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1 16.2 Types of Semiconductor Memories (1) Computer memory can be divided into 2 types: main memory and mass storage memory. The main memory is usually of the random-access type. A random-access memory (RAM) is one in which the time required for writing and reading information is independent of the physical location in which the information is stored. RAMs should be contrasted with serial or sequential memories. Sequential access means that the accessing a piece of information will take a varying amount of time, depending on which piece of information was accessed last . The device may need to seek (e.g. to position the read/write head correctly), or cycle (e.g. to wait for the correct location in a revolving medium to appear below the read/write head). Floppy disk and hard disk are of this type. Sedra-Smith 6 th ed.

16.2 Types of Semiconductor · 2016. 6. 8. · 1 16.2 Types of Semiconductor Memories (1) Computer memory can be divided into 2 types: main memory and mass storage memory. The main

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  • 1

    16.2 Types of Semiconductor Memories (1)

    Computer memory can be divided into 2 types: main memory and mass storage memory. The main memory is usually of the random-access type. A random-access memory (RAM) is one in which the time required for writing and reading information is independent of the physical location in which the information is stored. RAMs should be contrasted with serial or sequential memories. Sequential access means that the accessing a piece of information will take a varying amount of time, depending on which piece of information was accessed last. The device may need to seek (e.g. to position the read/write head correctly), or cycle (e.g. to wait for the correct location in a revolving medium to appear below the read/write head). Floppy disk and hard disk are of this type.

    Sedra-Smith 6th ed.

  • 2

    CPUHD

    RAM

    ROM

    MEMORIEMEMORIE* OS* SW* dati storici

    > lettura/scrittura> permanente> accesso sequenziale

    * OS “live”* dati operativi (da elaborare/elaborati)

    > lettura/scrittura> labile> accesso casuale

    * dati di sistema - avvio (boot loader) - descrizione HW (bios)

    > lettura> permanente> accesso casuale

  • ©RICHARD C. JAEGER 6/5/97

    MMIICCRROOEELLEECCTTRROONNIICIRCUIT DESIGNCIRCUIT DESIGN

    MEMORIEMEMORIEa semiconduttorea semiconduttore

    RAM ROM Random Access Memory Read Only Memory

    Architettura matrice matrice

    Accesso casuale casuale

    Permanenza labile perenne

    Lettura/scrittura sì solo lettura

    Contenuto dati operativi dati di sistema

  • 4

    Types of Semiconductor Memories (2)

    Source: G. Chou at ProMOSSedra-Smith 6th ed.

  • 5

    Dynamic Memory Cell (1)

    Where can we find DRAMs?

    Sedra-Smith 6th ed.

  • ©RICHARD C. JAEGER 6/5/97

    MMIICCRROOEELLEECCTTRROONNIICIRCUIT DESIGNCIRCUIT DESIGN

    Row Decoder

    12

    N

    12    rows

    M

    One Storage Cell

    Row  Address

    Column Decoder

    2M

    1 2

    M

    Read/write  Circuit

    Data  Out

    Data In

    2    columnsN

    Cell  Array

    Column Address

    Bitline

    Wordline

    1 2N

    Sense Amplifiers

    Row

    D e c o d e r 

    Figure 9.2 - Block diagram of basic memory array

  • ©RICHARD C. JAEGER 6/5/97

    MMIICCRROOEELLEECCTTRROONNIICIRCUIT DESIGNCIRCUIT DESIGN

    BL

    Wordline

    BL__

    D = D1 D = D2

    __

    MA1 MA2

    Figure 9.5 - Basic memory cell formed from the two-inverter latch and two access

    transistors MA1 and MA2

  • ©RICHARD C. JAEGER 6/5/97

    MMIICCRROOEELLEECCTTRROONNIICIRCUIT DESIGNCIRCUIT DESIGN

    BL BL__

    Read "0"

    +3 V

    1.5 V 1.5 V

    MP1 MP2

    MA1 MN1 MN2

    0 V 3 V

    MA2

    D1 D2

    WL WL

    Sense Amplifier

    CBLCBL

    Precharge

    Figure 9.7 - Reading data from a 6-T cell with a "0" stored in the cell

  • ©RICHARD C. JAEGER 6/5/97

    MMIICCRROOEELLEECCTTRROONNIICIRCUIT DESIGNCIRCUIT DESIGN

    BL__

    BL

    +1.5 V+1.5 V

    +3 V +3 V

    MA1 MA2

    offMP1

    offMN2

    i2

    MP2

    MN1

    i1

    +3 V

    0 V 3 V

    WL

    D DS S

    G G

    D1

    D2

    Figure 9.8 - Conditions immediately following activation of the wordline

  • ©RICHARD C. JAEGER 6/5/97

    MMIICCRROOEELLEECCTTRROONNIICIRCUIT DESIGNCIRCUIT DESIGN

    BL BLWordline

    MA1 MA2

    Storage Cell

    Sense Amplifier

    Precharge

    MPC

    D1D

    2

    Figure 9.23 - Memory array including a sense amplifier

  • ©RICHARD C. JAEGER 6/5/97

    MMIICCRROOEELLEECCTTRROONNIICIRCUIT DESIGNCIRCUIT DESIGN

    Read "1"

    +3 V+3 V

    1.5 V 1.5 V

    MP1 MP2

    i1

    MA1 MN1

    BL

    MN2

    0 V3 V

    +3 V

    MA2

    i2

    BL__

    D1 D2

    G

    D

    G

    DS S

    CBL CBL

    Figure 9.11 - Reading data from 6-T cell with a "1" stored in the cell

  • ©RICHARD C. JAEGER 6/5/97

    MMIICCRROOEELLEECCTTRROONNIICIRCUIT DESIGNCIRCUIT DESIGN

    0 V +3 V

    Write "0"

