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April, 2003 CMS tracker electronics 1 APV25 Production Testing Status Mark Raymond, Imperial College Outline Yield studies current status of ongoing investigations into causes of low yield on latest and previous production lots Future production plan

APV25 Production Testing Statusdmray/pdffiles/CMStrackerelec_9_4_03.pdf · APV25 Production Testing Status Mark Raymond, Imperial College Outline Yield studies current status of ongoing

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Page 1: APV25 Production Testing Statusdmray/pdffiles/CMStrackerelec_9_4_03.pdf · APV25 Production Testing Status Mark Raymond, Imperial College Outline Yield studies current status of ongoing

April, 2003 CMS tracker electronics 1

APV25 Production Testing Status

Mark Raymond, Imperial College

Outline

Yield studies

current status of ongoing investigations into causes of low yield on latest and previousproduction lots

Future production plan

Page 2: APV25 Production Testing Statusdmray/pdffiles/CMStrackerelec_9_4_03.pdf · APV25 Production Testing Status Mark Raymond, Imperial College Outline Yield studies current status of ongoing

April, 2003 CMS tracker electronics 2

History - 2002Jan 1st two production lots showed low yield

manufacturer found evidence of problems with silicide layer – both lots returned for replacement

March 3rd lot -> much better, 79% yield (few patchy wafers)

May 4th and 5th (replacements for 1 and 2) -> 33% and 44%=> still some processing problem

other HEP designs also experiencing variable yieldcauses unclear but long metal lines common to HEP designs(possible ESD damage during processing due to antenna effect)

Sept Test structures (CERN) included on MPW run to try and prove/disprove theories

Nov MPW run back -> all structures showing high yield no sig. difference between “low expected” and “high expected” yield designs => nothing proven

see http://www.hep.ph.ic.ac.uk/~dmray/pptfiles/CMS_TK_ELEC_July2002.pptand http://www.hep.ph.ic.ac.uk/~dmray/pdffiles/APV_LECC02_HEP.pdf

3210

100806040200% yield

lot 1

3210

100806040200% yield

lot 2

2

1

0

100806040200% yield

lot 3

3210

100806040200% yield

lot 4

43210

100806040200% yield

lot 5

lot 1

lot 2

lot 4

lot 5

lot 3

Page 3: APV25 Production Testing Statusdmray/pdffiles/CMStrackerelec_9_4_03.pdf · APV25 Production Testing Status Mark Raymond, Imperial College Outline Yield studies current status of ongoing

April, 2003 CMS tracker electronics 3

Up to date - 2003Jan: APV lots 6 and 7 delivered

lot 7 -> average 52%, but lot 6 close to zero

manufacturers notified (via CERN)

Feb: wafers from all 4 lower yield lots sent for failure analysis (FA)

weekly telephone conference set up to monitor progress including participants from:

Manufacturers: FA teams on 2 sites

Imperial and RAL: APV design and test

CERN: coordinating team and Medipix engineers

3210

1009080706050403020100% yield

lot 7lot 7

(Medipix project also experiencing yield problems on several lots – design not very similar to APV but might be common root cause – understood on all sides that FA on APV takes priority)

Page 4: APV25 Production Testing Statusdmray/pdffiles/CMStrackerelec_9_4_03.pdf · APV25 Production Testing Status Mark Raymond, Imperial College Outline Yield studies current status of ongoing

April, 2003 CMS tracker electronics 4

Date probed:Chips passed:Yield:

Digital failures:Power supply failures:Channel defects (Peds & Cal):Pipeline defects:

