089190R-ITCEP07V04 rpt-微星-Notebook MS-171Ffaenl.msi.com/ftp/CE Documents/Notebook/Archive/MS-171Fx (VR705)/CE_IT... · ( Assistant Engineer / Sampras Yen ) Approved By : ( Manager

No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. TEL:+886-2-8601-3788 FAX:+886-2-8601-3789 Email:[email protected] http://www.quietek.com

CERTIFICATE

Issued Date: Oct. 07, 2008 Report No. : 089190R-ITCEP07V04

This is to certify that the following designated product

Product : Notebook

Trade name : MSI

Model Number : MS-171F

Company Name : MICRO-STAR INT’L Co., LTD.

This product, which has been issued the test report listed as above in QuieTek

Laboratory, is based on a single evaluation of one sample and confirmed to

comply with the requirements of the following EMC standard.

EN 55022: 2006 EN 55024: 1998+A1: 2001+A2: 2003

EN 61000-3-2:2006 IEC 61000-4-2 Edition 1.2: 2001-04

EN 61000-3-3:1995+A1:2001+A2: 2005 IEC 61000-4-3 Edition 3.0: 2006

IEC 61000-4-4: 2004

IEC 61000-4-5 Edition 2.0: 2005

IEC 61000-4-6 Edition 2.2: 2006

IEC 61000-4-8 Edition 1.1: 2001-03

IEC 61000-4-11 Second Edition: 2004-03

TEST LABORATORY

Vincent Lin / Manager

Test Report

Product Name ： Notebook

Model No. ： MS-171F

Applicant ： MICRO-STAR INT’L Co., LTD.

Address ： No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C.

Date of Receipt ： 2008/09/10

Issued Date ： 2008/10/07

Report No. ： 089190R-ITCEP07V04

Version ： V1.0

The test results relate only to the samples tested.

The test results shown in the test report are traceable to the national/international standard through the calibration of the equipment and evaluated measurement uncertainty herein.

This report must not be used to claim product endorsement by TAF, NVLAP or any agency of the Government.

The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.

Declaration of Conformity The following product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (2004/108/EC). The listed standards as below were applied: The following Equipment:

Product : Notebook


Trade Name : MSI

This product is herewith confirmed to comply with the requirements set out in the

Council Directive on the Approximation of the laws of the Member States relating to

Electromagnetic Compatibility Directive (2004/108/EC). For the evaluation regarding

EMC, the following standards were applied:

RFI Emission:

EN 55022:2006, Class B : Product family standard

EN 61000-3-2:2006, Class D : Limits for harmonic current emission

EN 61000-3-3:1995+A1:2001+A2: 2005 : Limitation of voltage fluctuation and flicker in low-voltage supply system

Immunity:

EN 55024:1998+A1:2001+A2:2003 : Product family standard

The following importer/manufacturer is responsible for this declaration:

Company Name :

Company Address :

Telephone : Facsimile :

Person is responsible for marking this declaration:

Name (Full Name) Position/ Title

Date Legal Signature

QuieTek Corporation / No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. Tel: 886-2-8601-3788, Fax: 886-2-8601-3789, E-mail: [email protected]

QTK No.: 089190R-ITCEP07V04

S ta tement o f Conformi ty

This certifies that the following designated product:

Product : Notebook


Trade Name : MSI

Company Name : MICRO-STAR INT'L Co., LTD.

This product is herewith confirmed to comply with the requirements set out in the

Council Directive on the Approximation of the laws of the Member States relating to

Electromagnetic Compatibility Directive (2004/108/EC). For the evaluation regarding

EMC, the following standards were applied:

RFI Emission:

EN 55022:2006, Class B : Product family standard

EN 61000-3-2:2006, Class D : Limits for harmonic current emission

EN 61000-3-3:1995+A1:2001+A2: 2005 : Limitation of voltage fluctuation and flicker in low-voltage supply system

Immunity:

EN 55024:1998+A1:2001+A2:2003 : Product family standard

TEST LABORATORY

Vincent Lin / Manager

The verification is based on a single evaluation of one sample of above-mentioned products. It does not imply an assessment of the whole production and does not permit the use of the test lab. Logo.

Report No： 089190R-ITCEP07V04

Page: 2 of 134

Test Report Cert i f icat ion Issued Date : 2008/10/07 Report No. : 089190R-ITCEP07V04

Product Name : Notebook

Applicant : MICRO-STAR INT’L Co., LTD.

Address : No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C.

Manufacturer : MICRO-STAR INT’L Co., LTD.

Model No. : MS-171F

Rated Voltage : AC 230 V / 50 Hz

EUT Voltage : AC 100-240V, 50-60Hz

Trade Name : MSI

Applicable Standard : EN 55022: 2006 Class B

EN 55024: 1998+A1: 2001+A2: 2003

EN 61000-3-2:2006

EN 61000-3-3:1995+A1:2001+A2: 2005

Test Result : Complied

Performed Location : Quietek Corporation (Linkou Laboratory)

No.5-22,Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kuo Shiang,

Taipei, 244 Taiwan, R.O.C.

TEL:+866-2-8601-3788 / FAX:+886-2-8601-3789

Documented By :

(Adm. Specialist /Joanne Lin)

Reviewed By :

( Assistant Engineer / Sampras Yen )

Approved By :

( Manager / Vincent Lin )


Page: 3 of 134

Laboratory Information We , QuieTek Corporation, are an independent EMC and safety consultancy that was established the whole facility in our laboratories. The test facility has been accredited/accepted (audited or listed) by the following related bodies in compliance with ISO 17025, EN 45001 and specified testing scopes:

The related certificate for our laboratories about the test site and management system can be downloaded from QuieTek Corporation’s Web Site :http://tw.quietek.com/modules/enterprise/services.php?item=100 The address and introduction of QuieTek Corporation’s laboratories can be founded in our Web site : http://www.quietek.com/ If you have any comments, Please don’t hesitate to contact us. Our contact information is as below: HsinChu Testing Laboratory :

No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307, Taiwan, R.O.C. TEL:+886-3-592-8858 / FAX:+886-3-592-8859 E-Mail : [email protected]

LinKou Testing Laboratory :

No. 5, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwan, R.O.C. TEL : 886-2-8601-3788 / FAX : 886-2-8601-3789 E-Mail : [email protected]

Suzhou (China) Testing Laboratory :

No. 99 Hongye Rd., Suzhou Industrial Park Loufeng Hi-Tech Development Zone., Suzhou,China.TEL : +86-512-6251-5088 / FAX : +86-512-6251-5098 E-Mail : [email protected]

Taiwan R.O.C. : BSMI, NCC, TAF

Germany : TUV Rheinland

Norway : Nemko, DNV

USA : FCC, NVLAP

Japan : VCCI


Page: 4 of 134

TABLE OF CONTENTS Description Page 1. General Information .................................................................................................... 7

1.1. EUT Description................................................................................................... 7

1.2. Mode of Operation............................................................................................. 11

1.3. Tested System Details ....................................................................................... 11

1.4. Configuration of Tested System......................................................................... 18

1.5. EUT Exercise Software...................................................................................... 19

2. Technical Test ........................................................................................................... 20

2.1. Summary of Test Result..................................................................................... 20

2.2. List of Test Equipment ....................................................................................... 21

2.3. Measurement Uncertainty.................................................................................. 24

2.4. Test Environment ............................................................................................... 26

3. Conducted Emission (Main Terminals)...................................................................... 27

3.1. Test Specification............................................................................................... 27

3.2. Test Setup.......................................................................................................... 27

3.3. Limit ................................................................................................................... 27

3.4. Test Procedure .................................................................................................. 28

3.5. Deviation from Test Standard............................................................................. 28

3.6. Test Result ......................................................................................................... 29

3.7. Test Photograph ................................................................................................ 41

4. Conducted Emissions (Telecommunication Ports).................................................... 43


4.2. Test Setup.......................................................................................................... 43

4.3. Limit ................................................................................................................... 43

4.4. Test Procedure .................................................................................................. 44


4.6. Test Result ......................................................................................................... 45

4.7. Test Photograph ................................................................................................ 69

5. Radiated Emission.................................................................................................... 71


5.2. Test Setup.......................................................................................................... 71

5.3. Limit ................................................................................................................... 71

5.4. Test Procedure .................................................................................................. 72


5.6. Test Result ......................................................................................................... 73

5.7. Test Photograph ................................................................................................ 77

6. Harmonic Current Emission ...................................................................................... 79


Page: 5 of 134


6.2. Test Setup.......................................................................................................... 79

6.3. Limit ................................................................................................................... 79

6.4. Test Procedure .................................................................................................. 81


6.6. Test Result ......................................................................................................... 82

6.7. Test Photograph ................................................................................................ 86

7. Voltage Fluctuation and Flicker................................................................................. 87


7.2. Test Setup.......................................................................................................... 87

7.3. Limit ................................................................................................................... 87

7.4. Test Procedure .................................................................................................. 88


7.6. Test Result ......................................................................................................... 89

7.7. Test Photograph ................................................................................................ 90

8. Electrostatic Discharge ............................................................................................. 92


8.2. Test Setup.......................................................................................................... 92

8.3. Limit ................................................................................................................... 92

8.4. Test Procedure .................................................................................................. 93


8.6. Test Result ......................................................................................................... 94

8.7. Test Photograph ................................................................................................ 96

9. Radiated Susceptibility ............................................................................................. 96


9.2. Test Setup.......................................................................................................... 97

9.3. Limit ................................................................................................................... 97

9.4. Test Procedure .................................................................................................. 98


9.6. Test Result ......................................................................................................... 99

9.7. Test Photograph .............................................................................................. 101

10. Electrical Fast Transient/Burst ......................................................................... 102

10.1. Test Specification............................................................................................. 102

10.2. Test Setup........................................................................................................ 102

10.3. Limit ................................................................................................................. 102

10.4. Test Procedure ................................................................................................ 103

10.5. Deviation from Test Standard........................................................................... 103

10.6. Test Result ....................................................................................................... 104


Page: 6 of 134

10.7. Test Photograph .............................................................................................. 106

11. Surge ............................................................................................................... 108


11.2. Test Setup........................................................................................................ 108

11.3. Limit ................................................................................................................. 108

11.4. Test Procedure ................................................................................................ 109


11.6. Test Result ....................................................................................................... 110

11.7. Test Photograph .............................................................................................. 112

12. Conducted Susceptibility ................................................................................. 113


12.2. Test Setup........................................................................................................ 113

12.3. Limit ................................................................................................................. 114

12.4. Test Procedure ................................................................................................ 114


12.6. Test Result ....................................................................................................... 115

12.7. Test Photograph .............................................................................................. 117

13. Power Frequency Magnetic Field .................................................................... 119


13.2. Test Setup........................................................................................................ 119

13.3. Limit ................................................................................................................. 119

13.4. Test Procedure ................................................................................................ 119


13.6. Test Result ....................................................................................................... 120

13.7. Test Photograph .............................................................................................. 122

14. Voltage Dips and Interruption........................................................................... 123


14.2. Test Setup........................................................................................................ 123

14.3. Limit ................................................................................................................. 123

14.4. Test Procedure ................................................................................................ 124


