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Integrated electronic for SiPMIntegrated electronic for SiPMKOBE – 29 June ‘07
M. Bouchel, F. Dulucq, J. Fleury, C. de La Taille, G. Martin-Chassard, N. Seguin, L.
Raux, S. Blin, P. Barrillon, S. Callier
LAL Orsay IN2P3-CNRS – Université Paris-Sud – B.P. 34
91898 Orsay cedex – France
Introduction LAL microelectronic group is designing integrated front-
end electronic for particle physics Its know-how has evolved from low-noise front-end to
multichannel read out ASICs system on chip design allowing low-cost high number of channel read-out
That talk will introduce a bunch of Front-end ASICs designed by LAL microelectronic group
4 ASICs suitable for SiPM read out will be presented :
2004FLC_SIPM
2006MAROC2
2006HARDROC
2007SPIROC
FLC_SIPM
TCMTAHCAL
beam
ECAL
90 c
m 120
cm
FLC_SIPM has been designed to read out the CALICE AHCAL physics prototype
It is also used in the TCMT read out
Tile HCAL testbeam prototype 1 cubic metre 38 layers, 2cm steel plates 8000 tiles with SiPMs Electronics based on CALICE ECAL
design, common back-end and DAQ
DESY, Hamburg U,ITEP, MEPHI, LPI (Moscow)Northern IllinoisLAL, OrsayPragueUK groups
Tile sizes optimized for cost reasons
ASICs: LALBoards: DESY
DAQ: UK
DESY
From Felix Sefkow’s talk
Gain and dark rate uniformity correction
SiPM gain varies with the high voltage value DAC to adjust gain
CHANNEL BY CHANNEL
from M.Danilov ITEP, Moscow
Gain and dark rate uniformity correction
+HV
Preamp input
50Ω
100nF
SiPM
100kΩ 100nF 8-bit DAC
ASICHigh voltage on
the cable shielding
The input DACs allow to adjust HV channel by channel via slow control on the 8000 SiPM of the detector
Chip description
18-channel 8-bit DAC (0-5V) 18-channel front-end readout :
Variable gain charge preamplifier (0.67 to 10 V/pC) Variable time constant CRRC2 shaper (12 to 180 ns)
Track and hold 1 multiplexed output Power consumption : ~200mW (supply : 0-5V) Technology : AMS 0.8 m CMOS Chip area : ~10mm² Package : QFP-100
Channel architecture for SiPM readout
100nF
10pF
Charge Preamplifier :Low noise : 1300e- @40ns
Variable gain :
4bits : 0.67 to 10 V/pC
CR-RC² Shaper :Variable time constant : 4 bits (12 to 180ns)
12ns photoelectron measurement (calibration mode)180ns Mip measurement (physic mode)
compatibility with ECAL read-out
12kΩ
4kΩ 24pF
12pF
3pF
in
8pF 4pF 2pF 1pF
40kΩ
8-bit
DAC
0-5V
ASIC
Rin =
10kΩ
50Ω
100MΩ 2.4pF
1.2pF
0.6pF
0.3pF
0.1pF
0.2pF
0.4pF
0.8pF
6pF
MIP and photo-electron responses
Physics mode : Cf=0.4pF- t=180ns - Rin ON 1 MIP = 16 p.e. injected Vout = 23 mV @ tp = 160 ns SLOW SHAPING FOR TRIGGER
LATENCY
Calibration mode : Cf=0.2pF - t=12ns - Rin OFF 1 SPE = 0.16pC injected (0.6mV in 270pF) Vout = 11 mV @ tp = 35 ns
Linearity measurement (physics mode)Linearity Rin ON
t=180ns
0
500
1000
1500
2000
2500
0 50 100 150 200 250 300 350
Qinj (MIP)
Vo
ut
(mV
)
Cf=0,1pF
Cf=0,8pF
Cf=0,4pF
Cf=0,2pF
Cf=1,5pF
Linearity Residuals for physics mode (%)
-1
-0,8
-0,6
-0,4
-0,2
0
0,2
0,4
0,6
0 10 20 30 40 50 60 70 80 90
Injected charge (MIP=16p.e.)
0.5%
-0.5%
•Voltage swing : ~2.1V
•Dynamic Range: 80 MIPs
•Linearity: <1%
Cross-talk measurement
Set-up: Cf=0.4pF, t=180ns
Channel-to-Channel cross-talk : ~ 1-2‰ :negligible 2 contributions :
Capacitive coupling between neighboring channels
Long distance crosstalk in all channels (comes from a reference voltage)
Non-Direct neighbouring channel x100
Sampling time
Capacitive coupling contribution
Direct neighbouring channel x100
Long Distance cross-talk contribution
FLC_SIPM results
With russian SiPMWith MPPC
Felix
Sefk
ow
& a
l
Tohru
Take
shit
a &
al
-Physics results on such high number of channel are coming up-So far :
-Noise as expected-Coherent noise very low-Dynamic range as expected
MAROC : a versatile front-end chip
MAROC has been designed to read out 64-anode MA-PMT from HAMAMATSU. The first application is the ATLAS luminometer.Many other application have popped up (medical imaging, astrophysics, basically everything using MA-PMT)
MAROC : main features 64 Channels – designed to read out MA-PMT Discrimination on each channel (3 thresholds) Multi-gain preamp (0-4, 6 bits) tunable channel by channel to
correct PMT gain non uniformity Charge measurement and 12 bit multi-channel ADC working
aside and independently of threshold detection (for cross measurement or calibration)
Perfectly suitable for SIPM read-out
ATLAS luminometer using Hamamatsu MA-PMTExample of high integration
MAROC block diagramHold signal 1
Photomultiplier64 channels
Photons
Variable Gain
Preamp.
