© Springer International Publishing Switzerland 2016C. B. Carter, D. B. Williams (Eds.), Transmission Electron Microscopy, DOI 10.1007/978-3-319-26651-0 505

Figure and Table Credits

Chapter 1

Figure 1.6 Courtesy Bronsgeest MS and Delft University of Technology.

Figure 1.7 Courtesy Bronsgeest MS and Delft University of Technology.

Chapter 2

Figure 2.1 Reprinted from Svensson K, Olin H, Olsson E (2004) Nanopipettes for Metal Transport Phys Rev Lett 93(14) 145901-1-4, Fig. 4. With permission of the American Physical Society.

Figure 2.3 Robertson IM, Ferreira PJ, Dehm G, Hull R, Stach EA (2008) Visualizing the behavior of dislocations – seeing is believing. MRS Bulletin 33, 122–131. Figure 5. Reproduced by permission of Cambridge University Press.

Figure 2.4 Rudolph AR, Jungjohann KL, Wheeler DR, Brozik SM (2014) Drying Effect Creates False Assemblies in DNA-coated Gold Nanoparticles as Determined Through In Situ Liq-uid Cell STEM. Microsc Microanal 20, 437–444. Figures 4 & 7. Reproduced by permission of Cambridge University Press.

Figure 2.5 Panciera F, Chou Y-C, Reuter MC, Zakharov D, Stach EA, Hofmann S, Ross FM (2015) Synthesis of nanostructures in nanowires using sequential catalyst reactions. Nature Materials 14, 820–826. Reproduced by permission of Nature Publishing Group.

Figure 2.6 Reprinted from Creemer JF, Helveg S, Hoveling GH, Ullmann S, Molenbroek AM, Sarro PM, Zandbergen HW (2008) Atomic-scale electron microscopy at ambient pressure, Ultramicroscopy 108, 993–998. Figure 3b. With permission from Elsevier.

Figure 2.7 Reprinted from LaGrange T, Campbell GH, Reed BW, Taheri M, Peravento JB, Kim JS, Browning ND (2008) Nano-second time-resolved investigations using the in situ of dynamic transmission electron microscope (DTEM. Ultramicroscopy 108, 1441–1449. Fig. 1. With permission from Elsevier.

Figure 2.8 Reprinted from Shorokhov D, Zewail A (2008) 4D Electron imaging: principles and perspectives. Phys Chem Chem Phys 10(20), 2869–3016. Figure 2. Reproduced by per-mission of Royal Society of Chemistry.

Figure 2.9 Reprinted from Kulovits A, Wiezorek JMK, LaGrange T, Reed BW, Campbell GH (2011) Revealing the transient states of rapid solidification in aluminum thin films using ultrafast in situ transmission electron microscopy. Philos Mag Lett 91, 287–296. Figure 2. Reproduced by permission of Taylor and Francis.

Figure 2.10 Reprinted from LaGrange T, Reed BW, McKe-own JT, Santala MJ, Dehope WJ, Huete G, Shuttlesworth RM, Campbell GH, Microsc. Microanal. 19, 1154 (2013) Reprinted as Figure 2 in: Movie-mode Dynamic Electron Microscopy, MRS Bulletin 40(1), 22–28. Reproduced by permission of Cambridge University Press.

Figure 2.11 Lobastov VA, Weissenrieder J, Tang J, Zewail AH (2007) Ultrafast Electron Microscopy (UEM: Four-Dimensional Imaging and Diffraction of Nanostructures during Phase Trans-formations. Nano Lett 7(9), 2552–2558. Fig. 1. Reproduced by permission of American Chemical Society.

Figure 2.12 Adapted after Boyes ED, Gai PL (2014) Aberration corrected environmental STEM (AC ESTEM) for dynamic in situ gas reaction studies of nanoparticle catalysts. J Physics: Conf Ser 522, 012004. Reproduced by permission of IOP Publishing.

Figure 2.13 Reprinted from Boyes ED, Gai PL (2014) Visu-alising reacting single atoms under controlled conditions: Advances in atomic resolution in situ Environmental (Scan-ning) Transmission Electron Microscopy (E(S)TEM. CR Phys 15, 200–213. Fig. 1 Reproduced by permission of Else-vier France.

Figure 2.14 Courtesy of (a) Protochips, (b) Poseidon electro-chemical cell, (c) Hummingbird Scientific, (d) Hitachi. Dens-Solutions: The Ocean series

Figure 2.15 Reprinted from Creemer JF, Helveg S, Hoveling GH, Ullmann S, Molenbroek AM, Sarro PM, Zandbergen HW (2008) Atomic-scale electron microscopy at ambient pressure. Ultramicroscopy 108, 993–998. Figure 3b. Reproduced by per-mission of Elsevier.

Figure 2.16 Reprinted from Yoshida H, Omote H, Takeda S (2014) Oxidation and reduction processes of platinum nanopar-ticles observed at the atomic scale by environmental transmis-sion electron microscopy. Nanoscale 6, 13113–13118. Repro-duced by permission of Royal Society of Chemistry.

Figure 2.17 Reprint from Alan T, Yokosawa T, Gaspar J, Pan-draud G, Paul O, Creemer F, Sarro PM, Zandbergen HW (2012) Micro-fabricated channel with ultra-thin yet ultra-strong windows enables electron microscopy under 4-bar pressure. APL, 100, 081903-1-4, Fig. 5. With permission from AIP Pub-lishing LLC.

Figure 2.18 After Jungjohann KL (2012) Ph.D. Thesis, UC Da-vis. Nanoscale imaging and analysis of fully hydrated materials. Figure 3.10.

Figure 2.19 Photo by Carter CB courtesy Furuya K.

Figure 2.20 Reprint from Mehraeen S, McKeown JT, Desh-mukh PV, Evans JE, Abellan P, Xu P, Reed BW, Taheri ML, Fischione PE, Browning ND (2013) A (S)TEM Gas Cell Holder with Localized Laser Heating for In Situ Experiments. Microsc Microanal 19(2), 470–478, Fig. 1. Reproduced by permission of Cambridge University Press.

Figure 2.21 Reprinted from Niu K-Y, Park J, Zheng H, Alivisatos AP (2013) Revealing Bismuth Oxide Hollow Nanoparticle For-mation by the Kirkendall Effect. Nano Letters 13, 5715–5719. Reproduced by permission of American Chemical Society.

Figure 2.22 Reprinted from Wang C, Qiao Q, Shokuhfar T, Klie RF (2014) High-Resolution Electron Microscopy and Spectros-copy of Ferritin in Biocompatible Graphene Liquid Cells and Graphene Sandwiches. Advanced Materials 26, 3410–3414. Fig. 1. Reproduced by permission of John Wiley and Sons.

Figure 2.23 Reprinted from White ER, Singer SB, Augustyn V, Hubbard WA, Mecklenburg M, Dunn B, Regan BC (2012) In Situ Transmission Electron Microscopy of Lead Dendrites and Lead Ions in Aqueous Solution. ACS Nano, 6(7), 6308–17, Fig. 1. Re-produced by permission of American Chemical Society.

Figure 2.24 Reprinted from Mortensen PM, Hansen TW, Wagner JB, Jensen AD (2015) Modeling of temperature profiles in an environmental transmission electron microscope using compu-tational fluid dynamics. Ultramicroscopy 152, 1–9, Fig 7 and 10. Reproduced by permission of Elsevier.

