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Exceptional Performance Intuitive User Interface State of the Art Probing All within Budget Agilent Technologies 16900 Series Logic Analysis Systems

Agilent Technologies 16900 Series Logic Analysis Systems

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Page 1: Agilent Technologies 16900 Series Logic Analysis Systems

ExceptionalPerformance

Intuitive User Interface

State of the Art Probing

All within Budget

Agilent Technologies16900 SeriesLogic Analysis Systems

Page 2: Agilent Technologies 16900 Series Logic Analysis Systems

2 www.agilent.com/find/logic

Get your leading-edge designsto market faster

Debugging today’s digital systemsis tougher than ever. You needhigh-performance, reliable toolsto help you overcome the difficultengineering challenges you face.

The 16900 Series logic analysissystems help you solve toughdebug problems, minimize your project risk, and get your leading-edge products tomarket faster.

These systems provide excellentperformance and accurate,reliable measurements – priced tomatch your budget. And, becauseyou can’t measure what you can’tprobe, we’ve used innovativeprobing technologies so you canaccess critical signals in yourdesigns. These analyzers includethe familiarity of Windows®, anintuitive graphical user interfaceand straightforward triggeringcapability – so you spend moretime on design and debug andless time learning how to usethem.

From our HP test andmeasurement foundation,Agilent’s leadership in logicanalysis spans four decades.Beginning with the creationof the logic analyzer in the1970s, Agilent consistentlydelivers high-value productsthat keep pace with yourlatest designs and set thestandard of price-performanceand ease of use in the logicanalysis market.

Now a new generation oflogic analyzers, the Agilent16900 Series logic analysissystems, deliver what you’vecome to expect from theindustry leader in logicanalysis…and more.

Figure 1. Conquer your toughest debug problems with an Agilent 16900 Serieslogic analysis system.

Page 3: Agilent Technologies 16900 Series Logic Analysis Systems

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Get the performance you needat a price to match your budget

Figure 2. The 16900 Series logic analysis systems provide exceptional performance,usability and superior probing at prices to match your budget.

Agilent Model Number 16901A 16902B

Number of Slots 2 6

Multiframe Pro Expandability Yes Yes

Display Type(s) and Resolution Built-in color touch screen display, Built-in color touch screen display, 15 inch (38.1 cm), 1024 x 768: 15 inch (38.1 cm), 1024 x 768:supports up to four external monitors supports up to four external monitors up to 1600 x 1200 (with PCI video card) up to 1600 x 1200 (with PCI video card)

PCI Expansion Slots 1 full profile 1 full profile

Table 1. Agilent modular 16900 Series mainframes.

The Agilent 16900 Series logicanalysis systems deliver thepower and performance you need to conquer your toughestdebug problems.

The mainframe you select is the foundation of your system.The 16900 Series mainframes’multithreading softwarearchitecture takes full advantage

of gigabit local area networks(Gbit LANs) and the latest inmulti-processor, large memorycomputer technology to achievethe fastest performance in theindustry. They provide you with extremely rapid zooming,searching and scrolling updatesfor deep memory, high-channelcount acquisitions.

Performance doesn’t end with the mainframe. Agilent’s 4 GHztiming zoom and eye findertechnologies make accuratemeasurements on high-speedsignals, so you can find criticalproblems that occur on theindustry’s fastest buses. You get accurate and reliablemeasurements, all time-correlated,for today’s complex circuits, withexpandability and performanceheadroom to cover futuretechnology trends.

Page 4: Agilent Technologies 16900 Series Logic Analysis Systems

Easily integrate the analyzerinto your debug environment

In addition to performance,usability and excellent pricing,you also get flexibility. You canmake measurements and analyze,store and share data according toyour work style. Whether you workalone at a bench or with teammembers distributed around theworld, the 16900 Series providesa use model that easily integratesinto your debug environment.

Work at your bench – operate theanalyzer via touch screen or keyboardand mouse.

Expand view across multiple monitors – get the mostcomprehensive view of your data with extended desktop viewing usingup to four monitors.

Figure 3. Get the mostcomprehensive view of your data with extendeddesktop viewing using up to four monitors.