VariableSlow Shaper
20-100 ns
S&H 1
BipolarFast Shaper
Unipolar Fast Shaper
Gain correction64*6bits
3 discri thresholds (3*12 bits)
MultiplexedAnalog charge
output
LUCID
S&H 2
3 DACs12 bits
64 Wilkinson 12 bit ADC
64 trigger outputs
MultiplexedDigital charge
output
64 inputs
Hold signal 2
LUCID
FS choice
80 MH
z encod
er
Cmd_LUCID
EN_serializer
MUX
SUM of 7 fibres 9 Sums
Or 64 SiPM
Consumption : 130mW (~2mW/channel)
shaper transient responseThe slow shaper transient response is presented here for different preamp gains
S-curves with threshold sweep
DAC1 = 800
DAC1 = 1400
An example of trigger adjustment through the threshold (DAC step: 10)
HARDROC presentation
HARDROC has been designed to read out the CALICE RPC DHCAL technical prototype.
HARDROC main features
Full power pulsing
Digital memory: Data saved during bunch train.
Only one serial output @ 1 or 5MHz
Store all channels and BCID for every hit. Depth = 128 bits
Data format : 128(depth)*[2bit*64ch+24bit(BCID)+8bit(Header)] = 20kbits
BASICALLY : MAROC with internal RAM and time counting
One HaRD_ROC event
Discris
resu
lts – 6
4*2
bit
BCID
– 2
4 bi
t
Chip
ID -
8 bi
t
Position Energy Time
160 bits / chip event Depht is 128
Auto trigger and data output
Header
BCID Ch7
Auto trigger with 10fC:Qinj=10fC in Ch7DAC0 and DAC1=255 (~5fC)
Performance summaryNumber of inputs/outputs 64 inputs, 1 serial output
Input Impedance 50-70Ω
Gain Adjustment 0 to 4, 6bits, accuracy 6%
Bipolar Fast Shaper ≈3.5 mV/fC tp=15ns
10 bit-DAC 2.5 mV/fC, INL=0.2%
Trigger sensitivity Down to 10fC
Slow Shaper (analog readout) ≈50 mV/pC, 5fC to 15pC , tp= 50ns to 150ns
Analog Xtk 2%
Analog Readout speed 5 MHz
Memory depth 128 (20kbits)
Digital readout speed 5MHz or more
Power dissipation (not pulsed) 100 mW (64 channels)
Second generation chip for SiPM : SPIROC
SPIROC has been designed to read out the CALICE AHCAL technical prototype
Technical prototype architecture
Very similar to SiW ECAL
Following CALICE / EUDET DAQ concept
2.2m
~ 2000 tiles/layer
Layer units (assembly) subdivided into smaller PCBsHBUs:Typically 12*12 tiles, 4 ASICs
DIF(Layer
Concentrator,Clock, control,Configuration)
LDA(Module
concentrator,Optical link)
SPIROC2nd gen ASIC
incl ADC
With 40 µW / chTemp gradient 0.3 K / 2m
From Felix Sefkow’s talk
Integrated layer design
Sector wall
Reflector Foil100µm
Polyimide Foil100µm PCB
800µm
Bolt with innerM3 threadwelded to bottom plate
MGPD
Tile3mm
HBU Interface500µm gap
Bottom Plate600µm
ASICTQFP-1001mm high
Top Plate600µm steel
Component Area: 900µm highHBU height:6.1mm(4.9mm without covers => absorber)
AbsorberPlates(steel)
Spacer1.7mm
Top Plate fixing
DESY
integrated
From Felix Sefkow’s talk
SPIROC presentation
36-channel readout chip Self triggered Energy measurement :
2 gains / 12 bit ADC 1 pe 2000 pe Variable shaping time from 50ns to 100ns pe/noise ratio : 11
Time measurement : 1 TDC (12 bits) step~100 ps – accuracy ~1ns pe/noise ratio on trigger channel : 24 Fast shaper : ~15ns Auto-Trigger on ½ pe
Internal input 8-bit DAC (0-5V) for SiPM gain adjustment
It is a System on chip device, including control and communication features
Block scheme of SPIROC
Bunch crossing
Ch. 0
Ch. 1
Analog channel Analog mem.
36-channel12 bit
WilkinsonADC
for charge and time Meas.
Analog channel Analog mem.
Ch. 35 Analog channel Analog mem.
