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By : John Pendlebury Agilent Application Engineer Agilent Restricted May 25, 2013 Agilent 3070 Inline Agenda: Introduction of Agilent i3070 in Line System Ease of Changing Fixtures 1

Introduction of Agilent i3070 in Line System By : …...Introduction of Agilent i3070 in Line System Ease of Changing Fixtures 1 Group/Presentation Title Agilent Restricted Page 2

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By :

John Pendlebury

Agilent

Application Engineer

Agilent Restricted

May 25, 2013

Agilent 3070 Inline

Agenda:

Introduction of Agilent

i3070 in Line System

Ease of Changing

Fixtures

1

Group/Presentation Title

Agilent Restricted

Month ##, 200X Page 2

Consistent ICT Market Leader *

1985 - 3060 1994 - 3070 SII 1998 - 3070 S3 2007 - i3070

2009 – i3070 Series 5 2012 – i3070 HNC 2013 – i3070 E9901EL 2013 – i3070 S5i

* Market Leader as per Prime Research in 2010, 2011,2012

Built on industry leading

i3070 ICT Platform

Short Wire Fixture –

preserving core value of TRS

Easy maintenance and

fixture change

Agilent In-line ICT

- Integrated In-line ICT with Handler

4

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i3070 In-line

Key Values of i3070 In-line ICT

• Complete solution from Agilent

• Small footprint, better mobility

• Faster throughput

• Ease of maintenance and fixture loading/unloading

• Lower upgrade costs

5

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What does the inline Fixture Looks Like

6

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Inside the inline system

7

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Opening the Fixture Drawer Unit

8

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1 2

3 4

Loading the Bottom Fixture

9

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1

2

3

A Guide Pin – for orientation check

Push Bottom Fixture in and Secure it

10

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Flip

Locks

Loading the Top Fixture

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Top Fixture Inserted Half Way

An Automatic Latch

Top Jig Lock

in Close

Position

Preliminary Specifications

i3070 In-line

Dimension, exclude beacon (mm) 1200 (L) x 930 (W) x 1900 (H)

Number of test nodes (max) 2592

PCB Size (mm) 350 (L) x 370 (W)

PCB Weight (kg) 3

PCB Edge Support (mm) 3

Top Side Clearance (mm) 90

Bottom Side Clearance (mm) 30

Transport Direction L R, R L

Transport Method Belt Transfer

Transport Speed (mm/sec) 300

Transport Height (mm) 920 – 975

PCB Exchange Time (sec) 5 – 8

Bar Code Reader Available as Option

12

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• Complete solution from Agilent

• Small footprint, better mobility

• Faster throughput

• Ease of maintenance

• Lower upgrade costs

1989 HP3070 series I

1994 HP3070 series II 1998 HP3070 series III

In-Circuit Test Innovation Continues

2007 Medalist i3070

2011 Medalist i3070

Lean Version 2009 Medalist i3070

Series 5

2013

14

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Features of our i3070 over the decade

5/25/2013 15

i3070 Software Updates

Throughput Coverage Ease of Use

i30

70

S5

2012 Rel 8.30P LED Test Ext DLL

Windows 7

2011 Rel 8.20P 60V Zener

N5747A Pwr Supp Unit

2010 Rel 8.10P DC test for big Caps

RP5700 PC 100KHz & 200KHz for small Caps

CET on IC

2009 Rel 8.00P ASRU N "AS" Utility card Pwr Monitor

High Pwr Channels

TestPlan Analyzer Flexible Pwr Channels Fixture Pwr Supp

i30

70

2008 Rel 7.20P VTEP v2.0 CET VTEP enhanced guarding

2008 Rel 7.10P VTEP speed up 1149.6 Enhanced Log record

2007 Rel 7.00P IPG enhanced Auto Optimizer

VTEP v2.0 NPM Switch btw Mux : Unmux Browser Pin locator

i30

70

S3

2006 Rel 6.00P XW4200 PC

New GUI FPY, Worst Probe

AutoDebug WinXP

2005 Rel 5.40P iYET iVTEP

2003 Rel 5.30P

NAND/XOR Tree Pattern VTEP

Coverage Analyst User Fixture Component

Scanworks GUI Localization

2001 Rel 4.00P-5.20P 50% faster in sys diag ISP suite

ControlXTP - SW5.0 Auto Si nails Windows NT

< 2001 < Rel 4.00 Panel Test

Throughput Multiplier Testjet

4. CET New Wiring Recommendation

16

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VTEP Mux cable

CET USB cable

(with ferrite coil)

CET LEM_A,R,M &

Power

VTEP Mux card

CET card

1

2 20

19

CET Power

Data +

USB GND

USB VCC

Data -

LEM_A LEM_R

LEM_M

CET GND

HYBRID GND

1

2 20

19

CET Power

Data +

USB GND

USB VCC

Data -

LEM_A LEM_R

LEM_M

CET GND

Old Wiring New Wiring