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16.2 Types of Semiconductor Memories (1)
Computer memory can be divided into 2 types: main memory and mass storage memory. The main memory is usually of the random-access type. A random-access memory (RAM) is one in which the time required for writing and reading information is independent of the physical location in which the information is stored. RAMs should be contrasted with serial or sequential memories. Sequential access means that the accessing a piece of information will take a varying amount of time, depending on which piece of information was accessed last. The device may need to seek (e.g. to position the read/write head correctly), or cycle (e.g. to wait for the correct location in a revolving medium to appear below the read/write head). Floppy disk and hard disk are of this type.
Sedra-Smith 6th ed.
2
CPUHD
RAM
ROM
MEMORIEMEMORIE* OS* SW* dati storici
> lettura/scrittura> permanente> accesso sequenziale
* OS “live”* dati operativi (da elaborare/elaborati)
> lettura/scrittura> labile> accesso casuale
* dati di sistema - avvio (boot loader) - descrizione HW (bios)
> lettura> permanente> accesso casuale
©RICHARD C. JAEGER 6/5/97
MMIICCRROOEELLEECCTTRROONNIICIRCUIT DESIGNCIRCUIT DESIGN
MEMORIEMEMORIEa semiconduttorea semiconduttore
RAM ROM Random Access Memory Read Only Memory
Architettura matrice matrice
Accesso casuale casuale
Permanenza labile perenne
Lettura/scrittura sì solo lettura
Contenuto dati operativi dati di sistema
4
Types of Semiconductor Memories (2)
Source: G. Chou at ProMOSSedra-Smith 6th ed.
5
Dynamic Memory Cell (1)
Where can we find DRAMs?
Sedra-Smith 6th ed.
©RICHARD C. JAEGER 6/5/97
MMIICCRROOEELLEECCTTRROONNIICIRCUIT DESIGNCIRCUIT DESIGN
Row Decoder
12
N
12 rows
M
One Storage Cell
Row Address
Column Decoder
2M
1 2
M
Read/write Circuit
Data Out
Data In
2 columnsN
Cell Array
Column Address
Bitline
Wordline
1 2N
Sense Amplifiers
Row
D e c o d e r
Figure 9.2 - Block diagram of basic memory array
©RICHARD C. JAEGER 6/5/97
MMIICCRROOEELLEECCTTRROONNIICIRCUIT DESIGNCIRCUIT DESIGN
BL
Wordline
BL__
D = D1 D = D2
__
MA1 MA2
Figure 9.5 - Basic memory cell formed from the two-inverter latch and two access
transistors MA1 and MA2
©RICHARD C. JAEGER 6/5/97
MMIICCRROOEELLEECCTTRROONNIICIRCUIT DESIGNCIRCUIT DESIGN
BL BL__
Read "0"
+3 V
1.5 V 1.5 V
MP1 MP2
MA1 MN1 MN2
0 V 3 V
MA2
D1 D2
WL WL
Sense Amplifier
CBLCBL
Precharge
Figure 9.7 - Reading data from a 6-T cell with a "0" stored in the cell
©RICHARD C. JAEGER 6/5/97
MMIICCRROOEELLEECCTTRROONNIICIRCUIT DESIGNCIRCUIT DESIGN
BL__
BL
+1.5 V+1.5 V
+3 V +3 V
MA1 MA2
offMP1
offMN2
i2
MP2
MN1
i1
+3 V
0 V 3 V
WL
D DS S
G G
D1
D2
Figure 9.8 - Conditions immediately following activation of the wordline
©RICHARD C. JAEGER 6/5/97
MMIICCRROOEELLEECCTTRROONNIICIRCUIT DESIGNCIRCUIT DESIGN
BL BLWordline
MA1 MA2
Storage Cell
Sense Amplifier
Precharge
MPC
D1D
2
Figure 9.23 - Memory array including a sense amplifier
©RICHARD C. JAEGER 6/5/97
MMIICCRROOEELLEECCTTRROONNIICIRCUIT DESIGNCIRCUIT DESIGN
Read "1"
+3 V+3 V
1.5 V 1.5 V
MP1 MP2
i1
MA1 MN1
BL
MN2
0 V3 V
+3 V
MA2
i2
BL__
D1 D2
G
D
G
DS S
CBL CBL
Figure 9.11 - Reading data from 6-T cell with a "1" stored in the cell
©RICHARD C. JAEGER 6/5/97
MMIICCRROOEELLEECCTTRROONNIICIRCUIT DESIGNCIRCUIT DESIGN
0 V +3 V
Write "0"
+3 V
MP1 MP2
i1
MA1 MN1
BL
MN2
0 V 3 V
WL
MA2
i2
BL__
D1 D2
WL
CBL CBL
Figure 9.12 - Memory cell set up for a write "0" operation with a "0" already stored in the
cell
©RICHARD C. JAEGER 6/5/97
MMIICCRROOEELLEECCTTRROONNIICIRCUIT DESIGNCIRCUIT DESIGN
0 V +3 V
Write "0"
+3 V+3 V
MP1 MP2
i1
MA1 MN1
BL
MN2
0 V3 V
+3 V
MA2
i2
BL__
D1 D2
CBLCBL
Figure 9.13 Memory cell set up for a write "0" operation with a "1" previously in the cell
©RICHARD C. JAEGER 6/5/97
