PHD SCHOOL OF THE SOCIETÀ ITALIANA DI...

ThePh.D. Schoolof the SIE (“Società Italianadi Elettronica”– “ItalianElectronics Society”) is an importantevent linked to the SIEAnnualMeeting,which isannouncedforthe50thyear.TheSchoolwillbefocusedonthereliabilityinelectronicdevices,circuits,andsystems,aswellasonrelatedsubjects.Theaimistoexplainthereliabilitybasicsinallthefieldsofelectronics,todescribethemonitoring,simulation,measurementstrategiesavailableintherecentliterature,andtooffersomedesignguidelinestoalleviatethepotentialreliabilityreduction.Thetalkswillcover:degradationinSiGeHBTandVDMOSinducedbyhot-carriereffects,advancedhigh-efficiencyelectrothermalsimulation;reliabilityissuesinPVplants;failureanalysisinoptoelectronicdevices;degradationinpowerelectronics;reliabilityproblemsindigitalcircuits,withemphasisonnanoscaletransistorsandmemories;uncertaintyquantificationforrobustdesignofelectronicsystems;powerGaNdevices.ThePh.D.studentswillhavetheuniqueopportunitytofollowlecturesgivenbythemostrelevantEuropeanexperts,andwillalsoenjoy15-minutes-longQ&Asessionsaftereachtalk,whichwillallowthemtohonetheirunderstandingofthetopic.TheSchoolwillbeheldintheprestigiouslecture-hall“Spinelli”oftheDepartmentofPoliticalScienceofUniversityFedericoII,viaRodinò,LargoSanMarcellino,Naples.Giventhecrosscuttingrelevanceofthetopic,theSchoolisexpectedtobeofgreatinterestnotonlyforPh.D.studentsdealingwithelectronics,butalsoforthoseinvolvedinsimilarfields,likebiomedical,electrical,industrial,andtelecommunicationengineering.TheofficiallanguageisEnglish.

LECTURESHCdegradationinSiGeHBTs:Measurements,modeling,andphysicalexplanation

GerhardG.FischerIHP,FrankfurtOder

AdvancedsimulationofHCdegradationofSiGeHBTsandVDMOSFETs

ChristophJungemannUniversityofAachen

Recentadvancesofcompactthermalmodelingofintegratedcircuits

LorenzoCodecasaPolitecnicodiMilano

Reliabilityissuesinphotovoltaicsystems GiovanniSpagnuoloUniversityofSalerno

Diagnosticsofelectrondevices:Arealshortcuttoreliabilityimprovement

GiovannaMuraUniversityofCagliari

Anintroductiontothereliabilityofsemiconductormulti-chippowermodules

Real-timemonitoringofpowermodulesdegradationinactualapplications

AlbertoCastellazziUniversityofNottingham

ReliabilityofCMOSnanodevices FeliceCrupiUniversityofCalabria

ReliabilitychallengesinVLSIcircuitsandsystems

CeciliaMetraUniversityofBologna

Advancedsimulationofreliabilityissuesinlogicandmemorydevices

LucaLarcherUniversityofModenaeReggioEmilia

Uncertaintyquantificationforrobustdesignofelectronicsystems

FrancescoFerrantiInstitutMines-TélécomAtlantique,Brest

RecentadvancementsinpowerGaNreliability

GaudenzioMeneghessoUniversityofPadova

sie2018.dieti.unina.itWelookforwardtoseeingyouinthebeautifulNapoli!

Prof.NiccolòRinaldiProf.GiovanniBreglioProf.Vincenzod’Alessandro

Ph.D.SchoolChairsCONTACTS

ForinforegardingSubmission,Registration,SponsorshipandAccommodation:

secretariat.sie2018@gmail.com

Ph.D. students and recent graduates are warmly invited toparticipate to this unique experience. Young researchers,doctors,andcompany’sR&Dstaffcanalsoparticipate.Pleasevisittheannualmeetingwebsiteforsubmissionsandupdatedinformationat:

ReliabilityinElectronics

Coordinator Giovanni Breglio

Ph.D. School Chairs

Niccolò Rinaldi, Giovanni Breglio, Vincenzo d’Alessandro

General Chair Andrea Lacaita Organizing Chair

Giovanni Breglio Publication Chair

Ettore Napoli

Giovanni Breglio Antonio Strollo Niccolò Rinaldi

Santolo Daliento Andrea Irace

Ettore Napoli Vincenzo d’Alessandro

Davide De Caro Nicola Petra

Michele Riccio Pierluigi Guerriero

Luca Maresca Darjn Esposito

Antonio Pio Catalano Ilaria Matacena

Vincenzo Romano Marrazzo

LOCAL ORGANIZING COMMITTEE

PHD SCHOOL OF THE SOCIETÀ ITALIANA DI ELETTRONICA