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A stochastic model for localized disturbances and its applications
Zhikun Houa,*, Adriana Heraa, Mohammad Noorib
aDepartment of Mechanical Engineering, Worcester Polytechnic Institute, Worcester, MA 01609, USAbMechanical and Aerospace Engineering, North Carolina State University, USA
Received 15 November 2003; revised 15 December 2003; accepted 2 February 2004
Abstract
A stochastic model for local disturbances, particularly for a temporal harmonic with random modulations in amplitude and/or phase, is
proposed in this paper. Results for the second moment responses of a linear single-degree-of-freedom system to this type of stochastic
loading demonstrate a significant change in response characteristics due to a small uncertainty. A local phenomenon may last much longer
and resonance may be smeared to a broad range. Integrated with wavelet transform, the proposed approach may be used to model a random
process with non-stationary frequency content. Especially, it can be effectively used for Monte Carlo simulation to generate large size of
samples that have similar characteristics in time and frequency domains as a pre-selected mother sample has. The technique has a great
potential for the case where uncertainty study is warranted but the available samples are limited.
q 2004 Elsevier Ltd. All rights reserved.
Keywords: Random vibration; Stochastic modeling; Random process; Wavelet analysis; Monte Carlo simulation; Earthquake engineering; Structural dynamics
1. Introduction
Vibration analysis is often required to evaluate
performance of engineering structural systems in a
dynamic environment where sources of vibration are
specified by time-varying inputs [3,8]. When uncertainty
of the input is involved, a stochastic model for the input
is often required to describe its random nature appro-
priately. Popular stochastic models are exemplified by the
white noise process, the Poisson process, and their
descendants associated with various filters to describe
the frequency content of the input and various envelope
functions to introduce non-stationarity into the forcing
function [1,10,11]. Once the stochastic model for the
excitation is selected, a close-form solution based on
probabilistic theory or the numerical Monte Carlo
simulation technique based on statistics can be employed
to find random response of the dynamic system of
concern. Consequently, performance of structural systems
can be evaluated in a probabilistic sense and reliability of
these structures in a random environment can be
assessed.
This study was motivated by certain needs as how to
describe time-varying frequency content of a random
process and how to obtain samples for a random process
for which only limited samples are available. In the former
case, modulated random processes were introduced and
usage of associated envelope functions may partially
address the issue. However, it is challenge to find simple
envelope function to match the specified time-varying
frequency content. For the latter case, to improve the
accuracy of the Monte Carlo simulation, large size of
samples are required for a random process but often there
are only a limited number of samples available for a
practical application. Sometimes there are extreme cases
where only one sample is available, such as a ground motion
record at a specific site for a specific earthquake event. This
paper proposes a wavelet-based approach to address the
issue based on the ability of wavelet analysis for multi-level
time–frequency domain analysis.
As one of the popular wavelets in wavelet analysis, the
Morlet or Garbor wavelet plays an important role in this
study. First, the wavelet has an explicit frequency content
as expressed by its central frequency, which facilitates a
physical interpretation of the associated wavelet transform
of a given signal regarding its time-varying frequency
content. Second, the Morlet wavelet with random
0266-8920/$ - see front matter q 2004 Elsevier Ltd. All rights reserved.
doi:10.1016/j.probengmech.2004.02.004
Probabilistic Engineering Mechanics 19 (2004) 211–218
www.elsevier.com/locate/probengmech
* Corresponding author. Tel.: þ1-508-831-5705; fax: þ1-508-831-5680.
E-mail address: [email protected] (Z. Hou).
disturbances falls into a category of stochastic model for a
harmonic process with random disturbances that has been
extensively studied in the literature [4–7,9,12]. However,
due to its nearly finite support, a scaled and shifted Morlet
wavelet-based model may be useful for a localized random
disturbance.
In this paper, a stochastic model based on the Morlet
wavelet is proposed to describe a localized harmonic
process with random disturbances in both amplitude and
phase and then a technique is proposed to generate samples
of a random process using one sample from its limited
available sample database, referred as a mother sample.
Two applications are given: one addresses effects of
uncertainties in a localized disturbance on second moment
response of a linear single-degree-of-freedom system and
the other illustrates how to use the proposed technique to
generate a set of ground motion samples from the 1940 El
Centro ground acceleration record, S00E component.
Promising results were obtained in both cases.