    +3 V

    MP1 MP2

    i1

    MA1 MN1

    BL

    MN2

    0 V 3 V

    WL

    MA2

    i2

    BL__

    D1 D2

    WL

    CBL CBL

    Figure 9.12 - Memory cell set up for a write "0" operation with a "0" already stored in the

    cell

  • ©RICHARD C. JAEGER 6/5/97

    MMIICCRROOEELLEECCTTRROONNIICIRCUIT DESIGNCIRCUIT DESIGN

    0 V +3 V

    Write "0"

    +3 V+3 V

    MP1 MP2

    i1

    MA1 MN1

    BL

    MN2

    0 V3 V

    +3 V

    MA2

    i2

    BL__

    D1 D2

    CBLCBL

    Figure 9.13  Memory cell set up for a write "0" operation with a "1"    previously in the cell

  • ©RICHARD C. JAEGER 6/5/97

    MMIICCRROOEELLEECCTTRROONNIICIRCUIT DESIGNCIRCUIT DESIGN

    Bitline

    CBL CC

    Wordline

    MA

    Figure 9.15 - One-transistor (1-T) storage cell in which binary data is represented by the

    presence or absence of charge on CC

  • ©RICHARD C. JAEGER 6/5/97

    MMIICCRROOEELLEECCTTRROONNIICIRCUIT DESIGNCIRCUIT DESIGN

    0 V

    +3V

    VC

    CC

    S D

    G

    BL

    iC

    iC

    MA

    Figure 9.16 - Writing a "0" into the 1-T cell

  • ©RICHARD C. JAEGER 6/5/97

    MMIICCRROOEELLEECCTTRROONNIICIRCUIT DESIGNCIRCUIT DESIGN

    +3 V

    +3 V

    VC

    CC

    BL

    D S

    G

    iC

    iC

    MA

    Figure 9.17 - Conditions for writing a "1" into the 1-T cell

  • ©RICHARD C. JAEGER 6/5/97

    MMIICCRROOEELLEECCTTRROONNIICIRCUIT DESIGNCIRCUIT DESIGN

    A0

    A0

    _A

    1A

    2A

    1

    _A

    2

    _V

    DD

    VDD

    VDD

    VDD

    VDD

    VDD

    VDD

    VDD

    1 (001)

    2 (010)

    3 (011)

    4 (100)

    5 (101)

    6 (110)

    7 (111)

    A0

    A1

    A2

    0 (000)

    Figure 9.31 - NMOS static NOR address decoder

  • ©RICHARD C. JAEGER 6/5/97

    MMIICCRROOEELLEECCTTRROONNIICIRCUIT DESIGNCIRCUIT DESIGN

    VDD

    W1

    B1

    B2

    B3

    B0

    W3

    W0

    2W

    Fig. 9.42 - Basic structure of a NMOS static ROM with four 4-bit words:

    W0 = 0010 W1 = 1000 W2 = 0110 W3 = 0110

  • 21

    Mask-Programmable ROMs and PROMs

    Mask-programmable ROMs To avoid having to custom-design each ROM from scratch, ROMs are manufactured using a process known as mask programming. MOSFET can be included at all bit locations, but only the gates of those transistors where 0s are to be stored are connected to the word lines.

    Programmable ROMs PROMs are ROMs that can be programmed by the user, but only once (They are frequently seen in computer games, or such products as electronic dictionaries). A typical PROM comes with all bits reading as 0, burning a fuse during programming causes its bit to read as 1. The memory can be programmed just once after manufacturing by "blowing" the fuses (using a PROM blower), which is an irreversible process.

  • 22

    EPROMs (1)

    Erasable-Programmable ROMs It is a type of computer memory chip that retains its data when its power supply is switched off. Once programmed, an EPROM can be erased only by exposing it to strong ultraviolet light (wavelength=2537A). EPROMs are easily recognizable by the transparent window in the top of the package, through which the silicon chip can be seen, and which permits UV light during erasing.

    Sedra-Smith 6th ed.

  • Microelectronic Circuits, International Sixth Edition Sedra/Smith Copyright © 2011 by Oxford University Press, Inc.

    Figure 16.31 (a) Cross section and (b) circuit symbol of the floating-gate transistor used as an EPROM cell.

    Its structure and programming principle are illustrated below. EPROMs (2)

  • 24

    EPROM

    Typ. 2 V 7 V

  • EPROM Scrittura/Cancellazione

    25 V

    16 V Gnd

    Write (Program) process – hot-carrier injection Erase process – UV light

  • 26

    EEPROMs

    A more versatile PROM is the electrically erasable PROM (EEPROM). As the name implies, an EEPROM can be erased and reprogrammed electrically without the need for ultraviolet illumination. The difference between EPROM and EEPROM lies in the thickness of the insulating layer — in an EPROM it is about 25 nm thick whereas in an EEPROM it is much thinner — typically around 10 nm. This thinner insulating layer allows for lower voltages to be used for programming.

  • EEPROM

    Transistore

  • Scrittura e Cancellazione

  • 29

    Flash Memory

    Flash memory is a form of non-volatile computer memory that can be electrically erased and reprogrammed. Unlike EEPROM, it is erased and programmed in blocks consisting of multiple locations. Flash memory costs far less than EEPROM and therefore has become the dominant technology wherever a significant amount of non-volatile, solid-state storage is needed.

    Source: Samsung ElectronicsSedra-Smith 6th ed.

  • Flash Memory

    • Struttura NOR– scrittura: Channel Hot Electrons (CHE)– cancellazione: Fowler-Nordheim Tunneling

  • Read

    Write

    Erase

  • 12 V

    12 V

    12 V > VT2

    12 V

    12 V

    VT1 < 5 V < VT2

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