AUTHOR INDEX Author Index - it.iucr.org

Author Index

Entries refer to part, chapter or section numbers

Abele, R. K., 7.3AÊ berg, T., 7.4.3Abragam, A., 2.6.2Abrahams, J. M., 7.1.6Abrahams, K., 4.4.2Abrahams, S. C., 1.4, 4.2.2,

4.2.6, 5.3, 6.2, 8.1, 8.5, 9.2.2Abramowitz, M., 6.1.1, 6.3, 7.5Achiwa, N., 2.9Ackermann, I., 4.3.7Adams, L. H., 3.2Adamsky, R. F., 9.2.1Adlhart, W., 3.4Agamalyan, M. M., 4.4.2Agarwal, B. K., 4.2.6Ahahama, Y., 4.2.5Ahlrichs, R., 6.1.1Ahmed, A., 5.2Ahn, C. C., 4.3.4, 7.2Ahtee, M., 2.3, 8.6Airey, R. W., 7.1.6Akashi, Y., 5.3Akhiezer, A. I., 4.2.6Akiyoshi, T., 2.9Alani, R., 3.5Albers, R. C., 4.2.3Albertsson, J., 5.3Albinati, A., 8.6Alcock, N. W., 5.3, 6.3Aldred, P. J. E., 4.2.6Alefeld, B., 2.6.2, 4.4.2Aleksandrov, K. S., 3.1Alexander, E., 9.2.1Alexander, H., 4.3.8Alexander, L., 5.2, 5.3Alexander, L. E., 2.3, 3.4, 5.1,

5.3, 6.2Alexander, T. K., 4.4.2Alexandropoulos, N. G., 7.4.3Alkire, R. W., 3.4Allemand, R., 2.4.2, 7.1.6, 7.3Allen, F. H., 9.5, 9.6, 9.7Allen, J. P., 3.1Allen, S., 3.4Allen, S. J. M., 4.2.4Allewell, N. M., 3.4Allin, G. W., 7.3Allington-Smith, J. R., 7.1.6Allinson, N. M., 2.7, 7.1.6Allison, S. K., 2.3, 2.7, 4.2.1,

5.3Allsopp, D. W. E., 2.7Alp, E. E., 5.3Alstrup, I., 4.2.3, 4.2.6Alstrup, O., 2.5.1Altarelli, M., 4.3.4Alter, U., 5.3Altmann, S. L., 6.1.1Altomare, A., 8.6Alvarez, L. W., 4.2.3, 4.4.2Amadori, R., 4.4.2Amelinckx, S., 3.5, 4.3.8, 9.2.2Amemiya, Y., 7.1.6, 7.1.8Ames, L., 7.1.4Ammon, H. L., 3.1AmoroÂs, J. L., 2.2, 5.3AmoroÂs, M. C., 2.2, 5.3

d'Amour, H., 5.3Anderegg, J. W., 2.6.1Anderson, C. A. F., 2.3Anderson, D., 2.2, 3.4Anderson, D. W., 6.3Anderson, E., 8.1Anderson, I., 4.4.2Anderson, I. S., 4.4.2Anderson, J. E., 7.1.6Anderson, R., 2.4.1Anderson, W. F., 3.1Andersson, B., 4.3.7Andersson, S., 9.1, 9.7Ando, M., 2.2, 2.7, 2.8, 5.3,

7.1.8Ando, T., 4.3.3Ando, Y., 4.3.7, 8.8Andrade, M., 9.2.1Andresen, A., 6.1.2Andrew, N. L., 5.3Andrews, S. J., 2.2, 2.3Andrianova, M. E., 7.1.6Andrus, J., 2.7Angel, R. J., 9.2.2Anger, H. O., 7.1.6Anisimov, Yu. S., 7.1.6Ankner, J. F., 2.9, 4.4.2Ansara, I., 2.6.2Anstis, G. R., 4.3.8d'Anterroches, C., 4.3.8Aoki, K., 3.4Aoki, Y., 4.3.7Appleman, D. E., 5.2Apsimon, R. J., 7.1.6Arai, T., 2.3Arakali, S. V., 3.1Arcese, A., 7.1.7Archer, B. T., 4.3.3Archer, J. M., 3.4Argos, P., 3.4Argoud, R., 3.4Aristov, V. V., 4.2.6, 5.3Armstrong, R. W., 2.7Arndt, U. W., 2.2, 2.7, 3.4,

4.2.1, 4.2.2, 5.3, 6.2, 7.1.6Arnesen, S. P., 4.3.3Arnold, E., 3.4Arnold, H., 3.4Arnold, P., 2.5.2Arrott, A., 6.2Arrott, A. S., 2.8Arsenin, V. Ya., 2.6.1Artioli, G., 9.2.2Artymiuk, P., 2.2Arvedson, M., 4.3.3AÊ sbrink, S., 5.3Ascher, E., 9.8Ascheron, C., 5.3Ateiner, J., 2.3Atoji, M., 6.1.1Att®eld, J. P., 2.3Auleytner, J., 5.3Austerman, S. B., 2.7Authier, A., 2.7Autrata, R., 7.2Averbach, B. L., 2.3Avery, J., 6.1.1, 8.7

Avilov, A. S., 2.4.1, 4.3.5Axe, J. D., 4.4.2, 4.4.3Axelrod, H. J., 3.1Axelsson, U., 4.2.2Ayers, G. L., 2.3Azaroff, L. V., 2.3, 4.2.3, 5.3,

6.3, 9.2.1Azumi, I., 5.3

BaÎk-Misiuk, J., 5.3Babkevich, A. Yu., 9.2.2Bacchella, C. L., 2.6.2Bach, H., 3.5Bachmann, R., 2.3, 7.4.2Backhaus, K.-O., 9.2.2BacÏkovskyÂ, J., 5.3Bacon, G. E., 2.6.2, 3.6, 4.4.2,

4.4.4, 6.1.3, 6.4Bacon, J. R., 2.6.1Badurek, G., 4.4.2Baerlocher, Ch., 2.3, 8.6Bagchi, S. N., 2.6.1Baharie, E., 8.6Bai, Z., 8.1Baigarin, K. A., 4.2.1Baik, D. H., 4.2.2Bailey, D., 5.3Bailey, I., 2.4.2Bailey, R. L., 4.2.1Bailey, S. W., 9.2.2Baker, J. A., 5.3Baker, J. F. C., 5.3Baker, R. F., 4.3.4Baker, R. J., 9.7Baker, S. M., 2.9Baker, T. W., 2.3, 5.3Bakken, L. N., 4.3.7, 8.8Balaic, D. X., 4.2.5Baldock, P., 3.1Ballon, J., 7.1.3, 7.1.6Balzar, D., 8.6Band, I. M., 4.2.4Banerjee, D., 3.5Bannett, Y. B., 7.4.3Bannier, G., 9.2.2Baptista, G. B., 4.2.4Barber, D. J., 3.5Barclay, A. N., 3.4Barla, K., 5.3Barna, S. L., 2.7Barnea, Z., 4.2.5Barnes, I. L., 5.3Barnes, P., 3.4Barns, R. L., 5.3Baronnet, A., 9.2.2Barraud, J., 2.3Barreau, G. H., 4.2.2Barrett, C. S., 2.3, 2.7, 4.3.5Barrientos, J., 4.3.3Barry, J. C., 9.2.2Bartell, L. S., 4.3.3Bartels, K., 3.4, 6.3Bartels, K. S., 3.4Bartels, W. J., 5.3Barth, H., 2.7, 5.2Bartl, H., 3.4Bartunik, H. D., 3.4

Baru, S. E., 7.1.6Baruchel, J., 2.8, 7.3Basile, G., 4.2.2, 5.3Basinski, Z. S., 4.3.6.2Basso, R., 9.2.2Batchelder, D. N., 5.3Bateman, J. E., 7.1.6Bateman, O., 3.4Bates, D. R., 3.4Bates, F. S., 2.6.2Batson, P. E., 4.3.4Battagliarin, M., 2.3Batterman, B. W., 2.7Baumhauer, H., 9.2.2Bauspiess, W., 2.7Bautz, M. W., 7.1.6Bayvel, L. P., 2.6.1Bearden, J. A., 2.3, 4.2.2, 5.2,

5.3Beaumont, J. H., 2.3, 2.7,

4.2.5Becherer, G., 2.6.1Becker, J., 4.4.2Becker, P., 4.2.2, 5.3, 8.7, 9.8Becker, P. J., 6.3, 6.4, 8.7Beckman, R. J., 8.5Bednarski, S., 4.4.2Bedzyk, M. J., 4.2.3Beeman, W. W., 2.6.1, 6.3Begg, G. S., 3.4Begum, R., 4.2.6Behlke, J., 2.6.1Behrendt, D. R., 6.1.1Bellamy, B. A., 2.3, 5.3Bellard, S., 9.5, 9.6Bellis, J. G., 7.1.6Bellman, R., 6.1.1Bellotto, M., 2.3, 5.2, 5.3Belokoneva, E. L., 9.2.2Belov, N. V., 1.4, 9.2.1Belsky, V. K., 9.7Belsley, D. A., 8.2, 8.5Benedetti, A., 2.3Beni, G., 4.2.3Bennett, C. L., 3.4Benoit, H., 2.6.2Bentley, J., 8.7Berendsen, H. J. C., 3.1Berestetsky, V. B., 4.2.6Berg, H. M., 5.3Berg, W. F., 2.7Bergamin, A., 4.2.2, 5.3Berger, H., 5.3Berger, J. O., 8.1Berger, S. D., 4.3.4Bergerhoff, G., 9.4, 9.5, 9.6Bergevin, F. de, 4.2.5, 8.7Berggren, K.-F., 7.4.3Bergman, G., 8.3Bergstrom, J. C., 4.2.1Bergstrom, P. M. Jr, 4.2.6Berk, N. F., 2.9Berkum, J. van, 5.2Berliner, R., 7.3Berman, H., 3.2, 3.3Berman, L. E., 4.2.5Bernal, J. D., 2.2, 3.2, 4.3.5

AUTHOR INDEX

968

969 s:\ITFC\index.3d (Authors Index)

Bernard, L., 9.8Bernard, Y., 3.1Berndtsson, A., 4.2.2Berneron, M., 4.4.2Bernstein, S., 4.4.2Berry, B. S., 2.3Bertaut, E. F., 1.4, 8.7, 9.2.1,

9.7Bertin, E. P., 4.2.3Berzina, T. S., 2.9Besson, J. M., 2.5.1Beth, H. A., 4.3.3Bethe, H., 4.3.4Bethe, H. A., 2.4.1, 4.3.1Beu, K. E., 5.2, 5.3Bevis, M., 5.3Bewilogua, L., 7.4.3Beyer, H., 4.2.2Bhat, H. L., 3.4Bhatt, V. P., 3.4Bianconi, A., 4.2.3, 4.3.4Bickmann, K., 5.3Bieber, R. L., 5.3Bienenstock, A., 4.2.1, 4.2.3,

4.2.6Biggin, S., 5.3Biggs, F., 4.3.3, 7.4.3Bigler, E., 7.1.6Bijvoet, J. M., 2.2, 4.2.6Bilderback, D. H., 2.2, 4.2.5Binnig, G., 4.3.8Bird, D. M., 4.3.2, 4.3.7, 8.8Bird, R. B., 8.7Birks, L. S., 2.3Birnbaum, H. R., 4.2.3Bischof, C., 8.1Bish, D. L., 2.3, 7.1.4Bishop, A. C., 3.1Bjerrum Mùller, H., 4.4.3Black, D. R., 3.4Black, R. E., 5.3Blackman, M., 2.4.1, 4.3.1, 8.8Blair, D. G., 6.4Blake, A. J., 2.3Blake, R. G., 4.3.7Blakeslee, D. M., 3.1Blanc, Y., 4.4.2Blanton, T. N., 5.2Blaschko, O., 9.2.2BlaÈser, D., 3.4Blech, I., 9.8Bleeksma, J., 2.3Bloch, B. J., 7.4.3Bloch, F., 4.4.2, 7.4.3Block, S., 2.3, 5.1, 5.3Blow, D. M., 3.1, 3.4Blum, M., 7.1.6Blume, M., 4.2.6, 6.1.2, 7.4.3,

8.7Blundell, S. A., 4.2.2Blundell, T. L., 2.2, 3.1Bùe, N., 4.3.7, 8.8Boehli, T., 4.2.1Boehme, R. F., 8.7Boer, D. K. G. de, 2.9Boer, J. L. de, 7.5, 9.2.2Boerdijk, A. H., 9.2.1Boersch, H., 4.3.4Boese, R., 3.4Boettinger, W. J., 2.7Boeuf, A., 2.8

Boggs, P. T., 8.1BoÈhlen, K. van, 3.4Bohlin, H., 2.3Boie, R. A., 7.3Bojarski, Z., 2.3Bokij, G. B., 9.2.2Boød, T., 2.3Boll-Dornberger, K., 9.2.2Bolling, E. D., 4.4.2Bolotina, N. B., 5.3Bomchil, G., 5.3Bond, C. C., 7.1.6Bond, W. L., 2.7, 5.3Bone, D. A., 7.1.6Bonelle, J. P., 4.2.3Bongaarts, P. J. M., 4.4.2Bonham, R. A., 4.3.3BoÈni, P., 4.4.2Bonin, D., 7.1.6Bonnet, M., 8.7Bonnet, R., 3.4Bonse, M., 2.6.2Bonse, U., 2.2, 2.3, 2.6.1, 2.7,

4.1, 4.2.2, 4.2.5, 4.2.6, 4.4.2,5.3

Bontchev, R., 9.2.2Booker, G. R., 5.4.2Boom, G., 5.2Boothroyd, A. T., 2.6.2Borchert, G. L., 4.2.2Bordas, J., 2.5.1, 4.1, 5.2, 7.1.6,

9.2.1Bordet, J., 2.4.2Bordet, P., 3.1Borg, I. Y., 2.3Borgeaud, P., 5.3Borkowski, C. J., 7.1.6, 7.3BoÈrner, H. G., 4.2.2Borovilova, N. V., 4.4.2Borso, C. S., 7.1.6Bosshard, R., 3.4, 7.1.6BoÈttger, G., 4.4.2Botton, G. A., 8.8Boucherle, J. X., 8.7Bouchiat, M. A., 4.4.2Bouldin, C. E., 4.2.3Boulin, C., 7.1.6Bouman, J., 6.2Bouquiere, J. P., 3.4Bourdel, J., 7.3Bourdillon, A. J., 2.5.1, 4.3.4,

5.2Bourke, P., 4.2.1Bourret, A., 4.3.8Bovin, J.-O., 9.2.2Bowen, D. K., 2.7, 4.1, 4.2.3,

5.3Bowen, T. S., 4.2.1Bowman, H. A., 5.3Box, G. E. P., 8.1, 8.2Boyarskaya, R. V., 4.3.5Boyd, R. J., 8.7Boyers, D. G., 4.2.1Braam, A. W. M., 7.4.2Bracewell, R., 2.6.1BraÂdler, J., 2.7Brady, R. L., 3.1, 3.4Brafman, O., 9.2.1Bragg, W. H., 2.2, 2.3, 5.3Bragg, W. L., 2.2, 2.6.2, 5.3Braillon, P., 3.5

Brammer, L., 9.5, 9.6Brandenburg, K., 9.4Breitenstein, M., 4.3.3Brenner, R., 7.3Brentano, J. C. M., 2.3Brese, N. E., 9.1Bretherton, L., 3.4Briand, J. P., 5.2Brice, M. D., 9.5, 9.6Bricogne, G., 4.3.7, 7.1.6Briggs, E. A., 4.2.4, 4.2.6, 7.4.3Brindley, G. W., 9.2.2Brister, K. E., 4.2.5Britton, D., 3.1Brock, C. P., 9.7Brockhouse, B. N., 4.4.2Brockway, L. O., 4.3.3Brodsky, A., , 4.2.5Brongersma, H. H., 7.1.6Brooks, I., 2.2Bross, H., 4.3.4Brouns, E., 9.8Brown, A. S., 4.2.5Brown, B. R., 5.3Brown, D., 4.2.1Brown, D. B., 2.3Brown, G. E., 4.2.6Brown, G. M., 6.1.1Brown, G. S., 4.2.3, 7.4.4Brown, H., 1.4, 9.8Brown, I. D., 9.4, 9.5, 9.6Brown, L. M., 4.3.4, 4.3.8Brown, M. C., 9.6Brown, N. E., 3.4Brown, P. J., 4.4.5, 6.1.2, 8.7Brown, R. T., 4.2.4, 4.2.6, 7.4.3Brown, W. D., 7.4.3Brownell, S. J., 2.3, 5.2Brownell, W. E., 2.3Bruce, M. I., 9.6BruÈhl, H.-G., 5.3Brumberger, H., 2.6.1Brunegger, A., 4.3.4Brunel, M., 8.7Brunner, G. O., 9.1, 9.3Brydson, R., 4.3.4Brysk, H., 4.2.6Bubenzer, A., 4.3.4Buchanan, D., 2.3Buchanan, J., 8.2Buckingham, A. D., 8.7Budinger, T. F., 4.3.8Budnick, J. L., 4.4.2Bueche, A. M., 2.6.1Buerger, M. J., 1.4, 2.2, 2.3, 3.4,

5.3, 6.2, 9.2.1Buffat, P., 4.4.2Buggy, T. W., 4.3.4, 7.2BuÈhrer, W., 4.4.2Bulkin, B. J., 4.1BuÈlow, H., 9.8BuÈlow, R., 1.4Bunch, D. S., 8.1Bunge, A. V., 4.3.3Bunge, C., 4.3.3Bunge, C. F., 4.3.3Bunge, H.-J., 4.3.5Bunkenburg, J., 4.2.1Bunker, B., 4.2.3Bunker, G., 4.2.3Bunn, C. W., 3.1

Bunyan, P. J., 4.3.3Burany, X. M., 9.2.2Buras, B., 2.5.1, 2.5.2, 4.2.1,

4.2.6, 5.2, 5.3, 7.1.5Burbank, R. D., 6.2Burch, T. J., 4.4.2Burdette, H. E., 2.7, 3.4Burek, A. J., 4.2.1Burge, R. E., 7.2Burger, A., 7.1.4Burgers, W. G., 2.2Burgess, W. G., 8.8Burgy, M. T., 4.4.2Burke, B. E., 7.1.6Burke, J., 5.3Burkel, E., 7.4.2Burla, M. C., 8.6Burley, S. K., 3.1Burns, R., 7.1.6Burr, A. F., 2.3, 4.2.2Burshtein, Z., 7.1.4Bursill, L. A., 4.3.8Buschert, R. C., 5.3Buseck, P., 4.3.4Buseck, P. R., 4.3.8Bushnell-Wye, G., 2.3Bushuev, V. A., 7.4.3Busing, W. R., 3.4, 5.3Butler, D. J., 7.1.6Butler, E. P., 3.5Butler, M., 2.3Butler, R. D., 3.3Buttiker, M., 2.9Buxton, B. F., 4.3.7Bychkova, V. E., 2.6.1Byer, R. L., 4.2.1Byrd, R. H., 8.1

Caballero, A., 4.2.3Cable, J. W., 9.8Caglioti, G., 2.3, 2.4.2, 4.4.3,

8.6Cahn, J. W., 9.8Cahn, R. W., 1.3Calas, G., 4.2.3, 4.3.4Calvert, L. D., 2.3, 9.3Campbell, J. E., 3.4Campos, C., 3.4Camps, R. A., 4.3.8Capasso, S., 3.1Capel, M. S., 2.6.2Capellmann, H., 4.4.2Caplan, H. S., 4.2.1Cardona, M., 4.2.2, 5.3Cardoso, L. P., 3.4Carlile, C. J., 2.4.2, 4.4.2, 7.4.2Carlson, E. H., 9.2.2Caroll, C. L., 5.3Carpenter, J. M., 4.4.1Carr, M. J., 2.4.1Carr, P. D., 2.2, 3.4, 5.3Carter, C. B., 4.3.8Carter, C. W., 3.1Carter, C. W. Jr, 3.1Cartwright, B. A., 9.5, 9.6Carver, T. R., 4.4.2Cascarano, G., 8.6Cascio, D., 3.4Case, A. L., 2.8Caspar, D. L. D., 4.4.2Cassetta, A., 2.2

AUTHOR INDEX

969


Castaing, R., 4.2.1, 4.3.4Castelli, C. M., 2.7Caticha-Ellis, S., 3.4Catti, M., 1.3Catura, R. C., 7.1.6Cauchois, Y., 4.2.2Caudron, B., 7.1.6Caul®eld, P. B., 5.3Causer, R., 2.3, 5.3Cavagnero, G., 4.2.2, 5.3Cembali, F., 5.3Cernik, R., 5.2Cernik, R. J., 2.3CÏ ernohorskyÂ, M., 5.3Cerva, H., 2.7Ceska, T. A., 3.1Chadha, G. K., 9.2.1Chadi, D. J., 9.1Chaimdi, M., 3.4Chakera, A., 6.3Chamberland, B. L., 9.2.2Chambers, F. W., 5.3Chambers, W. F., 2.4.1Chan Dyk Tkhan, 7.1.6Chance, B., 4.2.3Chandler, G. S., 6.1.1Chandrasekaran, M., 9.2.1Chandrashekar, G. V., 3.1Chang, S.-L., 5.3Chan Khyo Dao, 7.1.6Chantler, C. T., 4.2.6Chapman, J. N., 7.2Chapuis, G., 4.2.6, 7.5Charpak, G., 2.2, 7.1.6Chatterjee, S., 8.5Chau, K., 4.3.8Chayen, N. E., 3.1Cheary, R. W., 5.2Cheetham, A. K., 2.3, 8.6Cheetham, G. M. T., 2.3, 3.1Chen, C. H., 4.3.4Chen, H., 4.2.3, 4.4.2Chen, S. H., 2.6.1, 2.6.2Chen, S.-H., 2.9Chen-Mayer, H. H., 4.4.2Cheng, T. Z., 4.3.8Cheremukhina, G. A., 7.1.6Chernenko, S. P., 7.1.6Chernov, M. A., 9.2.2Cherns, D., 4.3.8Chesser, N. J., 4.4.2, 4.4.3Cheung, S., 4.4.2Chevallier, P., 5.2Chidambaram, R., 6.1.1Chieux, P., 7.3Chikawa, J., 7.1.6, 7.1.7, 7.1.8Chikawa, J.-I., 2.7Chipera, S. J., 7.1.4Chipman, D. R., 4.2.3Chirino, A. J., 3.1Chou, H. P., 7.3Chowanietz, E. G., 7.1.6Christ, J., 4.4.2Christen, D. K., 2.6.2Christensen, A. N., 2.3, 7.1.3Christoph, A., 5.3Chu, B., 7.1.6Chung, S. J., 1.3Chupp, T. E., 4.4.2Chwaszczewska, J., 2.5.1CõÂsarÏovaÂ, I., 9.2.2

Cisney, E., 2.3Citrin, P. H., 4.1, 4.2.3Clark, G. F., 2.7Clark, S. M., 2.5.1, 3.4Clay, R. E., 4.2.1Clay, W. T., 7.3Cleemann, J. C., 2.6.1Clegg, W., 3.4, 5.3Clementi, E., 4.4.5, 6.1.1, 6.1.2Clifton, I. J., 3.4Cline, J. P., 2.3Clout, P. N., 7.1.6Cochran, W., 5.3Cockayne, D. J. H., 4.3.8Cocking, S. J., 4.4.2Cody, V., 3.1Coelho, A., 5.2Coene, W., 4.3.8Coene, W. M. J., 4.3.8Coffman, D., 4.3.3Cohen, E. R., 4.2.1, 4.2.2, 4.2.3Cohen, G. G., 2.7Cohen, J. B., 2.3Cohen, M. U., 5.2Cohn-Vossen, S., 9.1Cole, H., 2.7, 4.2.6, 5.3Cole, W. F., 5.3Colegrove, F. D., 4.4.2Coleman, T. A., 7.1.6Collett, B., 7.1.6Colliex, C., 4.3.4Collins, C. B., 4.2.1Collins, D. M., 8.2Colwell, J. F., 4.4.2Comparat, V., 7.1.3, 7.1.6Compton, A. H., 2.3, 2.7, 4.2.1,

5.3Condon, E. U., 8.7Conger, G. B., 7.1.6Conolly, M. L., 3.4Conradi, E., 9.2.2Constenoble, M. L., 2.3Conturie, Y., 4.2.1Convert, P., 2.4.2, 7.3Conway, J. H., 9.1Cook, J. E.,Cook, R. D., 8.5Cookson, D. J., 4.2.6Cooper, A. S., 5.3Cooper, C. W., 2.6.1Cooper, M. J., 4.2.3, 4.4.3, 6.3,

7.4.2, 7.4.3, 8.6Copley, J. R. D., 4.4.2Coppens, P., 2.2, 3.4, 6.3, 6.4,

8.7, 9.8Cork, C., 2.2Cork, C. W., 7.1.6Cosier, J., 3.4Cosslet, V. E., 4.2.3Cosslett, V. E., 4.2.1Cotton, J. P., 2.4.2, 7.3Cottrell, A., 9.2.1Cottrell, A. H., 6.4Couderchon, G., 4.4.2Coulter, K. P., 4.4.2Coulthard, M. A., 4.3.1, 6.1.1Coustham, J., 2.6.2Coutanceau Clarke, J. A. R., 9.7Cowley, J. M., 2.4.1, 4.1, 4.3.1,

4.3.2, 4.3.6.1, 4.3.7, 4.3.8,8.8, 9.2.1, 9.2.2

Cowley, R. A., 4.4.3Cox, A. R., 3.5Cox, D. E., 2.3, 2.5.1, 4.2.6,

7.4.4, 8.6, 9.2.2Cox, H. L. Jr, 4.3.3Cox, M. J., 3.1Coyle, B. A., 6.3Cracknell, A. P., 6.1.1Crain, J., 2.3CrameÂr, H., 8.4Craven, A. J., 4.3.4, 7.2Craven, B. M., 6.4Crawford, F. S., 4.2.3Crawford, R. K., 2.9Craxton, R. S., 4.2.1Creagh, D. C., 4.2.3, 4.2.4,

4.2.5, 4.2.6, 10Cressey, G., 2.3Crewe, A. V., 4.3.4, 4.3.8Crichton, R. R., 2.6.1, 2.6.2Croce, P., 2.9Cromer, D. T., 4.2.4, 4.2.6,

4.3.1, 6.1.1, 7.4.3, 8.7Cross, J. O., 4.2.3Crowder, C. E., 2.3, 5.2Crowfoot, D., 3.2Crozier, E. D., 4.2.3Crozier, P. A., 4.3.4Cruickshank, D. W. J., 2.2, 3.4,

5.3, 8.3, 8.7Cudney, B., 3.1Culhane, J. L., 7.1.6Cullen, E. E., 4.2.4Cullity, B. D., 2.3Currat, R., 4.4.2, 7.4.3, 9.8Curtis, C. F., 8.7Cusack, S., 2.6.2Cusatis, C., 4.2.6Cuttitta, F., 3.2Czerwinski, H., 7.4.3

Daams, J. L. C., 9.3Dabbs, J. W. T., 4.4.2Daberkow, I., 4.3.8Daberkow, L., 7.2Dabrowski, A., 7.1.4Dabrowski, A. J., 7.1.5Dahl, J. P., 8.7Dainton, D., 7.1.6Dalglish, R. L., 7.1.6Dallas, W. J., 7.1.6DalleÂ, D., 3.4Dam, B., 9.8Damaschun, G., 2.6.1Damaschun, H., 2.6.1Dana, E. S., 3.5Daniel, V., 9.8Daniels, J., 4.3.4Daniels, P. J., 7.1.6D'Antonio, P., 3.1Danz, H., 3.4D'Aprile, F., 3.4Darriet, B., 9.2.2Darriet, J., 9.2.2Dartyge, E., 7.1.6Darwin, C. G., 6.4Das Gupta, P., 5.2Dash, J. G., 4.4.2Dathe, W., 9.2.2D'Auria, S., 3.1Davanloo, F., 4.2.1

David, W. I. F., 2.3, 2.5.2, 8.6Davidson, E. R., 6.1.1Davidson, J. B., 2.8Davies, J. E., 9.7Davies, N. C., 3.5Davies, S. T., 2.7, 4.2.3Davis, B. L., 2.3, 5.3Dawson, B., 6.1.1Day, M. W., 3.1Deacon, A., 2.2Debye, P., 2.3, 2.6.1, 6.2DeCicco, P. D., 7.4.3Deckman, H. W., 7.1.6Degoy, S., 3.1Dehlinger, U., 9.8Deininger, C., 8.8Delaey, L., 9.2.1Delamoye, P., 9.8De Lange, P. W., 4.4.2Delapalme, A., 2.5.2, 4.4.2, 8.7Delduca, A., 7.1.6Delettrez, J., 4.2.1Delf, B. W., 4.2.5, 5.2Del Grande, N. K., 4.2.3, 4.2.4Delhez, R., 2.3, 5.2Dellby, N., 4.3.7, 4.3.8Delley, B., 8.7Deltour, J., 2.3DeLucia, M. L., 8.7De Marco, J. J., 4.2.4Demasi, D., 3.1Demierre, C., 2.2Demmel, J., 8.1Denesyuk, A. I., 2.6.1Denley, D., 4.2.3Denne, W. A., 3.4Denner, W., 5.3Dennis, J. E., 8.1Dent Glasser, L. S., 3.4Depmeier, W., 9.8Dereniak, E. L., 7.1.6Derewenda, Z., 7.1.6Desai, C. F., 3.4Descamps, J., 4.2.1Desclaux, J. P., 4.2.2, 4.4.5,

6.1.2, 8.7Deslattes, R., 5.2Deslattes, R. D., 4.2.1, 4.2.2,

5.2, 5.3Desseaux, J., 4.3.8DeTitta, G. T., 3.1Deutsch, M., 2.3, 4.2.2, 4.2.6,

5.3Dewan, J. C., 3.4Dexpert, H., 4.2.3Dexter, D. L., 2.3D'Eye, R. W. M., 3.4Dickens, B., 8.3Dideberg, O., 3.4Dietrich, B., 5.3Dietz, G., 9.2.2Dietz, J., 7.1.6DiGiovanni, H. J., 2.3Dikovskaya, R. R., 5.3Diller, T. C., 3.1Dimitrov, D. P., 2.6.1Dingley, D. J., 5.3Dinnebier, R. E., 8.6Di Nova, K., 4.2.1Dischler, B., 4.3.4Disko, M. M., 4.3.4

