Agilent 3070/i5000GOEPEL electronics‘ Boundary Scan integration for Agilent In-Circuit tester

• reduction of adapter costs through Boundary Scan in In-Circuit tester

• integration packages for Plug-In card (PIC) and Performance Port (PPT)

• faster test times through optimized interface

• galvanically isolated interface for Boundary Scan

• decoupled power supply for SCANFLEX®

• active delay compensation for optimizing of the TAP

• integrated program execution

• CION integration and manual interaction

• fast system diagnostics in case of errors

JTAG/Boundary Scan

BS/Agilent3070 / E / 06-2014

ISO 9001 certified

GOEPEL electronic GmbH

Goeschwitzer Str. 58 /60

07745 Jena /Germany

Phone: +49 (0) - 3641 - 6896 -0

Fax: +49 (0) - 3641 -6896 - 944

Email: sales@goepel.com

Web: www.goepel.com

Authorised Distributor:

sales@goepel.co.uk sales@goepelusa.com sales@goepel.asia sales@goepel.fr sales@goepel.in

Xvision error indication

Test plan GOEPEL electronics

JTAG/Boundary ScanAgilent 3070/i5000

Agilent Medialist i5000

GOEPEL electronics offers a professional Boundary Scan op-tion especially for In-Circuit testers of the 3070/i5000 series by Agilent. It provides signifi cant advantages in automatic produc-tion compared to classic stand-alone solutions.

The integrated error report shows errors for the In-Circuit test as well as for the Boundary Scan test in the output window of the Agilent system. Boundary Scan combined with ICT reduces requirements for the mechanic access, which minimizes adapter costs and enables testability for otherwise untestable nets.

GOEPEL electronics offers complete integration packages in dif-ferent levels, which differ in hardware performance and software options.

Each integration package contains the PCI controller and a special SCANFLEX transceiver for installation into the Agilent In-Circuit tester. It is available in versions as a Plug-in Card (PIC) or Performance Port Card (PPT). Both versions are designed with 4 TAPs and decouple all Boundary Scan signals from the ICT interface with relays to avoid interferences during non-operating state. The power supply of the transceiver is provided through a SCANFLEX power supply to ensure the galvanic isolation from the ICT.

Furthermore, each package includes „SYSTEM CASCON™ for Agilent 3070“, a demo reference board for quick system diag-nostics and a one-year maintenance contract for software and hardware.

The SCANFLEX principle offers optimized signal quality for test frequencies up to 80 MHz under ideal conditions. Thereby, mo-dern ESA technologies such as VarioTAP® and ChipVORX® can be used effectively on the ATE.

Optionally, interactive tests between Boundary Scan and ICT can be realized by installing CION modules into the test adapter.

Many developers and manufacturers of electronic products have already optimized their production systems through system integration.