k-wittmaack documents

Local SiO2 formation in silicon bombarded with oxygen above the critical angle for beam-induced oxidation: new evidence from sputtering yield ratios and correlation with data obtained
Documents Local SiO2 formation in silicon bombarded with oxygen above the critical angle for beam-induced oxidation: new evidence from sputtering yield ratios and correlation with data obtained
Oxygen-concentration dependence of secondary ion yield enhancement
Documents Oxygen-concentration dependence of secondary ion yield enhancement
Secondary ion yield variations due to cesium implantation in silicon
Documents Secondary ion yield variations due to cesium implantation in silicon
Impact-energy dependence of atomic mixing and selective sputtering of light impurities in cesium-bombarded silicon
Documents Impact-energy dependence of atomic mixing and selective sputtering of light impurities in cesium-bombarded silicon
Background formation in SIMS analysis of hydrogen, carbon, nitrogen and oxygen in silicon
Documents Background formation in SIMS analysis of hydrogen, carbon, nitrogen and oxygen in silicon
Production of ions of the opposite charge in mass analysis using a quadrupole filter
Documents Production of ions of the opposite charge in mass analysis using a quadrupole filter
On the mechanism of cluster emission in sputtering
Documents On the mechanism of cluster emission in sputtering
Projectile-energy dependence and line shape of ArL Auger spectra from argon bombarded silicon
Documents Projectile-energy dependence and line shape of ArL Auger spectra from argon bombarded silicon
Secondary ion emission from polymer layers by atomic and molecular ion bombardment: Data evaluation based on linear-cascade sputtering theory
Documents Secondary ion emission from polymer layers by atomic and molecular ion bombardment: Data evaluation based on linear-cascade sputtering theory
Gas-phase ionisation of sputtered rare gas atoms
Documents Gas-phase ionisation of sputtered rare gas atoms
Detailed evaluation of the analytical resolution function
Documents Detailed evaluation of the analytical resolution function
Peak or centroid — which parameter is better suited for quantifying apparent marker locations in low-energy sputter depth profiling with reactive primary ion beams?
Documents Peak or centroid — which parameter is better suited for quantifying apparent marker locations in low-energy sputter depth profiling with reactive primary ion beams?
A. Benninghoven, C. A. Evans jr, R. A. Powell, R. Shimizu and R. A. Storms. Secondary ion mass spectrometry: Proceedings of the second international conference on secondary ion mass
Documents A. Benninghoven, C. A. Evans jr, R. A. Powell, R. Shimizu and R. A. Storms. Secondary ion mass spectrometry: Proceedings of the second international conference on secondary ion mass
Charge compensation in SIMS analysis of polymer foils using negative secondary ions
Documents Charge compensation in SIMS analysis of polymer foils using negative secondary ions
Towards the ultimate limits of depth resolution in sputter profiling: Beam-induced chemical changes and the importance of sample quality
Documents Towards the ultimate limits of depth resolution in sputter profiling: Beam-induced chemical changes and the importance of sample quality
Raster scanning depth profiling of layer structures
Documents Raster scanning depth profiling of layer structures
Beiträge zur Kenntniss der Wirkung des Chinins auf das Gehörorgan
Documents Beiträge zur Kenntniss der Wirkung des Chinins auf das Gehörorgan
Concept and validation of a novel approach for producing large batches of reference material of ambient aerosols on filters
Documents Concept and validation of a novel approach for producing large batches of reference material of ambient aerosols on filters
Small-area depth profiling in a quadrupole based SIMS instrument
Documents Small-area depth profiling in a quadrupole based SIMS instrument
Rapid-relocation model for describing high-fluence retention of rare gases implanted in solids
Documents Rapid-relocation model for describing high-fluence retention of rare gases implanted in solids
Zur Frage der sekundären peripheren Kochleardegeneration nach Kochlearis-Stammläsion
Documents Zur Frage der sekundären peripheren Kochleardegeneration nach Kochlearis-Stammläsion