Industrialized Test Solutions - Photonic Integration Conference · 2017. 9. 29. · Fits in the V93K, Teradyne Catalyst / FLEX / UltraFLEX Direct ATE and Fast Ethernet control Measures

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Bridging the gaps of ATE versus new technologies….

Industrialized Test Solutions


We create and deliver innovative and effective Test Solutions for the microelectronics market, partnering with our customers to enhance

their success

Salland enables customer differentiation in Test Strategy– Turn Key Solutions on Salland core technology– Industrialization and Support on Customer IP– Delivery of Test Technology & Experience

Test Application Solutions

Introduction to Salland Engineering

Instruments Solutions

Company Confidential

Supply Chain Services


Today's Test Challenges; Device Technology develops faster then ATE

MEMS, IoT‐ …. Very Low current, low Capacitance and Low cost

SerDes; High Speed interfacing require Extremely fast signal handling‐ …. keeping signal integrity up to the device is getting challenging and expensive

RF/mmWave‐ ... Far beyond exsisting standard tester capabilities

Photonics

Never ending battle’s in test; Balance between Test Coverage, Cost of Test & Throughput (QCD)

=> A need for solutions to enhance the standard Tester (ATE) functionality

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Possible solutions to deliver new Technology

4

Universal

Investment

Application Specific

Loadboard

Universal ATE Instrument

FlexibleFast Costs

Poor IntegrationDebug toolingCalibration &

diagnosticSupply chain

Universal/FlexibleSupply chainCal & diagnosticsTooling

High Capex costsTTM: x years

$$$$

$

Technology

Rack Instruments


Possible solution

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Universal

Investment

Application Specific

Loadboard

“SMART Platform solution’’Device Family based

Universal ATE Instrument

Enhanced IntegrationDebug toolingCalibration & diagnosticSupply chainSupports familiesRobustness

Less UniversalLess Tooling

$$$$

$

Technology


Some Example’s

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Use Case: High Speed SERDES Solution

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Objective‐ Improve Testability by enabling test at-speed on SERDES

Constraints/Requirements‐ No ATE Instrument Configuration and TOS changes (Teradyne Catalyst)‐ Portable Solution and ATE independent

Proposal‐ ATE Independent High Speed SERDES modules inside stiffener with

DSO capability up to 32Gbps & BERT capability up to 30Gbps

Results‐ Enable High Speed Testing with


HSI 4 X 1_25GHz DSO Digital Sampling Scope

SMPS 40GHz Coaxial connector Ethernet and/or Direct ATE control interface Windows based Signal Debug GUI

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Description: State of the art, 4 channel, 25Gbps Digital

Sampling Oscilloscope for production testing Measures SerDes PHY TX signals on various

ATE platforms with all the logging and analyzing capabilities

Typical applications like High-Speed SerDes Testing & Characterization on various ATE platforms (Catalyst, V93k, ultraFLEX, etc.)

Solution: Full Eye and Mask Measurements Rise Time / Fall Time measurements Jitter Decomposition (TJ, RJ, DJ) intrinsic Jitter 20+ GHz Bandwidth Reference Optical Receiver



HSI 4 X 8.5_30 BERT Bit Error Rate Tester

Key features:‐ Supports all PRBS patterns and user pattern‐ Amplitude & Skew settings‐ Eye Scan & Bathtub measurement

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Description: State of the art, 4 channel, 8.5 to 30Gbps Bit

Error Rate Tester for production testing Stimulates SerDes PHY RX with a

controllable signal (level, noise, jitter) Fits in the V93K, Teradyne Catalyst / FLEX /

UltraFLEX Direct ATE and Fast Ethernet control Measures only 4.92” x 6.30”

Solution: 19/16ps Rise/Fall Times RMS jitter, Deterministic Jitter Output Level max. 1600mVpp differential 25mVpp sensitivity



Objective‐ Test RF /Radar components at 30GHz‐ Shorten development time hardware‐ Enable usage of low-cost digital testers

Constraints/Requirements‐ ATE independent‐ Easy configurable/tuneable specifications‐ Small form factors because of loadboard

space constraint

Proposal‐ Create set of building blocks to be able to bring RF signals in range of existing ATE

instruments

Result‐ Series of universal building blocks that can be used on ATE, Bench, final products

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RF Test Solutions: SE-RF Building block’s


Use Case: RF (Radar) testing

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RF Amplifier – Low Power

RF switches – T with 2 to 6 Multiplexer

Bandpass Filter


Bridging the ATE Gap to test Advanced MEMS Sensors

Objective ‐ Testing Advanced MEMS Sensors/IoT fully on normal ATE

MEMS Sensor element, DAC, ADC, Wireless, Processing & control ASIC

‐ Low cost, many part high parallel, wafer test Constrains/Requirements

‐ Get early process information about MEMS structure during wafer test

‐ MEMS sensor Testers: Can’t handle complex ASIC’s and/or high parallelism

‐ ATE: Can’t handle well specific MEMS parameters Proposal

‐ Exchange physical stimulus by electrical simulationDynamic MEMS test: Test the Mechanical elements electricallyAdd the missing capability to existing ATE

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Dynamic MEMS Level Testing?

Drive or Force

(Vo

lts)

(Time Units)

Sense or Measure

(Time Units)f = 1/t

Slope = Damping Ratio, Zeta and Q

(Signal Pattern Input:

Step, Ramp, Custom)(Device Response Output)

1 Axis Accelerometer

Digitized Waveform Output(Continuous Data Stream)


The Challenge: Bridging the Gap

MEMS test Solution ATE Testing

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MEMS Solution

SΣDelta/Gap:• Low site count

• Complexity

Delta/Gap:

• Low Capacitance

• Low current

• Smart Stimulation

• Smart Measure

• Test Tooling


Dynamic MEMS Solution Concept: Best of both Worlds!

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Regular ATE:

• DPS• Digital I/O• PMU• AWG/DIG• DUT Power

Supplies

MEMS Solution:

Hardware• Pico PMU (pA/nA)• Capacitance (pF/fF)• External LCR

connections• Memory/uC to

collect & pre-process data

(STDF & CSV)Tooling• Hardware control • Data Analysis

MEMS Solution

SΣ


New Test Challenges: New applications ahead

Monolithically IoT parts; ‐ Sensor and ASIC together, low cost

Increase test frequencies‐ 60 GHz license-free band‐ 28 … to 71 GHz bands for 5G‐ 77 and 120 GHz automotive radar

Faster SerDes modules‐ 400Gbit/s optical data communications‐ Higher frequencies‐ Other modulation methods: PAMx and QAM

Photonics‐ From light to high-speed digital ‐ Salland: use same ‘’add-on approach’’ to realize Photonic test solution

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https://www.i-micronews.com/images/Reports/MEMS/Images_reports/Yole_MEMS_CAGRs_for_MEMS_devices_MIS2017.jpg


Question to the audience

Salland can deliver Integrated & Industrialized Automatic Test Equipment Instruments & Applications

Salland is looking for partners to explore Photonics test challenges

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Your Challenge, Our StrengthSalland Engineering Test Solutions

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Thanks for your attention

Documents

Industrialized Test Solutions - Photonic Integration Conference · 2017. 9. 29. · Fits in the V93K, Teradyne Catalyst / FLEX / UltraFLEX Direct ATE and Fast Ethernet control Measures