Remotely control and monitor thelogic analyzer – access a remote logicanalyzer over the network with hostedpower mode or via built-in Windowsdesktop sharing. Receive an e-mailwhen the logic analyzer triggers.

Comply with your company’s networkstandards – add anti-virus software to the open Windows-based analyzer.

4 www.agilent.com/find/logic

Use the power of your latestmultiprocessor, deep memory PC orserver – increase your analyzer’s usageand team’s productivity. Use anyWindows-based computer on thenetwork to host the logic analyzerapplication software and remotelycontrol the logic analyzer. View andanalyze captured data on the PC whilethe logic analyzer makes additionalmeasurements. You can also create setups for your next roundof measurements.

Run automated tests – execute a series of tests via the ASCII remoteprogramming interface or Microsoft®

DCOM.

Offload data for custom analysis –move data quickly over the Gbit LANconnection to an external computer.

Share results and setups easily,anywhere in the world – transfer filesto USB flash drives or to shared drivesover high-speed LAN to share orarchive results and setups with teammembers worldwide. Copy and pastedata into other applications anddocument your findings.

Combine mainframes to expandmeasurement capability – use mainframes individually, then connectthem together when you need toanalyze complex, multiple-bus problems.

Figure 4. Whether you work alone at a bench or withteam members distributed around the world, the 16900Series provides a use model that easily integrates intoyour debug environment.

Page 5: Agilent Technologies 16900 Series Logic Analysis Systems

3 view & analyze

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connect1

Easily configure your16900 Series system

5

Configuring a 16900 Series modularsystem is as easy as 1, 2, 3.Select the probing, measurementmodules and analysis optionsthat are best suited for yourspecific application.

create thephysical and electricalconnection between the logicanalyzer and your device undertest with innovative probing.

obtain accurateand reliable measurements,with power to support futuretechnology trends.

consolidate largeamounts of data rapidly intodisplays that provide views ofyour system’s behavior in aformat you understand.

Figure 5. Soft touchconnectorlessprobes provide a powerfulcombination ofeasy, reliableconnection withhigh performance.

Figure 6. Choose from a family of logicanalyzer and pattern generator modulesto meet your requirements.

Figure 7. Get instant insight intoyour design with multiple viewsand analysis tools.

Agilent Technologies offers a widevariety of probing accessoriesthat support general-purpose and application-specificmeasurement needs.

Get accurate measurements with reliable probing

Agilent consistently delivers the leading edge in probinghardware and techniques to givedesigners like you access to thevery signals that hold the key toyour system’s problems.

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Page 6: Agilent Technologies 16900 Series Logic Analysis Systems

Quickly debug your Xilinx or AlteraFPGA and surrounding system

FPGAs play an increasinglyimportant role in your digitaldesigns. The high level of featuresand integration available intoday’s FPGAs allows you to use them in ways that weren’tenvisioned just a few years ago.It’s likely that your FPGA designcontains a subsystem or systemthat formerly would haveoccupied an entire board.

Figure 8. The FPGA dynamic probe dramatically increases debug productivity.

These higher levels of integrationpresent new challenges fordesigners. Signals that werepreviously available on the boardmay exist exclusively as nodesinside the FPGA. Getting visibility across critical internal interactions can betime-consuming. This makesintegration of the FPGA and thesurrounding system challenging.

Logic analyzer measurements are particularly effective in debugof FPGAs and the surroundingsystems. Combined with anAgilent logic analyzer, the FPGAdynamic probe provides the mosteffective solution for debuggingcomplex and elusive problems.

View internal FPGA activity. With alogic analyzer, you are normally limitedto measuring signals at the peripheryof the FPGA. With the dynamic probe,you get the additional benefit of beingable to look at signals internal to the FPGA. Access up to 256 internalFPGA signals for every debug pin.

Make multiple measurements inseconds. Moving probe points internalto an FPGA used to be time consuming.Now, in less than a second you caneasily measure a different group ofinternal signals — without changingyour design.

Leverage the work you did in yourdesign environment. The FPGAdynamic probe is the first tool on themarket that maps internal signal namesfrom your FPGA design tool to yourlogic analyzer. Eliminate mistakes andspeed the setup of signal and bus namesand connections on logic analyzers.