12-bit counterTime
digital mem.
Eventbuilder
Memorypointer
Triggercontrol
MainMemory
SRAM
Commodule
HC
AL
SLA
B
Time considerations
time
Time between two trains: 200ms (5 Hz)
Time between two bunch crossing: 337 ns Train length 2820 bunch X
(950 us)
Acquisition
1ms (.5%)
A/D conv..5ms (.25%)
DAQ.5ms (.25%)
1% duty cycle
IDLE MODE
99% duty cycle
199ms (99%)
SPIROC running modes
Acquisition A/D conversion DAQ
When an event occur :•Charge is stored in analogue memory•Time is stored in digital (coarse) and analogue (fine) memory•Trigger is automatically rearmed at next coarse time flag (bunch crossing ID)
Depht of memory is 16
The data (charge and time) stored in the analogue memory are sequentially converted in digital and stored in a SRAM.An event in RAM is :•The coarse time•The fine time•The charge•The shaper gain•The status of the trigger
The events stored in the RAM are outputted through a serial link when the chip gets the token allowing the data transmission.When the transmission is done, the token is transferred to the next chip.256 chips can be read out through one serial link
Read out : token ring, zero suppress
Acquisition A/D conv. DAQ IDLE MODEChip 0
Chip 1 Acquisition A/D conv. DAQ IDLE MODEIDLE
Chip 2 Acquisition A/D conv. IDLE MODEIDLE
Chip 3 Acquisition A/D conv. IDLE MODEIDLE
Chip 4 Acquisition A/D conv. IDLE MODEIDLE DAQ
Chip 0 Chip 1 Chip 2 Chip 3 Chip 4
5 ev
ents
3 ev
ents
0 ev
ent
1 ev
ent
0 ev
ent
Data bus
Read out of millions of channels for ILC
SPIROC: One channel schematic
50 -100ns
50-100ns
Gain selection
8-bit threshold adjustment
Reference voltage
T
15ns
DAC output
Q
HOLD
Slow Shaper
Slow Shaper
Fast Shaper
Time measurement
Charge measurement
Fast ramp
300ns
12-bit Wilkinson
ADC
Trigger
Depth 16
Depth 16
Depth 16
Common to the 36 channels
8-bit DAC
0-5V
Low gain Preamplifier
High gain Preamplifier
Analog memory
50pF
5pF
0.1pF-1.5pF
READ
Variable delay
0.1pF-1.5pF
IN
IN test
Discri
DAQASIC
Chip ID register 8 bits
gain
Trigger discri Output
Wilkinson ADC Discri output
gain
Trigger discri Output
Wilkinson ADC Discri output
..…
OR36
EndRamp (Discri ADC Wilkinson)
36
36
36
TM (Discri trigger)
ValGain (low gain or high Gain)
ExtSigmaTM (OR36)
Channel 1
Channel 0
ValDimGray 12 bits
…
Acquisition
readout
Conversion ADC
+
Writing RAM
RAM
FlagTDC
ValDimGray
12
8
ChipID
Hit channel register 16 x 36 x 1 bits
TDC rampStartRampTDC
BCID 16 x 8 bits
ADC rampStartrampb (wilkinson
ramp)
16
16ValidHoldAnalogb
RazRangN
16ReadMesureb
Rstb
Clk40MHz
SlowClock
StartAcqt
StartConvDAQb
StartReadOut
NoTrig
RamFull
TransmitOn
OutSerie
EndReadOut
Chipsat
Expressions
0 .250 .500 .750 1.0time (us)
2.5
0
-2.5
-5.0
-7.5
-10.0
Y0
(mV
)Y
0 (m
V)
.2500
-.250-.500-.750
-1.0-1.25
Y1
(mV
)Y
1 (m
V)
150100
50.00
-50.0-100-150
Y2
(mV
)Y
2 (m
V)
10.0
7.5
5.0
2.5
0
-2.5
Y3
(mV
)Y
3 (m
V)
1.251.0
.750
.500
.2500
-.250
Y4
(mV
)Y
4 (m
V)
out_pa_hg
out_pa_lg
out_fs
out_ssh_hg
out_ssh_lg
time (us)
User: raux Date: Feb 9, 2007 Time: 2:34:15 PM CET
SPIROC : Photoelectron response simulation
High gain Preamplifier response
Low gain Preamplifier response
Fast shaper
High gain Slow shaper
Low gain Slow shaper
Tp=15ns
Tp=50ns
Tp=50ns
Noise/pe ratio = 25
Noise/pe ratio = 11
Noise/pe ratio = 31mV/pe
10mV/pe
120mV/pe
Simulation obtained with SiPM gain = 106 _ 1 pe = 160 fC
Conclusion
Our group is able to provide in short terms integrated electronic to read out MA-PMT, SiPM or APDs. The versatility of our chips – using programmable parameters (gain, peaking time, thresholds) make them suitable for many applications
Integrated electronic is the best way to read out high number of channels detectors, it allows to reduce cost and improve compacity in every application
More information : [email protected]