AUTHOR INDEX

970


Divadeenam, M., 4.4.4Dixon, N. E., 3.1Dobrzynski, L., 4.4.2Dobson, P. J., 4.3.8Dodson, G. G., 3.4Doi, K., 2.8Dolin, R., 7.1.6Doll, C., 4.4.2Dollase, W. A., 2.3Dolling, G., 4.4.2Donaldson, J. R., 8.1Dongarra, J., 8.1Doniach, S., 2.6.1, 4.2.3Donnay, G., 1.3Donnay, J. D. H., 1.3, 1.4, 9.8DoÈnni, A., 4.4.2Donohue, J., 9.7Dorenwendt, K., 4.2.2, 5.3Dornberger-Schiff, K., 3.4,

9.2.1, 9.2.2Dorner, B., 4.4.3, 7.4.2Dorrington, E., 7.1.6Dorset, D. L., 3.5, 4.3.7, 4.3.8D'Orsi, C. J., 7.1.6Doscher, M. S., 3.4Doty, J. P., 7.1.6Doubleday, A., 9.5, 9.6Downing, K. H., 4.3.8Downing, R. G., 4.4.2Downs, J., 4.3.7, 8.8Doyle, P. A., 4.2.4, 4.3.1, 4.3.2,

6.1.1Drabkin, G. M., 4.4.2Dragoo, A. L., 5.2Draper, N., 8.1, 8.4Dreier, P., 4.2.3, 4.2.6Drenth, J., 3.1Dressler, L., 5.3Drits, V. A., 2.4.1, 4.3.5Drum, C. M., 3.5Drummond, W., 7.1.4Duarte, P. W. E. P., 4.2.4Dubey, M., 9.2.1Duchenois, V., 7.1.6Du Croz, J., 8.1Ducruix, A., 3.1Dudarev, S. L., 4.3.2Dudley, M., 2.8Duijneveldt, F. B. van, 6.1.1Duisenberg, A. J. M., 3.4Duke, P. J., 4.2.1DuÈker, H., 4.3.8Dumas, P., 3.4Du Mond, J. W. M., 2.3, 2.7Dunitz, J. D., 9.7Dunn, H. M., 5.3Dunning, T. H. Jr, 6.1.1Dupont, Y., 7.1.6Duppich, J., 4.4.2Durand, D., 6.1.1Durbin, R., 2.2Durbin, R. M., 7.1.6Durham, J. P., 4.3.4Durham, P. J., 4.2.3DÏ urovicÏ, S., 9.2.2DuÈrr, J., 4.2.3DusÏek, M., 9.2.2Dvoryankina, G. G., 2.4.1Dwiggins, C. W. Jr, 6.3Dyson, N. A., 2.3, 4.2.1,

7.1.6

Early, J. G., 3.4Eastabrook, J. N., 5.3, 7.1.2, 7.5Ebeling, G., 4.2.2, 5.3Eberhardt, W., 4.1Ebert, M., 4.4.2Ebisawa, T., 2.9, 4.4.2Eckert, J., 4.4.3Eddy, M. M., 2.3Edington, J. W., 3.5, 5.4.1Edwards, H. J., 2.3, 5.2Edwards, S. L., 3.4Edwards, T. H., 2.3Effenberger, H., 9.2.2Egelstaff, P. A., 4.4.2Egerton, R. F., 4.3.4Eggleton, R. A., 9.2.2Egidy, T. V., 4.2.2Egorov, A. I., 4.4.2Eguchi, T., 4.3.7, 8.8Ehrenberg, W., 4.2.1Eichelle, G., 3.1Eigner, W.-D., 2.6.1Eikenberry, E. F., 2.7, 7.1.6EiseleÂ, J.-L., 3.1Eisenberg, H., 2.6.2Eisenberger, P., 2.2, 4.1, 4.2.3,

7.4.3Eklund, H., 3.4El Korashy, A., 3.4Elder, M., 3.4Eling, A., 9.1Ellinger, Y., 8.7Ellis, T., 5.3Ellisman, M. H., 7.2Elsenhans, O., 4.4.2Elsner, G., 7.1.6Emberson, D. L., 7.1.6Emmerich, C., 2.2Endesfelder, A., 4.3.3Endoh, H., 4.3.8Endoh, T., 7.1.6Eng, P. J., 4.2.5Enge, H. A., 4.3.4Engel, D. H., 4.2.6Engel, P., 1.4Engel, W., 4.3.4Engelman, D. M., 2.6.2Englander, M., 2.8Engstrom, P., 4.2.5Enzo, S., 2.3Epstein, J., 4.3.3, 8.7Erickson, J. W., 3.4Ermer, O., 9.1Ernst, R. R., 5.5Ertl, G., 4.1Escof®er, A., 4.4.2Esquivel, R. O., 4.3.3Esteva, J. M., 4.3.4Evans, B. W., 9.2.2Evans, E. H., 3.4Evans, H. T., 2.2, 5.2Evans, H. T. Jr, 5.3Evans, J. C., 3.4Evans, R. C., 2.3, 9.7Evans, R. G., 3.5Ewing, F., 3.1Ewins, C., 3.5Eyres, B. L., 3.5

Faber, W., 4.4.2Fabian, D. J., 4.2.2

Fabri, R., 5.3Fagherazzi, A., 2.3Fagherazzi, G., 2.3FaÊk, B., 2.8Fan, G. Y., 4.3.7, 7.2Fan, H. F., 4.3.8Fang, Y., 6.2Fankuchen, I., 2.3Fano, U., 4.3.4, 7.1.6Farabaugh, E. N., 3.5Farge, Y., 4.2.1Farkas-Jahnke, M., 9.2.1Farnell, G. C., 7.2Farnoux, B., 2.4.2, 7.3Farquhar, M. C. M., 5.3Faruqi, A. R., 7.1.6Fast, G., 9.8Favro, L. D., 6.1.1Fawcett, T. G., 2.3, 5.2Fearon, E. O., 5.3Feder, R., 2.3Fedorov, B. A., 2.6.1Fedorov, V. V., 8.1, 8.4, 8.5Fedotov, A. F., 4.3.5, 9.2.2Feher, G., 3.1Feidenhans'l, R., 2.3, 7.1.3Feigin, L. A., 2.6.1, 2.9Fejes, P. L., 4.3.4, 4.3.8Felcher, G. P., 2.9Feldman, C., 4.1Feller, W., 6.1.1Feng, H.-P., 7.1.6Ferguson, I. F., 5.2Fermi, E., 4.2.6, 7.4.3, 8.7Ferraris, G., 1.3, 4.3.5FerreÂ-D'AmareÂ, A. R., 3.1Festenberg, C. V., 4.3.4Fewster, P. F., 5.3Fichtner, K., 9.2.2Fichtner-Schmittler, H., 9.2.2Fields, P. M., 4.3.8Figueiredo, M. O., 9.1Figueiredo, M. O. D., 9.2.2Filhol, A., 3.4Filippini, G., 9.7Filscher, G., 5.3Finger, L. W., 2.3, 2.5.1, 3.4,

8.3Fink, J., 4.3.4Fink, M., 4.3.3Finlayson, H., 4.2.2Finney, J. L., 3.4Finzel, B. C., 7.1.6Fiori, C. E., 7.1.4Fiorito, R. B., 4.2.1Fischer, D. G., 5.3Fischer, D. W., 4.3.4Fischer, J., 3.4, 7.3Fischer, K., 2.7, 4.2.6Fischer, K. F., 1.4Fischer, P., 4.4.2, 5.5Fischer, S., 4.4.2Fischer, W., 1.4, 9.1Fisher, R., 6.1.1Fisher, R. G., 3.1Fisher, R. M., 4.3.7, 8.8FitzGerald, J. D., 4.3.8, 5.4.2Fitzsimmons, M., 2.9FjellvaÊg, H., 2.3, 7.1.3Flack, H. D., 1.3, 4.2.2, 5.3, 6.3,

8.1

Flank, A. M., 7.1.6Fleischer, M., 9.2.2Flint, R. B., 7.2Flower, H. M., 3.5Fock, V., 4.2.6Foit, F. F. Jr, 3.4Foltyn, T., 4.4.2Fomin, V. G., 5.3Fontaine, A., 7.1.6Fontecilla-Camps, J. C., 3.1Ford, W. E., 3.5Fordham, J. L. A., 7.1.6FoÈrster, E., 4.2.2, 5.3Forsyth, J. B., 4.4.2, 4.4.5, 7.3,

8.7Forsyth, J. M., 4.1, 4.2.1Forsythe, E., 3.1Forte, M., 4.4.2Foster, B. A., 7.1.3Fouassier, M., 7.1.6Fourme, R., 2.2, 3.4, 4.2.1,

7.1.6Fourmond, M., 2.6.2Fournet, G., 2.6.1, 2.6.2Fournier, T., 3.1Fowler, C. E., 7.3Fox, A. G., 4.3.1, 4.3.2, 4.3.7,

6.1.1, 8.8Fraaije, J. G. E. M., 3.1Fraase Storm, G. M., 3.4Frahm, A., 4.2.3Frank, F. C., 9.1, 9.2.1Frank, J., 4.3.8Frankel, R. D., 4.1, 4.2.1Frank-Kamenetskii, V. A., 9.2.2Franklin, K. R., 2.3Franzini, M., 9.2.2Fraser, G. W., 7.1.6Frauenfelder, H., 3.4Freeborn, B. R., 2.6.2Freeborn, W. P., 2.3Freeman, A. J., 4.4.5, 6.1.2, 8.7Freeman, F. F., 4.4.2Freer, S. T., 7.1.6French, S., 7.5Freund, A., 4.2.6, 5.3Freund, A. K., 4.2.5, 4.4.2Freund, I., 7.4.3Frevel, L. K., 2.3, 2.4.1Frey, F., 3.4, 4.4.2Freymann, D., 7.1.6Fricke, H., 4.2.3Friedli, H. P., 4.4.2Friedman, H., 6.3Friedrich, H., 4.4.2Friedrich, W., 2.1, 2.2Frishberg, C., 8.7Fritsch, E., 4.3.4Fritsch, M., 4.2.2, 5.3Frolova, K. E., 4.3.5Frolow, F., 3.4Frueh, A. J., 9.2.2Fryer, J. R., 3.5, 4.3.8Fu, Z. Q., 4.3.8Fuchs, H. F., 7.1.6Fuchs, R., 4.3.4Fuess, H., 3.4, 4.4.2, 8.7Fuggle, J. C., 4.2.2, 4.3.4Fujii, K., 4.2.2Fujii, Y., 4.4.3Fujikawa, B. K., 4.2.4, 4.2.6

AUTHOR INDEX

971


Fujimoto, I., 2.7, 7.1.6, 7.1.7Fujimoto, Z., 4.2.2Fujita, T., 7.1.6Fujiwara, K., 4.3.1Fujiwara, M., 4.2.3Fujiyoshi, Y., 4.3.7, 4.3.8Fukahara, A., 5.3Fukamachi, T., 2.5.1, 5.2, 6.3Fukuhara, A., 4.3.7, 4.3.8, 8.8Fukumachi, T., 4.2.5Fukumori, T., 5.3Fuller, W. A., 8.1Fuoss, P. H., 4.2.3, 4.2.6Furry, W. H., 6.1.1Futagami, K., 5.3

Gabe, E. J., 5.3Gabel, K., 4.2.5Gabor, D., 4.3.8Gabriel, A., 7.1.6GaÈhler, R., 4.4.2Gainsford, G. J., 2.3Gaødecka, E., 5.3Gale, B., 5.2Gallo, R., 3.4Galloy, J. J., 9.7Galy, J., 9.2.2Gamarnik, M. Ya., 5.3Gamblin, S. J., 3.4Gandol®, G., 2.3Ganow, D., 5.3Garavito, R. M., 3.1Garcia Arribas, A., 9.8GarcõÂa-Ruiz, J. M., 3.1Gard, J. A., 5.4.1, 9.2.2Gar®eld, B. R. C., 7.1.6Garlick, G. F. J., 7.2Garman, E. F., 3.4Garrett, R., 4.2.5Garrett, R. F., 4.2.5Garroff, S., 2.9Gasgnier, M., 4.3.4Gaultier, J.-P., 4.3.5Gauthier, J. P., 9.2.1Gavezzotti, A., 9.7Gavin, R. M. Jr, 4.3.3Gavrila, M., 4.2.6, 7.4.3Gay, D. M., 8.1Gearhart, R. A., 4.2.1Gedcke, D. A., 5.2Geiger, H., 7.1.2Geiger, J., 4.3.3, 4.3.4Geist, V., 5.3George, B., 2.6.2George, J. D., 2.3, 5.3Gerber, C., 4.3.8Gerdau, E., 5.3Gerken, M., 5.3Gerlich, R., 9.1Gernat, C., 2.6.1Gerold, V., 2.7Gerstenberg, H., 4.2.3Gerstenberg, H. M., 4.2.3, 4.2.4Gerward, L., 2.5.1, 2.5.2, 4.2.3,

4.2.4, 4.2.6, 5.2, 5.3Ghose, S., 3.4Giacovazzo, C., 8.6Gibbons, P. C., 4.3.4Gibbs, D., 2.9, 7.4.3, 8.7Gibson, K. D., 9.7GiegeÂ, R., 3.1

Gielen, P., 5.3Giessen, B. C., 2.3, 2.5.1, 5.2Giles, C., 4.2.5Gill, P. E., 8.3Gillham, C. J., 2.3, 5.2Gilliland, G. L., 3.1, 7.1.6Gillon, B., 8.7Gilmore, C. J., 4.3.7, 4.3.8Gilmore, D. J., 7.1.6Girgis, K., 9.3Gjùnnes, J., 4.3.3, 4.3.7, 5.4.2,

8.8Gjùnnes, K., 4.3.7, 8.8Glaeser, R. M., 4.3.7, 4.3.8Glass, H. L., 5.3Glatter, O., 2.6.1, 2.6.2GlaÈttli, H., 2.6.2, 4.4.4Glauber, R., 4.3.3Glazer, A. M., 2.5.1, 3.4, 5.2,

5.3Glazer, J., 4.3.7Glinka, C. J., 4.4.2Glover, I., 3.4Glusker, J. P., 2.2Gobel, H., 4.2.6GoÈbel, H. E., 2.3, 7.1.3Gobert, G., 4.4.2Goddard, H. F., 7.1.6Goddard, P. A., 2.7Godwin, R. P., 4.2.1Godwod, K., 5.3Goetz, K., 4.2.2, 5.3Golay, M. J. E., 2.3Goldberg, M., 4.2.1, 8.7Goldman, L. M., 4.2.1Goldman, M., 4.4.4Goldschmidt, V., 9.8Goldsmith, C. C., 2.3Goldsztaub, S., 4.2.1, 9.2.2Golob, P., 4.3.4Golovin, A. L., 5.3Golub, R., 4.4.2Gonschorek, W., 5.3Gonzalez, A., 3.4Goodhew, P. J., 3.5Goodisman, J., 2.6.1Goodman, P., 2.4.1, 4.3.6.1,

4.3.7, 8.8, 9.2.2Goodson, J. H., 7.1.6Goral, K., 2.6.1Gorceix, O., 4.2.2Gordon, G. E., 2.3, 2.5.1, 5.2Gordon, R. G., 8.7Gorshkov, A. I., 4.3.5Goto, K., 2.7, 7.1.6, 7.1.7Goto, N., 7.1.6, 7.1.7Gottschalk, H., 4.3.8Gotwals, J. K., 5.3Goulon, J., 4.2.5Graaff, R. A. G. de, 6.3Graafsma, H., 3.4Graeff, W., 2.7Graeser, S., 9.2.2Graf, W., 4.4.2Grant, B. K., 2.3Grant, D. F., 7.5Grant, G. A., 3.5Grant, I., 4.3.1, 4.3.2Grasselli, J. G., 4.1Gratias, D., 9.8Graubner, H., 3.2

Gray, N., 9.2.2Grebille, D., 9.8Greegor, R. B., 4.3.4Green, M., 2.3, 4.2.1Green, R. E. Jr, 2.7, 7.1.7Greenbaum, A., 8.1Greenberg, B., 5.2Greene, G. C., 4.4.2Greene, G. L., 4.2.2Greenhough, T. J., 2.2, 3.4Greenwood, J. A., 6.1.1Grell, H., 9.2.2Grenville-Wells, H. J., 6.2Greville, T. N. E., 2.6.1Grey, D., 4.2.5Griebner, U., 5.3Grif®th, J. P., 3.4Grigson, C. W. B., 2.4.1Grimmer, H., 1.3, 4.4.2Grimsditch, M. H., 5.3Grimvall, G., 4.2.6Grinton, G. R., 4.3.8Gritsaenko, G. S., 4.3.5Gronsky, R., 4.3.8Grossi, F., 4.2.5Grossman, T., 4.4.2Grosso, J. S., 2.3Grosswig, S., 5.3Groves, G. W., 3.5Grubel, G., 4.2.5Gruber, E. E., 5.3GruÈnbaum, B., 9.1Gruner, S. M., 2.7, 7.1.6Grunes, L. A., 4.3.4Gschneider, K. Jr, 9.3Guagliardi, A., 8.6Gubbens, A. J., 4.3.7Gudat, W., 4.3.4Guetter, E., 7.2Guggenheim, S., 9.2.2Guidi-Morosini, C., 6.3Guigay, J. P., 2.8Guillemet, E., 7.1.6Guinet, P., 4.4.2Guinier, A., 2.3, 2.6.1, 2.6.2,

2.7, 4.3.5, 9.2.2Gumbel, E. J., 6.1.1GuÈnther, W., 9.2.2Guo, C.-L., 4.2.1Guo, S. Y., 3.2Gupta, S. K., 3.5Gurman, S. J., 4.2.3Guttmann, P., 7.1.6Guyot, P., 2.6.2Gyax, F. N., 4.1

Hausermann, D., 4.2.5Haag, F., 9.1Haas, J., 2.6.1, 2.6.2Habash, J., 2.2, 3.4Hadi, A. S., 8.5Haendler, H. M., 3.4Haga, K., 4.2.3Hagashi, Y., 5.3Hagemann, H. J., 4.3.4Hagen, W., 2.7HaÈgg, G., 2.2Hahn, Th., 1.3, 1.4, 5.3, 9.2.2,

9.7Haider, M., 4.3.8Hails, J. E., 2.2

Hainisch, B., 2.6.1Hajdu, J., 3.4Hale, K. F., 3.5Hales, T. C., 9.1Halfon, Y., 3.4Hall, E. L., 5.3Hall, M. M. Jr., 2.3Halliwell, M. A. G., 5.3Hamacher, E. A., 2.3Hamelin, B., 4.4.2Hamid, S. A., 9.2.2Hamill, G. P., 2.3, 5.2Hamilton, J. F., 7.2Hamilton, L. D., 2.6.1Hamilton, R., 2.3, 5.2Hamilton, W., 2.9Hamilton, W. A., 2.9Hamilton, W. C., 2.2, 5.3, 6.4,

7.5, 8.3, 8.4, 8.7Hamley, I. W., 2.9Hamlin, R., 2.2, 3.4, 7.1.6Hammarling, S., 8.1Hanawalt, J. D., 2.3Han¯and, M., 4.2.5Hanic, F., 5.3Hann, R. A., 3.5Hanneman, R. E., 5.3Hansen, N. K., 4.1Hansen, P. G., 4.2.2Hanson, H. P., 4.3.3Hanson, I. R., 3.4Harada, J., 4.2.5, 7.4.2Harada, Y., 4.3.7, 7.2Harding, M. M., 2.2, 2.3, 3.1,

3.4, 5.3Hardman, K. D., 3.4Harlos, K., 3.1Harmon, H. E., 4.4.2Harmony, M. D., 9.5, 9.6Harper, R. G., 3.5Harris, J. L., 4.2.1Harris, K. D. M., 8.6Harris, L. J., 7.1.6Harris, N., 5.3Harrison, D. C., 7.1.6Harrison, S. C., 2.2, 7.1.6Harrison, W. T. A., 2.3Hart, M., 2.2, 2.3, 2.5.1, 2.6.1,

2.6.2, 2.7, 4.2.2, 4.2.5, 4.2.6,4.4.2, 5.2, 5.3

Hartl, W. A. M., 4.3.4Hartmann, H., 3.4Hartmann, W., 2.7Hartmann-Lotsch, I., 4.2.6Hartree, D. R., 4.2.6, 7.4.3Hartshorne, N. H., 3.1, 3.3HaÈrtwig, J., 4.2.2, 5.3Haruta, K., 2.7Hasegawa, K., 7.1.6Hasegawa, T., 5.3Hashimoto, H., 2.7, 4.2.6, 4.3.8Hashizume, H., 2.2, 2.3, 2.7,

4.2.5, 7.1.3, 7.4.4Hasnain, S. S., 4.2.3Hastings, J. B., 2.2, 2.3, 4.2.3,

4.2.6, 7.4.4, 8.6Hastings, T. J., 3.4Haszlo, S. E., 7.1.7Hatton, P. D., 2.3Hattori, S., 4.2.6Haubold, H. G., 7.1.6

AUTHOR INDEX

972


Haumann, J., 2.9Hauptmann, H., 3.2HaÈusermann, D., 2.5.1, 5.3Hautecler, S., 4.4.2Hawkes, D. J., 4.2.4Hawthorne, F. C., 9.6Hayakawa, K., 2.7, 6.3, 7.1.6Hayes, C., 4.4.2Hayter, J. B., 2.6.2, 2.9, 4.4.2Hazen, R. M., 2.5.1, 3.4Heal, K. M., 3.4Heald, A., 4.2.3Heath, M. T., 8.1Heathman, S. P., 4.4.2Hebert, H., 5.3Heckingbottom, R., 5.3Hedman, B., 7.1.5Heesch, H., 9.1Hehn, R., 4.4.2Heidorn, D. B., 2.6.1Heigl, A., 3.2Heil, W., 4.4.2Heine, S., 2.6.1Heine, V., 4.3.4, 9.8Heinrich, A. R., 9.2.2Heinrich, K. F. J., 4.2.4, 7.1.4Heise, H., 5.3Heisenberg, W., 4.3.3Hellings, G. J. A., 7.1.6Helliwell, J. R., 2.1, 2.2, 2.3,

3.1, 3.4, 4.2.1, 4.2.3, 4.2.6,7.1.6

Helliwell, M., 3.1HellkoÈtter, H., 4.2.6Hellner, E., 7.1.1, 8.7, 9.1Helmholdt, R. B., 7.4.2Hemley, R. J., 2.5.1Henderson, R., 4.3.8Henderson, R. J., 4.3.7Hendricks, R. W., 2.6.1, 7.1.6Hendricks, S., 9.2.1Hendrickson, W. A., 3.2, 4.2.6,

8.3Hendrix, J., 2.6.1, 7.1.6Henins, A., 4.2.2, 5.2, 5.3Henke, B. L., 4.2.4, 4.2.6Hennig, M., 3.1Henning, A., 4.2.6Henriksen, K., 3.4Henry, L., 4.3.4Henry, N. F. M., 2.2, 3.1, 5.3Hensler, D. H., 2.3Heo, N. H., 3.4Hepp, A., 2.3, 8.6Herbstein, F. H., 5.3Herino, R., 5.3Herpin, A., 9.8Herrman, K., 4.3.8Herrmann, K.-H., 4.3.4, 7.2Hertz, G., 4.2.3Hestenes, M., 8.3Heuss, K. L., 3.4Hewat, A. W., 2.4.2, 5.5, 8.6Hewett, C. A., 2.3Hewitt, R., 4.2.3Hey, P. D., 2.4.2, 4.4.2Heynes, G. D., 7.1.7Hezemans, A. M. F., 3.1Hickling, N., 3.2Hida, M., 4.2.3Hidaka, M., 2.5.1, 5.2

Higashi, T., 2.2, 3.4Higgins, S. A., 4.4.3Higgs, H., 9.5, 9.6HiismaÈki, P., 4.4.2Hikaru, T., 4.2.3Hilbert, D., 9.1Hilczer, B., 5.3Hildebrandt, G., 2.7Hilderbrandt, R. L., 4.3.3Hill, R. J., 2.3Hilleke, R. O., 2.9Hillier, J., 4.3.4Hilton, M. R., 4.3.7Himes, V. L., 2.4.1, 9.7Himmelblau, D. M., 8.4Hines, W. A., 4.4.2Hinze, E., 5.2, 5.3Hirabayashi, M., 4.2.3Hirabayshi, M., 5.3Hiraga, K., 4.3.8Hirai, T., 2.7, 7.1.6, 7.1.7Hirano, T., 7.1.6Hirota, F., 4.3.3Hirs, C. H. W., 2.2Hirsch, P. B., 2.3, 3.5, 4.3.6.2,

4.3.8, 5.4.1Hirshfeld, F. L., 7.5, 8.7Hirshfelder, J. O., 8.7Hirvonen, J.-P., 2.9Hitchcock, A. P., 4.3.4Hjelm, R. P., 2.6.2Ho, A. H., 4.2.1Ho, M. M., 4.3.7Hoaglin, D. C., 8.2Hobbs, L. W., 3.5Hock, R., 4.4.2Hodeau, J. L., 3.1Hodges, C. H., 4.3.4Hodgson, K. O., 2.6.1, 4.2.3,

4.2.6, 7.1.5Hoerni, J. A., 4.3.3Hofer, F., 4.3.4Hofer, M., 2.6.1Hoff, R. W., 4.2.2Hoffmann, H., 2.6.1, 2.6.2Hoffmann, R., 4.3.4Hofmann, A., 4.2.1Hofmann, D., 4.4.2Hofmann, E. G., 2.3Hùghùj, P., 4.4.2Hohberger, H. I., 4.3.4Hohenberg, P., 8.7Hohlwein, D., 3.4, 7.3HoÈhne, E., 9.2.2Hùier, R., 4.3.7, 5.4.2, 8.8Holden, N. E., 4.4.4Holladay, A., 8.7Holland, F. M., 3.5Holmes, K. C., 2.6.1, 3.4Holmestad, R., 4.3.7, 8.8Holmshaw, R. T., 7.1.6Holt, S. A., 4.2.5HolyÂ, V., 2.9, 5.3Holzapfel, W. B., 2.5.1HoÈlzer, G., 4.2.2, 5.3Hom, T., 5.3Honess, A. P., 3.5Hong, S.-H., 5.3Honjo, G., 2.4.1, 9.2.1Honkimaki, V., 4.2.1HoÈnl, H., 4.2.6

d'Hooghe, P., 4.4.2Hope, H., 3.4Hopf, R., 7.1.6Hoppe, W., 2.6.2Horisberger, M., 4.4.2Horita, Z., 4.3.7, 8.8Horiuchi, S., 4.3.8Hornstra, J., 3.4Horota, F., 4.3.3Horstmann, M., 2.4.1HorvaÂth, J., 5.3Hosemann, R., 2.6.1, 2.7Hosokawa, N., 5.3Hosoya, S., 2.5.1, 2.8, 4.2.6,

5.2, 9.2.1Hossfeld, F., 2.6.1, 2.6.2, 4.4.2HovmoÈller, S., 3.4, 4.3.7Howard, A., 2.2Howard, A. J., 7.1.6Howard, C. J., 2.4.2Howard, S. A., 2.3Howard, W., 9.2.2Howerton, R. J., 4.2.4, 4.2.6,

7.4.3Howes, M. J., 7.1.6Howie, A., 3.5, 4.3.6.2, 4.3.7,

4.3.8, 5.4.1Hoya, H., 3.4Hoylaerts, M., 2.6.1Hsiang, W. Y., 9.1Hsu, B. T., 3.1Hu, H.-C., 6.2Huang, D. X., 4.3.8Huang, T. C., 2.3, 5.2, 8.6Hubbard, C., 2.3, 5.2Hubbard, C. R., 2.3, 5.1, 5.2, 5.3Hubbard, K. M., 2.9Hubbard, S. T., 2.6.1Hubbell, J. H., 4.2.3, 4.2.4,

4.2.6, 7.4.3Huber, H., 3.4Huber, P. J., 8.2Huber, R., 6.3Huffman, F. N., 4.2.2Huggins, F. G., 2.3Hughes, D. J., 4.4.2Hughes, G., 7.1.6Hughes, J. W., 7.1.2, 7.5Hughes, T. E., 5.2Huke, K., 4.2.1Hull, A. W., 2.3HuÈller, A., 6.1.1Hulme, R., 5.3Hulubei, H., 4.2.2Humblot, H., 4.4.2Huml, K., 5.3Hummelink, T., 9.5, 9.6Hummelink-Peters, B. G., 9.5,

9.6Humphreys, C. J., 4.3.6.2, 8.8Hundt, R., 9.4, 9.5, 9.6Hunter, B., 8.6Hunter, J. S., 8.1Hunter, W. G., 8.1Hustache, R., 2.8Hutchings, M. T., 4.4.6Hutchinson, J. L., 4.3.8Hutchison, J. L., 9.2.2Huxham, M., 3.5Huxley, H. E., 7.1.6d'Huysser, A., 4.2.3

Huyton, A., 5.2Huzinaga, S., 6.1.1Hwang, S. R., 4.4.2Hyde, S. T., 9.1Hyman, A., 3.5Hyogah, H., 4.2.6

I'anson, K. J., 2.6.1Ibach, H., 4.3.4Ibel, K., 2.4.2, 2.6.1, 2.6.2,

4.4.2, 7.3Ibers, J. A., 4.3.1Ichimiya, A., 4.3.7, 8.8IevinÎsÏ, A., 5.3Ihara, H., 4.2.3Ihringer, J., 3.4Iijima, S., 4.3.8, 9.2.2Iijima, T., 4.3.3Ikeda, S., 4.2.3Ikhlef, A., 7.1.6Illini, Th., 7.4.2Imada, K., 3.4Imai, K., 5.3Imamov, R. M., 2.4.1, 5.3Immirzi, A., 8.6Imura, T., 5.3Inagaki, Y., 7.3Inagami, T., 3.4Incoccia, L., 4.2.3Indelicato, P., 4.2.2Ingrin, J., 9.2.2Inkinen, O., 2.3Inokuti, M., 4.3.4In't Veld, G. A., 7.1.6Inzaghi, D., 5.3Irie, K., 5.3Isaacs, N. W., 3.4, 9.5, 9.6Isaacson, M., 4.3.4Isaacson, M. S., 4.3.4Isherwood, B. J., 5.3Ishida, K., 4.2.6Ishigaki, A., 2.5.1Ishiguro, T., 4.2.3Ishikawa, T., 2.7, 4.2.5, 4.2.6Ishimura, T., 4.2.1, 4.2.3Ishizawa, N., 3.4Ishizuka, K., 4.3.8, 7.2Isoda, S., 7.2Isokawa, K., 5.3Isozaki, Y., 7.1.6Israel, H., 4.2.6Israel, H. I., 4.2.4Ito, M., 2.7, 7.1.6, 7.1.8Ito, T., 9.2.2Ivanov, A. B., 7.1.6Iwai, S., 3.4Iwanczyk, J., 7.1.4Iwanczyk, J. S., 7.1.5Iwasaki, N., 4.2.6Izdkovskaya, T. V., 9.2.2

