Materials Characterization

October 29, 2012

Graduate Center for Materials Research

$6.3M Renovation of Straumanis-James Hall Completed Spring 2012

Director

(Matt O’Keefe)

Administrative

Associate

(Patty Smith)

Sr. Secretary

(Sissy Edgar)

Sr. Clerk

(Sarah Henne)

Director

AMCL Labs

(Scott Miller)

Sr. Resrch Engr. Techn.

(Ron Haas)

Mechanic

Sr. Research Spclst.

(Eric Bohannan)

XRD/AFM/TGA

Electron Micr. Spclst

(Clarissa Wisner)

SEM

Sr. Research Spclst.

(vacant)

FIB/TEM

Sr. Electronic Techn.

(Brian Porter)

XPS

MRC Background •Annually >$5M shared credit expenditures, ~30 faculty, ~75 grad students, ~2000 samples run, ~30 external users

Majority of campus patents and royalty income • Maintains materials analytical equipment (AMCL)

Major Analytical Equipment

FIB SEM TEM

XRD XPS DTA/DSC

http://amcl.mst.edu/

Advanced Materials Characterization Lab

Helios Nanolab 600 Dual Beam FIB / HRSEM

Cross-sectional Analysis

5 µm

As-deposited Ce

O

Ga

Al

Cl

Pt

10 µm

(A) (B) (C)

With computer-controlled automatic milling, slicing and imaging, 3D

microstructure reconstruction can be generated by using the Helios.

3-Dimension sub-micron structure of shale gas rock Courtesy of Dr Baojun Bai and Malek Elgmati

3D Structure Reconstruction

Grain Orientation Mapping by EBSD

TEM Sample Preparation

TEM Chemical Composition of Multiple Layers on Steel Surface

Precipitates in Steel and Diffraction Analysis

Diffraction Analysis

Photo by Dr Kai Song

MC

M23C6

M3B2

Selected area diffraction analysis identifies three types of precipitates in a nickel-based superalloy

Thin Film Diffractometer Multi-Purpose Diffractometer (MPD)

X-Ray Diffraction