi hf feb_16_10am

Trade-off Low-cost & Performance

Reducing # of GND-Stitches Medium-2-low-risk for 1.33GB/s operation with +55ps worst-case Setup-margin but with +8dB Antenna-Gain

Most probably we need to Turn-ON Spread spectrum.

What is the cost of PLL vs. Reduction of GND-Stitch?

Copyright © 2012 Agilent Technologies

Page 17: Introduction to emi hf feb_16_10am

Trace Emission

on PCBs due to cost-

reduction

Low-Layer count PCB

CASE:1

Memory emission from

MA/CMD lanes

Copyright © 2012 Agilent Technologies

Page 18: Introduction to emi hf feb_16_10am

4-layer PCB with Memory Emission Problem

Problem:

Investigate Emission problem at 1.25 times

the memory clock frequency (1.623 GHz)

Notes:

Address/Command Nets are routed on bottom-layer

Referencing power plane (due to lack of real-estate)

Copyright © 2012 Agilent Technologies

Page 19: Introduction to emi hf feb_16_10am

EMI Simulation Methodology

Step-1: Simulate and Visualize Current-density plot*

*Using Agilent Momentum Field Solver

Method-of-Moments

(Momentum) Simulations

showing current-density

plots and hot-spot regions

on the PCB

Emscan

Measurements

Copyright © 2012 Agilent Technologies

Page 20: Introduction to emi hf feb_16_10am

EMI Simulation Methodology, Cont’

Step-2: Isolate Problem

Observe hot-spot area closely, and identify root-cause

Root-cause:

There is small λ/8 power-plane patch

that is radiating like patch-antenna

Use the Momentum-uwave EM-engine with Antenna-Gain

parameter to measure the merit of the PCB as non-intended antenna

Develop EMI guidelines along with SI/PI Guidelines using

Antenna-Gain Parameter to compare Layout guidelines

Copyright © 2012 Agilent Technologies

Page 21: Introduction to emi hf feb_16_10am

What is the remedy?

Instead of REF MA/CMD to a VddQ Patch on Bottom layer

continue routing on Bottom Layer 3m Chamber at least 16dB Improvement

Copyright © 2012 Agilent Technologies

Page 22: Introduction to emi hf feb_16_10am

Trace Emission

on PCBs due to cost-

reduction

Low-Layer count PCB

CASE:2

TMDS Emissions

Copyright © 2012 Agilent Technologies

Page 23: Introduction to emi hf feb_16_10am

Problem Statement

TMDS Emission @ 770MHz on 4-layer PCB & Coupling to

Neighbor Ethernet-Card

Copyright © 2012 Agilent Technologies

Page 24: Introduction to emi hf feb_16_10am

Which one is better

Copper

band-aid

R4N

Suppressor

band-aid

Copyright © 2012 Agilent Technologies

Page 25: Introduction to emi hf feb_16_10am

Copyright © 2012 Agilent Technologies

Page 26: Introduction to emi hf feb_16_10am

Copyright © 2012 Agilent Technologies

Page 27: Introduction to emi hf feb_16_10am

Is it E-coupling or H-coupling?

Solution:

Simulation shows that suppression

material is improving EMI emission,

whereas, metallic shied is making it

worse

Choose Suppression material

over metallic shied -> Improve

both cost and performance

With

Metallic

Shield*Lab data confirms

simulation results

Copyright © 2012 Agilent Technologies

Page 28: Introduction to emi hf feb_16_10am

Near-field scan results

R4N

Suppressor

band-aid

Emscan

measurements

Copyright © 2012 Agilent Technologies

Page 29: Introduction to emi hf feb_16_10am

Copyright © 2012 Agilent Technologies

Page 30: Introduction to emi hf feb_16_10am

Copyright © 2012 Agilent Technologies

Page 31: Introduction to emi hf feb_16_10am

What is the Remedy?

Sometimes it is cheaper to dampen the receiver not Emitter

because adding R4N suppression materials is more cost than

using RJ45 shielded connector on the Ethernet-card.