Jack, A., 8.3JaÈckel, K.-H., 5.3Jackson, D. F., 4.2.4Jacob, M., 9.7JacobeÂ, J., 2.4.2, 7.3Jacobs, L., 2.7, 4.2.2Jacobs, S., 4.2.1Jacobson, R. A., 3.4Jacrot, B., 2.6.2Jagner, S., 9.2.2

AUTHOR INDEX

973


Jagodzinski, H., 2.3, 3.4, 9.2.1,9.2.2

Jahn, H. A., 7.4.2Jain, P. C., 9.2.1James, R. W., 4.2.6, 5.3, 6.3,

7.4.2James, V. J., 7.1.6James, W. J., 5.3Jancarik, J., 3.1JaÈnig, G. R., 2.6.1Janin, J., 3.1Janner, A., 9.8Janot, C., 2.6.2Jansen, J., 3.5Jansonius, J. N., 3.1Janssen, R. W., 4.3.4Janssen, T., 9.8Jap, B. K., 4.3.7, 4.3.8Jarchow, O., 9.2.2JaÈrvinen, M., 2.3JaÈschke, J., 5.3Jauch, J. M., 7.4.3Jauch, W., 2.5.2Jaynes, E. T., 8.2Jeffery, J. W., 2.2, 3.1, 3.4Jeffrey-Hay, P., 6.1.1Jeitschko, W., 2.3Jelinsky, P., 7.1.6Jelley, E. E., 3.3Jellinek, F., 9.8Jelonek, S., 8.6Jenkins, R., 2.3, 4.2.1, 5.2Jennings, L. D., 4.2.3, 4.2.5,

7.4.4Jensen, L. H., 2.2, 3.1, 3.4, 5.3Jensen, T., 2.5.1Jephcoat, A. P., 2.5.1Jepsen, O., 4.3.4Jesson, D. E., 4.3.8Jiang, S.-S., 2.7Johann, H. H., 2.3Johansson, T., 2.3Johnson, A. L., 4.3.4Johnson, A. W. S., 4.3.8, 5.4.1,

5.4.2Johnson, C. A., 9.2.1Johnson, C. K., 6.1.1, 8.3Johnson, D., 4.3.4Johnson, D. E., 4.3.4Johnson, D. W., 4.3.4Johnson, G. G. Jr, 2.4.1Johnson, J. E., 3.4Johnson, K. H., 4.3.4Johnson, L. N., 2.2, 3.1, 3.4Johnson, L. R., 5.3Johnson, M. W., 2.5.2Johnson, O., 9.7Johnson, R. W., 8.2Johnson, W. R., 4.2.2Johnston, D. F., 8.7Johnston, J., 3.2Jones, A., 3.4Jones, A. R., 2.6.1Jones, E. Y., 3.4Jones, P. M., 4.3.6.2, 5.4.2Jones, R. C., 7.1.6Jones, R. M., 9.2.1Jong, W. F. de, 6.2Jonson, B., 4.2.2Jorde, C., 2.6.1Jorgensen, J. D., 2.5.2, 5.5, 8.6

Jùrgensen, J.-E., 6.4Jostsons, A., 4.3.7Jouffrey, B., 4.3.4Joy, D. C., 4.2.3, 4.3.4Jucha, A., 7.1.6Jurnak, F., 3.1

Kaat, E. de, 5.3Kabra, V. K., 9.2.1Kabsch, W., 3.4Kaesberg, P., 2.6.1Kaesberg, P. J., 2.6.1Kafadar, K., 8.5Kahn, R., 2.2, 3.4, 7.1.6Kahovec, L., 2.6.1Kainuma, Y., 8.8Kaiser, A., 7.1.7Kaiser, W., 4.4.2Kajantie, K., 7.4.3Kakinoki, J., 9.2.1Kakudo, M., 4.3.5Kakuta, N., 4.3.3Kalata, K., 7.1.6Kalenik, J., 3.1Kalinin, Y. G., 4.2.1Kalman, Z. H., 2.5.1, 5.3, 9.2.1Kalnajs, J., 5.3Kalus, J., 2.6.1, 2.6.2Kamada, K., 2.8Kambe, K., 4.3.4, 4.3.7, 4.3.8Kaminaga, U., 7.4.4Kamino, N., 4.2.3Kamiya, K., 7.1.8Kamiya, N., 7.1.6Kammerer, O. F., 4.4.2Kampermann, S. P., 6.4Kane, P. P., 4.2.4, 4.2.6Kaneko, F., 9.2.2Kantor, B., 5.3Kaplow, R., 2.3, 6.3Kappler, E., 2.7Karamura, T., 6.3Karellas, A., 7.1.6Karen, V. L., 9.7Kariuki, B. M., 2.3, 3.1Karle, I. L., 4.3.3Karle, J., 4.2.6, 4.3.3Karlsson, R., 3.1Karnatak, R. C., 4.3.4Karplus, M., 3.4Kasai, N., 4.3.5Kasman, Ya. A., 4.4.2Kasper, J. S., 6.2, 9.1, 9.2.1, 9.7Katayama, C., 6.3Kato, A., 9.2.2Kato, H., 7.1.6, 7.1.8Kato, N., 2.7, 6.3Katoh, H., 4.2.6Katoh, T., 7.2Katsube, Y., 3.4Kaucic, V., 3.1Kaufmann, E. N., 4.1Kavinki, B. M., 8.6Kawaminami, M., 5.2, 5.3Kawamura, T., 2.7, 4.2.5, 7.1.7Kawamura, T. W., 7.1.6Kawasaki, M., 4.3.8Kawasaki, T., 4.2.1Kawata, H., 5.3Kay, M. I., 6.1.1Keast, D. J., 3.5

Keeney, R. B., 4.3.4, 7.2Keijser, Th. H. de, 2.3, 5.2Keil, P., 4.3.4Kellar, J. N., 2.3Keller, H. L., 5.3Kelley, D. M., 3.4Kelley, M. H., 4.3.3Kelly, A., 3.5Kelly, E. H., 5.2Kelly, P. M., 4.3.7Kendall, M. G., 6.1.1Kendrick, H., 6.2Kennard, C. H. L., 3.4Kennard, O., 9.5, 9.6, 9.7Kephart, J. O., 4.2.1Kessler, E., 4.2.2Kessler, E. G., 4.2.2, 5.2Kessler, E. G. Jr, 4.2.2Kessler, J., 4.3.3Ketkar, S. N., 4.3.3Keve, E. T., 8.5Khabakhshev, A. G., 7.1.6Kharitonov, Yu. I., 4.2.4Kheiker, D. M., 5.3, 7.1.6, 7.5Khejker, D. M., 5.2Khomyakov, A. P., 9.2.2Kihara, H., 4.3.7Kihn, Y., 4.3.4Kikuta, S., 2.7, 4.2.5Killat, U., 4.3.4Killean, R. C. G., 7.5Kim, S., 3.4Kim, S.-H., 3.1Kim, Y. K., 4.2.2Kim, Y. S., 8.7Kimura, M., 4.3.3Kimura, T., 4.2.3Kincaid, B. M., 2.2, 4.1, 4.2.3Kind, R., 9.8King, H. E. Jr, 2.3King, H. W., 2.3, 5.2King, J. S., 6.2King, M. V., 3.4, 6.1.1King, Q. A., 4.3.2, 8.8Kirfel, A., 4.2.6Kirisits, M. J., 3.1Kirk, D., 5.3Kirkham, A. J., 5.3Kirkland, A., 4.3.8Kirkpatrick, H., 2.3Kirkpatrick, H. B., 3.5Kirkpatrick, P., 4.2.1Kirste, R. G., 2.6.1, 2.6.2Kishimoto, S., 7.1.8Kishino, S., 2.7, 5.3Kisker, E., 4.3.4Kissel, L., 4.2.4, 4.2.6Kiszenick, W., 5.3Kitagawa, Y., 9.2.2Kitaigorodskii, A. I., 9.7Kitaigorodsky, A. I., 9.1, 9.7Kitajgorodskij, A. I., 9.7Kitano, T., 2.7Kittner, R., 5.3Kjeldgaard, M., 2.6.2Klapper, H., 1.3Kleb, R., 2.9Klein, A. G., 4.4.4Klein, O., 7.4.3Klemperer, O., 4.3.4Kliewer, K., 4.3.4

Klimanek, P., 4.4.2Kloos, G., 2.3Kloot, N. H., 8.4Klug, A., 4.1Klug, H. P., 2.3, 3.4, 5.1, 6.2Knibbeler, C. L. C. M., 7.1.6Knipping, P., 2.1, 2.2Knoll, W., 2.6.2Knop, W., 2.6.2Knop, W. E., 1.4Knox, J. R., 3.4Ko, T.-S., 3.4Kobayakawa, M., 4.2.1Kobayashi, J., 5.3Kobayashi, K., 4.2.6, 4.3.8Kobayashi, M., 9.2.2Kobayashi, T., 4.3.8, 7.2Kobayashi, Y., 4.2.6Koch, A., 7.1.6Koch, B., 4.2.4Koch, E., 1.1, 1.2, 1.3, 9.1Koch, E. E., 4.2.1Koch, M., 4.4.2Koch, M. H. J., 2.6.1, 2.6.2Koch, M. J. H., 7.1.6Koehler, W. C., 9.8Koester, L., 4.4.4Kogan, V. A., 5.2Kogiso, M., 4.3.7, 5.4.2Koh, F., 6.3Kohl, D. A., 4.3.3Kohl, H., 4.3.2Kohler, H., 2.3, 7.4.2Kohler, T. R., 7.1.4Kohn, W., 4.2.6, 8.7Kohra, K., 2.2, 2.7, 4.2.3, 4.2.5Koidl, P., 4.3.4Koike, H., 4.3.8Kolpakov, A. V., 4.1Komarov, F. F., 4.2.5Komem, Y., 5.3Komoda, T., 4.3.8Komura, Y., 9.2.1Konaka, S., 4.3.3Kondrashkina, E. A., 5.3Konnert, J. H., 3.1, 8.3Kopfmann, G., 6.3Kopp, M., 7.1.6Kopp, M. K., 7.3Koptsik, V. A., 1.4, 9.8Kordes, E., 9.3Korekawa, M., 9.8Koritsanszky, T., 8.7Korneev, D. A., 4.4.2Korolev, V. D., 4.2.1KorytaÂr, D., 5.3Koshiji, N., 5.3Kossel, W., 5.3Kostarev, A. L., 4.2.3Kosten, K., 3.4Kostorz, G., 2.6.2Kostroun, V. O., 2.7Kosugi, N., 4.3.4Kottke, T., 3.4Kovalchuk, M. V., 5.3Kovev, E. K., 5.3Kowalczyk, R., 5.3Kowalski, M., 9.2.2Koyama, K., 7.1.6Kozaki, S., 2.3, 4.2.1, 4.2.6Kraft, S., 4.2.2

AUTHOR INDEX

974


Krahl, D., 4.3.4, 4.3.7, 7.2Kraimer, M. R., 7.1.6Kramers, H. A., 4.2.1Kranold, R., 2.6.1Kratky, C., 3.4Kratky, O., 2.6.1, 2.6.2Krause, M. O., 6.3Krauss, M., 8.7Krec, K., 7.4.2Kreinik, S., 7.1.7Kretschmer, R.-G., 9.2.2Krigbaum, W. R., 2.6.1Krijgsman, P. C. J., 2.6.2Krinari, G., 4.3.5Krinary, G. A., 4.3.5Krishna, P., 9.2.1, 9.2.2Krivanek, O. L., 4.3.4, 4.3.7,

4.3.8, 7.2, 8.8KroÈber, R., 2.6.1Kroeger, K. S., 3.4KroÈger, E. Z., 4.3.4Kroll, N. M., 4.2.2Kronig, R. de L., 4.2.3Kroon, J., 3.1Kruger, E., 4.4.2Kruit, P., 4.3.4Krumpolc, M., 2.6.2Kshevetsky, S. A., 5.3Kuban, R.-J., 9.2.2Kubena, J., 2.9, 5.3Kucharczyk, D., 5.3, 9.8Kuchitsu, K., 9.2.2Kuczkowski, R. L., 9.5, 9.6Kudo, S., 5.3Kudriashov, V. A., 4.4.2Kuetgens, U., 4.2.2Kugasov, A. G., 4.4.2KuÈgler, F. R., 2.6.1Kuh, E., 8.2, 8.5KuÈhl, W., 2.7KuÈhlbrandt, W., 4.3.7Kuhn, K., 4.2.1Kuhs, W. F., 6.1.1Kujawa, S., 7.2Kulda, J., 4.4.2Kulenkampff, H., 4.2.1Kulipanov, G. N., 4.2.1Kulpe, S., 3.4Kumachov, M. A., 4.2.1Kumada, J., 7.1.6Kumakov, M. A., 4.2.5Kumaraswamy, S., 3.4Kumosinski, T. F., 2.6.1KuÈndig, W., 4.1Kundrot, C. E., 3.2, 3.4Kuntz, I. D. Jr, 3.4Kunz, A. B., 4.3.4Kunz, C., 4.1, 4.2.1, 4.3.4Kunze, G., 2.3KuÈppers, H., 5.3KuÈppers, J., 4.1Kupriyanov, M. F., 5.2Kurbatov, B. A., 5.3Kurittu, J., 7.4.2Kuriyama, M., 2.7, 7.1.7Kuriyama, T., 7.1.7Kuriyan, J., 3.4Kurki-Suonio, K., 6.1.1Kuroda, H., 4.2.3, 4.3.4Kuroda, K., 2.8Kuroiwa, T., 8.8

Kurz, R., 7.3Kusev, S. V., 4.2.1KuÈster, A., 3.4Kutschabsky, L., 9.2.2Kutzler, F. W., 4.2.3Kuyatt, C. E., 4.2.2, 4.3.4Kuz'min, R. N., 4.1, 7.4.3Kuznetsov, P. I., 6.1.1Kvick, AÊ ., 5.3Kwong, P. D., 3.2

Laan, G. van der, 4.3.4Laban, G., 9.2.2Labergerie, D., 4.2.5Labzowsky, L., 4.2.2Laclare, J. L., 4.2.1Ladd, M. F. C., 3.1Ladell, J., 2.3, 5.2Ladner, J. E., 3.1Lafferty, W. J., 9.5, 9.6Lagasse, A., 3.5Laggner, P., 2.6.1Lagomarsino, S., 2.8Laguitton, D., 5.2LaÈhteenmaÈki, I., 2.5.1Laine, E., 2.5.1Lairson, B. M., 2.2Lambert, N., 2.6.1Lamoreaux, R. D., 7.1.6Lampton, M., 7.1.6Landau, L., 4.3.4Lander, G., 4.4.1Landre, J. K., 2.7Lang, A. R., 2.3, 2.7, 5.3Lang, W., 4.2.2Lange, B. A., 3.4Lange, G., 3.4Langer, J. A., 2.6.2Langford, J. I., 2.3, 5.2, 6.2,

7.1.2Langridge, R., 2.6.1Lanz, H. Jr, 3.2Lapington, J. S., 7.1.6La Placa, S. J., 8.7LaRock, J. G., 4.4.2Larsen, E. S. Jr, 3.3Larsen, F. K., 3.4Larsen, P. K., 4.3.8Larson, A. C., 3.4, 8.7Larson, B. C., 5.3Lartigue, C., 4.4.2Laue, M. von, 2.1, 2.2Lauer, R., 4.2.2, 5.3Laugier, J., 3.4Laurie, V. W., 9.5, 9.6Laves, F., 9.1Lawrance, J. L., 2.7Lea, K., 4.2.1Lea, K. R., 4.2.6Leapman, R. D., 4.2.3, 4.3.4Lebech, B., 2.5.2, 4.3.7, 8.8Leber, M. L., 4.3.7Leboucher, P., 7.1.6Lebugle, A., 4.2.2Leciejewicz, J., 2.5.2Leduc, M., 4.4.2Lee, B., 6.3Lee, J. S., 4.3.3Lee, P., 4.2.4, 4.2.6Lee, P. A., 4.1, 4.2.3Lefaucheux, F., 3.1

LeGalley, D. P., 2.3Legrand, E., 4.4.2Lehmann, A., 5.3Lehmann, M. S., 2.3, 3.4, 7.1.3Lehmpfuhl, G., 4.3.7, 4.3.8, 8.8Leifer, K., 4.4.2Leising, G., 4.3.4Lele, S., 9.2.1Lemonnier, M., 2.2, 7.1.6Lengeler, B., 4.2.3, 4.2.6Lenglet, M., 4.2.3Leon, R., 4.2.5Leonardsen, E., 9.2.2Leopold, H., 2.6.1LePage, Y., 1.3, 5.4.1Le Peltier, F., 4.2.3Lerche, M., 5.3Lereboures, B., 4.2.3Leroux, J., 4.2.4LeszczynÂski, M., 3.4, 5.3Leung, P. C., 8.7Levi, A., 7.1.4Levine, I. L., 8.7Levine, M. R., 6.3Levinger, J. S., 4.2.4Levitt, M., 8.3Levy, H. A., 3.4, 5.3, 6.1.1, 8.3LeÂvy, P., 6.1.1Lewis, M. H., 3.5Lewis, O., 4.2.1Lewis, R., 7.1.6Lewis, S. J., 3.4Lewit-Bentley, A., 3.1Ley, L., 4.2.2Li, F. H., 4.3.8Li, J. Q., 4.3.8Li, Q., 4.2.1Li, Y., 7.1.6Liang, K. S., 2.3Liberman, D., 4.2.4, 4.2.6Liberman, D. A., 4.2.6Lichte, H., 4.3.8Lider, V. V., 5.3Lidin, S., 9.7Liebhafsky, H. A., 4.2.4Liesen, D., 4.2.2Lietzke, R., 2.6.2Lifchitz, E., 4.3.4Lifshitz, R., 9.8Lim, G., 2.3Lim, G. S., 5.2, 5.3Lima-de-Faria, J., 9.1Liminga, R., 5.3Lindau, I., 4.2.4, 7.4.4Lindegaard-Andersen, A., 2.5.1Lindemann, R., 2.3Linderstrom-Lang, K., 3.2Lindgren, I., 4.2.2Lindhard, J., 4.3.4Lindley, P., 3.4Lindley, P. F., 3.1, 3.2, 3.4Lindner, P., 2.6.2Lindner, T., 4.3.4Lindroth, E., 4.2.2Lindstrom, R. M., 4.4.2Lippman, R., 3.4Lipps, F. W., 7.4.3Lipscomb, W. N., 6.1.1Lipson, H., 2.2, 2.3, 5.2, 5.3,

6.2, 9.8Lischka, K., 2.9

Lisher, E. J., 4.4.5Lisoivan, V. I., 5.3Liss, K.-D., 4.4.2Litrenta, T., 4.4.2Liu, H., 7.1.6Liu, J. W., 4.3.3Liu, L., 4.3.8, 7.2Livesey, A. K., 8.2Livingood, J. J., 4.3.4Lloyd, K. H., 5.3Lobashov, V. M., 4.4.2LoÈchner, U., 3.4Loeb, A., 9.1Long, D. C., 7.1.6Long, N., 4.3.8Lonsdale, K., 2.2, 5.3, 6.2Lontie, R., 2.6.1Looijenga-Vos, A., 9.8Loopstra, B. O., 2.4.2Lorber, B., 3.1Lorenz, G., 3.4Lotsch, H., 4.2.6Lotz, B., 3.5LoueÈr, D., 2.3, 5.2, 8.6Lourie, B., 2.2Lovas, F. J., 9.5, 9.6Love, G., 4.2.1Lovesey, S. W., 4.1, 6.1.2,

7.4.3, 8.7Lovey, F. C., 4.3.8Low, B. W., 3.2Lowde, R. D., 2.5.2, 4.4.2, 6.4Lowe, B. M., 2.3Lowenthal, S., 7.1.6Lowitzsch, K., 2.3Lowrance, J. L., 7.1.6Lucas, W., 4.2.2, 5.3Lucht, M., 5.3Luft, J., 3.1Luft, J. R., 3.1Luger, P., 3.4, 5.3èukaszewicz, K., 5.3Lukehart, C. M., 2.5.2Lum, G. K., 4.2.2Lumb, D. H., 7.1.6Lund, L., 4.2.1Luo, M., 3.4Lushchikov, V. I., 4.4.2Lutterotti, L., 5.2Lutts, A., 5.3Lutts, A. H., 5.3Lutz, H. D., 2.3Luzzati, V., 2.6.1, 2.6.2Lynch, D. F., 4.3.6.1, 4.3.8Lynch, F. J., 7.3Lynch, J., 4.2.3, 4.3.8Lynn, J. E., 4.4.4Lytle, F. W., 4.2.3, 4.3.4Lyutzau, V. G., 5.3

Ma, H., 4.3.4Ma, Y., 4.2.3, 4.3.7, 8.8Maaskamp, H. J., 7.1.6MacGillavry, C. H., 3.1, 4.2.4,

4.3.1, 8.8Machado, W. G., 2.7Machin, K. J., 3.4Machin, P. A., 3.4Machlan, L. A., 5.3Mack, B., 2.4.2Mack, B. J., 4.4.2

AUTHOR INDEX

975


Mack, M., 2.3, 5.2, 7.5Mackay, A. L., 1.4, 3.4, 6.2Mackay, K. J. H., 5.3Mackenzie, J. K., 6.1.1, 7.5Macrae, C. F., 9.7Madar, R., 4.4.2Madariaga, G., 9.8Madsen, I. C., 2.3Maeda, H., 4.2.3Maeder, D. L., 3.1Magerl, A., 4.4.2Magorrian, B. G., 2.7Maher, D., 4.2.3Maher, D. M., 4.3.4Mai, Z.-H., 2.7Maier-Leibnitz, H., 4.4.2Main, P., 5.3Mair, S. L., 4.2.6, 6.1.1Maistrelli, P., 5.2Majkrzak, C. F., 2.9, 4.4.2Makarova, I. P., 3.1Makepeace, A. P. W., 2.7Maki, A. G., 9.5, 9.6Maki, M., 5.3Makita, Y., 4.3.8MakovickyÂ, E., 9.2.2Makowski, I., 3.4Malgrange, C., 2.8, 7.3Malik, S. S., 2.9Malina, R. F., 7.1.6Malinowski, A., 2.6.2Malinowski, M., 3.4, 5.3Mallett, J. H., 4.2.3, 4.2.4Malmros, G., 2.3, 8.6Malzfeldt, W., 4.2.6Mamy, J., 4.3.5Mana, G., 4.2.2Mann, J. B., 4.2.4, 4.3.1, 4.3.3,

6.1.1, 7.4.3Mannami, M., 4.3.8Manne, R., 4.2.1Manninen, S., 7.4.3Manoubi, T., 4.3.4Mantler, M., 5.2Manzke, R., 4.3.4Mao, H. K., 2.5.1Marchant, J. C. J., 7.2Marcus, M., 4.2.3Mardin, K. V., 6.1.1Mardix, S., 2.7MareÂschal, J., 4.4.2Marezio, M., 3.1Marks, L., 4.3.8Marmeggi, J. C., 2.5.2Marr, G. V., 4.2.1Marsh, D. J., 3.4Marsh, P., 5.3Marsh, R. E., 5.3, 8.3Marshall, R. C., 9.2.1Marshall, W., 4.1, 8.7Martens, G., 4.2.3MaÊrtensson, N., 4.2.2Marthinsen, K., 4.3.7, 8.8Martin, C., 7.1.6Martinez-Carrera, S., 10Martini, M., 4.2.3Maruani, J., 8.7Maruyama, E., 7.1.6Maruyama, H., 2.7, 7.1.6, 7.1.7Maruyama, X. K., 4.2.1Marvin, D. A., 2.6.1

Marx, D., 4.4.2Marxreiter, J., 3.4Marzolf, J. G., 4.2.2, 5.3Masaki, N., 2.8Masciocchi, N., 2.3, 8.6Maslen, E. N., 4.2.6, 6.1.1, 6.3Maslen, V. M., 4.3.4Mason, B., 3.2Mason, I. M., 7.1.6Massa, L., 8.7Massalski, T. B., 2.3, 4.3.5Massey, H. S. W., 4.3.3, 4.3.4Masuda, K., 4.2.1Materlik, G., 2.2, 2.7, 4.2.3,

4.2.6Mateu, L., 2.6.2Mathews, F. S. 3.4, 6.3Mathias, H. G., 3.4Mathieson, A. McL., 7.4.4Matsuhata, H., 4.3.7, 8.8Matsui, J., 2.7, 7.1.7Matsumoto, T., 9.1Matsumura, S., 8.8Matsunaga, K., 5.3Matsushima, I., 7.1.6Matsushita, T., 2.2, 2.7, 4.2.3,

4.2.5, 7.1.8, 7.4.4Matsuura, U., 9.2.2Matthewman, J. C., 8.6Matthews, B. W., 3.1, 3.2, 3.4Matthews, D., 2.2Matthews, G. D., 4.2.2Matzfeld, W., 4.2.3Mauer, F. A., 5.2, 5.3Maurice, J. L., 4.3.4Mawhorter, R. J., 4.3.3Max, N., 3.4May, C., 4.4.2May, R. P., 2.6.2May, W., 2.5.1Mayer, J., 4.3.7, 8.8Mayer, J. W., 4.1Mayers, D. F., 4.3.4Mazzarella, L., 3.1McCallum, B., 4.3.8McClelland, J. J., 4.3.3McConnell, C. H., 3.5McConnell, J. D. C., 9.8McCourt, M. P., 4.3.8McCrory, L. R., 4.2.1McCusker, L., 2.3, 8.6McDermott, G., 3.1McKeever, B., 3.4McKenney, A., 8.1McKie, C., 2.2McKie, D., 2.2McKinstry, H. A., 3.4McLarnan, T. J., 9.2.2McLaughlin, P. J., 3.4McLean, A. D., 4.3.3, 6.1.1McLean, R. S., 4.3.3McMahon, M., 4.2.5McMahon, M. I., 2.3, 2.5.1McMann, R. H., 7.1.7McMaster, R. C., 7.1.7McMaster, W. H., 4.2.3, 4.2.4McMeeking, R., 2.3McMullan, D., 4.3.4McMullan, R. K., 6.4McMurdie, H. F., 3.4McNeely, J. B., 5.3

McNeill, K. M., 7.1.6McPherson, A., 3.1, 3.4McSweeney, S., 2.2Meardon, B. H., 4.4.2Medarde, M., 4.4.2Mees, C. E. K., 7.1.1Megaw, H. D., 5.3Mei, R., 4.2.3Meier, B. H., 5.5Meier, F., 2.7Meier, J., 4.4.4Meier, P. F., 4.1Meieran, E. S., 2.7Meijer, G., 9.2.2Meisheng, H., 4.3.8Meister, H., 4.4.2Melgaard, D. K., 2.4.1Melkanov, M. A., 4.3.3Melle, W., 5.3Mellema, J. E., 2.6.2Mellini, M., 9.2.2Melmore, S., 9.1Mendelsohn, L. B., 4.3.3, 7.4.3Mendelssohn, M. J., 5.3Menke, H., 2.6.1Menotti, A. H., 4.4.2Menter, J. W., 4.3.8Menzel, M., 7.2Meriel, P., 2.6.2, 9.8MeÂring, J., 4.3.5Merisalo, M., 2.3, 6.1.1, 7.4.2Merlini, A. E., 5.3Merlino, S., 9.2.2Merritt, E. A., 7.1.6Merritt, F. C., 7.3Merwin, H. E., 3.3Merz, K. M., 9.2.1Merzbacher, E., 2.9Mesquita, A. H. G. de, 9.2.1Messerschmidt, A., 3.4, 7.1.6Metcalf, P., 7.1.6Metchnik, V., 4.2.1Metherell, A. J. F., 4.3.4Metoki, N., 2.9Metzger, T. H., 4.3.7, 8.8Meuth, H., 4.2.3Meyer, A. J., 5.3Meyer, C. E., 4.3.7Meyer, G., 2.4.1Meyer, H., 4.3.3Meyer-Ilse, W., 7.1.6Meyrowitz, R., 3.2, 3.3Meysner, L., 5.3Mezei, F., 4.4.2Mezey, P. G., 9.7Michalowicz, A., 2.8Midgley, H. G., 3.2Midgley, P. A., 4.3.7, 8.8Mighell, A. D., 2.4.1, 5.2, 9.7Mihama, K., 2.4.1Mikhailyuk, I. P., 5.3Mikhalchenko, V. P., 5.3Mikke, K., 2.5.2Mikol, V., 3.1Milch, J. R., 7.1.6Mildner, D. F. R., 4.4.2, 7.3Miles, M. J., 2.6.1Milledge, H. J., 4.2.4, 5.3Miller, A., 2.6.2Miller, B., 4.3.3Miller, B. R., 4.3.3

Miller, K. J., 8.7Miller, P. H., 4.4.2Millhouse, A. H., 7.4.3Million, G., 7.1.6Mills, D. L., 4.3.4Milne, A. D., 2.7Minakawa, N., 2.8Minato, I., 2.3, 3.4, 7.1.3Miner, B. A., 4.3.4Mingos, D. M. P., 2.3Minkowski, M., 9.1Misemer, D. K., 4.2.3Mises, R. von, 6.1.1Misselwitz, R., 2.6.1Mitchell, E. M., 9.7Mitchell, J. P., 7.1.7Mitchell, P. W., 4.4.3Mitchell, R. S., 9.2.1Mitra, G. B., 5.2Mitsunaga, T., 4.2.3Mittelbach, P., 2.6.1Mittemeijer, E. J., 2.3Miyahara, J., 7.1.6, 7.1.8, 7.2Miyake, S., 9.2.1Miyamoto, M., 9.2.2Miyata, T., 3.4Miyoshi, A., 2.7Mizusaki, T., 4.3.7Mizutani, I., 5.3Mochiki, K., 7.1.6Modrzejewski, A., 5.3Moelo, Y., 9.2.2Moews, P. C., 3.4Moffat, K., 2.2, 3.4Mogami, K., 9.2.2Mohr, P. J., 4.2.2, 5.3Moliterni, A. G., 8.6MoÈllenstedt, G., 4.3.8Monaco, H. L., 3.1Montenegro, E. C., 4.2.4Moodie, A. F., 4.3.1, 4.3.6.1,