Figure 2.25 Reprinted by permission from Macmillan Publish ers Ltd: Gao Y, Bando Y (2002) Carbon Nanothermometer Contain-ing Gallium. Nature 415, 599. Copyright 2002. Fig. 1. Repro-duced by permission of Nature Publishing Group.

Figure 2.26 Courtesy Basu J, Ravishankar N, Carter CB. Un-published research.

Figure 2.27a–e Reprinted from Saka H, Kamino T, Ara S, Sasaki K (2008) In Situ Heating Transmission Electron Microscopy. MRS Bull, 33, 93–100, Fig. 1. Reproduced by permission of Cambridge University Press.

Figure 2.27f Reprinted from Gandman M, Kauffmann Y, Koch CT, Kaplan WD (2013) Direct Quantification of Ordering at a Solid-Liquid Interface Using Aberration Corrected Transmis-sion Electron Microscopy. Phys Rev Lett 110, 086106. Fig. 1. Reproduced by permission of American Physical Society.

Figure 2.28 Reprinted from Kasama T, Dunin-Borkowski RE, Matsuya L, Broom RF, Twitchett AC, Midgley PA, New-comb SB, Robins AC, Smith DW, Gronsky JJ, Thomas CA, Fischione PE (2005) A versatile three-contact electrical bi-asing transmission electron microscope specimen holder for electron holography and electron tomography of working de-vices. Mater. Res. Soc. Symp. Proc., 907E, MM13.02. “In situ Electron Microscopy of Materials”, Eds Ferreira PJ, Robertson IM, Dehm G, Saka H. Fig. 8. Reproduced by permission of Cambridge University Press.

Figure 2.29 Reprinted from Asoro MA, Kovar D, Ferreira PJ (2013) In Situ Transmission Electron Microscopy Observa-tions of Sublimation in Silver Nanoparticles. ACS Nano, 7(9), 7844–7852, Figs 1&2. Reproduced by permission of American Chemical Society.

Figure 2.30 Reprinted from Delalande M, Guinel MJ-F, Allard LF, Delattre A, Le Bris R†, Yves Samson Y, Bayle-Guillemaud P, Peter Reiss P (2012) L10 Ordering of ultrasmall FePt Nanopar-ticles Revealed by TEM in situ annealing. J Phys Chem C 116, 6866–6872. Fig. 7. Reproduced by permission of American Chemical Society.

Figure 2.31 Reprinted from Vendelbo1 SB, Elkjær CF, Falsig H, Puspitasari I, Dona P, Mele L, Morana B, Nelissen BJ, van Rijn R, Creemer JF, Kooyman PJ, Helveg S (2014) Visualization of oscillatory behaviour of Pt nanoparticles catalysing CO oxida-tion. Nature Mater 13(9), 884–890. Reproduced by permission of Nature Publishing Group.

Figure 2.32 Reprinted from Evans JE, Jungjohann KL, Wong PCK, Chiu P-L, Dutrow GH, Arslan I, Browning ND (2012) Vi-sualizing macromolecular complexes with in situ liquid scanning transmission electron microscopy. Micron 43 1085–1090. Fig. 3. Reproduced by permission of Elsevier.

Figure 2.33 Wirix MJM, Bomans PHH, Friedrich H, Sommerdijk NAJM, de With G (2014) Three-Dimensional Structure of P3HT Assemblies in Organic Solvents Revealed by Cryo-TEM. Nano Lett 14, 2033–2038. Fig. 2. Reproduced by permission of Amer-ican Chemical Society.

Figure 2.34 Tai K, Liu Y, Dillon SJ (2014) In Situ Cryogenic Transmission Electron Microscopy for Characterizing the Evo-lution of Solidifying Water Ice in Colloidal Systems. Microsc

506 Figure and Table Credits

Figure and Table Credits

Microanal 20, 330–337. Fig. 1a. Reproduced by permission of Cambridge University Press.

Figure 2.35 Haque MA, Saif MTA (2002) In situ tensile test-ing of nano-scale specimens in SEM and TEM. Experimental Mech 42(1), 123–128, Fig. 1. Reproduced by permission of Springer Publishing Company.

Figure 2.36 Reprinted from Ye J, Mishra RK, Pelton AR, Minor AM (2010) Direct observation of the NiTi martensi-tic phase transformation in nanoscale volumes. Acta Mater 58, 490–498. Fig 1b & 2b. Reproduced by permission of El-sevier.

Figure 2.37 Reprinted from Espinosa HD, Bernal RA, Filleter T (2012) In Situ TEM Electromechanical Testing of Nanowires and Nanotubes. Small 8(21), 3233–3252, Fig. 4. Reproduced by permission of John Wiley and Sons.

Figure 2.38 Reprinted from Nowak JD, Mook WM, Minor AM, Gerberich WW, Carter CB (2007) Fracturing a Nanoparticle. Philos Mag 87(1), 29–37, Fig. 1. Reproduced by permission of Taylor and Francis.

Figure 2.39 Reprinted from Bernal RA, Filleter T, Connell JG, Sohn K, Huang J, Lauhon LJ, Espinosa HD (2014) In situ electron microscopy four-point electromechanical characteri-zation of freestanding metallic and semiconducting nanowires. Small 10 (4), 725–733. Reproduced by permission of John Wiley and Sons.

Figure 2.40 Reprinted from Lau JW, Schofield MA, Zhu Y, Neu-marl GF (2003) In situ Magnetodynamic Experiments Achieved with the design of an In-plane Magnetic Field Specimen Holder. Microsc. Microanal. 9, (Suppl 2), 130–131. Reproduced by per-mission of Cambridge University Press.

Figure 2.41 Reprinted from Budruk A, Phatak C, Petford-Long AK, De Graef M (2011) In situ Lorentz TEM magnetization studies on a Fe–Pd–Co martensitic alloy. Acta Mater 59, 6646–6657, Fig. 1. Copyright 2011, with permission from Elsevier.

Figure 2.42 Reprinted from Wang J, Zeng Z, Weinberger CR, Zhang Z, Zhu T, Scott X. Mao (2015) In situ atomic-scale observation of twinning dominated deformation in nanoscale body-centred cubic tungsten Nature Mater 14, 594–560. Fig-ure 13 of Supplementary data. Reproduced by permission of Nature Publishing Group.

Figure 2.43 Reprinted from Spence JCH (1988) A Scanning Tunneling Microscope in a Side-Entry Holder for Reflection Electron-Microscopy in the Philips EM400, Ultramicroscopy 25, 165–170, Fig. 4. Copyright 1988 with permission from Elsevier.

Figure 2.44 Reprinted from Costa PMFJ, Golberg D, Shen G, Mitome M, Bando Y (2008) ZnO low-dimensional structures:

electrical properties measured inside a transmission electron microscope. J Mater Sci 43, 1460–1470. Fig 6. Reproduced by permission of Springer Publishing Company.

Figure 2.45 Liu XH, Huang JY (2011) In situ TEM electro-chemistry of anode materials in lithium ion batteries. Energy & Environmental Sci, 4(10), 3844–3860, Fig. 1. Reproduced by permission of Royal Society of Chemistry.