6 www.agilent.com/find/logic

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Page 7: Agilent Technologies 16900 Series Logic Analysis Systems

Accurate measurements startwith reliable probing

Figure 10. Soft touch connectorlessprobes have 1/4 thecapacitive loading ofconnector probes andare the industry’smost reliableconnectorlesssolution.

Figure 9. The compact 17-channel soft touchprobe is ideal for tight spaces or times whenfewer signals need to be probed.

7

Save time analyzing your unique design with a turnkey setup

Agilent Technologies and ourpartners provide an extensiverange of bus and processoranalysis probes. They providenon-intrusive, full-speed,real-time analysis to accelerateyour debugging process.

Save time making bus- andprocessor-specific measurementswith application-specific analysisprobes that quickly and reliablyconnect to your device under test.

Display processor mnemonics, buscycle decode, or protocol packets.

Get support for a comprehensive list of industry-standard processorsand buses.

Agilent and Third-Party Processor Support

AMCC InfineonAMD Intel®

ARM® MotorolaFreescale SiemensIBM Xilinx

Agilent and Third-Party Bus, Protocol orFPGA Support

Advanced Switching PCIInterface PCI Express®

Altera: Stratix II GX, PCI-X®

Stratix II, Stratix GX, RS-232, RS-449Stratix, Cyclone II, Serial ATACyclone, Max II, Serial Attached SCSIAPEX 20K, APEX II, SPI (Serial Peripheral Excalibur Interface)

CAN SPI-4.2/PL4 DDR1, DDR2, DDR3 (System Packet Fibre Channel Interface)Fully buffered DIMM USBGDDR3 Xilinx: Virtex-5, HyperTransport Virtex-4, I2C Virtex-II Pro Series, InfiniBand Virtex-II Series,

Spartan-3/3A/3E

Soft touch connectorless probingAgilent’s soft touch probingadvantages include quick, easyconnection, minimal loading onyour target system and no needfor a connector designed intoyour target circuit board.

Figure 11. Use Agilent’s high-performanceflying-lead probes when you need themost flexibility in probing.

Connector probingConnector probes are a proven industry standard forprobing many signals in one easy connection.

Flying-lead probingFlying-lead probes provideflexibility for solving a variety of probing problems. They offerconnection to individual signalsso you can measure ones you maynot be able to measure otherwise.

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www.agilent.com/find/logic

Get exceptional performance, usability and superiorprobing at a price to match your budget

Up to 256 M deep memory foridentifying the root cause of a problemand symptom that are widely separatedin time

Modularity provides configurationflexibility to meet your measurementneeds – now and in the future

15-inch (38.1 cm) color touch screendisplay, allows you to see more data.Viewing relationships between largenumbers of signals and buses helpsyou identify a problem sooner.

View Scope lets you quickly validatesignal integrity and timing relationshipsbetween analog and digital domains by seamlessly integrating your scopeand logic analyzer waveforms into asingle display. Synchronized samplingclocks keep the logic analyzer andoscilloscope measurements tightlytime-correlated across deepacquisitions.

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44.32 cm17.45 in

General-purpose knob lets you quicklyadjust your viewing and measurementparameters. Select a modifiablevariable, then turn the knob to quicklystep through values for the variable.

Touch screen gives you direct accessto all logic analyzer functionality so you can stay focused on yourmeasurement. “Touch Off” key disablesthe touch screen and allows you topoint out anomalies to a colleaguewithout altering the display settings.

Six 2.0 USB ports, two in front, four inthe rear, let you “hot connect”a mouse,keyboard or USB storage drives.

28.88 cm11.37 in

38.1 cm15 in

36.1 cm14.2 in

16901A dimensions

See the 16900 Series mainframe datasheet (5989-0421EN) for 16902Bdimension details.

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10 www.agilent.com/find/logic

Choose the modules that meetyour specific needs

Modular expandability is the key to the long-term value of the Agilent 16900 Series logicanalysis systems. Purchase thecapability you need now, thenexpand as your needs evolve.Configure a custom logic analysissystem with modules to fit yourperformance and price needs.Protect your investment byupgrading analyzer modulememory depths or state speeds as your needs change.