4.3.8Moody, P. C. E., 3.4Mook, H. A., 4.4.2, 8.7Moon, K. J., 2.7Mooney, P. E., 4.3.7, 4.3.8Mooney, T., 4.2.2Mooney, T. M., 4.2.2Moore, J. K., 7.1.7Moore, L. J., 5.3Moore, M., 2.7Moore, P. B., 2.6.1, 2.6.2Moran, M. J., 4.2.1Moras, D., 3.4Morawe, C., 2.9Morchan, V. D., 7.1.6Moreno, A., 3.1Moret, R., 3.4Moretto, R., 3.4Morgan, B. L., 7.1.6Morgan, C. B., 7.3Morgan, D. V., 7.1.6Morgenroth, W., 4.2.6Mori, H., 9.2.2Mori, N., 4.3.7, 4.3.8, 7.2Moriguchi, S., 7.2Morikawa, K., 4.3.7Moring-Claesson, O., 2.6.1Morosin, B., 3.4Morris, I. L., 9.1Morris, M. C., 2.3, 3.4

AUTHOR INDEX

976


Morris, P. L., 3.5Morris, R. E., 2.3Morris, V. J., 2.6.1Morris, W. G., 5.3Morrison, G. R., 7.2Morse, P. M., 4.3.3Mort, K., 4.2.3Mortensen, K., 2.6.2Mortier, W. J., 2.3Mory, C., 4.3.4Moss, G., 8.7Mosteller, M., 8.2Motherwell, W. D. S., 9.5, 9.6Motohashi, H., 2.8Mott, N. F., 4.3.4Mott, N. I., 4.3.3Moudy, L. A., 5.3Moulai, J., 7.1.6Mountain, R. W., 7.1.6Mount®eld, M. J., 3.5Mourou, X., 4.2.1Moy, J.-P., 7.1.6Moyer, N. E., 5.3MuÈcklich, F., 4.4.2Mughabghab, S. F., 4.4.4Mughier, J., 3.5MuÈller, A., 4.2.1Muller, J., 3.4MuÈller, J. E., 4.2.3, 4.3.4MuÈller, J. J., 2.6.1MuÈller, K., 2.6.1MuÈller, U., 9.2.2MuÈller, W., 7.1.2MuÈller-Heinzerling, T., 4.3.4Munshi, S. K., 3.4Muralt, P., 9.8Muramatsu, T., 4.3.3Murata, T., 4.2.3Murray, W., 8.3Murray-Rust, P., 9.6Murshudov, G. N., 3.4Mursic, Z., 4.4.2Murthy, M. R. N., 3.4Musil, F. J., 5.2, 5.3Mustre de Leon, J., 4.2.3Myklebust, R. L., 7.1.4Myles, D., 3.4

Naday, I., 7.1.6, 7.3Naday, Y., 4.3.4Nagakura, S., 4.3.8Nagel, D. J., 4.2.1Naiki, T., 4.3.8Najmudin, S., 3.4Nakagawa, A., 7.1.8Nakajima, K., 5.3Nakajima, T., 5.2Nakamura, T., 5.3Nakamura, Y., 4.3.8Nakano, Y., 4.2.5, 6.3Nakayama, K., 2.7, 4.2.2Nanni, L. F., 5.3Nannichi, Y., 5.3Napier, J. G., 4.3.7Narayana, S. V. L., 3.4Nash, S., 8.1Nastasi, M., 2.9Nathans, R., 4.4.2, 4.4.3, 6.1.2Natoli, C. R., 4.2.3Naukkarinen, K., 2.7Nave, C., 2.6.1, 3.4

Navrotsky, A., 3.4Nazarenko, V. A., 4.4.2Necker, G., 8.8Neder, R. B., 3.4Neilsen, C., 7.1.6Nelder, J. A., 9.7Nellist, P., 4.3.8Nelmes, R. J., 2.3, 2.5.1Nelms, A. T., 4.2.6Nelson, J. B., 5.2Nemiroff, M., 5.3Nesper, R., 9.1Nesterova, Ya. M., 9.2.2NeubuÈser, J., 1.4, 9.8Neuling, H. W., 2.5.1Nevot, L., 2.9Newbury, D. E., 7.1.4Newkirk, J. B., 2.7Newman, B. A., 5.3Newsam, J. M., 2.3Newville, M., 4.2.3Ng, E. W., 4.3.3Nichols, M. C., 2.3Nicholson, J. R. S., 2.7Nicholson, R. B., 3.5, 4.3.6.2,

4.3.8, 5.4.1Nicholson, W. L., 7.5, 8.2, 8.4,

8.5Nicol, J. M., 2.3Niculescu, V., 4.4.2Nielsen, C., 2.2, 3.4Nielsen, M., 2.3, 4.4.3, 7.1.3Nielson, C., 7.1.6Nielson, M., 4.4.3Nieman, H. F., 3.4Niemann, W., 4.2.3, 4.2.6Nierhaus, K. H., 2.6.2Niggli, P., 9.1Niimura, N., 2.5.1Niinikoski, T. O., 2.6.2Niklewski, T., 5.3Nikolin, B. I., 9.2.2Ninio, J., 2.6.1Nishina, Y., 7.4.3Nishiyama, Z., 9.2.1Nissenbaum, J., 7.1.4Nittono, O., 2.7Nixon, W. C., 4.2.1Nomura, K., 9.2.2Nomura, M., 4.2.3Nonaka, Y., 7.1.6Nonoyama, M., 5.4.2Nordfors, B., 4.2.3Norman, D., 4.2.3Normand, J.-M., 6.1.1North, A. C. T., 3.4, 6.3Northwood, D. O., 9.2.2Norton, T. J., 7.1.6Nothnagel, A., 2.6.1NovaÂk, C., 9.2.2Nowacki, W., 9.1, 9.7Nowotny, V., 2.6.2Nugent, K. A., 4.2.5Numerov, B. V., 4.3.3Nunes, A. C., 4.4.2Nunez, V., 2.9, 4.4.2Nurmela, M., 2.3, 8.6Nyholm, R., 4.2.2

Oba, K., 2.7, 7.1.6Obaidur, R. M., 5.3

Obashi, M., 4.2.3OberthuÈr, R. C., 2.6.1, 2.6.2O'Connor, B., 8.6Ogawa, T., 4.2.6Ogilvie, R. E., 2.3, 5.3Oguso, C., 7.1.6Ohama, N., 5.3O'Hara, S., 2.7Ohkawa, T., 4.2.6Ohlendorf, D. H., 7.1.6Ohlidal, I., 2.9Ohshima, K.-I., 3.4Ohta, T., 4.2.3Ohtaka, K., 4.2.4Ohtsuki, Y. H., 4.2.4Oikawa, T., 4.3.7, 4.3.8, 7.2Okada, Y., 5.1, 5.3Okamoto, S., 2.9Okamura, Y., 7.1.6Okazaki, A., 3.4, 5.2, 5.3O'Keefe, M. A., 4.3.1, 4.3.2,

4.3.8, 6.1.1O'Keeffe, M., 9.1Oki, K., 8.8O'Mara, D., 7.1.6Okorokov, A. I., 4.4.2Okude, S., 7.1.6Okuno, H., 7.3Old®eld, T. J., 3.1Olejnik, S., 5.3Olekhnovich, A. I., 6.4Olekhnovich, N. M., 6.4Oliver, J. H., 6.3Olkha, G. S., 7.5Olsen, A., 4.3.7, 4.3.8, 5.4.2Olsen, J. S., 2.5.1, 5.2, 5.3Olthoff-MuÈnter, K., 2.7Omote, K., 2.3Onitsuka, H., 5.3Oosterkamp, P. W. J.,Oosterkamp, W. J., 4.2.1Op de Beeck, M., 4.3.8Opechowski, W., 1.4, 9.8Oppenheimer, I., 4.2.6Orchowski, A., 4.3.8Orlandi, P., 9.2.2Orpen, A. G., 9.5, 9.6Ortale, C., 7.1.6Ortiz, C., 2.3Oshima, K., 4.2.5Ostapovich, M. V., 5.3Ostrouchov, S., 8.1Ostrowski, G., 2.9Otten, E. W., 4.4.2Ottewanger, H., 7.1.6Otto, A., 4.3.4Otto, J. W., 2.5.1éverbù, I., 4.2.3, 4.2.4Ovitt, T. W., 7.1.6Oyanagi, H., 4.2.3, 4.2.5Ozawa, S., 4.3.8Ozawa, T., 9.2.2

Paakkari, T., 7.4.3Pabst, A., 9.2.2Pace, S., 5.3Paciorek, W. A., 7.5, 9.8Padawer, G. ,E., 5.3Padmaya, N., 9.7Pahl, R., 4.2.5Palache, Ch., 9.8

Palenzona, A., 9.2.2Palmer, R. A., 3.1Palmer, S. B., 2.8Panchenko, J. M., 5.2Panchenko, Yu. M., 7.5Pandey, D., 9.2.1Pang, G., 5.3Pangborn, W. A., 3.1Pannhorst, V., 2.4.1Panson, A. Y., 4.3.4Pantos, E., 4.2.3Paoletti, A., 2.3, 2.4.2, 4.4.3, 8.6Paolini, F. R., 2.3Papatzacos, P., 4.2.3Papiz, M. Z., 2.3, 3.4Parak, F., 3.4Paretzkin, B., 3.4Parfait, J., 2.6.1Parfait, R., 2.6.2Parker, N. W., 4.3.4Parmon, V. S., 2.4.1Parratt, L. G., 2.3, 4.2.2, 4.2.3Parrish, W., 2.3, 2.5.1, 5.2, 5.3,

7.1.2, 7.1.3, 7.1.4, 7.5, 8.6Parsons, D. F., 4.1PartheÂ, E., 2.3Pasemann, M., 4.3.8Pasero, M., 9.2.2Pashley, D. W., 3.5, 4.3.6.2,

4.3.8, 5.4.1Passell, L., 4.4.2Patel, N. B., 5.3Patel, S., 3.1Paterson, M. S., 9.2.1Patt, B. E., 7.1.6Patterson, A. L., 9.2.1, 9.7Pattison, P., 7.4.3PaÈtzold, H., 4.3.7Paul, R. L., 4.4.2Pauling, L., 9.2.2, 9.3Paulus, M., 3.5Pavlishin, V. I., 9.2.2Pavlov, M. Yu., 2.6.2Pawley, G. S., 2.3, 5.2, 6.1.1,

6.3, 8.6, 8.7Peacock, M., 9.8Pearce-Percy, H. T., 4.3.4Pearl, L. H., 3.1Pearlman, S., 2.3Pearson, G. L., 5.3Pearson, W. B., 9.3Pease, D. M., 4.2.3Pedersen, J. S., 2.6.2, 2.9Peele, A. G., 4.2.5Peerdeman, A. F., 4.2.6Peerdeman, F., 5.2Peierls, R. E., 4.2.6Peiser, H. S., 2.3, 5.1Peisert, A., 7.1.6Peisl, J., 7.4.2Peixoto, E. M. A., 4.3.3Peltonen, H., 6.1.1Pendry, J. B., 4.2.3, 4.3.4,

4.3.6.2Penfold, J., 2.6.2, 2.9, 4.4.2Peng, L.-M., 4.3.1, 4.3.2, 8.8Pennartz, P. U., 3.4Penner-Hahn, J. E., 4.2.3, 7.1.5Penneycook, S. J., 3.5Pennock, G. M., 3.5Pennycook, S. J., 4.3.8

AUTHOR INDEX

977


Perchiazzi, N., 9.2.2Perez, J. P., 4.3.4Perez-Mato, J. M., 9.8Perez-Mendez, V., 2.2Perfettii, P., 4.2.3Perlman, M. L., 4.2.3Pernot, P., 7.1.6Perrier de la Bathie, R., 2.8,

4.4.2Perrin, F., 6.1.1Perry, J. A., 9.1Persson, E., 4.2.6Persson, H., 4.2.2Perutz, M. F., 2.6.2Peshekhonov, V. D., 7.1.6Pesonen, A., 2.3Pessen, H., 2.6.1Peterson, R. C., 3.4Petiau, J., 4.2.3, 4.3.4Petit, M., 7.1.6Petri, E., 4.3.4Petricek, V., 9.2.2, 9.8Petroff, J. F., 2.7, 2.8Petrova, S. N., 9.2.2Petsko, G. A., 3.4Pettersen, R. C., 9.5, 9.6Petzow, G., 4.4.2Pfeiffer, H. G., 4.2.4P®ster, J. C., 5.3P¯uÈger, J., 4.3.4P¯ugrath, J., 3.4P¯ugrath, J. W., 7.1.6Phan, T., 9.8Phelps, A. W., 9.2.2Philipp, H. R., 4.3.4Philips, J. C., 4.2.6Phillips, D. C., 2.2, 3.4, 6.3Phillips, F. C., 3.1Phillips, G. N. Jr, 3.4Phillips, W. C., 2.3, 4.2.1, 7.1.6Phizackerley, R. P., 7.1.6Photen, M. L., 7.1.7Piaget, C., 7.1.6Pick, M. A., 5.3Pickart, S. J., 4.4.2Pickford, M. G., 3.4Picot, D., 3.1Picraux, S. T., 4.1Piermarini, G. J., 5.3Pierron, E. D., 5.3Piestrup, M. A., 4.2.1Pietraszko, A., 5.3Pihl, C. F., 5.3Pike, E. R., 2.3, 5.2Piltz, R. O., 2.3Pilz, I., 2.6.1Pimentel, C. A., 5.3Pincus, C. I., 4.2.1Pinot, M., 2.6.2Pinsker, Z. G., 2.4.1, 2.7, 4.3.5,

5.3Pirenne, M. H., 4.2.4Pirouz, P., 4.3.8PlancËon, A., 4.3.5Platzman, P. M., 7.4.3Plechaty, E. F., 4.2.4Plies, E., 4.3.4Plotnikov, V. P., 4.3.5Plotz, W., 2.9Plummer, E. W., 4.1Podlasin, S., 3.4, 5.3

Podolsky, R. J., 7.1.6Pofahl, E., 5.3Polack, F., 7.1.6PolcarovaÂ, M., 5.3Polidori, G., 8.6Polizzi, S., 2.3Pollehn, H. K., 7.1.6Polyak, M. I., 5.3Pommerrenig, D. H., 7.1.6Pongratz, P., 7.4.2Ponomarev, I. Yu., 4.4.2Poole, M. W., 4.2.1Popa, N. C., 7.4.2, 8.6Popov, A. N., 7.1.6PopovicÂ, S., 5.2, 5.3Porat, Z., 3.5Porod, G., 2.6.1, 2.6.2Porsev, G. D., 4.4.2Porteus, I. O., 4.2.3Posselt, D., 2.6.2Post, B., 5.3Post, J. E., 2.3Potts, H. R., 5.3Poulos, T. L., 7.1.6Pound, A., 3.2Pouxe, J., 7.1.3, 7.1.6Powell, B. M., 3.4Powell, C. J., 4.2.2, 4.3.4Powell, H. R., 2.3Powers, L. S., 4.2.3Prager, P. R., 9.2.1Prandl, W., 3.4Prasad, B., 9.2.1Prasad, L., 9.2.1Pratapa, S., 8.6Pratt, R. H., 4.2.4, 4.2.6, 7.4.3Press, W., 6.1.1Preston, A. R., 8.8Preston, G. D., 9.8Preston, K. D., 2.3Prewitt, C. T., 2.3, 3.4Price, P. F., 4.2.6Price, W. J., 7.1.6Prince, E., 2.3, 4.2.2, 5.1, 5.3,

7.5, 8.1, 8.2, 8.3, 8.4, 8.5, 8.6Prince, F. C. de, 5.3Pring, A., 9.2.2Prins, J. A., 2.6.1Probst, R., 4.2.2, 5.3Prout, C. K., 2.3Proviz, G. I., 7.1.6Provost, K., 3.1Przybylska, M., 3.1, 3.4Ptitsyn, O. B., 2.6.1Pulay, P., 4.3.3PuÈrschel, H. V., 2.6.1Pusey, M., 3.1Puxley, D. C., 3.4Pynn, R., 2.9, 4.4.2, 4.4.3Pyrros, N. P., 2.3

Quayle, J. A., 2.7Queisser, H.-J., 2.7

Rabe, P., 2.7, 4.2.3, 4.2.6Rabinovich, D., 2.2, 7.5Rabukhin, V. B., 3.2Rachinger, W. A., 2.3Rackham, G. M., 4.3.6.2, 5.4.2Radeka, V., 7.3Rademacher, H.-J., 4.2.2, 5.3

Radi, G., 8.8Radoslovich, E. W., 9.2.2Rae, A. D., 8.3Rae, W. N., 3.2Raether, H., 4.3.4Raftery, J., 9.6Rai, R. S., 9.2.1Raia, C. A., 3.1Raiko, V. I., 4.2.1Raj, K., 4.4.2Ralph, R. L., 8.3Ramachandran, G. N., 2.7Ramakrishnan, V., 2.6.2Ramakumar, S., 9.7Ramaseshan, S., 4.2.6, 6.1.3Ramesh, R., 4.3.7Ramesh, T. G., 6.1.3Ramsay, D. A., 9.5, 9.6Ramsdell, L. S., 9.2.1Randall, K. H., 9.1Ranganath, G. S., 6.1.3Rao, C. N., 4.3.4Rao, Ch. P., 3.4Rao, S., 9.1Raoux, D., 7.1.6Rask, J. H., 4.3.4Rasmussen, B. F., 3.4Rasmussen, S. E., 3.4Rathie, P. N., 7.5Rau, W., 4.3.8Rau, W. D., 4.3.8, 7.2Rauch, H., 2.7, 4.4.2, 4.4.4Ravel, B., 4.2.3Ravn, H. L., 4.2.2Rayment, I., 3.4Raynal, J., 4.3.3Read, M. H., 2.3Read, W. T., 6.4Reck, G., 9.2.2Redinbo, M. R., 3.1Reed, M., 4.2.1Reed, R. E., 4.4.2Reed, S. J. B., 2.3, 4.2.1Reeke, G. N. J., 5.3Rees, A. L. G., 2.4.1Rees, B., 8.7Rees, D. C., 3.1Rehr, J. J., 4.2.3Reichard, T. E., 5.3Reider, M., 3.4Reifsnider, K., 2.7Reilly, J., 3.2Reim, G., 4.2.2, 5.3Reimer, L., 4.3.4, 7.2Reinecke, T., 9.2.2Reinhardt, A., 9.1Rem, P. C., 4.4.2Remaut, G., 3.5Remenyuk, P. I., 5.3Remington, S. J., 3.1Ren, G., 4.3.2Renault, A., 4.3.8Renda, G., 7.1.6Rendle, D. F., 2.3Rennekamp. R., 4.3.4Renninger, M., 2.3, 2.7, 5.3Resouche, E., 4.4.2Reverchon, F., 3.5Reynolds, G. T., 7.1.6Reynolds, R. A., 3.1Reynolds, R. C., 2.3

Rez, D., 4.3.1, 4.3.2Rez, P., 4.3.1, 4.3.2, 4.3.4Rhan, H., 5.3Ribberfors, R., 7.4.3Ricci, F. P., 2.3, 2.4.2, 4.4.3,

8.6Rice, S. B., 4.3.8Rice-Evans, P., 7.1.6Richard, J. C., 7.1.6Richards, F. M., 3.2, 3.4Richardson, J. W., 8.6Richardson, M. C., 4.2.1Richardson, M. C. M., 4.2.5Richter, D., 4.4.2Ricker, G. R., 7.1.6Ridou, C., 5.3Rieck, C. D., 4.2.2Riekel, C., 3.1Ries-Kautt, M., 3.1Rietveld, H. M., 2.3, 2.4.2, 5.2,

8.2, 8.3, 8.6Rieubland, J. M., 2.6.2Rieubland, M., 2.6.2Riggs, P. J., 4.2.3Riglet, P., 2.7Rigoult, J., 6.3Rijlart, A., 2.6.2Rijllart, A., 2.6.2Riley, D. P., 5.2Rindby, A., 4.2.5Ringe, D., 3.4Ringe-Ponzi, D., 3.4Rink, W. J., 3.4Rinn, H. W., 2.3Ripp, R., 3.4Riquet, J. P., 3.4Risler, J. L., 3.4Riste, T., 4.4.2Ritchie, R. H., 4.3.4Ritland, H. N., 2.6.1Ritsko, J. J., 4.3.4Ritter, R., 4.4.2Rizkallah, P. J., 3.1Robert, M. C., 3.1Roberts, K. J., 2.7, 3.4Roberts, L. D., 4.4.2Roberts, P.-H., 6.1.1Robertson, B. E., 5.3Robin, J., 4.2.1Robinson, R. A., 4.4.3Roche, C. T., 7.3Rode, A. V., 4.2.5Rodeau, J.-L., 3.1Rodenburg, J., 4.3.8Rodgers, J. R., 9.3, 9.5, 9.6, 9.7Rodricks, B., 7.1.6Rodrigues, A. R. D., 2.3, 2.7,

4.2.5Rodriguez, S., 5.3Roe, A. L., 7.1.5Roe, S. M., 3.4Roehrig, H., 7.1.6Roetti, C., 4.4.5, 6.1.1, 6.1.2Rogers, D. W., 3.4Rogers, J. E., 8.1Rogerson, I. F., 5.2Rohe, D., 4.4.2Rohrer, H., 4.3.8Rohrlich, F., 7.4.3Rollett, J. S., 5.3Rùmming, C., 4.3.7, 8.8

AUTHOR INDEX

978


Rooksby, H. P., 2.3, 5.1Rooms, G., 4.4.2Roos, B., 6.1.1Roppert, J., 2.6.1Rose, A., 7.1.6, 7.1.7Rose, H., 4.3.4Rosier, D. J. de, 4.1Rosner, B., 5.3Ross, A. W., 4.3.3Ross, M., 9.2.2Ross, P. A., 2.3Rossbach, M., 4.4.2Rossi, F. A., 3.4Rossi, J., 7.1.7Rossi, J. P., 7.1.7Rossi, M., 3.1Rossmanith, E., 5.3Rossmann, M. G., 2.2, 3.4, 5.3Rossouw, C. J., 4.3.4Rotella, F. J., 2.5.2, 5.5Rouault, M., 4.3.3Roubeau, A., 2.6.2Roudaut, E., 2.4.2, 7.3Rourke, C. P., 6.3Rouse, K. D., 6.3, 7.4.2Rousseau, M., 5.3Rousseaux, F., 2.2, 4.3.5Roux, M., 4.3.3Rowe, J. M., 4.4.2, 4.4.3Rowlands, P. C., 5.3Roy, S. C., 4.2.4, 4.2.6Rozgonyi, G. A., 7.1.7Rozhanski, V. N., 4.3.8Rozhansky, V. H., 5.3Rozhansky, V. N., 5.3Rubin, H., 2.3Rubinstein, I., 3.5Ruble, J. R., 6.3Ruckpaul, K., 2.6.1Rudakov, L. I., 4.2.1Rudman, R., 3.4Rule, D. W., 4.2.1Rullhausen, P., 4.2.4, 4.2.6Rumpf, A., 2.7Runov, V. V., 4.4.2Ruoff, A. L., 2.5.1Rush, J. J., 8.3Russ, J. C., 7.1.4Russell, D. R., 9.6Russell, T. P., 2.9Rustichelli, F., 2.8, 4.4.2RuÈter, H. D., 5.3Rzotkiewicz, S., 8.7

Sabine, T. M., 6.4Sabino, E., 2.3, 5.2Sadanaga, R., 9.2.2Sadaoui, N., 3.1Sadler, D. M., 2.6.1Sagar, R. P., 4.3.3Sagerman, G., 3.4Sah, R. E., 4.3.4Saito, M., 4.2.3Saitoh, K., 7.2Sakabe, K., 6.3Sakabe, N., 2.2, 4.2.5, 6.3,

7.1.6, 7.1.8Sakai, H., 2.7, 7.1.6, 7.1.7Sakamaki, T., 3.4Sakashita, H., 5.3, 9.2.2Sakata, M., 7.4.2, 8.6

Sakurai, H., 4.2.1Sakurai, K., 4.2.1Salcido, M. M., 7.1.6Saldin, D. K., 4.3.4, 8.8Salemne, F. R., 7.1.6Saloman, E. B., 4.2.3, 4.2.4Salomonson, S., 4.2.2Salva-Ghilarducci, A., 2.6.2Samotoin, N. D., 4.3.5Samsonov, G. V., 9.3Sander, B., 5.3SandstroÈm, A. E., 5.2Sanford, P. W., 7.1.6Sankey, O. F., 4.3.4Sano, H., 4.2.4Santiard, J. C., 2.2, 7.1.6Santilli, V. J., 7.1.6Santoro, A., 6.3Sapirstein, J., 4.2.2Sareen, R. A., 7.1.6Sarikaya, M., 4.3.7Sarma, R., 3.4Sasaki, A., 4.2.3Sasaki, H., 4.3.3SasvaÂri, J., 5.3Sato, F., 2.7, 7.1.6, 7.1.7Sato, M., 3.4Sato, S., 4.2.6Sato-Sorensen, Y., 3.4Satow, Y., 7.1.6, 7.1.8Sauder, W. C., 4.2.2Sauer, H., 4.3.4Sauli, F., 2.2Saunders, M., 4.3.7, 8.8Sauvage, M., 2.7, 2.8Savage, H. F. J., 3.4Savinov, G. A., 7.1.6Savitzky, A., 2.3Sawada, M., 4.2.1, 4.2.3Sawada, T., 4.3.3Sawatsky, G. A., 4.3.4Saxton, W., 4.3.8Saxton, W. O., 4.3.8Sayers, D. E., 4.2.3, 4.3.4Sazaki, T., 4.3.4Sbitnev, V. I., 4.4.2Scarborough, G. A., 3.1Scardi, P., 5.2, 8.6Scaringe, R. P., 9.7Schaefer, W., 7.3Schaerpf, O., 4.4.2SchaÈfer, L., 4.3.3Schalt, W., 4.4.2SchaÈrpf, O., 2.6.2, 4.4.2Schattschneider, P., 4.3.4Schauer, P., 7.2Schaupp, D., 4.2.4, 4.2.6, 7.4.3Schearer, L. D., 4.4.2Schebetov, A. F., 4.4.2Scheckenhofer, H., 2.9Schedler, E., 4.4.2Schedrin, B. M., 2.6.1Scheer, J. W., 7.1.6Scheerer, B., 4.3.4Scheetz, B. E., 2.3Schefer, J., 4.4.2Scheinfein, M., 4.3.4Schellenberger, U., 5.3Schelten, J., 2.6.1, 2.6.2, 4.4.2,

7.3Schenk, M., 5.3

Scheraga, H. A., 9.7Scheringer, C., 6.1.1Scherm, R., 2.8, 4.4.2Scherm, R. H., 4.4.2Scherrer, P., 2.3Scherzer, O., 4.3.8Schetelich, Ch., 5.3Schick, B., 3.1Schieber, M., 7.1.4Schikora, D., 5.3Schildkamp, W., 2.2Schiller, C., 3.4Schindler, D. G., 2.6.2Schink, H.-J., 2.6.2Schirber, J. E., 3.4Schirmer, A., 4.4.2Schiske, P., 4.3.8Schlenker, M., 2.8, 7.3Schlenoff, J. B., 3.4Schlesier, B., 3.1Schmalle, H. W., 9.2.2Schmatz, W., 4.4.2Schmetzer, K., 2.3Schmider, H., 4.3.3Schmidt, H., 5.3Schmidt, K., 2.6.2Schmidt, L., 4.2.1Schmidt, V. V., 4.2.3Schnabel, R. B., 8.1Schnatterly, S. E., 4.3.4Schneider, D. K., 2.6.2Schneider, G., 9.2.2Schneider, J., 3.4, 5.3Schneider, J. R., 2.5.2, 4.1, 7.4.3Schnering, H. G. von, 9.1Schnopper, H. W., 4.2.3Schoenborn, B. P., 2.6.2, 4.4.2,

6.1.3Schomacher, V., 4.3.3Schomaker, V., 4.3.3, 8.3Schoonover, R. M., 5.3Schrauber, H., 2.6.1, 9.2.2Schreiner, W., 2.3, 5.2Schreiner, W. N., 2.3, 5.2Schrey, F., 5.3Schreyer, A., 2.9SchroÈder, B., 4.3.4SchroÈder, W., 2.2, 2.7Schroeder, L. W., 6.3Schubert, P., 3.4Schultz, A. J., 2.5.2, 7.3Schultz, H., 2.3Schulz, H., 3.4, 5.3, 6.1.1, 7.4.2,

9.2.2Schulz, L. G., 2.7Schulze, G. E. R., 3.2, 5.3Schulze, H., 2.6.2Schumacher, M., 4.2.4, 4.2.6,

7.4.3Schurz, J., 2.6.1Schuster, M., 4.2.6Schutt, C. E., 2.2Schwager, P., 3.4, 6.3Schwahn, D., 2.6.2Schwartz, L. S., 2.3Schwartzenberger, D. R., 5.3Schwarz, H. E., 7.1.6Schwarz, W., 9.2.2Schwarzenbach, D., 4.2.2, 5.3,

8.1, 9.3Schweig, A., 4.3.3

Schweizer, J., 4.4.2, 8.7Schwendemann, R. H., 9.5, 9.6Schweppe, J., 4.2.2Schweppe, J. E., 4.2.2Schwinger, J., 4.2.1Schwitz, W., 4.2.2Schwuttke, G. H., 2.7, 5.3Sco®eld, J., 4.2.6Sco®eld, J. H., 4.2.3, 4.2.4Scott, C. P., 7.2Scott, H. G., 8.6Scott, V. D., 4.2.1Scuderi, J., 3.4Sears, V. F., 2.9, 4.2.3, 4.4.2,

4.4.4Seary, A. J., 4.2.3Sebastian, M. T., 9.2.1SeÂbilleau, F., 2.3Secrest, D., 6.3Sedlacek, P., 9.2.2Seebold, R. E., 2.3Seeds, W. E., 2.6.1Seegar, P. A., 4.4.4Seeger, A., 4.4.2Seeger, P. A., 7.1.6Seemann, H., 2.3Segall, R. L., 9.2.2SegmuÈller, A., 2.3, 5.3Seip, H. M., 4.3.3Seip, R., 4.3.3Seka, W., 4.2.1Seki, R., 4.2.2Sekiguchi, A., 7.1.6Sekiguchi, A. A., 7.1.6Self, P. G., 4.3.8Selsmark, B., 2.5.1Semiletov, S. A., 2.4.1Senemaud, C., 4.2.1, 4.2.2Senzaki, K., 4.2.3Serdyuk, I. N., 2.6.2Serebrov, A. P., 4.4.2Serughetti, J., 3.5Servidori, M., 5.3Sette, F., 4.3.4Sevely, J., 4.3.4Sevillano, E., 4.2.3Seyfried, P., 4.2.2, 5.3Seymann, E., 4.4.4Shaham, H., 3.4Sham, L. S., 4.2.6Shankland, K., 4.3.7, 8.6Shannon, C. E., 2.6.1Shapiro, F. L., 4.4.2Shapiro, S. M., 4.4.2Sharov, V. A., 4.4.2Shaw Stewart, P. D., 3.1Shaw, A., 3.1Shechtman, D., 9.8Shekhtman, V. Sh., 5.3Sheldon, J., 3.4Sheldrick, G. M., 5.3Shelud'ko, S. A., 5.3Shenoy, G. K., 4.1Shephard, G. C., 9.1Sherman, I. S., 4.3.4, 7.1.6Sherwood, J. N., 2.7, 2.8Sheu, E. Y., 2.6.1, 2.6.2Shibata, S., 4.3.3Shidara, K., 2.7, 7.1.6, 7.1.7Shields, W. R., 5.3Shiles, E., 4.3.4