01060

01070

01080

01090

01100

01110

01120

01130

020612

02077

02080

02090

02100

02110

02120

02130

03040

03050

03060

03070

03080

03090

03100

03110

03120

03130

03140

031512

040412

04050

040610

04070

04080

04090

04100

04110

04120

04130

04140

041512

050210

05030

050410

05050

05060

05070

05080

05090

05100

05110

05120

05130

05140

05150

051610

051710

060211/12

060312

060410

06050

06060

06070

06080

06090

06100

06110

06120

06137

06140

061512

061611/12

061711/12

070211/12

07030

07040

07050

07060

07070

07080

07090

07100

07110

07120

07130

07140

07150

071612

0717

080211/12

080310

08040

08050

08060

08070

08080

08090

08100

08110

08120

08130

08147

081510

081612

081711/12

090212

09030

09040

09050

09060

09070

09080

09090

09100

09110

09120

09130

09140

09150

091612

091711/12

0918

091912

100212

10030

10040

10050

10060

10070

10080

10090

10100

10110

10120

10130

10147

10150

101610

101712

101811/12

101912

11000

110112

110210

11030

11040

11050

11060

11070

11080

11090

11100

11110

11127

11130

11140

11150

11160

11170

111811/12

111910

12000

120111/12

12020

120310

12040

12050

12060

12070

12080

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12100

12110

121212

121310

121410

121510

121610

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13000

130111/12

130210

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131710

13180

13190

140012

140111/12

140212

140310

140410

14050

14060

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14100

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14120

141310

141410

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141710

141811/12

141912

150212

150312

150412

15050

15060

15070

15080

15090

15100

15110

15120

15130

15140

15150

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151710

151817/22

151912

160211/12

160312

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160510

16060

16070

16080

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16100

16110

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161310

16140

161520

16165

161712

1618

161912

1702

170311/12

170412

17050

17060

17070

17080

17097

17100

17110

17120

17130

17140

17150

17160

171712

1802

180311/12

180412

180512

180610

18070

18087

18090

18100

18110

18120

181310

181410

18150

181612

181717/22

190211/12

190311/12

190412

19050

19060

19070

19080

19090

19100

19110

19120

19130

19140

19150

191612

191711/12

20020

200311/12

200412

200512

200610

200710

20080

20090

20100

20110

20120

201310

201410

201512

201611/12

201711/12

2104

210512

210612

210710

210810

21090

21100

21110

211210

211310

211412

21150

2204

2205

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220711/12

220812

220912

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221212

221311/12

221411/12

221511/12

230611/12

230712

230811/12

230912

23100

23110

23120

231311/12

240610

240712

2408

240911/12

241011/12

241111/12

24120

24130

Wafer Map: A7BCG1T

Wed 29 Jan 2003 10/360 3%

220 7123 0

Problem Lots

Date probed:Chips passed:Yield:

Digital failures:Power supply failures:Channel defects (Peds & Cal):Pipeline defects:

01061/2/3/4/5

01071/2/3/4/5

01081/2/3/4/5

01091/2/3/4/5

01101/2/3/4/5

01111/2/3/4/5

01121/2/3/4/5

01131/2/3/4/5

02061/2/5

02072/4/5

02081/2/3/4/5

02091/2/3/4/5

02101/2/3/4/5

02111/2/3/4/5

02121/2/3/4/5

02131/2/4/5

03041/2/3/4/5

03051/2/3/4/5

03061/2/3/4/5

03071/2/3/4/5

03081/2/3/4/5

03091/2/3/4/5

03101/2/3/4/5

03111/2/3/4/5

03121/2/3/4/5

03131/2/3/4/5

03142/4/5

03152/4/5

04041/2/3/4/5

04051/2/3/4/5

04061/2/3/4/5

04071/2/3/4/5

04081/2/3/4/5

04091/2/3/4/5

04101/2/3/4/5

04111/2/3/4/5

04121/2/3/4/5

04131/2/3/4/5

04141/2/3/4/5

0415

05021/2/3/4/5

05031/2/3/4/5

05041/2/3/4/5

05051/2/3/4/5

05061/2/3/4/5

05071/2/3/4/5

05081/2/3/4/5

05091/2/3/4/5

05101/2/3/4/5

05111/2/3/4/5

05121/2/3/4/5

05131/2/3/4/5

05141/2/3/4/5

05151/2/3/4/5

05162/4/5

05171/2/3/4/5

06021/2/3/4/5

06031/2/4/5

06041/2/3/4/5

06051/2/3/4/5

06061/2/3/4/5

06071/2/3/4/5

06081/2/3/4/5

06091/2/3/4/5

06101/2/3/4/5

06111/2/3/4/5

06121/2/3/4/5

06131/2/3/4/5

06141/2/3/4/5

06151/2/4/5

06162/4/5

06172

07021/2/3/4/5

07031/2/3/4/5

07041/2/3/4/5

07051/2/3/4/5

07061/2/3/4/5

07071/2/3/4/5

07081/2/3/4/5

07091/2/3/4/5

07101/2/3/4/5

07111/2/3/4/5

07121/2/3/4/5

07131/2/3/4/5

07141/2/3/4/5

07151/2/3/4/5

07161/2/3/4/5

07172/5

08021/2/3/4/5

08031/2/3/4/5

08041/2/3/4/5

08051/2/3/4/5

08061/2/3/4/5

08071/2/3/4/5

08081/2/3/4/5

08091/2/3/4/5

08101/2/3/4/5

08111/2/3/4/5

08121/2/3/4/5

08131/2/3/4/5

08141/2/3/4/5

08151/2/3/4/5

08161/2/3/4/5

08172

09021/2/3/4/5

09031/2/3/4/5

09041/2/3/4/5

09051/2/3/4/5

09061/2/3/4/5

09071/2/3/4/5

09081/2/3/4/5

09091/2/3/4/5

09101/2/3/4/5

09111/2/3/4/5

09121/2/3/4/5

09131/2/3/4/5

09141/2/3/4/5

09151/2/3/4/5

09161/2/3/4/5

09172/3/4/5

0918

09191/2/3/4/5

10021/2/3/4/5

10031/2/3/4/5

10041/2/3/4/5

10051/2/3/4/5

10061/2/3/4/5

10071/2/3/4/5

10081/2/3/4/5

10091/2/3/4/5

10101/2/3/4/5

10111/2/3/4/5

10121/2/3/4/5

10131/2/3/4/5

10141/2/3/4/5

10151/2/3/4/5

10161/2/3/4/5

10171/2/3/4/5

1018

10191/2/3/4/5

11001/2/3/4/5

11011/2/3/4/5

11021/2/3/4/5

11031/2/3/4/5

11041/2/3/4/5

11051/2/3/4/5

11061/2/3/4/5

11071/2/3/4/5

11081/2/3/4/5

11091/2/3/4/5

11101/2/3/4/5

11111/2/3/4/5

11121/2/3/4/5

11131/2/3/4/5

11141/2/3/4/5

11151/2/3/4/5

11161/2/3/4/5

11171/2/3/4/5

11182/3/4/5

11192/3/5

12001/2/3/4/5

12011/2/3/4/5

12021/2/3/4/5

12031/2/3/4/5

12041/2/3/4/5

12051/2/3/4/5

12061/2/3/4/5

12071/2/3/4/5

12081/2/3/4/5

12092/3/4/5

12101/2/3/4/5

12111/2/3/4/5

12121/2/3/4/5

12131/2/3/4/5

12141/2/3/4/5

12151/2/3/4/5

12161/2/3/4/5

12171/2/3/4/5

12182/5

12191/2/3/4/5

13001/2/3/4/5

13011/2/3/4/5

13021/2/3/4/5

13031/2/3/4/5

13041/2/3/4/5

13051/2/3/4/5

13061/2/3/4/5

13071/2/3/4/5