Only Agilent enables you to spliteach logic analyzer module intotwo separate time bases. You cancorrelate activity across multiplebuses using a single module withthis capability.

• Create higher-channel-countsystems by combining modules.

• Find elusive cause and effectproblems separated in time byusing deep memory.

Make accurate high-speed state measurementsEye finder automates the processof finding the precise moment to sample each signal relative tothe clock.

• Save time during measurementsetup with automatedthreshold and sample position adjustments.

• Quickly determine whichsignals haveactivity.

• Compensate forskew induced by variances in signal path lengths.

Accurately measure precise timing relationshipsA parallel acquisition architectureprovides up to 4 GHz high-speedtiming zoom simultaneously withother state or timing measurement.Timing zoom stays active all thetime with no tradeoffs.

• Gain confidence in yoursystem, whether you’re makingtiming or state measurements.

Figure 14. Modularity provides configuration flexibility to meet your measurementneeds—now and in the future.

Figure 13. Combine multiple acquisitionmodules when you need to measureacross many channels.

Figure 12. Identify problem signals quickly byviewing eye diagrams across all buses and signalssimultaneously.

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Support for other modulesThe 16900 Series also support thefollowing measurement modules:

Timing/State Modules• 16950A• 16760A• 16753A, 16754A, 16755A,

16756A• 16750A/B, 16751A/B,

16752A/B• 16740A, 16741A, 16742APattern Generator Module• 16720A

Headroom for your future needs(Extend the life of your equipment)Easily upgrade your 16900 Seriesmodules. “Turn on” additionalmemory depth and state speedwhen you need more. Purchasethe capability you need now, thenupgrade as your needs evolve.

16910A Upgrade max. state speed 16911A from 250 MHz to 450 MHz

and max. data rate from 250 Mb/s to 500 Mb/s

Memory depth options 256 K, 1 M, 4 M, 16 M or 32 M

16950A Memory depth options 256 K,1 M, 4 M, 16 M, 32 M or 64 M

16950B Memory depth options 1 M, 4 M, 16 M, 32 M or 64 M

Ultra Performance High Performance Agilent Model Number 16950B2/16951B2 16910A2 / 16911A2

Channels Per Module 68 102 / 68

Max Channels on Single 340 510 / 340Time Base and Trigger

High-Speed Timing Zoom1 4 GHz (250 ps) with 64 K depth 4 GHz (250 ps) with 64 K depth

Max Timing Sample Rate 1.2 GHz (833 ps)/ 1.0 GHz (1.0 ns)/(Half/Full Channels) 600 MHz (1.67 ns) 500 MHz (2.0 ns)

Max State Clock Rate 667 MHz 450 MHz with option 500,250 MHz with option 250

Max State Data Rate 1066 Mb/s 500 Mb/s with option 500250 Mb/s with option 250

Memory Depth 256 M (16951B) 256 K up to 32 M1 M up to 64 M (16950B)

Supported Signal Types Single-ended and differential Single-ended

Automated Threshold/ Yes YesSample Position, Simultaneous Eye Diagrams, All Channels

Probe Compatibility 90-pin cable connector 40-pin cable connector

1. All channels, all the time, simultaneous state and timing through same probe.2. Probes are ordered separately. Please specify probes when ordering to ensure the correct connection between your

logic analyzer and the device under test. Specify desired memory depth, state clock and data rate using availableoptions. Feature also available via software upgrade to existing module.

Table 2. Select the analyzer modules that best suit your requirements.

Unleash the complementary power ofa logic analyzer and an oscilloscopeEffectively track down problemsacross the analog and digitalportions of your design. Easily make time-correlatedmeasurements between anAgilent 16900 Series logicanalyzer and 80000, 8000, 6000,or 5000 Series oscilloscope.

