607 Switched-Capacitor S-H and Switches

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    Analog and Mixed-Signal Center, TAMU

    TRACK & HOLD

    ARCHITECTURES AND CIRCUITS,

    NON-IDEAL SWITCHES

    ECEN 607 (ESS)

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    Vi VoS/H

    circuit

    S/H commandVi

    Vo

    t

    t

    S/H: S H S H S H S H S

    Block Diagram Idealized Response

    Sample-and-Hold Circuit

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    TrackError

    Performances of S & H

    Realistic Transient Response:

    Input &OutputVoltage

    t

    t

    Vin

    Vout

    Pedestal

    Voltage Drift

    CK

    ta th

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    S/H Circuit Waveforms and Performance Parameters

    tac

    ts

    tap

    H S H

    Droop

    Vo

    Vi

    Vi

    Vo

    Holdstep

    Feedthrough

    DroopVo

    Vi

    Desiredoutput

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    Design of Track and hold

    Performance Definition Acquisition Time: the required time for the output transient after

    the sampling signal.

    Hold Settling Time: the time after the hold signal required for the

    output to settle within an acceptable error.

    Pedestal Error: due to the transition of sample to hold mode.

    Voltage Drift: the rate of discharge of the sampling capacitor

    during the hold mode.

    Dynamic Range: the ratio of the maximum and minimum input level,

    which can be sampled with a given resolution.

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    Performance Definition Nonlinearity Error: the maximum deviation of the Vout/Vin

    characteristic from the straight line passed through the end points.

    Gain Error: the deviation of the slope of the straight line from unity.

    P

    0

    0

    Vout

    Q

    G1

    Vin

    Gain Error= 1 - G

    NonlinearityError

    Analog and Mixed-Signal Center, TAMU

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    Track and hold

    Performance Definition Hold Mode Feedthrough: the percentage of the input signal that

    appears at the output during the hold mode.

    Vin Vout

    CK

    CS

    Cp

    S

    Parasitic capacitors

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    Performance Definition Aperture Error: the random variation of the turn off time of the

    switch results in an uncertain sampling time.

    Maximum Allowable

    Aperture Error for 1/2 LSB:

    10nsec

    1nsec

    100psec

    10psec

    1MHz 10MHz 100MHz 1GHz

    6bit

    s

    6bit

    s12bits

    12bits

    10bits

    10bits

    8bits

    8bits

    f

    fin

    1Nin

    max2f

    1t

    +=

    t

    ApertureError

    SamplingError

    Vin

    Ideal samplingpoint

    t

    CK

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    Signal-to-Noise Ratio (SNR): the ration of the signal power to thenoise power at the output. The sources of noise are the input and

    output buffer, switch, and clock jitter.

    Signal to Noise + Distortion Ratio (SNDR): the ration of signal powerto the total noise and harmonic power at the output. The source ofharmonics are the nonlinearity of the buffers and the switch.

    Vout

    nBinn

    Bout

    Vin

    S

    CK

    nsw* **

    PERFORMANCE DEFINITIONS

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    Sample-and-Hold Basic Architectures

    Fig. 1 An open-loop track and hold

    realized using MOS technology.

    Fig. 2 An open-loop track and hold realized

    using a CMOS transmission gate.

    ( )

    ( )

    hld

    SSDDOVOX

    hld

    intnDDOXC

    WLVC

    hld

    hldC

    intnDDtnGSeff

    eff

    effOXCHC

    C

    VVWLCV

    C

    VVVWLC

    C

    QV

    VVVVVV

    V

    WLVCQQ

    hld

    effOX

    hld

    ==

    =

    ==

    ==

    2

    bygiveniswhere

    22

    2

    11

    1

    1

    1

    Analysis

    .

    . VoutV

    clk

    clk

    clk

    VoutV

    1

    1

    Vin

    Vin

    Q1

    Q1

    Chld

    Chld

    .

    clk

    VoutV 1VinQ1

    Chld

    clk

    . .Q2

    Fig. 3 An open-loop track and hold realized using

    an n-channel switch along with a dummy

    switch for clock-feedthrough cancellation.

    1 1

    Input

    Buffer

    CH

    CKOutput

    Buffer

    S

    Vin Vout

    X.

    .

    Analog and Mixed-Signal Center, TAMU

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    Vout

    Buffered Sample & Hold CircuitBuffered Sample & Hold Circuit

    Input and Output Buffer:

    The capacitor voltage during the hold mode can be affected by

    the current drawn by the following circuit. Therefore, the outputvoltage is buffered.

    Bin Bout

    Vin

    S

    CK

    Analog and Mixed-Signal Center, TAMU

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    Vout

    Vin

    Evolution of S/H Architectures

    Vout.

    .+

    +-

    -Gm A0S

    CK CH

    X

    Fig A. Closed-loop sample-and-hold architecture.