13081/2/3/4/5

13091/2/3/4/5

13101/2/3/4/5

13111/2/3/4/5

13121/2/3/4/5

13131/2/3/4/5

13141/2/3/4/5

13151/2/3/4/5

13161/2/3/4/5

13171/2/3/4/5

13181/2/3/4/5

13191/2/3/4/5

14001/2/3/4/5

14011/2/3/4/5

14021/2/3/4/5

14031/2/3/4/5

14041/2/3/4/5

14051/2/3/4/5

14061/2/3/4/5

14071/2/3/4/5

14081/2/3/4/5

14091/2/3/4/5

14101/2/3/4/5

14111/2/3/4/5

14121/2/3/4/5

14131/2/3/4/5

14141/2/3/4/5

14151/2/3/4/5

14161/2/3/4/5

14171/2/3/4/5

14181/2/3/4/5

14191/2/3/4/5

15021/2/3/4/5

15031/2/3/4/5

15041/2/3/4/5

15051/2/3/4/5

15061/2/3/4/5

15071/2/3/4/5

15081/2/3/4/5

15091/2/3/4/5

15101/2/3/4/5

15111/2/3/4/5

15121/2/3/4/5

15131/2/3/4/5

15141/2/3/4/5

15151/2/3/4/5

15161/2/3/4/5

15171/2/3/4/5

15181/2/3/4/5

15191/2/3/4/5

16021/2/3/4/5

16031/2/3/4/5

16041/2/3/4/5

16051/2/3/4/5

16061/2/3/4/5

16071/2/3/4/5

16081/2/3/4/5

16091/2/3/4/5

16101/2/3/4/5

16111/2/3/4/5

16121/2/3/4/5

16131/2/3/4/5

16141/2/3/4/5

16151/2/3/4/5

16161/2/3/4/5

16171/2/4/5

16181/2/3/4/5

16191/2/3/4/5

17021/2/3/4/5

17031/2/3/4/5

17041/2/3/4/5

17051/2/3/4/5

17061/2/3/4/5

17071/2/3/4/5

17081/2/3/4/5

17091/2/3/4/5

17101/2/3/4/5

17111/2/3/4/5

17121/2/3/4/5

17131/2/3/4/5

17141/2/3/4/5

17151/2/3/4/5

17161/2/3/4/5

17171/2/3/4/5

18021/2/3/4/5

18031/2/4/5

18041/2/3/4/5

18051/2/3/4/5

18061/2/3/4/5

18071/2/3/4/5

18081/2/3/4/5

18091/2/3/4/5

18101/2/3/4/5

18111/2/3/4/5

18121/2/3/4/5

18131/2/3/4/5

18141/2/3/4/5

18151/2/3/4/5

18161/2/3/4/5

18172/4/5

19021/2/3/4/5

19031/2/4/5

19041/2/3/4/5

19051/2/3/4/5

19061/2/3/4/5

19071/2/3/4/5

19081/2/3/4/5

19091/2/3/4/5

19101/2/3/4/5

19111/2/3/4/5

19121/2/3/4/5

19131/2/3/4/5

19141/2/3/4/5

19151/2/3/4/5

19161/2/3/4/5

19171/2/3/4/5

20021/2/3/4/5

20031/2/3/4/5

20042/5

20051/2/4/5

20061/2/3/4/5

20071/2/3/4/5

20081/2/3/4/5

20091/2/3/4/5

20101/2/3/4/5

20111/2/3/4/5

20121/2/3/4/5

20131/2/3/4/5

20141/2/3/4/5

20151/2/3/4/5

20161/2/3/4/5

20171/2/3/4/5

21042/4/5

21052/4/5

21061/2/3/4/5

21071/2/3/4/5

21081/2/3/4/5

21091/2/3/4/5

21101/2/3/4/5

21111/2/3/4/5

21121/2/3/4/5

21131/2/3/4/5

21141/2/3/4/5

21151/2/3/4/5

22041/2/3/4/5

22051/2/4/5

22062/4/5

22072/4/5

22081/2/3/4/5

22091/2/3/4/5

22101/2/3/4/5

22111/2/3/4/5

22121/2/3/4/5

22131/2/3/4/5

22141/2/3/4/5

22151/2/3/4/5

23061/2/3/4/5

23071/2/3/4/5

23081/2/3/4/5

23091/2/3/4/5

23101/2/3/4/5

23111/2/3/4/5

23121/2/3/4/5

23131/2/3/4/5

24061/2/3/4/5

24071/2/3/4/5

24081/2/3/4/5

24091/2/3/4/5

24101/2/3/4/5

24111/2/3/4/5

24121/2/3/4/5

24131/2/3/4/5

Wafer Map: WG8P4CT

Wed 26 Feb 2003 3/360 1%

351 1 4 1

Date probed:Chips passed:Yield:

Digital failures:Power supply failures:Channel defects (Peds & Cal):Pipeline defects:

01062/5

0107

0108

0109

01102/3/5

01112/5

0112

0113

02062

0207

0208

0209

0210

0211

0212

0213

03041/2

0305

03062/5

03072

0308

0309

0310

03112

0312

0313

0314

0315

0404

04052

04062

0407

04085

0409

0410

04112/5

0412

0413

0414

0415

0502

0503

0504

0505

0506

05072

0508

0509

05102

0511

0512

0513

0514

0515

0516

0517

0602

06032/5

0604

0605

0606

06072

0608

06092

0610

0611

0612

0613

0614

0615

0616

0617

0702

07032/5

0704

0705

07062/4/5

07071/2/3/4/5

07081/2/4/5

07092/3/4/5

07102/4/5

07112/4/5

0712

07132

0714

0715

0716

0717

0802

0803

0804

08052/5

08062/5

08072

08082/4/5

08091/2/3/4/5

08102/4/5

08112

08122

08132

08142/5

08152

0816

0817

09022/5

0903

09042/5

09052/5

09062/4/5

09071/2/3/4/5

09081/2/3/4/5

09091/2/3/4/5

09101/2/4/5

09112/3/4/5

09122/3/4/5

09132

09142

0915

0916

0917

0918

0919

1002

10032

10042

10052/5

10062/3/4/5

10071/2/3/4/5

10081/2/3/4/5

10091/2/3/4/5

10102/3/4/5

10112/4/5

10122/3/4/5

10132

1014

1015

1016

1017

1018

1019

1100

1101

1102

11032/5

11042/5

11052/3/4/5

11061/2/3/4/5

11071/2/3/4/5

11081/2/3/4/5

11091/2/3/4/5

11101/2/4/5

11111/2/3/4/5

11121/2/3/4/5

11132/4/5

1114

1115

1116

1117

1118

1119

1200

1201

1202

12032

12042

12052/4/5

12061/2/3/4/5

12071/2/3/4/5

12081/2/3/4/5

12092/3/4/5

12102/5

12111/2/3/4/5

12121/2/3/4/5

12132/4/5

12142

12152

1216

1217

1218

1219

1300

1301

1302

1303

13042/5

13052/4/5

13062/3/4/5

13071/2/3/4/5

13081/2/3/4/5

13091/2/3/4/5

13101/2/3/4/5

13111/2/3/4/5

13121/2/3/4/5

13131/2/3/4/5

13142

13152

1316

1317

1318

1319

14002/3/5

1401

1402

14032

14042

14052/5

14062/4/5

14071/2/3/4/5

14081/2/3/4/5

14091/2/3/4/5

14101/2/3/4/5

14111/2/3/4/5

14121/2/3/4/5

14131/2/3/4/5

14142

14152/5

1416

1417

1418

1419

1502

15032/5

15042

15052/4/5

15061/2/4/5

15071/2/3/4/5

15081/2/3/4/5

15091/2/3/4/5

15101/2/3/4/5

15111/2/3/4/5

15121/2/3/4/5

15131/2/3/4/5

15142

1515

1516

1517

1518

1519

1602

1603

16042/5

16052

16062/4/5

16072/4/5

16081/2/3/4/5

16091/2/3/4/5

16101/2/3/4/5

16111/2/3/4/5

16121/2/3/4/5

16132/3/4/5

16142

16152

1616

1617

1618

1619

1702

1703

17042/5

17052/5

17062/5

17072/4/5

17081/2/4/5

17091/2/3/4/5

17101/2/3/4/5

17111/2/3/4/5

17121/2/4/5

17131/2/3/4/5

17142

1715

1716

1717

1802

18032/5

1804

1805

18062

18072/5

18082/5

18092/4/5

18102

18111/2/4/5

18122

18132

18142

1815

1816

1817

19022/5

19032/5

1904

19055

19062

19072

19082

19092/5

19102/5

19112/5

19122

19132

1914

1915

1916

1917

2002

20032/5

2004

2005

2006

2007

20082

20092/5

20102

20112

20122

20132

2014

2015

20162

2017

2104

2105

2106

21072/5

2108

21092/5

2110

21112/5

2112

2113

21142/5

2115

22042/3/5

22052/4/5

22062

22072/5

22085

2209

2210

2211

22122

2213

2214

2215

2306

2307

2308

23095

2310

23112/3/5

23122/5

2313

24062/3/4/5

2407

2408

24092

24105

24112/5

2412

2413

Wafer Map: W28P77T

Thu 27 Feb 2003170/36047%

111 1 77 1

Date probed:Chips passed:Yield:

