13
STATEMENT: This test may not be duplicated or used in part without prior written consent from Bay Area Compliance Laboratories Corp. (Shenzhen). The test data was only valid for the test sample(s). This report must not be used by the customer to claim product certification, approval, or endorsement by NVLAP, NIST, or any agency of the U.S. Federal Government. This report is valid only with a valid digital signature. The digital signature may be available only under the Adobe software above version 7.0. IES LM-79-08 MEASUREMENT AND TEST REPORT For WISDOM OPTOELECTRONICS TECHNOLOGY CO., LIMITED Floor 8,B2 Building,YangGuangn Industrial Park, Bao An District,ShenZhen,China Test Model: WSD-SB06W27-50K-D-T3-A-P Report Type: Electrical and Photometric tests including: Luminous Flux, Color, Luminous Intensity Distribution, THD, Power Factor Test Engineer: Daniel Duan Report Number: RSZ160311512-10 Test Date: 2016-03-18 to 2016-03-21 Report Date: 2016-03-22 Reviewed By: Jeanne Han/Safety Manager Prepared By: Bay Area Compliance Laboratories Corp. (Shenzhen) 6/F, the 3rd Phase of WanLi Industrial Building, ShiHua Road, FuTian Free Trade Zone Shenzhen, Guangdong, China Tel: +86-755-33320018 Fax: +86-755-33320008 Test Facility: Test facility was located at Pu Long Cun 69, Puxinghu Industrial Area, Tangxia Town, Dongguan, Guangdong, P.R.China. Accreditation: The NVLAP Lab Code is 200707-0.

IES LM-79-08The uncertainty of the luminous intensity is U=2.82% (K=2) , at the 95% confidence level. Additional Test The Additional Test item may not be covered by IESNA LM-79-2008

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Page 1: IES LM-79-08The uncertainty of the luminous intensity is U=2.82% (K=2) , at the 95% confidence level. Additional Test The Additional Test item may not be covered by IESNA LM-79-2008

STATEMENT: This test may not be duplicated or used in part without prior written consent from Bay Area Compliance Laboratories Corp.

(Shenzhen). The test data was only valid for the test sample(s). This report must not be used by the customer to claim product certification,

approval, or endorsement by NVLAP, NIST, or any agency of the U.S. Federal Government.

This report is valid only with a valid digital signature. The digital signature may be available only under the Adobe software above version 7.0.

IES LM-79-08

MEASUREMENT AND TEST REPORT For

WISDOM OPTOELECTRONICS TECHNOLOGY CO.,

LIMITED Floor 8,B2 Building,YangGuangn Industrial Park, Bao An District,ShenZhen,China

Test Model: WSD-SB06W27-50K-D-T3-A-P

Report Type:

Electrical and Photometric tests including: Luminous Flux,

Color, Luminous Intensity Distribution, THD, Power

Factor

Test Engineer: Daniel Duan

Report Number: RSZ160311512-10

Test Date: 2016-03-18 to 2016-03-21

Report Date: 2016-03-22

Reviewed By: Jeanne Han/Safety Manager

Prepared By:

Bay Area Compliance Laboratories Corp. (Shenzhen)

6/F, the 3rd Phase of WanLi Industrial Building,

ShiHua Road, FuTian Free Trade Zone

Shenzhen, Guangdong, China

Tel: +86-755-33320018

Fax: +86-755-33320008

Test Facility: Test facility was located at Pu Long Cun 69, Puxinghu Industrial

Area, Tangxia Town, Dongguan, Guangdong, P.R.China.

Accreditation: The NVLAP Lab Code is 200707-0.

Page 2: IES LM-79-08The uncertainty of the luminous intensity is U=2.82% (K=2) , at the 95% confidence level. Additional Test The Additional Test item may not be covered by IESNA LM-79-2008

Bay Area Compliance Laboratories Corp. (Shenzhen) 6/F, the 3rd Phase of WanLi Industrial Building, ShiHua Road, FuTian

Free Trade Zone Shenzhen, Guangdong, China

Report No. RSZ160311512-10 Page 2 of 13 The NVLAP Lab Code is 200707-0.