Figure 2.46 Wang CM, Li X, Wang Z, Wu W, Liu J, Gao F, Kovarik L, Zhang J-G, Howe J, Burton DJ, Liu Z, Xiao X, Thevuthasan S, Baer DR (2012) In Situ TEM Investigation of Congruent Phase Transition and Structural Evolution of Nano-structured Silicon/Carbon Anode for Lithium Ion Batteries. Nano Lett 12, 1624–1632. Fig. 4. Reproduced by permission of Amer-ican Chemical Society.

Figure 2.47 Liu Y, Liu XH, Nguyen BM, Yoo J, Sullivan JP, Picraux ST, Huang JH, Dayeh SA (2013) Tailoring Lithiation Be-havior by Interface and Bandgap Engineering at the Nanoscale. Nano Letters, 13(10), 4876–4833, Fig. 1, 3. Reproduced by per-mission of American Chemical Society.

Figure 2.48 Leenheer AJ, Jungjohann KL, Zavadil KR, Sullivan JP, Harris CT, Lithium electrodeposition dynamics in aprotic electrolyte observed in Situ via Transmission Electron Micros-copy, Fig. 2. Reproduced by permission of American Chemical Society.

Figure 2.49a Zhang C, Tian W, Xu Z, Wang X, Liu J, Li S-N, Tang D-M, Liu D, Liao M, Bando Y, Goldberg D (2014) Pho-tosensing performance of branched CdS/ZnO heterostructures as revealed by in situ TEM and photodetector tests. Nanoscale 6, 8084–8090, Fig. 4, 5. Reproduced by permission of Royal Society of Chemistry.

Figure 2.50 Zhang L, Miller BK, Crozier PA (2013) Atomic Level In Situ Observation of Surface Amorphization in Anatase Nano-crystals During Light Irradiation in Water Vapor. Nano Lett 13, 679–684, Fig. 1, 2, 4. Reproduced by permission of American Chemical Society.

Figure 2.51 Reprinted from Picher M, Mazzucco S, Blankenship S, Sharma R (2015) Vibrational and optical spectroscopies in-tegrated with environmental transmission electron microscopy. Ultramicroscopy 150, 10–15, Fig. 1, 2, 4c. Copyright 2015 with permission from Elsevier.

Figure 2.52 Reprinted from Hillerich K, Dick KA, Wen C-Y, Reuter MC, Kodambak S, Ross FM (2013) Strategies To Con-trol Morphology in Hybrid Group III–V/Group IV Hetero-structure Nanowires. Nano Lett 13, 903–908. Reproduced by permission of American Chemical Society.

Figure 2.53 Reprinted from Simonsen SB, Chorkendorff I, Dahl S, Skoglundh M, Sehested J, Helveg S (2010) Direct Ob-servation of Oxygen-induced Platinum Nanoparticle Ripening

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Studied by In Situ TEM. JACS 132, 7968–7975, Fig. 3. Repro-duced by permission of American Chemical Society.

Figure 2.54 Reprinted Woehl TJ, Evans JE, Arslan I, Risten-part WD, Browning ND (2012) Direct in Situ Determination of the Mechanisms Controlling Nanoparticle Nucleation and Growth. ACS Nano 6(10), 8599–8610, Fig. 1. Reproduced by permission of American Chemical Society.

Figure 2.55 Reprinted from Schneider NM, Norton MM, Men-del BJ, Grogan JM, Ross FM, Bau HH (2014) Electron-water interactions and implications for liquid cell electron microscopy. J Phys Chem C 118, 22373–22382, Fig. 1, 2, 5 Reproduced by permission of American Chemical Society.

Figure 2.56 Reprinted from Hattar K, Bufford DC, Buller DL (2014) Concurrent in situ ion irradiation transmission electron microscope. Nucl Instrum Meth B 338, 56–65, Fig. 2. Repro-duced by permission of Elsevier.

Figure 2.57 Reprinted from Hattar K, Bufford DC, Buller DL (2014) Concurrent in situ ion irradiation transmission electron microscope. Nucl Instrum Meth B 338, 56–65. Fig. 8. Repro-duced by permission of Elsevier.

Chapter 3

All Chapter 3 figures are unpublished works, with the exception of

Figure 3.11 Sundararaman M, Mukhopadhyay P, Banerjee S (1988) Precipitation of the δ-Ni3Nb phase in Two Nickel Base Superalloys. Met. Trans., 19A, 453. Reproduced by permission of Springer Publishing Company.

Chapter 4

Figure 4.2 Unpublished work courtesy Hseih KC.

Figure 4.3 Kaufman MJ, Eades JA, Loretto MH, Fraser HL (1983) A Study of a Cellular Phase Transformation in the Ter-nary Ni-Al-Mo Alloy System. Met. Trans., 14A, 1561–1571. Re-produced by permission of Springer.

Figure 4.4 as Figure 4.3

Figure 4.5 as Figure 4.3

Figure 4.6 as Figure 4.3

Figure 4.7 as Figure 4.3

Figure 4.8 as Figure 4.3

Figure 4.13 as Figure 4.3

Figure 4.11 From: Tanaka M, Saito R, Sekii H (1983a). Point-Group Determination by Convergent-Beam Electron Diffraction. Acta Cryst., A39, 357–368. Reproduced by permission of John Wiley and Sons.

Figure 4.16 From: Morniroli JP (2002) Large-Angle Conver-gent-Beam Electron Diffraction. Paris, Société Française des Microscopies, Figure VI.21. Reproduced by permission of John Wiley and Sons.

Figure 4.17 From: Eades JA, Kiely CJ (1987) Convergent-beam diffraction. EMAG 87, Inst. Phys Conf Series, 90, 109–114. Re-produced by permission of Taylor and Francis.

Figure 4.19 From Cherns D, Preston AR (1989) Convergent Beam Diffraction Studies of Interfaces, Defects and Multilay-ers. J. Electron Microsc. Tech., 13, 111–122. Reproduced by permission of John Wiley and Sons

Figure 4.20 From Tanaka M, Terauchi M, Kaneyama T (1988) Convergent-Beam Electron Diffraction II. JEOL, Tokyo, page 165. Reproduced by permission of the authors and JEOL.

Figure 4.21 From Morniroli JP (2002) Large-Angle Conver-gent-Beam Electron Diffraction. Paris, Société Française des Microscopies, Figure XI.31. Reproduced by permission of John Wiley and Sons.

Figure 4.23 From Tanaka M, Terauchi M (1985) Conver-gent-Beam Electron Diffraction. JEOL, Tokyo, Page 83. Repro-duced by permission of the authors and JEOL.

Figure 4.24 From Humphreys CJ, Eagelsham DJ, Maher DM, Fraser HL (1988) CBED and CBIM from semiconductors and superconductors. Ultramicroscopy 26(1–2), 13–23. Reproduced by permission of Elsevier.

Figure 4.25 Courtesy Christenson KK, Eades JA.

Figure 4.26 With permission from Christoph T. Koch

Table 4.3 After: Eades JA (1988) Symmetry Determination by Convergent-beam Diffraction. EUREM 88; IOP Conf. Series 93, 1, 3–12.

Table 4.5 After: Buxton BF, Eades JA, Steeds JW, Rackham GM (1976) The Symmetry of Electron Diffraction Zone Axis Patterns Phil. Trans. A281, 171–194.

Table 4.6 Adapted from: Eades JA, Shannon MD, Buxton BF. SEM (1983) Crystal Symmetry from Electron Diffraction III, 1051–1060.