Digital failures:Power supply failures:Channel defects (Peds & Cal):Pipeline defects:

01062

01072

0108

01092

0110

01112

01122

01132/5

02062

0207

02082/5

0209

0210

02112

0212

0213

0304

0305

0306

0307

0308

0309

0310

0311

0312

0313

0314

03152

0404

0405

0406

04071/2/4/5

0408

0409

0410

0411

0412

04132

04145

0415

05022

0503

0504

0505

0506

05072

05082

05092

05102/4/5

05112

05122

0513

0514

0515

0516

05172

0602

0603

06042

0605

06061/2/4/5

06072

06082

06092

06102

06112

06122

0613

0614

0615

0616

0617

0702

0703

0704

07052

07062

07072/4/5

07082/4/5

07092/4/5

07102/4/5

07112

07122/4/5

07132

0714

0715

0716

0717

0802

08032

0804

08052

08062

08072/4/5

08082

08092/4/5

08102

08112

08122

08132/5

08142

0815

0816

0817

0902

09032

09042

09052

09062/4/5

09071/2/3/4/5

09081/2/3/4/5

09091/2/4/5

09102

09112/5

09122/4/5

09132/4/5

09142

09152

0916

0917

0918

09191/2/5

10022

10032

10042

10052

10062

10072/4/5

10082/3/4/5

10092/4/5

10102

10112

10122

10132/5

10142/4/5

10152

10162

1017

1018

10192

11002/3/4/5

1101

1102

11032

11042/4/5

11052/4/5

11062/4/5

11072/4/5

11081/2/4/5

11092/4/5

11102

11112/4/5

11122/4/5

11132/4/5

11142/3/4/5

11152/5

11162

1117

1118

1119

12002/3/5

1201

1202

12032

12042

12052/4/5

12062/4/5

12072/4/5

12082

1209

1210

12112

12122

12132/5

12142

12152

12162

1217

1218

1219

13001/2/3/4/5

1301

13022

13032

13042

13052/4/5

13061/2/3/4/5

13071/2/3/4/5

13082/3/4/5

13092/4/5

13102/4/5

13112/4/5

13122/4/5

13132/4/5

13142/3/4/5

13152/5

1316

1317

13182

13192

14001/2/3/4/5

1401

1402

14032

14042

14052/5

14062/5

14072/4/5

14082/3

14091/2/3/4/5

14102

14112/4/5

14122/4/5

14132/4/5

14142/5

14152

14162

1417

1418

1419

15022

15032

15042

15052

15062

15072/4/5

15082/4/5

15092/4/5

15102/4/5

15111/2/3/4/5

15121/2/3/4/5

15132/3/4/5

15142/4/5

15152/4/5

1516

1517

1518

15192/4/5

1602

1603

16042

16052

16062

16072

16082

16092

16102

16112/4

16122/4/5

16132/5

16142

16152

1616

1617

1618

16191/2/3/4/5

1702

17032

1704

17052

17062

17072

17082

17092/4/5

17102/5

17112/5

17122/5

17132

17142

17152

1716

1717

18022

1803

1804

1805

1806

18072

18082

18092

18102

18112

18122

18132

18142

18152

1816

1817

1902

1903

1904

19052/3/4/5

1906

19072

19082

19092

19102

19112

1912

1913

1914

1915

1916

1917

20021/2/3/4/5

2003

2004

2005

2006

2007

2008

20092

20102

2011

2012

2013

2014

2015

2016

20172/4/5

21045

21052/3/5

2106

2107

2108

2109

21103/5

2111

2112

2113

2114

2115

22042/3/5

22052

2206

22072

2208

2209

2210

2211

2212

2213

2214

22152

2306

2307

2308

2309

2310

2311

2312

2313

24062/4/5

24072

2408

2409

24101/2

24112

2412

2413

Wafer Map: KKM3K2T

Tue 18 Feb 2003150/36042%

77 2127 4

lot 4 – ave. yld. 33% lot 5 – ave. yld. 44% lot 6 – ave. yld. ~ 0% lot 7 – ave.yld. 52%

sample wafers from each of 4 problem lots sent to manufacturers failure analysis team

