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5/20/2013
1
Chapter 31
Other DOE Considerations
31.1 Latin Square Designs and
Youden Square Designs
• A Latin square design is useful to investigate the effects of
different levels on a factor while having two different
blocking variables.
• Restrictions for use are that the number of rows, columns,
and treatments must be equal and there must be no
interactions.
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31.1 Latin Square Designs and
Youden Square Designs
• For example, a Latin square design could be used to
investigate a response where the blocking variables are
machines and operators.
• If we consider operators A, B, C, and D, a 4x4 Latin square
design would then be
Run Machine
1 2 3 4
1 A B C D
2 B C D A
3 C D A B
4 D A B C
31.1 Latin Square Designs and
Youden Square Designs
• A 3x3 Latin square design is sometimes called a Taguchi L9
orthogonal array.
• The analysis of a Latin square is available in Minitab (called
Taguchi designs).
• The Latin square design is not considered to be a factorial
design since it does not allow for interaction between
separate factors composing the design.
• Hunter (1989a) warns of dangers from misuse of Latin
square design.
• Youden square designs are similar to Latin square designs
with wide choice of the number of rows as design
alternatives.
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31.2 Evolutionary Operation (EVOP)
• Evolutionary operation (EVOP) is an analytical approach
targeted at securing data from a manufacturing process
where process conditions are varied in a planned factorial
structure from one lot to another without jeopardizing the
manufactured product.
• For previously described DOEs it is typically desirable to
include as many factors as possible in each design, which
keeps the factors studied-to-runs ratio as high as possible.
However, the circumstances when conducting an EVOP are
different.
• Box et al. (1978) provides the following suggestions when
conducting an EVOP:
31.2 Evolutionary Operation (EVOP)
• Because the signal/noise ratio must be kept low, a large
number of runs is usually necessary to reveal the effects of
changes.
• However, these are manufacturing runs that must be made
anyway and result in very little additional cost.
• In the manufacturing environment things need to be simple,
and usually it is practical to vary only two or three factors in
any given phase of the investigation.
• In these circumstances it makes sense to use replicated 22
or 23 factorial designs, often with an added center-point.
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31.2 Evolutionary Operation (EVOP)
• As results become available, averages and estimates of
effects are continually updated and displayed on an
information board as a visual factory activity in the area
under investigation.
• The information board must be located where the results are
visible to those responsible for running the process.
• In consultation with an EVOP committee, the process
supervisor uses the information board as a guide for better
process conditions.
31.3 Example 31.1: EVOP
• A study was conducted to decrease the cost per ton of a
product in a petrochemical plant (Jenkins l969; Box et al. I978).
• For one stage of the investigation two variables believed
important were:
• Reflux ratio of a distillation column
• Ratio of recycle flow to purge flow
• Changes to the magnitude of the input variables were expected
to cause transients, which would subside in about 6 hours.
Measurements for the study would be made during an
additional 18 hours of steady operation.
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31.3 Example 31.1: EVOP
7.25
7.5
7.75
8
6.5 6.7 6.9 7.1Recycle
/Pu
rge R
ati
o
Reflux Ratio
Phase I - 5 cycles
£ 92
£ 86
£ 92
£ 91
£ 95
31.3 Example 31.1: EVOP
• Recorded response was
the average cost per ton.
• The design was a 22
factorial with a center point.
Effects and their std. dev.
Reflux ratio 4.01.5
Recycle/purge ratio -5.01.5
Interaction 1.01.5
31.3 Example 31.1: EVOP
Effects and their std. dev.
Reflux ratio 1.01.0
Recycle/purge ratio -3.01.0
Interaction 0.01.0
7.75
8
8.25
8.5
5.5 5.9 6.3 6.7Recycle
/Pu
rge R
ati
o
Reflux Ratio
Phase II - 5 cycles
£ 80
£ 83
£ 81
£ 84
£ 82
8
8.25
8.5
8.75
5.5 5.9 6.3 6.7Recycle
/Pu
rge R
ati
o
Reflux Ratio
Phase III - 4 cycles
£ 86
£ 84
£ 85
£ 83
£ 80
Effects and their std. dev.
