基板上の ZnTe エピタキシャル膜の光学的評価 · Title:...

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  • ZnTe

    Optical characterizations of ZnTe epilayers grown on InP substrates Takeuchi Takashi and Satoru Seto

    (Ishikawa National College of Technology) 1.

    ZnTe

    2.26eV

    550nm

    ZnTe GaAs

    InP 300

    GaAs ZnTe

    InPZnTe

    2. ZnTe 6.1037[]GaAs

    5.6533[]InP 5.8687[]300

    GaAsInPZnTeZnTe

    ZnTe

    ZnTe

    X

    ZnTe

    ZnTe

    3.

    1InPZnTe

    650nm

    GaAs

    InPZnTe

    X -

    2

    ZnTe

    GaAsInP

    ZnTe

    GaAs

    ZnTe GaAs

    8 InP

    0.05688GaAs 0.03903 GaAs

    Inte

    nsi

    ty (

    a. u

    .)

    800750700650600550

    W avelength (nm )

    G ro w th p erio d : 8 hr

    2 hr1 hr

    30 m in

    ZnTe o n InPT= 1 1 KH e-C d laser (3 2 5 nm ) excita tio n

    PL

    6.096

    6.097

    6.098

    6.099

    6.1

    6.101

    6.102

    6.103

    6.104

    6.105

    0.0 1.0 2.0 3.0 4.0 5.0 6.0 7.0 8.0

    [h]

    ZnTe[]

    ZnTe

    ZnTe

    InP

    Optical characterizations of ZnTe epilayers grown on InP substrates

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