AUTHOR INDEX

979


Shimakura, H., 4.2.6Shimambukuro, R. L., 4.2.4,

4.2.6Shindo, D., 4.3.8Shinoda, G., 5.3Shiraiwa, T., 4.2.3Shiraiwa, Y., 4.2.1Shirane, G., 4.4.2, 4.4.3, 6.1.2Shirley, R., 8.6Shishiguchi, S., 2.3, 7.1.3Shmueli, U., 7.5Shmytko, I. M., 4.2.6, 5.3Shoemaker, D. P., 7.5, 8.4Shoji, T., 2.3Shore, J. E., 8.2Shortley, G. H., 8.7Shrier, A., 5.3Shubnikov, A. V., 9.1Shulakov, E. V., 4.2.6, 5.3Shull, C. G., 2.8, 6.1.2, 6.1.3Shulman, R. G., 4.2.3Shulman, S., 2.6.1Shuman, H., 4.3.4Shuvalov, B. N., 7.1.6Shvarts, D., 4.2.1Shvyd'ko, Yu. V., 5.3Sica, F., 3.1Siddons, D. P., 2.3, 2.7, 4.2.6Siddons, P., 4.2.6Sidorenko, O. V., 4.3.5, 9.2.2Sidorov, V. A., 7.1.6Sieber, J., 8.6Siegbahn, M., 4.2.1Siegbahn, P., 6.1.1Siegel, R. W., 4.1Siegert, H., 4.2.2, 5.3Siegmund, O. H. W., 7.1.6Siegmund, W., 4.2.5Siemensmeyer, K., 4.4.2Sievers, R., 9.4, 9.5, 9.6Silcox, J., 4.3.4Sillers, I.-Y., 2.6.2Sillou, D., 2.8Silzer, R. M., 4.2.1Simmons, R. O., 5.3Simms, R. A., 7.1.6Simon, J. P., 2.6.2Simons, A. L., 4.2.3Simpson, J. A., 4.3.4Simpson, K., 2.6.2Simpson, W. T., 6.1.1Sinclair, H. B., 5.2Sinfelt, J. H., 4.2.3Singh, G., 9.2.1Singh, K., 5.3Singh, S. R., 9.2.1Sinha, S. K., 2.9Sinogowitz, U., 9.1Sirianni, A. F., 2.3Sironi, A., 8.6Sirota, E. B., 2.9Sirota, M. I., 2.4.1Sivia, D. S., 8.6Skalicky, P., 7.4.2Skellam, J. G., 7.5Skilling, J., 8.2Skopik, D. M., 4.2.1Skowronek, M., 7.1.6Skupov, V. D., 5.3Skuratowski, I. Ya., 4.2.1Slack, G. A., 9.1

Slade, J. J., 5.3Slade, J. J. Jr, 5.3Slater, J. C., 7.4.3Sleight, A. W., 2.3Sleight, J., 4.2.1Slingsby, S., 3.4SÏ ljukicÂ, M., 5.3Sloane, N. J. A., 9.1Sluis, P. van der, 3.1Smaalen, S. van, 9.2.2, 9.8Smakula, A., 5.3Smend, F., 4.2.4, 4.2.6, 7.4.3Smirnov, V. V., 4.3.8Smirnova, N. L., 9.1Smith, A. J., 9.7Smith, D., 4.3.3Smith, D. G. W., 2.3Smith, D. J., 3.5, 4.3.7, 4.3.8Smith, D. K., 2.3, 9.2.2Smith, D. T., 3.4Smith, D. Y., 4.2.6, 4.3.4Smith, G., 5.3, 7.1.6Smith, G. F. H., 9.8Smith, G. S., 2.3, 2.9Smith, H., 8.1, 8.4Smith, J. M., 9.7Smith, J. V., 9.2.2Smith, S. T., 2.3Smith, S. Y., 4.3.4Smith, T. B., 4.4.2Smith, V. H., 4.3.3Smith, V. H. Jr, 4.3.3, 6.1.1Smits, D. W., 5.2Snavely, M. K., 4.1Snell, E., 2.2Snigirev, A., 4.2.5Snigireva, I., 4.2.5Snyder, D., 4.2.1Snyder, R. L., 2.3Soares, D. A. W., 5.3Soboleva, S. V., 4.3.5, 9.2.2SoÈchtig, J., 4.4.2Soejima, Y., 3.4, 5.3Sofer, A., 8.1Soff, G., 4.2.2Soller, W., 2.3, 5.2Somiya, S., 2.3Somlyo, A. P., 4.3.4Sommers, H. S., 4.4.2Sonada, M., 7.1.6Sonneveld, E. J., 2.3, 5.2Sonoda, M., 7.1.8Sorenson, D., 8.1Sorenson, L. B., 4.2.3Sorenson, L. O., 4.2.6Soriano, T. M. B., 3.1Sorokin, N. D., 9.2.2Soures, J. M., 4.2.1Sowa, H., 9.1Spackman, M. A., 8.7Spangfort, M. D., 3.1Spargo, A. E. C., 4.3.7, 4.3.8Sparks, C. J., 5.2, 7.4.3Sparks, R. A., 2.3, 3.4Sparrow, T. G., 4.3.4Spear, W. E., 4.2.1Spehr, R., 4.3.4Speier, W., 4.3.4Spence, A. J., 4.3.8Spence, J. C. H., 4.3.4, 4.3.7,

4.3.8, 8.8

Spencer, R. C., 5.2Spiegelman, C. H., 8.4, 8.5Spielberg, N., 2.3, 5.2, 7.5Spooner, F. J., 5.3Springer, T., 2.6.2, 4.4.2Sprong, G. J. M., 5.2Squire, G. D., 3.4Srinivasan, K., 2.5.2SteÎpienÂ, J. A., 5.3SteÎpienÂ-Damm, J., 5.3SteÎpienÂ-Damm, J. A., 5.3Stalick, J. K., 2.3, 2.4.1, 5.1, 5.2Stalke, D., 3.4Stanglmeier, F., 4.2.6Stanley, H. B., 2.9Stanton, M., 7.1.6Stasiecki, P., 2.6.1Statile, J. L., 7.1.7Staub, U., 4.4.2Stearns, D. G., 4.2.6Stedman, R., 4.4.3Steeds, J. W., 4.3.6.2, 4.3.7,

5.4.2, 8.8Steeple, H., 2.3Stegun, I. A., 6.1.1, 6.3, 7.5Steichele, E., 2.5.2, 4.4.2Steigemann, W., 3.4Steinberger, I. T., 9.2.1Steinberger, J., 4.4.2Steiner, M., 4.4.2Steiner, W., 7.4.2Steinhauser, K. A., 2.9Steinmeyer, P. A., 2.3Steinsvoll, O., 4.4.2, 4.4.3Stemple, N. R., 4.2.6Stephens, M. A., 6.1.1Stephens, P. W., 4.2.5, 8.6Stephenson, S. T., 4.2.1Stern, E. A., 4.2.1, 4.2.3, 4.3.4Stern, R. A., 7.1.6Steryl, A., 2.9Stetsko, Yu. P., 5.3Steurer, W., 9.8Stevels, A. L. N., 2.7Stevens, E. D., 7.4.2, 8.7Stevenson, A. W., 7.4.2Stevenson, M. L., 4.2.3Stewart, G. W., 8.1Stewart, R. F., 4.3.3, 6.1.1, 8.7Stibius-Jensen, M., 4.2.3, 4.2.6Stiefel, E., 8.3Stipcich, S., 4.2.3Stirling, W. G., 4.4.2Stobbs, W. M., 4.3.8Stock, A. M., 3.4Stock, S. R., 4.2.3Stohr, J., 4.2.3, 4.3.4Stùlevik, V., 4.3.3Storm, A. R., 4.2.3Storm, E., 4.2.4, 4.2.6Stott, A. M. B.,Stout, C. D., 3.1Stout, G. H., 2.2, 3.1, 3.4, 5.3Stout, J. H., 9.2.2Strack, R., 4.2.5Stragier, H., 4.2.3Stratonovich, R. L., 6.1.1Straumanis, M., 5.3Straumanis, M. E., 2.3, 5.3Strauss, M. G., 4.3.4, 7.1.6, 7.3Strauss, S., 7.4.3

Strinskii, A. N., 4.2.1Strobel, P., 3.1Stroud, A. H., 6.3Stuart, A., 3.1, 3.3, 6.1.1Stuart, D., 6.3Stuart, D. I., 3.4Stubbings, S. J., 3.4Stuckey Kauffman, D., 5.3Stuesser, N., 4.4.2Stuhrmann, H., 4.2.1Stuhrmann, H. B., 2.6.1, 2.6.2StuÈmpel, J., 4.2.2StuÈmpel, J. W., 7.1.6Stura, E. A., 3.1Sturhahn, W., 5.3Sturkey, L., 2.4.1Sturm, K., 4.3.4Sturm, M., 4.2.6Su, L. S., 4.3.3Su, Z., 8.7Suck, D., 3.4Sudol, J., 7.3Suehiro, S., 7.1.6Sueno, S., 3.4Suh, I.-H., 3.4Suh, J.-M., 3.4Sukharev, Y., 4.3.7Suller, V. P., 4.2.1Sullivan, J. D., 3.2Sumner, I., 7.1.6Suortti, P., 2.3, 4.2.1, 4.2.4,

4.2.6, 7.4.2, 7.4.4, 8.6Surin, B. P., 3.1Surkau, R., 4.4.2Suski, T., 3.4, 5.3Sussieck-Fornefeld, C., 2.3Sussini, J., 4.2.5Sutter, J., 5.3Sutton, L. E., 9.5, 9.6Suzuki, M., 9.2.2Suzuki, S., 2.7Suzuki, T., 4.3.8Suzuki, Y., 7.1.6Svensson, C., 5.3Svensson, L. A., 3.1Svergun, D. I., 2.6.1Swann, P. R., 3.5, 4.3.4Swanson, D. K., 3.4Swanson, H. E., 5.2, 5.3Swanton, D. J., 8.7Swapp, S. M., 3.4Sweet, R. M., 3.1, 7.1.6Swoboda, M., 4.3.7Swyt, C. R., 4.3.4Sygusch, J., 8.3Syromyatnikov, F. V., 3.2SzaboÂ, P., 7.5Szarras, S., 2.5.1Szmid, Z., 2.5.1, 5.3SzymanÂski, J. T., 9.2.2

Tabbernor, M. A., 4.3.1, 4.3.2,4.3.7, 6.1.1, 8.8

Taft, E. A., 4.3.4Taftù, J., 4.3.4, 4.3.7, 8.8Tairov, Yu. M., 9.2.2Takahashi, H., 4.3.7Takahashi, K., 7.1.6, 7.1.8Takahata, T., 9.2.2Takama, T., 4.2.6Takano, M., 7.1.6, 7.1.8

AUTHOR INDEX

980


Takano, Y., 5.3Takayanagi, K., 4.3.8Takeda, H., 9.2.2Takeda, T., 4.2.3, 4.4.2TakeÂuchi, Y., 9.2.2Tanaka, H., 7.1.8Tanaka, M., 4.2.2, 4.3.7, 7.1.6,

8.8Tanaka, N., 3.4Tanaka, T. J., 4.2.4, 4.2.6Tanemura, M., 9.1Tanimoto, M., 7.1.6Tanioka, K., 7.1.6Tanisaki, S., 9.8Tanner, B. K., 2.7, 4.1, 5.3Tanoue, H., 4.2.3Tao, K., 2.3Taran, Yu. V., 4.4.2Tardieu, A., 2.6.2Tarling, S. E., 3.4Tasset, F., 4.4.2Tate, M. W., 2.7Taub, H., 7.3Taupin, D., 2.3Tavard, C., 4.3.3Taxer, K., 9.2.2Taylor, A., 2.3, 4.2.1, 5.2, 9.2.1Taylor, B. N., 4.2.1, 4.2.2,

4.2.3, 5.3Taylor, H. F. W., 9.2.2Taylor, J., 2.3, 5.2Taylor, J. C., 8.6Taylor, P. R., 6.1.1Taylor, R., 9.5, 9.6Tazzari, S., 4.2.1, 4.2.6Tchoubar, C., 4.3.5Tchoubar, D., 4.3.5Teatum, E. T., 9.3Teeter, M. M., 3.4Teller, E., 9.2.1Teller, R. G., 2.5.2Tello, M. J., 9.8Templer, R. H., 7.1.6Templeton, D. H., 4.2.3, 4.2.6,

6.3Templeton, L. K., 4.2.3, 4.2.6,

6.3Tence, M., 4.3.4Teng, T. Y., 3.4Tennevin, J., 2.7Teo, B. K., 4.2.3, 4.3.4Terada, N., 4.2.3Terasaki, D., 5.2Terasaki, O., 2.5.1, 4.3.7, 5.2Terhell, J. C. J. M., 9.2.1Terminasov, Yu. S., 5.3Termonia, Y., 2.3Teuchert, W., 4.4.2Thakkar, A. J., 4.3.3, 6.1.1Thaller, C., 3.1Thatcher, D. R., 3.1Theisen, R., 4.2.4Theobald-Dietrich, A., 3.1Thiel, D. J., 4.2.5Thierry, J. C., 3.4Thiessen, M. J., 3.1Thinh, T. P., 4.2.4Thole, B. T., 4.3.4Thomas, D. J., 7.1.6Thomas, G., 3.5, 5.4.2, 7.1.6Thomas, J. M., 4.3.4

Thomas, J. O., 8.6Thomas, L. H., 4.2.6, 7.4.3, 8.7Thomas, P., 7.3Thomas, R. K., 2.9Thomlinson, W., 2.3, 7.4.4, 8.6Thompson, A. B., 9.2.2Thompson, A. W., 2.2, 3.4Thompson, D. J., 4.2.1Thompson, J. B, 9.2.2Thompson, P., 2.3Thompson, T. E., 3.2Thomsen, J. S., 4.2.2, 5.2, 5.3,

7.5Thuesen, G., 4.2.3, 4.2.6Thut, R., 4.4.2Tiao, G. C., 8.1, 8.2Tibballs, J. E., 6.3Tighe, N. J., 3.5Tikhonov, A. N., 2.6.1Tikhonov, V. I., 6.1.1Tilton, R. F., 3.4Tilton, R. F. Jr, 3.4Timasheff, S. N., 2.2, 2.6.1Timchenko, T. I., 9.2.2Timmers, J., 5.2Timmins, P. A., 2.6.2Tindle, G. L., 4.4.3Tipson, R. S., 3.1Tissen, J. T. W. M., 3.1Tivol, W. F., 4.3.8Tixier, R., 5.3Toby, B. H., 2.3Tode, G. E., 3.4Toellner, T. S., 5.3To®eld, B. C., 8.7Tohji, K., 4.2.1Tokonami, M., 9.2.1, 9.2.2Tokumaru, Y., 5.1Tokumoto, M., 4.2.3Tolhoek, H. A., 7.4.3Toman, K., 5.2Tomaszewski, P. E., 5.3, 9.2.2Tomimitsu, H., 2.8Tomita, T., 9.2.1Tomkeieff, M. V., 5.3Tomlin, S. G., 4.2.1Tomokiyo, Y., 4.3.7, 8.8Tomonaga, N., 5.3Tonomura, A., 4.3.8Toorn, P. van, 7.2Toraya, H., 2.3, 5.2Tossel, J. A., 4.3.4Tournarie, M., 2.3Town, W. G., 9.5, 9.6Toyoshima, N., 3.4Trail, J., 4.2.1Trammell, G. T., 6.1.2Trautmann, N., 4.4.2Travennier, M., 5.2Travis, D. J., 7.1.6Treacy, M. M. J., 4.3.8, 9.1Trebbia, P., 4.3.4Tremayne, M., 8.6Treverton, J. A., 3.5Trewhella, J., 2.6.1Trigunayat, G. C., 5.3, 9.2.1Tripathi, A. N., 4.3.3Troitsky, V. I., 2.9Trost, A., 2.3Trueblood, K. N., 2.2, 8.3Trzhaskovskaya, M. B., 4.2.4

Tse, T., 4.2.5Tseng, H. K., 7.4.3Tsernoglou, D., 3.4Tsu, Y., 4.2.3Tsuda, K., 4.3.7, 8.8Tsuji, M., 4.3.8Tsukimura, K., 3.4Tsuno, K., 4.3.8Tsutsumi, K., 4.2.3Tsvetkov, V. F., 9.2.2Tsypursky, S. I., 2.4.1Tu, H. Y., 3.1Tubbenhauer, G. A., 7.1.6Tucker, P., 8.2Tucker, T. N., 5.3Tugulea, M. N., 7.4.3Tuinstra, F., 3.4, 5.2, 9.8Tukey, J. W., 8.2Tulkki, J., 7.4.3Tung, M., 3.1Tuomi, T., 2.7Turber®eld, K. C., 2.5.2Turchin, V. F., 4.4.2Turkenburg, J. P., 3.4Turner, J. N., 4.3.8Turner, P. S., 2.4.1, 4.2.4, 4.3.1,

4.3.2, 6.1.1Tutton, A. E., 3.2Tuzov, L. V., 5.3Tzafaras, N., 3.4

Uchiyama, K., 7.1.6Udagawa, Y., 4.2.1, 4.2.3Uehling, E. A., 4.2.2Ueno, Y., 7.1.8Ugarte, D., 4.3.4Ullrich, H.-J., 5.3Ullrich, J. B., 4.4.2Umanskii, M. M., 7.5Umanskij, M. M., 5.2Umansky, M. M., 5.3Umeno, M., 5.3Umezawa, K., 4.2.6Unangst, D., 5.3Uno, R., 2.5.1Unonius, L., 2.3, 8.6Unwin, P. N. T., 4.3.7, 4.3.8Urbanowicz, E., 5.3Ursell, H. D., 6.1.1Usami, K., 7.1.6Usha, R., 3.4Uspeckaya, G. I., 5.3Usuda, K., 5.3Utlaut, M., 4.3.4Uyeda, N., 4.3.8Uyeda, R., 2.7, 4.3.7, 5.4.2, 8.8

Vacquier, V. D., 3.1Vainshtein, B. K., 2.2, 2.4.1,

4.3.5Vajda, I., 2.3Valentine, R. C., 7.2Valvoda, V., 4.1Van Bommel, A. J., 4.2.6Van Dyck, D., 4.3.8Van Landuyt, J., 4.3.8Van Mellaert, L., 2.7Vanoni, F., 4.4.2Vansteelandt, L., 4.4.2Van Tendeloo, G., 4.3.8, 9.2.1,

9.2.2

Varghese, J. N., 4.2.5Varnum, C. M., 4.4.2Vaughan, D. J., 4.3.4Veeraraghavan, V. G., 2.3Veigele, W. J., 4.2.4, 4.2.6,

7.4.3Veillard, A., 6.1.1Venghaus, H., 4.3.4Vercillo, R., 7.1.6Vergamini, P. J., 3.4Verheijen, M. A., 9.2.2Verin, I. A., 3.1Verma, A. J., 9.2.2Verma, A. R., 9.2.1Vernon, W., 2.2, 7.1.6Vettier, C., 4.2.5Veysseyre, R., 9.8Via, G. H., 4.2.3Victoreen, J. A., 4.2.4Villain, F., 4.2.3Villain, J., 9.8Villars, P., 9.3Vincent, M. G., 6.3Vincent, R., 4.3.7, 8.8Vincze, L., 4.2.5Vineyard, G. H., 2.3Visser, J. W., 2.3, 5.2, 9.8Viswamitra, M. A., 9.7Vittone, E., 4.2.2Vittot, M., 7.1.6Vogels, A. B. P., 2.3Vogt, T., 4.4.2Voigt, W., 7.4.2Voigt-Martin, I. G., 4.3.7Vollath, D., 4.2.4Volz, K., 2.2Von Dreele, R. B., 6.4, 8.6Von Festenberg, C., 4.3.4Voronin, L. A., 2.6.1Vos, A., 7.4.2Voss, R., 4.3.7, 4.3.8Vossers, H., 3.4Vriend, G., 3.4Vrublevskaya, Z. V., 4.3.5, 9.2.2Vucht, J. H. N. van, 9.3Vvedensky, D. D., 4.3.4

Waarzak, I., 3.1Waber, J. T., 4.2.4, 4.2.6, 4.3.1,

6.1.1, 9.3WacheÂ, C., 5.3Wachtel, E., 2.6.2Wada, N., 4.2.3Waddington, W. G., 4.3.8Wade, R. H., 4.3.8Wagenfeld, H., 4.2.6, 6.3Wagner, C. N. J., 2.3Wagner, R., 2.6.2Wagner, V., 4.4.2Wagshul, M. E., 4.4.2Wait, E., 3.4Wakabayashi, K., 7.1.8Wakita, H., 4.2.3Walder, V., 5.3Walker, A. R., 5.4.2Walker, G. A., 2.3Walker, N., 6.3Wall, J., 4.3.8Wall, M. E., 2.7Wallace, C. A., 2.7, 5.3Waller, I., 4.2.6, 7.4.3

AUTHOR INDEX

981


Walls, M. G., 4.3.4Walter, G., 2.6.1Walters, K., 4.4.2Walton, D., 7.1.6Wang, D. N., 4.3.7Wang, J., 4.3.3Wang, M. S., 4.2.6Wang, S. Q., 8.8Warble, C. E., 4.3.8Warburton, W. K., 4.2.3, 7.1.5Ward, K. B., 3.1Ward, R. C., 7.4.2Ward, R. C. C., 2.7Ware, N. G., 2.3Warren, B. E., 2.3, 4.2.5, 4.3.5Warrington, D. H., 1.3Waschkowski, W., 4.4.4Waser, J., 6.2, 8.3Washburn, J., 3.5WasÂkowska, A., 5.3Wassermann, G., 2.3Watanabe, D., 4.3.7, 8.8Watanabe, H., 4.3.7, 8.8Watanabe, T., 4.2.3, 6.1.1Watenpaugh, K. D., 3.4Watkin, D. J., 2.3Watson, D. G., 9.5, 9.6, 9.7Watson, D. L., 2.7Watson, K. J., 6.1.1Watson, L. M., 4.2.2Weaver, L. H., 3.1Weaver, W., 2.6.1Weber, H., 7.4.2Weber, H.-P., 2.3Weber, K., 6.3Weber, P. C., 3.1Weber, W., 4.2.6Weckerman, B., 4.4.2Weertman, J., 9.2.1Weertman, J. R., 9.2.1Wehenkel, C., 4.3.4Weibel, E., 4.3.8Weickenmeier, A., 4.3.2Weickenmeier, A. L., 4.3.7, 8.8Weigel, D., 9.8Weik, H., 5.3Weill, F., 9.2.2Weill, G., 2.5.1Weininger, M. S., 3.4Weinstock, B., 4.3.3Weisenberger, P., 4.2.3Weisgerber, S., 2.2Weiss, R. J., 6.3, 7.4.3Weiss, Z., 9.2.2Weissenberg, K., 2.2Weissmann, S., 5.3Weisz, O., 5.3Welberry, T. R., 3.4Wellenstein, H., 4.3.3Wells, A. A., 7.1.6Wells, A. F., 9.1, 9.2.1Wells, M., 4.4.5Welsch, R. E., 8.1, 8.2, 8.5Welsh, R. C. J., 4.4.2Weng, X. D., 4.3.4Wenk, H. R., 4.3.8Wennemer, M., 9.2.2Wenskus, R., 7.4.3Wenzl, H., 5.3Werner, K., 4.4.2Werner, P. E., 2.3, 8.6

Werner, S., 2.8Werner, S. A., 4.4.3, 4.4.4, 6.2,

6.4, 7.5Wertheim, G., 2.3Wery, J. P., 3.4West, D. R. F., 3.5West, J. M., 3.5West, K., 2.3Westbrook, E. M., 3.2, 7.1.6Westbrook, M. L., 7.1.6Whaling, W., 7.3Whatmore, R. W., 2.7Whelan, M. J., 3.5, 4.3.2,

4.3.6.2, 4.3.8, 5.4.1White, E. T., 3.2White, T. J., 9.2.2Whit®eld, H., 4.3.7Whitney, D. R., 5.2, 5.3Whittaker, E. J. W., 7.1.1Whittemore, W. L., 4.4.2Wichmann, E. H., 4.2.2Wick, G. C., 4.4.2Wicks, B. J., 3.5Widom, J., 7.1.6Wiedmann, L., 4.2.1Wiegand, C. E., 4.2.2Wien, W., 4.3.4Wiesler, D. G., 2.9WiewioÂra, A., 9.2.2Wiewiorosky, J., 2.3Wignall, G. D., 2.6.2Wikinson, A. P., 8.6Wiles, D. B., 2.3, 8.6Wiley, D. C., 7.1.6Wilhelm, T., 7.1.6Wilkens, M., 5.2Wilker, C. N., 4.3.4Wilkins, J. W., 4.3.4Wilkins, M. H. F., 2.6.1Wilkins, S. W., 4.2.5, 6.1.1, 6.4Wilkinson, A. P., 2.3Wilkinson, C., 2.2Wilkinson, D. H., 7.1.6Wilkinson, M. K., 9.8Will, G., 2.3, 5.2, 5.3, 7.3, 8.6Wille, H.-C., 5.3Wille, P., 4.4.2Williams W. G., 4.4.2Williams, B. G., 4.3.4, 7.4.3Williams, D. B., 4.3.8Williams, D. E. G., 9.7Williams, E. J., 7.5, 8.4Williams, G. P., 7.4.4Williams, J. C., 3.5Williams, J. M., 2.5.2Williams, R., 3.4Williams, W. G., 4.4.2Williamson, G. K., 3.5Willis, B. T. M., 2.2, 2.3, 2.5.2,

3.6, 4.4.6, 5.3, 5.5, 6.1.1,6.1.3, 6.2, 7.4.2, 8.6, 8.7

Willoughby, A. F. W., 5.3Willson, P. D., 2.3Wilson, A. J. C., 1.4, 2.3, 2.4.2,

2.5.1, 3.3, 4.2.2, 4.3.5, 5.1,5.2, 5.3, 6.3, 6.4, 7.5, 8.1,8.2, 9.2.1, 9.2.2, 9.7

Wilson, A. R., 4.3.8Wilson, C. G., 5.3Wilson, E., 3.1Wilson, H. R., 2.6.1

Wilson, K., 7.5Wilson, R. J. F., 7.1.6Wilson, R. R., 4.2.1Wilson, S. A., 2.8Winchell, P. G., 2.3Windisch, D., 5.3Windsor, C. G., 2.5.2, 4.1,

4.4.6, 7.3, 8.6Winick, H., 4.2.1, 4.2.3Winick, M., 7.4.3Winkler, F. K., 2.2Winslow, E. H., 4.2.4Wippler, C., 2.6.2Witters, R., 2.6.1Wittmann, H. G., 3.4Wittmann, J. C., 3.5Wittono, G., 4.2.6Witz, J., 2.2, 2.6.2Wlodawer, A., 2.2, 6.3Woicik, J. C., 4.2.3Wokulska, K., 4.2.2, 5.3Woøcyrz, M., 5.3Wolf, B. de, 2.6.2Wolf, J., 4.2.2, 5.3Wolf, R. S., 7.3WoÈlfel, E. R., 2.3, 5.3, 7.1.3,

7.1.6Wolff, P. M. de, 1.4, 2.3, 7.1.1,

9.2.2, 9.8Wollan, E. O., 9.8Wolpert, R. L., 8.1Wolstenholme, J. F. R., 5.2Wonacott, A. J., 2.2, 3.4, 7.1.6Wondratschek, H., 1.4, 9.8Wones, D. R., 9.2.2Wong, T. C., 4.3.3Wong-Ng, W., 3.4, 5.2Wood, G. J., 4.3.8Wood, I. G., 3.4Wood, R. A., 3.4Woodruff, D. P., 4.2.3Woodward, J. B., 4.2.6Woolfson, M. M., 2.2, 5.3Wooster, W. A., 2.2, 5.3, 7.4.2Worcester, D. L., 2.6.1Worgan, J. S., 7.1.5Worlton, T. G., 2.5.2Worthmann, W., 2.6.1,

2.6.2Wright, A. F., 3.4, 4.4.2Wright, D. J., 2.6.1Wright, E. M., 7.5Wright, M. M., 8.3Wroblewski, T., 3.4Wroe, H., 4.4.2Wu, C. C., 2.7Wu, D. Q., 7.1.6Wu, Y., 5.2Wu, Y.-Q., 4.2.1Wulff, P., 3.2Wunderlich, J. A., 3.2Wurmbach, P., 2.6.2Wyckoff, H. W., 2.2, 3.4

Xiao, Q. F., 4.4.2Xie, J., 7.1.6Xie, S.-D., 4.3.3Xuong, Ng. H., 2.2, 3.4, 7.1.6

Yaakobi, B., 4.2.1Yabuki, S., 2.6.2

Yagi, K., 4.3.8Yakovlev, V. A., 7.1.6Yakowitz, H., 5.3Yamada, N., 5.3Yamada, S., 2.9Yamagishi, H., 4.3.7Yamaguchi, M., 2.7, 7.1.6Yamaguchi, T., 4.2.3Yamamoto, A., 9.8Yamamoto, M., 3.4Yamanaka, T., 9.2.2Yamashita, T., 7.1.7Yamazaki, H., 3.4Yan, D. H., 4.3.7Yano, Y., 7.1.6Yao, T., 4.2.1, 4.2.3Yap, F. Y., 4.2.2, 5.2, 7.5Yap, Y., 5.3Yasuami, S., 5.3Yates, A. C., 4.3.3Yeates, T. O., 3.1Yeh, J. J., 4.2.4Yin, Y., 3.1Yocum, C. F., 4.2.3Yoder, H. S., 9.2.2Yonath, A., 3.4York, E. J., 6.3Yoshida, N., 4.2.3Yoshimatsu, M., 2.3, 4.2.1Yoshimura, M., 2.3Yoshioka, H., 8.8Yoshioka, Y., 7.1.6Young, A. C. M., 3.4Young, H. D., 4.4.4Young, R. A., 2.3, 4.2.5, 5.2,

6.3, 8.6Yvon, K., 2.3

Zaanen, J., 4.3.4Zabel, H., 2.9Zabidarov, E. I., 4.4.2Zaccai, G., 2.6.2Zach, J., 4.3.8Zachariasen, W. H., 4.2.6, 4.4.2,