Reflux ratio -1.01.5
Recycle/purge ratio 2.01.5
Interaction 0.01.5
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31.3 Example 31.1: EVOP
• The cost for the described 4½-month program was £6,000,
which resulted in a per-ton cost reduction from £92 to £80. The
annualized saving was £100,000.
31.4 Fold-over Designs
• A technique called fold-over can be used to create a
resolution IV design from a resolution III design.
• To create a fold-over design, simply include with the original
resolution III design a second fractional factorial design with
all the signs reversed.
• This fold-over process can be useful in the situation where
the experimenter has performed a resolution III design
initially and now wishes to remove the confounding of the
main and 2-factor interaction effects.
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31.4 Fold-over Designs
1 2 3 4 5 6 7
V+ * * 3
V
IV * * * * 4
III * * * * 5 6 7
1 + - - + - + +
2 + + - - + - +
3 + + + - - + -
4 - + + + - - +
5 + - + + + - -
6 - + - + + + -
7 - - + - + + +
8 - - - - - - -
1 2 3 4 5 6 7
1 + - - + - +
2 + + - - + -
3 + + + - - +
4 - + + + - -
5 + - + + + -
6 - + - + + +
7 - - + - + +
8 - - - - - -
- + + - + -
- - + + - +
- - - + + -
+ - - - + +
- + - - - +
+ - + - - -
+ + - + - -
+ + + + + +
1 2 3 4 5 6 7 8 9 10 11
V+ * * * 4
V * * * *
IV * * * * * 6
III * * * * * * * * 9 10 11
1 + - - - + - - + + - +
2 + + - - - + - - + + -
3 + + + - - - + - - + +
4 + + + + - - - + - - +
5 - + + + + - - - + - -
6 + - + + + + - - - + -
7 - + - + + + + - - - +
8 + - + - + + + + - - -
9 + + - + - + + + + - -
10 - + + - + - + + + + -
11 - - + + - + - + + + +
12 + - - + + - + - + + +
13 - + - - + + - + - + +
14 - - + - - + + - + - +
15 - - - + - - + + - + -
16 - - - - - - - - - - -
1 2 3 4 5 6 7 8 9 10 11
31.5 DOE: Attribute Response
• In some situations, the appropriate response for a trial may
be an attribute data, e.g., number of failures in n trials.
• If the sample size is the same for each trial, the attribute
data can be analyzed, but a data transformation may be
needed.
• The accuracy of the analysis can become questionable
whenever the sample size is such that many trials have no
failures.
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31.6 DOE: Reliability Evaluations
• In some situations, it is beneficial when doing a reliability
evaluation to build and test devices/systems using a DOE
structure.
• This strategy can be beneficial when deciding on what
design changes should be implemented to fix a problem.
• This strategy can also be used to describe how systems are
built/configured when running a generic reliability test during
early stages of production.
• In this type of test, if all trials experience failures, a failure
rate or time of failure could be the response that is used for
the DOE analysis, with transformation considerations.
31.7 Factorial Designs with more than
2 Levels
• A multiple-experiment strategy that builds on two-level
fractional factorials can be a very useful approach for
gaining insight into what is needed to better understand and
improve a process.
• Usually nonlinear conditions can be addressed by not being
too bold when choosing factorial levels.
• If a description of a region is necessary, a response surface
design such as Box-Behnken or central composite design
(CCD) can be beneficial (see Chapter 33).
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31.7 Factorial Designs with more than
2 Levels
• Tables M1 to M5 can be used to create designs for these test
considerations. To do this, combine the contrast columns of the
designs in Tables M1 to M5 for these test considerations (e.g., - -
= source W, - + = source X, + - = source Y, + + = source Z).
• However, an additional contrast column needs to be preserved in
the case of four levels, because there are 3 degrees of freedom
with 4 levels (4 levels - 1 = 3 degrees of freedom). The contrast
column to preserve is normally the contrast column that contains
the two-factor interaction effect of the two contrast columns
selected to represent the four levels.
• For example, if the A and B contrast columns were combined to
define the levels, the AB contrast column should not be assigned
a factor. These three contrast columns contain the four-level
main effect information.