Selected to change RJ45 Connector on Ethernet-card to

shielded one to suppress the receiver

Copyright © 2012 Agilent Technologies

Page 32: Introduction to emi hf feb_16_10am

PCB Edge Emission

due to Power delivery

Noise

Copyright © 2012 Agilent Technologies

Page 33: Introduction to emi hf feb_16_10am

Simulation Challenges in EMI

•System level (source, coupling path, unintentional antenna

•Full wave simulation is often needed

•Time and memory consuming

Copyright © 2012 Agilent Technologies

Page 34: Introduction to emi hf feb_16_10am

Combining Measured Icc(t) with FDTD simulations

to study the critical on-board-decaps under the

GPU

Drivers Channel Receivers

Power Delivery Network

Current Probe @ VddQ pins

•SSO current is obtained by a combined simulation of the power delivery network

model and the memory IO channel model

Copyright © 2012 Agilent Technologies

Page 35: Introduction to emi hf feb_16_10am

Measured Dynamic-current profile Icc(t)

fft

ifft

steady-state frequencies

•Time-domain noise pattern directly imported into FDTD solver

Copyright © 2012 Agilent Technologies

Page 36: Introduction to emi hf feb_16_10am

Importing PCB layout of the Memory Channel

11 cm

8 c

m

Signal

Ground

Signal

VDD

Ground

VDD

Stackup

board thickness: 1.57mm

Copyright © 2012 Agilent Technologies

Page 37: Introduction to emi hf feb_16_10am

SSO Noise Source on Top Layer

IC

Noise sources

Copyright © 2012 Agilent Technologies

Page 38: Introduction to emi hf feb_16_10am

Decaps on Bottom Layer

decaps

Copyright © 2012 Agilent Technologies

Page 39: Introduction to emi hf feb_16_10am

Far-Field Radiation

at 0.5 GHz at 1.0 GHz

With Decaps Without Decaps With Decaps Without Decaps

Reduction of 3-4 dB

Copyright © 2012 Agilent Technologies

Page 40: Introduction to emi hf feb_16_10am

Current Density

At 0.5 GHz At 0.5 GHz

Without Decaps With Decaps

Copyright © 2012 Agilent Technologies

Page 41: Introduction to emi hf feb_16_10am

What is the benefit of PCB decaps?

New method to optimize the PCB decaps:

1. Measure or simulate the Dynamic-current profile Icc(t) @ the

VddQ-pins with maximum activity on the memory-channel

2. Import the Icc(t) into FDTD (wide-band-phenomena)

3. Study the critical PCB decaps to mitigate the SSO noise

emission

Copyright © 2012 Agilent Technologies

Page 42: Introduction to emi hf feb_16_10am

Connector/Cable

Emission

Copyright © 2012 Agilent Technologies

Page 43: Introduction to emi hf feb_16_10am

Board +Connector +Mate

Copyright © 2012 Agilent Technologies

Page 44: Introduction to emi hf feb_16_10am

Combining CAD and Board Files

Precise landing of connector fingers on

board signal pad

Copyright © 2012 Agilent Technologies

Page 45: Introduction to emi hf feb_16_10am

Near-Field Radiation:

Do we need Shielded Connector? ($0.15 more cost)

Do we need copper-tape under connector?

Study if improved grounding & shielding of the

connector improves EMI behavior

•Simulated with FDTD-solver

(Agilent EMPro)

•Accelerated on GPU system

•Simulation time ≈ ½ day with

1-GPU card and 2-hrs with

3-GPU cards

Copyright © 2012 Agilent Technologies

Page 46: Introduction to emi hf feb_16_10am

Improved Grounding of the Connector:

What is the impact of a copper-tape under the

connector

No copper tape Extra copper tape

Copyright © 2012 Agilent Technologies

Page 47: Introduction to emi hf feb_16_10am

Improved Grounding: Far-field impact of CU-tape

Reduction of 5 dB for EMI emission

In direction of chassis

Copyright © 2012 Agilent Technologies

Page 48: Introduction to emi hf feb_16_10am

Conclusion

•“Virtual-EMI” Lab is a MUST for Speed-of-Light Product-to-Market

•Radiated/Conducted-Emission:

•Packages Return-Path-Discontinuity driving the need to turn-ON SS

• PCBs due to Cost-Reduction 4L-PCBs”

– MA/CMD Emission by referencing to VddQ

– TMDS Emission due to routing on Bottom layer

• SSO Noise Emission by VddQ Current-Profile on PCB Decaps are very

effective

• Emission of Connector+Cables from HDMI common-mode noise

Copyright © 2012 Agilent Technologies

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