2. Morlet wavelet-based stochastic model for localized
disturbances
The proposed methodology in the present paper is
based on the Morlet wavelet. A complex Morlet wavelet is
given by:
cðtÞ ¼Affiffip
ps
exp 2t2
s2
!expðivctÞ ð1Þ
where vc and s are both real and positive. By the standard
operations of shifting and scaling in wavelet analysis, the
Morlet wavelet represents a localized and oscillatory signal.
In the frequency domain, the complex Morlet wavelet is
characterized by its Fourier transform as follows:
cðvÞ ¼ A exp 2ðv2 vcÞ
2
4=s
!ð2Þ
Eq. (2) shows that the energy of the wavelet is concentrated
around the center frequency vc and with a window size that
depends on s: Therefore, vc and s are often referred as the
center frequency and the bandwidth parameter of the
Morlet wavelet, respectively. As shown in Eqs. (1) and (2),
the complex Morlet function has localized Gaussian-type
windows in both time and frequency domains.
A Morlet wavelet-based stochastic model is proposed in
the following form:
f ðtÞ ¼ ð1 þ haðtÞÞe2t2=2 cosðvct þ hpðtÞÞ ð3Þ
where vc is the central frequency of the Morlet wavelet and
haðtÞ and hpðtÞ represent random disturbances in amplitude
and phase of the harmonic part, respectively. Both haðtÞ
and hpðtÞ are modeled as a stationary white noise process of
a normal distribution, satisfying:
E½ha1ðtÞ� ¼ E½hpðtÞ� ¼ 0
E½haðtÞhaðt þ tÞ� ¼ DadðtÞ
E½hpðtÞhpðt þ tÞ� ¼ DpdðtÞ
E½haðtÞhpðt þ tÞ� ¼ DapdðtÞ
ð4Þ
where Da and Dp represent, respectively, the intensities of
haðtÞ and hpðtÞ and Dap is the intensity of their cross
correlation. As a preliminary study, Dap is assumed to be
zero. If all D’s are zero f ðtÞ is reduced to a deterministic
case, i.e. the real part of the complex Morlet wavelet. The
exponential term introduces temporal localization into the
model. Alternative expressions may be used for the purpose
but the form in Eq. (3) is consistent with future wavelet
formulation.
Two representative deterministic signals, localized in the
time domain, are illustrated in Fig. 1. Both signals are
obtained by shifting the Morlet wavelet in Eq. (3) to t ¼ 5
and 15 s, respectively. The Morlet wavelets are also scaled
such that two signals have different decay rates and
therefore exhibit different localization properties. The signal
in the right figure is more localized due to its higher decay
rate characterized by a great s:
Fig. 2 plots samples generated from the proposed
stochastic model with different noise intensities of random
disturbances in phase. In Fig. 2, solid lines represent
samples generated from the proposed model and the dashed
lines are for the original signals without random disturbance
for comparison. All signals are localized in the neighbor-
hood of t ¼ 6 s. Fig. 2 plots results for random disturbances
in phase only. From the top to the bottom, the disturbance
intensity gradually increased from 0.01, 0.05, 0.1, up to 0.5.
For the top two plots with smaller disturbances, the samples
Fig. 1. Two representative shifted and scaled Morlet wavelets localized in
the neighborhood of t ¼ 5 and 15 s, respectively. The signal in the right
figure has a higher decay rate.
Z. Hou et al. / Probabilistic Engineering Mechanics 19 (2004) 211–218212
still demonstrate localized harmonic waveform as that of the
original deterministic counterpart but distorted by the
random phase modulation. With an increasing noise level,
the waveform becomes more and more irregular, as shown
in the two lower figures. It is expected that the waveform
will eventually be destroyed by significantly large random
phase modulation. Note that since these results are only for
the disturbance in phase, all samples are bounded.
Fig. 3 demonstrates samples generated from the proposed
stochastic model with different noise intensities of random
disturbances in magnitude. Again, the original signals
without random disturbance are plotted as the dashed lines
for comparison. All signals are still localized in the
neighborhood of t ¼ 6 s. From the top to the bottom, the
disturbance intensity in amplitude is gradually increased
from 0.01, 0.05, 0.1, up to 0.5. Like in Fig. 2, the top two
plots with smaller disturbances clearly show distorted
localized harmonic waveform but the waveform becomes
less recognized in the two lower figures. In comparison to
the bounded samples in Fig. 2, results in Fig. 3, caused by
disturbances in the amplitude only, are unbounded and show
a quite clear pattern in the frequency content.
