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Diamond D10 Test Platform

Diamond D10 Test Platform. Diamond 10 Test System The Diamond 10 test system contains the following digital hardware: cPCI backplane—The 10-slot backplane

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Page 1: Diamond D10 Test Platform. Diamond 10 Test System The Diamond 10 test system contains the following digital hardware: cPCI backplane—The 10-slot backplane

Diamond D10 Test Platform

Page 2: Diamond D10 Test Platform. Diamond 10 Test System The Diamond 10 test system contains the following digital hardware: cPCI backplane—The 10-slot backplane

Diamond 10 Test System

The Diamond 10 test system contains the following digital hardware:

• cPCI backplane—The 10-slot backplane serves as a physical receptacle for Diamond Series instruments. The backplane uses the compact PCI (cPCI) standard, whichallows any instrument to be in any slot and facilitates the use of third party instruments.

• Instruments—Connect to the cPCI backplane and provide channel connections to the device under test (DUT). The available instruments are:

– DPIN96 digital instrument– DPS16 device power supply (DPS)– VIS16 voltage/current source– Multiwave– DIB Utility instrument

Page 3: Diamond D10 Test Platform. Diamond 10 Test System The Diamond 10 test system contains the following digital hardware: cPCI backplane—The 10-slot backplane

Software System Components

The Diamond Series software uses:• Linux operating system• C++ programming language• Standard Tester Interface Language (STIL)

Page 4: Diamond D10 Test Platform. Diamond 10 Test System The Diamond 10 test system contains the following digital hardware: cPCI backplane—The 10-slot backplane

Software System Components

The Diamond Series software uses:• Linux operating system• C++ programming language• Standard Tester Interface Language (STIL)

Page 5: Diamond D10 Test Platform. Diamond 10 Test System The Diamond 10 test system contains the following digital hardware: cPCI backplane—The 10-slot backplane

DPIN96 Digital Instrument

The features of the DPIN96 digital instrument are:• 96 channels per instrument• Per-pin timing, formatting, and levels• On-the-fly format and timeset switching• Per-pin programmable super voltage that can be triggered from the pattern• Go/no-go per-pin PMU• Precision ADC PMU per instrument• Frequency and interval counter per instrument• Reconfigurable Pattern memory that supports both parallel and scan vectors• Pattern Capture memory that captures pass/fail data on selected vectors

Page 6: Diamond D10 Test Platform. Diamond 10 Test System The Diamond 10 test system contains the following digital hardware: cPCI backplane—The 10-slot backplane

DPIN96 Digital Instrument Specification Feature SpecificationData RatesSequencer instruction rate 8 kHz – 100 MHzMaximum clock rate 200 MHzMaximum capture data rate 100 Mbps per channel

DriverRange -1.0 V – +6.0 VResolution 122 μVAccuracy ±20 mVComparatorRange -1 V – +6.0 VResolution 122 μVAccuracy ±35 mV

Timing and FormatEdges per cycle 4Edge Resolution 19.53 psFormat sets 256 combinations of per pin formatTime sets 256 combinations of period and per pin timingDrive edge accuracy ±350 psCompare edge accuracy ±350 ps

Page 7: Diamond D10 Test Platform. Diamond 10 Test System The Diamond 10 test system contains the following digital hardware: cPCI backplane—The 10-slot backplane

DPIN96 Digital Instrument ContinuedFeature SpecificationVector MemoryMaximum parallel vector depth 16 MMaximum scan vector depth 1152 M (2 chains), 576 M (4 chains),

288 M (8 chains), 144 M (16 chains)Maximum capture memory depth 16 M (1 bit per cycle)

Frequency CounterMaximum frequency 200 MHzResolution 10 ns interval, 32 bit count

Per pin Parametric Measurement UnitVoltage range -1.5 V – +6.5 VForce voltage accuracy ±20 mVMeasure voltage accuracy ±20 mVCurrent ranges ±32 mA, ±8 mA, ±2 mA, ±512 μA,

±128 μA, ±32 μA, ±8 μA, ±2 μAForce current accuracy 2% of range ±30 nAMeasure current accuracy 4% of range

Super Voltage Driver and LoadVoltage range -1.5 V – +12 VResolution 244 μVAccuracy ±20 mV

Page 8: Diamond D10 Test Platform. Diamond 10 Test System The Diamond 10 test system contains the following digital hardware: cPCI backplane—The 10-slot backplane

DPS16 Device Power Supply

The DPS16 device power supply has 16 supplies per instrument. Table 4 shows thehighlights of the DPS16 specification.

