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International Journal of Advanced Research in Electronics and Communication Engineering (IJARECE) Volume 3, Issue 10, October 2014 1261 ISSN: 2278 909X All Rights Reserved © 2014 IJARECE AbstractDynamic gates have been excellent choice in the design of high-performance modules such as full adders, subtractors, multipliers, registers, multiplexers and comparators in modern microprocessors. However, the main drawback of dynamic gates is their relatively low noise margin compared to that of standard static logic gates. Traditionally, this problem has been resolved by employing a PMOS keeper transistor in the pull up network that compensates for the sub threshold leakage current of the pull-down NMOS network. In the earlier dynamic technologies, the PMOS keeper transistor could improve the reliability of the dynamic gates with minor performance degradation. However, the shrinking device size towards 16 nm along with increasing levels of process variations have reduced the effectiveness of the traditional PMOS keeper transistor approach. In this paper, a 4-bit ripple carry adder circuit is designed using an adaptive keeper technique called rate sensing keeper (RSK) that enables faster switching and tracks the variation across different process corners[14] and its performance is compared with 4-bit adder circuit designed using twin transistor technique and current mirror techniques. In this paper the multiple bit domino adders are implemented with L=0.12μm technology along with a supply voltage of 1.2V. Index TermsDomino logic, high-speed domino circuit, leakage power, noise tolerance, transistor sizing. 1. INTRODUCTION Dynamic logic gates and circuits have been excellent choice in the design of high-performance modules such as multiple bit adders, subtractors, multipliers, comparators, multiplexers, registers, etc in modern VLSI microprocessors [1]. The advancement in fabrication technology along with the shrinking device size has allowed for placement of nearly two billion transistors on Intel’s latest processor [2]. The digital logic gates and circuits designed using dynamic domino technique is considerably faster than the logic gates and circuits designed with standard static logic style. The aggressive technology scaling to improve the performance as well as the integration level makes the noise play a major role in design parameters like area, power and speed [3]. Therefore the digital integrated circuit noise has become one of the most important issues in the design of deep submicron VLSI chips [4]- [9]. The robustness and performance of wide fan-in dynamic circuits significantly degrade with increasing levels of process variations and sub threshold leakage. A number of design techniques such as PMOS feedback keeper transistor method to prevent the dynamic node floating problem, precharging the internal nodes to eliminate the charge sharing problem and weak complementary p-network is constructed to improve the noise tolerance to the level of skewed static CMOS logic gates, have been developed in the past three decades to minimize the effect of noise in dynamic circuits [6]. It is also shown that voltage scaling aggravates the crosstalk noise in the dynamic circuits and reduces circuit noise immunity, motivating the need for noise-tolerant circuit design [10]-[12]. To design a high performance domino logic circuit, there are two most important factors to be considered when designing a keeper circuit. The first factor is the additional loading caused by the keeper and its control circuits and the second factor is the keeper circuit should be capable of switching off very fast [13]. If the keeper circuit remains ON during evaluation it will compete for longer time with the NMOS network during the pull down process. Designing feedback keeper circuit for wide fan-in gates is a challenging task since the leakage current largely depends on increase in variability [14]. In this paper, a 4-bit ripple carry adder circuit is designed using an adaptive keeper technique called rate sensing keeper (RSK) that enables faster switching and tracks the variation across different process corners[14] and its performance is compared with 4-bit adder circuit designed using twin transistor technique and current mirror techniques. One method to reduce the sub threshold leakage current in the pull down NMOS network is the use of a leakage current replica keeper circuit with proper transistor sizing [15]. This type of domino circuits consists of an analog current mirror to replicate the leakage current of a dynamic gate pull-down stack and thus tracks process, voltage, and temperature. In this paper the effect of temperature on the circuit performance is analyzed in detail by sweeping the temperature from 25 0 C to 70 0 C. The performance of the dynamic circuits can be significantly improved by precise design and properly sizing the transistors. Usually in all the digital circuits the transistor gate length remains uniform. So the size of the transistor in digital circuits depends on the width of the transistor. In this paper the multiple bit domino adders are implemented with L=0.12μm technology along with a supply voltage of 1.2V. The noise sensitivity of the domino circuits depends on the threshold voltage of the transistors used in the circuit and High Speed Low Power Noise Tolerant Multiple Bit Adder Circuit Design Using Domino Logic M.Manikandan 2 ,Rajasri 2 ,A.Bharathi 3 Assistant Professor, IFET College of Engineering, Villupuram, india 1 M.E, Applied Electronics, IFET College of Engineering, Villupuram, India 2,3

