m-geretschlaeger documents

Determination of three parameters of a depth profile of foreign atoms in bulk material using pixe analysis: Part II: Influence of the errors of theoretical quantities which are used
Documents Determination of three parameters of a depth profile of foreign atoms in bulk material using pixe analysis: Part II: Influence of the errors of theoretical quantities which are used
A simple low-noise cryogenic preamplifier for silicon surface barrier detectors
Documents A simple low-noise cryogenic preamplifier for silicon surface barrier detectors
Monte Carlo simulation of the response of Si(Li) X-ray detectors to proton induced K X-rays of light elements (12 ≦ Z ≦ 32) applied to efficiency determination
Documents Monte Carlo simulation of the response of Si(Li) X-ray detectors to proton induced K X-rays of light elements (12 ≦ Z ≦ 32) applied to efficiency determination