14.6. Test Result ....................................................................................................... 125

14.7. Test Photograph .............................................................................................. 127

15. Attachment ...................................................................................................... 128

　 EUT Photograph .............................................................................................. 128


Page: 7 of 134

1. General Information

1.1. EUT Description

Product Name Notebook

Trade Name MSI

Model No. MS-171F

Component

Power Adapter (1) MFR: LiteOn, M/N: PA-1900-04 Input: AC 100-240V, 50-60Hz 1.5A Output: DC 19V, 4.74A Cable out: Non-Shielded, 1.8m, with one ferrite core bonded. Power Cord: Non-Shielded, 1.8m

Power Adapter (2) MFR: DELTA, M/N: ADP-90SB BB Input: AC 100-240V, 50-60Hz 1.5A Output: DC 19V, 4.74A Cable out: Non-Shielded, 1.8m, with one ferrite core bonded. Power Cord: Non-Shielded, 1.8m


Page: 8 of 134

Keyparts List

Item Vendor Model name

T9600 / 2.8GHz

T9400 / 2.53GHz

P9500 / 2.53GHz

P8600 / 2.53GHz

P8400 / 2.26GHz

P7350 / 2.0GHz

T5900 / 2.2GHz

T5800 / 2.0GHz

T7700 / 2.4GHz

T7500 / 2.2GHz

T7250 / 2.0GHz

T7100 / 1.8GHz

T5550 / 1.83GHz

T5450 / 1.66GHz

T3400 / 2.16GHz

T3200 / 2.0GHz

T2410 / 2.0GHz

T1700 / 1.83GHz

CPU Intel

T1600 / 1.66GHz

CMO N170C2-L02 / 17”

Samsung LTN170X2-L02 / 17” Panel

AU B17PW03 V3 / 17”

AD-7580S Sony

AD-7560S

TSST TS-L633A ODD

HLDS GT10N


Page: 9 of 134

WD1200BEVS

WD1200BEVT

WD1600BEVS

WD2500BEVS

WD2500BEVT

WD

WD3200BEVT

MHZ2120BH

MHZ2160BH

MHZ2250BH Fujitsu

MHZ2320BH

MK1252GSX

MK1652GSX

MK2552GSX

HDD

Toshiba

MK3252GSX

JM800QSU-1G

TS128MSQ64V8U

TS128MSQ64V8U

JM800QSU-2G

TS256MSQ64V8U

TS256MSQ64V8U

TS128MSQ64V6J

JM467Q643A-6

Transcend

JM667QSU-2G

GU331G0ALEPR612F

GU332G0ALEPR8H2F

GU331G0AJEPN6E2F

GU331G0AJEPR612F

Unifosa

GU332G0AJEPR8H2F

KVR800D2S5 / 1G

KVR667D2S5 / 1G

DRAM

Kingston

KVR667D2S5 / 512


Page: 10 of 134

M470T2864QZ3-CF7

M470T5663QZ3-CF7

M470T2953EZ3-CE6

M470T2864QZ3-CE6

Samsung

M470T5663QZ3-CE6

DRAM

Hynix HYMP112S64CP6-Y5

YIVNMS0016D11-- Inverter Sampo

YIVNMS0028D11--

BTY-M52 / 4400 mAh / 10.8V SMP

BTY-M52 / 5200 mAh / 10.8V Battery

Welldown BTY-L71 / 7200 mAh / 10.8V

Delta ADP-90SB BB Adaptor

Lite-On PA-1900-04

Touch Pad Elantech 810406-5053

Motorola ML3054 Modem

LSI D40

MSI MS-6890 WLAN

Atheros AW-GE780 (AR5BXB63)

BT MSI MS-6837D

Camera BISON BN29M5S8-000


Page: 11 of 134

1.2. Mode of Operation QuieTek has verified the construction and function in typical operation. All the test modes were

carried out with the EUT in normal operation, which was shown in this test report and defined as:

Pre-Test Mode

Mode 1 Mode 2 Mode 3 Mode 4 Mode 5 Mode 6 Mode 7 Mode 8 Mode 9 Mode 10 Mode 11 Mode 12 Mode 13 Mode 14 Mode 15 Mode 16 Mode 17 Mode 18 Mode 19

Final Test Mode

Emission Mode 1 Mode 2

Immunity Mode 1 Mode 2


Page: 12 of 134

Item MODE 1

(LCD+HDMI 1440*900/60Hz) MODE 2

(LCD+HDMI 1440*900/60Hz)

CPU Intel T9600/2.8GHz Intel T9400/2.53GHz

LCD Samsung LTN170X2-L02 CMO N170C2-L02

HDD WD WD3200BEVT/320G WD WD3200BEVT/320G

ODD Sony AD-7560S Sony AD-7560S

RAM Transcend JM800QSU-2G/2GB Transcend JM800QSU-2G/2GB

Battery Welldown BTY-L71/7200 mAh SMP BTY-M52/4400 mAh

AC-adapter Delta ADP-90SB BB Lite-On PA-1900-04

Touch Pad Elantech 810406-5053 Elantech 810406-5053

MDC Modem LSI D40 Motorola ML3054

WLAN MSI MS-6890 Atheros AW-GE780 (AR5BXB63)

Camera BISON BN29M5S8-000 BISON BN29M5S8-000

Inverter Sampo YIVNMS0028D11-- Sampo YIVNMS0016D11--

Bluetooth MSI MS-6837D MSI MS-6837D

Item MODE 3


(LCD+HDMI 1440*900/60Hz)

CPU Intel P9500/2.53GHz Intel P8600/2.53GHz

LCD AU B17PW03 V3 Samsung LTN170X2-L02

HDD WD WD1200BEVS/120G WD WD1200BEVT/120G

ODD Sony AD-7580S TSST TS-L633A

RAM TranscendJM800QSU-1G/1G

TS128MSQ64V8U/1G Transcend

TS128MSQ64V8U/1G

TS128MSQ64V8U/1G

Battery SMP BTY-M52/5200 mAh SMP BTY-M52/4400 mAh









Page: 13 of 134

Item MODE 5


(LCD+HDMI 1440*900/60Hz)

CPU Intel P8400/2.26GHz Intel P7350/2.0GHz

LCD CMO N170C2-L02 AU B17PW03 V3

HDD WD WD1600BEVS/160G WD WD2500BEVS/250G

ODD HLDS GT10N Sony AD-7560S

RAM TranscendTS256MSQ64V8U/2G

TS256MSQ64V8U/2G Transcend

TS128MSQ64V6J/1G

TS256MSQ64V8U/2G

Battery Welldown BTY-L71/7200mAh SMP BTY-M52/4400 mAh








Item MODE 7


(LCD+HDMI 1440*900/60Hz)



HDD WD WD2500BEVT/250G Fujitsu MHZ2120BH/120G

ODD Sony AD-7580S TSST TS-L633A

RAM TranscendJM467Q643A-6/512MB

JM467Q643A-6/512MB Transcend

TS128MSQ64V6J/1G

TS128MSQ64V6J/1G










Page: 14 of 134

Item MODE 9


(LCD+HDMI 1440*900/60Hz)



HDD Fujitsu MHZ2160BH/160G Fujitsu MHZ2250BH/250G

ODD TSST TS-L633A Sony AD-7560S

RAM Transcend JM667QSU-2G/2G Unifosa GU331G0ALEPR612F/1G

GU331G0ALEPR612F/1G









Item MODE 11

(LCD+D-SUB 1440*900/60Hz) MODE 12

(LCD+D-SUB 1440*900/60Hz)


LCD CMO N170C2-L02 AU B17PW03 V3

HDD Fujitsu MHZ2320BH/320G Toshiba MK1252GSX/120G


RAM Unifosa GU332G0ALEPR8H2F/2G Unifosa GU331G0AJEPN6E2F/1G

GU331G0AJEPR612F/1G










Page: 15 of 134

Item MODE 13

(LCD+D-SUB 1440*900/60Hz) MODE 14

(LCD+D-SUB 1440*900/60Hz)



HDD Toshiba MK1652GSX/160G Toshiba MK2552GSX/250G


RAM Unifosa GU332G0AJEPR8H2F/2G Kingston D6408TEBGGL3U/512MB

KVR667D2S5/1G









Item MODE 15

(LCD+D-SUB 1440*900/60Hz) MODE 16

(LCD+D-SUB 1440*900/60Hz)



HDD Toshiba MK3252GSX/320G WD WD3200BEVT/320G


RAM Kingston

Samsung

KVR800D2S5/1G

M470T2864QZ3-CF7/1G Samsung

M470T2953EZ3-CE6/1G

M470T2864QZ3-CE6/1G










Page: 16 of 134

Item MODE 17

(LCD+D-SUB 1440*900/60Hz) MODE 18

(LCD+D-SUB 1440*900/60Hz)



HDD WD WD3200BEVT/320G WD WD1200BEVS/120G

ODD Sony AD-7580S Sony AD-7580S

RAM Samsung M470T5663QZ3-CE6/2G

M470T2864QZ3-CE6/1G Samsung M470T5663QZ3-CF7/2G









Item MODE 19

(LCD+D-SUB 1440*900/60Hz)

CPU Intel T1600/1.66GHz

LCD AU B17PW03 V3

HDD WD WD1600BEVS/160G

ODD Sony AD-7580S

RAM Hynix HYMP112S64CP6-Y5/1G

Battery SMP BTY-M52/5200 mAh

AC-adapter Delta ADP-90SB BB

Touch Pad Elantech 810406-5053

MDC Modem LSI D40

WLAN MSI MS-6890

Camera BISON BN29M5S8-000

Inverter Sampo YIVNMS0028D11--

Bluetooth MSI MS-6837D


Page: 17 of 134

1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the tested system (including

inserted cards) are:

Product Manufacturer Model No. Serial No. Power Cord

1 Notebook PC DELL PP04X C8YYM1S

Non-Shielded, 0.8m With

Core*1

2 Exchange

Network Sun Moon Star PX-4 95170087 Non-Shielded, 1.8m

3 Printer EPSON StyLus C63 FAPY094255 Non-Shielded, 1.8m

4 Monitor Dell 2408WFPb

CN-0NN792-74261-8

2S-0Y8S Non-Shielded, 1.8m

5 IPod nano Apple A1236 7K818WL4Y0P N/A

6 USB Mouse Logitech M-BE58 HCA30103100 N/A

7 Microphone &

Earphone PCHOME N/A N/A N/A

8 Walkman AIWA HS-TA164 N/A N/A

9 Monitor Dell 2407WFPb

CN-0FC255-46633-6

38-1MDS Non-Shielded, 1.8m


Page: 18 of 134

1.4. Configuration of Tested System

Connection Diagram

Signal Cable Type Signal cable Description

A Telecom Cable Non-Shielded, 7m

B LAN Cable Non-Shielded, 7m

C USB Cable Shielded, 1.5m

D HDMI Cable Shielded, 1m

E USB Cable Shielded, 1.2m

F USB Cable Shielded, 1.8m

G Earphone & Microphone Cable Non-Shielded, 1.6m

H Audio Cable Non-Shielded, 1.6m

I D-SUB Cable Shielded, 1.8m, with two ferrite cores bonded


Page: 19 of 134

1.5. EUT Exercise Software

1 Setup the EUT and peripheral as shown on Figure

2 Connect the power to EUT and peripherals, then turn on the power of all equipments.

3 Waiting for EUT to enter Window Windows Vista Operating System, and adjust the display resolution to the test mode.first.