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International Journal of Advanced Research in Electronics and Communication Engineering (IJARECE)

Volume 3, Issue 10, October 2014

1261

ISSN: 2278 – 909X All Rights Reserved © 2014 IJARECE

Abstract— Dynamic gates have been excellent choice in the

design of high-performance modules such as full adders,

subtractors, multipliers, registers, multiplexers and

comparators in modern microprocessors. However, the main

drawback of dynamic gates is their relatively low noise margin

compared to that of standard static logic gates. Traditionally,

this problem has been resolved by employing a PMOS keeper

transistor in the pull up network that compensates for the sub

threshold leakage current of the pull-down NMOS network. In

the earlier dynamic technologies, the PMOS keeper transistor

could improve the reliability of the dynamic gates with minor

performance degradation. However, the shrinking device size

towards 16 nm along with increasing levels of process

variations have reduced the effectiveness of the traditional

PMOS keeper transistor approach. In this paper, a 4-bit ripple

carry adder circuit is designed using an adaptive keeper

technique called rate sensing keeper (RSK) that enables faster

switching and tracks the variation across different process

corners[14] and its performance is compared with 4-bit adder

circuit designed using twin transistor technique and current

mirror techniques. In this paper the multiple bit domino

adders are implemented with L=0.12µm technology along with

a supply voltage of 1.2V.

Index Terms— Domino logic, high-speed domino circuit,

leakage power, noise tolerance, transistor sizing.

1. INTRODUCTION

Dynamic logic gates and circuits have been excellent choice

in the design of high-performance modules such as multiple

bit adders, subtractors, multipliers, comparators,

multiplexers, registers, etc in modern VLSI microprocessors

[1]. The advancement in fabrication technology along with

the shrinking device size has allowed for placement of nearly

two billion transistors on Intel’s latest processor [2]. The

digital logic gates and circuits designed using dynamic

domino technique is considerably faster than the logic gates

and circuits designed with standard static logic style. The

aggressive technology scaling to improve the performance as

well as the integration level makes the noise play a major role

in design parameters like area, power and speed [3].

Therefore the digital integrated circuit noise has become one

of the most important issues in the design of deep submicron

VLSI chips [4]- [9]. The robustness and performance of wide

fan-in dynamic circuits significantly degrade with increasing

levels of process variations and sub threshold leakage.

A number of design techniques such as PMOS feedback

keeper transistor method to prevent the dynamic node

floating problem, precharging the internal nodes to eliminate

the charge sharing problem and weak complementary

p-network is constructed to improve the noise tolerance to the

level of skewed static CMOS logic gates, have been

developed in the past three decades to minimize the effect of

noise in dynamic circuits [6]. It is also shown that voltage

scaling aggravates the crosstalk noise in the dynamic circuits

and reduces circuit noise immunity, motivating the need for

noise-tolerant circuit design [10]-[12]. To design a high

performance domino logic circuit, there are two most

important factors to be considered when designing a keeper

circuit. The first factor is the additional loading caused by the

keeper and its control circuits and the second factor is the

keeper circuit should be capable of switching off very fast

[13]. If the keeper circuit remains ON during evaluation it

will compete for longer time with the NMOS network during

the pull down process. Designing feedback keeper circuit for

wide fan-in gates is a challenging task since the leakage

current largely depends on increase in variability [14].