    . 1Vin

    Q1

    Chld

    clk

    .-+ Vout

    Fig B. Including an opamp in a feedback loop

    of a sample and hold to increase the

    input impedance.

    Vout. 1Vin

    Q1

    Chld

    clk

    .-+

    Q2

    Q3

    clk

    C. Adding on additional switch to the S/H of

    Fig B to minimize slewing time.

    ..

    +

    +-

    -

    ChldOpamp 1

    Opamp 2

    Vin

    clk

    clk Q2

    Q1

    Fig D An improved configuration for an S/H as

    compared to that of Fig C

    . 1VinQ1

    Chld

    clk

    .-+

    Q2

    Q3

    clk

    .

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    Track & Hold (T&H) Circuit

    VoutGm

    Vin S

    CK+

    - A+

    -

    V1V-

    Simple Closed-Loop Architecture:

    During the sampling time, the drain and source voltage of MOSswitch are closed to ground. Thus the charge injection and clockfeedthrough introduce an offset voltage at the output and isindependent of the input voltage.

    Disadvantage: stability problems and low speed.

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    T&H Circuit: Closed-Loop Architecture

    Vout

    GmVin

    CK

    +

    - A+

    -

    V1 V-

    Offset Voltage Cancellation:

    The charge injection and clock feedthrough can be cancel out byapplying a replica of the offset voltage to the positive terminalof the second amplifier (common-mode voltage).

    Cs

    M1

    M2CK

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    T&H Circuit: Switched CapacitorSwitched-Capacitor Architecture:

    This architecture consists of sampling capacitor CS, amplifierGm, and MOS switches.

    Gm+

    -Vin

    Vout

    CS

    Hold Mode (CK=0)

    Gm+

    -

    Vout

    CS

    Track Mode (CK=1)

    Vin

    Gm+

    -

    Vout

    CSVin

    CK

    M2

    CK

    M3

    CK

    M1

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    Design of Track and hold

    T&H Circuit: Current-ModeCurrent-Mode Architecture:

    Advantages: high-speed (over 100MHz) and low voltage (

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    Fig. The clock waveforms for Vin andclkused to illustrate how a finite slope for the sampling

    clock introduces sampling-time jitter.

    actual1st

    ideal1stinV

    Sampling jitter

    clk

    ideal2st

    actual2st

    Vout.

    .+

    +-

    -

    CH

    Vin

    GmA0

    .

    .

    .M1

    M2

    CK

    CK

    X

    C2

    Fig. Closed-loop sample-and-hold architecture with pedestal cancellation.

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    S/H Open Loop Architecture with Miller Capacitance

    .

    +

    -

    A0

    .

    .

    ..

    CK

    VinVout

    M1

    M2

    ZC1

    C2

    X

    Y

    +

    -A0.

    .

    ..

    Vin Vout

    ZC1

    C2

    X

    Y

    (a)(b)

    +

    -A0 .

    Vout

    ZC1

    C2

    XY

    (c)Fig. Open-loop architecture with Miller capacitance. (a) Basic circuit; (b) equivalent circuit inthe acquisition mode; (c) equivalent circuit in the hold mode.

    The open-loop architecture with Miller capacitance employs two different values of capacitance

    in the acquisition and hold modes to achieve high speed and small pedestal error. This is

    accomplished using a Miller amplifier that multiplies the effective value of the sampling capacitor

    by a large number when the SHA enters the hold mode.

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    Switched-Capacitor S/H Implementations1 2

    A switched-capacitor sample and hold and low-pass filter.

    2A

    A switched-capacitor S/H.

    .

    .. . -+

    vout

    vinC1

    C22

    1

    .

    .-+vin .

    .

    -+

    . ..

    1

    .

    .

    .

    1A

    S1

    S4

    CS

    S21B

    COF

    1B

    S3

    2B

    S5

    CH

    Vout

    2S

    S61B

    CX

    S7

    .

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    T&H Circuit: Current-ModeClosed-Loop Current-Mode Architecture:

    This architecture needs stability and speed considerations.The distortion of Gm2 affects directly the output current [21].

    Gm1

    CK

    +

    - A+

    -

    V

    -

    Cs

    M1

    Iin Gm2+

    -

    CC

    Iout

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    +Vo-

    Buffer

    +Vi

    -

    +

    R R

    CHSW1

    SW driver

    S/H

    SW3

    C(=CH)SW2

    Improved S/H Circuit

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    Nonideal Effects inSwitches

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    MOSFET Resistor

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    MOSFET Resistor

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    Nonzero On-Resistance

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    Clock Bootstrapping

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    Simplified Clock Bootstrapper

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    Switch-Induced Errors

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    Clock Feedthrough and

    Charge Injection

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    Clock SR Dependence

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    Switch Size Optimization

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    Dummy Switch

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    CMOS Switch