1. Product Description

General Information:

One sample was received on 2016-03-11 and used for testing. Sample No.: RSZ160311512-S01 Model: WSD-SB06W27-50K-D-T3-A-P

Model Tested: WSD-SB06W27-50K-D-T3-A-P

Manufacturer: WISDOM OPTOELECTRONICS TECHNOLOGY CO., LIMITED

Brand Name: WISDOM

Product Designation: Outdoor Pole/Arm-Mounted Area and Roadway Luminaires

Architectural Flood and Spot Luminaires

Dimmable: Non-Dimmable

Burning Time Before Test: 0 hour(For New Products)

Rated Values:

Rated Voltage/Frequency: AC120-277V 60Hz

Rated Power: 60W

Nominal Light Output: 7200 lm

Nominal CCT: 5000K

Nominal CRI: 80

2. Standards Used

IESNA LM-79-08: Approved Method: Electrical & Photometric Measurement of Solid-state Lighting Products

ANSI C82.77-2002: Harmonic Emission Limits – Related Power Quality Requirements for Lighting

3. Description of Test Equipment

Device Manufacture Model No Serial No Test Range Calibration

date

Calibration

due date

Integrating

Sphere SENSING SPR-600 S09008 25~50℃ 2016-03-10 2017-03-09

Spectral

photometer SENSING SPR3000 90902027 350nm~800nm 2016-03-10 2017-03-09

Power Meter YOKOGAWA WT-210 91j926132 15/30/60/150/300/600 V 2016-03-04 2017-03-03

AC Power Supply ALL Power APW-105N 970663 220V±10% 50HZ 2016-03-04 2017-03-03

Standard Light

Source EVERFINE D204 01331191 24V/100W 2015-08-27 2016-08-26

Thermal Meter SENSING N/A N/A 25、50℃ 2016-03-10 2017-03-09

DC Power

Supply ITECH IT6154

0061 0417 6471 0010

19 0~32V 2016-03-04 2017-03-03

AC Power Supply EVERFINE VPS1030

PWM 1012017 0-150V, 0-300V 2016-03-04 2017-03-03

DC Power

Supply EVERFINE WY12010 1009009 30V/5A 2016-03-04 2017-03-03

Power Meter YOKOGAWA WT-210 91KB35700 15/30/60/150/300/600 V 2016-03-04 2017-03-03

Goniophotometer EVERFINE GO-R5000 YG108492N10120001 1600mm,3000W/10A 2016-03-10 2017-03-09

Wireless Remote

Sensor N/A 433MHz N/A 0℃~50℃;-20℃~60℃ 2015-03-24 2016-03-23

Page 3: IES LM-79-08The uncertainty of the luminous intensity is U=2.82% (K=2) , at the 95% confidence level. Additional Test The Additional Test item may not be covered by IESNA LM-79-2008

Bay Area Compliance Laboratories Corp. (Shenzhen) 6/F, the 3rd Phase of WanLi Industrial Building, ShiHua Road, FuTian

Free Trade Zone Shenzhen, Guangdong, China

Report No. RSZ160311512-10 Page 3 of 13 The NVLAP Lab Code is 200707-0.

Device Manufacture Model No Serial No Test Range Calibration

date

Calibration

due date

Standard Light

Source EVERFINE D908 1012003 N/A 2015-09-08 2016-09-07

Statement of Traceability: Bay Area Compliance Laboratories Corp. (Shenzhen) attested that all calibration has been

performed using suitable standards traceable to National Primary Standards and International System of Units (SI).

4. Test Method

Product was tested with no seasoning. All stabilization and measurements were made in compliance with IES LM-79-08. The product was operated at rated voltage or at voltage required by manufacturer. The ambient temperature of the sample was maintained at 25°C±1°C during measurement. And relative humidity is less than 65%.

Integrating Sphere System

The system includes AC power source, digital power meter, DC power supply, spectrophotometer, and integrating sphere. The integrating sphere system is calibrated by standard light source before measurement. The system and standard light source has been calibrated regularly and traceable to the National Primary Standards.

4π geometry was used during measurement. The product was operated in its intended orientation in application and was recorded in this report.

The uncertainty of the light output (luminous flux) measurements is U=2.1% (K=2), at the 95% confidence level. The uncertainty of the correlated color temperature measurements is U=32K (K=2), at the 95% confidence level. The uncertainty of the CRI is U=2.1 (K=2) , at the 95% confidence level.

The uncertainty of power meter AC current U=0.19 % of rdg, AC Voltage U=0.15% of rdg, Power U=0.20%) (K=2), at the 95% confidence level.

Goniophotometer System

The goniophotometer system is calibrated by standard light source before measurement. The standard light source has been calibrated regularly and traceable to the National Primary Standards.

Type C goniophotometer was used for measuring total luminous flux, luminous intensity distribution, and color spatial uniformity. The product was operated in its intended orientation in application and was recorded in this report.