31.7 Factorial Designs with more than
2 Levels
• For test efficiency, most factor-level considerations above
the level of 2 should be reduced to the value of 2 during an
initial DOE experiment. Higher-level considerations that
cannot be eliminated from consideration can still be
evaluated in a test strategy that consists of multiple
experiments. When the factors that significantly affect a
response are reduced to a manageable number through
two-level experiments, response surface analysis
techniques can be used to find the factor levels that optimize
a response.
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31.8 Example 31.2:
Creating a 2-level DOE Strategy from a
Many-level Factorial Initial Proposal • Consider 2-level factorial experiments
where possible. However, it is
sometimes not very obvious how to
make the change from an experiment
design of many-level considerations.
• An experiment is proposed that
considers an output as a function of
the following factors, where the factor
A may be temperature at 4 levels and
B to F may consider the effects from
other process tolerances.
Factors # of
Levels
A 4
B 3
C 2
D 2
E 2
F 2
31.8 Example 31.2:
Creating a 2-level DOE Strategy from a
Many-level Factorial Initial Proposal • To use an experiment design that considers all possible
combinations of the factors, there would need to be 193
experiment trials.
• By changing all factors to 2-levels and reducing the amount
of interaction output information, a design alternative can be
determined using Tables M1 to M5. This experiment can
then be performed in 8, 16, 32 trials depending on the
desired resolution.
• A series of 2-level experiments is a more efficient test
strategy. After the significant parameters are identified, a
follow-up experiment is made at a resolution that better
assesses main effects and the 2-factor interactions.
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31.9 Example 31.3:
Resolution III DOE with Interaction
Consideration • An experimenter wants to assess the effects of 14 2-level
factors (A-N) on an output. Two of these factors are
temperature and humidity. Each test trial is very expensive,
hence, only a 16-trial resolution III screening experiment is
planned. However, the experimenter is concerned that
temperature and humidity may interact.
• From Table M3, it is noted that for a 14-factor experiment,
the 15th contrast column is not needed for any main effect
consideration. This column could be used to estimate
experimental error or the temperature-humidity interaction.
31.9 Example 31.3:
Resolution III DOE with Interaction
Consideration • To make the temperature-humidity interaction term appear in
this column, the factor assignments must be managed such
that they are consistent with this column.
• From Table N3, it is noted that there are several assignment
alternatives (i.e., AD, BH, GI, EJ, KL, FM, and CN). For
example, temperature could be assigned an A while
humidity is assigned a D.
• This method could be extended to address more than one
interaction consideration for both III and IV designs.
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31.10 Example 31.4:
Analysis of a Resolution III Experiment
with 2-Factor Interaction Assessment • A resolution III experiment was conducted to determine if a
product would give a desirable response under various
design tolerance extremes and operating conditions.
• The experiment had 64 trials with 52 2-level factors (A-Z, a-
z). From Table M5, the experiment design is as follows,
31.10 Example 31.4:
Analysis of a Resolution III Experiment
with 2-Factor Interaction Assessment Factors A B C D E F G H I J K L M N O P Q R S T U V W X Y Z a b c d e f g h i j k l m n o p q r s t u v w x y z Contrast 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52