4 Connect LAN and Telecom to Notebook PC for transmitting data.

5 Activate Wireless interface and Bluetooth function, and perform the wireless data communication with the other Notebook (write/delete action).

6 Connect 1394 to Slim Combo for transmitting data.

7 Run Windows Media Player program and play a disk with color Bar pattern

8 Run “H＂ pattern.

9 Begin to test and repeat the above procedure (4)~(8)


Page: 20 of 134

2. Technical Test

2.1. Summary of Test Result

No deviations from the test standards

Deviations from the test standards as below description:

Emission

Performed Item Normative References Test

Performed Deviation

Conducted Emission EN 55022:2006 Class B Yes No

Impedance Stabilization

Network

EN 55022:2006 Class B Yes No

Radiated Emission EN 55022:2006 Class B Yes No

Power Harmonics EN 61000-3-2:2006 Yes No

Voltage Fluctuation and

Flicker

EN 61000-3-3:1995+A1:2001+A2: 2005 Yes No

Immunity

Performed Item Normative References Test

Performed Deviation

Electrostatic Discharge IEC 61000-4-2 Edition 1.2: 2001-04 Yes No

Radiated susceptibility IEC 61000-4-3 Edition 3.0: 2006 Yes No

Electrical fast transient/burst IEC 61000-4-4:2004 Yes No

Surge IEC 61000-4-5 Edition 2.0: 2005 Yes No

Conducted susceptibility IEC 61000-4-6 Edition 2.2: 2006 Yes No

Power frequency magnetic

field

IEC 61000-4-8 Edition 1.1: 2001-03 Yes No

Voltage dips and interruption IEC 61000-4-11 2nd Edition: 2004-03 Yes No


Page: 21 of 134

2.2. List of Test Equipment Conducted Emission / SR1 Instrument Manufacturer Type No. Serial No Cal. Date EMI Test Receiver R&S ESCS 30 100366 2007/10/18 LISN R&S ENV4200 833209/007 2008/08/12 LISN R&S ENV216 100085 2008/02/14 Pulse Limiter R&S ESH3-Z2 357.88.10.52 2008/09/04

Impedance Stabilization Network / SR1 Instrument Manufacturer Type No. Serial No Cal. Date Capacitive Voltage Probe Schaffner CVP2200A 18331 2007/11/10 EMI Test Receiver R&S ESCS 30 100366 2007/10/18 LISN R&S ENV216 100085 2008/02/14 LISN R&S ENV4200 833209/007 2008/07/13 lmpedance Stabilization Network

Schaffner ISN T400 19099 2008/07/15

Pulse Limiter R&S ESH3-Z2 357.88.10.52 2008/09/04 RF Current Probe FCC F-65 10KHz~1GHz 198 2007/11/10 BALANCED TELECOM ISN FCC FCC-TLISN-T2-02 20316 2007/11/24 BALANCED TELECOM ISN FCC FCC-TLISN-T4-02 20317 2007/11/24 BALANCED TELECOM ISN FCC FCC-TLISN-T8-02 20319 2007/11/24

Radiated Emission / Site3 Instrument Manufacturer Type No. Serial No Cal. Date Bilog Antenna Schaffner Chase CBL6112B 2704 2008/09/15 Broadband Horn Antenna Schwarzbeck BBHA9170 208 2008/07/25 EMI Test Receiver R&S ESCS 30 838251/001 2008/03/22 Horn Antenna Schwarzbeck BBHA9120D 305 2008/08/10 Pre-Amplifier QTK N/A N/A 2008/01/03 Spectrum Analyzer Advantest R3162 101102468 2007/10/24 EMI Test Receiver R&S ESI 26 838786/004 2008/05/25

Pre-Amplifier MITEQ QMF-4D-180400-45-6P

925974 2008/01/03

Power Harmonics / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic)

Schaffner NSG 1007 HK54148 2008/06/23

IEC1000-4-X Analyzer(Flicker)

Schaffner CCN 1000-1 X7 1887 2008/06/23

Voltage Fluctuation and Flicker / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic)

Schaffner NSG 1007 HK54148 2008/06/23

IEC1000-4-X Analyzer(Flicker)

Schaffner CCN 1000-1 X7 1887 2008/06/23


Page: 22 of 134

Electrostatic Discharge / SR3 Instrument Manufacturer Type No. Serial No Cal. Date ESD simulator system TESEQ NSG 438 695 2008/01/17 Horizontal Coupling Plane(HCP)

QuieTek HCP AL50 N/A N/A

Vertical Coupling Plane(VCP)

QuieTek VCP AL50 N/A N/A

Radiated susceptibility / CB5 Instrument Manufacturer Type No. Serial No Cal. Date

AF-BOX R&S AF-BOX ACCUST

100007 N/A

Audio Analyzer R&S UPL 16 100137 2008/04/23 Bilog Antenna Schaffner Chase CBL6112B 2450 2008/01/03 Broad-Band Antenna Schwarzbeck VULB 9166 1085 2008/08/02 Biconilog Antenna EMCO 3149 00071675 2008/05/29 CMU200 UNIV.RADIOCOMM

R&S CMU200 104846 2008/04/23

Directional Coupler A&R DC 6180 22735 N/A Dual Microphone Supply B&K 5935 2426784 2008/08/04 Mouth Simulator B&K 4227 2439692 2008/08/04 Power Amplifier A&R 30S1G3 309453 N/A Power Amplifier A&R 100W10000M7 A285000010 N/A Power Amplifier SCHAFFNER CBA9413B 4020 N/A Power Amplifier AR 75A250A 0325371 N/A Power Meter R&S NRVD(P.M) 100219 2008/04/22 Pre-Amplifier A&R 150A220 23067 N/A Probe Microphone B&K 4182 2278070 2008/08/04

Signal Generator R&S SMY02(9K-2080)

825454/028 2007/09/22

Electrical fast transient/burst / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC immunity system Thermo N/A 411225 2007/12/01

Surge / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC immunity system Thermo EMCPRO PLUS 0411225 2007/12/01

Conducted susceptibility / SR6 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2070 RF-Generator

Schaffner N/A N/A 2008/04/21

Power frequency magnetic field / SR3 Instrument Manufacturer Type No. Serial No Cal. Date Induction Coil Interface Schaffner INA 2141 6002 N/A Magnetic Loop Coil Schaffner INA 702 160 N/A Triaxial ELF Magnetic Field Meter

F.B.BELL 4090 9852 2008/05/30


Page: 23 of 134

Voltage dips and interruption / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC immunity system Thermo EMCPRO PLUS 0411225 2007/12/01

Schaffner NSG 2050 System Mainframe Instrument Manufacturer Type No. Serial No Cal. Date Burst 4.8KV/16A Generator with CDN

Schaffner PNW2225 200123-098SC 2008/01/12

Damped osc. Wave 100kHz and 1MHz

Schaffner PNW2056 200124-058SC 2008/01/10

Double AC Source Variator Schaffner NSG 642A 30910014938 2008/01/15 Hybrid surge pulse 1.2/50uS

Schaffner PNW 2050 200117-013SC 2008/01/03

PQT Generator Schaffner PNW2003 200138-007SC 2008/01/15 Pulse COUPLING NETWORK

Schaffner CDN131 200124-007SC 2008/01/10

Schaffner NSG 2070 RF-Generator Instrument Manufacturer Type No. Serial No Cal. Date CDN Schaffner CAL U100A 20405 N/A CDN Schaffner TRA U150 20454 N/A CDN M016S Schaffner CAL U100A 20410 N/A CDN M016S Schaffner TRA U150 21167 N/A CDN T002 Schaffner CAL U100 20491 N/A CDN T002 Schaffner TRA U150 21169 N/A CDN T400 Schaffner CAL U100 17735 N/A CDN T400 Schaffner TRA U150 21166 N/A Coupling Decoupling Network

Schaffner CDN M016S 20822 2008/03/31

Coupling Decoupling Network

Schaffner CDN M016S 20823 2008/03/31


Schaffner CDN T002 19018 2008/03/31


Schaffner CDN T400 21226 2008/03/31

EM-CLAMP Schaffner KEMZ 801 21024 2008/03/31


Page: 24 of 134

2.3. Measurement Uncertainty

Conducted Emission

The measurement uncertainty is evaluated as ± 2.26 Db.

Impedance Stabilization Network

The measurement uncertainty is evaluated as ± 2.26 dB.

Radiated Emission

The measurement uncertainty is evaluated as ± 3.19 Db.

Electrostatic Discharge

As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025:

1999[2], the requirements for measurement uncertainty in ESD testing are deemed to have

been satisfied, and the testing is reported in accordance with the relevant ESD standards.

The immunity test signal from the ESD system meet the required specifications in IEC

61000-4-2 through the calibration report with the calibrated uncertainty for the waveform of

voltage and timing as being 1.63 % and 2.76%.

Radiated susceptibility


1999[2], the requirements for measurement uncertainty in RS testing are deemed to have

been satisfied, and the testing is reported in accordance with the relevant RS standards.

The immunity test signal from the RS system meet the required specifications in IEC

61000-4-3 through the calibration for the uniform field strength and monitoring for the test

level with the uncertainty evaluation report for the electrical filed strength as being 2.72 Db.

Electrical fast transient/burst


1999[2], the requirements for measurement uncertainty in EFT/Burst testing are deemed to

have been satisfied, and the testing is reported in accordance with the relevant EFT/Burst

standards. The immunity test signal from the EFT/Burst system meet the required

specifications in IEC 61000-4-4 through the calibration report with the calibrated uncertainty

for the waveform of voltage, frequency and timing as being 1.63 %, 2.8 　 10-10 and

2.76%.

Surge


1999[2], the requirements for measurement uncertainty in Surge testing are deemed to

have been satisfied, and the testing is reported in accordance with the relevant Surge

standards. The immunity test signal from the Surge system meet the required specifications

in IEC 61000-4-5 through the calibration report with the calibrated uncertainty for the

waveform of voltage and timing as being 1.63 % and 2.76%.


Page: 25 of 134

Conducted susceptibility


1999[2], the requirements for measurement uncertainty in CS testing are deemed to have

been satisfied, and the testing is reported in accordance with the relevant CS standards.

The immunity test signal from the CS system meet the required specifications in IEC

61000-4-6 through the calibration for unmodulated signal and monitoring for the test level

with the uncertainty evaluation report for the injected modulated signal level through CDN

and EM Clamp/Direct Injection as being 3.72 dB and 2.78 dB.

Power frequency magnetic field


1999[2], the requirements for measurement uncertainty in PFM testing are deemed to have

been satisfied, and the testing is reported in accordance with the relevant PFM standards.

The immunity test signal from the PFM system meet the required specifications in IEC

61000-4-8 through the calibration report with the calibrated uncertainty for the Gauss Meter

to verify the output level of magnetic field strength as being 2 %.