Lot 4 wafer extreme example but hopefully indicative of failure mode of other wafers in same lotother wafers from this lot already with hybrid company

to assist failure analysis wafers re-probed with modified test protocol – trying to extract as much info as possible from failing sites

Page 5: APV25 Production Testing Statusdmray/pdffiles/CMStrackerelec_9_4_03.pdf · APV25 Production Testing Status Mark Raymond, Imperial College Outline Yield studies current status of ongoing

April, 2003 CMS tracker electronics 5

Analog

Pipeline

Memory

Pipeline Control Logic

Pre

am

plifi

er

Filt

er

Pip

elin

eR

ea

do

ut

12

8:1

An

alo

gM

ux

Bias generator

and bias registers

FIFO Standard

Cell Logic

Modified wafer test protocol

test continues to end even if gross defect found early onto provide as much info as possible to FA team

sort failures into 5 categories:powerchannel (pedestal or response to CAL)bias register (stuck bits)pipeline logic (digital header incorrect)other digital

try to associate failure with particular functional area on chip

high power failure can be useful in localising faults

chips can (and often do) fail on more than one (sometimes all) categories

Page 6: APV25 Production Testing Statusdmray/pdffiles/CMStrackerelec_9_4_03.pdf · APV25 Production Testing Status Mark Raymond, Imperial College Outline Yield studies current status of ongoing

April, 2003 CMS tracker electronics 6

Failure Analysis (FA) techniquesliquid crystal

wafer coated with temperature sensitive layerprobes used to apply power to a particular chipcoating changes colour over any hot spots – allows localization of fault

delayering (top down) cross sectiongradual removal of layers, looking for cut through wafer in suspect locationproblems along the way

Page 7: APV25 Production Testing Statusdmray/pdffiles/CMStrackerelec_9_4_03.pdf · APV25 Production Testing Status Mark Raymond, Imperial College Outline Yield studies current status of ongoing

April, 2003 CMS tracker electronics 7

Metallization X section

MZ

M2

M1

via

via

via

via

M2

Q2 thin dielectriclayer

APV uses 3 metal layers (up to 6 possible)

floating capacitors implemented by Q2/M2 structure – only used in analogue parts of chip

production process divided into 2 distinct phases

Front end of line – transistors defined

Back end of line – metal layers and interconnecting vias added

substrate

ILD (inter-level dielectric)

ILD (inter-level dielectric)

Page 8: APV25 Production Testing Statusdmray/pdffiles/CMStrackerelec_9_4_03.pdf · APV25 Production Testing Status Mark Raymond, Imperial College Outline Yield studies current status of ongoing

April, 2003 CMS tracker electronics 8

Fault Diagnosis – Lot 6

severity of problem with this lotallowed fairly rapid diagnosis

X-section through metal trackingshows shorts between tracks, andQ2 (capacitor top-plate metal) whereit shouldn’t be

Q2 should have been stripped off (inareas where it is not supposed to be)prior to patterning of underlying M2

problem thought to be incomplete removal of photo-resist layer used to pattern Q2=> Q2 layer not removed properly (in areas where it should be)=> subsequent M2 etch had to go through Q2 first and so didn’t get all the way through

example coordinatesX=2422, Y=872 um

cross section

Page 9: APV25 Production Testing Statusdmray/pdffiles/CMStrackerelec_9_4_03.pdf · APV25 Production Testing Status Mark Raymond, Imperial College Outline Yield studies current status of ongoing