1 + - - - - - + - - - - + + - - - + - + - - + + + + - + - - - + + + - - + - - + - + + - + + + - + + - - + 2 + + - - - - - + - - - - + + - - - + - + - - + + + + - + - - - + + + - - + - - + - + + - + + + - + + - - 3 + + + - - - - - + - - - - + + - - - + - + - - + + + + - + - - - + + + - - + - - + - + + - + + + - + + - 4 + + + + - - - - - + - - - - + + - - - + - + - - + + + + - + - - - + + + - - + - - + - + + - + + + - + + 5 + + + + + - - - - - + - - - - + + - - - + - + - - + + + + - + - - - + + + - - + - - + - + + - + + + - + 6 + + + + + + - - - - - + - - - - + + - - - + - + - - + + + + - + - - - + + + - - + - - + - + + - + + + - 7 - + + + + + + - - - - - + - - - - + + - - - + - + - - + + + + - + - - - + + + - - + - - + - + + - + + + 8 + - + + + + + + - - - - - + - - - - + + - - - + - + - - + + + + - + - - - + + + - - + - - + - + + - + + 9 - + - + + + + + + - - - - - + - - - - + + - - - + - + - - + + + + - + - - - + + + - - + - - + - + + - +
10 + - + - + + + + + + - - - - - + - - - - + + - - - + - + - - + + + + - + - - - + + + - - + - - + - + + - 11 - + - + - + + + + + + - - - - - + - - - - + + - - - + - + - - + + + + - + - - - + + + - - + - - + - + + 12 + - + - + - + + + + + + - - - - - + - - - - + + - - - + - + - - + + + + - + - - - + + + - - + - - + - + 13 + + - + - + - + + + + + + - - - - - + - - - - + + - - - + - + - - + + + + - + - - - + + + - - + - - + - 14 - + + - + - + - + + + + + + - - - - - + - - - - + + - - - + - + - - + + + + - + - - - + + + - - + - - + 15 - - + + - + - + - + + + + + + - - - - - + - - - - + + - - - + - + - - + + + + - + - - - + + + - - + - - 16 + - - + + - + - + - + + + + + + - - - - - + - - - - + + - - - + - + - - + + + + - + - - - + + + - - + - 17 + + - - + + - + - + - + + + + + + - - - - - + - - - - + + - - - + - + - - + + + + - + - - - + + + - - + 18 - + + - - + + - + - + - + + + + + + - - - - - + - - - - + + - - - + - + - - + + + + - + - - - + + + - - 19 + - + + - - + + - + - + - + + + + + + - - - - - + - - - - + + - - - + - + - - + + + + - + - - - + + + - 20 + + - + + - - + + - + - + - + + + + + + - - - - - + - - - - + + - - - + - + - - + + + + - + - - - + + + 21 + + + - + + - - + + - + - + - + + + + + + - - - - - + - - - - + + - - - + - + - - + + + + - + - - - + + 22 - + + + - + + - - + + - + - + - + + + + + + - - - - - + - - - - + + - - - + - + - - + + + + - + - - - + 23 + - + + + - + + - - + + - + - + - + + + + + + - - - - - + - - - - + + - - - + - + - - + + + + - + - - - 24 + + - + + + - + + - - + + - + - + - + + + + + + - - - - - + - - - - + + - - - + - + - - + + + + - + - - 25 - + + - + + + - + + - - + + - + - + - + + + + + + - - - - - + - - - - + + - - - + - + - - + + + + - + - 26 + - + + - + + + - + + - - + + - + - + - + + + + + + - - - - - + - - - - + + - - - + - + - - + + + + - + 27 - + - + + - + + + - + + - - + + - + - + - + + + + + + - - - - - + - - - - + + - - - + - + - - + + + + - 28 - - + - + + - + + + - + + - - + + - + - + - + + + + + + - - - - - + - - - - + + - - - + - + - - + + + + 29 + - - + - + + - + + + - + + - - + + - + - + - + + + + + + - - - - - + - - - - + + - - - + - + - - + + + 30 - + - - + - + + - + + + - + + - - + + - + - + - + + + + + + - - - - - + - - - - + + - - - + - + - - + + 31 - - + - - + - + + - + + + - + + - - + + - + - + - + + + + + + - - - - - + - - - - + + - - - + - + - - + 32 + - - + - - + - + + - + + + - + + - - + + - + - + - + + + + + + - - - - - + - - - - + + - - - + - + - -
5/20/2013
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31.10 Example 31.4:
Analysis of a Resolution III Experiment
with 2-Factor Interaction Assessment Factors A B C D E F G H I J K L M N O P Q R S T U V W X Y Z a b c d e f g h i j k l m n o p q r s t u v w x y z Contrast 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52