Choose the modules that meetyour specific needs (continued)

Agilent 16720A1 Half Channels Full Channels

Max Clock Speed 300 MHz 180 MHz

Max Memory Depth 16 M Vectors 8 M Vectors

Channels Per Module 24 48

Max Number of Channels 120 240Per Time Base

Stimulus Commands Initialize, Block, Repeat, and Break Macros

Logic Levels Supported 5 V TTL, 3 state TTL, 3 state CMOS, 3 state 3.3 V ECL, 5 V PECL, 3.3 V LVPECL, 3 state 2.5 V, 3 state 1.8 V, LVDS

1. Order at least one clock pod for each module used as a master and at least one data pod for every 8 output channels.

Table 3. Add a pattern generator module to drive down risk early in product development.

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12 www.agilent.com/find/logic

Simplify debug withintuitive triggering

Agilent’s intuitive triggering helps you identify the cause of elusiveproblems in less time – so youcan debug and validate yourdesign more quickly.

Figure 19. Workingremotely? Tell the analyzerto send you an e-mailwhen it finds a triggercondition and acquires asnapshot of your system.

Figure 16. Define a single trigger event asa combination of levels, edges, patterns orglitches across multiple signals and buses.

Simple Trigger

Set the trigger according to how youthink about your target signals. Usestandard events, such as rising edge,falling edge, glitch or pattern to definea trigger event. These events areaccessible via an easy pull-down menuwithout leaving the waveform display.

You can set the trigger for an event onthe basis of activity on one or morebuses or signals. Simply select thepatterns, edge or levels for the signalsthat apply.

Figure 17. Create a trigger by simplydrawing a box around an event in thecurrent trace.

Set “Quick Trigger”

See something you didn’t expect in thecurrent trace? Simply draw a boxaround the questionable event andselect Set Quick Trigger to see if itoccurs again. You don’t have to spendtime defining the trigger. The analyzerdoes the work for you.

Figure 18. Customize a trigger to specifythe sequence of events leading up to atrigger event.

Advanced Trigger

With the Advanced Trigger feature,you can customize a trigger for yourspecific situation. You can usemodifiable trigger functions asindividual trigger events or as buildingblocks for complex scenarios.

Icons provide a graphical representationfor each trigger function. Simplydrag-and-drop an icon into the triggersequence. To fully define the traceevent, fill in the blanks with values orselect standard options from thepull-down menu.

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Figure 22. The split Source windowdisplays the source code on top and theinverse-assembled trace below. The twotraces are time-correlated and track asyou scroll.

Source Correlation Window

Correlate your logic analyzer trace to thehigh-level source code that produced it.

Locate the cause of a problem by“stepping backward” from the pointwhere you see a problem to its root cause.

Set up your next logic analyzeracquisition by simply pointing andclicking on a line of source code.

Determine the cause of data corruptionby acquiring all activity relative to a variable.

Get instant insights into your designwith multiple views and analysis tools

The 16900 Series’ navigation,data view and analysis featuresprovide instant insights into yoursystem’s operation.

Figure 20. View timing relationships tovalidate hardware operation with theWaveform window.

Waveform/Chart View

Validate correct hardware operation byviewing timing relationships betweenmultiple buses and signals, includingwaveforms imported from a scope.

Track a symptom on one bus to itscause on another bus or signal usingtime-correlated global markers.

Verify that all of the signals in yourtarget are functioning with a quickglance at the activity indicators.

Highlight and differentiate signals ofinterest by individually coloring andsizing signals/buses.

Compare signals/buses directly withthe Overlay feature.

Graphically validate digitized signals toand from A/D converters by charting abus’s values over time.

Make quick, precise measurementsusing snap-to-edge marker placement.

Figure 21. The Listing window is typicallyused to view states.

Listing Window

Examine data patterns and sequencesof events in the same order they werecaptured and placed into memory.

View data in a format that has meaning to you – binary, hex, octal,decimal, signed decimal (twoscomplement), ASCII, symbols, orprocessor mnemonics.

Mark and navigate to points of interestwith individually colored, named andannotated markers.

13

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14 www.agilent.com/find/logic

Figure 23. The Compare window lets you quickly identify differences betweentwo traces.

Compare Window

Find functional differences between aknown good device and one that has a problem by comparing traces fromeach device.

Determine how your device willrespond differently under varyingoperating conditions like temperatureor frequency changes.

Find intermittent errors. Stop arepetitive run when a comparedifference or number of differences is found.