Samples generated from the proposed stochastic model
with different noise intensities of the random disturbances in
both magnitude and phase are illustrated in Fig. 4. Results
exhibit similar features as those in the previous two figures
but the original harmonic waveform can be recognized only
for very small disturbances. In general, all these samples are
Fig. 2. Samples generated from the proposed model with various intensities
of random disturbances in phase. All signals are localized in the
neighborhood of t ¼ 6 s.
Fig. 3. Samples generated from the proposed model with various intensities
of random disturbances in amplitude. All signals are localized in the
neighborhood of t ¼ 6 s.
Fig. 4. Samples generated from the proposed model with various intensities
of random disturbances in both amplitude and phase. All signals are
localized in the neighborhood of t ¼ 6 s.
Z. Hou et al. / Probabilistic Engineering Mechanics 19 (2004) 211–218 213
neither bounded due to the disturbance in amplitude nor
having the original frequency pattern due to the disturbance
in phase.
3. Application: random response of linear SDOF systems
to a localized random disturbance
The proposed model has been applied to a linear single-
degree-of-freedom oscillator to study the effects of a
temporally local disturbance of uncertainties. The govern-
ing equation of motion of the dynamic system is:
md2x
dt2þ c
dx
dtþ kx ¼ f ðtÞ ð5Þ
where xðtÞ is displacement response of the system; m; c and k
are mass, viscous damping and stiffness coefficients of
the system, respectively; and f ðtÞ; described by Eq. (3), is
a localized excitation with random disturbance to take the
load uncertainty into account. Assume that the system is
originally at rest.
Monte Carlo simulation was adopted at the current stage
to find the second moment responses, i.e. auto-covariance of
the displacement and velocity, CxxðtÞ and CvvðtÞ and their
cross-covariance CxvðtÞ: The numerical results are shown in
Figs. 5–7. Since the mean values of the displacement and
velocity responses are zero in the studied case, the auto-
covariance responses are in fact also the mean square
responses of the displacement and velocity. Note that m ¼ 1
unit was consistently used for all results and the central time
of the local disturbance is at t ¼ 5 s. Two hundred samples
were used in the simulation and the fourth-order Runge-
Kutta numerical scheme was employed for calculation of
dynamic response of the system for each sample. Parameter
Fig. 5. Second moment responses of a linear single-degree-of-freedom oscillator subjected to a localized harmonic excitation with random phase modulation of
various intensities.
Z. Hou et al. / Probabilistic Engineering Mechanics 19 (2004) 211–218214
studies were performed for the intensity of the random
disturbance and the natural frequency and the damping ratio
of the system.
Fig. 5 presents the second moment responses of the
system to a localized harmonic input with random phase
disturbance for four intensity levels of 0, 0.001, 0.005 and
0.01. While the local input shows only a local influence on
the system responses for the deterministic case, i.e. the noise
level is zero, as shown in Fig. 5a, a small uncertainty may
significantly change the response characteristics, as
observed in Fig. 5b–d. The response tends to last much
longer than expected after the localized input applied.
Fig. 6 illustrates effects of the system damping on the
second moment responses of a single-degree-of-freedom
system subjected to a localized harmonic with random phase
modulation. The critical damping ratio was set to 0, 0.01,
0.05 and 0.2, respectively. The existence of system damping
will in general help to keep the local nature of a physical
phenomenon. More damping the system has, more localized
the system response is due to the local input.
Fig. 7 investigates how a system with different natural
frequencies responds to a local harmonic with random
phase modulation. The frequency parameter varies from 1 to
9 rad/s and only four sets of results for 1, 4, 5 and 6 rad/s are
plotted. The peak response may not necessarily appear at its
resonance frequency, i.e. 5 rad/s. The random phase
modulation smears the resonance peak of the deterministic
case, as observed.
In general, amplitude of the second moment responses
may be determined by a few competing factors. Among
them, higher damping will accelerate the decay of the
response caused by the temporal impact, frequency ratio
may increase or decrease the system response depending
whether moving into or away from the resonance, and
Fig. 6. Effects of the system damping on the second moment responses of a single-degree-of-freedom system subjected to a localized harmonic with random
phase modulation.
Z. Hou et al. / Probabilistic Engineering Mechanics 19 (2004) 211–218 215
the higher intensity of the random phase modulation may
bring more ‘averaging’ effect into secondary moment
responses. Therefore, amplitude of the second moment
responses in the above figures does not show a monotonic
change with a selected physical parameters.