33 + + - - + - - + - + + - + + + - + + - - + + - + - + - + + + + + + - - - - - + - - - - + + - - - + - + - 34 + + + - - + - - + - + + - + + + - + + - - + + - + - + - + + + + + + - - - - - + - - - - + + - - - + - + 35 - + + + - - + - - + - + + - + + + - + + - - + + - + - + - + + + + + + - - - - - + - - - - + + - - - + - 36 - - + + + - - + - - + - + + - + + + - + + - - + + - + - + - + + + + + + - - - - - + - - - - + + - - - + 37 - - - + + + - - + - - + - + + - + + + - + + - - + + - + - + - + + + + + + - - - - - + - - - - + + - - - 38 + - - - + + + - - + - - + - + + - + + + - + + - - + + - + - + - + + + + + + - - - - - + - - - - + + - - 39 - + - - - + + + - - + - - + - + + - + + + - + + - - + + - + - + - + + + + + + - - - - - + - - - - + + - 40 + - + - - - + + + - - + - - + - + + - + + + - + + - - + + - + - + - + + + + + + - - - - - + - - - - + + 41 + + - + - - - + + + - - + - - + - + + - + + + - + + - - + + - + - + - + + + + + + - - - - - + - - - - + 42 + + + - + - - - + + + - - + - - + - + + - + + + - + + - - + + - + - + - + + + + + + - - - - - + - - - - 43 + + + + - + - - - + + + - - + - - + - + + - + + + - + + - - + + - + - + - + + + + + + - - - - - + - - - 44 - + + + + - + - - - + + + - - + - - + - + + - + + + - + + - - + + - + - + - + + + + + + - - - - - + - - 45 - - + + + + - + - - - + + + - - + - - + - + + - + + + - + + - - + + - + - + - + + + + + + - - - - - + - 46 + - - + + + + - + - - - + + + - - + - - + - + + - + + + - + + - - + + - + - + - + + + + + + - - - - - + 47 - + - - + + + + - + - - - + + + - - + - - + - + + - + + + - + + - - + + - + - + - + + + + + + - - - - - 48 + - + - - + + + + - + - - - + + + - - + - - + - + + - + + + - + + - - + + - + - + - + + + + + + - - - - 49 - + - + - - + + + + - + - - - + + + - - + - - + - + + - + + + - + + - - + + - + - + - + + + + + + - - - 50 - - + - + - - + + + + - + - - - + + + - - + - - + - + + - + + + - + + - - + + - + - + - + + + + + + - - 51 - - - + - + - - + + + + - + - - - + + + - - + - - + - + + - + + + - + + - - + + - + - + - + + + + + + - 52 + - - - + - + - - + + + + - + - - - + + + - - + - - + - + + - + + + - + + - - + + - + - + - + + + + + + 53 + + - - - + - + - - + + + + - + - - - + + + - - + - - + - + + - + + + - + + - - + + - + - + - + + + + + 54 - + + - - - + - + - - + + + + - + - - - + + + - - + - - + - + + - + + + - + + - - + + - + - + - + + + + 55 - - + + - - - + - + - - + + + + - + - - - + + + - - + - - + - + + - + + + - + + - - + + - + - + - + + + 56 - - - + + - - - + - + - - + + + + - + - - - + + + - - + - - + - + + - + + + - + + - - + + - + - + - + + 57 - - - - + + - - - + - + - - + + + + - + - - - + + + - - + - - + - + + - + + + - + + - - + + - + - + - + 58 + - - - - + + - - - + - + - - + + + + - + - - - + + + - - + - - + - + + - + + + - + + - - + + - + - + - 59 - + - - - - + + - - - + - + - - + + + + - + - - - + + + - - + - - + - + + - + + + - + + - - + + - + - + 60 - - + - - - - + + - - - + - + - - + + + + - + - - - + + + - - + - - + - + + - + + + - + + - - + + - + - 61 - - - + - - - - + + - - - + - + - - + + + + - + - - - + + + - - + - - + - + + - + + + - + + - - + + - + 62 - - - - + - - - - + + - - - + - + - - + + + + - + - - - + + + - - + - - + - + + - + + + - + + - - + + - 63 - - - - - + - - - - + + - - - + - + - - + + + + - + - - - + + + - - + - - + - + + - + + + - + + - - + + 64 - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - -
31.10 Example 31.4:
Analysis of a Resolution III Experiment
with 2-Factor Interaction Assessment • Consider that an analysis indicated that only contrast 6, 8,
and 18 were found statistically significant, which implies that
factors F, H, and R are statistically significant.