The uncertainty of the luminous intensity is U=2.82% (K=2) , at the 95% confidence level.

Additional Test

The Additional Test item may not be covered by IESNA LM-79-2008. Additional test including power factor, off-state power and THD, was measured by Digital Power Meter after stabilized at 25°C±1°C.Test voltage for THD and power factor test would be equal to rated voltage or, in case of a voltage range, maximum value of that range.

The uncertainty of power meter AC current U=0.19 % of rdg, AC Voltage U=0.15% of rdg, Power U=0.20%) (K=2), at

the 95% confidence level.

Page 4: IES LM-79-08The uncertainty of the luminous intensity is U=2.82% (K=2) , at the 95% confidence level. Additional Test The Additional Test item may not be covered by IESNA LM-79-2008

Bay Area Compliance Laboratories Corp. (Shenzhen) 6/F, the 3rd Phase of WanLi Industrial Building, ShiHua Road, FuTian

Free Trade Zone Shenzhen, Guangdong, China

Report No. RSZ160311512-10 Page 4 of 13 The NVLAP Lab Code is 200707-0.

5. Test Result

[Integrating Sphere System]

Total operating time for integrating sphere test: 1.0 hours

Test orientation: Downward

Electrical Measurement

Voltage (V) Frequency (Hz) Current (A) Power (W) Power Factor

120.04 60 0.5148 61.6 0.997

Photometric Measurement

Luminous Flux (lm) Radiant Flux (W) Efficacy (lm/W) CCT (K) Duv

7165.79 22.303 116.328 4908 0.0023

Chromaticity Coordinate

x y u v u' v'

0.3483 0.3588 0.2108 0.3257 0.2108 0.4886

Color Rendering Index

Ra

83.1

R1 R2 R3 R4

81 88 92 83

R5 R6 R7 R8

81 82 88 69

R9 R10 R11 R12

12 70 82 57

R13 R14 R15

83 95 76

Page 5: IES LM-79-08The uncertainty of the luminous intensity is U=2.82% (K=2) , at the 95% confidence level. Additional Test The Additional Test item may not be covered by IESNA LM-79-2008

Bay Area Compliance Laboratories Corp. (Shenzhen) 6/F, the 3rd Phase of WanLi Industrial Building, ShiHua Road, FuTian

Free Trade Zone Shenzhen, Guangdong, China

Report No. RSZ160311512-10 Page 5 of 13 The NVLAP Lab Code is 200707-0.

Relative Spectral Power Distribution

nm mW

nm mW

nm mW

nm mW

nm mW

380 8.693E-03 465 2.887E-01 550 4.057E-01 635 2.850E-01 720 2.981E-02

385 6.461E-03 470 2.145E-01 555 4.106E-01 640 2.601E-01 725 2.556E-02

390 5.020E-03 475 1.680E-01 560 4.186E-01 645 2.354E-01 730 2.199E-02

395 3.680E-03 480 1.602E-01 565 4.202E-01 650 2.127E-01 735 1.882E-02

400 2.808E-03 485 1.715E-01 570 4.270E-01 655 1.901E-01 740 1.642E-02

405 3.372E-03 490 1.946E-01 575 4.288E-01 660 1.679E-01 745 1.428E-02

410 5.522E-03 495 2.268E-01 580 4.332E-01 665 1.469E-01 750 1.210E-02

415 1.109E-02 500 2.639E-01 585 4.330E-01 670 1.296E-01 755 1.094E-02

420 2.385E-02 505 2.960E-01 590 4.311E-01 675 1.123E-01 760 9.548E-03

425 4.702E-02 510 3.213E-01 595 4.284E-01 680 9.776E-02 765 8.240E-03

430 9.465E-02 515 3.418E-01 600 4.179E-01 685 8.485E-02 770 7.396E-03

435 1.847E-01 520 3.574E-01 605 4.078E-01 690 7.411E-02 775 6.494E-03

440 3.465E-01 525 3.703E-01 610 3.967E-01 695 6.340E-02 780 5.965E-03

445 5.929E-01 530 3.801E-01 615 3.756E-01 700 5.490E-02

450 7.037E-01 535 3.864E-01 620 3.571E-01 705 4.624E-02

455 5.314E-01 540 3.920E-01 625 3.336E-01 710 3.988E-02

460 3.754E-01 545 3.981E-01 630 3.107E-01 715 3.427E-02

0.0

0.2

0.4

0.6

0.8

1.0

1.2

380 440 500 560 620 680 740 800

Page 6: IES LM-79-08The uncertainty of the luminous intensity is U=2.82% (K=2) , at the 95% confidence level. Additional Test The Additional Test item may not be covered by IESNA LM-79-2008

Bay Area Compliance Laboratories Corp. (Shenzhen) 6/F, the 3rd Phase of WanLi Industrial Building, ShiHua Road, FuTian

Free Trade Zone Shenzhen, Guangdong, China

Report No. RSZ160311512-10 Page 6 of 13 The NVLAP Lab Code is 200707-0.

