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erm1986 documents
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Bayesian tolerance interval control limits for attributes
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Statistical modelling and inference for multivariate and longitudinal discrete response data.pdf
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Monitoring high-yields processes with defects count in nonconforming items by artificial neural network
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Optimization of the new DS-u control chart. An application of Genetic Algorithms.Perez et al. (2010)
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CUMULATIVE SUM CHARTS FOR HIGH YIELD PROCESSES (Chan y Gan 2001)