• However, from Table N3, it is noted that contrast column 6
(factor F) also contains the HR interaction, contrast column 8
(factor H) also contains the FR interaction, and contrast
column 18 (factor R) also contains the FH interaction. One
of the three 2-factor interactions might be making the third
contrast column statistically significant.
• To assess which of these scenarios is most likely from a
technical point of view, interaction plots can be made of the
possibilities assuming that each of them are true.
5/20/2013
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31.11 Example 31.5:
DOE with Attribute Response
• A manufacturing surface mount assembles electrical
components onto a printed circuit board (PCB). Visual
assessment at several locations on the PCB of residual flux
and tin (Sn) residuals (lower value is most desirable). A
DOE was conducted with the following factors
Factors (−𝟏) Level (+𝟏) Level
A: Paste age (paste_age) Fresh Old
B: Humidity (humdty) Ambient High
C: Print-reflow time (pr_rfw_tm) Short Long
D: IR temperature (ir_temp) Low High
E: Cleaning temperature (cln_temp) Low High
F: Is component present (comp_prs) No Yes
31.11 Example 31.5:
DOE with Attribute Response
• Inspectors were not blocked within the experiment though
they should have been.
• The results of the experiment with the trials are as follows,
Trial A B C D E F Insp Flux Sn
1 -1 -1 +1 -1 -1 -1 +1 0 3
2 +1 +1 +1 -1 -1 -1 +1 0 0
3 -1 +1 +1 -1 -1 +1 +1 0 0
4 +1 -1 +1 -1 -1 +1 +1 0 25
5 -1 +1 +1 +1 -1 -1 +1 7 25
6 +1 -1 +1 +1 -1 -1 +1 5 3
7 -1 -1 +1 +1 -1 +1 +1 11 78
8 +1 +1 +1 +1 -1 +1 +1 13 67
9 -1 +1 -1 -1 +1 -1 -1 0 0
10 +1 -1 -1 -1 +1 -1 -1 0 12
11 -1 +1 -1 -1 +1 +1 -1 0 150
12 +1 -1 -1 -1 +1 +1 -1 0 94
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15
31.11 Example 31.5:
DOE with Attribute Response
Trial A B C D E F Insp Flux Sn
13 -1 -1 -1 +1 +1 -1 -1 0 424
14 +1 +1 -1 +1 +1 -1 -1 0 500
15 -1 -1 -1 +1 +1 +1 -1 0 1060
16 +1 +1 -1 +1 +1 +1 -1 0 280
17 +1 -1 +1 -1 +1 +1 +1 0 1176
18 -1 +1 +1 -1 +1 -1 +1 24 17
19 +1 -1 +1 -1 +1 -1 +1 5 14
20 -1 -1 +1 -1 +1 +1 +1 0 839
21 +1 +1 +1 +1 +1 +1 +1 0 376
22 -1 -1 +1 +1 +1 -1 +1 0 366
23 +1 +1 +1 +1 +1 -1 +1 0 690
24 -1 +1 +1 +1 +1 +1 +1 0 722
25 -1 +1 -1 -1 -1 -1 -1 0 50
26 -1 -1 -1 -1 -1 -1 -1 0 12
27 +1 +1 -1 +1 -1 -1 -1 0 50
28 -1 +1 -1 +1 -1 +1 -1 0 207
29 +1 -1 -1 +1 -1 +1 -1 0 172
30 +1 -1 -1 +1 -1 -1 -1 2 54
31 -1 -1 -1 -1 -1 +1 +1 0 0
32 +1 +1 -1 -1 -1 +1 +1 0 2
31.11 Example 31.5:
DOE with Attribute Response
• Consider first an analysis of the flux response. There are many
0s, which makes a traditional DOE analysis impossible. However,
when the responses are ranked, there are 7 non-zero values.
The largest 6 values are with C= +1 and from the same inspector.