6.3, 6.4Zagari, A., 3.1Zagofsky, A., 2.3Zahorowski, W., 5.3Zakharov, N. D., 4.3.8Zaloga, G., 3.4Zaluzec, N. J., 4.3.4, 8.8Zanchi, G., 4.3.4Zanevskii, Yu. V., 7.1.6Zani, A., 5.3Zarka, A., 2.8Zassenhaus, H., 1.4, 9.8Zeedijk, H. B., 3.5Zeidler, T., 2.9Zeisler, R., 4.4.2Zeissler, C. J., 4.4.2Zeitler, E., 3.5, 4.3.4, 7.2Zemany, P. D., 4.2.4Zemlin, F., 3.5Zeppenfeld, K., 4.3.4Zeppezauer, E. S., 3.4Zeppezauer, M., 3.4Zerby, C. D., 4.2.6Zernicke, F., 2.6.1Zevin, L. S., 5.2, 5.3, 7.5Zeyen, C. M. E., 4.4.2Zha, C. S., 2.5.1

AUTHOR INDEX

982


Zhang, X.-J., 3.4Zhang, Y., 2.3, 5.2Zhao, Z. X., 4.3.8Zhdanov, G. S., 4.1, 9.2.1Zhou, X.-L., 2.9Zhoukhlistov, A. P., 9.2.2Zhu, J., 4.3.4Zhukhlistov, A. P., 4.3.5,

9.2.2Zimmermann, J., 4.2.1

Zimmermann, S., 4.3.4Zinke, M., 2.6.1Zipper, P., 2.6.1Zirwer, D., 2.6.1Zittlau, W., 4.3.3Zobel, D., 3.4Zobetz, E., 9.1Zocco, T. G., 2.9Zolensky, M. E., 2.3Zolliker, P., 5.5

Zolotoyabko, E., 5.3Zoltai, T., 9.2.2Zorkaya, O. N., 9.7Zorkii, P. M., 9.2.2Zorky, P. M., 9.7Zosi, G., 4.2.2, 5.3Zou, X. D., 4.3.7Zsoldos, EÃ ., 5.3Zubenko, V. V., 5.3Zucchino, P., 7.1.6

Zucker, U. H., 6.1.1ZunÄiga, F. J., 9.8Zuo, J., 8.8Zuo, J. M., 4.3.7, 4.3.8, 5.4.1,

8.8ZuÊra, J., 5.3Zurek, S., 3.4Zvyagin, B. B., 3.5, 4.3.5,

9.2.2Zwoll, K., 5.3

AUTHOR INDEX

983


Subject Index

Abbe refractometer, 160Abbe theory, 420Abelian module, 937Aberrations (see also Systematic errors)

centroid displacements, 494coefficients, 426geometrical, 46, 83, 86, 493in powder diffractometry, 46, 48, 50line-profile breadths, 494of an energy-dispersive diffractometer, 497physical, 46, 85, 86, 493, 494refraction, 492transparency, 49

Absolute calibration of SANS data, 108Absolute intensity in SANS, 108Absolute measurements, 505

of lattice spacings, 505, 526, 529±533Absorbed dose, definition of, 958Absorption, 599, 609, 653

air, 73anomalous, 416coefficients, 213, 218coefficients for Bloch waves, 735coefficients for neutrons, 461coefficients, linear, 599coefficients, mass, 600cross sections, macroscopic, 461edges, 191, 202, 205, 206, 209, 599edges, wavelengths of, 205±211effects, 261efficiency, 623factor, 51function, 261in XED, 86length, 188minimization by suitable mounting of single

crystals, 163of generated X-rays in target, 191photoelectric, 599systematic error, 528systematic error, elimination, 521±524,

528±529X-ray, 599±608

Absorption corrections, 170, 600±608neutron diffraction, 177

Accelerating voltagefluctuations, 424of a transmission electron microscope,

determination, 539Accessible range of d's, 38Accuracy, 490, 492, 707

factors determining, 501Accuracy of lattice-parameter (lattice-spacing)

determination, 505, 507, 526, 533±536evaluation, 534(methods of) increasing, 532±536relative, 505

Acoustic modes, 653, 654Activity, definition of, 958Adequate protection, definition of, 958Adhesives for mounting specimens, 163Aggregation effects in SANS, 107Air absorption, 73Air and window transmission, 73Air scattering, 74, 665ALCHEMI (atom location by channelling

enhanced microanalysis), 411Alignment and angular calibration, 46

Aluminiumdielectric coefficients, 402effective number density, 411film, 393

Ambiguities in modulated structure notation,936

Amorphous material, diffraction from, 24Analyser, 530

perfect-crystal, 665Analysis of charge density, 713±734Analysis of spin density, 713±734Analytical extrapolation of lattice

parameters, 493Anatase, high-energy resolution spectra, 408Anger camera for neutrons, 650Angle definition, use of peak or centroid for,

63Angle-dispersive diffractometry, 491,

495±496Angle-reading error, 524Angle-setting error, 524Angles between crystal blocks, determination,

516Angles in direct and reciprocal space, 4Angles of reciprocal cell, determination, 517Angular distribution of reflections in Laue

diffraction, 29Angular momentum, 727

orbital, 731Angular setting errors (precession), 35Angular-velocity factors, 596Anharmonicity, 585, 722Anisotropic mosaic crystals, 432Anisotropic temperature factors, 697Anisotropic thermal diffuse scattering

correction, 654Anode current/voltage relationship in

electrochemical thinning, 175Anomalous absorption, 416Anomalous dispersion (scattering) (see also

Dispersion), 21, 188, 241, 733not anomalous, 241

Anomalous transmission, 116Anti-equi-inclination setting, 31Antiferromagnetic order, 728Antiferromagnetism, 140Antiferromagnets, 728Antimorphism, 897Antiscatter slits, 45Aperiodic lattice, 921, 928, 937Approximations

Born, 591Born±Oppenheimer, 713, 722, 723commensurate, 909convolution, 723crystal-field, 729dipolar, 731first Born, 389Glauber, 391harmonic, 723Hartree±Fock, 732impulse, 657kinematical, 260LCAO, 723Moliere high-energy, 260no-upper-layer-line, 415phase-grating, 260projected charge-density, 423

Approximationsquasi-Gaussian, 590two-beam, 260weak-phase-object, 423

Archimedes method for density measurement,158

Area-detector diffractometry, 36, 170Area detectors,

geometric effects, 41non-uniformity of response, 41television, 630

Arithmetic crystal classes, 15, 897, 898, 911,917, 939, 945

(3+1)-dimensional, 917as classification of space groups, 15classification by size, 20derivation of, 15four-dimensional, 15notation for, 15one-dimensional, 15, 16three-dimensional, 15±20two-dimensional, 15, 16uses of, 15

Arithmetic equivalence, 911, 939Arithmetic point groups, 914Arithmetically equivalent point groups, 939Arrangements giving partial reduction of

systematic errors, 515, 514, 521±523,526, 528±531

Associated Legendre polynomials, 581Astigmatism, 421, 424Asymmetric Bragg reflections, 526Asymmetric (Straumanis) film mounting, 509Asymmetry

factor, 118of peaks, 67

Asymptotic behaviour of SANS curves, 110Atom-centred expansion, 729Atom-centred models, 714Atom-centred spherical harmonic

approximation, 714Atom location by channelling enhanced

microanalysis (ALCHEMI), 411Atomic beams, 189Atomic dipole moment, 716Atomic environment types, 776Atomic form factor, 242Atomic orbital basis, 722Atomic quadrupole moment, 717Atomic scattering factors, 188, 242, 259

analytical approximation for (tables), 578±581

for electrons (tables), 263±281free atoms (tables), 555±564generalized, 565ions (tables), 566±577

Atomic volumes, 774Attenuation coefficients, 213, 230, 600Auger shifts, 204, 205Automation, computer-controlled, 63Avalanche multiplication, 619, 634Avalanche production, 626Average structure, 913Avogadro constant, determination of, 534Axial divergence, 46, 50, 53, 494, 497Axial-divergence error, 494, 523

correction for, 523Axial holography, 427

SUBJECT INDEX

c:\itfc\sindex.3d

984

Axial lengths, determination of, 532Axial reflections, 517

Back reflection, 512±515Backgammon ( jeu de jacquet) counter, 627Background, 68, 661

in SANS, 108, 109Background counting rates, 667Background radiation, definition of, 958Backlash in diffractometer drives, 47, 503,

667Balanced filters, 74, 78, 79, 238Bandwidth, 197Basic polytypes, 763, 766, 767Basic structural features, 745±944Basic structure, 909Basis

conventional, 944crystallographic, conventional, 3crystallographic, non-primitive, 3crystallographic, primitive, 2primitive reciprocal, 2standard, 944vectors, 944

Bayerite family, 766Bayes's theorem, 681Beam centring, 45Beam conditions, 120Beam divergence, 45, 425, 498Beam-splitting crystal, 531Beam tilt (see also Misalignment), 524Becquerel, definition of, 958Bending magnets, 198Bent crystals, 77Berg±Barrett method, 114Beryllium, cross section for neutrons, 439Beryllium acetate, 663Bessel function, 589, 666

spherical, 460, 581, 592Best linear unbiased estimator, 680Best overall fit, 493Beta function, 703Bethe approximation, 736Bethe ridge, 411Bethe theory for inelastic scattering, 406±408Bias, 689, 707, 709

of midpoint of a chord, 520of peak, 520

Bijvoet-pair intensity ratios, 251Bijvoet-pair techniques, 251Binding effects, 391Biological macromolecules, SANS, 105Birefringence, 153

of polytypes, 757Black-body radiation in X-ray region, 198±199Blackman curve, 81Blind region, 34Bloch standing waves, 411Bloch-wave method, 259, 415±416, 426, 735Block collimation, 99Block polytypism, 760, 766Boltzmann statistics, 726Bond angles, 698Bond lengths, 698, 813Bond method, 498, 507, 508, 522±526, 529,

531, 534, 535±536for small spherical crystals, 525in multiple-crystal spectrometers, 529±531systematic errors, 523±524

Bond-system diffractometers, 522, 524Bonding electrons, distribution of, 425

Bonds, classification of, 791, 813Bonse±Hart camera, 100Bonse±Hart interferometer, 121Born approximation, 591

first, 389Born±Oppenheimer approximation, 713, 722,

723Born series, 259Borrmann effect, 113, 116, 600Borrmann triangle, 116Bound nuclear scattering lengths, 593Boundaries, low-angle, 114Bragg angle, 187

accuracy of, 505±506, 516determination, 506, 519, 521errors, 491, 494from a diffraction profile, 519±521from a photograph, 519from a two-dimensional map of intensity,

522measurement of, 505, 518operational definitions, 491

Bragg±Brentano (Parrish) angle-dispersivediffractometers, 44, 495, 664

Bragg cut-off, 438Bragg law, 505Bragg optics, 432Bragg reflection, 3, 432

magnetic, 591Bravais classes, 910, 913, 940, 945

(2+l)-dimensional, 915(2+2)-dimensional, 916(3+l)-dimensional, 917±918one-line symbols, 915, 920two-line symbols, 915, 920

Bravais lattice, 3, 15, 913Brazil twins, 11Bremsstrahlung, 37, 191

for XED, 84Brilliance, synchrotron radiation, 197Brillouin zone, 657Broadening function, 710Brownian diffusion, 589Broyden±Fletcher±Goldfarb±Shano update,

684

Cadmium iodide, 754, 756Cadmium telluride detector, 623Calculated powder patterns, 60Calculation of the twin element, 14Cambridge Structural Database, 790, 812Camera methods for lattice-parameter

determination, 491, 497Camera radius

extremely large, 510uncertainty, elimination, 510

Camera tubeshigh-resolution TV, 633lead oxide, 634

Camerasback-reflection, 71Bonse±Hart, 100cylindrical, 70Debye±Scherrer, 42, 70ellipsoidal mirror in SANS, 106flat-film, 71for recording lattice-parameter changes, 510Gandolfi, 71Guinier focusing, 44, 68, 70Kossel, 512Kratky, 99

Camerasmirror, 106miscellaneous, 70pinhole, in SANS, 106pinhole, in SAXS, 100powder, 69±71small-angle, 99systems for synchrotron radiation, 100

Capillary tubes for mounting specimens, 162Carcinogenesis, 960Cast films, 176Castaing & Henry filter, 397Categories of OD structures, 764Cauchy curves, 67Cauchy distribution, 689Causality, principle of, 246CBED (convergent-beam electron diffraction),

416, 540, 735CBED disc, 417Cell dimensions, incorrect assignment, 170Cellulose film containers, 162, 163Central-limit theorem, 702Centre of gravity (centroid), 518

additivity, 518variance, 518

Centred lattices, 3Centred unit cells, 3Centring conditions, 921Centring lattice vectors, 3Centring reflection conditions, 921

for (3+1)-dimensional Bravais classes, 935Centroid of a reflection, 492Centroid of wavelength distribution, 494Ceramics, preparation of specimens, 171Cerenkov radiation, 401Cerium oxide (intensity standard), 500, 503Channel-cut monochromators, 77, 121Channelling, 189Characteristic function, 90Characteristic line spectrum, 191, 202Characteristic radiation, efficiency of

production, 192Characteristic X-rays, excitation of, 510Characterization of detectors, 639Charge, 187Charge-cloud model, 715Charge-coupled devices, 629Charge densities, analysis of, 713±734Chemical

analysis, 154etchants for thin section preparation, 173etching, 173polishing, 174properties, 154thinning, 175

Chi-squared (�2) distributions, 702, 703Chiral volumes, 700Chlorite group, 765, 769Chlorite±vermiculite group, 769±770Choice of reflections, 535Cholesky decomposition, 681, 685Cholesky factor, 678, 681, 694, 708Choppers, 443Chromatic aberration constant, 423, 424Chromium oxide (intensity standard), 500, 503Circle packings, 746±747, 752Classification

of bonds, 791, 813of experimental techniques, 24of space groups, 15

Cleavage, 153

SUBJECT INDEX

c:\itfc\sindex.3d

985

Close-packed structures, 752, 761, 897interstices in, 753lattices possible, 755notations for, 753±754, 756polytypes, 754±756space groups possible, 755spheres, 747, 752stacking faults in, 758±760structure determination of, 756±758symmetry of layers, 753symmetry of stacking, 755voids in, 753

Cobalt martensites, stacking faults in, 758Coherent inelastic scattering, 177Coherent multiple scattering, 661Coherent (Rayleigh) scattering, 554Coherent scattering cross sections, 594Coherent scattering lengths, 594Cohesive energy, 721Coincidence operations, 761Cold neutrons, 105Collimation, 37

block, 99in-plane, 522of neutrons, 105, 431systematic errors connected with, 523±524

Collimatorsmisalignment (tilt), 523±524misalignment (tilt), error, 524Soller, 82, 443

Collinear structures, 591Colour groups, 21Column approximation, 414Combined aberrations, 50Combined methods, spectrometers for, 531Commensurate approximation, 909Commensurate modulated structures,

907±944Comparison measurements of lattice

parameters, 508Compensating transformations, 940Compensating translations, 940Composite crystal structures, 907, 941Composition surfaces, 10Compton scattering, 90, 213, 242, 554, 599,

657±661, 663, 713non-relativistic approximations, 657±659relativistic treatment, 659±660

Compton shift formula, 657Compton wavelength, 260Computer-controlled automation, 63Computer graphics for powder patterns, 69Computer programs

CRYSTIN, 778data processing, 596

Computer simulation in estimation of error,536

Computing methods for electron diffraction,425

Concentration effects, 97elimination of, 98

Condensed models, 766Condition number, 678, 682Conditional probability density function, 679Conditional Q±Q plot, 708Conditioning, 684Cone-axis photography, 35Confidence level, 64Conic section, 515Conical surface of an hkl reflection, 510Conjugate-gradient methods, 686

Conservation laws, 657Constrained models, 693Constraints in refinement, 693, 693±701Contact number, 747, 749Continuous spectrum, 192Contrast

diffraction, 113, 735extinction, 113first-fringe, 116match-point, 107orientation, 113variation in SANS, 107variation in SAXS, 97variation, inverse, 108variation, spin, 108

Conventional basis, 3, 945Conventional unit cell, 913Conventional X-ray sources, 37Convergent-beam electron diffraction

(CBED), 80, 416, 417, 540, 735Convolution, 66, 505, 518, 534Convolution equations, 67Convolution of rocking curves, 663Convolution range, 66Convolution square-root technique, 103Coordination complexes, typical interatomic

distances, 812±896Coordination number, 774Core-electron spectroscopy, 404Core-loss spectroscopy, 404Correction factor

for absorption and extinction, 612for powders, 657

Correction of systematic error, 653Correlated and uncorrelated mosaic blocks,

610Correlation coefficients, 724Correlation energy, 391Correlation function, 90Correlation length, 93Correlations between recorded intensities,

519Corundum

etching, 173intensity standard, 500, 503

Coulombic self-electronic energy, 721Counters

backgammon ( jeu de jacquet), 627gas-filled, 626Geiger±MuÈller, 522parallel-plate, 627

Counting losses, 625Counting modes, 666Counting rates, 666±668

background, 667erratic fluctuations, 666reflection only, 666total, 666

Counting statistics, 64, 666±668Critical-voltage effect, 416, 736Critical wavelength, 196Cross sections

differential scattering, 260dispersion corrections, 221elastic differential scattering, 262ionization, 407of a rod-like particle, 93PDDF of, 102,plasmon, 399scattering and absorption, 439, 444

Cryoprotectants, 166,

Crystal(s)analysers, 56datum orientation, 33definition of, 908displacively modulated, 909edges, 3ideal, 908ideally imperfect, 113ideally perfect, 113intergrowth, 941misalignment (tilt), 424misalignment (tilt), error, 524modulated, 908monochromators, 76, 662mosaicity, 170normal, 908orientation matrix, 33real, 419reflecting power, 590rocking curves, 34, 37, 40rocking widths, 33selection, 148, 151slippage within capillary, 165systems, 6

Crystal classesarithmetic, 15, 911, 945geometric, 15, 911, 913

Crystal-field approximation, 729Crystal-lattice vector and crystal setting, 168Crystal profile, 505Crystal-size analysis, 81Crystal structure

determination by HREM, 419images, 422

Crystal systemscubic, 9, 19hexagonal, 7, 15, 19monoclinic, 6, 16oblique, 15orthorhombic, 6, 16rectangular, 15rhombohedral, 8square, 15tetragonal, 7, 17triclinic, 6trigonal, 7, 18

Crystal thicknessdetermination by electron diffraction, 416,

419in transmission geometry, 512, 513

Crystalline solids, 259Crystallite-size effects, 62Crystallization, 148Crystallographic system, 940Cubic closest packing, 747Cubic crystal system, 9, 19Cubic harmonics, 585Cumulant expansion, 588Cumulative distribution function, 679Current density, 725Current ionization position-sensitive detectors,

628Curvature, lattice, 114Curvilinear density functions, 588±590Cusp constraint, 715Cyclic twins, 10Cylinder

elliptic, 92homogeneous, 96inhomogeneous, 96

Cylindrical camera, 70

SUBJECT INDEX

c:\itfc\sindex.3d

986

Cylindrical collimators, 432Cylindrical detector recording, 32Cylindrical powder cameras, 70Cylindrical powder specimens, 57Cylindrical sample

2� scan, 57for neutron diffraction, 177

d orbital occupancies, 722Darwin width, 662DAS (differential anomalous X-ray scattering)

technique, 218Data evaluation, 100Data processing

program for intensity factors, 596single-crystal methods, 505, 517, 536

Databasesinorganic structures, 778organic structures, organometallic structures

and coordination complexes, 790, 812powder diffraction, 81

Datum orientation of the crystal, 33DauphineÂ twins, 11Davidon±Fletcher±Powell update, 684de Broglie's law, 186Dead-time, 619, 624, 666Debye formula, 104Debye±Scherrer camera, 70, 162

aberrations in, 498Debye±Scherrer±Hull method, 42Debye±Waller factor, 415, 729, 735Deconvolution

in SANS, 107, 111techniques, 393

Defect types, electron diffraction, 424Defects, 419

images, 426lattice, 113study of, 506, 531viewed by an imaging system, 633

Deformation density, 714Deformation map

X ± N, 714X ± X, 714X ± (X+N), 714

Degrees of freedom, 703Delay-line read-out, 627DelbruÈck scattering, 242Dense systems in SANS, 112Densitometry, 618Density, 154Density functionals, 721Density measurement

Archimedes method, 158flotation, 158gradient tube (column), 156immersion microbalance, 158penetration or swelling of solid, 156pycnometry, 158vibrating-string method, 158volumenometry, 158

Depth-profiling analysis, 58Derivative lattice, 11Designated radiation area, definition of, 958Desymmetrization of OD structures, 765Detection

efficiency, 624limits, 410of systematic error, 498±499, 707±709quantum efficiency, 639systems, 397, 663

Detection processes (neutrons), 644±652electronic aspects, 648±649films, 646gas ionization, 644±646neutron capture, 644scintillation, 645±646

Detection systems (neutrons), 649±651Anger camera, 650corrections, 652gas position-sensitive, 650position-sensitive, 649±651single detectors, 649

Detective quantum efficiency (DQE), 624, 639Detector recording

cylindrical, 32plane, 32V-shaped, 32

Detector-response correction in SANS, 109Detectors

background from, 663characterization, 639energy-dispersive, 622, 663for electrons, 639for neutrons, 644, 649gas-filled, 82imaging, 623in X-ray spectrometers, 522, 529±531multiwire, 82position-sensitive, 82, 87, 100, 113, 664resolution of, 82scintillation, 642, 664semiconductor, 622±623, 629, 642single-wire, 82solid-state, 82, 664with wide-open window, 522, 527

Detectors for X-rays, 618±638Geiger counters, 618photographic film, 498, 618proportional counters, 619scintillation counters, 619solid-state detectors, 620

Diagram levels, 191Diamagnetism, 154Dielectric coefficients, 401Dielectric description, 399Difference densities, 714Differential anomalous X-ray scattering (DAS)

technique, 218Differential methods, 527Differential scattering cross section, 260Diffraction

contrast, 113, 735coordinates, 31geometry, practical realization, 36grazing-incidence, 58imaging, 124intensities, 596spot size and shape, 37, 39topography, 113, 124

Diffraction absorption fine structure (DAFS),254

Diffraction profile, 48, 528, 530asymmetry of, 521broadening of, 521double-crystal, 528(in) standardized (form), 519location of, 518narrow, 528, 530parameters of, 528shape of, 521symmetric, 528

Diffractometersalignment, 46area-detector, 36, 170background scattering with, 664Bragg±Brentano, 495double-crystal in SANS, 106for powder diffraction, 42four-circle, 170, 516gears, 503inclination, 517kappa, 36neutron powder, 82, 652neutron powder, high-resolution, 541operation control, 64Seemann±Bohlin, 492, 495three-circle, 170

Diffractometry, 36angle-dispersive, 491, 495±496energy-dispersive, 491

Diffuse scattering, 261Diffusion, Brownian, 589Digital image processing, 635Dimension of a lattice, 945Dioctahedral sheet, 767Dipolar approximation, 731Dipole, 716Dipole moment

atomic, 717molecular, 724

Dirac±Fock, 205Direct and reciprocal lattices, 2Direct crystallization, 174Direct image, 115Direct lattice, 412, 911Direct-lattice parameters, 505Direct method, X-ray detectors, 634Direct structure analysis, 103Direction angles of a crystal face, 4Disc specimens, 171Disc thinning method, 174Dislocations, 114Dispersion, 21, 75, 590, 600Dispersion corrections, 241±258

for XED, 86tables of, 255±257theory of, 243

Dispersion surfaces, 416, 417, 736Displacive modulation, 907Distance distribution functions, 104Divergent-beam techniques, 510±516

classification, 512Dopant concentration, study of, 531Dose equivalent, definition of, 958Double-beam

comparator, 531diffractometer, 531spectrometer, 531technique, 531

Double-crystal diffraction profile, 528Double-crystal diffractometer in SANS, 106Double-crystal monochromator (at

synchrotron), 39Double-crystal spectrometers, 528±530

combined with double-beam technique, 531with photographic recording, 510, 529with symmetric (Bond) arrangement, 529with white X-radiation, 529

Double-crystal topography, 117Double-oscillation method, 168DQE (detective quantum efficiency), 624Drift chambers, 626

SUBJECT INDEX

c:\itfc\sindex.3d

987

Drude model, 400Du Mond diagram, 117Duane±Hunt limit, 192Dynamic measurements, 626Dynamic R factor, 427Dynamic range, 624Dynamical diffraction, 80

Bloch-wave method, 41calculations, 261many-beam, 80multislice method, 414

Dynamical wave amplitudes, 414

Eccentricity error, 524elimination, 521±523, 529

EELS (electron energy-loss spectroscopy),219, 391±412, 428

Effect on lattice parametersof electric field, 508of irradiation, 525of pressure, 508of temperature, 507, 510, 516, 522, 524,

529Effective misorientation, 119Efficiency of the production of characteristic

radiation, 192Eigenvalue filtering, 510Eigenvalues, 678Eigenvectors, 678Elastic constants, 654Elastic differential scattering cross section,

262Elastic scattering, 416

factors, 262neutron, 727

Elastic specular neutron diffraction, 126Elastic stiffness constants, 654Elastic wave, velocity of, 654Electric field gradient, 719Electrical properties, 154Electrochemical thinning, 175Electromagnetic waves, 186Electron beam, misalignment, 424Electron binding energies, 203Electron density, 90, 713

experimental, errors in, 724thermally smeared, 723

Electron diffraction, 259absorption effects, 188, 261boundary conditions, 259computing methods, 425convergent-beam, 80, 735crystal thickness, 188, 419detectors for, 639±643determination of crystal thickness, 416,

419HOLZ technique, 538interaction constant, 259intensities, 416Kikuchi technique, 538lattice-parameter determination, 537measurement of structure factors, 416oriented texture patterns, 412±414pattern analysis, 537pattern indexing, 537patterns, 80, 390potential field, 259preparation of specimens, 171propagation function, 259reciprocal-space representation, 412relativistic values, 259

Electron diffractionscattering factors, 188, 259selected-area, 80, 538structure factors, 416transmission function, 259useful parameters as a function of acceler-

ating voltage, 281Electron diffractometry, 413Electron distributions, 713Electron energy-loss near-edge structure

(ELNES), 408Electron energy-loss spectrometry

Castaing & Henry filter, 397crystallographic information from, 397parallel detection, 397Wien filter, 396

Electron energy-loss spectroscopy (EELS),219, 391±412, 428

aberrations in, 396analysers for, 395detection systems, 397monochromators for, 395non-characteristic background, 394spectrometers for, 394±397types of excitation in, 393

Electron holography, 426, 427Electron inelastic scattering, 378Electron kinetic energy, 721Electron microscopy, 80, 419

preparation of specimens, 171Electron multiplication

in position-sensitive detectors, 622±623in proportional counters, 623

Electron paramagnetic resonance, 190Electron scattering

amplitudes, 259inelastic, 391

Electron spin, interaction with neutron spin,725±726

Electron transitions, 261Electron-transparent specimens, 171Electron-tube device for measurement of

intensities, 642Electron wavelength of a transmission electron

microscope, determination, 540Electroneutrality constraint, 715Electronic detectors, 639Electronic instability, 424Electrons

properties, 187scattering factors, 262wavelength, 424

Electropolishing, 174Electrostatic moments, 716, 717, 718Electrostatic potential, 186, 718Electrostatic properties, 721Elimination of concentration effects, 98Ellipse and ellipsoid packing, 751±752Ellipsoid, 92Ellipsoid of revolution, 94Ellipsoidal-mirror SANS camera, 106Elliptic cylinder, 92ELNES (electron energy-loss near-edge

structure), 408Emission lines, 202, 203, 204, 206, 209Emission-spectrum profile, 519Empirical correction factor for preferred

orientation, 61Empirical metallic radii, 774Enantiomorphous pairs of space groups, 20Energy discrimination, 625

Energy-dispersiveanalysis, 428detectors, 625, 641, 663diffraction, 58, 619diffractometer, aberrations of, 497methods, in lattice-spacing determination,

496, 507neutron diffraction, 87techniques, 496X-ray diffraction, 84, 619

Energy-filtered lattice images, 428Energy-flow triangle, 115Energy-flow vector, 119Energy-loss spectrometer, 395Energy of radiation, 187Energy resolution, 396, 619, 620, 622Enhanced symmetry, 13Entrance slit, 45Entropy maximization, 691Epitaxic formation, 176Epitaxic layers, study of, 516, 529Epitaxy, 153EPR (electron paramagnetic resonance),

190Equatorial divergence, 497Equatorial geometry, 516Equi-inclination setting, 31Equivalent origins, 15Equivalent superspace groups, 940Erratic fluctuations in counting rates, 667Errors (see also Aberrations, Systematic

errors)and aberrations in lattice-parameter mea-

surements, 490and uncertainties in wavelength, 493in angle reading, 524in angle setting, 524in experimental electron density, 725of the Bragg angle, 491

Escape peaks, 622Estimated standard deviation, 707

of an observation of unit weight, 702Estimates, 680Etch figures, 153Etching

chemical, 173corundum, 173ion sources, 173sputter, 173

Euclidean norm, 678Eulerian angles, 694Eulerian-cradle diffractometer, 517Eulerian-geometry diffractometer, 517Evaporated thin films, 173Ewald sphere, 26, 526, 656EXAFS (extended X-ray absorption fine

structure), 24, 189, 213±220, 254, 409Exchange-correlation energy, 721Excitation errors, 414Excitation of characteristic X-rays, 510EXELFS (extended electron fine structure),

409Exit beam, extremely parallel, 532Expectation values, 679Experimental techniques

classification of, 24for crystal structure analysis, 25

Exposure of radiation, definition of, 958Extended electron fine structure (EXELFS),

409Extended solids, 730

SUBJECT INDEX

c:\itfc\sindex.3d

988

Extended X-ray absorption fine structure[(E)XAFS], 24, 189, 213±220, 254, 409

facilities for, 219External space, 944External standard, 499External vibrations, 723Extinction, 113, 599, 728

contrast, 113correction factor for, 612correction, neutron diffraction, 177correction, XED, 86distance, 736length, 187primary, 609, 610secondary, 609, 611symbol, 13

