External Use

Applied MDLx™ Ginestra™

Simulation Software

Solutions and Key Features

| External Use

Ginestra™ Solutions

Features:

▪ Simulate electrical behavior for various

material-device structure combinations

▪ Based on first principles treatment of

carrier transport in different materials

▪ Accurate modeling of electrical properties

at nanoscale and macroscale including

defects and interfaces

▪ Transient, pulse and DC electrical

characteristics together with long term

reliability estimates

Ginestra is an innovative software platform that enables design and optimization of

devices from materials based on performance, reliability and variability requirements

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| External Use

Memories and Novel Devices

Features:

▪ Design novel devices or optimize

existing technologies with the

automatic Ginestra optimization tool

▪ Simultaneous optimization of multiple

Figures of Merit for specific

functionalities

▪ Comprehensive electrical tests

covering all aspects of Performance,

Variability, and Reliability

Ginestra enables Novel Device Design by leveraging material properties

Design of novel devices by identifying materials combinations and device geometries

for optimum device performance

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| External Use

Designing Resistive RAM Using Ginestra

Features:

▪ Simulation of a full FORMING-RESET-SET cycle

▪ FORMING: Field-Induced Temperature-Driven positive

feedback

► Field and Temperature-Driven diffusion of atomic species

▪ RESET: Partial oxidation of the Conductive Filament

due to Field-Driven diffusion of oxygen ions

▪ SET: Field-Induced breakdown of the oxide barrier

► Oxygen diffusion recreates the oxygen reservoir

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| External Use5

Resistive RAM Simulations

| External Use

Material Characterization

Features:

▪ Automatic extraction of key materials

properties from electrical measurements

(IV, CV, GV, BTI, TSCIS)

▪ Full characterization of defect energy

and space distribution

▪ Identification of atomic defect species

affecting device electrical characteristics

Fast characterization of material and defects properties from automatic interpretation

of multiple electrical measurements

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| External Use

Defect Spectroscopy

Method for extracting defect density depth profiles using a combination of electrical

measurements

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| External Use

Electrical Characterization

Features:

▪ Simulation of DC, pulsed and

transient electrical characteristics

▪ Accurate over wide range of

voltages, times and temperature

Accurate DC, AC and transient electrical characteristics determined by accounting

for the effect of bulk atomic structure, interfaces and defects

Ginestra simulates key device characteristics that encompass performance,

variability and reliability

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| External Use

Reliability and Variability

Features:

▪ Multiscale simulation of SILC,

BD, BTI, RTN

▪ Use built-in module for statistical

simulations to assess device

variability

▪ Predict device lifetime for

multiple different operating

conditions and applications

Models link microscopic material properties to electrical characteristics

Ginestra allows visibility into long term reliability and performance degradation of

devices under operating conditions

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| External Use

Ginestra 3D

Features:

▪ Finite Element and Finite Volume

▪ Highest accuracy through hexahedral

mesh with local refinement capabilities

▪ Tunneling and quantization effects

▪ Individual defects considered

▪ 3D templates: FinFET, 3D CTT NAND,

DRAM

Understand how defect-related issues affect performance, variability and reliability of

state-of-the art logic and memory technologies

New FEM-based approach for arbitrary 3D geometries

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