Voltage dips and interruption


1999[2], the requirements for measurement uncertainty in DIP testing are deemed to have

been satisfied, and the testing is reported in accordance with the relevant DIP standards.

The immunity test signal from the DIP system meet the required specifications in IEC

61000-4-11 through the calibration report with the calibrated uncertainty for the waveform of

voltage and timing as being 1.63 % and 2.76%.


Page: 26 of 134

2.4. Test Environment

Performed Item Items Required Actual

Temperature (C) 15-35 25

Conducted Emission Humidity (%RH) 25-75 50

Barometric pressure (mbar) 860-1060 950-1000


Impedance Stabilization

Network Humidity (%RH) 25-75 50



Radiated Emission Humidity (%RH) 25-75 50



Electrostatic Discharge Humidity (%RH) 30-60 52



Radiated susceptibility Humidity (%RH) 25-75 52



Electrical fast

transient/burst Humidity (%RH) 25-75 52



Surge Humidity (%RH) 10-75 52



Conducted susceptibility Humidity (%RH) 25-75 52



Power frequency magnetic

field Humidity (%RH) 25-75 52



Voltage dips and

interruption Humidity (%RH) 25-75 53



Page: 27 of 134

3. Conducted Emission (Main Terminals)

3.1. Test Specification

According to EMC Standard : EN 55022

3.2. Test Setup

3.3. Limit

Limits

Frequency (MHz)

QP (dBuV)

AV (dBuV)

0.15 - 0.50 66 - 56 56 – 46

0.50-5.0 56 46

5.0 - 30 60 50

Remarks: In the above table, the tighter limit applies at the band edges.


Page: 28 of 134

3.4. Test Procedure

The EUT and simulators are connected to the main power through a line impedance

stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the

measuring equipment. The peripheral devices are also connected to the main power through

a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination.

(Please refers to the block diagram of the test setup and photographs.)

Both sides of A.C. line are checked for maximum conducted interference. In order to find the

maximum emission, the relative positions of equipment and all of the interface cables must

be changed on conducted measurement.

Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz using

a receiver bandwidth of 9kHz.

3.5. Deviation from Test Standard

No deviation.


Page: 29 of 134

3.6. Test Result

Site : SR-1 Time : 2008/09/17 - 02:44

Limit : CISPR_B_00M_QP Margin : 10

EUT : Notebook Probe : ENV-216-L1 - Line1

Power : AC 230V/50Hz Note : Mode 1


Page: 30 of 134

Site : SR-1 Time : 2008/09/17 - 02:45




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.533 9.820 26.680 36.500 -19.500 56.000 QUASIPEAK

2 * 1.216 9.830 33.480 43.310 -12.690 56.000 QUASIPEAK

3 3.783 9.860 32.020 41.880 -14.120 56.000 QUASIPEAK

4 7.009 9.890 30.670 40.560 -19.440 60.000 QUASIPEAK

5 12.502 10.073 29.300 39.373 -20.627 60.000 QUASIPEAK

6 22.580 10.210 28.010 38.220 -21.780 60.000 QUASIPEAK

Note:

1. All Reading Levels are Quasi-Peak and average value.

2. " * ", means this data is the worst emission level.

3. Measurement Level = Reading Level + Correct Factor


Page: 31 of 134

Site : SR-1 Time : 2008/09/17 - 02:45

Limit : CISPR_B_00M_AV Margin : 0



Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.533 9.820 13.500 23.320 -22.680 46.000 AVERAGE

2 1.216 9.830 20.120 29.950 -16.050 46.000 AVERAGE

3 * 3.783 9.860 20.830 30.690 -15.310 46.000 AVERAGE

4 7.009 9.890 20.480 30.370 -19.630 50.000 AVERAGE

5 12.502 10.073 18.420 28.493 -21.507 50.000 AVERAGE

6 22.580 10.210 18.160 28.370 -21.630 50.000 AVERAGE

Note:





Page: 32 of 134

Site : SR-1 Time : 2008/09/17 - 02:46


EUT : Notebook Probe : ENV-216-N - Line2



Page: 33 of 134

Site : SR-1 Time : 2008/09/17 - 02:47




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.162 9.869 39.300 49.169 -16.488 65.657 QUASIPEAK

2 0.392 9.840 31.920 41.760 -17.326 59.086 QUASIPEAK

3 1.166 9.830 25.400 35.230 -20.770 56.000 QUASIPEAK

4 * 3.935 9.860 31.940 41.800 -14.200 56.000 QUASIPEAK

5 11.431 9.966 26.770 36.736 -23.264 60.000 QUASIPEAK

6 21.459 10.080 25.330 35.410 -24.590 60.000 QUASIPEAK

Note:





Page: 34 of 134

Site : SR-1 Time : 2008/09/17 - 02:47




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.162 9.869 23.080 32.949 -22.708 55.657 AVERAGE

2 * 0.392 9.840 24.110 33.950 -15.136 49.086 AVERAGE

3 1.166 9.830 14.160 23.990 -22.010 46.000 AVERAGE

4 3.935 9.860 19.040 28.900 -17.100 46.000 AVERAGE

5 11.431 9.966 15.620 25.586 -24.414 50.000 AVERAGE

6 21.459 10.080 16.350 26.430 -23.570 50.000 AVERAGE

Note:





Page: 35 of 134

Site : SR1 Time : 2008/09/19 - 01:07





Page: 36 of 134

Site : SR1 Time : 2008/09/19 - 01:08




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.502 9.820 39.400 49.220 -6.780 56.000 QUASIPEAK

2 0.548 9.820 31.680 41.500 -14.500 56.000 QUASIPEAK

3 0.904 9.830 32.430 42.260 -13.740 56.000 QUASIPEAK

4 1.005 9.830 35.760 45.590 -10.410 56.000 QUASIPEAK

5 2.056 9.850 29.400 39.250 -16.750 56.000 QUASIPEAK

6 6.041 9.880 19.690 29.570 -30.430 60.000 QUASIPEAK

Note:





Page: 37 of 134

Site : SR1 Time : 2008/09/19 - 01:08




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.502 9.820 22.530 32.350 -13.650 46.000 AVERAGE

2 0.548 9.820 15.010 24.830 -21.170 46.000 AVERAGE

3 0.904 9.830 17.550 27.380 -18.620 46.000 AVERAGE

4 1.005 9.830 18.980 28.810 -17.190 46.000 AVERAGE

5 2.056 9.850 21.500 31.350 -14.650 46.000 AVERAGE

6 6.041 9.880 12.360 22.240 -27.760 50.000 AVERAGE

Note:





Page: 38 of 134

Site : SR1 Time : 2008/09/19 - 01:08





Page: 39 of 134

Site : SR1 Time : 2008/09/19 - 01:10




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.517 9.830 38.940 48.770 -7.230 56.000 QUASIPEAK

2 1.076 9.830 32.780 42.610 -13.390 56.000 QUASIPEAK

3 2.041 9.850 27.990 37.840 -18.160 56.000 QUASIPEAK

4 3.556 9.860 24.990 34.850 -21.150 56.000 QUASIPEAK

5 4.455 9.870 20.050 29.920 -26.080 56.000 QUASIPEAK

6 13.244 10.170 16.410 26.580 -33.420 60.000 QUASIPEAK

Note:





Page: 40 of 134

Site : SR1 Time : 2008/09/19 - 01:10




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.517 9.830 19.620 29.450 -16.550 46.000 AVERAGE

2 1.076 9.830 17.010 26.840 -19.160 46.000 AVERAGE

3 * 2.041 9.850 20.480 30.330 -15.670 46.000 AVERAGE

4 3.556 9.860 17.660 27.520 -18.480 46.000 AVERAGE

5 4.455 9.870 11.280 21.150 -24.850 46.000 AVERAGE

6 13.244 10.170 9.640 19.810 -30.190 50.000 AVERAGE

Note:





Page: 41 of 134

3.7. Test Photograph Test Mode : Mode 1

Description : Front View of Conducted Test

Test Mode : Mode 1

Description : Back View of Conducted Test


Page: 42 of 134

Test Mode : Mode 2

Description : Front View of Conducted Test

Test Mode : Mode 2

Description : Back View of Conducted Test


Page: 43 of 134

4. Conducted Emissions (Telecommunication Ports)



4.2. Test Setup

4.3. Limit

Limits

Frequency (MHz)

QP (dBuV)

AV (dBuV)

0.15 - 0.50 84 – 74 74 – 64

0.50 - 30 74 64

Remarks:

The limit decreases linearly with the logarithm of the frequency in the range 0.15 MHz~0.50

MHz.


Page: 44 of 134

4.4. Test Procedure

Telecommunication Port:

The mains voltage shall be supplied to the EUT via the LISN when the measurement of

telecommunication port is performed. The common mode disturbances at the

telecommunication port shall be connected to the ISN, which is 150 ohm impedance.

Both alternative cables are tested related to the LCL requested. The measurement range is

from 150kHz to 30MHz. The bandwidth of measurement is set to 9kHz.

The 75dB LCL ISN is used for cat. 6 cable, the 65dB LCL ISN is used for cat. 5 cable, 55dB

LCL ISN is used for cat. 3.


No deviation.


Page: 45 of 134

4.6. Test Result

Site : SR-1 Time : 2008/09/17 - 02:07

Limit : ISN_Voltage_B_00M_QP Margin : 10

EUT : Notebook Probe : ISN-T2 - Line1

Power : AC 230V/50Hz Note : Mode 1, ISN Telecom


Page: 46 of 134

Site : SR-1 Time : 2008/09/17 - 02:09




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.431 9.966 51.360 61.326 -14.645 75.971 QUASIPEAK

2 0.642 9.940 48.140 58.080 -15.920 74.000 QUASIPEAK

3 0.947 9.930 55.080 65.010 -8.990 74.000 QUASIPEAK

4 1.543 9.920 57.660 67.580 -6.420 74.000 QUASIPEAK

5 * 2.611 9.920 58.120 68.040 -5.960 74.000 QUASIPEAK

6 5.228 9.900 43.180 53.080 -20.920 74.000 QUASIPEAK

Note:





Page: 47 of 134

Site : SR-1 Time : 2008/09/17 - 02:09

Limit : ISN_Voltage_B_00M_AV Margin : 0



Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.431 9.966 51.330 61.296 -4.675 65.971 AVERAGE

2 0.642 9.940 33.890 43.830 -20.170 64.000 AVERAGE

3 0.947 9.930 45.790 55.720 -8.280 64.000 AVERAGE

4 * 1.543 9.920 50.160 60.080 -3.920 64.000 AVERAGE

5 2.611 9.920 47.450 57.370 -6.630 64.000 AVERAGE

6 5.228 9.900 33.700 43.600 -20.400 64.000 AVERAGE

Note:





Page: 48 of 134

Site : SR-1 Time : 2008/09/17 - 02:40



Power : AC 230V/50Hz Note : Mode 1,ISN 10Mbps


Page: 49 of 134

Site : SR-1 Time : 2008/09/17 - 02:41




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.447 9.910 51.430 61.340 -14.174 75.514 QUASIPEAK