Extrapolated (midchord) peak, 518Extrapolation in lattice-parameter

determination, 505, 510, 521±522, 535analytical, 493±494graphical, 493

F distribution, 702Face normals, 5Face or cleavage plane of a crystal, 4Factors determining accuracy, 501Family diffractions, 765Fano factor, 626Fano plots, 408Faraday cage, 642Faster-than-sound neutrons, 657Faults in polytypes, 758±760Feasible point, 693Fermi chopper, 443Fermi level, 398

germanium, 406heavy metals, 406sulfur, 406transition elements, 406

Fermi pseudopotential, 444Ferrimagnetism, 154Ferroelectricity, 154Ferromagnetism, 154Ferromagnets, 728Fibre optics, 632Fibre texture, 414Fibres, diffraction from, 24Film

aluminium, 393for neutrons, 646germanium, 394

Film shrinkage, 498error, elimination of, 509

Filters, 38, 76balanced, 74, 78, 238Castaing & Henry, 397for common target elements, 79for neutrons, 438for X-rays, 236graphite, 82optimum-thickness, 238polarizing, 438, 440single, 78thickness, 78wavelength change by, 239Wien, 396with scintillation counters, 621

Fine-grained substances, oriented texturepatterns, 412

First-fringe contrast, 116First-order Laue zone (FOLZ), 417, 418

First/second derivatives, 65Fixed-count timing, 667Fixed-time counting, 666Flat-cone setting, 31Flat crystal, 77Flat-crystal monochromator, 39Flat-film camera for Laue patterns, 70Flat particles, 95

cross-sectional inhomogeneity, 96molecular weight, 93

Flat-specimen aberration, 47, 48Flipping coil, radio-frequency, 728Flipping ratios, 592, 728Flotation, 158Fluctuations

in particle orientation, 61±62, 492in recording counts, 492, 666

Fluorescence radiation, 657Fluorescence scattering, 661Fluorescence spectroscopy, 619Fluorescence techniques, 218Fluorescent screens, 640Fluorophlogopite reflection angles, 503Focal-line width, 48Focusing diffractometer geometries, 43Focusing geometry, 83Focusing monochromator, 82Focusing, neutron scattering, 443Focusing powder camera, 70Fog density, 618Fog level, 640Foil detector, 645FOLZ (first-order Laue zone), 417, 418Forbidden reflections, 527Form factors, magnetic, 454, 591Four-circle diffractometer, 516Four-dimensional crystal classes, 16Fourier imaging, n-beam, 422Fourier integral, 89Fourier-invariant expansions, 586Fourier potential, 735Fourier series, 89Fourier transformation, 89

indirect, 111techniques, 393

Free-electron gasDrude model, 400±401Lorentz model, 400

Free-radical scavengers to improve crystallifetime, 166

Free scattering length, 594Frequency of space groups, 15Fresnel diffraction theory, 259Friedel-pair intensity ratios, 251Friedel-pair techniques, 251Friedel's law, 913Fringe patterns, stacking-fault, 116Fringe period, 419Fringe visibility, 421Full symbols for superspace groups, 921

Gallium selenide, 754Gamma function, 702Gamma rays, 187Gas amplification, 626±627Gas detector for neutrons, 644Gas-filled counters, 82, 626Gas multi-electrode position-sensitive

detectors for neutrons, 650Gas multiplication, 626Gauss±Markov theorem, 680

Gauss±Newton algorithm, 683, 690, 693Gaussian curves, 66, 711Gaussian fits to X-ray scattering factors, 261Gaussian radial functions, 724Geiger counter, 618Gelatine capsules, 163Generalized Bessel function, 666Generation of X-rays, 191Generator stability, 72Geometric crystal classes, 15, 911, 945Geometrical aberrations, 41, 493

for XED, 86Geometrical analysis of oriented texture

patterns, 412Geometrical instrument parameters, 44Geometrical peak, 518Geometry of SANS, 106Germanium, Fermi level, 406Germanium film, 394Gibbs instability, 415Gibbsite±nordstrandite family, 766Gittergeister (lattice ghosts), 907Givens rotations, 679Glauber approximation, 391Globular particles, 93Glove box, definition of, 959Gnomonic transformations, 29Gold, dielectric coefficients, 401Goodness-of-fit parameters, 702, 707Gordon±Kim model, 721Gradient tube (column)

cavities, problem of, 156Ficoll gradient, 157inclusions, problem of, 156shallow gradient, 157

Gram±Charlier series expansion, 586Graphical extrapolation of lattice parameters,

493Graphite

dielectric functions, 403monochromator, 37, 38, 51, 620

Gray, definition of, 959Grazing-incidence diffraction, 58Grigson scanning method, 81Growth striations, study of, 530Growth twins, 10Guinier and Tennevin technique, 119Guinier approximation, 92, 110Guinier camera, 162Guinier focusing, 70

Half-life, definition of, 959Half-width, 506, 519, 522, 526, 528

(methods of) reducing, 526minimum, 506of wavelength distribution, 506

Hamilton's R-factor ratio test, 704Hankel transform, 102Hard-sphere interference model, 98Hard X-rays, 187Hardness, 153Harmonics, cubic, 585Hartree±Fock

approximation, 732model, 243self-consistent field, 659wavefunctions, 460

Hat matrix, 705Heat capacity, 154Heavy metals, Fermi level, 406HEED (high-energy electron diffraction), 412

SUBJECT INDEX

c:\itfc\sindex.3d

989

Helimagnetic order, 728Hellmann±Feynman constraint, 715Hermite polynomial tensors, 586Hessian matrix, 684Heterogeneous packing, 746Hetero-octahedral sheet, 767Hexacontatetrapole, 716Hexadecapole, 716Hexagonal

closest packing, 747, 752crystal system, 7, 15, 19

High-angle annular dark-field (HAADF)images, 428

High-angle Bragg reflections in lattice-parameter determination, 509, 522, 529,532

High-energy electron diffraction (HEED), 412High-order Laue zone (HOLZ), 418, 424, 538,

539High-pressure structural studies, 87High-purity germanium detector, 622High-resolution electron microscopy (HREM),

261, 419, 773High-resolution energy-dispersive diffraction,

58High-resolution experiments, 97High-resolution powder diffractometers

D2B at Institut Laue±Langevin, 541HRPD at Rutherford Appleton Laboratory,

541High-sensitivity lattice-parameter comparison,

531±532High-tension supplies, unsmoothed, 667Higher-dimensional crystallography, 908Histogramming memories, 626Hohenberg and Kohn theorem, 721Hollow cylinders, 92Hollow particles, 96Holographic reconstructions, 427Holohedry, 12, 939, 945HOLZ (high-order Laue zone), 418, 424, 538,

539Homogeneous cylinder, 96Homogeneous packing, 746Homogeneous particles, 93Homogeneous triaxial bodies, 92Homometric mapping, 751Homo-octahedral sheet, 767Horizontal divergence, error, 525Horizontal Soller slits, 56Householder transformations, 679, 686HREM (high-resolution electron microscopy),

261, 419, 773Hydrogen-atom scattering factors, 565Hydrogen bonding, 906Hyperbolic Bessel function, 666Hyperfine interaction, 732Hyper-resolution, 427Hypothesis testing (no remaining systematic

errors), 523

ICDD Powder Diffraction File, 81Icosahedral viruses, SANS, 111Ideal crystals, 908Ideally imperfect crystals, 113Ideally perfect crystals, 113Idempotency conditions, 722Idempotent, 705Identity period, 752Identity period determination, 508

accuracy of, 510

Ill-conditioned least-squares problems, 101Image intensifiers, 122, 632, 635Image processing, 427, 635Imaging detectors, 623Imaging plates, 426, 635, 641Immersion microbalance, 158Impulse approximation, 657Incidence aperture, 53Incident-beam monochromatization, 120Incident-beam monochromator, 53Inclination diffractometer, 517Inclination of plane of specimen, 494Incoherent elastic scattering cross section, 595Incoherent multiple scattering, 108, 661Incoherent scattering, 177, 554

Compton, 90cross section, 594functions (Table 7.4.3.2), 658level, 109

Incommensurate modulated structures,907±944

Index of refraction, 600Indexing powder patterns, 541Indirect method, X-ray detectors, 634Indirect transformation method, 101Indium antimonide, dielectric coefficients,

401Induced matrix norm, 678Inelastic coherent scattering, 109Inelastic crystal excitations, 425Inelastic scattering, 378, 416, 657

Bethe theory, 406±408electrons, 391neutrons, 391

Inelastic scattering factors for electrons (Table4.3.3.2), 378±388

Inelastically scattered electrons, 81Influential data points, 705, 708Information resolution limit, 424Infrared radiation, 187Inhomogeneities in matter, 105Inhomogeneous cylinders, 96Inhomogeneous particles, 96Inner moments, 718Inner surface area, 109Inorganic compounds

silicates, 766±769typical interatomic distances, 778±789

Inorganic Crystal Structure Database, 778Insertion devices, 197Instrument parameters, geometrical, 44Instrumental broadening and aberrations, 47,

101Integrated intensity

for XED and powder samples, 85formulae for, 600of a reflection, 668

Integrated reflections, 114Intensity, 519

distribution, two-dimensional map, 522of characteristic lines, 191of diffracted intensities, 554±595standards, 500statistics, 519variation with take-off angle, 74

Intensity factors, 596angular velocity, 596data-processing programs for, 596in single-crystal methods, 596±598polarization, 596trigonometric, 596±598

Interatomic distances, 778±896in inorganic compounds, 778±789in metals, 774±777in organic compounds, 790±811programs for calculating, 778

Interaxial angles, determination, 525Interband transition, 401Interference model, hard sphere, 98Interferometers

Bonse & Hart, 121Fabry±Perot, 533

Interferometry, combined optical and X-ray,533±534

Intergrowth crystal structures, 907Interlaboratory comparison, 536Internal

space, 912, 937, 944standard, 499translation, 912

Interparticle interference, 97, 98Interpenetrating packing, 751Interplanar spacing determination

accuracy of, 505precision of, 505

Interquartile range, 690Intersecting-Kikuchi-line method, 736Interstices in close-packed structures, 753Intramolecular multiple scattering, 392Intrinsic background (neutrons), 651Intrinsic component, 917Intrinsic efficiency, 622Intrinsic part of a space group, 940Inverse contrast variation, 108Inversion twins, 10, 12Ion-beam thinning, 171±173Ion-implanted silicon, 525Ion sources for etching, 173Ionic radii, 778Ionicity, degree of, 425Ionization cross sections, 407Ionizing radiation

definition of, 958protection from, 962±963

Irradiated areadisplacement of, 526exactly defined, 522

Irradiated specimen length, 45Irradiation, study of effects of, 516, 525Isometric point groups (crystal classes), 939Isotopic replacement, triple, 111IUPAC notation, X-ray diagram levels, 191

Jagodzinski notation, silicon carbide, 754Johann monochromator, 664Johansson monochromator, 664Joint probability density function, 679

K� doublet, 62, 510, 512±515K�1 and K�1 wavelengths in lattice-spacing

determination, 521K�2 radiation, elimination, 510K� line in lattice-spacing determination, 507Kaolinite, 769Kappa diffractometer (definition), 37Kappa model, 714Kikuchi lines, 419Kikuchi patterns, 735Kikuchi techniques, 538Kinematic image, 115Kinematic theory, 590Kinematical approximation, 80, 260, 262

SUBJECT INDEX

c:\itfc\sindex.3d

990

Kinetic energy, 721Kitajgorodskij's categories, 897Knife-edge calibration, 498Kossel

camera, 512cone, 510, 514lines, 510±515lines, intersections of, 512±513method, 510±516pattern, 512±514, 735plane, 513

Kramer's constant, 192Kramers±Kronig transform, 245Kratky cameras, 99

Label triangulation, 111Labelling, 97

isotopic, 108Lagrange polynomials, 111Lagrange undetermined multipliers, 693Lambda curves (Laue), 39Lambda symmetry (operations), 763Lamellar particles, 97Lamellar textures, 412Lanthanum hexaboride, instrumental sample,

501Large-scale problems, 685Larmor frequency, 728Laser, He±Ne, 533Laser plasma X-ray sources, 189Latex particles, 107Lattice(s)

aperiodic, 937Bravais, 3, 15, 913centred, 3curvature, 114defects, 113derivative, 11dimension, 937direct, 911direct and reciprocal, 2for close-packed structures, 755holohedry, 939point, 2rank, 937twin, 10vector, 2vector centring, 3vector, reciprocal, 2

Lattice bases, standard, 938Lattice-fringe images, 421Lattice ghosts (Gittergeister), 907Lattice-parameter changes, study of, 507, 510,

522, 525, 529±530Lattice-parameter determination, 490±541

aberrations in, 493absolute, 505, 525, 529±532for rectangular systems, 528from one crystal mounting, 509, 510from separate photographs, 509HOLZ techniques, 538, 540inter-laboratory comparison, 536Kikuchi techniques, 538±540least-squares methods, 498local, 525, 529, 532neutron diffraction, 541of cubic lattice, 528of deformed lattice, 513±515of imperfect crystal, 522of large flat slab, 507, 522, 524, 527of perfect crystal, 522

Lattice-parameter determinationof polycrystals (Kossel method), 515of single crystals, 505±536of small spherical crystals, 507, 525of standard crystal, 507powder diffraction, 491, 506, 509, 518, 521precision, 505, 509, 515, 526, 530, 536preliminary, 507relative, 505sensitivity of, 505, 507, 532standards, 499systematic errors in, 493, 498wavelength problems, 492

Lattice-parameter determination methodscamera, 497, 507diffractometer, 495±496, 516±517electron diffraction, 537±540energy-dispersive, 496±497neutron diffraction, 541non-dispersive, 506, 509, 526, 533±534polycrystalline X-ray, 491±504pseudo-non-dispersive, 506, 526, 528single-crystal X-ray, 505±536synchrotron, 495whole-pattern, 496X-ray, 534

Lattice-parameter differences, determinationof, 507, 522, 525, 528±531

Lattice-parameter measurementsaccuracy of, 490discrepancy for silicon, 490possible effect of filter, 239

Lattice parametersof silicon, 490, 499of silver, 499of tungsten, 499

Lattice-spacing comparators, 530Laue class, 13, 938Laue diffraction

multiplicity distribution, 27neutron single-crystal, 87

Laue geometry, 26, 38Laue method, 663Laue patterns, 27, 124

flat-film camera for recording, 70Laue photography combined with powder

diffraction, 506Laue point group, 908, 913, 938Laue sphere, 26Layer-line screen (precession), 34Layer-line screen (Weissenberg), 35Layer lines, 414Layer polytypism, 760, 766Layer silicates, 414Layer stacking, 752±773

in polytypes, 760±773LCAO (linear combination of atomic orbitals)

approximation, 715, 723Lead oxide camera tubes, 634Leakage radiation, definition of, 959Least-dense sphere packings, 748, 749Least-squares calculations, 678±688

estimator, 680nonlinear, 682software for, 688

Least-squares refinement, 504, 505, 510, 517problems, 101

LEED (low-energy electron diffraction), 24Legendre polynomial, 565

associated, 581Lens configuration, 514

Lens-shaped figures, 512±514Levenberg±Marquardt algorithm, 683Leverage, 705, 708Libration (rotational oscillation), 589Libration tensor, 697Librational model, 697Librational temperature factor, 723, 724Licensable quantity, definition of, 959Likelihood, 689Likelihood-ratio method, 523Limited projection topographs, 116Limiting resolution of X-ray detectors, 634Line focus, 194Line profile, 518

calculated by convolution, 662Linear algebra, 678Linear attenuation coefficient, 213Linear combination of atomic orbitals (LCAO)

approximation, 715, 723Linear estimator, 680Linearity, 621Linearity of response, 619Lithium-drifted germanium detector, 622Lithium-drifted silicon detector, 622Live X-ray topographs, 122Local measurements (topography), 516,

525±527, 529Location of diffraction profile, 518Long-period polytypes, 757Lorentz factor, 497, 596, 710Lorentz model, 400Lorentz±polarization factor, errors, 60, 523,

596correction for, 523

Lorentzian curves, 66Lorentzian functions, 711Lorentzian profiles, 67, 400Low-angle boundaries, 114Low-angle reflections, confusion with escape

peaks, 622Low-energy electron diffraction (LEED), 24Low-Q scattering, 105Lower quartile, 813Luminescence, photostimulated, 635

Macromolecules, biological, use of SANS,105

Macroscopic absorption cross section, 461Magnetic

Bragg reflection, 591domains, 124form factors, 454, 592interaction vector, 591orbital structure factor, 731ordering, 725space group, 591

Magnetic properties, 154of the neutron, 108

Magnetic scatteringof neutrons, 590of neutrons, elastic, 591X-ray, 733

Magnetic structure factors, 591, 726, 727unit-cell, 591X-ray, 733

Magnetism, 725Magnetization density, 591, 725Magnetostatic energy, 731Magnetostatic properties, 731Magnets, bending, 197Main reflections, 907

SUBJECT INDEX

c:\itfc\sindex.3d

991

Mains-voltage fluctuations, 667Many-beam dynamical diffraction, 80Marginal probability density function, 679Mass absorption coefficients, 213, 600Mass attenuation coefficients, 213±214

tables of, 230±236Mathematical interpretation in single-crystal

methods, 536Mathematical theory of powder

diffractometry, 518Matrix diagonalization, 425Matrix formulae for two-circle diffractometer,

517Maximum degree of order (MDO) polytypes,

762, 767, 768, 769, 770, 772Maximum dimension of a particle, 93, 102Maximum-entropy method, 428, 689Maximum-likelihood estimate, 689Maximum-likelihood methods, 691Maximum oscillation angle, 33Maximum primary dose (MPD), 960MDO (maximum degree of order) polytypes,

762, 767, 768, 769, 770, 772Mean, 679, 813Mean-square broadening, 493Measured-as-negative intensities, 667Measured profile, 505

as a convolution, 503Measurements of lattice parameters

absolute, 505relative, 505

Mechanical (deformation, glide) twins, 10Mechanical properties, 153Mechanical twins, 10Median, 520

absolute deviation, 690variance of, 520

Melt-grown crystals, 114Melting point, 154Membrane proteins, 24Mercury iodide detector, 623Mercury sulfide chloride, -Hg3S2Cl2, 771,

772Merohedral point groups, 12Meso-octahedral sheet, 767Metallic radii, empirical, 774Metals

preparation of specimens, 173texture studies, 414typical interatomic distances, 774±777

Methyl methacrylate resin containers, 162Metric tensor, 694Mezei flipper, 442Mica containers, 162Mica group, 765, 768±770Microanalysis, 54

quantitative, 410Microdensitometer, 618Microdiffractometers, 491Microdiffractometry, 53Microfocus sources, 71Microrefractometer, 160Microtome, 171Microwaves, 190Midchord peak, 518Midpoint of a single chord, 518

bias, 520variance, 520

Miller formulae, 5Miller indices, 5, 11Mimetic twinning, 153

Mirror cameras, 106Mirrors, 37

for neutrons, 436reflection devices, 435

Misalignment, 506, 531, 535±536diffraction, 424of electron beam, 424

Misorientation functions, 414Misorientation matrices, 33Mixed-layer structures, 760Model calculations in SAXS, 103Model fitting in SANS, 111Modelling of space-group frequencies, 897Moderators for neutrons, 431Modulated crystal structures, 907±944

examples, 936types defined, 907

Modulationdisplacive, 907occupation, 907, 913relations, 941

Modulation transfer function (MTF), 634MoireÂ topography, 121Molecular beams, 189Molecular biology, isotopic composition in

SANS, 107Molecular dipole moment, 725Molecular geometry, 812Molecular organic structures

packing in, 897space-group distribution of, 905

Molecular packing, 904Molecular scattering factors, 390Molecular weight, 93Moliere high-energy approximation, 260Moment, 679Moments of a charge distribution, 716Momentum density distributions, 659, 713Momentum space, 713Monitor methods, 72Monitoring circuits, 619Monochromatic radiation, �±2� scan, 55Monochromatic still exposure, 30Monochromator-scan method for diffraction,

85Monochromators, 37, 43, 46, 51, 76, 99, 120,

395, 528, 662alignment, 46angular calibration, 46channel-cut, 77, 121, 239common types, 77comparison of, 433crystal, 76different diffraction geometries, 43diffracted beam, 44, 46double-reflection, 239focusing, 82for neutrons, 432±435for X-rays, 236graphite, 38, 239, 620, 664±665incident-beam, 53Johann, 664Johansson, 664mosaic crystals, 432, 662multi-reflection, 239perfect-crystal, 39, 443, 663pyrolytic graphite, 46, 72quartz, 661scanning-crystal, 622single-reflection, 239

Monoclinic crystal system, 6, 16

Monodisperse systems, 91Monopole, 716Morphological properties, 153Morphology, and mounting of single crystals,

164Morse approximation, 389Mosaic-crystal monochromator, 662Mosaic spread, 432Mosaicity, 443

neutron diffraction, 433Moseley's law, 76MoÈssbauer radiation, 656MoÈssbauer spectroscopy, 189, 719Mott±Bethe formula, 261Mounting of specimens, 163

biological macromolecule single crystals,165

polycrystalline specimens, 162single crystals, 164small organic and inorganic single crystals,

164Moving splines, 111Multichannel pulse-height analyser, 496Multi-component complex, label triangulation,

111Multidetector, 82Multilayer materials, 171Multilayer polarizers, 436Multiple-beam methods, 531Multiple-crystal techniques, 528±532Multiple diffraction, 513Multiple-diffraction methods, 526±528

with counter recording, 526±528with photographic recording, 513

Multiple-diffraction pattern, 527indexing, 527

Multiple-exposure techniques, 514Multiple-order reflections (Laue), 27Multiple scattering, 661

deconvolution techniques, 391incoherent, 661intramolecular, 392neutron diffraction, 177Poisson distribution, 393problems associated with, 392

Multiple twins, 10Multiplicity distribution in Laue diffraction, 27Multiplicity factor, 596Multipole expansions, 103, 714, 716, 730Multipole functions, angle dependence, 583Multipole model, 716Multi-reflection devices, 121Multislice method, 414±416, 425

programs for, 415Multiwire detectors, 82Multiwire proportional chamber (MWPC),

627Muons, 189Muskovite, 771

n-beam Fourier imaging, 422n-particle density matrix, 713n-particle wavefunction, 713Natural background, definition of, 959Near-edge fine structures, 408Neighbours, nearest (direct) and next-nearest

(indirect), 775Net planes, 4Neutron Anger camera, 650Neutron-beam definition, 431Neutron-capture reactions, 644±645

SUBJECT INDEX

c:\itfc\sindex.3d

992

Neutron diffraction, 26cross section (tables), 445±461energy-dispersive, 87Laue, 87powder, 82preparation of specimens, 177scattering lengths (tables), 445±461time-of-flight, 87time-of-flight, powder, 88white-beam, 87

Neutron polarization, 592Neutron powder data, 68

Rietveld analysis of, 710±712Neutron resonance spin echo (NRSE), 443Neutron scattering, 591±595

elastic, 728focusing, 443form factors, 454±461inelastic, in spectroscopy of solids, 391magnetic, 591, 726monochromators, 443nuclear, 593polarized, 728resolution functions, 443scattering factors, 454±461Soller collimators, 443spectrometers, 444

Neutron sourcespulsed spallation, 189reactors, 430spallation, 87, 430

Neutron spin, 444interaction with electron spin, 725±726

Neutronsabsorption coefficients (Table 4.4.6.1), 461cold, 105faster-than-sound, 657films for, 646filters, 438guide tubes, 432, 435moderated, 430monochromators, 432polarized, 108, 592properties, 187reflectivity, 126, 433reflectometry, 126scattering-length densities, 441slower-than-sound, 657topography, 124

Next-nearest (indirect) neighbours, 775NFZ relation, 761NIST (National Institute of Standards and

Technology) silicon standard, 495NMR (nuclear magnetic resonance), 154, 190No-upper-layer-line approximation, 415Nodal reflections, 27Noise reducer for image processing, 635Non-crystalline samples, diffraction from, 24Non-crystallographic symmetry elements, 907Non-dispersive methods (techniques), 506,

526, 533±534Non-linear least squares, 683Non-periodic systems, 89Non-stochastic effects, 959Non-systematic interactions, 81Non-uniformity of response, area detectors, 41Normal attenuation, 214Normal-beam equatorial geometry, 36Normal-beam rotation method, 31Normal crystal, 908Normal equations, 680, 682

Normal modes of vibration, 653Normal probability distribution function, 66,

702Normalized spin density, 727Notations for close-packed structures, 753,

758Nuclear magnetic resonance (NMR), 154, 190Nuclear reactors, 430Nuclear scattering

amplitude, 594length, bound, 594of neutrons, 593

Nuclear structure factors, 595, 725, 732Nuclear Thomson scattering, 242Numbers of reciprocal-lattice points within

resolution sphere, 28Numerical approximations to f(s), 261Numerical methods, 685

Objective-lens defocus, 421Oblate ellipsoid of revolution, 94Oblique crystal system, 15Oblique-texture electron difraction patterns,

412Obliquity, 41Occupation modulation, 907, 913Octahedral sheet, 767Octupole, 716OD (order±disorder)

diffraction pattern, 763groupoid families, 761, 763, 765, 773layers, 764packets, 765repeat unit, 764structures, 761, 764structures, desymmetrization of, 765theory, 761

One-crystal spectrometers, 521±526asymmetric (arrangement), 521±522symmetric (arrangement), 521±526

One-dimensional crystal classes, 15, 16One-line symbols for Bravais classes, 915, 920One-particle reduced density matrix, 726Open shell electrons, 727Operations in polytypes, 762±763Optic modes, 653Optical

activity, 153antipodes, 153diffractograms, 427interferometry, 533±534properties, 153, 160reflectivity, graphite, 403wavelength as a standard, 533

Optimization (of measurement), 517±520,526±528, 532±534, 667

Optimum design of experiments, 74, 702Orbital angular momentum, 731Orbital magnetism, 731Orbital moment, 727Orbital momentum, 726Orbitals, Slater-type, 584Order±disorder (OD)

diffraction pattern, 763groupoid families, 761, 763, 765, 773layers, 764packets, 765repeat unit, 764structures, 761, 764structures, desymmetrization of, 765theory, 761

Organic compoundspreparation of specimens for electron

diffraction and electron microscopy, 176space-group distribution of molecular, 905typical interatomic distances, 790±811

Organometallic compoundslabel triangulation, 111typical interatomic distances, 812±896

Orientated solidification, 176Orientation contrast, 113Orientation matrix, 516, 535, 537

determination, 517four-circle diffractometer, 516±517

Orientation of crystals, 134Orientation of the lattice relative to the point

group, 15Oriented texture patterns, 412Origin of angular scale

recovery of, 530uncertainty of, 530, 536

Original profile, 505, 520half-width of, 506, 520

Origins, equivalent, 15Orthorhombic crystal system, 6, 16Oscillation angle, maximum, 33Oscillation photographs processing, 510Outer moments, 718±720Outlier removal, 813

Packingcontact number in, 746±747, 752density of, 746heterogeneous, defined, 746homogeneous, defined, 746interpenetrating, 751of circles, 746±747, 752of ellipses and ellipsoids, 751±752of layers, 752±773of spheres, 746±751, 752, 904stable, 747, 750types, tables of, 747±748voids in, 750

Pair-distance distribution function (PDDF), 90Pair-production cross sections, 213Parafocusing, 47Parallax, 41, 624Parallel-beam geometry, 54, 663Parallel detection, 397Parallel-plate counters, 627Parallel recording, 639Paramagnetism, 154Paramagnets, 728Parasitic scattering, 661Partial coincidence operations, 761Partial structure factors in SANS, 112Partial wave phase shifts, 389Partially stimulated reflections (partials), 34,

39Particle(s), 186

latex, 107mass in SANS, 110maximum dimension, 102parameters of, 91shape in SANS, 110shape in SAXS, 93

Particle orientation, fluctuations, 492Particle size, 62, 89, 162

distribution, 111Patterson synthesis, 21Pauli principle, 412Pauling model of hydrous phyllosilicates, 767

SUBJECT INDEX

c:\itfc\sindex.3d

993

PCD (projected charge-density)approximation, 423

PDDF (pair-distance distribution function),90

Peakasymmetry, 67displacements, 518height, 518of a reflection, 492satellite, 75search, 65shift, 518variance, 520

Peak flux, 431Peak-shape function, 710±711Peak-to-background ratio, 65, 661

with scintillation counters, 622Pearson VII function, 67, 711PendelloÈsung, 250Penetration depth, 58

of X-rays, methods of reducing, 525Peptides, standard coordinates, 699Per cent point function, 708Perfect-crystal analysers, 665Perfect-crystal monochromators, 444, 663Perfect single crystals, 510, 519Persistence length, 93Petrographic sections, 171Phase analysis, electron diffraction, 412Phase diagrams, determination of, 510Phase-grating approximation, 260Phase identification, 42, 81

from electron-diffraction patterns, 81Phase-space analysis, 661Phase-space diagrams, 661Phase transitions, study of, 509, 522, 525,

529Phonon absorption, 656Phonons, 261, 653Phosphor screens, 634Phosphoric acid as etchant, 173Phosphors, 630

storage, 635Photoabsorption measurements, 406Photoconductive layer

amorphous Se±As alloy, 635lead oxide, 634X-ray-sensing, 634

Photo-effect data, theoretical, 221Photoelectric absorption, 599Photographic emulsions, 640Photographic film

graininess, 640properties of, 640shrinkage, 498

Photographic methodselectron diffraction powder pattern, 81single-crystal, 508±516single-crystal, classification of, 508

Photographscone-axis, 36setting (precession), 35upper-layer (precession), 35upper-layer (Weissenberg), 35zero-layer (precession), 35zero-layer (Weissenberg), 34

Photomultiplier tube, 619Photon energy, 84Photon-induced X-ray analysis, 189Photon interaction cross sections, tables of,

223±229

Photon noise, 633Photon scattering cross section, 213Photons, 186Photostimulated luminescence, 635Phyllosilicates, 413, 766±771Physical aberrations, 493, 493

for XED, 86Physical constraints, 715Physical properties, relation to crystal

structure, 151±153Picture elements (pixels), 634Piezoelectricity, 154Pinhole cameras

in SANS, 106in SAXS, 100

PIX (proton-induced X-ray analysis), 189Pixels (picture elements), 634Planck's law, 186Plane detector recording, 32Plane-wave topography, 121Plasmas, 191Plasmon(s), 261, 403

cross section, 399dispersion, 398energies in metals, 397excitation energy, 660lifetime, 399scattering, 657, 661

Plasticity, 153Pleochroism, 153Point group(s), 939

arithmetic, 913arithmetically equivalent, 939definition of, 945equivalence class, 939geometrically equivalent, 939Laue, 908, 913merohedral, 12orientation of the lattice relative to, 15reducible, 940

Point lattice, 2Point row, 3Point-spread factor, 40Point-spread function (PSF), 625Poisson distribution, 393, 666, 690

difference of two, 666sum of two, 666

Poisson statistics, 519Poisson's electrostatic equation, 719Polarization, 193

dependence, 732incident neutron, 727index, 611neutron, 592rotation of, 593vector, 654