One might inquire whether a gage R&R study had been
conducted. These PCBs should also be reassessed.
Trial A B C D E F Insp Flux
18 -1 +1 +1 -1 +1 -1 +1 24
8 +1 +1 +1 +1 -1 +1 +1 13
7 -1 -1 +1 +1 -1 +1 +1 11
5 -1 +1 +1 +1 -1 -1 +1 7
6 +1 -1 +1 +1 -1 -1 +1 5
19 +1 -1 +1 -1 +1 -1 +1 5
30 +1 -1 -1 +1 -1 -1 -1 2
• If the results are
validated, one would
conclude that -1 level
for C is best.
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31.11 Example 31.5:
DOE with Attribute Response
• Consider next an analysis of the tin (Sn) response. Because
the response is count data, a transformation should be
considered.
31.11 Example 31.5:
DOE with Attribute Response Factorial Fit: Sn versus A, B, C, D,
E, F, Insp
Estimated Effects and Coefficients
for Sn (coded units)
Term Effect Coef
Constant 507
A 227 114
B -292 -146
C 2393 1197
D 691 345
E 634 317
F 592 296
Insp -2543 -1271
A*B -433 -216
A*C 303 151
A*D 592 296
A*E 166 83
A*F 23 12
A*Insp -178 -89
B*C -406 -203
Term Effect Coef
Constant 507
B*D -268 -134
B*E -693 -347
B*F -491 -245
C*D 163 81
C*E 179 90
C*F -8 -4
D*E 1283 642
D*F -420 -210
E*F -438 -219
A*B*C -135 -67
A*B*D -988 -494
A*C*D 178 89
A*B*E -1011 -505
A*C*E 188 94
A*B*F 466 233
A*C*F 254 127
B*C*F -294 -147
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31.11 Example 31.5:
DOE with Attribute Response
Analysis of Variance for Sn (coded units)
Source DF Seq SS Adj SS Adj MS F P
Main Effects 7 1775800 1485343 212192 * *
2-Way Interactions 16 1151550 1274442 79653 * *
3-Way Interactions 8 445497 445497 55687 * *
Residual Error 0 * * *
Total 31 3372848
31.12 Example 31.6:
A System DOE Stress to Fail Test
• During the development of a new computer, a limited amount of
test hardware is available to evaluate the overall design of the
product. 4 test systems are available along with 3 different
card/adapter types (designated as card A, card B, and adapter)
that are interchangeable between the systems.
• A “quick and dirty” fractional factorial test approach is desired
to evaluate the different combinations of the hardware along
with the temperature and humidity extremes.
• One obvious response for the experimental trial is whether the
combination of hardware “worked” or “did not work”. However,
more information was desired from the experiment than just a
binary response.
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31.12 Example 31.6:
A System DOE Stress to Fail Test
• In the past, it was shown that the system design safety factor
could be quantified by noting the 5-V power supply output level,
both upward and downward, at which the system begins to
perform unsatisfactorily.
• A probability plot was then made of these voltage values to
estimate the number of systems from the population that would
not perform satisfactorily outside the 4.7-5.3 tolerance range of
the 5-V power supply.
• Determining a low-voltage failure value could easily be
accomplished for this test procedure because this type of
system failure was not catastrophic; i.e., the system would still
perform satisfactorily again if the voltage level were increased.
31.12 Example 31.6:
A System DOE Stress to Fail Test
• However, the system voltage stressing would be suspended at
6.00 V because additional stressing might destroy more
components.
• The following table shows a 16-trial test matrix with measured
voltage levels.
• Note that the trial fractional factorial levels can be created from
Tables M1 to M5 where 4 levels of the factors are created by
combining contrast columns (e.g., --=1, -+=2, +-=3, and ++=4).
• It should be noted that the intent of this experiment was to do a
quick test at the boundaries of the conditions to assess the
range of response that might be expected when parts are
assembled in different patterns. No special care was taken
when picking the contrast columns, there will be confounding.