2 0.939 9.900 50.700 60.600 -13.400 74.000 QUASIPEAK

3 * 2.439 9.910 54.260 64.170 -9.830 74.000 QUASIPEAK

4 6.248 9.870 44.250 54.120 -19.880 74.000 QUASIPEAK

5 10.000 9.850 39.800 49.650 -24.350 74.000 QUASIPEAK

6 12.502 9.953 50.470 60.423 -13.577 74.000 QUASIPEAK

Note:





Page: 50 of 134

Site : SR-1 Time : 2008/09/17 - 02:41




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.447 9.910 39.970 49.880 -15.634 65.514 AVERAGE

2 0.939 9.900 31.210 41.110 -22.890 64.000 AVERAGE

3 * 2.439 9.910 40.300 50.210 -13.790 64.000 AVERAGE

4 6.248 9.870 32.720 42.590 -21.410 64.000 AVERAGE

5 10.000 9.850 27.750 37.600 -26.400 64.000 AVERAGE

6 12.502 9.953 37.920 47.873 -16.127 64.000 AVERAGE

Note:





Page: 51 of 134

Site : SR-1 Time : 2008/09/17 - 02:37



Power : AC 230V/50Hz Note : Mode 1, ISN 100Mbps


Page: 52 of 134

Site : SR-1 Time : 2008/09/17 - 02:38




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.505 9.900 49.480 59.380 -14.620 74.000 QUASIPEAK

2 0.865 9.900 51.450 61.350 -12.650 74.000 QUASIPEAK

3 1.259 9.900 52.320 62.220 -11.780 74.000 QUASIPEAK

4 * 2.435 9.910 54.900 64.810 -9.190 74.000 QUASIPEAK

5 5.173 9.880 42.010 51.890 -22.110 74.000 QUASIPEAK

6 16.228 10.000 50.970 60.970 -13.030 74.000 QUASIPEAK

Note:





Page: 53 of 134

Site : SR-1 Time : 2008/09/17 - 02:38




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.505 9.900 42.270 52.170 -11.830 64.000 AVERAGE

2 0.865 9.900 46.330 56.230 -7.770 64.000 AVERAGE

3 1.259 9.900 36.810 46.710 -17.290 64.000 AVERAGE

4 2.435 9.910 38.860 48.770 -15.230 64.000 AVERAGE

5 5.173 9.880 35.830 45.710 -18.290 64.000 AVERAGE

6 * 16.228 10.000 48.880 58.880 -5.120 64.000 AVERAGE

Note:





Page: 54 of 134

Site : SR-1 Time : 2008/09/17 - 02:34



Power : AC 230V/50Hz Note : Mode 1, ISN 1G


Page: 55 of 134

Site : SR-1 Time : 2008/09/17 - 02:35




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.838 10.070 53.450 63.520 -10.480 74.000 QUASIPEAK

2 1.486 10.040 53.480 63.520 -10.480 74.000 QUASIPEAK

3 * 2.283 10.010 55.730 65.740 -8.260 74.000 QUASIPEAK

4 2.939 10.000 51.420 61.420 -12.580 74.000 QUASIPEAK

5 5.291 9.980 42.650 52.630 -21.370 74.000 QUASIPEAK

6 7.705 9.990 35.910 45.900 -28.100 74.000 QUASIPEAK

Note:





Page: 56 of 134

Site : SR-1 Time : 2008/09/17 - 02:35




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.838 10.070 48.170 58.240 -5.760 64.000 AVERAGE

2 1.486 10.040 39.580 49.620 -14.380 64.000 AVERAGE

3 2.283 10.010 43.880 53.890 -10.110 64.000 AVERAGE

4 2.939 10.000 36.650 46.650 -17.350 64.000 AVERAGE

5 5.291 9.980 33.730 43.710 -20.290 64.000 AVERAGE

6 7.705 9.990 28.610 38.600 -25.400 64.000 AVERAGE

Note:





Page: 57 of 134

Site : SR-1 Time : 2008/09/17 - 01:56





Page: 58 of 134

Site : SR-1 Time : 2008/09/17 - 02:01




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.435 9.964 52.990 62.954 -12.903 75.857 QUASIPEAK

2 0.873 9.938 48.670 58.608 -15.392 74.000 QUASIPEAK

3 1.744 9.920 40.870 50.790 -23.210 74.000 QUASIPEAK

4 2.220 9.920 38.550 48.470 -25.530 74.000 QUASIPEAK

5 10.189 9.880 32.740 42.620 -31.380 74.000 QUASIPEAK

6 24.002 10.040 32.290 42.330 -31.670 74.000 QUASIPEAK

Note:





Page: 59 of 134

Site : SR-1 Time : 2008/09/17 - 02:01




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.435 9.965 52.879 62.844 -3.013 65.857 AVERAGE

2 0.873 9.938 48.660 58.598 -5.402 64.000 AVERAGE

3 1.744 9.920 40.290 50.210 -13.790 64.000 AVERAGE

4 2.220 9.920 32.030 41.950 -22.050 64.000 AVERAGE

5 10.189 9.880 27.790 37.670 -26.330 64.000 AVERAGE

6 24.002 10.040 30.610 40.650 -23.350 64.000 AVERAGE

Note:





Page: 60 of 134

Site : SR-1 Time : 2008/09/17 - 01:37





Page: 61 of 134

Site : SR-1 Time : 2008/09/17 - 01:38




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.627 9.900 46.430 56.330 -17.670 74.000 QUASIPEAK

2 2.220 9.910 45.460 55.370 -18.630 74.000 QUASIPEAK

3 6.252 9.870 46.690 56.560 -17.440 74.000 QUASIPEAK

4 8.752 9.860 47.650 57.510 -16.490 74.000 QUASIPEAK

5 10.000 9.850 40.040 49.890 -24.110 74.000 QUASIPEAK

6 * 12.502 9.953 49.430 59.383 -14.617 74.000 QUASIPEAK

Note:





Page: 62 of 134

Site : SR-1 Time : 2008/09/17 - 01:38




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.627 9.900 44.430 54.330 -9.670 64.000 AVERAGE

2 2.220 9.910 39.650 49.560 -14.440 64.000 AVERAGE

3 6.252 9.870 35.130 45.000 -19.000 64.000 AVERAGE

4 8.752 9.860 34.540 44.400 -19.600 64.000 AVERAGE

5 10.000 9.850 27.280 37.130 -26.870 64.000 AVERAGE

6 12.502 9.953 36.220 46.173 -17.827 64.000 AVERAGE

Note:





Page: 63 of 134

Site : SR-1 Time : 2008/09/17 - 01:39





Page: 64 of 134

Site : SR-1 Time : 2008/09/17 - 01:40




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.170 9.963 45.590 55.553 -27.876 83.429 QUASIPEAK

2 0.627 9.900 46.130 56.030 -17.970 74.000 QUASIPEAK

3 2.212 9.910 46.250 56.160 -17.840 74.000 QUASIPEAK

4 8.716 9.860 44.390 54.250 -19.750 74.000 QUASIPEAK

5 * 16.228 10.000 50.230 60.230 -13.770 74.000 QUASIPEAK

6 23.127 9.970 48.690 58.660 -15.340 74.000 QUASIPEAK

Note:





Page: 65 of 134

Site : SR-1 Time : 2008/09/17 - 01:40




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.170 9.963 43.910 53.873 -19.556 73.429 AVERAGE

2 0.627 9.900 44.300 54.200 -9.800 64.000 AVERAGE

3 2.212 9.910 42.630 52.540 -11.460 64.000 AVERAGE

4 8.716 9.860 41.270 51.130 -12.870 64.000 AVERAGE

5 * 16.228 10.000 47.700 57.700 -6.300 64.000 AVERAGE

6 23.127 9.970 46.260 56.230 -7.770 64.000 AVERAGE

Note:





Page: 66 of 134

Site : SR-1 Time : 2008/09/17 - 01:41





Page: 67 of 134

Site : SR-1 Time : 2008/09/17 - 01:42




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.173 10.194 44.040 54.234 -29.109 83.343 QUASIPEAK

2 0.396 10.128 43.320 53.448 -23.523 76.971 QUASIPEAK

3 * 0.627 10.090 46.550 56.640 -17.360 74.000 QUASIPEAK

4 1.177 10.050 42.400 52.450 -21.550 74.000 QUASIPEAK

5 2.216 10.010 46.390 56.400 -17.600 74.000 QUASIPEAK

6 29.857 10.030 36.820 46.850 -27.150 74.000 QUASIPEAK

Note:





Page: 68 of 134

Site : SR-1 Time : 2008/09/17 - 01:42




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.173 10.194 42.070 52.264 -21.079 73.343 AVERAGE

2 0.396 10.128 38.850 48.978 -17.993 66.971 AVERAGE

3 * 0.627 10.090 44.890 54.980 -9.020 64.000 AVERAGE

4 1.177 10.050 38.270 48.320 -15.680 64.000 AVERAGE

5 2.216 10.010 41.290 51.300 -12.700 64.000 AVERAGE

6 29.857 10.030 31.630 41.660 -22.340 64.000 AVERAGE

Note:





Page: 69 of 134


Description : Front View of ISN Test

Test Mode : Mode 1

Description : Back View of ISN Test


Page: 70 of 134

Test Mode : Mode 2

Description : Front View of ISN Test

Test Mode : Mode 2

Description : Back View of ISN Test


Page: 71 of 134

5. Radiated Emission



5.2. Test Setup

5.3. Limit

Limits

Frequency (MHz)

Distance (m) dBuV/m

30 – 230 10 30

230 – 1000 10 37

Remark:

1. The tighter limit shall apply at the edge between two frequency bands.

2. Distance refers to the distance in meters between the measuring instrument antenna

and the closed point of any part of the device or system.


Page: 72 of 134

5.4. Test Procedure

The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The

turn table can rotate 360 degrees to determine the position of the maximum emission level.

The EUT was positioned such that the distance from antenna to the EUT was 10 meters.

The antenna can move up and down between 1 meter and 4 meters to find out the maximum

emission level.

Both horizontal and vertical polarization of the antenna are set on measurement. In order to

find the maximum emission, all of the interface cables must be manipulated on radiated

measurement.

Radiated emissions were invested over the frequency range from 30MHz to1GHz using a

receiver bandwidth of 120kHz. Radiated was performed at an antenna to EUT distance of 10

meters.


No deviation.


Page: 73 of 134

5.6. Test Result Site : OATS-3 Time : 2008/09/17 - 04:27


EUT : Notebook Probe : 2007_Site3(2921)_10M - HORIZONTAL


Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 178.185 12.480 14.180 26.659 -3.341 30.000 QUASIPEAK

2 240.000 15.590 6.870 22.460 -14.540 37.000 QUASIPEAK

3 445.526 20.988 12.890 33.878 -3.122 37.000 QUASIPEAK

4 648.000 24.310 9.140 33.450 -3.550 37.000 QUASIPEAK

5 * 742.555 25.492 8.400 33.892 -3.108 37.000 QUASIPEAK

6 840.056 26.860 2.210 29.070 -7.930 37.000 QUASIPEAK

Note:

1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or

average measurements as necessary.




