The Ph.D. School of the SIE (“Società Italiana di Elettronica” – “Italian Electronics Society”) is an important event linked to the SIE Annual Meeting, which is announced for the 50th year. The School will be focused on the reliability in electronic devices, circuits, and systems, as well as on related subjects. The aim is to explain the reliability basics in all the fields of electronics, to describe the monitoring, simulation, measurement strategies available in the recent literature, and to offer some design guidelines to alleviate the potential reliability reduction. The talks will cover: degradation in SiGe HBT and VDMOS induced by hot-carrier effects, advanced high-efficiency electrothermal simulation; reliability issues in PV plants; failure analysis in optoelectronic devices; degradation in power electronics; reliability problems in digital circuits, with emphasis on nanoscale transistors and memories; uncertainty quantification for robust design of electronic systems; power GaN devices. The Ph.D. students will have the unique opportunity to follow lectures given by the most relevant European experts, and will also enjoy 15-minutes-long Q&A sessions after each talk, which will allow them to hone their understanding of the topic. The School will be held in the prestigious lecture-hall “Spinelli” of the Department of Political Science of University Federico II, via Rodinò, Largo San Marcellino, Naples. Given the crosscutting relevance of the topic, the School is expected to be of great interest not only for Ph.D. students dealing with electronics, but also for those involved in similar fields, like biomedical, electrical, industrial, and telecommunication engineering. The official language is English. LECTURES HC degradation in SiGe HBTs: Measurements, modeling, and physical explanation Gerhard G. Fischer IHP, Frankfurt Oder Advanced simulation of HC degradation of SiGe HBTs and VDMOSFETs Christoph Jungemann University of Aachen Recent advances of compact thermal modeling of integrated circuits Lorenzo Codecasa Politecnico di Milano Reliability issues in photovoltaic systems Giovanni Spagnuolo University of Salerno Diagnostics of electron devices: A real shortcut to reliability improvement Giovanna Mura University of Cagliari An introduction to the reliability of semiconductor multi-chip power modules Real-time monitoring of power modules degradation in actual applications Alberto Castellazzi University of Nottingham Reliability of CMOS nanodevices Felice Crupi University of Calabria Reliability challenges in VLSI circuits and systems Cecilia Metra University of Bologna Advanced simulation of reliability issues in logic and memory devices Luca Larcher University of Modena e Reggio Emilia Uncertainty quantification for robust design of electronic systems Francesco Ferranti Institut Mines-Télécom Atlantique, Brest Recent advancements in power GaN reliability Gaudenzio Meneghesso University of Padova sie2018.dieti.unina.it We look forward to seeing you in the beautiful Napoli! Prof. Niccolò Rinaldi Prof. Giovanni Breglio Prof. Vincenzo d’Alessandro Ph.D. School Chairs CONTACTS For info regarding Submission, Registration, Sponsorship and Accommodation: [email protected] Ph.D. students and recent graduates are warmly invited to participate to this unique experience. Young researchers, doctors, and company’s R&D staff can also participate. Please visit the annual meeting website for submissions and updated information at: Reliability in Electronics Coordinator Giovanni Breglio Ph.D. School Chairs Niccolò Rinaldi, Giovanni Breglio, Vincenzo d’Alessandro General Chair Andrea Lacaita Organizing Chair Giovanni Breglio Publication Chair Ettore Napoli Giovanni Breglio Antonio Strollo Niccolò Rinaldi Santolo Daliento Andrea Irace Ettore Napoli Vincenzo d’Alessandro Davide De Caro Nicola Petra Michele Riccio Pierluigi Guerriero Luca Maresca Darjn Esposito Antonio Pio Catalano Ilaria Matacena Vincenzo Romano Marrazzo LOCAL ORGANIZING COMMITTEE PHD SCHOOL OF THE SOCIETÀ ITALIANA DI ELETTRONICA

PHD SCHOOL OF THE SOCIETÀ ITALIANA DI ELETTRONICAsie2018.dieti.unina.it/wp-content/uploads/2017/10/Call_for_PhD-School...Niccolò Rinaldi Santolo Daliento Andrea Irace Ettore Napoli

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Page 1: PHD SCHOOL OF THE SOCIETÀ ITALIANA DI ELETTRONICAsie2018.dieti.unina.it/wp-content/uploads/2017/10/Call_for_PhD-School...Niccolò Rinaldi Santolo Daliento Andrea Irace Ettore Napoli

LECTURESHCdegradationinSiGeHBTs:Measurements,modeling,andphysicalexplanation

GerhardG.FischerIHP,FrankfurtOder

AdvancedsimulationofHCdegradationofSiGeHBTsandVDMOSFETs

ChristophJungemannUniversityofAachen

Recentadvancesofcompactthermalmodelingofintegratedcircuits

LorenzoCodecasaPolitecnicodiMilano

Reliabilityissuesinphotovoltaicsystems GiovanniSpagnuoloUniversityofSalerno

Diagnosticsofelectrondevices:Arealshortcuttoreliabilityimprovement

GiovannaMuraUniversityofCagliari

Anintroductiontothereliabilityofsemiconductormulti-chippowermodules

Real-timemonitoringofpowermodulesdegradationinactualapplications

AlbertoCastellazziUniversityofNottingham

ReliabilityofCMOSnanodevices FeliceCrupiUniversityofCalabria

ReliabilitychallengesinVLSIcircuitsandsystems

CeciliaMetraUniversityofBologna

Advancedsimulationofreliabilityissuesinlogicandmemorydevices

LucaLarcherUniversityofModenaeReggioEmilia

Uncertaintyquantificationforrobustdesignofelectronicsystems

FrancescoFerrantiInstitutMines-TélécomAtlantique,Brest

RecentadvancementsinpowerGaNreliability

GaudenzioMeneghessoUniversityofPadova

sie2018.dieti.unina.itWelookforwardtoseeingyouinthebeautifulNapoli!

Prof.NiccolòRinaldiProf.GiovanniBreglioProf.Vincenzod’Alessandro

Ph.D.SchoolChairsCONTACTS

ForinforegardingSubmission,Registration,SponsorshipandAccommodation:

[email protected]

Ph.D. students and recent graduates are warmly invited toparticipate to this unique experience. Young researchers,doctors,andcompany’sR&Dstaffcanalsoparticipate.Pleasevisittheannualmeetingwebsiteforsubmissionsandupdatedinformationat:

ReliabilityinElectronics

Coordinator Giovanni Breglio

Ph.D. School Chairs

Niccolò Rinaldi, Giovanni Breglio, Vincenzo d’Alessandro

General Chair Andrea Lacaita Organizing Chair

Giovanni Breglio Publication Chair

Ettore Napoli

Giovanni Breglio Antonio Strollo Niccolò Rinaldi

Santolo Daliento Andrea Irace

Ettore Napoli Vincenzo d’Alessandro

Davide De Caro Nicola Petra

Michele Riccio Pierluigi Guerriero