In this paper, a 4-bit ripple carry adder circuit is designed

using an adaptive keeper technique called rate sensing

keeper (RSK) that enables faster switching and tracks the

variation across different process corners[14] and its

performance is compared with 4-bit adder circuit designed

using twin transistor technique and current mirror

techniques. One method to reduce the sub threshold leakage

current in the pull down NMOS network is the use of a

leakage current replica keeper circuit with proper transistor

sizing [15]. This type of domino circuits consists of an analog

current mirror to replicate the leakage current of a dynamic

gate pull-down stack and thus tracks process, voltage, and

temperature. In this paper the effect of temperature on the

circuit performance is analyzed in detail by sweeping the

temperature from 250C to 700C.

The performance of the dynamic circuits can be

significantly improved by precise design and properly sizing

the transistors. Usually in all the digital circuits the transistor

gate length remains uniform. So the size of the transistor in

digital circuits depends on the width of the transistor. In this

paper the multiple bit domino adders are implemented with

L=0.12µm technology along with a supply voltage of 1.2V.

The noise sensitivity of the domino circuits depends on the

threshold voltage of the transistors used in the circuit and

High Speed Low Power Noise Tolerant

Multiple Bit Adder Circuit Design Using

Domino Logic M.Manikandan

2,Rajasri

2,A.Bharathi

3

Assistant Professor, IFET College of Engineering, Villupuram, india1

M.E, Applied Electronics, IFET College of Engineering, Villupuram, India2,3

International Journal of Advanced Research in Electronics and Communication Engineering (IJARECE)

Volume 3, Issue 10, October 2014

1262

ISSN: 2278 – 909X All Rights Reserved © 2014 IJARECE

since the transistor size is decreasing year by year due to

aggressive scaling trends in modern electrons, due to the low

threshold voltage, the circuits should be more sensitive to

noise that necessitates the use of noise tolerant circuits design

techniques. The paper is organized as follows. Section II

details the circuit implementation and operation of the 4-bit

adder using three different domino techniques. Section III

compares the performance of these full adder circuits using

the simulated results. Section IV concludes the paper.

1.1 CIRCUIT DESIGN

The circuit diagram of a full adder circuit implemented

using current mirror domino (LCR) technique is shown in

fig.1 and its layout is shown in fig.2. The full adder circuit

implemented using leakage current replica (LCR) keeper

domino technique uses an analog current mirror to replicate

the leakage current of the pull-down network and it tracks

process, voltage, and temperature.The block diagram of the

4- bit adder circuit implemented using the LCR technique is

shown in fig.3 and its layout is shown in fig.5. The timing

diagram of the 4-bit adder using LCR technique is shown in

Fig.4.

Fig.1. Full Adder circuit using current mirror domino logic

Fig.2. Layout of the Full Adder circuit using current mirror

domino logic

Fig.3 Block diagram of 4-Bit adder using current mirror

domino logic

Fig.4 Timing diagram of the 4-bit adder using high current

mirror logic

Fig.5 Layout of the 4-bit adder using current mirror domino

logic

Fig.6 Voltage Vs Time waveforms of 4-bit adder using

current mirror domino

Fig.7 Effect of temperature on the performance of 4-bit adder

using LCR

The output voltage Vs Time characteristic of the 4-bit

adder is shown in fig.6. This eye diagram shows the

precharing and evaluation of the circuit. In this full adder

circuit a current mirror is connected to the keeper which

compensates for the sub threshold leakage current of the

pull-down network. This current mirror circuit can be shared

International Journal of Advanced Research in Electronics and Communication Engineering (IJARECE)

Volume 3, Issue 10, October 2014

1263

ISSN: 2278 – 909X All Rights Reserved © 2014 IJARECE

for all the logic gates in the circuit. In this configuration the

keeper and current mirror circuit minimizes the delay of the

circuit (delay in the order of pico seconds) by minimizing the

effect of charge sharing. This circuit need proper selection of

clock signal. If the clock frequency exceeds 500MHz, the

performance of the 4-bit adder circuit degrades. The effect of

temperature on the performance of 4-bit adder circuit is

shown in Fig.7. In this work the temperature is varied from

250C to 700C. From the fig.7 it is clear that as the

temperature increases the transition delay also increases due

to the increase in leakage current. The circuit is implemented

using L=0.12µm technology with VDD =1.2V. The simulation

results shows that the circuit performance is superior in

terms of speed and power compared to the adder circuits

implemented using standard static logic circuit techniques.

