ELECTRON MICROSCOPYDr. K. Siva PrasadAssistant ProfessorDept. of
MME, NIT TrichyE-mail: [email protected]
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Numerical Aperture Number that expresses ability of a lens to
resolve fine details in an object being observed.
Related to the angular aperture of the lens and the refractive
index of the medium found between the lens and the specimen.
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*ELECTRON MICROSCOPY*Optical microscopy vs. SEMScrew length: ~
0.6 cmA SEM typically has orders of magnitude better depth of focus
than a optical microscope making SEM suitable for studying rough
surfacesThe higher magnification, the lower depth of focusDepth of
focus
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SEM images the sample surface by scanning it with a high-energy
beam of electrons in a raster scan pattern.
The electrons interact with the atoms that make up the sample
producing signals containing information about the samples surface
topography, composition and properties such as electrical
conductivity.Accelerating voltage : 0.5 30 kV.**ELECTRON
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**ELECTRON MICROSCOPYVarious Types of Electron Guns
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**ELECTRON MICROSCOPYDiffusion of incident electrons (after
Ducumb and Shields)
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Effect of accelerating voltage**ELECTRON MICROSCOPY
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Specimen: Toner (a) High accelerating voltage makes it hard to
obtain contrast of the specimen surface structure and the specimen
surface charges up easily, (b) surface microstructures are easily
seen.**ELECTRON MICROSCOPYInfluence of accelerating voltage
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FEG SEM image of as cast Al-4wt%Cu-3wt% TiB2 in-situ
composite**ELECTRON MICROSCOPY
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SEM micrograph of as cast Al-4wt%Cu-3wt% TiB2 in-situ composite
and its corresponding EDS pattern**ELECTRON MICROSCOPYN. Naga
Krishna & K. Siva Prasad, Trans. IIM 64 (2011) 63 - 66.
**ELECTRON MICROSCOPYTRANSMISSION ELECTRON MICROSCOPE
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**ELECTRON MICROSCOPYScanning Near-field Optical
MicroscopeNear-field scanning optical microscopy(NSOM/SNOM) is
amicroscopytechnique for nanostructure investigation that breaks
the far fieldresolution limitby exploiting the properties
ofevanescent waves. This is done by placing the detector very close
(distance much smaller thanwavelength) to the specimen surface.
This allows for the surface inspection with high spatial, spectral
and temporalresolving power. With this technique, the resolution of
the image is limited by the size of the detector aperture and not
by the wavelength of the illuminating light. In particular, lateral
resolution of 20nm and vertical resolution of 25nm have been
demonstrated
![The Relativistic Electron Density [1ex] and Electron ... · PDF fileThe Relativistic Electron Density and Electron Correlation Markus Reiher ... Electron density distributions for](https://img.pdfslide.net/doc/110x75/5ab2020e7f8b9aea528d15ec/the-relativistic-electron-density-1ex-and-electron-relativistic-electron-density.jpg)