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Chapter 5

Figure 5.6: Zuo J, Kim M, O’Keeffe M, Spence JCH (1999) Di-rect observation of d-orbital holes and Cu-Cu bonding in Cu2O. Nature, 401, 49–52. Reproduced by permission of Nature Pub-lishing Group.

Figure 5.7: Courtesy Mayer J, unpublished. For more details see Krämer S, Mayer J (1999) Using the Hough transform for HOLZ line identification in Convergent Beam Electron Diffraction. J Mi-crosc 194, 2–11 (1999)

Figure 5.9a: Tanaka M et al (2003) CBED. JEOL, Vol. 3. Repro-duced by permission of the authors and JEOL.

Chapter 6

All Figures are the product of the author.

Chapter 7

All Figures are the product of the author.

Chapter 8

All Figures are the product of the author.

Chapter 9

All Figures are the product of the author.

Chapter 10

Most Figures are the product of the author.

Figure 10.1: Courtesy EMAT center for Electron Microscopy, Uni-versity of Antwerp.

Figure 10.8: Courtesy Jia CL, Thust A (1999) Phys Rev Lett 82, 5052. Reproduced by permission.

Chapter 11

Figure 11.1 Adapted from Pennycook SJ, Browning ND, Mc-Gibbon MM, McGibbon AJ, Jesson DE, Chisholm MF (1996a) Philos. Trans. R. Soc. A. 354, 2619.

Figure 11.2 From Pennycook SJ, Jesson DE (1992) Acta Metall. Mater. 40, S149. Reproduced under US Govt agreement.

Figure 11.3 Adapted from Pennycook SJ, Jesson DE, Chisholm MF, Browning ND (1993) Atomic-Resolution Imaging and Anal-ysis with the STEM, Vol. 130, X-Ray Optics and Microanalysis 1992, edited by Kenway PB, Duke PJ, Lorimer GW, Mulvey T, Drummond IW, Love G, Michette AG and Stedman M, pp. 217. Bristol: Institute of Physics.

Figure 11.4 From Pennycook SJ, Jesson DE (1991) Incoherent characteristics; the probe propagating Ultramic. 37, 14. Repro-duced under US Govt agreement.

Figure 11.5 Reproduced from Peng Y, Oxley MP, Lupini AR, Chisholm MF, Pennycook SJ (2008) Microsc. Microanal. 14, 36.

Figure 11.6 Adapted from Pennycook SJ, Jesson DE, Chisholm MF, Ferridge AG, Seddon MJ (1992) Sub-Ångstrom Microscopy through Incoherent Imaging and Image Restoration, Vol. Scan-ning Microscopy Supplement 6, Signal and Image Processing in Microscopy and Microanalysis, edited by PW. Hawkes, Cam-bridge, UK: Scanning Microscopy International.

Figure 11.7 (a) Adapted from Abe E, Pennycook SJ (2005) J. Crystallog. Soc. Japan 47, 26. (b) is from Steinhardt PJ, Jeong HC, Saitoh K, Tanaka M, Abe E, Tsai AP (1998) Nature 396, 55. For Figure 7a,b Reproduced under US Govt agreement.

Figure 11.8 (a) From Merli PG, Missiroli GF, Pozzi G (1976) Am. J. Phys. 44, 306, Reproduced by permission of … (b) from Tonomura A, Endo J, Matsuda T, Kawasaki T, Ezawa H (1989) Am. J. Phys. 57, 117. Reproduced with permission.

Figure 11.14 From Nellist PD, Pennycook SJ (1999a) Inst Phys Conf Ser 315. Reproduced under US Govt agreement.

Figure 11.16 Images a,b and c courtesy of McGibbon MM, Varela M, Lupini AR, respectively.

Figure 11.17 Images from (A) Nellist PD, Pennycook SJ (1996) Science 274, 413 Reproduced under US Govt agreement (B) Sohlberg K, Rashkeev S, Borisevich AY, Pennycook SJ, Pan-telides ST (2004) Pt atoms on γ-alumina Chemphyschem 5, 1893 Reproduced under US Govt agreement (C) Wang SW, Borise-vich AY, Rashkeev SN, Glazoff MV, Sohlberg K, Pennycook SJ, Pantelides ST (2004) On a γ-alumina flake Nature Mat. 3, 143 Reproduced under US Govt agreement.

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Figure 11.18 Adapted from Zhou W, Kapetanakis M, Prange M, Pantelides S, Pennycook S, Idrobo JC (2012a) Phys. Rev. Lett. 109, 206803.

Figure 11.19 Adapted from Zhou W, Kapetanakis M, Prange M, Pantelides S, Pennycook S, Idrobo JC (2012a) Phys. Rev. Lett. 109, 206803.

Figure 11.20 Adapted from Lee J, Zhou W, Pennycook SJ, Idrobo JC, Pantelides ST (2013) Graphene nanopore Nature Commu-nications 4, 1650.

Figure 11.21 Adapted from Borisevich AY, Lupini AR, Penny-cook SJ (2006a) Proc. Nat. Acad. Sci. USA 103, 3044.

Figure 11.22 From Borisevich AY, Lupini AR, Pennycook SJ (2006a) Proc. Nat. Acad. Sci. USA 103, 3044. Reproduced under US Govt agreement.

Figure 11.23 Adapted from van Benthem K, Lupini AR, Kim M, Baik HS, Doh S, Lee JH, Oxley MP, Findlay SD, Allen LJ, Luck JT, Pennycook SJ (2005) Appl. Phys. Lett. 87, 034104. A movie version of Figure 11.23.

Figure 11.24 From van Benthem K, Lupini AR, Kim M, Baik HS, Doh S, Lee JH, Oxley MP, Findlay SD, Allen LJ, Luck JT, Pennycook SJ (2005) Appl. Phys. Lett. 87, 034104. A movie version of Figure 11.23. Reproduced under US Govt agree-ment.

Figure 11.29 From James EM, Browning ND (1999) Practical as-pects of atomic resolution imaging and analysis in STEM. Ultra-microscopy 78, 125–139 Reproduced by permission of Elevier.

Figure 11.30 Adapted from Pennycook et al. (2003).

Figure 11.31 From Nellist PD, Chisholm MF, Dellby N, Krivanek OL, Murfitt MF, Szilagyi ZS, Lupini AR, Borisevich A, Sides WH, Pennycook SJ (2004) Science 305, 1741. Supplementary Online Material. Reproduced under US Govt agreement.

Figure 11.31 Courtesy Duscher G.

Figure 11.32 Ronchigrams courtesy of Gerd Duscher.

Figure 11.33b (Pennycook et al. (2009) The original data points from Browning et al. (1993a). Adapted from Browning et al. 1993a; Browning et al. (1993b)

Figure 11.34 Adapted from Peng et al. (2008).

Figure 11.35 Adapted from Pennycook and Nellist (1999).

Figure 11.36 Adapted from Jesson and Pennycook (1993).

Figure 11.38 Simulated Ronchigrams courtesy Lupini AR.

Figure 11.39 Simulated Ronchigrams courtesy Lupini AR.

Figure 11.40 Adapted from Nellist and Pennycook (1998b).

Figure 11.41 Adapted from Jesson and Pennycook (1995).

Figure 11.42 Adapted from Jesson and Pennycook (1995).

Figure 11.43 Adapted from Pennycook et al. (1996b).

Figure 11.44 Adapted from Nellist and Pennycook (2000).

Figure 11.45 Adapted from Borisevich et al. (2006a)

Figure 11.46 Adapted from Varela et al. (2005).

