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Application of CMOS sensors in radiation detection S. Ashrafi Physics Faculty University of Tabriz 1

Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

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Page 1: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

Application of CMOS sensors in radiation detection

S. Ashrafi

Physics FacultyUniversity of Tabriz

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Page 2: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

CMOS Complementary Metal Oxide Semiconductor

MOS the MOSFET transistors

Complimentary the two different types of semiconductors (N-type and P-type)

CMOS is used in electronics:

static RAM, digital logic circuits, micro processors, micro controllers, image sensors and particle tracking, and …

CMOS is a technology for making low power integrated circuits.

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Page 3: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

Architecture of a CMOS image sensor

photodetector

tran

sisto

rs

access a pixeland read the signal value

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Page 4: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

Basic functions of CMOS webcam:

Optical gathering of photons (lens)

Wavelength discrimination of photons (filter)

Detector for photons to electrons conversion (photodiode)

readout the detector

Timing control, and drive electronics

Signal processing electronics

Analog-to–digital conversion

Interface electronics

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Page 5: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

Basic configuration of CMOS image sensor.

MSF = source follower transistor

MSEL = select transistor

An n-MOSFET structure is shown:MRS = reset transistor

source is a PD

drain is biased at Vdd

gate is off-state.

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Page 6: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

Potential profile

Ohta-2007

The impurity density in the sourceis smaller than that in the drain.

electron density

n MOSFET

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Page 7: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

The operation of an APS is as follows:

First, the reset transistor MRS is turned on. This resets VPD to (Vdd −Vth), where Vth is the threshold voltage of transistor MRS.

Then, MRS is turned off and the PD is electrically floated.

When light is incident, the photo-generated carriers accumulate in the PD junction capacitance CPD. The accumulated charge decreases VPD according to the input light intensity.

After an accumulation time of 33 msec , (at video rate), the select transistor MSEL is turned on and the output signal in the pixel is read out in the vertical output line.

When the read-out process is finished, MSEL is turned off and MRS is again turned on to repeat the above process.

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Page 8: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

Photodetectors for CMOS image sensors

• behavior of minority carriers is important

• In p-type substrate minorities are electrons

• infrared (IR) penetrate up to 10 μm

• Diffusion of minorities to adjacent photodiodes

• image blurring.

• A PD is usually operated in accumulation mode.

• Photocarriers are swept to the surface due to the potential well in the depletion region

• The potential voltage decreases

• voltage drop ∝ the light powerOhta-2007

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Page 9: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

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Page 10: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

Blooming

The pixels’ potential well has got specified capacity. If quantity of charge is too large, then it diffuses into potential wells of surrounding pixels.

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Page 11: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

CMOS: pros & cons listing

1. Low power consumption.

work at low voltage

2. Lower cost

4. Miniaturization

5. Random access of image data

6. High-speed imaging.

1. Lower Sensitivity

2. Higher Noise

3. Small Dynamic range

Fill Factor × Quantum Efficiency

especially under low illumination

Ratio: saturation signal / rms noise floor

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Page 12: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

α3He

p

TD

Image sensor preparation for particle detection

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Page 13: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

Electron: range – energy in Silicon

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Page 14: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

A Bayer filter over the pixel sensor array

2010-Holms

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Page 15: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

Camera Sensor Pixels with RGB Color and Infrared Blocking Filters

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Page 16: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

computing the size, charge and coordinates of the center of each alpha cluster detected.

measurements in a light tight box 241Am (activity 4.6 kBq) source 5.48 MeV alpha particles

The back-illuminated BT sensor showed nearly 100% efficiency.

Maneuski-2011

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Page 17: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

Total Ionizing Dose (TID) –via Dark Current (DC) analysis

1) 60Co irradiation at room temperature2) Sample is unbiased 3) Integration time is 3 seconds 2010-Beaumel

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Page 18: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

Thomas Auzinger, 2012

GeigerCam: Measuring Radioactivity with Webcams

use morphological clustering to group pixels into particle impact events and analyze their energies.

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Page 19: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

Dead time

The frame rate was 30 Hz, but there were only six different frames per second gathered. It could be caused by large quantity of generated charge that could not be discharged by circuits in the image sensor. The dead time of this detector is 5 cycles, which corresponds to 1/ 6 s, compared to the dead time of Geiger-Müller counters of about 10−4 s

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Page 20: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

Radon monitor

2013-Griffin

electrostatic concentrator

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Page 21: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

2013-Griffin

β

α

Radon measurements:

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Page 22: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

Linearity & Sensitivity

Kang 2016

2) For X-rays, the bluecomponent has higher sensitivity

1) The excellent linearity

Sensor has a thickness of less than 10 μm

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Page 23: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

X-ray energy dependence

Kang 2016

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Page 24: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

Gamma-ray dose rate dependence 137CS: 662 keV

Kang 2016

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Page 25: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

Other Gamma-rays

Kang 2016

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Page 26: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

CellRAD is a system of software that runs on off-the-shelf unmodified Android cellphones. It uses the camera of the phone to detect gamma radiation.