MMIICCRROOEELLEECCTTRROONNIICIRCUIT DESIGNCIRCUIT DESIGN
Bitline
CBL CC
Wordline
MA
Figure 9.15 - One-transistor (1-T) storage cell in which binary data is represented by the
presence or absence of charge on CC
©RICHARD C. JAEGER 6/5/97
MMIICCRROOEELLEECCTTRROONNIICIRCUIT DESIGNCIRCUIT DESIGN
0 V
+3V
VC
CC
S D
G
BL
iC
iC
MA
Figure 9.16 - Writing a "0" into the 1-T cell
©RICHARD C. JAEGER 6/5/97
MMIICCRROOEELLEECCTTRROONNIICIRCUIT DESIGNCIRCUIT DESIGN
+3 V
+3 V
VC
CC
BL
D S
G
iC
iC
MA
Figure 9.17 - Conditions for writing a "1" into the 1-T cell
©RICHARD C. JAEGER 6/5/97
MMIICCRROOEELLEECCTTRROONNIICIRCUIT DESIGNCIRCUIT DESIGN
A0
A0
_A
1A
2A
1
_A
2
_V
DD
VDD
VDD
VDD
VDD
VDD
VDD
VDD
1 (001)
2 (010)
3 (011)
4 (100)
5 (101)
6 (110)
7 (111)
A0
A1
A2
0 (000)
Figure 9.31 - NMOS static NOR address decoder
©RICHARD C. JAEGER 6/5/97
MMIICCRROOEELLEECCTTRROONNIICIRCUIT DESIGNCIRCUIT DESIGN
VDD
W1
B1
B2
B3
B0
W3
W0
2W
Fig. 9.42 - Basic structure of a NMOS static ROM with four 4-bit words:
W0 = 0010 W1 = 1000 W2 = 0110 W3 = 0110
21
Mask-Programmable ROMs and PROMs
Mask-programmable ROMs To avoid having to custom-design each ROM from scratch, ROMs are manufactured using a process known as mask programming. MOSFET can be included at all bit locations, but only the gates of those transistors where 0s are to be stored are connected to the word lines.
Programmable ROMs PROMs are ROMs that can be programmed by the user, but only once (They are frequently seen in computer games, or such products as electronic dictionaries). A typical PROM comes with all bits reading as 0, burning a fuse during programming causes its bit to read as 1. The memory can be programmed just once after manufacturing by "blowing" the fuses (using a PROM blower), which is an irreversible process.
22
EPROMs (1)
Erasable-Programmable ROMs It is a type of computer memory chip that retains its data when its power supply is switched off. Once programmed, an EPROM can be erased only by exposing it to strong ultraviolet light (wavelength=2537A). EPROMs are easily recognizable by the transparent window in the top of the package, through which the silicon chip can be seen, and which permits UV light during erasing.
Sedra-Smith 6th ed.
Microelectronic Circuits, International Sixth Edition Sedra/Smith Copyright © 2011 by Oxford University Press, Inc.
Figure 16.31 (a) Cross section and (b) circuit symbol of the floating-gate transistor used as an EPROM cell.
Its structure and programming principle are illustrated below. EPROMs (2)
24
EPROM
Typ. 2 V 7 V
EPROM Scrittura/Cancellazione
25 V
16 V Gnd
Write (Program) process – hot-carrier injection Erase process – UV light
26
EEPROMs
A more versatile PROM is the electrically erasable PROM (EEPROM). As the name implies, an EEPROM can be erased and reprogrammed electrically without the need for ultraviolet illumination. The difference between EPROM and EEPROM lies in the thickness of the insulating layer — in an EPROM it is about 25 nm thick whereas in an EEPROM it is much thinner — typically around 10 nm. This thinner insulating layer allows for lower voltages to be used for programming.
EEPROM
Transistore
Scrittura e Cancellazione
29
Flash Memory
Flash memory is a form of non-volatile computer memory that can be electrically erased and reprogrammed. Unlike EEPROM, it is erased and programmed in blocks consisting of multiple locations. Flash memory costs far less than EEPROM and therefore has become the dominant technology wherever a significant amount of non-volatile, solid-state storage is needed.
Source: Samsung ElectronicsSedra-Smith 6th ed.
Flash Memory
• Struttura NOR– scrittura: Channel Hot Electrons (CHE)– cancellazione: Fowler-Nordheim Tunneling
Read
Write
Erase
12 V
12 V
12 V > VT2
12 V
12 V
VT1 < 5 V < VT2
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