Page 9: Diamond D10 Test Platform. Diamond 10 Test System The Diamond 10 test system contains the following digital hardware: cPCI backplane—The 10-slot backplane

DPS16 Device Power Supply Specification

Feature Specification

Voltage ForceRange 0 – 6 VResolution 13 bitsAccuracy 0.1% of value ±1 mV

Voltage MeasureRanges 4 V, 8 VResolution 16 bitsAccuracy 0.1% of value ±1 mV

Current MeasureMaximum output 2 A per channel, gangable to 16 ARanges ±200 μA, ±2 mA, ±200 mA, ±2 AResolution 16 bitsAccuracy 0.2% of value ±0.1% of range

Page 10: Diamond D10 Test Platform. Diamond 10 Test System The Diamond 10 test system contains the following digital hardware: cPCI backplane—The 10-slot backplane

VIS16 Voltage/Current Source

The features of the VIS16 voltage/current source are:

• Sixteen voltage/current sources per instrument• Four quadrant voltage/current sourcing capability• Single-ended or differential voltage measurements

Page 11: Diamond D10 Test Platform. Diamond 10 Test System The Diamond 10 test system contains the following digital hardware: cPCI backplane—The 10-slot backplane

VIS16 Voltage/Current Range Specifications

Feature SpecificationChannels Per Instrument 16 ±60 V 100 mA per channel, gangable to 200 mA ±20 V 300 mA per channel, gangable to 600 mA

VIS16 Force Voltage SpecificationsRange Resolution Accuracy±2 V 16 bit ±0.03% FSR ±6 V 16 bit ±0.03% FSR ±20 V 16 bit ±0.03% FSR±60 V 16 bit ±0.03% FSR

VIS16 Current Clamp SpecificationsRange Resolution Accuracy±300 nA 16 bit ±0.2% FSR +1 nA/V ±3 μA 16 bit ±0.05% FSR +1 nA/V ±300 μA 16 bit ±0.05% FSR ±3 mA 16 bit ±0.05% FSR ±30 mA 16 bit ±0.05% FSR ±300 mA (100 mA) 16 bit ±0.05% FSR

Page 12: Diamond D10 Test Platform. Diamond 10 Test System The Diamond 10 test system contains the following digital hardware: cPCI backplane—The 10-slot backplane

VIS16 Measure Voltage SpecificationsRange Resolution Accuracy±2 V 16 bit ±0.03% FSR ±6 V 16 bit ±0.03% FSR ±20 V 16 bit ±0.03% FSR ±60 V 16 bit ±0.03% FSR

VIS16 Measure Current SpecificationsRange Resolution Accuracy ±300 nA 16 bit ±0.2% FSR +1 nA/V ±3 μA 16 bit ±0.05% FSR +1 nA1/V ±300 μA 16 bit ±0.05% FSR ±3 mA 16 bit ±0.05% FSR ±30 mA 16 bit ±0.05% FSR ±300 mA (100 mA) 16 bit ±0.05% FSR

VIS16 Differential Voltage Measurment Specifications Range Accuracy±20 mV 0.5% FSR1±200 mV 0.1% FSR±2.00 V 0.1% FSR±5 V 0.1% FSRCMRR 70 dB

Page 13: Diamond D10 Test Platform. Diamond 10 Test System The Diamond 10 test system contains the following digital hardware: cPCI backplane—The 10-slot backplane

MULTI_WAVE Instrument

8 Wide bandwidth DSP channels per single slot board

High Resolution Path on Solder Side

High Speed Path on Component Side

MULTI_WAVE combines high frequency and high accuracy in one instrument

Page 14: Diamond D10 Test Platform. Diamond 10 Test System The Diamond 10 test system contains the following digital hardware: cPCI backplane—The 10-slot backplane

Multiwave Instrument features

• 4 D/A Channels and 4 A/D Channels per Board• Fully Differential Inputs and Outputs• High Speed and High Resolution Path per Channel• High Accuracy Force/Sense PMU per Channel• 2MS (HF) / 1MS (LF) Memory per Channel• Built-in Self Test and Calibration Unit• 2 Independent Master Clocks per instrument• Clock Divider per Channel• SYNC Tracks for Pattern Synchronization• Flexible Trigger Modes

Page 15: Diamond D10 Test Platform. Diamond 10 Test System The Diamond 10 test system contains the following digital hardware: cPCI backplane—The 10-slot backplane

MULTI_WAVE Wideband Waveform Generator

High speed mode• 0 …250 MSPS sampling rate• 16 bit resolution• LPF ( 1.2 MHz, 12 MHz , 50 MHz , BYP )• output mode single ended / differential ( 50 ohms terminated )• output ranges +/-3.4(4.0) V, +/-2.0V, +/-1.0 V, +/-0.5 V (open load)

High resolution mode• 0 .. 768 kS/s sampling rate• 24 bit resolution• LPF 1.4 kHz , 5 kHz , 10 kHz , 25 kHz , 110 kHz , bypass• output mode single ended / differential• output ranges +/-10 V, +/-5 V, +/-2.5 V , +/-1.25 V• Kelvin mode selectable

Page 16: Diamond D10 Test Platform. Diamond 10 Test System The Diamond 10 test system contains the following digital hardware: cPCI backplane—The 10-slot backplane

MULTIWAVE—HIGH PRECISION (AUDIO) GENERATOR PATH Specifications

Feature SpecificationAWG Channels/Unit 4 DifferentialDAC Resolution 24 bit

High Precision (Audio) Generator Path DC Output SpecificationsRange Resolution Accuracy±10 V 1.3 μV ±(0.1% + 800 μV) ±5 V 650 nV ±(0.1% + 800 μV) ±2.5 325 nV ±(0.1% + 800 μV)±1.25 163 nV ±(0.1% + 800 μV)