4. Application: sample generation of general random
processes
The proposed model effectively works with wavelet
transform to generate a sample set of similar time–
frequency characteristics based on a given signal, referred
as the mother sample of a random process. Using a selected
analyzing or mother wavelet function CðtÞ; wavelet trans-
form of a signal, f ðtÞ; is defined as:
ðWf Þða; bÞ ¼1ffiffia
pðþ1
21f ðtÞ �C
t 2 b
a
� �dt ð6Þ
where a and b are the dilation/scaling and translation/
shifting parameters, respectively. Both are real and a must
be positive. The bar over CðtÞ indicates its complex
conjugate. The original signal may be recovered or
reconstructed by an inverse wavelet transform of ðWf Þða; bÞ
as defined by:
f ðtÞ ¼1
Cc
ðþ1
21
ðþ1
21ðWf Þða; bÞC
t 2 b
a
� �1
a2da db ð7Þ
Fig. 7. Effects of the system natural frequency on the second moment responses of a single-degree-of-freedom system subjected to a temporal harmonic input
with random disturbances.
Z. Hou et al. / Probabilistic Engineering Mechanics 19 (2004) 211–218216
where CC is defined by:
Cc ¼ðþ1
21
lFcðvÞl2
lvldv , 1 ð8Þ
in which FCðvÞ is the Fourier transform of the mother
wavelet. Wavelet analysis may be viewed as an extension of
the traditional Fourier transform with adjustable window
location and size. Merits of wavelet analysis lie in its ability
to examine local data with ‘zoom lens having an adjustable
focus’ to provide multi-levels of details and approximations
of the original signal. Details of wavelet analysis may be
found in Chui [2].
One of the popular wavelets is the Garbor or Morlet
wavelet, expressed as:
CðtÞ ¼ e2t2=2 cosðvctÞ ð9Þ
which is a real version of Eq. (1). vc is the central frequency
of the wavelet. Without loss of generality, vc ¼ 5 rad/s is
selected. Note that the Morlet wavelet in Eq. (9)
corresponds to the deterministic case of the proposed
model. A merit of Morlet wavelet is an explicit form of its
Fourier transform given by:
FCðvÞ ¼ðþ1
21cðtÞ e2ivt dt
¼ e2v2c2v2
e1=2ð2vcþvÞ2 þ e1=2ðvcþvÞ2� � ffiffiffiffi
p
2
rð10Þ
Using a modified version of reconstruction process in
wavelet analysis, a sample can be expressed as:
~fðtÞ ¼1
Cc
ðþ1
21
ðþ1
21ðWf Þða; bÞ �C
t 2 b
a
� �1
a2da db ð11Þ
where:
~CðtÞ ¼ ð1 þ Sða; bÞhaðtÞÞe2t2=2 cosðvct þ Sða; bÞhpðtÞÞ ð12Þ
in which Sða; bÞ is a characteristic function being one for all
dominant wavelet components of scale a at time b and zero
otherwise. As a result, samples can be generated based on
wavelet transform of a given signal, used as a mother
sample of the random process.
Fig. 8 presents a sample set generated from the proposed
model using the S00E component of the 1940 El Centro
Fig. 8. Samples generated using the 1940 El Centro Earthquake ground motion records with random disturbances of various intensities. The dashed lines are the
original ground motion data.
Z. Hou et al. / Probabilistic Engineering Mechanics 19 (2004) 211–218 217
ground acceleration data as the mother sample. By applying
the random disturbance for both amplitude and phase of
some dominant wavelet components at different times,
samples with a nature in both time and frequency domains,
similar to the mother sample, can be generated. A sample set
can be obtained for a combination of selected intensities of
random disturbance in both phase and amplitude. Only one
sample per intensity set is plotted in Fig. 8 for illustration.
For the sake of convenience, only data of the first 8 s are
presented. When compared with the original El Centro
ground acceleration data represented by the dashed line, the
induced sample set exhibits similar characteristics as the
original data. By changing intensities of the random
disturbances, a large size of samples can be generated for
Monte Carlo simulation study in many practical appli-
cations where uncertainty study is warranted but the
available samples are limited.
5. Conclusion
A stochastic model for local disturbances, particularly
for a temporal harmonic with random modulations in
amplitude and/or phase, is proposed in this paper. Results
for the second moment responses of a linear single-degree-
of-freedom system to this type of stochastic input show
significant changes in response characteristics due to small
uncertainties. A local phenomenon may last much longer
and resonance may be smeared to a broad range. Integrated
with wavelet transform, the model may be effectively used
for Monte Carlo simulation to generate large size of samples
that have similar characteristics in time and frequency
domains as a pre-selected mother sample has. The technique
has a great potential for the case where uncertainty study is
warranted but the available samples are limited.
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