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31.12 Example 31.6:
A System DOE Stress to Fail Test
Temp Humi System Card A Card B Adapter Elevated Lowered
95 50 1 4 1c 4 E1 5.92 E2 4.41
95 50 3b 3 3 2 sus 6.00 E3 4.60
95 50 4 1 2 1 sus 6.00 E2 4.50
95 50 2 2 4 3 sus 6.00 E2 4.41
55 20 1 4 1c 1 sus 6.00 E2 4.34
55 20 2 1 4 2 sus 6.00 E2 4.41
55 20 3ad 2 3 3 sus 6.00 E2 4.45
55 20 4 3 2 4 sus 6.00 E2 4.51
55 85 1 1 2 2 sus 6.00 E2 4.52
55 85 2 4 3 1 sus 6.00 E2 4.45
55 85 3b 2 4 4 sus 6.00 E3 4.62
55 85 4 3 1c 3 E1 5.88 E2 4.58
95 20 1 1 2 3 sus 6.00 E2 4.51
95 20 2 3 3 4 sus 6.00 E2 4.44
95 20 3ad 4 4 1 sus 6.00 E2 4.41
95 20 4 2 1c 2 E1 5.98 E2 4.41
b Lowering 5V
caused an E3
error.
c Lowering 5V
caused an E1
error. (3 out
of 4 times
when card
B=1.
3a new system
planar board
installed.
31.12 Example 31.6:
A System DOE Stress to Fail Test
• It is noted that the system 3 planar board was changed during
the experiment. Changes of this type should be avoided;
however, if an unexpected event mandates a change, the
change should be documented.
• It is also noted that the trials containing system 3 with the
original planar resulted in a different error message when the
5V power supply was lowered to failure.
• It is also noted that the only “elevated voltage” failures occurred
(3 out of 4 times) when card B = 1. General conclusions from
observations of this type must be made with extreme caution
because aliasing and measurement errors can lead to
erroneous conclusions. Additional investigation is needed for
the purpose of confirmation or rejecting such theories.
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31.12 Example 31.6:
A System DOE Stress to Fail Test
• The basic strategy behind this type of experiment is to assess
the amount of safety factor before failure.
• The DCRCA (DOE Collective Response Capability
Assessment) plot can give some idea of the safety factor in the
design. From this plot, a best-estimate projection is that about
99.9% of the systems will perform at the low-voltage tolerance
value at 4.7.
31.12 Example 31.6:
A System DOE Stress to Fail Test
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31.12 Example 31.6:
A System DOE Stress to Fail Test
• Consider next that a similar experiment is performed with a
new level of hardware.
• From the probability plot of the low-voltage stress values, one
of the points could be an outlier. This data should be
investigated for abnormalities.
• It appears that the later design have a larger safety factor.
• In manufacturing, it is feasible for the test strategy to be
repeated periodically. Data could be monitored on 𝑥 and 𝑅
control charts for degradation/improvement as a function of
time.
31.12 Example 31.6:
A System DOE Stress to Fail Test
Temp Humi System Card A Card B Adapter Elevated Lowered
95 50 1 4 1 1 sus 6.00 E2 4.48
95 20 2 1 4 2 sus 6.00 E2 4.48
95 20 3 2 3 3 sus 6.00 E2 4.45
95 20 4 3 2 4 sus 6.00 E2 4.42
55 85 1 1 2 2 sus 6.00 E2 4.56
55 85 2 4 3 1 sus 6.00 E2 4.46
55 85 3 2 4 4 sus 6.00 E2 4.45
55 85 4 3 1 3 sus 6.00 E2 4.43
55 20 1 1 2 3 sus 6.00 E2 4.45
55 20 2 3 3 4 sus 6.00 E2 4.46
55 20 3 4 4 1 sus 6.00 E3 4.42
55 20 4 2 1 2 sus 6.00 E2 4.48
95 50 1 4 1 4 sus 6.00 E2 4.45
95 50 3 2 4 3 sus 6.00 E2 4.49
95 50 4 3 3 2 sus 6.00 E2 4.45
95 50 2 1 2 1 sus 6.00 E2 4.49
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31.12 Example 31.6:
A System DOE Stress to Fail Test
31.12 Example 31.6:
A System DOE Stress to Fail Test