CIE 1931 x y Chromaticity Diagram

7-Step & 4-Step Chromaticity Quadrangles

0

0.1

0.2

0.3

0.4

0.5

0.6

0.7

0.8

0.9

0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8

0.30

0.35

0.40

0.45

0.30 0.35 0.40 0.45 0.50 0.55

sample

7-STEP 2200K

7-STEP 2500K

7-STEP 2700K

7-STEP 3000K

7-STEP 3500K

7-STEP 4000K

7-STEP 4500K

7-STEP 5000K

7-STEP 5700K

7-STEP 6500K

Page 7: IES LM-79-08The uncertainty of the luminous intensity is U=2.82% (K=2) , at the 95% confidence level. Additional Test The Additional Test item may not be covered by IESNA LM-79-2008

Bay Area Compliance Laboratories Corp. (Shenzhen) 6/F, the 3rd Phase of WanLi Industrial Building, ShiHua Road, FuTian

Free Trade Zone Shenzhen, Guangdong, China

Report No. RSZ160311512-10 Page 7 of 13 The NVLAP Lab Code is 200707-0.

[Goniophotometer System]

Total operating time for luminous intensity distribution: 1.0 hours

Test orientation: Downward

Electrical Measurement

Input Voltage (V) Frequency (Hz) Input Current (A) Power (W) Power Factor

120.02 60 0.5185 61.3 0.9851

Photometric Measurement

Luminous Flux (lm) Efficacy (lm/W) Imax (cd) S/MH (C0/180) S/MH (C90/270)

7213.29 117.67 3669 1.95 1.09

Luminous Intensity Distribution

C0/180 C45/225 C90/270 C135/315 AVG.

Beam Angle (50% Imax): 130.6 46.1 55.8 45.8 69.6

Field Angle (10% Imax): 161.9 141.0 134.7 140.9 144.6

Page 8: IES LM-79-08The uncertainty of the luminous intensity is U=2.82% (K=2) , at the 95% confidence level. Additional Test The Additional Test item may not be covered by IESNA LM-79-2008

Bay Area Compliance Laboratories Corp. (Shenzhen) 6/F, the 3rd Phase of WanLi Industrial Building, ShiHua Road, FuTian

Free Trade Zone Shenzhen, Guangdong, China

Report No. RSZ160311512-10 Page 8 of 13 The NVLAP Lab Code is 200707-0.