Page: 74 of 134

Site : OATS-3 Time : 2008/09/17 - 04:35


EUT : Notebook Probe : 2007_Site3(2921)_10M - VERTICAL


Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 178.185 12.480 14.020 26.499 -3.501 30.000 QUASIPEAK

2 240.000 15.590 12.500 28.090 -8.910 37.000 QUASIPEAK

3 445.526 20.988 8.200 29.188 -7.812 37.000 QUASIPEAK

4 480.000 21.668 7.500 29.168 -7.832 37.000 QUASIPEAK

5 * 742.548 25.492 8.360 33.852 -3.148 37.000 QUASIPEAK

6 891.058 27.544 6.180 33.724 -3.276 37.000 QUASIPEAK

Note:






Page: 75 of 134

Site : OATS-3 Time : 2008/09/17 - 03:52


EUT : Notebook Probe : 2007_Site3(2921)_10M - HORIZONTAL


Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 178.186 12.480 14.420 26.899 -3.101 30.000 QUASIPEAK

2 222.761 14.350 12.490 26.841 -3.159 30.000 QUASIPEAK

3 * 371.273 19.305 14.600 33.905 -3.095 37.000 QUASIPEAK

4 519.778 22.408 10.220 32.629 -4.371 37.000 QUASIPEAK

5 742.542 25.492 3.300 28.792 -8.208 37.000 QUASIPEAK

6 816.800 26.542 4.510 31.053 -5.947 37.000 QUASIPEAK

7 965.309 28.552 4.990 33.542 -3.458 37.000 QUASIPEAK

Note:






Page: 76 of 134

Site : OATS-3 Time : 2008/09/17 - 03:37


EUT : Notebook Probe : 2007_Site3(2921)_10M - VERTICAL


Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 178.182 12.480 14.280 26.759 -3.241 30.000 QUASIPEAK

2 * 222.766 14.351 12.500 26.851 -3.149 30.000 QUASIPEAK

3 371.270 19.304 13.330 32.635 -4.365 37.000 QUASIPEAK

4 519.780 22.408 9.820 32.229 -4.771 37.000 QUASIPEAK

5 671.255 24.570 2.690 27.260 -9.740 37.000 QUASIPEAK

6 816.800 26.542 4.530 31.073 -5.927 37.000 QUASIPEAK

7 965.308 28.552 4.910 33.462 -3.538 37.000 QUASIPEAK

Note:






Page: 77 of 134


Description : Front View of Radiated Test

Test Mode : Mode 1

Description : Back View of Radiated Test


Page: 78 of 134

Test Mode : Mode 2

Description : Front View of Radiated Test

Test Mode : Mode 2

Description : Back View of Radiated Test


Page: 79 of 134

6. Harmonic Current Emission


According to EMC Standard : EN 61000-3-2

6.2. Test Setup

6.3. Limit

(a) Limits of Class A Harmonics Currents

Harmonics

Order

n

Maximum Permissible

harmonic current

A

Harmonics

Order

n

Maximum Permissible

harmonic current

A

Odd harmonics Even harmonics

3 2.30 2 1.08

5 1.14 4 0.43

7 0.77 6 0.30

9 0.40 8 n 40 0.23 * 8/n

11 0.33

13 0.21

15 n 39 0.15 * 15/n


Page: 80 of 134

(b) Limits of Class B Harmonics Currents

For Class B equipment, the harmonic of the input current shall not exceed the maximum

permissible values given in table that is the limit of Class A multiplied by a factor of 1.5.

(c) Limits of Class C Harmonics Currents

Harmonics Order

n

Maximum Permissible harmonic current

Expressed as a percentage of the input

current at the fundamental frequency

％

2 2

3 30．λ＊

5 10

7 7

9 5

11 n 39

(odd harmonics only) 3

＊λ is the circuit power factor

(d) Limits of Class D Harmonics Currents

Harmonics Order

n

Maximum Permissible

harmonic current per watt

mA/W

Maximum Permissible

harmonic current

A

3 3.4 2.30

5 1.9 1.14

7 1.0 0.77

9 0.5 0.40

11 0.35 0.33

11 n 39

(odd harmonics only) 3.85/n See limit of Class A


Page: 81 of 134

6.4. Test Procedure

The EUT is supplied in series with power analyzer from a power source having the same

normal voltage and frequency as the rated supply voltage and the equipment under test.

And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be

performed.


No deviation.


Page: 82 of 134

6.6. Test Result Product Notebook

Test Item Power Harmonics

Test Mode Mode 1

Date of Test 2008/09/20 Test Site No.3 Shielded Room

Test Result: N/L Source qualification: Normal

Current & voltage waveforms

-0.6

-0.4

-0.2

0.0

0.2

0.4

0.6

-300

-200

-100

0

100

200

300

Cu

rre

nt (A

mp

s)

Vo

ltag

e (V

olts)

Harmonics and Class D limit line European Limits

0.00

0.05

0.10

0.15

0.20

0.25

0.30

0.35

Cu

rre

nt R

MS

(Am

ps)

Harmonic #4 8 12 16 20 24 28 32 36 40

Test result: N/L Worst harmonic was #3 with 0.00% of the limit.


Page: 83 of 134

Test Result: N/L Source qualification: Normal THC(A): 0.00 I-THD(%): 0.00 POHC(A): 0.000 POHC Limit(A): 0.000 Highest parameter values during test:

V_RMS (Volts): 229.72 Frequency(Hz): 50.00 I_Peak (Amps): 0.596 I_RMS (Amps): 0.342 I_Fund (Amps): 0.284 Crest Factor: 2.061 Power (Watts): 72.1 Power Factor: 0.919

Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status 2 0.006 3 0.098 0.245 0.0 0.096 0.368 0.00 N/L 4 0.001 5 0.014 0.137 0.0 0.010 0.206 0.00 N/L 6 0.002 7 0.010 0.072 0.0 0.011 0.108 0.00 N/L 8 0.001 9 0.009 0.036 0.0 0.008 0.054 0.00 N/L 10 0.001 11 0.004 0.025 0.0 0.003 0.038 0.00 N/L 12 0.001 13 0.003 0.022 0.0 0.003 0.032 0.00 N/L 14 0.001 15 0.003 0.019 0.0 0.003 0.028 0.00 N/L 16 0.001 17 0.002 0.017 0.0 0.001 0.025 0.00 N/L 18 0.001 19 0.002 0.015 0.0 0.002 0.022 0.00 N/L 20 0.001 21 0.002 0.013 0.0 0.001 0.020 0.00 N/L 22 0.001 23 0.001 0.012 0.0 0.001 0.018 0.00 N/L 24 0.000 25 0.001 0.011 0.0 0.001 0.017 0.00 N/L 26 0.000 27 0.001 0.010 0.0 0.001 0.015 0.00 N/L 28 0.000 29 0.001 0.010 0.0 0.001 0.014 0.00 N/L 30 0.000 31 0.001 0.009 0.0 0.001 0.013 0.00 N/L 32 0.000 33 0.001 0.008 0.0 0.001 0.013 0.00 N/L 34 0.000 35 0.001 0.008 0.0 0.001 0.012 0.00 N/L 36 0.000 37 0.001 0.007 0.0 0.000 0.011 0.00 N/L 38 0.000 39 0.001 0.007 0.0 0.000 0.011 0.00 N/L 40 0.000

1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the

same window as the maximum harmonics/limit ratio.

2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power

>75W. Others the result should be pass.


Page: 84 of 134

Product Notebook

Test Item Power Harmonics

Test Mode Mode 2


Test Result: Pass Source qualification: Normal

Current & voltage waveforms

-1.5

-1.0

-0.5

0.0

0.5

1.0

1.5

-300

-200

-100

0

100

200

300

Cu

rre

nt (A

mp

s)

Vo

ltag

e (V

olts)

Harmonics and Class D limit line European Limits

0.000.050.100.150.200.250.300.350.400.45

Cu

rre

nt R

MS

(Am

ps)

Harmonic #4 8 12 16 20 24 28 32 36 40

Test result: Pass Worst harmonic was #3 with 62.12% of the limit.


Page: 85 of 134

Test Result: Pass Source qualification: Normal THC(A): 0.18 I-THD(%): 49.42 POHC(A): 0.002 POHC Limit(A): 0.040 Highest parameter values during test:

V_RMS (Volts): 229.71 Frequency(Hz): 50.00 I_Peak (Amps): 1.127 I_RMS (Amps): 0.468 I_Fund (Amps): 0.406 Crest Factor: 2.549 Power (Watts): 92.5 Power Factor: 0.861

Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status 2 0.003 3 0.182 0.315 57.8 0.164 0.472 41.42 Pass 4 0.002 5 0.024 0.176 13.5 0.021 0.264 9.86 Pass 6 0.001 7 0.011 0.093 11.8 0.010 0.139 8.66 Pass 8 0.001 9 0.005 0.046 10.6 0.005 0.069 8.80 Pass 10 0.001 11 0.002 0.032 7.0 0.002 0.049 6.47 Pass 12 0.001 13 0.004 0.028 13.1 0.003 0.041 10.26 Pass 14 0.001 15 0.001 0.024 3.9 0.001 0.036 3.82 Pass 16 0.001 17 0.002 0.021 7.2 0.002 0.031 6.42 Pass 18 0.001 19 0.001 0.019 6.9 0.001 0.028 6.52 Pass 20 0.001 21 0.001 0.017 4.3 0.001 0.025 4.15 Pass 22 0.001 23 0.001 0.015 7.7 0.001 0.023 7.21 Pass 24 0.001 25 0.001 0.014 5.0 0.001 0.021 4.88 Pass 26 0.001 27 0.001 0.013 4.9 0.001 0.020 4.97 Pass 28 0.001 29 0.001 0.012 5.7 0.001 0.018 5.65 Pass 30 0.001 31 0.001 0.011 5.4 0.001 0.017 5.66 Pass 32 0.001 33 0.001 0.011 7.1 0.001 0.016 6.29 Pass 34 0.001 35 0.000 0.010 4.0 0.000 0.015 4.25 Pass 36 0.000 37 0.000 0.010 4.3 0.000 0.014 4.28 Pass 38 0.001 39 0.001 0.009 6.3 0.000 0.014 7.00 Pass 40 0.001

1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the

same window as the maximum harmonics/limit ratio.

2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power

>75W. Others the result should be pass.


Page: 86 of 134


Description : Power Harmonics Test Setup

Test Mode : Mode 2

Description : Power Harmonics Test Setup


Page: 87 of 134

7. Voltage Fluctuation and Flicker


According to EMC Standard : EN 61000-3-3

7.2. Test Setup

7.3. Limit

The following limits apply:

－ the value of Pst shall not be greater than 1.0;

－ the value of Plt shall not be greater than 0.65;

－ the value of d(t) during a voltage change shall not exceed 3.3 ％ for more than 500

ms;

－ the relative steady-state voltage change, dc, shall not exceed 3.3 ％;

－ the maximum relative voltage change, dmax, shall not exceed;

a) 4 ％ without additional conditions;

b) 6 ％ for equipment which is:

－ switched manually, or

－ switched automatically more frequently than twice per day, and also has either a

delayed restart (the delay being not less than a few tens of seconds), or manual restart,

after a power supply interruption.

NOTE The cycling frequency will be further limited by the Pst and P1t limit.