The full adder circuit implemented using twin transistor

domino technique is shown in figure-8 and its layout is

shown in figure-9. The twin transistor technique improve the

noise immunity of the full adder circuit by increasing the

threshold voltage of the NMOS transistor which is connected

to the input through a cross coupled transistor called twin

transistor. It has been shown that the full adder circuit

implemented using twin transistor technique is more

energy-efficient than existing noise-tolerant full adder

circuits designed using other dynamic techniques. Since the

twin transistors increase the node capacitance of the full

adder circuit, the circuit delay will be increased.

Twin-transistors also reduce the charge-sharing problem that

occurs in dynamic logic circuits. The block diagram of 4-bit

adder circuit implemented using twin transistor domino

technique is shown in figure-10 and its layout is shown in

figure-11. Experimental results show that the full adder

designed using twin transistor technique provides a

significant improvement in the noise immunity of dynamic

circuits with a slight increase in power dissipation and no

loss in throughput. The carry outputs of the 4-bit adder

implemented using twin transistor technique are shown in

fig.12.

Fig.8. Full adder circuit using Twin transistor domino logic

style 250C

Fig.9. Layout of the Full adder circuit using Twin transistor

domino

Fig.10. Block diagram of 4-bit adder using Twin transistor

domino

Fig.11. Layout diagram of 4-bit adder using Twin transistor

domino

Fig.12.Carry outputs of the 4-bit adder using Twin transistor

domino

Fig.13. Voltage Vs Time waveforms of 4-bit adder using twin

transistors

Fig.14.The pre-charge & Evaluation phases of sum bit S3 in

a 4-bit adder

International Journal of Advanced Research in Electronics and Communication Engineering (IJARECE)

Volume 3, Issue 10, October 2014

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ISSN: 2278 – 909X All Rights Reserved © 2014 IJARECE

The output voltage Vs Time characteristic of the 4-bit

adder implemented using twin transistor domino logic style

is shown in fig.13. The pre-charge and evaluation phases of

the sum bit s3 of a 4-bit adder circuit designed using twin

transistor domino logic style are shown in Fig.14. As the

clock frequency increases the output voltage decreases due to

the parasitic capacitances. The operation of the circuit is as

follows. When clock goes low, the dynamic node will be

precharged to VDD (precharge phase) and the output remains

low in this condition. When the clock signal changes the

state from low to high the circuit evaluate the logic function

(evaluation phase). The circuit consume an additional 10 –

15 % power to improve the noise tolerance. Another

limitation of this circuit is in terms of the area.

The full adder circuit implemented using rate sensing

keeper (RSK) technique is shown in figure-15 and its layout

is shown in figure-16. The full adder circuit implemented

using rate sensing technique works based on the difference in

the rate of change of voltage at the dynamic node of the

circuit during the ON and the leakage condition and the

average of these two rates called reference rate is used to

control the keeper transistor. This technique helps to achieve

high speed and low noise. The pin diagram of the full adder

module constructed using RSK technique is shown in fig-17.

This full adder has an extra input terminal called Vbias

terminal. The block diagram of the 4-bit adder circuit

designed using RSK technique is shown in Figure-18 and its

layout is shown in Figure 19. This circuit is also simulated

using L=0.12µm technology with VDD=1.2V. The simulation

results show that the 4-bit adder implemented using RSK

technique gives superior performance compared to the other

alternatives such as Conditional Keeper (CKP) and current

mirror-based keeper (LCR). The power and current Vs Time

characteristic of the 4-bit adder implemented using RSK

domino style is shown in fig.20 and the timing diagram of the

4-bit adder implemented using RSK logic style is shown in

Fig.21.

Fig.15. Full adder circuit using rate sensing keeper technique

Fig.16. Layout of Full Adder using rate sensing keeper

technique

Fig.17. Full adder Module using rate sensing keeper

technique-pin diagram

Fig.18. Block diagram of the 4-bit adder circuit using RSK

logic style

Fig.19. Layout diagram of the 4-bit adder circuit using RSK

logic style

In this paper three types of four bit adders are

presented with L=0.12µm technology and with a supply

voltage of 1.2V. These high performance domino styles

improve the scalability of multiple bit domino logic adders.