Luminous Intensity (cd) Distribution Data

C

0° 22.5° 45° 67.5° 90° 112.5° 135° 157.5° γ

0.0° 1347 1347 1347 1347 1347 1347 1347 1347

5.0° 1359 1392 1415 1415 1432 1431 1425 1410

10.0° 1413 1478 1501 1505 1509 1531 1552 1533

15.0° 1544 1665 1665 1608 1615 1685 1788 1795

20.0° 1812 1996 1949 1775 1744 1901 2163 2210

25.0° 2181 2481 2388 2034 1966 2257 2668 2711

30.0° 2576 2922 2924 2564 2518 2828 3184 3122

35.0° 3018 3242 3421 3140 2947 3392 3567 3387

40.0° 3206 3582 3539 3115 2866 3295 3637 3616

45.0° 2881 3542 3353 3032 2668 3113 3405 3264

50.0° 2115 2925 3235 2751 2246 2795 3167 2558

55.0° 1714 2067 2988 2115 1642 2146 2748 1976

60.0° 1454 1778 2424 1820 1879 1795 2059 1788

65.0° 747 1502 1549 1658 1211 1563 1401 1220

70.0° 340 702 1050 687 458 687 1009 580

75.0° 236 305 491 267 187 259 485 286

80.0° 150 160 193 126 95 123 188 148

85.0° 55 64 78 57 43 56 68 51

90.0° 0 4 2 2 4 1 5 0

95.0° 0 0 0 0 0 0 0 0

100.0° 1 0 0 0 0 0 0 0

105.0° 1 0 0 0 0 0 0 1

110.0° 1 0 0 0 0 0 0 1

115.0° 1 1 0 0 0 0 0 1

120.0° 1 1 0 0 0 0 0 1

125.0° 1 1 1 0 0 0 1 1

130.0° 1 1 1 1 0 1 1 1

135.0° 1 1 1 1 1 1 1 1

140.0° 1 1 1 1 1 1 1 1

145.0° 2 1 1 1 1 1 1 2

150.0° 2 2 2 1 1 1 2 2

155.0° 2 2 2 2 1 2 2 2

160.0° 2 2 2 2 2 2 2 2

165.0° 2 2 2 2 2 2 2 2

170.0° 2 2 2 2 2 2 2 2

175.0° 2 2 2 2 2 2 2 2

180.0° 2 2 2 2 2 2 2 2

Page 9: IES LM-79-08The uncertainty of the luminous intensity is U=2.82% (K=2) , at the 95% confidence level. Additional Test The Additional Test item may not be covered by IESNA LM-79-2008

Bay Area Compliance Laboratories Corp. (Shenzhen) 6/F, the 3rd Phase of WanLi Industrial Building, ShiHua Road, FuTian

Free Trade Zone Shenzhen, Guangdong, China

Report No. RSZ160311512-10 Page 9 of 13 The NVLAP Lab Code is 200707-0.

Luminous Intensity (cd) Distribution Data (cont.)

C

180° 202.5° 225° 247.5° 270° 292.5° 315° 337.5° γ

0.0° 1347 1347 1347 1347 1347 1347 1347 1347

5.0° 1368 1331 1300 1268 1268 1272 1293 1328

10.0° 1452 1344 1242 1188 1177 1196 1241 1321

15.0° 1634 1418 1205 1098 1091 1105 1182 1345

20.0° 1950 1579 1208 1032 1032 1042 1166 1479

25.0° 2309 1736 1236 987 1004 992 1190 1650

30.0° 2740 1866 1229 941 996 956 1202 1807

35.0° 3064 1926 1191 899 983 908 1178 1920

40.0° 3084 1932 1132 838 950 852 1138 1992

45.0° 2610 1781 1039 767 860 767 1056 1885

50.0° 1919 1491 910 666 733 673 939 1611

55.0° 1629 1116 720 550 585 560 760 1219

60.0° 1296 755 514 420 419 432 539 816

65.0° 676 466 337 283 220 296 348 521

70.0° 312 276 223 174 163 180 225 303

75.0° 245 214 161 122 112 125 161 221

80.0° 150 135 100 83 83 85 105 145

85.0° 51 45 43 46 46 48 50 55

90.0° 0 0 0 0 0 0 0 0

95.0° 0 0 0 0 0 0 0 0

100.0° 0 0 1 0 0 1 0 0

105.0° 0 1 1 1 1 1 1 1

110.0° 1 1 1 1 1 1 1 1

115.0° 1 1 1 1 1 1 1 1

120.0° 1 1 1 1 1 1 1 1

125.0° 1 1 1 1 1 1 1 1

130.0° 1 1 1 1 1 1 1 1

135.0° 1 1 2 2 2 2 2 2

140.0° 1 1 2 2 2 2 2 2

145.0° 1 1 2 2 2 2 2 2

150.0° 1 1 1 2 2 2 2 2

155.0° 1 1 1 1 2 2 2 2

160.0° 1 1 1 1 2 2 1 2

165.0° 1 1 1 1 2 2 1 2

170.0° 1 1 1 1 2 2 2 2

175.0° 2 2 1 2 2 2 2 2

180.0° 2 2 2 2 2 2 2 2

Page 10: IES LM-79-08The uncertainty of the luminous intensity is U=2.82% (K=2) , at the 95% confidence level. Additional Test The Additional Test item may not be covered by IESNA LM-79-2008

Bay Area Compliance Laboratories Corp. (Shenzhen) 6/F, the 3rd Phase of WanLi Industrial Building, ShiHua Road, FuTian

Free Trade Zone Shenzhen, Guangdong, China

Report No. RSZ160311512-10 Page 10 of 13 The NVLAP Lab Code is 200707-0.

Average Area Illumination Figure

Height (m) Diameter

(cm) Eavg(lx) Emax(lx)

0.5 69.50 5453.0 8254.0

1.0 139.00 1363.0 2063.0

1.5 208.51 605.9 917.1

2.0 278.01 340.8 515.9

2.5 347.51 218.1 330.1

3.0 417.01 151.5 229.3

3.5 486.51 111.3 168.4

4.0 556.01 85.2 129.0

4.5 625.52 67.3 101.9

5.0 695.02 54.5 82.5

Angle: 69.6°. Flux out: 2100.0 lm.