April, 2003 CMS tracker electronics 9

Fault Diagnosis – lot 4this wafer showed high power consumption failures – liquid crystal technique showed hotspots in pipeline control logic area

non-contacting vias => transistors which should be off can float to on condition => high power consumption

reasons for via underetch not clear, but separation between metal layers close to maximum allowed=> points to possible problem with Inter-Level Dielectric (ILD) layer thickness control (etch time is fixed)

this problem now confirmed on chips in centre and at edge of wafer

Page 10: APV25 Production Testing Statusdmray/pdffiles/CMStrackerelec_9_4_03.pdf · APV25 Production Testing Status Mark Raymond, Imperial College Outline Yield studies current status of ongoing

April, 2003 CMS tracker electronics 10

Fault Diagnosis – lots 5 & 7lot 7 wafer FA just started - this lot showed average 52% yield, so not such severe problem

no definite problem found so far (but ILD thickness also large)

physical coordinates of stuck bit locations in biasregisters provided for both these lots – may be helpful

0,0

6454,6395

Bit 8 Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1

Flip-FlopRegister ISSF<8>

Bias Generator Area

APV25 Complete Chip

X =

1307

X =

1307

X =

1349

X =

1349

X =

1482

X =

1524

X =

1599

X =

1641

X =

1686

X =

1728

X =

1758

X =

1800

X =

1830

X =

1872

X =

1902

X =

1944

X =

1974

X =

2016

ISPARE Y = 105

ICAL Y = 131

CSEL Y = 157

CDRV Y = 183

IPRE Y = 209

IPCASC Y = 235

VFP Y = 261

IPSF Y = 287

IMUXIN Y = 313

VPSP Y = 339

IPSP Y = 365

ISHA Y = 391

VFS Y = 417

ISSF Y = 443

ISSF Y = 443

Notes:

This diagram shows the location of the storage flip-flops in the bias generator area relative to a co-ordinate system defined by pad openings.

The origin is at the bottom right corner of the left columns of pads. The lower left corner of the pad at the right end of the top side is at x=6454, y=6395 microns.

The detail of the bias generator area show rows specific to each register (see labels on the right) where the Y co-ordinate desribes the center line. Within each row there are 8 flip flops with analogue mirrors in between. The horizontal edges are defined in microns along the lower side.

Note that the registers: Mode, Latency and Muxgain are not listed, they are in a separate region of the chip.

Registers CDRV and CSEL appear different from the others: in these cases there are no analogue mirrors, the digital states are output instead.

M J French 21/March/2003

Page 11: APV25 Production Testing Statusdmray/pdffiles/CMStrackerelec_9_4_03.pdf · APV25 Production Testing Status Mark Raymond, Imperial College Outline Yield studies current status of ongoing

April, 2003 CMS tracker electronics 11

APV Production Plan

(March)(48)Feb.48

Jan 0448Nov.48Oct.48Sept.48July24

June 0324

latest delivery date

no. of wafers

288 (336)

wafer volume will cover our needs assuming 60% yield~ 62,000 (72,500) chips

~ 40 wafers/monthhigh but manageable, 2 wafers/day

2003

2004

Page 12: APV25 Production Testing Statusdmray/pdffiles/CMStrackerelec_9_4_03.pdf · APV25 Production Testing Status Mark Raymond, Imperial College Outline Yield studies current status of ongoing

April, 2003 CMS tracker electronics 12

SummaryProgress in understanding causes for low yields

2002 lotsLot 4 (33%): V2 underetch (non-contacting vias), ILD thickness close to maximumLot 5 (44%): not yet begun

2003 lotsLot 6 (~0%): M2 layer shorts and extraneous Q2 metal layerLot 5 (52%): FA started, no problem found so far, but ILD thickness also large

Manufacturer’s efforts have been substantial, still ongoing

All problems identified so far associated with “back-end-of-line” production phase

2 free production lots offered and now in fabrication (delivery in ~ few weeks time)foundry proposes to vary ILD thickness (5 steps between process extremes) on one lot with additional measurements after each ILD stage

=> lower overall yield for this lot but valuable information for further production

hope that results of these studies will lead to reduction of low-yield lots