Using these methods it is possible to implement the adder

circuits with a transistor gate length of L=16nm along with a

supply voltage of 0.8V. These adder circuits are superior in

performance compared to conventional static logic adders.

These adder circuits minimize the chip area, minimize the

leakage power, and improve the noise tolerance without

much speed degradation. Also the delay between the gates is

now reduced to the order of pico seconds. These types of

domino logic circuits can be used in high performance

microprocessors.

International Journal of Advanced Research in Electronics and Communication Engineering (IJARECE)

Volume 3, Issue 10, October 2014

1265

ISSN: 2278 – 909X All Rights Reserved © 2014 IJARECE

Fig.20. Power Vs Time waveforms of 4-bit adder using RSK

domino

Fig.21.Timing diagram of the 4-bit adder implemented using

RSK domino

2. SIMULATION RESULTS

The simulations were performed using L=0.12µm

technology along with the supply voltage VDD=1.2V. In

this paper a 4-bit adder is constructed using three different

domino techniques such as leakage current mirror keeper,

twin transistor method and rate sensing keeper. Since a

single current mirror structure can be shared among more

than one domino logic circuits, the LCR technique is

useful for constructing wide fan in circuits such as

multiple bit adders, registers, multiplexers etc. This adder

circuit has the area overhead of an extra NMOS transistor

which is connected to the keeper from the current mirror

circuit. This adder circuit has much better noise margin,

low leakage current and low power consumption

compared to the adder circuits designed using domino

logic styles with traditional feedback keepers. The adder

circuit designed using twin transistor domino logic has

very good noise immunity but it consumes some additional

power due to the twin transistors. The power time

characteristics of the 4-bit adder circuit designed using

various domino logic styles is shown in figure-22.

Fig.22.Power-Time characteristics

3.CONCLUSION

As the technology scales down, the leakage current of the

pull down evaluation network increases, especially in wide

fan in dynamic gates such as wide OR gates, wide AND-OR

gates used in microprocessors. This will increase the power

consumption and reduce the noise immunity. In this paper

the performance of 4-bit adder circuit designed using three

domino circuit techniques (LCR, Twin Transistor logic, and

RSK) is analyzed in detail and its performance is compared

with other adder circuits. The 4-bit adder circuit is simulated

using L=0.12µm technology along with supply voltage

VDD=1.2V. The experimental results shows that these adder

circuits gives superior performance compared to adder

circuits designed using conventional domino techniques.

REFERENCES

[1] H. F. Dadgour and K. Banerjee, “A novel

variation-tolerant keeper architecture for high-performance

low-power wide fan-in dynamic or gates,” IEEE Trans. Very

Large Scale (VLSI) Syst., vol. 18, no. 11, pp.1567–1577,

Nov. 2010.

[2] L. Ding and P. Mazumder, “On circuit techniques to

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[4] K. L. Shepard and V. Narayanan, “Noise in deep

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[7] V. G. Oklobdzija and R. K. Montoye,

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MANIKANDAN.M received the B.E degree in

Electronics and communication engineering from Sri

Manakula Vinayagar college of engineering Puducherry,

India and M.E degree in Karuniya University, Coimbatore ,

India .His current research interests include low-power,

high-performance, and robust circuit design for

deep-submicrometer CMOS technologies.

RAJASRI.K received the B.E degree in

Electronics and communication engineering from AVC

college of engineering Mannampandal, Mayiladuthurai,

Tamilnadu. She is currently pursuing the M.E.degree in

Applied electronics from the IFET college of Engineering,

Villupuram, Tamilnadu. Her current research interests

include low-power,high-performance, and robust circuit

design for deep-submicrometer CMOS technologies.

BHARATHI. A was born in Tamilnadu in 1990.

She obtained the Bachelor of degree in Electrical and

Electronics Engineering with First Class Honours in

Avinashilingam University, Tamilnadu in 2012. She is doing

her M.E Applied Electronics in IFET College of

Engineering,Tamilnadu. Her current research interests

include low-power design for deep-submicrometer CMOS

technologies.