Page 11: IES LM-79-08The uncertainty of the luminous intensity is U=2.82% (K=2) , at the 95% confidence level. Additional Test The Additional Test item may not be covered by IESNA LM-79-2008

Bay Area Compliance Laboratories Corp. (Shenzhen) 6/F, the 3rd Phase of WanLi Industrial Building, ShiHua Road, FuTian

Free Trade Zone Shenzhen, Guangdong, China

Report No. RSZ160311512-10 Page 11 of 13 The NVLAP Lab Code is 200707-0.

Zonal Lumen Density Measurement

Deg Flux (lm) %

Deg Flux (lm) %

0-5 32.3 0.45 0-5 32.3 0.45

5-10 98.1 1.36 0-10 130.4 1.81

10-15 168.8 2.34 0-15 299.2 4.15

15-20 254.2 3.52 0-20 553.4 7.67

20-25 366.1 5.08 0-25 919.5 12.75

25-30 507.1 7.03 0-30 1426.7 19.78

30-35 673.2 9.33 0-35 2099.9 29.11

35-40 807.3 11.19 0-40 2907.2 40.30

40-45 871.3 12.08 0-45 3778.5 52.38

45-50 846.5 11.74 0-50 4624.9 64.12

50-55 747.7 10.36 0-55 5372.7 74.48

55-60 641.8 8.90 0-60 6014.5 83.38

60-65 528.1 7.32 0-65 6542.6 90.70

65-70 331.4 4.60 0-70 6873.9 95.30

70-75 176.2 2.44 0-75 7050.2 97.74

75-80 96.0 1.33 0-80 7146.2 99.07

80-85 49.5 0.69 0-85 7195.7 99.76

85-90 12.0 0.16 0-90 7207.7 99.92

90-95 0.2 0.01 0-95 7207.9 99.93

95-100 0.2 0.00 0-100 7208.1 99.93

100-105 0.2 0.00 0-105 7208.3 99.93

105-110 0.3 0.01 0-110 7208.6 99.94

110-115 0.3 0.00 0-115 7208.9 99.94

115-120 0.4 0.00 0-120 7209.3 99.94

120-125 0.4 0.01 0-125 7209.7 99.95

125-130 0.4 0.01 0-130 7210.1 99.96

130-135 0.5 0.00 0-135 7210.5 99.96

135-140 0.5 0.01 0-140 7211.0 99.97

140-145 0.5 0.00 0-145 7211.5 99.97

145-150 0.4 0.01 0-150 7211.9 99.98

150-155 0.4 0.01 0-155 7212.3 99.99

155-160 0.4 0.00 0-160 7212.7 99.99

160-165 0.3 0.01 0-165 7212.9 100.00

165-170 0.2 0.00 0-170 7213.1 100.00

170-175 0.1 0.00 0-175 7213.3 100.00

175-180 0.0 0.00 0-180 7213.3 100.00

Page 12: IES LM-79-08The uncertainty of the luminous intensity is U=2.82% (K=2) , at the 95% confidence level. Additional Test The Additional Test item may not be covered by IESNA LM-79-2008

Bay Area Compliance Laboratories Corp. (Shenzhen) 6/F, the 3rd Phase of WanLi Industrial Building, ShiHua Road, FuTian

Free Trade Zone Shenzhen, Guangdong, China

Report No. RSZ160311512-10 Page 12 of 13 The NVLAP Lab Code is 200707-0.

[Additional Test]

Test Item Test Voltage (V) Frequency (Hz) Test Result

Power Factor: 277.0 60 0.9621

Total Harmonic Distortion: 277.0 60 13.92%

Total Harmonic Distortion: 120.0 60 9.51%

6. Product Photo

Page 13: IES LM-79-08The uncertainty of the luminous intensity is U=2.82% (K=2) , at the 95% confidence level. Additional Test The Additional Test item may not be covered by IESNA LM-79-2008

Bay Area Compliance Laboratories Corp. (Shenzhen) 6/F, the 3rd Phase of WanLi Industrial Building, ShiHua Road, FuTian

Free Trade Zone Shenzhen, Guangdong, China

Report No. RSZ160311512-10 Page 13 of 13 The NVLAP Lab Code is 200707-0.

7. Product Test orientation in the Goniophotometer

***********END OF REPORT***********