Figure 11.48 Courtesy Miyoung Kim.

Figure 11.49 From Perovic DD, Rossouw CJ, Howie A (1993) Ultramicroscopy 52, 353. Reproduced with permission.

Figure 11.50 From Xin Y, Pennycook SJ, Browning ND, Nel-list PD, Sivananthan S, Omnes F, Beaumont B, Faurie JP, Gibart P (1998) Appl. Phys. Lett. 72, 2680. Dislocations emerging at the surface of GaN. Reproduced under US Govt agreement.

Figure 11.51 Adapted from Kadavanich et al. (2001) McBride et al. (2006) Pennycook et al. (2003).

Figure 11.52 Adapted from Roberts et al. (2008).

Figure 11.53 From Shibata N, Pennycook SJ, Gosnell TR, Painter GS, Shelton WA, Becher PF (2004) Nature 428, 730. Reproduced under US Govt agreement.

Figure 11.54 Adapted from Pennycook (2002); Yan et al. (1999).

Figure 11.55 From LeBeau JM, D’Alfonso AJ, Findlay SD, Stemmer S, Allen LJ (2009) Phys Rev B 80, 214110. No Stobbs factor. Reproduced with permission.

Figure 11.56 From Molina SI, Varela M, Ben T, Sales DL, Pizarro J, Galindo PL, Fuster D, Gonzalez Y, Gonzalez L, Pennycook SJ (2008) J. Nanosci. Nanotech. 8, 3422. Calibrated by high reso-lution X-ray diffraction. Reproduced under US Govt agreement.

Chapter 12

Figure 12.8 Reprinted from Ultramicroscopy, Vol 109, Baten-burg KJ, Bals S, Sijbers J, Kübel C, Midgley PA, Hernandez JC, Kaiser U, Encina ER, Coronado EA, Van Tendeloo G (2009) 3D imaging of nanomaterials by discrete tomography, 730–740. Copyright 2009, with permission from Elsevier.

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Figure 12.9 Saghi Z, Holland DJ, Leary R, Falqui A, Bertoni G, Sederman AJ, Gladden LF, Midgley PA (2011) Three-Dimen-sional Morphology of Iron Oxide Nanoparticles with Reactive Concave Surfaces. Nano Letters, 11, 4666–4673. Reproduced by permission of American Chemical Society.

Figure 12.10 Jinnai H, Nishikawa Y, Spontak RJ, Smith SD, Agard DA, Hashimoto T (2000) Direct measurement of interfa-cial curvature distributions in a bicontinuous block copolymer morphology. Physical Review Letters, 84(3), 518–521. Repro-duced by permission of American Physical Society.

Figure 12.11 Midgley PA, Thomas JM, Laffont L, Weyland M, Raja R, Johnson BFG, Khimyak T (2004) Reprinted with per-mission of American Chemical Society.

Figure 12.12 Ercius P, Weyland M, Muller DA, Gignac LM (2006) Three-dimensional imaging of nanovoids in copper in-terconnects using incoherent bright field tomography. Applied Physics Letters, 88(24). Reproduced by permission of AIP Pub-lishing LLC.

Figure 12.13. Reprinted from Micron, Vol. 47, Lepinay K, Lo-rut F, Pantel R, Epicier T (2013) Chemical 3D tomography of 28 nm high K metal gate transistor: STEM XEDS experimental method and results, 43–49. Copyright 2013, with permission from Elsevier.

Figure 12.14 Reprinted from Scripta Materialia, Vol. 55, Wey-land M, Yates TJV, Dunin-Borkowski RE, Laffont L, Midgley PA (2006) Nanoscale analysis of three-dimensional structures by electron tomography, 29–33. Copyright 2006, with permission from Elsevier.

Figure 12.15 Gass MH, Koziol KKK, Windle AH, Midgley PA (2006) 4-dimensional spectral-tomography of carbonaceous nano-composites. Nano Letters, 6(3), 376–379. Reproduced by permission of American Chemical Society.

Figure 12.16 Reprinted from Ultramicroscopy, Vol. 109, Ja-rausch K, Thomas P, Leonard DN, Twesten R, Booth CR (2009) Four-dimensional STEM-EELS: Enabling nano-scale chemical tomography, 326–337. Copyright 2009, with permission from Elsevier.

Figure 12.17 Image courtesy of Barnard J.

Figure 12.18 Reprinted from Scripta Materialia, Vol. 59, Tanaka M, Higashida K, Kaneko K, Hata S, Mitsuhara M (2008) Crack tip dislocations revealed by electron tomography in silicon single crystal, 901–902. Copyright 2008, with permission from Elsevier.

Figure 12.19 Reprinted from Ultramicroscopy, Vol. 108, Twitchett-Harrison AC, Yates TJV, Dunin-Borkowski RE, Midgley PA (2008) Quantitative electron holographic tomog-raphy for the 3D characterization of semiconductor device

structures, 1401–1407. Copyright 2008, with permission from Elsevier.

Figure 12.20 Phatak C, Petford-Long AK, De Graef M (2010) Three-Dimensional Study of the Vector Potential of Magnetic Structures. Physical Review Letters, 104, 253901. Reproduced by permission of the American Physical Society.

Figure 12.21 Van Aert S, Batenburg KJ, Rossell MD, Erni R, Van Tendeloo G (2011) Three-dimensional atomic imaging of crystalline nanoparticles. Nature, 470, 374–377. Reproduced by permission of Nature.

Figure 12.24 Sample courtesy of Xiong X.

Chapter 13

Figure 13.5 Midgley PA, Saunders M (1996) Quantitative elec-tron-diffraction – from atoms to bonds. Contemp. Phys., 37, 441 . Reproduced by permission of Taylor & Francis.

Figure 13.14 Sigle W, Krämer S, Varshney V, Zern A, Eigen-thaler U, Rühle M (2003) Plasmon energy mapping in energy-fil-tering transmission electron microscopy. Ultramicroscopy, 96, 565–571. Reproduced with permission of Elsevier.

Figure 13.15 Sample provided courtesy of Lin W of the Mayo Clinic, Jacksonville.

Figure 13.17 After: Hofer F, Grogger W, Kothleitner G, Warbi-chler P (1997) Quantitative analysis of EFTEM elemental dis-tribution images. Ultramicroscopy, 67, 83–103.

Figure 13.18 After: Thomas PJ, Midgley PA (2001) Image-Spec-troscopy 2: the Removal of Plural Scattering from Extended Energy-Filtered Series by Fourier Deconvolution Techniques. Ultramicroscopy, 88, 187–194.

Figure 13.20 After: Walther T (2003) Electron energy-loss spec-troscopic profiling of thin film structures: 0.39 nm line resolution and 0.04 eV precision measurement of near-edge structure shifts at interfaces. Ultramicroscopy, 96, 401–411.

Figure 13.21 After Midgley PA (2009).

Chapter 14

Figure 14.1 Spectra replotted from the following sources. i) 1974: Egerton RF, Whelan MJ, J Electron Spectroscopy and Related Phenomena, 3 (1974) 232; ii) 1989: Weng X, Rez P, Ma H, Phys. Rev. B 40 (1989) 4175; iii) 2001: Soininen JA,

511

Shirley EL, Phys. Rev. B 64 (2001) 165112. iv) 1998 and Exp: Merchant AR, McCulloch DG, Brydson R, Diamond and Related Materials 7 (1998) 1303.