Work remotely and let the analyzernotify you via e-mail when a newacquisition has more than a specifiednumber of compare differences.

Compare traces of different lengths orjust a specific range of the trace. Offsetthe reference data so that the samplesbeing compared are properly aligned.

Get instant insights into your design with multiple views and analysis tools (continued)

Figure 24. Customize your data view withthe Filter/Colorize tool and Agilent’sexclusive VBA view.

Filter/Colorize Tool

Perform multiple analysis scenarioswithout re-acquiring data when you’renot sure what you're looking for.

View data in an easy to understandformat that provides insight andanswers. The VBA view chartingfunction is seamlessly integrated,providing multiple ways to categorizedata - line charts, XY scattergrams (I/Q plots), horizontal and vertical barcharts, pie charts and more.

Focus on just the information you need.Filter uninteresting data such as idlestates and cache fills from deep,complex acquisition traces.

Gain quick insight into the frequency ofan event. Scroll through the trace withthe filter tool’s color highlighting enabled.

Save time performing your favoriteanalysis scenarios. Store, recall andshare your favorite search/filterconditions and VBA views, eachindividually named for easy recognition.

Figure 25. Extend your measurementresults with customized data analysis.

Making Measurements andCustomizing Analysis

Save time by creating custom dialogs that perform repetitive tasksand analysis.

Create an automated test suite thatmodifies the trigger for the next runbased on the analysis results ofprevious runs.

Perform further analysis using the analysis functions of otherCOM-enabled PC applications bylaunching and transferring data to anapplication like MathWork’s MATLAB®.

Customize your measurement by developing your own inverseassemblers or analysis tools with theAnalysis API.

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Get instant insights into your design with multiple views and analysis tools (continued)

Related literature and CD-ROMS

Publication title Publication type Publication number

Agilent Technologies 16900 Series Logic Analysis Systems Data Sheet 5989-0421EN

Agilent Technologies Timing and State Modules for the 16900 Series Logic Analysis System Data Sheet 5989-0422EN

Agilent Technologies 16800 Series Portable Logic Analyzers Data Sheet 5989-5062EN

Agilent Technologies 16800 Series Portable Logic Analyzers Data Sheet 5989-5063EN

Agilent Technologies FPGA Dynamic Probe for Xilinx Data Sheet 5989-0423EN

Agilent Technologies FPGA Dynamic Probe for Altera Data Sheet 5989-5595EN

Probing Solutions for Agilent Technologies Logic Analyzers Catalog 5968-4632E

Application Support for Agilent Logic Analyzers Configuration Guide 5966-4365E

Innovative Digital Debug Solutions CD with Videos CD-ROM 5980-0941EN

For current promotions and special offers on logic analyzers, includingtrade-up offers, visitwww.agilent.com/find/logic-offer

Figure 26.

Packet Viewer

Save time debugging your systemwhen you trigger, search, view andanalyze at the packet level.

View summarized and detailed packetinformation simultaneously. The upperpane displays decoded packets andfields. The lower pane contains tabs for viewing selected packet details,header, payload, and lane information.

Use Agilent’s solutions for industrystandard protocols like PCI Express oruse our B4641A Protocol DevelopmentKit to create a solution for yourproprietary protocol.

Figure 27.

Digital Vector Signal Analysis

Perform in-depth time, frequency andmodulation domain analysis on yourdigital baseband and IF signals.

See your signal as it changes from atrain of perfect symbols to a signal withfiltering, pre-distortion, re-sampling, orother potential sources of error.

Eliminate writing custom software toanalyze your data. The 89600 VectorSignal Analysis software provides a wealth of display formats,measurements, and digital modulationanalysis – all using consistent,industry-tested algorithms.

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www.agilent.com/find/logic

MATLAB is a U.S. registered trademark ofThe MathWorks, Inc.

Windows and Microsoft are U.S. registeredtrademarks of Microsoft Corporation.

Intel is a U.S. registered trademark of IntelCorporation.

PCI Express and PCI-X are registered trademarks of PCI-SIG.

ARM is a registered trademark of ARM Limited.

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offers open connectivity for a broad range

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software, PC-standard I/O and global

support, which are combined to more

easily integrate test system development.

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