For example: a dmax of 6％producing a rectangular voltage change characteristic twice per

hour will give a P1t of about 0.65.


Page: 88 of 134

c) 7 ％ for equipment which is:

－ attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment

such as mixers, garden equipment such as lawn mowers, portable tools such as

electric drills), or

－ switched on automatically, or is intended to be switched on manually, no more than

twice per day, and also has either a delayed restart (the delay being not less than a

few tens of seconds) or manual restart, after a power supply interruption.

Pst and P1t requirements shall not be applied to voltage changes caused by manual switching.

7.4. Test Procedure

The EUT is supplied in series with power analyzer from a power source having the same

normal voltage and frequency as the rated supply voltage and the equipment under test.

And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be

performed.


No deviation.


Page: 89 of 134


Test Item Voltage Fluctuation and Flicker

Test Mode Mode 1

Date of Test 2008/09/20 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Psti and limit line European Limits

0.25

0.50

0.75

1.00

Pst

1:3

0:5

7

Plt and limit line

0.00

0.25

0.50

Plt

1:3

0:5

7

Parameter values recorded during the test: Vrms at the end of test (Volt): 229.61 Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (mS): 500.0 Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): 0.064 Test limit: 1.000 Pass Highest Plt (2 hr. period): 0.028 Test limit: 0.650 Pass


Page: 90 of 134

Product Notebook

Test Item Voltage Fluctuation and Flicker

Test Mode Mode 2

Date of Test 2008/09/20 Test Site No.3 Shielded Room Test Result: Pass Status: Test Completed Psti and limit line European Limits

0.25

0.50

0.75

1.00

Pst

0:5

6:3

8

Plt and limit line

0.00

0.25

0.50

Plt

0:5

6:3

8

Parameter values recorded during the test: Vrms at the end of test (Volt): 229.61 Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (mS): 500.0 Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): 0.064 Test limit: 1.000 Pass Highest Plt (2 hr. period): 0.028 Test limit: 0.650 Pass


Page: 91 of 134


Description : Flicker Test Setup

Test Mode : Mode 2

Description : Flicker Test Setup


Page: 92 of 134

8. Electrostatic Discharge


According to Standard : IEC 61000-4-2

8.2. Test Setup

8.3. Limit

Item Environmental

Phenomena

Units Test Specification Performance

Criteria

Enclosure Port

Electrostatic Discharge kV(Charge Voltage) ±8 Air Discharge

±4 Contact Discharge B


Page: 93 of 134

8.4. Test Procedure

Direct application of discharges to the EUT:

Contact discharge was applied only to conductive surfaces of the EUT.

Air discharges were applied only to non-conductive surfaces of the EUT.

During the test, it was performed with single discharges. For the single discharge

time between successive single discharges will be keep longer 1 second. It was at

least ten single discharges with positive and negative at the same selected point.

The selected point, which was performed with electrostatic discharge, was marked

on the red label of the EUT.

Indirect application of discharges to the EUT:

Vertical Coupling Plane (VCP):

The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned

at a distance 0.1m from, the EUT, with the Discharge Electrode touching the

coupling plane.

The four faces of the EUT will be performed with electrostatic discharge. It was at


Horizontal Coupling Plane (HCP):

The coupling plane is placed under to the EUT. The generator shall be positioned

vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching

the coupling plane.

The four faces of the EUT will be performed with electrostatic discharge. It was at



No deviation.


Page: 94 of 134


Test Item Electrostatic Discharge

Test Mode Mode 1


Item Amount of

Discharge Voltage

Required

Criteria

Complied To

Criteria

(A,B,C)

Results

Air Discharge 10

10

+8kV

-8kV

B

B

A

A

Pass

Pass

Contact Discharge 25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(HCP)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Front)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Left)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Back)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Right)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Note:

The testing performed is from lowest level up to the highest level as required by standard,

but only highest level is shown on the report. NR: No Requirement

Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information

EUT stopped operation and could / could not be reset by operator at kV. No false alarms or other malfunctions were observed during or after the test.

Remark:

The Contact discharges were applied at least total 200 discharges at a minimum of four

test points.


Page: 95 of 134

Product Notebook

Test Item Electrostatic Discharge

Test Mode Mode 2


Item Amount of

Discharge Voltage

Required

Criteria

Complied To

Criteria

(A,B,C)

Results

Air Discharge 10

10

+8kV

-8kV

B

B

A

A

Pass

Pass

Contact Discharge 25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(HCP)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Front)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Left)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Back)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Right)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Note:

The testing performed is from lowest level up to the highest level as required by standard,

but only highest level is shown on the report. NR: No Requirement


EUT stopped operation and could / could not be reset by operator at kV. No false alarms or other malfunctions were observed during or after the test.

Remark:

The Contact discharges were applied at least total 200 discharges at a minimum of four

test points.


Page: 96 of 134


Description : ESD Test Setup

Test Mode : Mode 2

Description : ESD Test Setup


Page: 97 of 134

9. Radiated Susceptibility



9.2. Test Setup

9.3. Limit

Item Environmental

Phenomena

Units Test

Specification

Performance

Criteria

Enclosure Port

Radio-Frequency

Electromagnetic Field

Amplitude Modulated

MHz

V/m(Un-modulated, rms)

% AM (1kHz)

80-1000

3

80

A


Page: 98 of 134

9.4. Test Procedure

The EUT and load, which are placed on a table that is 0.8 meter above ground, are

placed with one coincident with the calibration plane such that the distance from

antenna to the EUT was 3 meters.

Both horizontal and vertical polarization of the antenna and four sides of the EUT are set

on measurement.

In order to judge the EUT performance, a CCD camera is used to monitor EUT screen.

All the scanning conditions are as follows:

Condition of Test Remarks

1. Field Strength 3 V/m Level 2

2. Radiated Signal AM 80% Modulated with 1kHz

3. Scanning Frequency 80MHz - 1000MHz

4 Dwell Time 3 Seconds

5. Frequency step size f : 1%

6. The rate of Swept of Frequency 1.5 x 10-3 decades/s


No deviation.


Page: 99 of 134


Test Item Radiated susceptibility

Test Mode Mode 1

Date of Test 2008/09/20 Test Site Chamber5

Frequency

(MHz)

Position

(Angle) Polarity

(H or V)

Field

Strength

(V/m)

Required

Criteria

Complied

To Criteria

(A,B,C)

Results

80-1000 FRONT H 3 A A PASS

80-1000 FRONT V 3 A A PASS

80-1000 BACK H 3 A A PASS

80-1000 BACK V 3 A A PASS

80-1000 RIGHT H 3 A A PASS

80-1000 RIGHT V 3 A A PASS

80-1000 LEFT H 3 A A PASS

80-1000 LEFT V 3 A A PASS

80-1000 UP H 3 A A PASS

80-1000 UP V 3 A A PASS

80-1000 DOWN H 3 A A PASS

80-1000 DOWN V 3 A A PASS

Note:

The testing performed is from lowest level up to the highest level as required by

standard, but only highest level is shown on the report.


There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at V/m

at frequency MHz.

No false alarms or other malfunctions were observed during or after the test.


Page: 100 of 134

Product Notebook

Test Item Radiated susceptibility

Test Mode Mode 2

Date of Test 2008/09/20 Test Site Chamber5

Frequency

(MHz)

Position

(Angle) Polarity

(H or V)

Field

Strength

(V/m)

Required

Criteria

Complied

To Criteria

(A,B,C)

Results

80-1000 FRONT H 3 A A PASS

80-1000 FRONT V 3 A A PASS

80-1000 BACK H 3 A A PASS

80-1000 BACK V 3 A A PASS

80-1000 RIGHT H 3 A A PASS

80-1000 RIGHT V 3 A A PASS

80-1000 LEFT H 3 A A PASS

80-1000 LEFT V 3 A A PASS

80-1000 UP H 3 A A PASS

80-1000 UP V 3 A A PASS

80-1000 DOWN H 3 A A PASS

80-1000 DOWN V 3 A A PASS

Note:




There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at V/m

at frequency MHz.



Page: 101 of 134


Description : Radiated Susceptibility Test Setup

Test Mode : Mode 2

Description : Radiated Susceptibility Test Setup


Page: 102 of 134

10. Electrical Fast Transient/Burst



10.2. Test Setup

10.3. Limit

Item Environmental Phenomena

Units Test Specification Performance Criteria

I/O and communication ports Fast Transients Common Mode

kV (Peak) Tr/Th ns Rep. Frequency kHz

+0.5 5/50 5

B

Input DC Power Ports Fast Transients Common Mode


+0.5 5/50 5

B

Input AC Power Ports Fast Transients Common Mode


+1 5/50 5

B


Page: 103 of 134

10.4. Test Procedure

The EUT is placed on a table that is 0.8 meter height. A ground reference plane is placed on

the table, and uses a 0.1m insulation between the EUT and ground reference plane.

The minimum area of the ground reference plane is 1m*1m, and 0.65mm thick min, and

projected beyond the EUT by at least 0.1m on all sides.

Test on I/O and communication ports:

The EFT interference signal is through a coupling clamp device couples to the signal and

control lines of the EUT with burst noise for 1minute.

Test on power supply ports:

The EUT is connected to the power mains through a coupling device that directly couples the

EFT/B interference signal.

Each of the Line and Neutral conductors is impressed with burst noise for 1 minute.

The length of the signal and power lines between the coupling device and the EUT is 0.5m.


No deviation.


Page: 104 of 134


Test Item Electrical fast transient/burst

Test Mode Mode 1


Inject

Line Polarity

Voltage

kV

Inject

Time

(Second)

Inject

Method

Required

Criteria

Complied

to

Criteria Result

L+N+PE ± 1kV 60 Direct B A PASS

LAN ± 0.5 kV 60 Clamp B A PASS

Telecom ± 0.5 kV 60 Clamp B A PASS

Note:



Meet criteria A : Operate as intended during and after the test

Meet criteria B : Operate as intended after the test

Meet criteria C : Loss/Error of function

Additional Information

EUT stopped operation and could / could not be reset by operator at kV of

Line .



Page: 105 of 134

Product Notebook

Test Item Electrical fast transient/burst

Test Mode Mode 2


Inject

Line Polarity

Voltage

kV

Inject

Time

(Second)

Inject

Method

Required

Criteria

Complied

to

Criteria Result

L+N+PE ± 1kV 60 Direct B A PASS

LAN ± 0.5 kV 60 Clamp B A PASS

Telecom ± 0.5 kV 60 Clamp B A PASS

Note:







EUT stopped operation and could / could not be reset by operator at kV of

Line .



Page: 106 of 134


Description : EFT/B Test Setup

Test Mode : Mode 1

Description : EFT/B Test Setup-Clamp


Page: 107 of 134

Test Mode : Mode 2

Description : EFT/B Test Setup

Test Mode : Mode 2

Description : EFT/B Test Setup-Clamp


Page: 108 of 134

11. Surge



11.2. Test Setup

11.3. Limit

Item Environmental Phenomena Units Test Specification Performance Criteria

Signal Ports and Telecommunication Ports(See 1) and 2) ) Surges Line to Ground

Tr/Th us kV

1.2/50 (8/20) 1

B

Input DC Power Ports Surges Line to Ground

Tr/Th us kV

1.2/50 (8/20) 0.5

B

AC Input and AC Output Power Ports Surges Line to Line Line to Ground

Tr/Th us kV kV

1.2/50 (8/20) 1 2

B

Notes:

1) Applicable only to ports which according to the manufacturer’s may directly to outdoor

cables.