Figure 14.3 Singh DJ, Planewaves, Psuedopotentials and the LAPW Method, Kluwer, Boston (1994) Reproduced by permis-sion of Springer (formerly Kluwer).

Figure 14.4 After: Keast VJ, Bosman M. Microsc Res Techn 70:211–219 (2007)

Figure 14.5 Experimental data from Phys. Rev. B 66 (2002) 125319 and Mizoguchi T et al, 34 Micron (2003) 249.

Figure 14.6 Experimental data and multiplet calculations from FM. de Groot et al Phys. Rev. B 41 (1990) 928.

Figure 14.7 From Wu ZY, Ouvard G, Gressier P, Natoli CR. Phys. Rev. B 55 (1997) 10382. Reproduced by permission of American Physical Society.

Figure 14.8 Related calculations given in J Electron Spectros-copy and Related Phenomena 143 (2005) 97–104

Figure 14.9 From Vast N et al. Phys. Rev. Lett 88 (2002) 037601. Reproduced by permission of American Physical Society.

Chapter 15

All Figures are the product of the author.

Chapter 16

Figure 16.2 reproduced by permission of Cambridge University Press from Kotula & Keenan 2006.

Figure 16.10a,b reproduced by permission of Cambridge Uni-versity Press from Kotula & Keenan 2006.

Figure 16.11 reproduced by permission of Cambridge University Press from Kotula & Keenan 2006.

Figure 16.12 reproduced by permission of Cambridge University Press from Kotula & Keenan 2006.

Figure 16.13 (parts) reproduced by permission of Cambridge University Press from Kotula, Keenan & Michael 2003a.

Figure 16.18 reproduced by permission of Cambridge University Press from Kotula & Keenan 2006.

Figure 16.19 reproduced by permission of The Meteoritical So-ciety from Goldstein et al. 2007.

Figure 16.22 B&C reproduced by permission of Taylor &Francis from Yang et al 2013.

Figure 16.23 reproduced by permission of The American Chem-ical Society from Guiton et al. 2011.

Chapter 17

Figure 17.25 Gorzkowski EP, Watanabe M, Scotch AM, Chan HM, Harmer MP (2004) Direct Measurement of Oxygen in Lead-Based Ceramics Using the ζ-factor Method in an Analytical Electron Microscope J. Mater. Sci. 39 6735–6741.Reproduced by permission of Springer.

Figure 17.26 Watanabe M, Williams DB (2006) The Quantitative Analysis of Thin Specimens: a Review of Progress from the Cliff-Lorimer to the New ζ-Factor Methods J. Microsc. 221 89–109. As in the 2003 paper, you’ll find more details and references to the original work. Reproduced by permission of John Wiley and Sons.

Figure 17.27 From Watanabe M (2013) Microscopy Hacks: De-velopment of Various Techniques to Assist Quantitative Nano-analysis and Advanced Electron Microscopy, Microscopy, 62, 217–241. Reproduced by permission of Oxford University Press.

Figure 17.30 From Watanabe M (2013) Microscopy Hacks: De-velopment of Various Techniques to Assist Quantitative Nano-analysis and Advanced Electron Microscopy, Microscopy, 62, 217–241. Reproduced by permission of Oxford University Press.

Figure 17.32 Courtesy of Okunishi E, JEOL Reproduced by per-mission of JEOL.

Figure 17.33 Yaguchi T, Konno M, Kamino T, Watanabe M (2008) Observation of Three-dimensional Elemental Distribu-tions of a Si-device Using a 360-degree-tilt FIB and the Cold Field-emission STEM System Ultramicrosc., 108, 1603–1615. Reproduced by permission of Elsevier.

Figure 17.34 Yaguchi T, Konno M, Kamino T, Watanabe M (2008) Observation of Three-dimensional Elemental Distribu-tions of a Si-device Using a 360-degree-tilt FIB and the Cold Field-emission STEM System Ultramicrosc., 108, 1603–1615.Reproduced by permission of Elsevier .

Figure 17.35 Zaluzec N (2012) The Confluence of Aberration Correction, Spectroscopy and Multi-Dimensional Data Acqui-sition. Proc. European Microscopy Congress 2012. Reproduced by permission of the author.

512 Figure and Table Credits

Figure and Table Credits

Figure 17.36 Specimen courtesy of Varela M, Lee HN at Oak Ridge National Lab.

Figure 17.37 From Watanabe M (2013) Microscopy Hacks: Development of Various Techniques to Assist Quantitative Na-noanalysis and Advanced Electron Microscopy, Microscopy, 62, 217–241. Reproduced by permission of Oxford University Press.

513

515

Index

AA2 phase 85Aberration

coefficients 257correction 222, 256, 295, 300, 434

Absorption 11, 67, 150, 155, 157, 161, 163, 201, 216

Accelerating voltage 11, 19, 147, 149, 150, 151, 154, 155, 162, 210, 211

Achromatic circles 160Acicular morphology 87, 101Actuator 50, 52, 55, 56, 58, 76AEM 469, 473AFM-TEM holders 51, 58Airy 3, 292, 293, 294, 295, 298, 302, 316,

317, 325, 337disc 292, 293, 294, 295, 298, 302, 316,

317, 325function 3, 316, 317

ALCHEMI 425, 426, 427, 428, 429, 430, 431, 432, 434, 435, 436

systematic 426Alloy 54, 55, 81, 83, 85, 87, 93, 94, 96, 97,

101, 146, 159, 351, 356, 429, 435, 489, 501

Aluminum 142, 211, 348, 384, 391, 392, 393, 450

Amplitude contrast transfer function (ACTF) 204, 216

Amplitude normalization 221, 223Angular current density 2, 5, 8, 10, 14Applied field 20, 56Arbitrary waveform generator (AWG) 26Argand 273, 274, 275ASAC software package 154Atmospheric 475Automated 448Automated acquisition 157Axial 429, 430, 431, 432, 436Azimuthally 298

BB2-ordered structure 85B32-ordered phase 83, 85Back-etching 35Background 302, 310, 393, 468, 469, 471,

480, 483, 485, 492Background intensity 132Bagaryatski 97, 101

Basis 410, 411, 420, 421Basis set 152Bend 287, 426Bend contour 54, 123Berkovich-type indenter 53Bessel 317Bethe 421Bethe potentials 154B-field 217Bloch 323, 324, 325, 326, 327, 329, 332,

333, 334, 409, 425, 431Bloch wave 152Boersch effect 3, 6, 7Bohr 412Boltzmann constant 4Bootstrap method 145, 153Bosons 3, 207Bragg

angle 121, 146, 148, 149, 150, 154, 156, 157, 158, 159, 160, 317, 322, 352, 356, 432

beam intensities 146law 109, 154, 159reflections 109, 111, 112, 114, 117, 119,

121, 122, 125, 128, 129, 132, 146, 149, 150, 156, 158, 160, 162, 317, 356, 426

scattering 109, 122, 132, 146, 147, 148, 150, 154, 156, 157, 158, 159, 160, 162, 322, 352

Bravais lattice 148Bright

tomography 351, 354Bright field (BF) 70, 83, 84, 93, 105, 107,

112, 114, 115, 117, 118, 119, 123, 126, 128, 129, 130, 132, 133, 134, 136, 137, 138, 142, 160, 174, 189