Polarization factor, 51, 596for XED, 85

Polarized neutron scattering, 728Polarized neutrons, 108, 592Polarized radiation, circularly, 734Polarizers, multilayer, 435Polarizing

filters, 438microscope, 154mirrors, 440neutron guides, 431

Polishing, 174Polycrystalline samples for neutron

diffraction, 177Polydisperse systems, 89, 99

Polymersisotopic composition in SANS, 107preparation of specimens for electron

diffraction and electron microscopy, 176texture studies, 414

Polypeptides, restraints in refining, 699±700Polysynthetic twins, 10Polytypes, 754±756, 760±773

basic, 762families, 761faults in, 758±760layer stacking in, 760±773long-period, 757maximum degree of order (MDO), 762mixed-layer structures, 761regular, 762rod, 760, 766simple, 762standard, 762turbostratic structures, 761

Polytypismdefinition, 760layer, 766oriented texture patterns, 412rod, 760, 766

Position-sensitive detectors, 82, 87, 100, 113,619, 623±633, 664

choice of detectors, 623detection efficiency, 623±624detector properties, 623±625for neutrons, 649, 652localization of detected photon, 627photographic film, 623size and weight, 626software packages, 633storage phosphors, 634, 635±638

Positron annihilation spectroscopy (PAS),189

Positrons, 189Posterior probability density function, 681Potential scattering, 594Powder cameras, 70Powder diffraction, 42, 664

advantages of synchrotron, 54combined with Laue photography, 506electron techniques, 80methods, basic, 55neutron techniques, 82special factors in, 596standards, 498±499tilted-beam techniques, 80

Powder diffraction data, Rietveld analysis of,710±712

Powder diffractometry, mathematical theoryof, 518

Powder methods compared with single-crystalmethods, 506

Powder-pattern geometry, 80Powder-pattern indexing, 541Powder-pattern intensities, 80Powder patterns

calculation of, 60computer graphics for, 69

Powders, correction factor for, 657Poynting vector, 119Precautions against radiation injury,

958±967Precession geometry, 35

setting, 168Precision, 490, 492, 497, 501, 707

of parameter estimates, 702

SUBJECT INDEX

c:\itfc\sindex.3d

994

Precision of lattice-spacing determination, 505and profile shape, 517±519(methods of) increasing, 518, 533±534relative, 505

Preferred orientation, 60, 80, 162, 712empirical correction factor, 61minimization of, 60

Preparationof crystals, 153of specimens for electron diffraction and

electron microscopy, 171of specimens for neutron diffraction, 177

Pressure, effect on lattice parameters, studyof, 508

Primary dose limits, 960Primary extinction, 609, 610Primitive

crystallographic basis, 2reciprocal basis, 2unit cell, 2

Principle of causality, 246Prior probability density function, 681Probability density function, 681Probability distribution function (p.d.f.),

707Profile fitting, 65, 492, 710

computer procedures, 491functions, 66, 710in oscillation photographs, 510

Profile parameters, 710Projected charge-density (PCD)

approximation, 423Projection matrix, 705, 706Projection topograph, 115Prolate ellipsoid of revolution, 94Promolecule, 714Promolecule density, 714Propagation function, 415Proportional counters, 619Protection from ionizing radiation, 962±963Proteins

label triangulation, 111restraints in refining, 699±701

Proton-induced X-ray analysis (PIX), 189Pseudo-atom moments, 718Pseudo-non-dispersive methods, 506, 526,

528±533Pseudo-Voigt function, 67, 711Pulse-amplitude discrimination, 73, 620Pulse-amplitude distributions, 621Pulse-height analyser, 622Pulse-height discrimination, 619Pulse-height distribution, 626Pulsed neutron source, 711Pulsed (spallation) neutron source, 87, 189,

430±431Pycnometry, 158Pyroelectricity, 154Pyrolytic graphite, 43, 77, 438, 665

cross section for neutrons, 439Pyrophyllite, 768

Q±Q (quantile±quantile) plot, 707, 708QED corrections, 204, 205QR decomposition, 679Quadrupole, 716Quadrupole moment, 717Quality factor (QF), definition of, 959Quanta, 186Quantile±quantile plot, 707, 708Quantitative microanalysis, 410

Quantum counting efficiency, 621Quantum efficiency, 624Quartz monochromator, 664Quartz twins, 11Quasi-Gaussian approximation, 590Quasi-Newton methods, 683Quasicrystals, 908

R factors, 68, 710±711dynamical, 427weighted, 68

Racah's algebra, 731Radial constraint, 715Radial distribution function, 97Radiation damage, 166, 417, 626, 630Radiation injury

definition of terms, 958±960possible sources, 962±963precautions against, 958±967regulatory authorities, 964±966responsibilities, 960±961

Radiation protection, 957, 962Radiation safety officer, 960Radiations used in crystallography

electromagnetic waves, 186particles, 186, 259

Radioactive samples, 619Radioactive sources, 189Radio-frequency flipping coil, 728Radionuclides, 75, 196

definition of, 959Radiotoxicity, definition of, 959Radius of gyration, 91

of the cross section, 92of the thickness, 92

Radoslovich model, 769Raman effect, 153Raman scattering, 657, 660

resonant, 657, 660, 661Raman spectroscopy, 189Ramsdell notation, 752Rank of a lattice, 937Rate-meter measurements, 63Ratio method

for powder samples, 509for single crystals, 509

Ratio of lattice spacing to optical wavelength,533

Rational twin axis, 10Rayleigh criterion, 427Rayleigh scattering, 214, 242, 554, 599Rayleigh scattering data, theoretical, 221RBS (Rutherford backscattering), 189Reactors, 430Real crystals, 419Real solids, 401Real structure

determination, 516, 531errors due to, 528

Receiving slit, 45aperture, 53width, 48

Reciprocal cellpicture of, three-dimensional, 509picture of, two-dimensional, 509picture of, undeformed, 509

Reciprocal lattice, 412angles, determination, 517geometry, 513layer lines and crystal setting, 168parameters, determination, 517

Reciprocal latticepoint, 415vector, 3

Recording counts, fluctuations of, 492Recording range, 52Rectangular crystal system, 15Reducible point groups, 939Reference crystal(s), 531±532Reference sample in SANS, 109Refinement

least-squares, 503, 505, 510, 517of structural parameters, 677problems, least-squares, 101Rietveld, 56, 82, 541Rietveld, using XED, 86

Reflecting power of a crystal, 590Reflection

angles, 499conditions, for a twinned crystal, 13conditions, special, 921of light, 153

Reflection electron microscopy (REM), 428Reflection high-energy electron diffraction

(RHEED), 428Reflection-only counting rates, 666Reflection specimen, �±2� scan, 44, 53Reflection topographs, 113, 114Reflection twins, 10, 12Reflections

integrated, 114main, 907multiple-order (Laue), 27nodal, 29satellite, 907single-order (Laue), 27

Reflectivity function, 528Refraction, 527

correction for, 492, 505, 523, 536effects, 81

Refractive index, 81, 154, 160, 189, 599±600immersion media for measurement of, 160

Regular polytypes, 762Regulatory authorities, 964Relative measurements of lattice spacing, 505Relative molecular mass in SANS, 110Relativistic corrections, 390Relativistic effects, 186, 260, 262REM (reflection electron microscopy), 428Remanent systematic error, testing for, 498Repeated twins, 10Residual, 707Residual map, 714Resolution

in XED, 85sphere, 27

Resolution errorsdetector element, 106gravity, 106in SANS, 106slit, 106wavelength, 106

Resolution functions in neutron scattering,443

Resonance scattering, 594Resonant Raman scattering, 657, 660, 661Restraints in refinement, 691, 693±701RHEED (reflection high-energy electron

diffraction), 428Rho operations, 763Rhombohedral crystal system, 8Ribosomes, scattering curves from, 111

SUBJECT INDEX

c:\itfc\sindex.3d

995

Rietveld method, 56, 82, 422, 493, 496, 541,690, 710

background, 711indexing, 711peak-shape function, 710±711preferred orientation, 712problems with, 711using XED, 86

Rigid-motion parameters, 697Robust/resistant methods, 689Rock minerals, preparation of specimens, 171Rocking curves, 37, 39, 188, 662

double-crystal, 529Rod-like particles, 94

molecular weight, 93radial inhomogeneity, 96

Rod polytypes, 760, 766Rotating-anode tubes, 71, 189, 194Rotation diagrams, 414Rotation geometry setting with moving-crystal

methods, 168Rotation method, 29

normal beam, 31Rotation of polarization, 593Rotation/oscillation geometry, 31Rotation twins, 10, 12Rotational oscillation (libration), 589Rutherford backscattering (RBS), 189Rutile, intensity standard, 503

Sample mean, 813Sample median, 813Sample standard deviation, 813SANS (small-angle neutron scattering), 105,

110Satellite

peaks, 75reflections, 907

Saticon television camera tubes, 630SAXS (small-angle X-ray scattering), 89Sayre's equation, 428Scale factor, estimation of, 691Scanning-crystal monochromator, 622Scanning electron microscopy (SEM), 540Scanning range, 519±520Scanning transmission electron microscope

(STEM), 427Scanning tunnelling microscope, 428Scattering

coherent multiple, 661Compton, 242, 554, 599, 661DelbruÈck, 242diffuse, 261elastic, 416electron, 259fluorescence, 661inelastic, 416, 657low-Q, 105magnetic, 730magnetic X-ray, 730multiple, 661multiple, deconvolution techniques, 393multiple, incoherent, 661multiple, intramolecular, 392multiple, neutron diffraction, 177multiple, Poisson distribution, 393multiple, problems associated with, 392neutrons, magnetic, 591neutrons, nuclear, 593nuclear and magnetic, 435parasitic, 661

Scatteringplasmon, 657, 661potential, 594Raman, 657Rayleigh, 242, 554, 599resonance, 594resonant Raman, 657, 660, 661spin-flip, 591thermal diffuse, 416, 653, 655, 657, 661Thomson, 733

Scattering amplitudes, 389for electrons, 263±281nuclear, 594

Scattering cross sectionscoherent, 594Compton, 213elastic, 213elastic differential, 262incoherent, 594incoherent elastic, 595inelastic, 213magnetic, 593nuclear, 591pair-production, 213Rayleigh, 213total, 213, 594total (tables), 223±229

Scattering factorsatomic, 554, 566complex, 188, 262electron, 188, 259for electrons, molecular, 390for electrons, partial wave (Table 4.3.3.1),

286±377for neutral atoms, 263free atoms, 555generalized, 565hydrogen-atom, 565interpolation, 565magnetic, 461parameterization, 262, 461X-ray, Gaussian fits, 261X-ray incoherent, 389

Scattering functions, 89incoherent (Table 7.4.3.2), 658

Scattering intensitiescalculation of, 104neutron, 105

Scattering-length densities, 105match-point, 107

Scattering lengths, 444bound nuclear, 594coherent, 594density, 105density, match-point, 107for neutrons, 188, 444free, 594total, 91

Scattering surfaces, 656Scattering vector, 3, 90Scherzer focus, 422, 423, 424, 426SchroÈdinger wave equation, 186, 415, 735Scintillation detectors, 619, 642, 664Screen menu (CRT) for diffractometer-

operation control, 64Screenless rotation technique for large-

molecule data collection, 169Screw correlation tensor, 697Secant methods, 683Secondary extinction, 609, 611Section topograph, 115

Seemann±Bohlin diffractometers, 495Seemann±Bohlin geometry, 43Seemann±Bohlin method, 52

advantages, 53Selected-area channelling patterns, 540Selected-area diffraction patterns, 428Selected-area electron diffraction, 80, 538Selection of crystals, 151Self-centring slit, 45Self-consistent field (Hartree±Fock) method,

243SEM (scanning electron microscopy), 540Semiconductor crystals, 428Semiconductor detectors, 629, 642Sensitivity (of lattice-spacing determination)

increasing, 505(methods of) highest, 531

Separation plots, structural, 774Serial recording, 639Serpentine±kaolin group, 766±769Setting�±2�, 47anti-equi-inclination, 31azimuthal, 168equi-inclination, 31flat cone, 31Guinier, 39photograph (precession), 35precession geometry, 168rotation geometry, 168stationary crystal, 168

Setting angles in standard diffractometers,516

Shadowing, 189Shannon±Jaynes entropy, 691Shape function, 520, 523Shape of profile

affected by collimation, 520and precision, 519±521

Shape transform, 718Sheets

dioctahedral, 767hetero-octahedral, 767homo-octahedral, 767meso-octahedral, 767octahedral, 767tetrahedral, 768trioctahedral, 767

Short symbols for superspace groups, 921Siegbahn notation, 191Sievert, definition of, 959Sigma symmetry (operations), 763Signal-to-noise ratio, 633, 645Significance tests, 702Silicates (phyllosilicates), 766±771Silicon, lattice parameter of, 490, 495, 499Silver, lattice parameter of, 499Silver behenate reflection angles, 503Simple polytypes, 762Simulations in SAXS, 103Simultaneous reflection, 526Single crystal

characterization, 525Laue diffraction, neutron, 87monochromators (at synchrotron), 39topography, 114XED methods, 87

Single-crystal methodscompared with powder methods, 506photographic, 508±516with counter recording, 516±533

SUBJECT INDEX

c:\itfc\sindex.3d

996

Single-crystal X-ray techniques, 26, 505±536classification of, 25

Single filters, 78Single-order reflections (Laue), 27Single-particle scattering, 110Single-wire detectors, 82Skewness, 586Slater determinant, 722Slater-type orbitals, 584Slits

antiscatter, 45design, 45self-centring, 45

Slower-than-sound neutrons, 657Small-angle approximation, 80Small-angle cameras, 99Small-angle neutron scattering (SANS), 105,

110Small-angle X-ray scattering (SAXS), 89Small angles of incidence, 525Small particles

essential, 56line broadening from, 62

Small spherical crystals, lattice-parameterdetermination of, 507, 525

Solid-state detectors, 82, 620, 642, 664Solid-state effects, 400Solid-state valence-band theory, 415Soller collimators, 82, 432, 443Soller slits, 46, 56, 82, 494, 521±522Solutions, diffraction from, 24Somatic effects, 960Sound velocity, 656Source intensity distribution and size, 73Sources of X-radiation, 507Space-group frequencies

statistical modelling of, 897±906tables, 905

Space groupsand arithmetic crystal class, 15±20arranged by arithmetic crystal class, 16classification of, 15, 897closest-packed, 897distribution of molecular organic structures,

897enantiomorphous pairs, 20for close-packed structures, 755frequency of, 15impossible, 897limitingly close-packed, 897magnetic, 591one-line symbol, 920permissible, 897symmetry, 695two-line symbol, 921

Spallation neutron sources, 87, 189, 430±431Spark erosion, 174Sparse matrices, 685Sparse matrix methods, 701Spatial distortions, 41, 625, 633Spatial non-uniformity, 633Special reflection conditions, 921

for (3+1)-dimensional space groups, 934Specific heat, 154Specific isotopic labelling, 107Specific surface, 93Specimen

aberrations, 48absorption, 497, 498displacement, 494, 498, 499displacement error, correction, 528

Specimenfactors, 60fluorescence, 43, 78focusing circle, 44irradiated length, 45mounting, 162orientation, 44preparation, 171, 177, 503surface displacement, 48, 499, 503transparency, 494, 497, 499transparency aberration, 50

Specimen-tilt and beam-tilt error correction,524

Spectral breadth, 189Spectral brightness, 197Spectral profiles, 48Spectral purity, 72Spectrometers, 395

asymmetric, 521±522combined (techniques), 531double-beam, 531double-crystal, 510, 528±530one-crystal, 521±526stability of, 532symmetric, 521±526, 529±531time-of-flight, 444triple-axis, 444, 531±532triple-crystal, 531±532

Spectroscopyelectron energy-loss, 391infrared, 189Raman, 189

Sphalerite, 754Sphere(s), 92, 94

close-packing, 746, 752, 761hollow, 92of reflection (Laue sphere), 26packing, 747

Spherical aberration, 421Spherical Bessel function, 460, 565, 592Spherical harmonic approximation, atom-

centred, 714Spherical harmonic functions, 581, 714, 722Spherical harmonic multipole model, 715Spherical symmetry, 103Spherically symmetric particles, 96Spin

flipper, 442of neutrons, 443polarization, 388

Spin-contrast variation, 108Spin density

analysis of, 713±734errors, 729

Spin-flip processes, 728Spin-flip scattering, 591Spin-magnetization densities, 725, 727, 731Spin-orbit coupling, 727Spin-orientation devices, 442Spin-polarization effect, 732Spin structure factor, 731Spin-turn coil (flipper), 442Split basis, 944Spot size and shape, 37, 39Sputter etching, 173Sputtered thin films, 173Square crystal system, 15Square-root technique, convolution, 103Square-wave modulation transfer function, 634Stability of spectrometers, 532Stability of X-ray sources, 72

Stable packing, 746, 750Stacking faults, 754, 762

fringe patterns, 116Stacking sequence, determination of, 757Standard basis, 944Standard crystal, 507, 531±532

lattice-parameter determination of, 507Standard deviation, 679Standard lattice bases, 938Standard polytypes, 762Standard reference materials, 498Standard specimens, 501Standard uncertainty, 681, 707Standards

intensity, 500powder-diffraction, 498±499

Static model map, 714Stationary-crystal method, 168Stationary-phase focus, 422Statistical errors of lattice-parameter

determination, 505, 519, 523Statistical fluctuations, 69, 492, 666Statistical modelling, 904Statistical significance tests, 702±705Statistical validity

in general, 702±705of Rietveld method, 712

Statistics, 679of recorded counts, 519Poisson, 519

STEM (scanning transmission electronmicroscope), 427

Step size and count time, 64Stereochemical constraints, 698Stereographic projection of Kossel pattern,

513Stereographic transformation, 29Stibivanite, 769±772Still exposure, monochromatic, 31Still photographs for initial crystal setting, 169Stochastic effects, 959Stopping rules, 684Storage phosphors, 623, 635Storage rings, 196

synchrotron-radiation sources, 199Strain, measurement of, 510, 516, 529Strainmeter, 510Straumanis film mounting, 509Stress

internal, 528study of, 510, 516, 522

Strip-chart recordings, 63Stroboscopic X-ray topography, 120Structural classes, 904Structural separation plots, 774Structure amplitude, complex, 261Structure analysis

direct, 103electron diffraction, 413

Structure determination of close-packedstackings, 756±758

Structure factor(s), 590, 941determination, 735magnetic, 725, 728, 730magnetic orbital, 731magnetic, unit-cell, 591magnetic X-ray, 733measurement by electron diffraction, 416nuclear, 595, 725, 730partial, 112SANS, 112

SUBJECT INDEX

c:\itfc\sindex.3d

997

Structure factor(s)spin, 731X-ray, 737

Structure imaging, electron diffraction, 424Structure prediction, 897Structure refinement, 426Student's t distribution, 704Subfamilies, 769Sub-grains, 114Sublimed films, 176Sulfur, Fermi level, 406Superficial layers (see also Epitaxic layers),

study of, 525Superlattices, determination of, 525Supermirrors, 435Superposition structure, 763Superspace, 944

embedding, 908Superspace groups, 909, 912, 916, 940, 945

(2+1)-dimensional (table), 920(2+2)-dimensional (table), 921(3+1)-dimensional (table), 922±934equivalent, 940full symbols, 921short symbols, 921symbols for, 921

Superstructure, 919Surface diffraction, 24Surface of a particle, 93Surface plasmons, 403Surface-roughness scattering, 108, 128Surface structure, 428Symmetric arrangement in single-crystal

methods, 509, 521±526, 529±531Symmetry

conditions for second cumulant tensors,695±696

elements, non-crystallographic, 907enhanced, 13group, 908of Patterson synthesis, 21spherical, 103

Symmorphism, 15, 897Synchrotron radiation, 54, 99, 114, 119, 187,

191, 596, 623, 653, 665, 711camera systems for, 100determination of wavelength, 495facilities (for EXAFS), 219for XED, 84sources, 38, 198, 495special applications, 189spectrum, 197

Synchrotron X-ray topography, 120Systematic errors (see also Aberrations), 490,

492, 501, 653±665, 707background, 661±665connected with collimation, 523±524detection and treatment, 498±499, 707±709estimation of, 535in counter-diffractometer methods, 518,

535in divergent-beam methods, 515in photographic methods, 508, 515, 535in single-crystal spectrometers, 521, 522,

523in the Bond method, 523±525of wavelength determination, 535plasmon scattering, 660Raman scattering, 660±661reduced experimentally, 512, 515, 521, 526,

528±530

Systematic errors (see also Aberrations)reduced by detailed analysis of Kossel

patterns, 512±515reduced by extrapolation, 505, 535reduced by least-squares refinement, 517remanent, 408specimen displacement, 517, 531testing for, 498±499thermal diffuse scattering, 653±657white radiation, 661±665

Systematic interactions, 81

Take-off angle, 74Talc±pyrophyllite group, 768±770Tangent formula, 428Tau operations, 764Television area detectors, 630Television camera tubes, 632TEM (transmission electron microscopy), 171,

428, 540Temperature correction, 524Temperature dependence of lattice parameters,

study of, 507, 530Temperature factor(s), 586

anisotropic, 697generalized, 586librational, 724

Tensors, symmetry of, 695±696Tetragonal crystal system, 7, 17Tetrahedral sheet, 767Texture

axis, 412basis, 412fibre, 413lamellar, 412patterns, 412

Theoretical photo-effect data, 221Theoretical Rayleigh scattering data, 221Thermal diffuse scattering, 415, 653, 656,

661, 711correction, anisotropic, 655correction factor, 654correction factor for thermal neutrons, 656error, 653

Thermal effects, error connected with, 515Thermal expansion, 154

study of, 510, 516, 522, 525, 529Thermal neutron detection, 644±652

detection process, 644±648detection systems, 649±651electronic aspects, 648via gas ionization, 645via scintillation, 645

Thermal smearing, 723Thermodynamic properties, 154Thickness

distance distribution function of, 103fringes, 735of crystal (sample), 512, 513of lamellar particles, 93

Thin films and thinning, 173Thin sections, 171, 174Thinning solution, 175Thomas±Fermi method, 659Thomas±Fermi model, 243Thomson formula, 90Thomson scattering, 733

by a free electron, 242Three-axis spectrometers, 444Three-beam fringes, 422Three-dimensional crystal classes, 15±20

Tilt(s)of beam, 524of crystals, 530

Tilt-series reconstruction method, 427Time-averaged flux, 431Time-constant errors, 492Time-of-flight neutron diffraction, 87, 431Time-of-flight SANS, 106Time-of-flight spectrometers, 444Time reversal, 591Topography, 113±123, 516, 525±527

detectors suitable for, 634Topotaxy, 154Total coincidence operations, 761Total counting rates, 666Total external reflection, 525Total scattering cross section, 594Total scattering lengths, 91Townsend avalanches, 619Trace of S singularity, 697Transformation(s)

compensating, 940gnomonic, 29stereographic, 29twins, 10

Transition elements, Fermi level, 406Transition-radiation X-rays, 192Translation, internal, 912Translation tensor, 697Translations, compensating, 940Transmission coefficients, 601Transmission electron microscopy (TEM),

428, 540preparation of specimens, 171

Transmission factor for XED, 86Transmission function, 414, 432Transmission geometry, 512, 513, 525

crystal thickness for, 512, 513Transmission method, advantage of, 52Transmission specimen, �±2� scan, 49Transmission topographs, 113, 114, 124Transparency aberration, 49Traverse topograph, 115Triaxial bodies, homogeneous, 92Triclinic crystal system, 6Tricontadipole, 716Trigonal crystal system, 7, 18Trigonometric intensity factors, 596Trimercury dichloride disulfide, 766,

771±772Trioctahedral sheet, 767Triple-axis spectrometers, 444, 531±532Triple-crystal spectrometers, 531±532Triple isotopic replacement, 111Triple-reflection scheme, 532Truncation level, 518

optimum, 520Trust-region methods, 683Tungsten

lattice parameter of, 499reflection angles, 499, 502

Turbostratic structures, 760TV cameras, X-ray-sensitive, 633Twin(s)

axis, 10, 11axis, rational, 10boundary, 10Brazil, 11centre, 10centred lattice, 11components, 10

SUBJECT INDEX

c:\itfc\sindex.3d

998

Twin(s)cyclic, 10DauphineÂ, 11element, 10, 14growth, 10index, 11interface, 10inversion, 10, 12lattices, 10law, 10mechanical (deformation, glide), 10mimetic, 153multiple, 10operation, 10plane, 10, 11polysynthetic, 10primitive lattice, 11quartz, 11reflection, 10, 12repeated, 10rotation, 10, 12simulated Laue class of, 13transformation, 10

Twinned crystal, reflection conditions, 13Twinning, 10

by merohedry, 12by pseudomerohedry, 12in polytypes, 762reciprocal-space implications, 12

Two-beam approximation, 80, 260Two-circle diffractometers, 517

matrix formulae, 517Two-dimensional crystal classes, 15, 16Two-line symbols for Bravais classes, 915,

920

Ultramicrotomy, 171Ultraviolet radiation, 187, 189Umweganregung, 527Undulators, 197Uniformity of response, 625Unit cell

conventional, 913conventional or centred, 2magnetic structure factor, 591primitive, 2volume, 2

Unsmoothed high-tension supplies, 667Upper-layer photographs (precession), 35Upper-layer photographs (Weissenberg), 35Upper quartile, 813

V-shaped detector recording, 32Valence map, X ± X, X ± N, and X ±(X+N),

714Vanadium, scattering from, 594Variable reduction method, 693Variance, 679

of centroid, 520of measure of location, 519of median, 520of peak, 520of single midpoint of chord, 520

Variance±covariance matrices, 680, 692,707

Variances of measured intensities (recordedcounts), 519

Variations in cell parameters, 522VC (vicinity condition), 763VC layers, 765VC structures, 765

Vector(s)basis, 944energy-flow, 119lattice, 2module, 907, 937, 944Poynting, 119reciprocal-lattice, 3scattering, 3

Velocity of sound, 656Velocity of the elastic wave, 654Vermiculites, 765Vertical divergence, 82Vertical inclination

correction for, 522of incident beam, 522of reflected beam, 522

Vibrating-string method for densitymeasurement, 158

Vibration, normal modes, 653Vicinity condition (VC), 763Viruses, SANS, 106, 111Visual estimation, 618Voids in close-packed structures, 753Voigt function, 67, 711Volume

of a homogeneous particle, 92plasmons, 398

Volumenometry, 158Voronoi polyhedron, 774

Waller±Hartree method, 659Wave amplitudes, dynamical, 414Wavefunction, 186Wavelength calibration, 55Wavelength determination, 506, 528, 533

accuracy of, 526errors in, 541

Wavelength filter, 528Wavelength normalization (Laue), 39Wavelength problems, 492Wavelength selection, 75

easy, 55Wavelength shifts, 197Wavelengths -rays, 187determination, 533distribution, 506errors, 492synchrotron radiation, 187uncertainty, 536X-rays, 187, 191, 200, 201, 206, 209

Wavevector, 186Weak-peak measurement, 65Weak-phase-object (WPO) approximation,

423, 427Weighted R factors, 68Weissenberg camera, setting of single crystals,

168Weissenberg diffractometer, 517Weissenberg geometry, 34White-beam energy-dispersive X-ray

diffraction, 622White-beam neutron diffraction, 87, 124White radiation, 661

in double-crystal spectrometer, 529in lattice-parameter determination, 507,

508, 529streaks and crystal setting, 169topography, 119

Whole-powder-pattern fitting, 68Wien filter, 396

Wigglers, 197Wigner±Eckart theorem, 727Window thinning method, 174WPO (weak-phase-object) approximation,

423, 427Wurtzite, 754Wyckoff positions, 914

XAFS (extended X-ray absorption finestructure), 24, 189, 213±220, 254, 409

as a short-range-order phenomenon, 214data analysis, 217

XANES (X-ray absorption near-edgestructure), 214±220, 258, 403

XED (X-ray energy-dispersive diffraction), 84XPS (X-ray photoemission spectroscopy), 189X-ray absorption, 599±612X-ray absorption coefficients, 220

absolute measurement of, 214data analysis of EXAFS, 217±218experimental techniques, 214

X-ray absorption near-edge structure(XANES), 214±220, 258, 401

X-ray absorption spectra, 213±241X-ray attenuation coefficients, 220X-ray background over a spot, 34X-ray beam

extremely parallel, 532highly divergent, 507, 508, 510±516in single-crystal techniques, 507well collimated, 507, 508, 536

X-ray diffractiondetectors for, 618±638texture patterns, 412

X-ray dispersion corrrections, 241X-ray energies, 236X-ray energy-dispersive diffraction (XED), 84X-ray generators, 72X-ray imaging systems, 633X-ray incoherent scattering factors, 389X-ray interferometry, 201

combined with optical interferometry,533±534

X-ray levels, 191X-ray microanalysis, 82X-ray microscopy, 189X-ray optics, 37X-ray phosphors, 631X-ray photoemission spectroscopy (XPS),

189X-ray powder techniques, 42±79, 492±503

aberrations in, 47±50energy-dispersive, 58filters, 78±79focusing geometries, 43history, 42±43literature, 42±43microdiffractometry, 53±54monochromators in, 43, 76±78parallel-beam geometries, 54Seemann±Bohlin geometry, 43, 52±53Soller slits in, 50, 56specimen fluorescence in, 43zero position, 46

X-ray scattering, 554±590magnetic, 733

X-ray-sensitive TV cameras, 633X-ray source(s), 191

conventional, 37in the sample, 510laser plasma, 189

SUBJECT INDEX

c:\itfc\sindex.3d

999

X-ray source(s)on the sample, 510outside the sample, 510radioactive, 195synchrotron, 38, 196X-ray tube, 193

X-ray spectra, 71, 74Bremsstrahlung, 191

X-ray spectrometersBragg, 510double-crystal, 528symmetric, 510, 521, 529triple-crystal, 530

X-ray techniques, single-crystal, 26X-ray topography, 115, 516, 525±527

X-ray tubes, 71±74, 193loading, 195power dissipation in, 195

X-ray wavelengths, 187, 191, 200±212, 221conversion factors, 191in single-crystal methods, 506

X-rayshard, 187properties, 187soft, 187special applications, 189

Z-module, 907Zebra patterns, 119Zeeman polarizers, 442

Zero-angle calibration, 494Zero-error elimination, 517, 521, 523, 529Zero-layer photographs (precession), 35Zero-layer photographs (Weissenberg), 34Zero line, 415Zero-order Laue zone (ZOLZ), 418Zero plane, 415Zero-point correction, 517Zero setting, 528Zhdanov notation, 752Zinc oxide (intensity standard), 503Zinc sulfide, 754ZOLZ (zero-order Laue zone), 418Zone axis, 3, 10Zone equation, 4

SUBJECT INDEX

c:\itfc\sindex.3d

1000

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