Metrology and Calibration of Mechatronic Systems – overview (v2.1)

Adrian M. Rankers

Metrology and Calibration of Mechatronic Systems

Metrology and Calibration of Mechatronic Systems – overview (v2.1)

Adrian M. Rankers

Mechatronics System Design – part 1

(5 days)

Mechatronics System Design – part 2

(5 days)

Motion

Control

Tuning

(6 days)

Advanced

Motion

Control

(5 days)

Advanced

Feedforward

Control

(3 days)

Premium

Standard

Basic

Advanced Advanced Mechatronic System Design

(6 days)

Workshop Mechatronics System Design

Dynamics

and Modelling

(3 days)

Actuation and

Power

Electronics

(3 days)

Experimental

Techniques in

Mechatronics

(3 days)

Metrology &

Calibration of

Mechatronic

Systems

(3 days)

Thermal

Effects in

Mechatronic

Systems

(3 days)

Machine

Vision in

Mechatronic

Systems

(2 days)

Design for

Ultra Clean

Vacuum

(4 days)

Design

Principles

Basics

(5 days)

Design for

Additive

Manufacturing

(3 days)

Design

Principles

Masterclass

(8 sessions)

Summer

School Opto

Mechatronics

(5 days)

Mechatronics Training Curriculum

Start

www.mechatronics-academy.nl

* Relevant partner trainings:

Applied Optics, Electronics for non-

electrical engineers, System Architecture,

Soft skills for technology professionals,

…

Metrology and Calibration of Mechatronic Systems – overview (v2.1)

Adrian M. Rankers

Mechatronics Training

December 31, 2009 Philips decided to stop all its training activities, which were

carried out by the Philips Centre for Technical Training (CTT), and all training

programs were transferred to external parties.

Currently, all former Philips trainings (and more) are offered to the market

under the umbrella of The High Tech Institute (www.hightechinstitute.nl).

Content partner for all Mechatronics courses is Mechatronics Academy B.V.

(www.mechatronics-academy.nl) which is set-up and supervised by :

Professor Dr.ir. Jan van Eijk

Professor Dr.ir. Maarten Steinbuch

Dr.ir. Adrian Rankers

Metrology and Calibration of Mechatronic Systems – overview (v2.1)

Adrian M. Rankers

Trainers

• Dr.ir. Rens Henselmans (NTS-Group)

• Dr.ir. Stefan Bäumer (TNO)

• Dr.ir. René Klaver (Heidenhain)

• Ir. Jef Horijon (Assembleon)

• Dr.ir. Adrian Rankers (Mechatronics Academy)

Course Director(s)

• Dr.ir. Rens Henselmans (NTS-Group)

• Dr.ir. Adrian Rankers (Mechatronics Academy)

Metrology and Calibration of Mechatronic Systems

Metrology and Calibration of Mechatronic Systems – overview (v2.1)

Adrian M. Rankers

Day Topic Presenter

1 Introduction / Definitions Short Range Sensors

Rens Henselmans Rens Henselmans

Interferometry Systems Encoder Systems

Stefan Bäumer René Klaver

2 Case Introduction Mechatronic Context

Rens Henselmans Adrian Rankers

Metrology on System Level Rens Henselmans

3 System Calibration Rens Henselmans

SMD component mounter case Wrap-Up & Closure

Jef Horijon Adrian Rankers

Global Program

Metrology and Calibration of Mechatronic Systems – overview (v2.1)

Adrian M. Rankers

Day 1 (morning)

Introduction & Metrology definitions

Short Range Sensors

Sensor terminology (range, resolution, sensitivity etc.)

Sensor types (capacitive, inductive, optical etc.)

Metrology and Calibration of Mechatronic Systems – overview (v2.1)

Adrian M. Rankers

Day 1 (afternoon)

Displacement interferometry (principle, components, error sources etc.)

Encoders (theory, various types)

Metrology and Calibration of Mechatronic Systems – overview (v2.1)

Adrian M. Rankers

Day 2 (morning)

Case introduction

Measurement machine for freeform optics

Analysis of existing solutions

Performance estimation

Mechatronic context

Control theory summary

Influence of sensor properties / placement

Metrology and Calibration of Mechatronic Systems – overview (v2.1)

Adrian M. Rankers

Day 2 (afternoon)

Metrology on System Level

• Design for low uncertainty

• Error types

• Rules of Abbe and Bryan

• System loops

• Quantity of concern

• Error budgeting basics

Metrology and Calibration of Mechatronic Systems – overview (v2.1)

Adrian M. Rankers

Day 3 (morning)

System Calibration

Basics

Calibration instruments & artefacts

Self-calibration

Calibration application examples

Use of calibration data

Metrology and Calibration of Mechatronic Systems – overview (v2.1)

Adrian M. Rankers

Day 3 (afternoon)

• SMD Component Mounter Case

• Vision Metrology

• Calibration of Series Products

Metrology and Calibration of Mechatronic Systems – overview (v2.1)

Adrian M. Rankers

Sign-up for this training

Via the website of our partner

The High Tech Institute