Brillouin 322Brownian motion 34, 35

CCarbon 4, 10, 17, 18, 21, 27, 33, 35, 36, 38,

42, 43, 45, 46, 54, 58, 60, 61, 63, 70, 96, 97, 98, 162

nanotubes (CNTs) 18thin films 43

Cerenkov 398Chemical 396

Chemical doping 29Child-Langmuir effect 26Chromatic aberration 3, 11, 12, 13, 20, 36,

211, 216, 219Cliff 458Close-packed directions 97Confocal 350Continuum 479Converging 292, 293Convolution 185, 186, 202, 204, 213, 216,

219, 244, 246, 268, 284, 305, 307, 312, 313, 315, 329, 332, 333, 334, 345, 346

Corrosion resistance 87, 93Cosinusoidal interference pattern 200, 205,

206, 230Coulomb 2, 6, 7, 9, 13, 46, 225, 237, 314,

408, 409interaction 2, 6, 7, 9, 13, 46, 237, 314,

409repulsion 409

Crack dependence 21Critical 482, 488Crystallographic R-factor 158CuL 391Cuprite 147, 152, 153

DD0a-ordered orthorhombic structure 87D03-ordered phase 85Dark 239, 268, 284, 314, 318, 320, 328,

356, 357, 358, 377, 440, 444, 446, 449, 458

Dark field (DF)holography 229

de Broglie wavelength 205Deconvolution 162

filter 162Defect-free region 53, 132, 147Delocalization 32, 36, 206Demagnification 10DeskTop 500Detective quantum efficiency (DQE) 162Detector 381, 394, 468, 471, 472, 475, 476,

480, 492Dielectric constant 7Diffraction

mode 136pattern 27, 33, 103, 129, 188, 218

Diffractogram 188, 189, 218, 230, 311Diffuse 284, 334, 337, 432Diffuse scattering 145, 146, 158, 159, 162Digital 384, 391, 462, 469, 472, 483Digital Micrograph 22, 167, 168, 169, 170,

171, 172, 173, 174, 175, 176, 177, 178, 179, 180, 181, 183, 185, 187, 188, 189, 191, 192, 193, 194, 195

Dimensionless X-ray structure factors 151Direct 267, 268, 271, 274, 276, 279, 280,

329Discrete 348, 349Disk of least confusion 12Disordered A2 (bcc) structure 83, 85Dopant distribution 227Drift

correction 24, 446Dwell times 69

EEigenvalues 331, 453Eikonal equation 217Einstein 322, 323, 326, 333

scattering 322, 323, 326, 333Einstein model 159

scattering 159Electrochemical impedance spectrosco-

py 41Electrode materials 40, 59, 60Electron 261, 378, 387, 427, 446, 472, 479,

487, 488Electron dose 22, 26, 30, 46, 47, 60, 69, 70,

188, 224Electronic phase transitions 29Electron irradiation 33, 59, 69, 70, 71Electropolishing 100EMiSPEC 442Emittance 2Energy

calibration 468distribution 6, 152

Ensemble coherence 212Environmental gas cell holder 37Euler’s formula 187Ewald 321, 322Ewald sphere 88, 122, 146, 149, 150, 156Exchange 408, 409, 421Excitation error 149, 150, 156, 157, 158Ex-situ analysis 20Extinction 111, 112, 113, 119, 123, 127,

129, 140, 141, 142, 146, 147, 148, 151, 156, 158, 226

Extractor potential 5

FFcc Cr-rich M23C6 carbide 93Fcc NbC carbides 94FEFF 417Fermi 3, 9, 207, 227, 337, 407, 412, 414,

418

golden 412, 418level 9, 227, 407

Fermions 3, 207Ferritic Steels 96, 97Field-enhancement factor 5, 9Field ion microscopy (FIM) 83Fienup (1982) algorithm 145, 161First-order lattice spacing 160First-order reflection 159Fraunhofer diffraction 161, 203Fresnel 56, 202, 203, 205, 218, 236, 351

contrast 351fringes 202, 205integral 56, 202propagator 202

Full width at half maximum (FWHM) 3, 11, 211

GGalvanostatic hold 41, 59, 63Gaussian

broadening 485, 486, 490, 491fit 468focus 11, 302, 309, 380image 248image plane 11, 12noise 153orbitals 411source 3, 11, 12, 14, 210, 305, 306, 307,

334Global minima 148Gold-plated titanium mirror 38Goodness-of-fit index 148Gottfried Möllenstedt 213, 230G-phase 98, 99Grain boundary, orientations 21Grain growth 27, 93Green 412, 416, 417G-spacings 33

HHairpin metals 26Hamiltonian 273, 280, 407, 408, 409, 410,

416Heating holders 41, 42, 43, 44, 45, 65Heisenberg Uncertainty Principle 198, 206Helmholtz equation 198, 199, 205Hf 302, 304Higher-order Laue zone (HOLZ) 105, 121,

124High-speed electrostatic deflector 26High temporal-resolution imaging 30Holtsmark regime 7Huygens’ principle 202, 213Hysitron picoindenter 51

IIllumination 3, 19, 26, 27, 65, 127, 130,

131, 135, 147, 148, 149, 159, 160,

162, 211, 213, 216, 224, 225, 229, 230

Imagecalibration 178, 179, 180display 171, 173, 174, 175, 177, 178,

179, 180filter 162, 185, 187, 189, 191noise 72, 162, 189, 191plane 177, 189, 219

In 495InAs 334Incoherent 3, 82, 93, 94, 97, 101, 148, 163,

207, 208, 211, 212, 213, 216, 217, 219

Inelastic 36, 38, 64, 67, 132, 138, 149, 150, 159, 163, 211, 212, 217, 223, 224, 225, 226

interaction 211, 212Infinite 312, 316Information loss 178Infrared imaging 35, 38InGaN 226Interference

fringe 160pattern 160, 207

Intermetallic 426, 428, 434, 482, 483, 501International Technology Roadmap for Semi-

conductors (ITRS) 153Inverse 468Ion-beam deposition (IBD) 37Iron jump-ratio image 174Isoplanatic 210

JJump-ratio image 174, 195

KKinematic interaction 217Kirchhoff diffraction integral 197, 199, 201,

202, 203KLM 481, 482Klug’s approach 46, 75

LLaAlO 327, 328LaB 379LaB6 electron source 27Landau 394Laser 4, 10, 19, 24, 25, 26, 27, 38, 51, 64,

65, 67, 207Laws of wave optics 198liquid-N2, 152, 162Log of Modulus 177, 188Longitudinal coherence 4Lorentz 7, 55, 56, 226, 227, 314, 462

angular 314force 55lens 55, 226, 227mode 55, 227

low 449

516 Index

Index

Low-loss 35

MMagnetic flux 55, 218, 230Mass-thickness contrast 63Mathematica™ 3, 24, 170, 175, 176, 183,

185, 187, 188, 198, 200, 202, 210, 212, 213, 230

Matlab™ 24Maxwell 418Mean-free path 36Microdiffraction 81, 82, 85, 100, 146, 148,

159, 160, 163Microelectromechanical systems

(MEMS) 20, 29Micromanipulators 50, 65Minimum 485Möllenstedt biprism 205, 220, 222, 230Monochromators 3Most 393Mott formula 145, 152Multipole expansion 148, 152Multiva 456

NNanoelectromechanical systems 56Nanofactory STM holder 51Nanoindentation 20, 49, 50, 51, 52, 53, 54,