High Precision (Audio) Generator Path Specifications (Sheet 1 of 2)Feature Minimum Typical MaximumSampling Rate 16 kS/s1 768 kS/s Resolution: 10 μHzBandwidth AC 500 kHz Max Output Level Absolute -11.00 V +11.00 V Output Impedance < 5 Ohm

Output Modes - Single Pos, Single Neg, DifferentialKelvin Output - Force/Sense for pos. and neg. output

Page 17: Diamond D10 Test Platform. Diamond 10 Test System The Diamond 10 test system contains the following digital hardware: cPCI backplane—The 10-slot backplane

High Precision (Audio) Generator Path Specifications

Feature Minimum Typical MaximumCommon Mode Voltage ±10.00 V

AC Performance : THD -110 dB -100 dB SFDR 110 dB 115 dB SNR (0.1–25 kHz) 103 dB 107 dB

High Precision (Audio) Generator Path Filter SpecificationsFeature Specification Comments

Selectable LP Filter (-3 dB) 1.4 kHz 6 pole Butterworth5.0 kHz 6 pole Butterworth10 kHz 4 pole Butterworth25 kHz 4 pole Butterworth110 kHz 4 pole ButterworthBypass

Page 18: Diamond D10 Test Platform. Diamond 10 Test System The Diamond 10 test system contains the following digital hardware: cPCI backplane—The 10-slot backplane

MULTIWAVE—HIGH PRECISION (AUDIO) DIGITIZER PATH SPECIFICATIONS

Feature Specification CommentsDigitizer Channels/Unit 4 DifferentialADC Resolution 24 bit

High Precision (Audio) Digitizer Path Voltage Range (AC+DC) SpecificationsRange Resolution Accuracy CommentsSingle Ended±10 V 1.3 μV ±(0.1% + 800 μV) Low or high input±5 V 650 nV ±(0.1% + 800 μV) connected to GND±2.5 325 nV ±(0.1% + 800 μV)±1.25 163 nV ±(0.1% + 800 μV)

Differential (Vpos–Vneg)±20.00 Vpp 2.6 μV ±(0.1% + 800 μV) Input differential±10.00 Vpp 1.3 μV ±(0.1% + 800 μV) connected±5.00 Vpp 650 nV ±(0.1% + 800 μV)±2.50 Vpp 325 nV ±(0.1% + 800 μV)

Page 19: Diamond D10 Test Platform. Diamond 10 Test System The Diamond 10 test system contains the following digital hardware: cPCI backplane—The 10-slot backplane

High Precision (Audio) Digitizer Path Specifications

Feature Minimum Typical Maximum CommentsSampling Rate 48 kS/s5 2.5 MS/s Resolution: 10 μHzBandwidth AC 500 kHz Max Input Level -11.00 V +11.00 V Input Bias Current < 1μA Input Modes - Single Pos, Single Neg, Differential

Feature Minimum Typical Maximum CommentsAC PerformanceTHD -98 dB - 95 dB SFDR 115 SNR (0.1–25 kHz) 106

High Precision (Audio) Digitizer Path Filter SpecificationsFeature Specification CommentsSelectable LP Filter (-3 dB) 1 kHz Notch -35 dB Attenuation

25 kHz 4 pole Butterworth100 kHz 4 pole Butterworth250 kHz 4 pole ButterworthBypass

Page 20: Diamond D10 Test Platform. Diamond 10 Test System The Diamond 10 test system contains the following digital hardware: cPCI backplane—The 10-slot backplane

DIBU Instrument (Device Interface Board)

The DIB Utility instrument contains:

• Loadboard reference clocks– 400 MHz calibration reference clock—Used for calibration routines– 10 MHz reference clock—Synchronizes device or equipment reference clocks to the system reference clock– DUT clock (CLK_DUT)—Synchronizes the system clocks to an externallysupplied clock

• Loadboard power supplies– ±5 V @ 3 A user power supply– +5 V @ 5 A relay power supply– +12 V @ 2 A user power supply– +24 V @ 2 A isolated power supply (floating from ground)

• Loadboard utilities– Control bits (CBITs)—64 bits that control relays and logic on the loadboard– DIB present—Detects whether or not the loadboard is connected– Calibration bus (6 wire)—Provides the link to the external meter– DIB ground sense—Provides the loadboard ground sense

Page 21: Diamond D10 Test Platform. Diamond 10 Test System The Diamond 10 test system contains the following digital hardware: cPCI backplane—The 10-slot backplane

• Loadboard busses– ID programmable read only memory (IDPROM) bus– General Purpose Inter-IC (I2C) bus– Serial Peripheral interface (SPI) bus– General Purpose Input Output (GPIO) bus– Scope Test Point (TP) bus

• Power supplies for third party cPCI instruments– 48 V system power– +5 V @ 10 A power supply– ±12 V @ 2 A power supply

The DIB Utility instrument must reside in slot 9.