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APD, CSP and T-card Characteristics Toru Sugitate / Hiroshima University [email protected] for PHOS FEE Review / PRR Meeting in Wuhan, China on May 30/31, 2005

APD, CSP and T-card Characteristics Toru Sugitate / Hiroshima University [email protected] for PHOS FEE Review / PRR Meeting in Wuhan, China on

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Page 1: APD, CSP and T-card Characteristics Toru Sugitate / Hiroshima University sugitate@hiroshima-u.ac.jp for PHOS FEE Review / PRR Meeting in Wuhan, China on

APD, CSP and T-card Characteristics

Toru Sugitate / Hiroshima University

[email protected]

for PHOS FEE Review / PRR Meeting in Wuhan, China

on May 30/31, 2005

Page 2: APD, CSP and T-card Characteristics Toru Sugitate / Hiroshima University sugitate@hiroshima-u.ac.jp for PHOS FEE Review / PRR Meeting in Wuhan, China on

PHOS electronics embedded

Page 3: APD, CSP and T-card Characteristics Toru Sugitate / Hiroshima University sugitate@hiroshima-u.ac.jp for PHOS FEE Review / PRR Meeting in Wuhan, China on

PHOS signal processing scheme

Page 4: APD, CSP and T-card Characteristics Toru Sugitate / Hiroshima University sugitate@hiroshima-u.ac.jp for PHOS FEE Review / PRR Meeting in Wuhan, China on

PbW04 crystal

lead-tungstate crystal (PWO)

Fluorescence decay-time of around 25ns at the operation point; i.e. -25deg.

Inorganic scintillating crystal of 22x22x180 mm3, corresponding to 20X0.

Emission spectrum has blue(420nm) and green(500nm) components.

Light yield of 7-12 pe/MeV for crystals produced in Apatity.

Larger LY as cooling down, but increase slower components.

High QE in blue, low noise and capacitance, and thin photo-sensor, operational at low temperature and in magnetic field is required.

Page 5: APD, CSP and T-card Characteristics Toru Sugitate / Hiroshima University sugitate@hiroshima-u.ac.jp for PHOS FEE Review / PRR Meeting in Wuhan, China on

Silicon avalanche photo diode (APD)

Page 6: APD, CSP and T-card Characteristics Toru Sugitate / Hiroshima University sugitate@hiroshima-u.ac.jp for PHOS FEE Review / PRR Meeting in Wuhan, China on
Page 7: APD, CSP and T-card Characteristics Toru Sugitate / Hiroshima University sugitate@hiroshima-u.ac.jp for PHOS FEE Review / PRR Meeting in Wuhan, China on

Smaller sensitive area, but 3-4 times higher QE than PMT.

Abrupt breakdown at a certain reverse voltage.

NB; data are given at 25 deg.

Page 8: APD, CSP and T-card Characteristics Toru Sugitate / Hiroshima University sugitate@hiroshima-u.ac.jp for PHOS FEE Review / PRR Meeting in Wuhan, China on

Gain depends on temp and reverse voltage, and

higher performance as cooling down.

Both the precise temperature and reverse voltage controls are required.

Page 9: APD, CSP and T-card Characteristics Toru Sugitate / Hiroshima University sugitate@hiroshima-u.ac.jp for PHOS FEE Review / PRR Meeting in Wuhan, China on

Reality of APD’s(for samples ~ 1800)

Inverse current at M=50

1

10

100

1000

0 5 10 15 20 25 30 35 40 45 50

Inverse current at M=50

num

ber

of

APD

Inverse current (nA) at op. voltage

0 10 20 30 40 50 0

100

200

300

400

500

15 20 25 30

15 20 25 30

num

ber

of

APD

Vop.= 350 - 440VVbreak – Vop.= 20 - 25VIdark peaks at 5nA, and

mostly below 15nA.

Inverse current (nA)voltage difference (V)

Vbreak – Vop.

0

50

100

150

200

250

300 350 400 450 500Bias Voltage (V)

num

bers

break down voltagebias voltage at M=50

num

ber

of

APD

Breakdown voltage and Op. voltage at M=50

300 350 400 450 500inverse voltage (V)

Page 10: APD, CSP and T-card Characteristics Toru Sugitate / Hiroshima University sugitate@hiroshima-u.ac.jp for PHOS FEE Review / PRR Meeting in Wuhan, China on

J-FET

Sensitivity

Rise time

Noise (ENC)

Output polarity

Feedback loop Power

dissipation

2SK932 (IDSS rank =23) by SANYO

0.833V/pC

15-20 ns over full range

200 e + 3.2 e /pF x Cin(pF)

Positive

100M // 1pF

64mW (4.2mA @12V & 2.2mA @-6V)

APD: Hamamatsu S8148/S8664-55

APD preamplifier: Originally designed and built at CCNU & Bergen.

Re-designed in 2002 at Hiroshima using components available in Japan.

Hiroshima ver.2 is successfully performed in PHOS256 in 2003/04.

Minor modification for ver.3 in 2004.5,000 of Hiroshima ver.3 has been

produced for the first module.

C5 only for test

100M // 1pF

Page 11: APD, CSP and T-card Characteristics Toru Sugitate / Hiroshima University sugitate@hiroshima-u.ac.jp for PHOS FEE Review / PRR Meeting in Wuhan, China on

T-card: 8 CSP outputs into single base connector. Originally built at Bergen in 2003.Re-deigned at Hiroshima in 2005 to;

fit with the new frame design at Sarov, remove a test pulse generator, andremove serial registers R11 to R16 in p

ower lines, since they are on CSP. 10 samples of the new version for testing. Connectors onboard;

MOLEX 53047-0610 AMP 747470-2

Sarov design

Page 12: APD, CSP and T-card Characteristics Toru Sugitate / Hiroshima University sugitate@hiroshima-u.ac.jp for PHOS FEE Review / PRR Meeting in Wuhan, China on

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