CellRAD

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Page 27: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

Dark current distribution – low dose

CMOS CHARACTERISTICS

Dark current spectroscopy: Second peak is related to deep-level traps

Shift of distributionDue to TID

2014-Virmontois

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Page 28: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

Dark current distribution – high dose

Shift of distributionDue to TID

Spikes are related to Displacement damages

2014-virmontois

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Page 29: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

CMOS image sensors as X-ray imagers

High-resolution X-ray micro-imaging X-ray beam monitor

2015-Castoldi

1 mm

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Page 30: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

CMOS image sensors as particle beam monitors

1 up to 6 MeV proton beam

Image of a single 1 MeV proton detection.

2015-Castoldi

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Page 31: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

Fixed Pattern Noise (FPN) Suppression

2015-Perez

-5σ

The CMOS imager: Commercial APTINA MT9V011

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Page 32: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

55Fe: 5.90 keV or 6.5 keV X-ray

137Cs(γ –ray): 662 keV

137Cs( β–ray): 514, 1176 keV

Response of CMOS toγ, β – rays and α particles

2015-Perez 32

Page 33: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

2018-Prez

Response of CMOS to neutrons

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Page 34: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

phosphorus-32 β particleEmax= 1711 keV

Am-241 α particleE= 5485, 5443, 5388 keV

2018-Nelson

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Page 35: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

PhotodiodeSensor(PD)

MonolithicActive Pixel Sensor (MAPS)

ComplementarySensor Active Pixel sensor(CAPS)

ImprovedFill factor

diffusion

ImprovedFill factor

drift

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Page 36: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

2008-Rao

A 4-T APS structure

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Page 37: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

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Page 38: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

Disadvantages:

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Page 39: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

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Page 40: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

Complementary active pixels sensors (CAPS)

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Page 41: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

Apply bias voltage to bulk rely on drift instead of diffusion

Take care of inter-pixel isolation

Avoid charge collection on parasitic wells by shielding them inside a deep n-well

The main new features are that the reset transistor is replaced by a PMOS.

Complementary active pixels sensors (CAPS)

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Page 42: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

Pixelated Silicon as a sensor:

Keller

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Page 43: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

Pixelated SiliconKeller

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Page 44: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

Pattern Recognition:

Keller

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Page 45: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

a neutron-induced reaction with three ejected evaporation particles

2014-Saoud

a high-energy proton---- or----------

different topology shapes detected with a CCD

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Page 46: Application of CMOS sensors in radiation detectionparticles.ipm.ir/conferences/2018/dae/pdf/Ashrafi.pdfcapacitance C. PD. The accumulated charge decreases V. PD. according to the input

Conclusions:

CMOS sensors are applicable to:

Radiation dosimetry

Particle tracking

X-ray imaging

Particle identification

Beam monitoring

CMOS sensors are available at low cost (COTS)

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Ohta, J. (2007). Smart CMOS image sensors and applications. CRC press.

References:

Holms, A., & Quach, A. (2010). Complementary Metal-Oxide Semiconductor Sensors.

Maneuski, D., Blue, A., Hynds, D., Mac Raighne, A., & O'Shea, V. (2011). Evaluation of silicon active pixel sensors for alpha particle detection. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 659(1), 328-332.

Beaumel, M., Herve, D., & Van Aken, D. (2010). Cobalt-60, proton and electron irradiation of a radiation-hardened active pixel sensor. IEEE Transactions on Nuclear Science, 57(4), 2056-2065.

Auzinger, T., Habel, R., Musilek, A., Hainz, D., & Wimmer, M. (2012, August). GeigerCam: measuring radioactivity with webcams. In SIGGRAPH Posters (p. 40).

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References:

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“Classical MAPS” → HV/HR-CMOS■ Apply bias voltage to bulk → rely on drift instead of diffusion■ Avoid charge collection on parasitic wells by shielding them inside adeep n-well■ Take care of inter-pixel isolation after irradiation by suitable techniques■ Often a rather classical charge-sensitive amplifier with leakage currentcompensation is used at the expense of larger pixels■ New applications opening up?

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