ALD 20µm Microchannel PlatesLatest batch, #161-166, 167, 168

Visible light transmission for a 20 µm pore#168 ALD MCP .

20 µm pores (8° bias). New substrate batch. All from INCOM 11863, job # 518627.All show comparable visual features – so same material batch.

Surface photo for a 20 µm pore #168 ALD MCP with NiCr electrode .

Imaging Performance of ALD MCPs, 33mm

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20µm borosilicate MCP substrates, 60:1 L/d, 8 degree pore bias.~1000v applied to each MCP.

Single MCP tests in DC amplification mode show imaging and gain very similar to conventional MCPs.

MCP pairs operated in photon counting mode also show imaging and gain very similar to conventional MCPs.

Sample performance hasimproved dramatically overthe last 12 months due to process improvements.

UV 184nm illumination

33mm ALD-MCP #164 Background Rate

Pulse amplitude distributions for UV145nm, and for background events, There may be excess background dueto detection of ion pump events.

1000 sec background, 496 counts, at 2.5 x 106 gain, 2600v total, with 400v on anode. Background rate is 0.095 events cm-2 sec-1. Improved to 0.08 events cm-2 sec-1 with vacuum.

MCP gapped pair (164-163), 20µm pores, 8° bias, 60:1 L/d, achieves <0.08 events cm-2 sec-1.

33mm ALD-MCP #164 Imaging

Image of 185nm UV light, shows top MCP hexmodulation (sharp) and faint MCP hexmodulation from bottom MCP. Several triplecorner crush defects, but generally very good

MCP gapped pair (164-163), 20µm pores, 8° bias, 60:1 L/d,

Gain map (average gain), shows top MCP hex modulation (sharp) and couple of spots where the gain is low. Only a littlemulti to multi differences.

ANL ALD-MCP #163 Background Rate

Pulse amplitude distributions for UV145nm, and for background events, here may be excess background dueto detection of tank ion events.

3000 sec background, 0.120 events cm-2 sec-1. Uniform background rate is 0.120 events cm-2 sec-1. Not pumped very long, has some tank ion input flux.

MCP gapped pair (163-164), 20µm pores, 8° bias, 60:1 L/d

33mm ALD-MCP #163 Imaging

Image of 185nm UV light, shows top MCP hexmodulation (sharp) and faint MCP hexmodulation from bottom MCP. Several triplecorner crush defects, but generally very good

MCP gapped pair (163-164), 20µm pores, 8° bias, 60:1 L/d,

Gain map (average gain), shows top MCP hex modulation (sharp) and spots where the gain is low. One characteristic set of multi rows with high gain.

ANL ALD-MCP #161 Background Rate

Pulse amplitude distributions for UV145nm, and for background events, here may be excess background dueto detection of tank ion events.

1000 sec background, 0.145 events cm-2 sec-1. Uniform background rate is 0.129 events cm-2 sec-1. Couple of warm spots, not pumped very long, has some tank ion input flux.

MCP gapped pair (161-164), 20µm pores, 8° bias, 60:1 L/d

Older 33mm ALD-MCP #140 Imaging

Image of 185nm UV light, shows top MCP hex modulation (big) and small MCP hex size modulation from bottom MCP.

MCP gapped pair (140-164), 20µm pores, 8° bias, 60:1 L/d,

Gain map (average gain), shows top MCP hex modulation. Old MCP substrate shows significant gain variations at boundaries and within multis.

MCP Test Observations• New substrates/coatings are much better for imaging and background• No triple point voids, and little debris to cause hotspots• New substrates/coatings give 0.12 to 0.08 events cm-2 sec-1 background• Glass pitting has nothing to do with the background behavior • Looks good for use in LAPP tubes, but need to get more timing, lifetest data

NEXT STEPS• Ready to begin next lifetest:- bake, and scrub with a pair of the new MCPs

hope to show better overall stability for gain and background.• Have computer controlled bake and scrub data logging now up and running

• Will need more new 20µm 33mm MCPs for tests – resistance matched!! Other Issues

• 4 ea 8” 40µm MCPs electroded for Anil ALD tests • NEED 8” MCPS for our TESTBED imaging detector!!• Electroding 2 ea 40µm 33mm MCPs cut from 8” substrate, ALD done by Anil beforehand. To check 8” 40µm MCP quality.• New 8” MCP ship containers sent to ANL with INCOM ship test substrates