2) Where normal functioning cannot be achieved because of the impact of the CDN on the

EUT, no immunity test shall be required.


Page: 109 of 134


The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane

measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least

0.1m on all sides. The length of power cord between the coupling device and the EUT shall

be 2m or less.

For Input and Output AC Power or DC Input and DC Output Power Ports:

The EUT is connected to the power mains through a coupling device that directly couples the

Surge interference signal.

The surge noise shall be applied synchronized to the voltage phase at 00, 900, 1800, 2700 and

the peak value of the a.c. voltage wave. (Positive and negative)

Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with

interval of 1 min.


No deviation.


Page: 110 of 134


Test Item Surge

Test Mode Mode 1


Inject

Line Polarity Angle

Voltage

kV

Time

Interval

(Second)

Inject

Method

Required

Criteria

Complied

to

Criteria Result

L-N ± 0 1kV 60 Direct B A PASS




L-PE ± 0 2kV 60 Direct B A PASS




N-PE ± 0 2kV 60 Direct B A PASS




Note:


standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information

EUT stopped operation and could / could not be reset by operator at kV of Line .



Page: 111 of 134

Product Notebook

Test Item Surge

Test Mode Mode 2


Inject

Line Polarity Angle

Voltage

kV

Time

Interval

(Second)

Inject

Method

Required

Criteria

Complied

to

Criteria Result













Note:


standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information

EUT stopped operation and could / could not be reset by operator at kV of Line .



Page: 112 of 134


Description : SURGE Test Setup

Test Mode : Mode 2

Description : SURGE Test Setup


Page: 113 of 134

12. Conducted Susceptibility



12.2. Test Setup

CDN Test Mode

EM Clamp Test Mode


Page: 114 of 134

12.3. Limit

Item Environmental Phenomena Units Test Specification

Performance Criteria

Signal Ports and Telecommunication Ports Radio-Frequency Continuous Conducted

MHz V (rms, Un-modulated) % AM (1kHz)

0.15-80 3 80

A

Input DC Power Ports Radio-Frequency Continuous Conducted


0.15-80 3 80

A

Input AC Power Ports Radio-Frequency Continuous Conducted


0.15-80 3 80

A


The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and Ground reference plane. For Signal Ports and Telecommunication Ports The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp device couples to the signal and Telecommunication lines of the EUT. For Input DC and AC Power Ports The EUT is connected to the power mains through a coupling and decoupling networks for power supply lines. And directly couples the disturbances signal into EUT. Used CDN-M2 for two wires or CDN-M3 for three wires. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 130dBuV(3V) Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 0.15MHz – 80MHz 4 Dwell Time 3 Seconds 5. Frequency step size f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s


No deviation.


Page: 115 of 134


Test Item Conducted susceptibility

Test Mode Mode 1


Frequency

Range

(MHz)

Voltage

Applied

dBuV(V)

Inject

Method

Tested Port

of

EUT

Required

Criteria

Performance

Criteria

Complied To

Result

0.15~80 130 (3V) CDN AC IN A A PASS

0.15~80 130 (3V) CDN LAN A A PASS

0.15~80 130 (3V) CDN 1G A A PASS

0.15~80 130 (3V) CDN Telecom A A PASS

Note:







EUT stopped operation and could / could not be reset by operator at dBuV(V) at

frequency MHz.

No false alarms or other malfunctions were observed during or after the test. The

acceptance criteria were met, and the EUT passed the test.


Page: 116 of 134

Product Notebook

Test Item Conducted susceptibility

Test Mode Mode 2


Frequency

Range

(MHz)

Voltage

Applied

dBuV(V)

Inject

Method

Tested Port

of

EUT

Required

Criteria

Performance

Criteria

Complied To

Result

0.15~80 130 (3V) CDN AC IN A A PASS

0.15~80 130 (3V) CDN LAN A A PASS

0.15~80 130 (3V) CDN 1G A A PASS

0.15~80 130 (3V) CDN Telecom A A PASS

Note:







EUT stopped operation and could / could not be reset by operator at dBuV(V) at

frequency MHz.




Page: 117 of 134


Description : Conducted Susceptibility Test Setup

Test Mode : Mode 1

Description : Conducted Susceptibility Test Setup -CDN


Page: 118 of 134

Test Mode : Mode 2

Description : Conducted Susceptibility Test Setup

Test Mode : Mode 2

Description : Conducted Susceptibility Test Setup -CDN


Page: 119 of 134

13. Power Frequency Magnetic Field



13.2. Test Setup

13.3. Limit Item Environmental

Phenomena Units Test Specification Performance

Criteria Enclosure Port Power-Frequency

Magnetic Field Hz A/m (r.m.s.)

50 1

A


The EUT and its load are placed on a table which is 0.8 meter above a metal ground

plane measured at least 1m*1m min. The test magnetic field shall be placed at central

of the induction coil.

The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT.

And the induction coil shall be rotated by 90 in order to expose the EUT to the test field

with different orientation (X, Y, Z Orientations).


No deviation.


Page: 120 of 134


Test Item Power frequency magnetic field

Test Mode Mode 1


Polarization Frequency

(Hz)

Magnetic

Strength

(A/m)

Required

Performance

Criteria

Performance

Criteria

Complied To

Test Result

X Orientation 50 1 A A PASS

Y Orientation 50 1 A A PASS

Z Orientation 50 1 A A PASS

Meet criteria A: Operate as intended during and after the test

Meet criteria B: Operate as intended after the test

Meet criteria C: Loss/Error of function


EUT stopped operation and could / could not be reset by operator at kV

of Line .




Page: 121 of 134

Product Notebook

Test Item Power frequency magnetic field

Test Mode Mode 2


Polarization Frequency

(Hz)

Magnetic

Strength

(A/m)

Required

Performance

Criteria

Performance

Criteria

Complied To

Test Result

X Orientation 50 1 A A PASS

Y Orientation 50 1 A A PASS

Z Orientation 50 1 A A PASS

Meet criteria A: Operate as intended during and after the test

Meet criteria B: Operate as intended after the test

Meet criteria C: Loss/Error of function


EUT stopped operation and could / could not be reset by operator at kV

of Line .




Page: 122 of 134


Description : Power Frequency Magnetic Field Test Setup

Test Mode : Mode 2

Description : Power Frequency Magnetic Field Test Setup


Page: 123 of 134

14. Voltage Dips and Interruption



14.2. Test Setup

14.3. Limit

Item Environmental

Phenomena

Units Test Specification Performance

Criteria

Input AC Power Ports

% Reduction

Period

30

25 C

Voltage Dips

% Reduction

Period

>95

0.5 B

Voltage Interruptions % Reduction

Period

> 95

250 C


Page: 124 of 134


The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane

measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at least

0.1m on all sides. The power cord shall be used the shortest power cord as specified by the

manufacturer.

For Voltage Dips/ Interruptions test:

The selection of test voltage is based on the rated power range. If the operation range is

large than 20% of lower power range, both end of specified voltage shall be tested.

Otherwise, the typical voltage specification is selected as test voltage.

The EUT is connected to the power mains through a coupling device that directly couples to

the Voltage Dips and Interruption Generator.

The EUT shall be tested for 30% voltage dip of supplied voltage and duration 25 Periods,

for 95% voltage dip of supplied voltage and duration 0.5 Periods with a sequence of three

voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied

voltage and duration 250 Periods with a sequence of three voltage interruptions with

intervals of 10 seconds.

Voltage phase shifting are shall occur at 00, 450, 900 ,1350 ,1800 ,2250, 2700 ,3150 of the

voltage.


No deviation.


Page: 125 of 134


Test Item Voltage dips and interruption

Test Mode Mode 1


Voltage Dips and

Interruption

Reduction(%)

Angle Test

Duration

(Periods)

Required

Performance

Criteria

Performance

Criteria

Complied To

Test Result

30(161V) 0 25 C A PASS 30(161V) 45 25 C A PASS 30(161V) 90 25 C A PASS 30(161V) 135 25 C A PASS 30(161V) 180 25 C A PASS 30(161V) 225 25 C A PASS 30(161V) 270 25 C A PASS 30(161V) 315 25 C A PASS >95(0V) 0 0.5 B A PASS >95(0V) 45 0.5 B A PASS >95(0V) 90 0.5 B A PASS >95(0V) 135 0.5 B A PASS >95(0V) 180 0.5 B A PASS >95(0V) 225 0.5 B A PASS >95(0V) 270 0.5 B A PASS >95(0V) 315 0.5 B A PASS >95(0V) 0 250 C B PASS >95(0V) 45 250 C B PASS >95(0V) 90 250 C B PASS >95(0V) 135 250 C B PASS >95(0V) 180 250 C B PASS >95(0V) 225 250 C B PASS >95(0V) 270 250 C B PASS >95(0V) 315 250 C B PASS


The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kV

of Line .




Page: 126 of 134

Product Notebook

Test Item Voltage dips and interruption

Test Mode Mode 2


Voltage Dips and

Interruption

Reduction(%)

Angle Test

Duration

(Periods)

Required

Performance

Criteria

Performance

Criteria

Complied To

Test Result

30(161V) 0 25 C A PASS 30(161V) 45 25 C A PASS 30(161V) 90 25 C A PASS 30(161V) 135 25 C A PASS 30(161V) 180 25 C A PASS 30(161V) 225 25 C A PASS 30(161V) 270 25 C A PASS 30(161V) 315 25 C A PASS >95(0V) 0 0.5 B A PASS >95(0V) 45 0.5 B A PASS >95(0V) 90 0.5 B A PASS >95(0V) 135 0.5 B A PASS >95(0V) 180 0.5 B A PASS >95(0V) 225 0.5 B A PASS >95(0V) 270 0.5 B A PASS >95(0V) 315 0.5 B A PASS >95(0V) 0 250 C B PASS >95(0V) 45 250 C B PASS >95(0V) 90 250 C B PASS >95(0V) 135 250 C B PASS >95(0V) 180 250 C B PASS >95(0V) 225 250 C B PASS >95(0V) 270 250 C B PASS >95(0V) 315 250 C B PASS


The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kV

of Line .




Page: 127 of 134


Description : Voltage Dips Test Setup

Test Mode : Mode 2

Description : Voltage Dips Test Setup


Page: 128 of 134

15. Attachment EUT Photograph

(1) EUT Photo

(2) EUT Photo


Page: 129 of 134

(3) EUT Photo

(4) EUT Photo


Page: 130 of 134

(5) EUT Photo

(6) EUT Photo


Page: 131 of 134

(7) EUT Photo

(8) EUT Photo


Page: 132 of 134

(9) EUT Photo

(10) EUT Photo


Page: 133 of 134

(11) EUT Photo

(12) EUT Photo


Page: 134 of 134

(13) EUT Photo

(14) EUT Photo