55Nanorods 67, 127, 329, 462

AG 462growth of 67

Nanoscale loops 158Neutron diffraction 148, 158, 163Ni3Nb-type 87NiAl 429NiOx 468, 469, 470, 471, 472, 483, 484,

494NiOxIceC 472, 473NIST Standard Reference Data Base 156Non 383, 384, 385, 391Nylon gas tubes 39

OObject transmission function 201, 203Ohmori 96, 98Omega 379, 380Omega (Ω) filter 147, 149, 152, 154, 158,

162Optical imaging 160, 210Optical pyrometry 41Orthogonal 55, 119, 207, 217Ostwald ripening 30, 39, 69Oxygen plasma cleaning 35‘Oxygen-sponge’ crystals 157

PPairwise 238, 239Paraxial rays 161

Pauli 408Pb 486, 487, 490Peak 468, 480Peak (X-ray characteristic) 67, 149, 158,

171Peltier 470Pencil-beam regime 7Phase Contrast Transfer Function

(PCTF) 204, 216, 218Phase display 178Phonon 149, 156, 158, 162, 163, 211Photoelectric effect 198Photo-emission effect 10Piezo 24, 49, 50, 51, 53, 56, 58, 59, 64, 65,

104, 137, 226Piezoelectric polarization 226Pixon 331Plane wave 148, 152, 162, 198, 199, 200,

201, 202, 203, 205, 213, 217Plasma cleaning 35Plasmon 41, 150, 158, 211Point P 109, 147, 202, 208Point Q 203Point spread function (PSF) 7, 11, 204, 213,

216Point-symmetric masks 185Poisson 145, 148, 151, 157, 255, 381, 386,

452, 453, 454, 455, 456, 458, 477, 485

equation 148, 157, 255, 453noise 381, 452, 453, 454, 456, 458, 477,

485scaled 452, 456statistics 145, 151, 381, 386, 452, 453,

455, 456, 485weighted 452, 453

Pole-piece 18, 19, 29, 30, 31, 32, 33, 36, 37, 38, 43, 52, 53, 56, 65, 66, 67, 71, 73, 74, 227

Post mortem analysis 20, 49Potential distribution 219, 227, 228, 230Potentiostatic hold 41Powder electron diffraction 156Poynting vector 198Practical coherence width 3Pre 393Precession method 123, 145, 157, 158Princip 331, 454Principal Components Analysis (PCA) 194Probe

current 12size 11, 148

Probe-forming lens 12, 147, 148Profile extraction tool 181, 182, 183, 193Projection 344, 346, 347, 373Protein monolayers 146Protochips version 45Pseudo-Contours 171Pseudopotential 410, 413Ptychography 145, 159, 160, 162, 163Pythagoras 202

QQuantitative convergent-beam method

(QCBED) 146Quantitative density map 151Quasicrystals 288, 289, 327, 337

RRadial function 152Radon 344, 345, 346, 347, 350, 373Rate of evaporation 8Rayleigh 293, 300Reference wave 219, 220, 221, 222, 226,

229Region-of-interest (ROI) 180, 181Relative 394, 470, 472, 473Relativistic electron velocity 217Relativity-corrected acceleration voltage 3Relrod 88, 123Residual coherent aberrations 216Residual gas analyzer (RGA) 32, 39Reversible processes 25, 27RGB values 175Richardson equation 4Riemann 346Rietveld method 148, 163Ring collapse 8Rocking curve 146, 147, 148, 156, 157, 163Ronchigrams 145, 154, 159, 160, 161, 163Rose 485Rutherford 284, 314, 315, 332, 337

SSampling Theorem 170Saxton 362Scaling factor 174Scanning 350Scattered intensity 151Scherzer 294, 297, 319Schottky effect 4, 5, 13

emitter 13Schrödinger 407, 408, 410, 411Scintillator 22, 32, 162, 222Secondary Ion Mass Spectroscopy

(SIMS) 227Segmentation 347, 348, 362, 369, 370, 371,

372Selected area diffraction (SAD) 81, 111,

123, 128, 141, 147, 223Shadow image 130, 131, 136, 154, 157,

159, 160, 161Si 286, 288, 303, 308, 310, 312, 321, 326,

443, 468, 475, 480Signal-to-noise (SNR) ratio 224, 225Silicon (111) 7x7 surface reconstruction 22,

31, 33, 35, 36, 45, 60, 61, 75, 109, 134, 136, 137, 141, 146, 149, 155, 157

Simplex algorithm 145, 151Simultaneous 347SiN membranes 33, 34, 35, 38, 39, 40, 70

517

Slater 415Sobel 383Solid angle 2, 13, 210Space-charge effects 26, 27Sparrow 293Spatial 238, 241, 242, 243, 244, 248, 249,

250, 252, 253, 254, 268, 270, 295, 305, 318, 319, 320, 325, 344, 346

Spatial coherence 4, 160, 205, 208, 210, 211, 212, 213, 224

Spatial frequency 162, 187, 188, 189, 195, 200, 201, 203, 205, 213, 216, 218, 219, 220

Spherical aberration 11, 12, 13, 132, 137, 159, 160, 161, 216, 218, 219, 227

Spherical charge density 152Spherical harmonic function 152Spinodal alloy 83, 101Spinodal decomposition 83, 85, 98, 154Static cells 40Stereographic projection 100, 101, 113, 120Stobbs 334Strain

mapping 145, 153Superlattice 83, 84, 85, 87, 88, 101, 134

reflection 88Surface oxide films 100

TTa 432Ta disk cathode 26Temporal coherence 4, 211, 212, 219Thermal-diffuse scattering 158, 159Thermal energy 2Thermal expansion 38, 42, 43, 54Thermionic emitter 6, 7, 13, 25, 26Thin-film elastic relaxation 154Three 387, 388, 389Total 378, 387, 446, 479, 487Total electron dose 47Transmission 350, 354, 377, 378, 379, 400Transmission electron diffraction

(TED) 146Transmission electron microscopy

(TEM) 120, 122Transverse 316, 317, 320Tungsten filament 43Type 329 duplex stainless steel 98

UUltrafast electron microscopes (UEM) 10Ultra high vacuum (UHV) 18, 36Uncertainty principle 4, 153, 198, 206

VVacanc 429, 430, 432, 434Vacancy 54, 69, 72, 158, 335Vanadium-bearing steel 100Varimax 455

Verwey transition 163Virtual source 2, 6, 7, 8, 9, 10, 11, 12, 13,

14, 55, 148, 159, 160Voxel 171

WWarren 322, 337Wave

amplitude 200, 201, 229modulation 201, 216properties 223spherical 199

Wave transfer function 204, 216Weight coefficient 150Wet-etch methods 35WIEN 411, 418, 421

XX-ray Bragg intensities 146, 157X-ray crystallography 41, 113, 145, 146,

147X-ray energy dispersive spectroscopy

(XEDS) 35spectroscopy 35

YYAG scintillator 162Young 292Young’s fringes 160

ZZAF 354Z-contrast 160

high-angle scattering 160Ze 321Zeolite structures 157Zernike phase 203, 218Zero-field image-force potential 5Zero-frequency 188Zero-loss 149, 223Zero-order Laue zone 105, 107, 112, 113,

114, 121, 123, 124, 126, 141, 150Zero scattering angle 151Zincblende structure 222, 223ZOLZ intensity distribution 153

518 Index